CN215492912U - Test bench for COS (chip on chip) shearing force of superluminescent diode - Google Patents
Test bench for COS (chip on chip) shearing force of superluminescent diode Download PDFInfo
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- CN215492912U CN215492912U CN202123060482.4U CN202123060482U CN215492912U CN 215492912 U CN215492912 U CN 215492912U CN 202123060482 U CN202123060482 U CN 202123060482U CN 215492912 U CN215492912 U CN 215492912U
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Abstract
The utility model provides a super-radiation light-emitting diode COS (chip operating system) shearing force test bench, which relates to the technical field of super-radiation light-emitting diode COS shearing force test devices and comprises a bottom plate, a limiting clamp, a three-axis displacement table, a push-pull force meter and a push needle, wherein the limiting clamp and the three-axis displacement table are arranged on the bottom plate, a positioning mechanism used for fixing a chip on the limiting clamp is arranged on the limiting clamp, the push-pull force meter is arranged on the three-axis displacement table, the three-axis displacement table is used for moving the push-pull force meter in the horizontal and vertical directions, the push needle is connected with a measuring head of the push-pull force meter, and the push needle is used for carrying out tube core stripping on the chip fixed on the limiting clamp. The shear force tester solves the problems that the shear force tester in the prior art is large in size, inconvenient to operate and move, complex in structure and high in manufacturing cost.
Description
Technical Field
The utility model relates to the technical field of a super-radiation light-emitting diode testing device, in particular to the technical field of a super-radiation light-emitting diode COS shearing force testing device.
Background
The super-radiation light-emitting diode (SLD) is a semiconductor photoelectric device, has the characteristics of high output power, wide spectral width and the like, is suitable for an Optical Coherence Tomography (OCT) imaging system, an optical fiber gyroscope (FOG) and the like, and is widely applied to industry, medical treatment and military industry.
In the production and manufacturing of the super-radiation light-emitting diode (SLD), the welding quality of a chip, namely cos (chip on submount), is an important link for determining the service life of the super-radiation light-emitting diode (SLD). The current mainstream of subsides of chip adopts the eutectic welding mode, judges whether eutectic welding is qualified mainly to test the chip through the shearing force tester, looks over whether the chip eutectic bonding face shearing strength is qualified, and whether the soldering tin on die and the base bonding face is even after observing the die on the chip and peeling off, whether has the cavity. At present, the mainstream shear force tester has the disadvantages of large volume, inconvenient operation and movement, complex structure and high manufacturing cost, so that enterprises generally adopt a mode of sharing one shear force tester by a plurality of eutectic devices for testing at present, the shear force of a chip needs to be repeatedly tested when the eutectic devices are debugged, equipment tension can be caused, and meanwhile, the chip to be tested needs to be moved for a long distance for testing, so that the risk of sample damage is increased.
SUMMERY OF THE UTILITY MODEL
The utility model provides a super-radiation light-emitting diode COS (chip operating system) shearing force test bench which solves the problems that a shearing force tester in the prior art is large in size, inconvenient to operate and move, complex in structure and high in manufacturing cost.
The technical scheme of the utility model is realized as follows:
the limit clamp and the three-axis displacement table are mounted on the bottom plate, a positioning mechanism used for fixing a chip on the limit clamp is arranged on the limit clamp, the push-pull dynamometer is mounted on the three-axis displacement table, the three-axis displacement table is used for moving the push-pull dynamometer in the horizontal and vertical directions, the push pin is connected with a measuring head of the push-pull dynamometer, and the push pin is used for carrying out tube core stripping on the chip fixed on the limit clamp.
Furthermore, the positioning mechanism comprises a chip die holder, a positioning groove is arranged on the limiting clamp, an air passage communicated with the positioning groove is arranged on the limiting clamp, the chip die holder is clamped in the positioning groove, a chip groove is arranged on the chip die holder, and the chip groove is communicated with the air passage.
Further, the positioning mechanism further comprises a limiting bolt, a limiting screw hole is formed in the limiting clamp, the limiting bolt is in threaded connection with the limiting screw hole of the limiting clamp, and the head of the limiting bolt is abutted against the chip die holder.
