CN102539378A - Semiconductor laser array near infrared spectrometer - Google Patents

Semiconductor laser array near infrared spectrometer Download PDF

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Publication number
CN102539378A
CN102539378A CN2012100112794A CN201210011279A CN102539378A CN 102539378 A CN102539378 A CN 102539378A CN 2012100112794 A CN2012100112794 A CN 2012100112794A CN 201210011279 A CN201210011279 A CN 201210011279A CN 102539378 A CN102539378 A CN 102539378A
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CN
China
Prior art keywords
integrating sphere
semiconductor laser
sample
sample cup
light
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Pending
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CN2012100112794A
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Chinese (zh)
Inventor
陈斌
陆道礼
胡静芳
朱文静
詹敦平
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Jiangsu University
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Jiangsu University
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Priority to CN2012100112794A priority Critical patent/CN102539378A/en
Publication of CN102539378A publication Critical patent/CN102539378A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/065Integrating spheres
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/08Optical fibres; light guides

Abstract

The invention discloses a semiconductor laser array near infrared spectrometer and belongs to the technical field of near infrared nondestructive testing. The semiconductor laser array near infrared spectrometer comprises a light source semiconductor laser, an integrating sphere, a sample cup, a microprocessor, a keyboard input and result display device, and a computer data processing unit; the semiconductor laser is connected with the integrating sphere through an optical fiber; light from the semiconductor laser enters the integrating sphere through the optical fiber; the integrating sphere comprises a light incidence hole, a detector port and a sample cup inlet which are integrated on the wall of the integrating sphere; the sample cup is connected with the integrating sphere through the sample cup inlet; and the keyboard input and result display device is arranged on a shell of the spectrometer and is connected with the microprocessor. The computer data processing unit is connected with the microprocessor through a universal serial bus (USB) interface; and the detector port of the outer circumference of the integrating sphere is provided with a detector, and light signal change detected by the detector is connected with the microprocessor through a preamplification circuit. The spectrometer can quickly detect different components.

