CN215375082U - Near infrared spectrum analyzer device - Google Patents
Near infrared spectrum analyzer device Download PDFInfo
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- CN215375082U CN215375082U CN202121749907.XU CN202121749907U CN215375082U CN 215375082 U CN215375082 U CN 215375082U CN 202121749907 U CN202121749907 U CN 202121749907U CN 215375082 U CN215375082 U CN 215375082U
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Abstract
The utility model relates to a near infrared spectrum analyzer device, which comprises a halogen light source, a light source reflector, a sample reflector group, a shading disc, a motor, a sample diffuse reflection light collecting optical fiber, a light source reflection light collecting optical fiber and a near infrared spectrum analyzer, wherein the halogen light source vertically irradiates a sample to be measured, the shading disc is provided with a light hole, the motor rotates the shading disc and controls the position of the light hole of the shading disc, the near infrared spectrum analyzer is connected with the sample diffuse reflection light collecting optical fiber and the light source reflection light collecting optical fiber, and the sample diffuse reflection light collecting optical fiber and the light source reflection light collecting optical fiber are opposite to the light hole of the shading disc. By adopting the near-infrared spectrum analyzer device, the voltage of the light source is automatically adjusted, the intensity of the output light of the light source is kept stable, the wavelength of the near-infrared spectrum analyzer is automatically calibrated, and the diffuse reflection light of the sample is collected at multiple angles through the reflectors at different positions and different angles, so that the near-infrared spectrum analyzer device has wide application range.
Description
Technical Field
The utility model relates to the field of photoelectric devices, in particular to a near-infrared spectrum analyzer device.
Background
Near infrared spectroscopy analysis technology is widely applied to industries such as agriculture, food, chemical industry and pharmacy, is used for rapidly and nondestructively performing qualitative or quantitative analysis on samples, most of the existing products are used for laboratory analysis, have certain requirements on installation environment and need to perform hardware calibration regularly.
For complex production environments, more convenient installation and detection modes are required, for example, non-contact detection is required, the equipment is firm and reliable, can continuously run for more than half a year, and the stability of the equipment is ensured, for example, a light source is stable, the obtained spectrum wavelength is accurate, and the like.
SUMMERY OF THE UTILITY MODEL
The utility model aims to overcome the defects of the prior art and provides a near infrared spectrum analyzer device which has the advantages of stable light intensity, simple and convenient operation and wider application range.
In order to achieve the above object, the near infrared spectrum analyzer of the present invention comprises:
the near infrared spectrum analyzer device is mainly characterized by comprising a halogen light source, a light source reflector, a sample reflector group, a shading disc, a motor, a sample diffuse reflection light collection optical fiber, a light source reflection light collection optical fiber and a near infrared spectrum analyzer, wherein the halogen light source vertically irradiates a detected sample, the shading disc is provided with a light hole, the motor rotates the shading disc and controls the position of the light hole of the shading disc, the near infrared spectrum analyzer is connected with the sample diffuse reflection light collection optical fiber and the light source reflection light collection optical fiber, and the sample diffuse reflection light collection optical fiber and the light source reflection light collection optical fiber are opposite to the light hole of the shading disc.
Preferably, the halogen light source irradiates the sample to be detected, the diffuse reflection light of the sample to be detected passes through the sample reflector group, is reflected to the sample diffuse reflection light collection optical fiber through the light hole of the shading disc, and the sample diffuse reflection light is input to the near-infrared spectrometer through the sample diffuse reflection light collection optical fiber.
Preferably, the light emitted from the halogen light source is reflected to the light source reflected light collecting optical fiber through the light holes of the shading disc by the light source reflector, and the sample reflected light is input to the near-infrared spectrometer by the light source reflected light collecting optical fiber.
Preferably, the device further comprises a control mainboard and a light source power connector, wherein the control mainboard is connected with the halogen light source through the light source power connector, the control mainboard is connected with the near-infrared spectrometer, and the control mainboard adjusts the voltage of the halogen light source to keep the maximum spectrum signal output by the light source constant.
Preferably, the device further comprises a calibration light source and an optical fiber for the calibration light source, the calibration light source is connected with the near-infrared spectrometer through the optical fiber for the calibration light source, the calibration light source is further connected with the control main board, the shading disc periodically shades diffuse reflection light of the sample and light source reflection light, the calibration light source is opened through the control main board, and wavelength correction is performed on the near-infrared spectrometer.
Preferably, the sample reflector group consists of 8 groups of reflectors, is positioned at different positions between the halogen light source and the sample to be detected, and reflects sample diffuse reflection light from different angles to enter the sample diffuse reflection light collecting optical fiber.
