CN215448886U

CN215448886U - Grain checker

Info

Publication number: CN215448886U
Application number: CN202121666608.XU
Authority: CN
Inventors: 池田学
Original assignee: Satake Corp
Current assignee: Satake Corp
Priority date: 2020-07-21
Filing date: 2021-07-21
Publication date: 2022-01-07
Anticipated expiration: 2031-07-21
Also published as: JP7512733B2; JP2022021234A

Abstract

The utility model provides a grain checker capable of correcting a sensor by using a simple structure, wherein the grain checker (1) comprises: a sensor (31) for detecting the grains on the sample tray (7) disposed at the inspection position; and a reference member (9) which is used for the correction of the sensor (31) and moves between a correction position at which the correction of the sensor (31) is performed and a retracted position retracted from the correction position, wherein when the sample disk (7) is arranged at the inspection position, the reference member (9) receives a pressing force from the sample disk (7) and moves from the correction position to the retracted position.

Description

Grain checker

Technical Field

The present invention relates to a grain checker for checking quality of grains.

Background

Today, the following grain inspectors are known: the transmitted light or the reflected light of the light irradiated to the grains is received by the sensor, and the presence or absence of breakage or the like of the grains is checked based on the light amount of the light received by the sensor. In order to maintain the detection accuracy of the sensor with high accuracy in the grain inspection machine, the sensor needs to be calibrated. For example, japanese patent application laid-open No. 2016 and 125867 describes a grain inspection device that corrects a sensor using a reference plate made of a plurality of plates having different color densities. The grain checker moves the sensor between the detection position of the grain and the detection position of the reference plate by the driving force of the motor. That is, the sensor detects the grains at the detection positions of the grains and corrects the detection positions of the reference plate.

However, when the sensor is moved by using the motor, a power transmission mechanism or the like for transmitting the power of the motor to the sensor is required, and the structure of the grain checker becomes complicated.

The utility model aims to provide a grain checker capable of correcting a sensor by using a simple structure.

SUMMERY OF THE UTILITY MODEL

The present invention according to claim 1 provides a grain inspection device, comprising:

a sensor for detecting grains on a sample tray disposed at the inspection position; and

a reference member for correcting the sensor and moving between a correction position at which the sensor is corrected and a retracted position retracted from the correction position,

when the sample disk is disposed at the inspection position, the reference member receives a pressing force from the sample disk and moves from the calibration position to the retracted position.

Scheme 2 the grain checker according to scheme 1, wherein,

and a biasing member for biasing the reference member toward the calibration position.

Scheme 3 the grain checker according to

scheme

1 or 2, wherein,

the sample tray has a placement part for placing the grains,

the distance in the vertical direction between the sensor and the grains placed on the placement portion when the grains placed on the placement portion are detected by the sensor is the same as the distance between the sensor and the reference member when the reference member is disposed at the calibration position.

Scheme 4 the grain checker according to

scheme

1 or 2, wherein,

the reference member moves on a straight line between the correction position and the retreat position.

Scheme 5 the grain checker according to

scheme

1 or 2, wherein,

the reference member moves on an arc between the correcting position and the retracted position.

Scheme 6 the grain checker according to

scheme

1 or 2, wherein,

the reference member has a plurality of regions having different colors.

Scheme 7 the grain checker according to scheme 6, wherein,

the reference member is divided into a plurality of members at boundaries of the plurality of regions.

According to the grain inspection device of the present invention, the sensor can be calibrated with a simple structure.

Drawings

The above and other objects and features of the present invention will become apparent from the following description of the embodiments with reference to the accompanying drawings. These figures are as follows.

Fig. 1 is a longitudinal sectional view showing a schematic structure of a grain checker.

Fig. 2 is a perspective view of a sample tray.

Fig. 3 is a diagram showing the sample disk storage unit in a state where the reference member is at the calibration position.

Fig. 4 is a diagram showing the sample disk storage unit in a state where the reference member is at the retracted position.

Fig. 5 is a diagram illustrating an operation of the reference member according to the first embodiment.

Fig. 6 is a diagram illustrating an operation of the reference member according to the first embodiment.

Fig. 7 is a diagram illustrating an operation of the reference member according to the first embodiment.

Fig. 8 is a diagram illustrating an operation of the reference member according to the first embodiment.

Fig. 9 is a diagram illustrating an operation of the reference member according to the first embodiment.

Fig. 10 is a diagram illustrating an operation of the reference member according to the first embodiment.

Fig. 11 is a diagram illustrating an operation of the reference member according to the second embodiment.

Fig. 12 is a diagram illustrating an operation of the reference member according to the second embodiment.

Fig. 13 is a diagram illustrating an operation of the reference member according to the second embodiment.

Fig. 14(a) and 14(b) are views showing a sample tray according to a third embodiment.

Fig. 15 is a diagram showing a sample tray of the fourth embodiment.

Detailed Description

[ first embodiment ]

Hereinafter, the grain checker according to the first embodiment will be described with reference to the drawings. In the present specification, for convenience of explanation, directions indicated by arrows in the drawings are described as directions indicating up, down, left, right, front, and rear, respectively.

Fig. 1 is a longitudinal sectional view showing a schematic structure of a grain checker. The grain checker 1 is a device for checking the quality of grains such as rice, wheat, beans, and corn by irradiating the grains with light.