Description

The semiconductor laser array near-infrared spectrometers
Technical field
The invention belongs to the near infrared technical field of nondestructive testing, relate to a kind of novel semiconductor laser array near-infrared spectrometers.
Background technology
Near-infrared spectrum analysis is as a kind of analytical approach rapidly and efficiently, can carry out fast, accurately quantitatively or qualitative analysis various samples such as comprising from gas to transparent or muddy liquid, from homogenate to the powder, from the solid material to the biological tissue.Near-infrared spectrum analysis (NIR) is one of high-new analytical technology with the fastest developing speed over past ten years, and its amount of samples is few and do not destroy sample, need not sample is carried out chemical treatment; And can carry out quantitative test simultaneously to the multiple composition in the sample in the short time at 1 ~ 2 minute the utmost point; It is low to have cost, and speed is fast, and precision is high; Pollution-free, be convenient in real time, advantages such as on-line analysis and control.
The near infrared detection technology all obtains fine application in fields such as agricultural, petrochemical industry, pharmacy, food, and obtains fabulous society and economic benefit.Composition detection like the check of the bread basket in the agricultural product, dairy produce; Half-finished on-line monitoring of each stage in the detection of finished product and the preparation process in the pharmaceuticals industry.In drug abuse test, near-infrared spectral analysis technology has been the differentiation means of the medicine true and false of a large-scale popularization.Aspect the analysis of effective component of near-infrared spectral analysis technology in raw-material quality differentiation of Chinese medicine and preparation application is arranged also.China abounds in tea, and the online detection of studying tealeaves grade and tea product process with near-infrared spectral analysis technology fast all has report.In recent years, near-infrared spectrum analysis is used widely in petrochemical field, and is applied to online process analysis procedure analysis gradually.
Traditional near-infrared spectrometers kind is a lot, can be divided into set wave elongated and sweep type, and the set wave elongated is divided into optical filter type and LED type again; Optical filter type near-infrared spectrometers adopts some interference filters that the light that light emitted goes out is carried out beam split; As required wavelength rotatable lamella wheel is selected a suitable optical filter light path during measurement, and the instrument volume very much not is convenient for carrying, the monochromatic bands of a spectrum broad of this analyser; The wavelength resolution rate variance; Power consumption is big, and effectively luminous power is little, and the life-span is short.Light emitting diode (LED) type near-infrared spectrometers is to adopt LED as light source; Produce different wavelengths with different light emitting diodes; The spectral half-width of such near-infrared analyzer is excessive to be reached more than the 30nm, has satisfied not the selection requirement for accurate specific wavelength, still can adopt LED to add the mode of optical filter in addition on some instrument; The too small situation of effective luminous power be can occur equally, measuring accuracy and accuracy influenced.Sweep type is divided into grating type, fourier-type, acousto-optic turnable filter type (AOTF type) and multi-channel type again.What the grating type near-infrared analyzer adopted is grating beam splitting, so the restriction of slit makes its resolution and sensitivity lower, and strict to light path, and extraneous light intensity can influence test result, and sweep velocity is slow.The fourier-type near-infrared analyzer can shake and deflection in scanning process because of having moving-member, causes the instability of interference signal, and sensitivity descends.Acousto-optic turnable filter type (AOTF type) near-infrared analyzer uses the arrangement of alternating electric field control crystal to realize the beam split to complex light, the bands of a spectrum broad of beam split, and resolution is lower, and natural veiling glare can be influential.The principle of multi-channel type near-infrared analyzer is: the light that light source sends focuses on the fixed grating through behind the sample, and the light after the holographic grating chromatic dispersion is detected by multichannel detector simultaneously.Its shortcoming is that dynamic range is limited, and to responsive to temperature.
Early 1970s has been started the new period that semiconductor laser develops after having realized the room temperature of semiconductor laser, continuous sharp penetrating.It has been an irreplaceable important light source in optical-fibre communications, Fibre Optical Sensor, video disc recording storage, light interconnection, laser printing and printing, laser molecular spectroscopy and the solid state laser pumping at present; In addition, also be widely used at the aspects such as fundamental research of optical measurement, robot and control automatically, medical treatment, atom and molecular physics.It has been to need indispensable optical device in the optoelectronic device of high efficiency monochromatic light source.
The principle of work of semiconductor laser (LD) is; Utilize semiconductor substance (both having utilized electronics) can interband transition luminous, form two parallel reflective mirrors as catoptron, the composition resonator cavity with the cleavage plane of semiconductor crystal; The radiation of light generation, feedback, generation light is amplified, output laser.Compare with the laser instrument of other kinds; Semiconductor laser has very outstanding advantage; Except advantages such as volume is little, in light weight, conversion efficiency is high, power saving; The sharp radio frequency rate of semiconductor laser can be tuning in the scope of broad, swash to penetrate power and frequency can make things convenient for, directly modulate efficiently, and modulation range is big.And LD spectrum is compared its half-breadth less than 2nm with LED spectrum, and limit film rejection ratio is greater than 30dB, and effectively luminous power is high.
Summary of the invention
In order to overcome the existing limitation of traditional near-infrared spectrometers, a kind of semiconductor laser array (LD) spectroanalysis instrument is provided.