By adopting the near-infrared spectrum analyzer device, the voltage of the light source is automatically adjusted, the intensity of the output light of the light source is kept stable, the wavelength of the near-infrared spectrum analyzer is automatically calibrated, and the diffuse reflection light of the sample is collected at multiple angles through the reflectors at different positions and different angles, so that the near-infrared spectrum analyzer device has wide application range.
Drawings
FIG. 1 is a schematic diagram of a near infrared spectrum analyzer apparatus of the present invention.
Reference numerals:
1 halogen light source
2 light source reflector
3 group of sample reflectors
4 light source irradiation direction schematic
5 sample diffuse reflection light direction schematic
6 tested sample
7 diffuse reflected light of the sample is indicated by the direction of the reflector group
8 light source reflected by mirror
9 light hole
10 shading disc
11 Motor
12 sample diffuse reflection light collection optical fiber
13 light source reflected light collecting optical fiber
14 light source power connector
15 calibrating light source
16 near infrared spectrometer
17 control mainboard
18 computer
19 optical fiber for calibration light source
Detailed Description
In order to more clearly describe the technical contents of the present invention, the following further description is given in conjunction with specific embodiments.
The near infrared spectrum analyzer device comprises a halogen light source, a light source reflector, a sample reflector group, a shading disc, a motor, a sample diffuse reflection light collecting optical fiber, a light source reflection light collecting optical fiber and a near infrared spectrometer, wherein the halogen light source vertically irradiates a sample to be measured, the shading disc is provided with a light hole, the motor rotates the shading disc and controls the position of the light hole of the shading disc, the near infrared spectrometer is connected with the sample diffuse reflection light collecting optical fiber and the light source reflection light collecting optical fiber, and the sample diffuse reflection light collecting optical fiber and the light source reflection light collecting optical fiber are opposite to the light hole of the shading disc.
In a preferred embodiment of the present invention, the halogen light source irradiates the sample to be measured, the diffuse reflection light of the sample to be measured passes through the sample mirror group, is reflected to the sample diffuse reflection light collection optical fiber through the light holes of the light shielding plate, and the sample diffuse reflection light is input to the near-infrared spectrometer through the sample diffuse reflection light collection optical fiber.
In a preferred embodiment of the present invention, the light emitted from the halogen light source is reflected by the light source reflector to the light source reflected light collecting fiber through the light transmitting hole of the shutter disk, and the sample reflected light is input to the near-infrared spectrometer through the light source reflected light collecting fiber.
As a preferred embodiment of the present invention, the apparatus further includes a control main board and a light source power connector, the control main board is connected to the halogen light source through the light source power connector, the control main board is connected to the near-infrared spectrometer, and the control main board adjusts the voltage of the halogen light source to keep the maximum spectrum signal output by the light source constant.
As a preferred embodiment of the present invention, the apparatus further includes a calibration light source and an optical fiber for the calibration light source, the calibration light source is connected to the near-infrared spectrometer through the optical fiber for the calibration light source, the calibration light source is further connected to the control motherboard, the shading disc periodically shades the diffuse reflection light of the sample and the light source reflection light, and the calibration light source is turned on by the control motherboard to perform wavelength correction on the near-infrared spectrometer.
In a preferred embodiment of the present invention, the sample reflector group is composed of 8 groups of reflectors, and is located at different positions between the halogen light source and the sample to be measured, and reflects the sample diffuse reflection light from different angles into the sample diffuse reflection light collection optical fiber.
In a specific embodiment of the utility model, the device comprises a halogen light source, a light source reflector, a sample reflector group, a shading disc with a light hole, a motor for controlling the position of the light hole, a sample diffuse reflection light collection optical fiber, a light source power connector, a calibration light source, a near-infrared spectrometer, a control mainboard and a computer.
The light source irradiates a sample, diffuse reflection light of the sample is reflected to the sample diffuse reflection light collection optical fiber through the sample reflector group and the light hole, and the sample reflection light is input to the near-infrared spectrometer through the optical fiber.
Light emitted by the light source is reflected to the light source reflected light collecting optical fiber through the light hole by the light source reflector, and the sample reflected light is input to the near-infrared spectrometer through the optical fiber.
The motor rotates the shading disc to different positions, and the positions of the light holes are controlled, so that light source reflected light and sample diffuse reflected light enter the spectrometer through the optical fibers at different times.
The reflected light of the light source is monitored by the near-infrared spectrometer regularly to obtain a maximum spectrum signal, the voltage of the light source is adjusted by the mainboard, and the maximum spectrum signal output by the light source is kept constant.