For example, in the case of irradiating light to the rice where the body fracture is generated, the light is reflected at the body fracture portion. Therefore, the intensity of light transmitted through the body breaking portion becomes weak. At this time, when the rice is observed from a direction opposite to the direction of irradiating light to the rice, the body broken portion can be seen to be dark. Therefore, the presence or absence of a body break, the size of a body break, and the like can be determined from the brightness of the transmitted light that has passed through the meter.

The grain inspection device 1 includes a box 2, and various devices for inspecting grains are provided inside the box 2. The case 2 is made of, for example, light-shielding synthetic resin.

The grain inspection device 1 includes a first sensor installation unit 3, a sample tray storage unit 4, a light source installation unit 5, and a second sensor installation unit 6.

The first sensor arrangement part 3 is a part where the first sensor 31 is arranged. The first sensor installation portion 3 is formed in a rectangular parallelepiped box shape, for example. That is, the first sensor installation portion 3 is formed in a rectangular shape in a plan view.

The first sensor-disposed part 3 has an upper plate part 32 constituting an upper portion and side plate parts 33 constituting four side portions. The lower side of the first sensor-disposed part 3 is open.

The first sensor 31 is provided on the inner surface of the upper plate portion 32.

The first sensor 31 is a sensor for detecting grains on the sample tray stored in the sample tray storage 4. The detection data detected by the first sensor 31 is transmitted to, for example, an image display device (not shown). The image display device displays an image of the grains based on the detection data, and the operator performs an inspection of the grains based on the displayed image.

The first sensor 31 is, for example, a light detection sensor. The light detection sensor is, for example, an image sensor. The image sensor is, for example, a CCD image sensor or a CMOS image sensor. The first sensor 31 may be a camera of a smartphone or the like. When the first sensor 31 is a camera of a smartphone or the like, an image captured by the first sensor 31 is displayed on a display or the like of the smartphone.

The sample tray storage 4 is a portion for storing the sample tray 7 when inspecting the grains, and is disposed below the first sensor installation portion 3.

The sample disk storage section 4 is formed in a rectangular parallelepiped box shape, for example, and includes an upper plate section 41, a bottom plate section 42, and four side plate sections 43.

An opening 44 is formed in the central portion of the upper plate 41, and the interior of the sample disk storage 4 communicates with the interior of the first sensor installation section 3. An opening 45 is also formed in the central portion of the bottom plate 42. A receiving port (not shown) capable of receiving the sample tray 7 from the front side is formed in one side plate portion 43 of the four side plate portions 43.

The reference member 9 for calibration of the first sensor 31 and a second sensor described below is disposed in the sample disk storage portion 4.

The reference member 9 moves between a correction position at which the first sensor 31 and the second sensor are corrected and a retracted position retracted from the correction position. The retracted position is a position where the reference member 9 is disposed when inspecting the grains placed on the sample tray 7. The action of the reference member 9 and the configuration for actuating the reference member 9 are described in detail below.

The sample disk storage section 4 is provided with a first light source 46 that directly or indirectly irradiates the grains placed on the sample disk 7. The first light sources 46 are disposed in plural along the four side plates 43 of the sample disk storage 4, for example. The first light source 46 is, for example, an LED.

The light source installation unit 5 is a unit in which the light source device 51 is installed, and is disposed below the sample disk storage unit 4. The light source installation portion 5 is formed in a rectangular parallelepiped box shape, and includes an upper plate portion 52, a bottom plate portion 53, and four side plate portions 54.

The upper plate portion 52 is formed with an opening 55. Therefore, the interior of the light source installation section 5 communicates with the interior of the sample disk storage section 4 through the opening 45 formed in the bottom plate section 53 of the sample disk storage section 4. An opening 56 is also formed in the central portion of the bottom plate 53 of the light source installation unit 5.

The light source device 51 irradiates light from below toward the sample disk storage unit 4. In a state where the sample disk 7 is stored in the sample disk storage section 4, the light source device 51 irradiates light toward the bottom surface of the sample disk 7. The light source device 51 is disposed along, for example, four side plate portions 54 of the light source installation portion 5.

The light source device 51 includes a light source housing part 511, a second light source 512, and a lens 513.

The light source accommodating part 511 is a part accommodating the second light source 512 and the lens 513. The light source housing 511 is formed in a rectangular box shape, for example.

The second light source 512 is disposed inside the light source housing member 511, and emits light toward the inside of the sample disk housing portion 4. The second light source 512 is, for example, an LED.

The lens 513 is a lens 513 that condenses light emitted from the second light source 512. The lens 513 is, for example, a cylindrical lens. The lens 513 focuses the light emitted from the second light source 512 at a position further away from the second light source 512.

For example, when the lens 513 is not disposed in the light source housing 511, the second light source 512 strongly irradiates a portion of the sample disk 7 closer to the second light source 512, and weakly irradiates a portion of the sample disk 7 farther from the second light source 512. That is, the illuminance of the portion closer to the second light source 512 on the bottom surface of the sample disk 7 is increased, and the illuminance of the portion farther from the second light source 512 is decreased.

On the other hand, in the case where the lens 513 is disposed in the light source housing part 511, the lens 513 condenses the light emitted from the second light source 512, for example, in the vicinity of the center of the bottom surface of the sample tray 7. This makes it possible to move the region in which the illuminance of light applied to the sample disk 7 is increased from a region closer to the second light source 512 to a region farther from the second light source 512. As a result, the illuminance of the light irradiated to the bottom surface of the sample disk 7 becomes more uniform over the entire area of the bottom surface.

The second sensor installation section 6 is a section where the second sensor 61 is installed. The second sensor installation section 6 is formed in a rectangular parallelepiped box shape, for example.