A kind of semiconductor laser array spectroanalysis instrument, this instrument comprise light source semiconductor laser, integrating sphere, sample cup, microprocessor, keyboard input and device displaying result, computer data processing unit; Described semiconductor laser is connected with integrating sphere through optical fiber, and the light of semiconductor laser gets into integrating sphere through optical fiber; Described integrating sphere comprises incident light hole, detector mouth and the sample cup inlet that is integrated on the integrating sphere wall, and sample cup is connected with integrating sphere by the sample cup inlet; The keyboard input places on the shell of instrument with device displaying result, links to each other with microprocessor.The computer data processing unit links to each other with microprocessor through USB interface; Establish detector on the detector mouth on the excircle of integrating sphere, the change in optical signal that detector is measured links to each other with microprocessor through pre-amplification circuit.
Wherein said semiconductor laser (LD) is a semiconductor laser array; At first different semiconductor lasers (LD) array is arranged; And by optical fiber light is spread out of, then multiple beams of optical fiber is carried out outer coupling through coupling mechanism, and by an optical fiber output; Through the incident light hole of integrating sphere, sample in the sample cell is shone.Can select different LD wave bands to encapsulate according to user's needs,, can in the LD that has encapsulated, select a combination to light in addition as required and measure the different samples composition to meet the different needs.
The sample cup of wherein said integrating sphere enters the mouth to have and is used for making sample cup fixing groove and register pin; Light gets into integrating sphere through incident light hole, and sample cup is inserted integrating sphere by the sample cup inlet, and the rotary sample cup is until register pin entering flange circle groove, with its stationkeeping.Rayed constantly reflects at integrating sphere inwall and sample surfaces on sample cup, and sample fully absorbs light in the sample cup, puts into the light signal that detector will carry sample message in the detector hole and converts electric signal to and pass to microprocessor.
Wherein said sample cup adopts low-hydroxy-group squartz glass to make; Shape adopts cylindrical; The lower end adds the end, and adopts the flange circle to fix the degree of depth of inserting integrating sphere, fluted on the flange circle register pin on the integrating sphere is inserted so that accurate localization more; Sample cup is vertically put into integrating sphere inside by integrating sphere sample chamber inlet, realizes the bulk absorption of sample near infrared light, the sample chamber specification and the measurement model parameter of the corresponding different-diameter of design feature per sample.
Adopt near-infrared spectrometers provided by the present invention,, when spectrum is gathered, can select for use different semiconductor lasers to make up and light, thereby can detect multiple heterogeneity because light source is arranged by a plurality of semiconductor laser array formulas.The present invention adopts integrating sphere diffuse reflection mode that microprocessor is collected and passed to the light signal that carries sample message and handles.
Description of drawings
Fig. 1 is the structural drawing of semiconductor laser array provided by the present invention (LD) near-infrared analyzer;
Fig. 2 is that light source provided by the present invention is connected synoptic diagram with the spectra collection unit;
Fig. 3 is integrating sphere diagrammatic cross-section provided by the present invention and sample cup structural representation;
Fig. 4 is a sample cup structural representation provided by the present invention.
Embodiment
Below in conjunction with accompanying drawing the present invention is described further.
Fig. 1 is the composition structural representation of semiconductor laser array provided by the present invention (LD) near-infrared spectrometers; This instrument comprises light source semiconductor laser 10, integrating sphere 20, sample cup 30, microprocessor 50, keyboard input and device displaying result 60, computer data processing unit 70; Described semiconductor laser 10 is connected with integrating sphere 20 through optical fiber 13, and the light of semiconductor laser 10 gets into integrating sphere 20 through optical fiber 13; Described integrating sphere 20 comprises the incident light hole 21 that is integrated on the integrating sphere wall, detector mouth 25 and sample cup inlet 22, and sample cup 30 is connected with integrating sphere 20 by sample cup inlet 22; The keyboard input places on the shell 90 of instrument with device displaying result 60, links to each other with microprocessor 50.Computer data processing unit 70 links to each other with microprocessor 50 through USB interface 71; Establish detector 40 on the detector mouth 25 on the excircle of integrating sphere 20, the change in optical signal that detector is measured links to each other with microprocessor through pre-amplification circuit.
As shown in Figure 2; Wherein said semiconductor laser (LD) 10 is a semiconductor laser array, at first different semiconductor lasers (LD) array is arranged, and by optical fiber 12 light is spread out of; Then multiple beams of optical fiber 12 is carried out outer coupling through coupling mechanism 11; And,, sample in the sample cell 30 is shone through the incident light hole 21 of integrating sphere 20 by 13 outputs of an optical fiber.Can select different LD wave bands to encapsulate according to user's needs,, can in the LD that has encapsulated, select a combination to light in addition as required and measure the different samples composition to meet the different needs.
The output power of said semiconductor laser 10 can difference per sample be preestablished by the user; In order to guarantee the unanimity of sample test; Output power after the setting is constant as much as possible; Semiconductor laser is input as excitation with electric current, can adopt current feedback circuit to obtain stable input current, obtains stable luminous power through the control to electric current.
Described integrating sphere as shown in Figure 3 comprises that the incident light hole 21 that is integrated on the integrating sphere wall, sample cup inlet 22 and detector mouth 25 form, and sample cup inlet 22 has and is used for making sample cup fixing groove 23 and register pin 24; Light gets into integrating sphere 20 through incident light hole 21, and sample cup 30 is inserted integrating sphere 20 by sample cup inlet 22, and rotary sample cup 30 is until register pin 24 entering flange circles 31 grooves 32, with its stationkeeping.Rayed is on sample cup 30; Constantly reflect at integrating sphere 20 inwalls and sample surfaces; Sample fully absorbs light in the sample cup 30, puts into the light signal that detector 40 will carry sample message in the detector hole 25 and converts electric signal to and pass to microprocessor 50.
As shown in Figure 4; Described sample cup 30 adopts low-hydroxy-group squartz glass to make; Shape adopts cylindrical; The lower end adds the end, and adopts flange circle 31 to fix the degree of depth of inserting integrating sphere, and fluted 32 make when being used to detect register pin 24 on the integrating sphere 20 insert so that accurate localization more on the flange circle 31; Sample cup 30 is vertically put into integrating sphere 20 inside by integrating sphere sample chamber inlet 22, realizes the bulk absorption of sample near infrared light, the sample chamber specification and the measurement model parameter of the corresponding different-diameter of design feature per sample.