And regularly shielding the diffuse reflection light of the sample and the light source reflection light by using a shading disc, opening a calibration light source through a main control board, connecting a near-infrared spectrometer through an optical fiber, and performing wavelength correction on the near-infrared spectrometer.
The sample reflector group consists of at most 8 groups of reflectors, and sample diffuse reflection light is reflected from different angles to enter the sample diffuse reflection light collection optical fiber at different spatial positions.
All the photoelectric devices are connected with and controlled by a main control board, the main control board is connected with a computer, and a user completes the analysis of the sample and the setting of the parameters of the spectrum system through special operating software in the computer.
By adopting the near-infrared spectrum analyzer device, the voltage of the light source is automatically adjusted, the intensity of the output light of the light source is kept stable, the wavelength of the near-infrared spectrum analyzer is automatically calibrated, and the diffuse reflection light of the sample is collected at multiple angles through the reflectors at different positions and different angles, so that the near-infrared spectrum analyzer device has wide application range.
In this specification, the utility model has been described with reference to specific embodiments thereof. It will, however, be evident that various modifications and changes may be made thereto without departing from the broader spirit and scope of the utility model. The specification and drawings are, accordingly, to be regarded in an illustrative rather than a restrictive sense.
Claims (6)
1. The utility model provides a near infrared spectrum analyzer device, its characterized in that, the device include halogen light source, light source speculum, sample speculum group, anti-dazzling screen, motor, sample diffuse reflection collection optic fibre, light source reverberation collection optic fibre and near infrared spectrum appearance, halogen light source vertical irradiation measured sample, anti-dazzling screen on have a light trap, the motor rotatory anti-dazzling screen and control anti-dazzling screen's light trap position, near infrared spectrum appearance connect sample diffuse reflection collection optic fibre and light source reverberation collection optic fibre, sample diffuse reflection collection optic fibre and light source reverberation collection optic fibre just to the light trap of anti-dazzling screen.
2. The near infrared spectrum analyzer device as claimed in claim 1, wherein the halogen light source irradiates the sample to be measured, the diffuse reflection light of the sample to be measured passes through the sample reflector group, is reflected to the sample diffuse reflection light collection optical fiber through the light transmission hole of the light shielding plate, and the sample diffuse reflection light is input to the near infrared spectrometer through the sample diffuse reflection light collection optical fiber.
3. The near infrared spectrum analyzer device as set forth in claim 1, wherein the light from the halogen light source is reflected by the light source reflector through the light transmitting hole of the shutter disk to the light source reflection light collecting fiber, and the sample reflection light is input to the near infrared spectrometer through the light source reflection light collecting fiber.
4. The near-infrared spectrum analyzer device as claimed in claim 1, further comprising a control motherboard and a light source power connector, wherein the control motherboard is connected with the halogen light source through the light source power connector, the control motherboard is connected with the near-infrared spectrum analyzer, and the control motherboard adjusts the voltage of the halogen light source to keep the maximum spectrum signal output by the light source constant.
5. The NIR spectrum analyzer assembly of claim 4, further comprising a calibration light source and an optical fiber for the calibration light source, wherein the calibration light source is connected to the NIR spectrum analyzer via the optical fiber for the calibration light source, the calibration light source is further connected to the control board, the shutter disk periodically blocks the diffuse reflected light from the sample and the reflected light from the light source, and the calibration light source is turned on via the control board to perform wavelength calibration on the NIR spectrum analyzer.
6. The NIR spectrometer apparatus of claim 1, wherein the set of sample reflectors comprises 8 sets of reflectors positioned at different locations between the halogen light source and the sample under test, for reflecting diffuse sample light from different angles into the sample diffuse light collection fibers.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121749907.XU CN215375082U (en) | 2021-07-29 | 2021-07-29 | Near infrared spectrum analyzer device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121749907.XU CN215375082U (en) | 2021-07-29 | 2021-07-29 | Near infrared spectrum analyzer device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215375082U true CN215375082U (en) | 2021-12-31 |
Family
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121749907.XU Active CN215375082U (en) | 2021-07-29 | 2021-07-29 | Near infrared spectrum analyzer device |
Country Status (1)
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|---|---|
| CN (1) | CN215375082U (en) |
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2021
- 2021-07-29 CN CN202121749907.XU patent/CN215375082U/en active Active
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20230621 Address after: 201601 Room 117, Building 1, No. 599, Gaoji Road, Sijing Town, Songjiang District, Shanghai Patentee after: Pusheng Tianchuang Optical Technology (Shanghai) Co.,Ltd. Address before: 200233 Room 501, No. 28, Lane 768, Qinzhou South Road, Xuhui District, Shanghai Patentee before: Song Yong |