The second sensor-mounting portion 6 has an upper plate portion 62, a bottom plate portion 63, and four side plate portions 64. An opening 65 is formed in the central portion of the upper plate portion 62 of the second sensor-mounting portion 6. The second sensor 61 is provided on the bottom plate 63 of the second sensor installation unit 6.

The second sensor 61 is a sensor for detecting grains on the sample tray 7 stored in the sample tray storage 4. The detection data detected by the second sensor 61 is transmitted to, for example, an image display device.

The second sensor 61 is, for example, a light detection sensor. The light detection sensor is, for example, an image sensor. The image sensor is, for example, a CCD image sensor or a CMOS image sensor. The second sensor 61 may be a camera of a smartphone or the like. When the second sensor 61 is a camera of a smartphone or the like, an image captured by the second sensor 61 is displayed on a display or the like of the smartphone.

Next, the sample disk 7 stored in the sample disk storage section 4 will be described.

Fig. 2 is a perspective view of the sample tray 7. The sample tray 7 is a member on which the grains inspected by the grain inspector 1 are placed. The sample disk 7 is formed of a transparent member. The transparent member is, for example, transparent synthetic resin or glass.

The sample tray 7 includes a tray portion 71 and a discharge portion 72. The tray portion 71 and the discharge portion 72 are coupled to each other.

The tray portion 71 is a portion for holding the grains inspected by the grain inspector 1. Disk portion 71 is formed in a circular shape in plan view, for example.

The tray 71 includes a mounting portion 711, a side portion 712, and a flange 713.

The placing part 711 is a part for placing grains. The upper surface of the mounting part 711 is a mounting surface on which grains are mounted.

The side portion 712 extends upward and outward from the outer periphery of the mounting portion 711. The side portion 712 serves to prevent the grains placed on the placement portion 711 from falling off the sample tray 7.

The flange 713 is a portion extending from the upper end of the side portion 712 toward the outside. When the sample disk 7 is stored in the sample disk storage 4, the flange 713 is supported by a sample disk guide described below.

The discharge portion 72 is a portion having one end coupled to the disk portion 71 and protruding from the disk portion 71. The discharge portion 72 functions as a passage for discharging the grains placed on the tray portion 71 to the outside. The other end of the discharge portion 72 is cut away to form an outlet for discharging the grains to the outside.

When the sample disk 7 is stored in the sample disk storage section 4, the discharge section 72 is held by the operator. In other words, the operator grips the discharge unit 72 and stores the sample disk 7 in the sample disk storage unit 4.

Next, the sample disk storage unit 4 will be described with reference to fig. 3 and 4.

Fig. 3 is a perspective view showing the sample disk storage 4 in a state where the reference member 9 is at the calibration position. Fig. 4 is a perspective view showing the sample disk housing section 4 in a state where the reference member 9 is at the retracted position retracted from the calibration position. In fig. 3 and 4, the first light source 46 and the like are not shown.

A receiving port 47 for receiving the sample disk 7 is formed in the front surface of the sample disk receiving portion 4. An opening 45 through which light from the second light source 512 is transmitted is formed in the bottom plate portion 42 of the sample tray storage portion 4.

A link coupling portion 48 is formed at the rear end portion of the sample disk storage portion 4 in the vicinity of both the left and right ends. The link coupling portion 48 is a portion coupled to one end portion of a link member described below. The link connecting portion 48 is, for example, a projection extending upward from the bottom plate portion 42 of the sample disk storage portion 4.

A biasing member locking portion 49 is formed near the center of the rear end of the sample disk storage portion 4. The biasing member locking portion 49 is a portion that locks a biasing member described below. The biasing member locking portion 49 is, for example, a projection extending upward from the bottom plate portion 42 of the sample tray housing portion 4.

The sample disk storage unit 4 includes a sample disk guide 8, a reference member 9, a reference plate guide 10, a link member 11, and an urging member 12.

The sample disk guide 8 is a member that guides the sample disk 7 toward the inside when the sample disk storage portion 4 receives the sample disk 7 from the storage port 47 and stores the sample disk therein. The sample tray guide 8 has a pair of linear portions extending rearward from a receiving port 47 formed in the front surface of the case 2, and a curved portion connecting rear ends of the pair of linear portions. The curved portion is formed in a curved shape curved toward the rear side. That is, the sample tray guide 8 is formed in a U shape in a plan view.

The sample tray guide 8 has a first guide member 81 and a second guide member 82.

The first guide member 81 is a member that supports the flange 713 of the sample disk 7 from below and guides the sample disk 7 into the sample disk storage 4.

The second guide member 82 is a member that covers the flange 713 of the sample disk 7 from above and guides the sample disk 7 into the sample disk storage 4.

The second guide member 82 includes a horizontal portion 821 disposed at a position facing the first guide member 81, and a vertical portion 822 extending downward from an outer end of the horizontal portion 821. The length of the vertical portion 822 is formed such that the distance between the upper surface of the first guide member 81 and the lower surface of the second guide member 82 is longer than the thickness of the flange 713 of the sample tray 7.

Both end portions of the second guide member 82 positioned on the front side are formed to be inclined upward toward the front side. That is, in order to facilitate the sample tray guide 8 to receive the sample tray 7, the interval between the upper surface of the first guide member 81 and the horizontal portion 821 of the second guide member 82 is widened at the front end portion of the sample tray guide 8.