The semiconductor indium that described detector 40 adopts is sowed the arsenic detector, is used to receive the diffuse transmission spectral signal of the material of surveying that all is distributed in the integrating sphere inwall, and is these near infrared light signal transition that carry sample message electric signal.
50 pairs of electric signal that receive of described microprocessor are handled, and comprise semiconductor laser (LD) control module, A/D modular converter, computing module and memory module.
Wherein said semiconductor laser (LD) control module is used for array of controls formula semiconductor laser 10, comprising selection to required LD, and lighting order and lighting the control of time and the LD that selects to the FEEDBACK CONTROL of LD input current stability.
The analog signal conversion that described A/D modular converter is used for detector 40 output is a digital signal so that to data analyze, processing, computing.Under the A/D modular converter can adopt A/D converter, its formation and to be connected to those skilled in the art known.
The data that described memory module stores data processor is produced when carrying out this program with storage are so described storer comprises the zone of the data that the memory processes program is produced when carrying out this program with storage.
Described computing module can be set up instance model according to the sample of measuring in advance, and according to this instance model the sample that will measure is predicted.
Input of described keyboard and display module 60 as a result, the keyboard input is used for the pattern that detects is selected, and luminous power is regulated, and data processing mode is selected.Display is used for the demonstration to result.
Described computer data processing unit 70 is used for the processing to data, and sets up model, through USB interface 71, the model of setting up is passed in the respective memory of microprocessor 50, after being convenient to it is directly called.
Described semiconductor laser (LD) near-infrared spectrometers also comprises shell 90, attaching plug 85, switch 80, USB interface 71, is used to control whole instrument, and is as shown in Figure 1.
The test operation of sample is following:
1. plug in 85, turn on the power switch 80, the parameter of installing each annex is provided with.As the intensity of light source is set, chooses the combination of required measurement wavelength and light the time interval etc. in turn.
2. with the testing sample sample cup 30 of packing into, sample size was not for ning flange circle 31, entered the mouth by sample cup and 22 inserted in the integrating sphere 20.The illumination that semiconductor laser 10 sends is mapped to the testing sample surface; And in integrating sphere 20, constantly reflect; Sample fully absorbs light in the sample cup; Detector receives and carries the light of sample message and convert thereof into electric signal subsequently, and passes in the microprocessor 50, through the A/D conversion equipment analog signal conversion is become digital signal; And choose the model of having set up test volume is calculated, a certain quality index values of this material that calculates is shown with device displaying result through the keyboard input.
3. the sample after will testing takes out, and the cleaning sample cup is done test next time and prepared.
Through instance the present invention is done below and specify.
The present invention can measure the component content of multiple material, lifts an embodiment that is used for tealeaves moisture content detection at this, and the detection of other samples can be with reference to the detection method of this embodiment.
At first the characteristic wavelength of moisture and the semiconductor laser 10 of reference wavelength are carried out the array encapsulation; And the optical fiber of output carried out outer coupling by coupling mechanism 11, be connected to light entrance port 21 with in the light input integral ball by an optical fiber output (or from the semiconductor laser array that has encapsulated, choose required wavelength combinations and light) at last.
Get some parts of the tealeaves (about 100 parts) of different in moisture, a part is as calibration set (about 80 parts), and remainder is as forecast set (about 20 parts).According to the water cut of the national standard of existing tea quality inspection and industry standard GB8304-87 mensuration all samples as measured value; With semiconductor laser (LD) near-infrared spectrometers it is carried out spectra collection, the absorption spectrum signal value that obtains detecting device is kept in the microprocessor 50.Then through usb communication interface 71 with data importing in computer data processing unit 70, set up the correlation model between spectral signal value and the tealeaves water cut.The model parameter that obtains is written in microprocessor 50 respective storage areas of spectrometer through usb communication interface 71.
Next just can carry out fast measuring to the tealeaves of unknown moisture.The line 85 that plugs in turns on the power switch 80, and selecting detecting patterns through the keyboard input with display module 60 is the tealeaves water content detection; With tealeaves to be measured sample cup 30 is filled to and did not have the flange circle, add a cover, insert by sample cup inlet 22 and rotate to register pin 24 and place in the flange circle groove 32, begin to detect; Program according to prior setting; Begin to light in turn combination of light sources selected in the incident light source, the entering integrating sphere 20 that light source sends, wall and sample surfaces constantly reflect within it; Sample fully absorbs light in the sample cup 30, and the light that diffuse reflection is come out device 40 to be detected receives; The near infrared light signal transition that detecting device will carry sample message is an electric signal, changes in the digital signal input microprocessor 50 through A/D again; Microprocessor is accepted this spectral signal value and spectral signal value substitution Model Calculation, the keyboard input with can show this tealeaves water cut on the display module 60 as a result, so far the tealeaves water cut detects and finishes.
Above-mentioned near infrared detection method can realize the modeling of instrument, after the modelling, realizes the fast detecting and the demonstration of the index of quality.
This instance only is an embodiment of the present invention.Obviously, the present invention is not limited only to this, and many distortion can also be arranged, and all distortion that those of ordinary skill in the art can directly derive or associate from content disclosed by the invention all should be thought protection scope of the present invention.