Further, the three-axis displacement table is characterized by further comprising a support, a seat plate and a locking bolt, wherein the bottom plate is provided with locking screw holes which are arranged in an array mode, the support and the seat plate are respectively provided with a U-shaped groove, the locking bolt penetrates through the U-shaped groove and is in threaded connection with the locking screw holes in the bottom plate, the head of the locking bolt is abutted against the support and the seat plate, the limiting clamp is fixedly installed on the support, and the three-axis displacement table is fixedly installed on the seat plate.
The push pin base is fixedly installed on a measuring head of the push-pull dynamometer, a push pin hole and a locking screw hole communicated with the push pin hole are formed in the push pin base, the push pin penetrates through the push pin hole, and the locking bolt is in threaded connection with the locking screw hole of the push pin base and is abutted to the push pin.
Furthermore, a measuring head of the push-pull dynamometer is parallel to the upper surface of a chip fixed on the limiting clamp, an included angle between the push pin hole and the horizontal plane is 45 degrees, a lower cutting surface and a front cutting surface are arranged at the tail end of the push pin, the lower cutting surface is parallel to the upper surface of the chip fixed on the limiting clamp, and the front cutting surface is perpendicular to the upper surface of the chip fixed on the limiting clamp.
The utility model adopts the technical proposal to achieve the following beneficial effects:
1. fixing the chip on a limiting clamp through a positioning mechanism, adjusting the spatial position of a push-pull dynamometer through a three-axis displacement table, placing the tail end of a push pin on a welding surface of the chip, finely adjusting a horizontal shaft of the three-axis displacement table, peeling off the tube core on the chip by a push-pull dynamometer, recording the maximum shearing force in the tube core peeling process by the push-pull dynamometer, observing the soldering conditions of the base surface and the bottom surface of the tube core of the chip after peeling, therefore, the test function of the chip is completed, the structure of the test board for the COS shearing force of the super-radiation light-emitting diode is miniaturized and simplified, the problems that a shearing force tester in the prior art is large in size, inconvenient to operate and move, complex in structure and high in manufacturing cost are solved, the production efficiency is effectively improved, the production cost is reduced, the chip is convenient to directly move to the test board for testing, and the risk in the sample transfer process is reduced;
2. when the chip is fixed on the limiting clamp, the air passage is communicated with the vacuum pump, negative pressure is generated by the vacuum pump, and the chip in the chip groove is adsorbed and fixed, so that the operation is very convenient, the testing efficiency is effectively improved, and the labor intensity of workers is reduced;
3. the chip die holder is clamped in the positioning groove of the chip die holder, the chip groove is formed in the chip die holder, and when chips of different specifications need to be tested, only different chip die holders need to be replaced, so that the chip die holder is well suitable for testing requirements of chips of different specifications.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts:
FIG. 1 is a perspective view of the present invention;
FIG. 2 is a front view of the present invention;
FIG. 3 is an enlarged view of a portion of FIG. 1 at A;
fig. 4 is a partially enlarged schematic view of a portion B in fig. 2.
In the drawings, the parts corresponding to the reference numerals are as follows:
1-bottom plate, 2-support, 4-limit clamp, 5-three-axis displacement table, 6-base plate, 7-push-pull force meter, 9-push pin, 10-push pin base, 11-locking bolt, 12-measuring head, 13-push pin hole, 14-locking screw hole, 16-positioning groove, 17-air channel, 18-chip die base, 19-chip groove, 21-limit bolt, 22-locking screw hole, 23-U-shaped groove, 24-lower cutting surface and 25-front cutting surface.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the following embodiments of the present invention, and it should be understood that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1 to 4, the test bench for COS shearing force of the superluminescent diode comprises a bottom plate 1, a limit clamp 4, a three-axis displacement table 5, a push-pull dynamometer 7, a push pin 9, a support 2, a seat plate 6, a locking bolt 11, a push pin seat 10 and a locking bolt, wherein the limit clamp 4 and the three-axis displacement table 5 are installed on the bottom plate 1, and the specific connection relationship between the three-axis displacement table 5 and the limit clamp 4 and the bottom plate 1 is as follows: the base plate 1 is provided with locking screw holes 22 which are arranged in an array mode, the support 2 and the seat plate 6 are respectively provided with a U-shaped groove 23, the locking bolt 11 penetrates through the U-shaped groove 23 and is in threaded connection with the locking screw holes 22 on the base plate 1, the head of the locking bolt 11 is abutted to the support 2 and the seat plate 6, the limiting clamp 4 is fixedly installed on the support 2, and the three-axis displacement table 5 is fixedly installed on the seat plate 6.