The reference member 9 is a member for correction of the sensor. The reference member 9 is formed of, for example, synthetic resin. The reference member 9 has a plurality of regions different in color from each other. The plurality of regions different in color from each other are formed of, for example, a light-transmitting synthetic resin. Alternatively, the regions may be formed by attaching sealing materials having regions of different colors to the upper and lower surfaces of the reference member.

The reference member 9 has, for example, a first reference plate 91 and a second reference plate 92. The reference member 9 is divided into a first reference plate 91 and a second reference plate 92 at the boundaries of a plurality of regions different in color. The reference member 9 has a plurality of protrusions 93.

The first reference plate 91 and the second reference plate 92 are rectangular plate members, respectively. The length of each long side of the first reference plate 91 and the second reference plate 92 is, for example, about 2 times the length of each short side.

A link coupling portion 911 is formed at a left end portion of the first reference plate 91 at a central portion in the front-rear direction. A link coupling portion (not shown) is formed at the front-rear direction center portion and at the right side end portion of the second reference plate 92. The link connecting portion 911 of the first reference plate 91 and the link connecting portion of the second reference plate 92 are bosses formed integrally with the first reference plate 91 and the second reference plate 92, respectively, for example.

As will be described in detail later, the projection 93 is a portion that abuts against the outer side surface of the side portion 712 of the sample tray 7 to receive a force from the sample tray 7. The projection 93 is, for example, a cylindrical member having a central axis extending in the vertical direction, and an upper end portion thereof is, for example, tapered toward the upper end.

The projection 93 includes a first front projection 931 provided at the front end portion of the first reference plate 91 and at a position closer to the left of the first reference plate 91. The projection 93 includes a first center projection 932 provided at the center portion in the front-rear direction of the first reference plate 91 and at the right end portion of the first reference plate 91. Further, the projection 93 includes a second front projection 933 provided at the front end portion of the second reference plate 92 and at a position closer to the right of the second reference plate 92. In addition, the projection 93 includes a second center projection 934 provided at the center portion in the front-rear direction of the second reference plate 92 and at the left end portion of the second reference plate 92.

The reference plate guide 10 is a member that guides the reference member 9 when the reference member 9 moves in the left-right direction. The reference plate guide 10 is, for example, an elongated member having a U-shaped cross section. The reference plate guide 10 is disposed on the front and rear portions of the sample disk storage 4, and holds the reference member 9 by sandwiching the reference member 9 from the front and rear.

The link member 11 is a long plate-like member that connects the reference member 9 and the bottom plate portion 42 of the sample disk storage portion 4. The link member 11 has a first link member 111 and a second link member 112.

A long hole 113 is formed at one end of the first link member 111. For example, the screw 114 is fitted into the elongated hole 113, and the screw 114 is screwed to the link connecting portion 911 of the first reference plate 91, whereby one end of the first link member 111 is connected to the first reference plate 91.

A circular hole (not shown) is formed at the other end of the first link member 111. The screw 114 is fitted into the circular hole, and the screw 114 is screwed to the link connecting portion 48 of the sample disk storage portion 4, whereby the other end of the first link member 111 is connected to the bottom plate portion 42 of the sample disk storage portion 4.

A locking hole (not shown) for locking the biasing member 12 is formed near the center of the first link member 111.

A long hole (not shown) is formed at one end of the second link member 112. For example, the screw 114 is fitted into the elongated hole, and the screw 114 is coupled to the link coupling portion of the second reference plate 92, whereby one end of the second link member 112 is coupled to the second reference plate 92.

A circular hole (not shown) is formed at the other end of the second link member 112. The screw 114 is fitted into the circular hole, and the screw 114 is screwed to the link coupling portion 48 of the sample disk storage portion 4, whereby the other end of the second link member 112 is coupled to the bottom plate portion 42 of the sample disk storage portion 4.

A locking hole (not shown) for locking the biasing member 12 is formed near the center of the second link member 112.

The urging member 12 is a member that urges each link member 11. The force application member 12 includes a first force application member 121 and a second force application member 122. The urging member 12 is an elastic member. The urging member 12 is, for example, a coil spring.

One end of the first biasing member 121 is locked to a locking hole formed near the center of the first link member 111. The other end of the first biasing member 121 is locked to a biasing member locking portion 49 formed in the sample disk storage portion 4. Thereby, the first biasing member 121 biases the first reference plate 91 rightward via the first link member 111.

One end of the second biasing member 122 is locked to a locking hole formed near the center of the second link member 112. The other end of the second biasing member 122 is locked to a biasing member locking portion 49 formed in the sample disk storage portion 4. Thereby, the second biasing member 122 biases the second reference plate 92 leftward via the second link member 112.

Next, the calibration of the first sensor 31 and the second sensor 61 will be described. There is a case where a mechanical error occurs in the detection data detected by the first sensor 31 and the second sensor 61. That is, there may be a difference between a value indicated by the detection data actually detected by the first sensor 31 and a value that the detection data detected by the first sensor 31 should originally indicate. Further, there may be a difference between a value indicated by the detection data actually detected by the second sensor 61 and a value that the detection data detected by the second sensor 61 should originally indicate. The reason for this is caused by, for example, manufacturing errors of the first sensor 31 and the second sensor 61. In order to correct the mechanical error, the first sensor 31 and the second sensor 61 are corrected using the reference member 9.

In the case of correcting the first sensor 31 and/or the second sensor 61, light is irradiated from the first light source 46 or the second light source 512 toward the reference member 9. The reflected light and/or transmitted light of the light irradiated to the reference member 9 is detected by the first sensor 31 and/or the second sensor 61. For example, the illuminance of light detected by the first sensor 31 and/or the second sensor 61 is compared with a predetermined reference illuminance, and a correction coefficient for correcting the illuminance of light received by the sensors is calculated based on the comparison result. Based on the calculated correction coefficient, the first sensor 31 and/or the second sensor 61 are corrected.

Next, the operation of the reference member 9 when inspecting the grains placed on the sample tray 7 will be described.

Fig. 5 to 10 are diagrams for explaining the operation of the reference member 9 when inspecting the grains placed on the sample tray 7.

Fig. 5 shows a state before the sample disk 7 is inserted into the sample disk storage 4 from the storage port 47 of the sample disk storage 4. At this time, the first biasing member 121 (see fig. 3 and 4) and the second biasing member 122 (see fig. 3 and 4) bias the first reference plate 91 and the second reference plate 92 in directions approaching each other, respectively. In this state, the first light source 46 (see fig. 1) or the second light source 512 (see fig. 1) emits light, and the first sensor 31 (see fig. 1) and/or the second sensor 61 (see fig. 1) receive reflected light reflected by the first reference plate 91 or the second reference plate 92 and/or transmitted light transmitted through the first reference plate 91 or the second reference plate 92. The first sensor 31 and/or the second sensor 61 is corrected based on the light amount of the received light. The position of the reference member 9 when the first sensor 31 and/or the second sensor 61 is corrected is referred to as a corrected position.

Fig. 6 shows a state in which the sample disk 7 is inserted from the receiving port 47 of the sample disk storage 4 and the outer side surface of the side portion 712 of the sample disk 7 abuts on the protrusion 93 of the reference member 9. When the upper portions of the side portions 712 abut on the upper portions of the first front protrusions 931 and the upper portions of the second front protrusions 933, the first front protrusions 931 and the second front protrusions 933 receive pressing forces to the left rear and the right rear, respectively. Therefore, the first reference plate 91 receives a pressing force toward the left rear, and the second reference plate 92 receives a pressing force toward the right rear.

The movement direction of the first reference plate 91 and the second reference plate 92 is restricted to the left-right direction by the reference plate guide 10 (see fig. 3 and 4). Therefore, the first reference plate 91 and the second reference plate 92 start moving in the left direction and the right direction, respectively, by the force of the left-right direction component of the leftward and rightward pressing force and the rightward and rearward pressing force, respectively.

Fig. 7 shows a state where the sample disk 7 is further inserted into the sample disk storage 4. When the sample tray 7 is further inserted deeply, the contact positions of the side portion 712 of the sample tray 7 with the first front projection 931 and the second front projection 933 are gradually moved to the front side of the sample tray 7. The first reference plate 91 and the second reference plate 92 are gradually opened to the left and right by the pressing force applied from the sample tray 7.

Fig. 8 shows a state where the sample disk 7 is further inserted into the sample disk storage 4. At this time, the side 712 of the sample tray 7 abuts the first front protrusion 931, the first center protrusion 932, the second front protrusion 933, and the second center protrusion 934.

Fig. 9 shows a state where the sample disk 7 is further inserted into the sample disk storage 4. When the sample disk 7 is further inserted into the sample disk storage 4, the first center protrusion 932 and the second center protrusion 934 receive a pressing force from the side portion 712 of the sample disk 7. Thereby, the first reference plate 91 and the second reference plate 92 are further moved in the left and right directions, respectively. At this time, the side 712 of the sample tray 7 is separated from the first and second

front protrusions

931 and 933.

Fig. 10 shows a state in which the sample disk 7 is further inserted into the deep part of the sample disk storage 4 and the sample disk 7 is set at the inspection position. In this state, the sample tray 7 abuts against the curved portion of the sample tray guide 8. That is, the bent portion of the sample tray guide 8 functions as a positioning portion of the sample tray 7.

When the sample tray 7 is inserted to the inspection position, the first reference plate 91 and the second reference plate 92 reach positions that are not detected by the first sensor 31 or the second sensor 61. The positions of the first reference plate 91 and the second reference plate 92 are referred to as retracted positions. The first reference plate 91 and the second reference plate 92 in the retracted positions press the sample tray 7 set in the inspection position by the biasing forces of the first biasing member 121 and the second biasing member 122, respectively. However, the urging force is so small that the sample disk 7 is not pushed out from the sample disk storage section 4 to the front side. Alternatively, in order not to push the sample disk 7 out of the sample disk storage 4 by the urging force, a stopper (not shown) for restricting the forward movement of the sample disk 7 at the inspection position may be provided in the sample disk storage 4.

The grains placed on the sample tray 7 are inspected with the sample tray 7 in the inspection position.

When the inspection of the grains is completed, the sample tray 7 is pulled out from the sample tray storage unit 4 in the reverse order to the order of insertion of the sample tray 7. As described above, the first reference plate 91 and the second reference plate 92 are biased in the direction of approaching each other by the biasing member 12. Therefore, as the sample disk 7 is pulled out from the sample disk storage unit 4, the first reference plate 91 and the second reference plate 92 move to the calibration position.