The positioning mechanism used for fixing the chip on the limiting clamp 4 is arranged on the limiting clamp 4, and the specific structure of the positioning mechanism and the specific connection relation with the limiting clamp 4 are as follows: the positioning mechanism comprises a chip die holder 18 and a limiting bolt 21, a positioning groove 16 is formed in the limiting clamp 4, the chip die holder 18 is clamped in the positioning groove 16, a limiting screw hole is formed in the limiting clamp 4, the limiting bolt 21 is in threaded connection with the limiting screw hole of the limiting clamp 4, and the head of the limiting bolt 21 is abutted to the chip die holder 18. An air passage 17 communicated with the positioning groove 16 is arranged on the limiting clamp 4, a chip groove 19 is arranged on the chip die holder 18, and the chip groove 19 is communicated with the air passage 17.
The push-pull dynamometer 7 is installed on the triaxial displacement table 5, the triaxial displacement table 5 is used for moving the push-pull dynamometer 7 in the horizontal and vertical directions, the push pin 9 is connected with a measuring head 12 of the push-pull dynamometer 7, and the push pin 9 is used for tube core stripping of a chip fixed on the limiting clamp 4. The three-axis displacement table 5 is an XYZ vacuum displacement table sold by auxiliary optical precision instruments (Shanghai) Limited and having a model number of FPSTA-7T 38V-XYZD; the push-pull force meter 7 is a digital display type push-pull force meter with the model number of VC500N, which is manufactured by the limited liability company of the Sean Shengli instruments. The specific connection relationship between the push pin 9 and the measuring head 12 of the push-pull dynamometer 7 is as follows: the push needle seat 10 is fixedly installed on a measuring head 12 of the push-pull dynamometer 7, a push needle hole 13 and a locking screw hole 14 communicated with the push needle hole 13 are formed in the push needle seat 10, the push needle 9 penetrates through the push needle hole 13, and the locking bolt is in threaded connection with the locking screw hole 14 of the push needle seat 10 and abuts against the push needle 9. The measuring head 12 of the push-pull dynamometer 7 is parallel to the upper surface of the chip fixed on the limiting clamp 4, the included angle between the push pin hole 13 and the horizontal plane is 45 degrees, the tail end of the push pin 9 is provided with a lower cutting surface 24 and a front cutting surface 25, the lower cutting surface 24 is parallel to the upper surface of the chip fixed on the limiting clamp 4, and the front cutting surface 25 is vertical to the upper surface of the chip fixed on the limiting clamp 4.
When the test bench for the COS shearing force of the super-radiation light-emitting diode is used, a chip is placed in the chip groove 19 of the chip die holder 18, the air passage 17 is communicated with the vacuum pump, and the vacuum pump generates negative pressure to adsorb and fix the chip in the chip groove 19. The test bench for the COS shearing force of the super-radiation light-emitting diode is placed on a microscope platform, the tail end of a push pin 9 is observed through the microscope, a three-axis displacement platform 5 is adjusted, the tail end of the push pin 9 is placed on a welding surface of a chip, then a horizontal shaft of the three-axis displacement platform 5 is finely adjusted to drive a push-pull dynamometer 7 and the push pin 9 to move back and forth along the horizontal direction, a tube core of the chip is stripped through the push pin 9 until the tube core is stripped, the maximum shearing force in the tube core stripping process is recorded through the push-pull dynamometer 7, the soldering tin conditions of the base surface and the bottom surface of the tube core of the stripped chip are observed, and the test for the COS shearing force of the super-radiation light-emitting diode is completed.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the utility model, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (6)
1. The test bench for the COS (chip operating system) shear force of the superluminescent diode is characterized by comprising a bottom plate (1), a limiting clamp (4), a three-axis displacement table (5), a push-pull dynamometer (7) and a push pin (9), wherein the limiting clamp (4) and the three-axis displacement table (5) are installed on the bottom plate (1), a positioning mechanism used for fixing a chip on the limiting clamp (4) is arranged on the limiting clamp (4), the push-pull dynamometer (7) is installed on the three-axis displacement table (5), the three-axis displacement table (5) is used for moving the push-pull dynamometer (7) in the horizontal and vertical directions, the push pin (9) is connected with a measuring head (12) of the push-pull dynamometer (7), and the push pin (9) is used for carrying out tube core stripping on the chip fixed on the limiting clamp (4).