It is preferable that the distance between the upper surface of the reference member 9 at the calibration position and the first sensor 31 is the same as the distance in the vertical direction between the center (thickness direction) of the grains placed on the sample tray 7 at the inspection position and the first sensor 31. In other words, the height of the upper surface of the reference member 9 is set to be slightly higher than the height of the upper surface of the sample tray 7. In this way, the first sensor 31 can detect the grains placed on the sample tray 7 with high accuracy. However, the same distance does not mean exactly the same distance, but means a distance to the same extent as the first sensor 31 can be corrected with high accuracy. For example, the distance between any part of the grains and the first sensor 31 and the distance between the upper surface of the reference member 9 and the first sensor 31 may be the same. When the grains placed on the sample tray 7 are, for example, rice grains, the centers of the grains are located at a height of about 1[ mm ] from the placement surface of the sample tray, and the height of the upper surface of the reference member 9 is set to this height.

In order to make the height of the upper surface of the reference member 9 at the calibration position equal to the height of the center of the grains placed on the sample tray 7 at the inspection position, for example, the position of the first front protrusion 931 and the position of the second front protrusion 933 may be arranged closer to each other than the positions shown in fig. 5 to 10. That is, the first front protrusion 931 is provided near the right end of the first reference plate 91, and the second front protrusion 933 is provided near the left end of the second reference plate 92. In this configuration, when the sample disk 7 is inserted into the sample disk storage 4, the placement portion 711 of the sample disk 7 does not abut on the first reference plate 91 and the second reference plate 92, and the upper portion of the side portion 712 of the sample disk 7 abuts on the upper portion of the first front protrusion 931 and the upper portion of the second front protrusion 933, so that the first reference plate 91 and the second reference plate 92 can be moved in the left-right direction.

Further, the distance between the lower surface of the reference member 9 at the calibration position and the second sensor 61 and the distance between the upper surface of the mounting portion of the sample tray 7 at the inspection position and the second sensor 61 may be the same.

As described above, in the grain inspection machine 1 according to the first embodiment, the reference member 9 is moved from the calibration position to the retracted position by the pressing force from the sample tray 7. Therefore, it is not necessary to provide the grain checker 1 with a power source and a power transmission mechanism for moving the reference member 9. As a result, the structure of the grain inspection device 1 can be simplified.

The grain checker 1 of the first embodiment further includes a biasing member 12 that biases the reference member 9 toward the calibration position. Therefore, the reference member 9 automatically moves to the calibration position as the sample disk 7 moves from the inside to the outside of the sample disk storage unit 4. As a result, it is not necessary to provide a lever or the like for manually returning the reference member 9 to the calibration position, and the structure of the grain checker 1 can be simplified.

In the grain checker 1 of the first embodiment, the reference member 9 moves linearly. Therefore, the components such as the reference plate guide 10 can be configured simply.

In the grain checker 1 of the first embodiment, the reference member 9 has a plurality of regions having different colors. Therefore, the first sensor 31 and the second sensor 61 can be corrected with high accuracy.

In the grain checker 1 of the first embodiment, the reference member 9 is divided into a plurality of members at boundaries of a plurality of regions. Therefore, the first sensor 31 and the second sensor 61 can be corrected with high accuracy without being affected by the boundary portion.

[ second embodiment ]

Next, the grain checker 1 of the second embodiment will be explained. In the grain checker 1 of the second embodiment, the reference member and the configuration of the periphery of the reference member are different from those of the grain checker 1 of the first embodiment. Therefore, the reference member and its peripheral structure will be described below, and the description of the same structure as that of the first embodiment will be omitted.

Fig. 11 is a diagram illustrating the reference member and the configuration of the periphery thereof according to the second embodiment.

The reference member 21 includes a first reference lever 211, a first reference plate 212, a first pressed portion 213, a second reference lever 214, a second reference plate 215, and a second pressed portion 216.

The first reference lever 211 is a rod-shaped member that supports the first reference plate 212 and the first pressed portion 213. The first reference lever 211 is pivotally supported by a pivoted portion 218 formed on the bottom plate portion 42 of the sample disk storage portion 4 on the left side of the sample disk guide 8. That is, the first reference lever 211 can rotate about the pivoted portion 218.

The first reference plate 212 is a component for calibration of the sensor. The first reference plate 212 has a plurality of regions of different colors. The first reference plate 212 is attached, for example, such that a plurality of different regions are aligned in the longitudinal direction of the first reference bar 211. The first reference plate 212 is formed of, for example, a light-transmitting synthetic resin.

The first pressed portion 213 is a portion that receives a pressing force from the side portion 712 of the sample disk 7 when the sample disk 7 is inserted into the sample disk storage portion 4. The first pressed portion 213 is formed of, for example, a hemispherical member.

The first reference lever 211 receives a biasing force in the clockwise direction from the first biasing member 217 provided on the rear side of the pivoted portion 218 when viewed from the receiving port 47 of the sample disk receiving portion 4.

The second reference lever 214 is a rod-shaped member that supports the second reference plate 215 and the second pressed portion 216. The second reference lever 214 is pivotally supported by a pivoted portion 218 formed on the bottom plate portion 42 of the sample disk storage portion 4 on the right side of the sample disk guide 8. That is, the second reference lever 214 can rotate about the pivoted portion 218.

The second reference plate 215 is a component for calibration of the sensor. The second reference plate 215 has a plurality of regions having different colors. The second reference plate 215 is attached, for example, such that a plurality of different regions are aligned in the longitudinal direction of the second reference bar 214. The second reference plate 215 is formed of, for example, a light-transmitting synthetic resin.

The second pressed portion 216 is a portion that receives a pressing force from the side portion 712 of the sample disk 7 when the sample disk 7 is inserted into the sample disk storage portion 4. The second pressed portion 216 is formed of, for example, a hemispherical member.

The second reference lever 214 receives a biasing force in the counterclockwise direction from a second biasing member 219 provided on the rear side of the pivoted portion 218 when viewed from the receiving port 47 of the sample disk receiving portion 4.

The rotation range of the first reference lever 211 and the second reference lever 214 is limited by a stopper (not shown) so that they are stopped at positions aligned in a straight line with each other.

Next, the operation of the reference member 21 when inspecting the grains placed on the sample tray 7 will be described.

Fig. 11 to 13 are diagrams for explaining the operation of the reference member 21 when inspecting the grains placed on the sample tray 7.

Fig. 11 shows a state before the sample disk 7 is inserted into the sample disk storage 4 from the storage port 47 of the sample disk storage 4. At this time, the first biasing member 217 biases the first reference lever 211 in the clockwise direction, and the second biasing member 219 biases the second reference lever 214 in the counterclockwise direction. In this state, the first light source 46 or the second light source 512 emits light, and the first sensor 31 and/or the second sensor 61 receives reflected light reflected by the first reference plate 212 or the second reference plate 215 and/or transmitted light transmitted through the first reference plate 212 or the second reference plate 215. The first sensor 31 and/or the second sensor 61 is corrected based on the light amount of the received light. The position of the reference member 21 at which the first sensor 31 and/or the second sensor 61 is corrected is a corrected position.

Fig. 12 shows a state in which the sample disk 7 is inserted from the receiving port 47 of the sample disk storage 4 and the side portion 712 of the sample disk 7 presses the first pressed portion 213 and the second pressed portion 216. When the first pressed portion 213 receives a pressing force from the sample disk 7, the first reference lever 211 rotates counterclockwise about the pivoted portion 218. When the second pressed portion 216 receives a pressing force from the sample disk 7, the second reference lever 214 rotates clockwise about the pivoted portion 218.

Fig. 13 shows a state in which the sample disk 7 is further inserted into the deep part of the sample disk storage 4 and the sample disk 7 is set at the inspection position. In this state, the sample tray 7 abuts against the curved portion of the sample tray guide 8.

When the sample tray 7 is inserted to the inspection position, the first reference plate 212 and the second reference plate 215 reach positions that are not detected by the first sensor 31 (see fig. 1) or the second sensor 61 (see fig. 1). The position is a retracted position. The first reference plate 212 and the second reference plate 215 in the retracted positions press the sample tray 7 set in the inspection position to the front side by the biasing forces of the first biasing member 217 and the second biasing member 219, respectively. However, the urging force is so small that the sample disk 7 is not pushed out from the sample disk storage section 4 to the front side. Alternatively, in order not to push the sample disk 7 out of the sample disk storage 4 by the urging force, a stopper for restricting the forward movement of the sample disk 7 at the inspection position may be provided in the sample disk storage 4.

When the inspection of the grains is completed, the sample disk 7 is pulled out from the sample disk storage unit 4 in the reverse order to the order when the grains are inserted into the sample disk storage unit 4. As described above, the first reference lever 211 and the second reference lever 214 are biased in the direction of approaching each other by the first biasing member 217 and the second biasing member 219, respectively. Therefore, as the sample disk 7 is pulled out from the sample disk storage unit 4, the first reference plate 212 and the second reference plate 215 move to the calibration position.

In the present embodiment, the distance between the upper surface of the reference member 21 at the calibration position and the first sensor 31 is the same as the distance between the center (thickness direction) of the grains placed on the sample tray 7 at the inspection position and the first sensor 31 in the vertical direction. In this way, the first sensor 31 can detect the grains placed on the sample tray 7 with high accuracy. Alternatively, the distance between the lower surface of the reference member 21 at the calibration position and the second sensor 61 may be the same as the vertical distance between the center of the grain placed on the sample tray 7 at the inspection position and the second sensor 61.

As described above, in the grain inspection machine 1 according to the second embodiment, the reference member 21 is moved from the calibration position to the retracted position by the pressing force from the sample tray 7. Therefore, it is not necessary to provide the grain checker 1 with a power source and a power transmission mechanism for moving the reference member 21. Therefore, the structure of the grain inspection device 1 can be simplified.

In the grain checker 1 of the second embodiment, the first reference lever 211 and the second reference lever 214 rotate about the pivoted portion 218. That is, the reference member 21 moves on an arc between the correction position and the retreat position. Therefore, the reference member 21 and its periphery can be configured simply.

In the first and second embodiments described above, the sample disk storage 4 may be provided with an adjustment mechanism for adjusting the position of the sample disk guide 8 in the height direction. Thus, the size of the grains to be inspected can be compared, and the distance between the upper surface of the reference member 9 at the calibration position and the first sensor 31 and the distance between the center of the grains placed on the sample tray 7 at the inspection position and the first sensor 31 in the vertical direction can be adjusted so as to be the same.

[ third embodiment ]

Next, a third embodiment will be explained. In the present embodiment, the sample disk 7 includes a sample disk frame in order to prevent light emitted from the first light source 46 (see fig. 1) or the second light source 512 (see fig. 1) from being reflected by the side portion of the sample disk 7 or from being transmitted through the side portion of the sample disk 7 during inspection of the grains.

Fig. 14(a) is a perspective view of the sample disk frame 23 provided on the disk portion 71 of the sample disk 7, and fig. 14(b) is a side view of the sample disk frame 23.

The sample disk frame 23 is a frame member having a hole penetrating in the vertical direction, and is formed in substantially the same shape as the side portion 712 of the sample disk 7. When the side portion 712 of the sample disk 7 is tapered toward the lower side, the sample disk frame 23 is tapered toward the lower side.