2. The test bench for the COS shearing force of the super-radiation light-emitting diode (LED) according to claim 1, wherein the positioning mechanism comprises a chip die holder (18), a positioning groove (16) is formed in the limit clamp (4), an air channel (17) communicated with the positioning groove (16) is formed in the limit clamp (4), the chip die holder (18) is clamped in the positioning groove (16), a chip groove (19) is formed in the chip die holder (18), and the chip groove (19) is communicated with the air channel (17).
3. The test bench for testing the COS shearing force of the super-radiation light-emitting diode (LED) as claimed in claim 2, wherein the positioning mechanism further comprises a limit bolt (21), a limit screw hole is formed in the limit clamp (4), the limit bolt (21) is in threaded connection with the limit screw hole of the limit clamp (4), and the head of the limit bolt (21) abuts against the die holder (18).
4. The test bench for the COS (chip operating system) shear force of the super-radiation light-emitting diode according to claim 1, further comprising a support (2), a seat plate (6) and locking bolts (11), wherein the bottom plate (1) is provided with locking screw holes (22) arranged in an array manner, the support (2) and the seat plate (6) are respectively provided with a U-shaped groove (23), the locking bolts (11) penetrate through the U-shaped grooves (23) and are in threaded connection with the locking screw holes (22) on the bottom plate (1), the heads of the locking bolts (11) are abutted against the support (2) and the seat plate (6), the limiting clamp (4) is fixedly installed on the support (2), and the three-axis displacement table (5) is fixedly installed on the seat plate (6).
5. The test bench for the COS (chip operating system) shear force of the superluminescent diode of claim 1, further comprising a push needle base (10) and a locking bolt, wherein the push needle base (10) is fixedly installed on a measuring head (12) of the push-pull dynamometer (7), the push needle base (10) is provided with a push needle hole (13) and a locking screw hole (14) communicated with the push needle hole (13), the push needle (9) is arranged in the push needle hole (13) in a penetrating manner, and the locking bolt is in threaded connection with the locking screw hole (14) of the push needle base (10) and is abutted against the push needle (9).
6. The test bench for the COS (chip operating system) shear force of the super-radiation light-emitting diode according to claim 5, wherein a measuring head (12) of the push-pull dynamometer (7) is parallel to the upper surface of the chip fixed on the limit fixture (4), an included angle between the push-pin hole (13) and the horizontal plane is 45 degrees, a lower cutting surface (24) and a front cutting surface (25) are arranged at the tail end of the push-pin (9), the lower cutting surface (24) is parallel to the upper surface of the chip fixed on the limit fixture (4), and the front cutting surface (25) is perpendicular to the upper surface of the chip fixed on the limit fixture (4).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123060482.4U CN215492912U (en) | 2021-12-08 | 2021-12-08 | Test bench for COS (chip on chip) shearing force of superluminescent diode |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123060482.4U CN215492912U (en) | 2021-12-08 | 2021-12-08 | Test bench for COS (chip on chip) shearing force of superluminescent diode |
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| Publication Number | Publication Date |
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| CN215492912U true CN215492912U (en) | 2022-01-11 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202123060482.4U Active CN215492912U (en) | 2021-12-08 | 2021-12-08 | Test bench for COS (chip on chip) shearing force of superluminescent diode |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117109793A (en) * | 2023-10-25 | 2023-11-24 | 沈阳机床股份有限公司 | Belt tension measuring mechanism and testing method |
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2021
- 2021-12-08 CN CN202123060482.4U patent/CN215492912U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117109793A (en) * | 2023-10-25 | 2023-11-24 | 沈阳机床股份有限公司 | Belt tension measuring mechanism and testing method |
| CN117109793B (en) * | 2023-10-25 | 2024-01-09 | 沈阳机床股份有限公司 | Belt tension measuring mechanism and testing method |
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