The sample disk frame 23 has an outer surface 231, a lower surface 232, an upper surface 233, and an inner surface 234. The outer surface 231 is a surface that contacts the inner surface of the side portion 712 of the sample tray 7. The lower surface 232 is a surface that contacts the mounting surface of the sample tray 7. The lower surface 232 is formed parallel to the mounting surface of the sample disk 7 in a state where the sample disk frame 23 is mounted on the mounting portion 711 of the sample disk 7. The upper surface 233 is a surface parallel to the lower surface 232, and is connected to the outer surface 231 at the outer peripheral portion and connected to the inner surface 234 at the inner peripheral portion. The inner side 234 is formed parallel to the outer side 231. The inner side 234 is connected at an upper end to the upper surface 233 and at a lower end to the lower surface 232.

The sample tray frame 23 is formed of a material that does not transmit light. The sample tray frame 23 is made of, for example, a matt black synthetic resin.

When the grain inspection device 1 inspects the grains placed on the sample tray 7, for example, the first light source 46 is turned on, the reflected light reflected by the grains is detected by the first sensor 31, and the transmitted light transmitted through the grains is detected by the second sensor 61. At this time, there are cases where: the light from the first light source 46 is reflected by the side 712 of the sample disk 7 or transmitted through the side 712, and the first sensor 31 and/or the second sensor 61 receive the reflected light and/or the transmitted light. Thus, the captured image may become a whitish image as a whole. To prevent this from occurring, the sample tray frame 23 prevents light from being reflected or transmitted at the side 712 of the sample tray 7.

In a state where the sample tray frame 23 is placed on the sample tray 7, the sample tray frame 23 prevents grains from overflowing and falling from the discharge portion 72 of the sample tray 7.

Further, the sample disk frame 23 may be fixed to the fixing portion of the sample disk 7 in a state where the sample disk 7 or the sample disk frame 23 is placed on the sample disk 7.

[ fourth embodiment ]

Next, a fourth embodiment will be explained. The sample tray 7 of the present embodiment is called a double-sided box. The sample tray 7 of the present embodiment prevents the grains placed on the sample tray 7 from moving during the inspection.

Fig. 15 is a diagram showing the sample tray 7. The sample tray 7 has a first sample tray 73 and a second sample tray 74.

The first sample tray 73 is the same as the sample tray 7 described in the first embodiment. Therefore, the description of the first sample tray 73 is omitted here.

The second sample tray 74 sandwiches the grains placed on the first sample tray 73 between the tray portion 71 of the first sample tray 73 and the second sample tray 74. The second sample tray 74 is formed in a circular disk shape in a plan view. The second sample plate 74 is formed of a light-transmitting material. The light-transmitting material is, for example, a transparent synthetic resin. The second sample tray 74 has a tray section 741 and a sheet 742.

The disk portion 741 has a bottom 743 and a side 744. The bottom 743 is formed in a circular plate shape. The side portion 744 is a tapered member tapered toward the lower tip. The lower end of the side portion 744 is connected to the outer periphery of the bottom portion 743.

The sheet 742 is attached to the bottom surface of the disk section 741, and sandwiches the grains with the first sample tray 73. The sheet 742 is attached to the bottom surface of the disc section 741 with an adhesive, for example. The sheet 742 is formed into a circular shape in accordance with the shape of the bottom 743 of the disk section 741. The sheet 742 is formed of, for example, a translucent elastic member. The light-transmitting elastic member is, for example, a transparent gel sheet.

Next, a method of using the sample tray 7 will be described. In the grain inspection machine 1 using the sample tray 7, for example, a sensor for detecting grains is disposed only below the sample tray 7.

First, grains to be inspected are placed on the first sample tray 73. Next, the second sample plate 74 is superimposed on the first sample plate 73. In this state, the sample tray 7 is stored in the sample tray storage 4 of the grain inspection device 1, and the grain inspection is performed. Thus, the grain inspection device 1 can inspect the grains based on the light quantity of the reflected light reflected by the grains.

When the second sample disk 74 is stacked on the first sample disk 73 and the inspection in this state is completed, the sample disk 7 is turned upside down and the sample disk 7 is stored in the sample disk storage section 4. That is, the grains are placed on the sheet 742 attached to the second sample tray 74, and the placing surface of the first sample tray 73 is covered with the grains.

In this state, the grains were inspected. That is, by inverting the sample tray 7, the grain particles can be inspected by the reflected light reflected by one surface and the reflected light reflected by the other surface of the grain particles. Therefore, the grain particles can be inspected with high accuracy. In a state where the grains are sandwiched between the placement portion 711 of the first sample tray 73 and the sheet 742, the sheet 742 is elastically deformed along the shape of the grains by the urging force from the grains. Therefore, when the sample tray 7 of the present embodiment is used, the grain can be prevented from moving on the sample tray 7 during the inspection. Further, when the sample tray 7 is turned upside down, the grain can be prevented from moving between the first sample tray 73 and the sheet 742.

Claims

1. A grain inspection device is characterized by comprising:

2. Grain checker according to claim 1,

3. Grain checker according to claim 1 or 2,

the sample tray has a placement part for placing the grains,

4. Grain checker according to claim 1 or 2,

5. Grain checker according to claim 1 or 2,

6. Grain checker according to claim 1 or 2,

the reference member has a plurality of regions having different colors.

7. Grain checker according to claim 6,