Claims (5)

1. a semiconductor laser array spectroanalysis instrument is characterized in that comprising light source semiconductor laser, integrating sphere, sample cup, microprocessor, keyboard input and device displaying result, the computer data processing unit; Described semiconductor laser is connected with integrating sphere through optical fiber, and the light of semiconductor laser gets into integrating sphere through optical fiber; Described integrating sphere comprises incident light hole, detector mouth and the sample cup inlet that is integrated on the integrating sphere wall, and sample cup is connected with integrating sphere by the sample cup inlet; The keyboard input places on the shell of instrument with device displaying result, links to each other with microprocessor.
2. the computer data processing unit links to each other with microprocessor through USB interface; Establish detector on the detector mouth on the excircle of integrating sphere, the change in optical signal that detector is measured links to each other with microprocessor through pre-amplification circuit.
3. a kind of semiconductor laser array spectroanalysis instrument according to claim 1; It is characterized in that wherein said semiconductor laser is a semiconductor laser array, at first different semiconductor laser array formulas are arranged, and light is spread out of by optical fiber; Then multiple beams of optical fiber is carried out outer coupling through coupling mechanism; And,, sample in the sample cell is shone through the incident light hole of integrating sphere by an optical fiber output; Select different LD wave bands to encapsulate according to user's needs,, perhaps in the LD that has encapsulated, select a combination to light as required and measure the different samples composition to meet the different needs.
4. a kind of semiconductor laser array spectroanalysis instrument according to claim 1, the sample cup inlet that it is characterized in that wherein said integrating sphere have and are used for making sample cup fixing groove and register pin; Light gets into integrating sphere through incident light hole, and sample cup is inserted integrating sphere by the sample cup inlet, and the rotary sample cup is until register pin entering flange circle groove, with its stationkeeping; Rayed constantly reflects at integrating sphere inwall and sample surfaces on sample cup, and sample fully absorbs light in the sample cup, puts into the light signal that detector will carry sample message in the detector hole and converts electric signal to and pass to microprocessor.
5. a kind of semiconductor laser array spectroanalysis instrument according to claim 1; It is characterized in that wherein said sample cup adopts low-hydroxy-group squartz glass to make; Shape adopts cylindrical; The lower end adds the end, and adopts the flange circle to fix the degree of depth of inserting integrating sphere, fluted on the flange circle register pin on the integrating sphere is inserted so that accurate localization more; Sample cup is vertically put into integrating sphere inside by integrating sphere sample chamber inlet, realizes the bulk absorption of sample near infrared light, the sample chamber specification and the measurement model parameter of the corresponding different-diameter of design feature per sample.
CN2012100112794A 2012-01-16 2012-01-16 Semiconductor laser array near infrared spectrometer Pending CN102539378A (en)

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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102890070A (en) * 2012-09-14 2013-01-23 江苏惠通集团有限责任公司 Near infrared spectrum analyzer for quality of agricultural product based on micro electro-mechanical technology
CN105008896A (en) * 2012-12-11 2015-10-28 内克西斯公司 Photoreflectance device
CN105424624A (en) * 2015-11-11 2016-03-23 广州讯动网络科技有限公司 Detector based on semiconductor laser unit and parameter adjustment method of detector
CN106918577A (en) * 2017-03-02 2017-07-04 许昌学院 The detection means and method of a kind of medicine
CN107478966A (en) * 2017-07-26 2017-12-15 国网上海市电力公司 A kind of partial-discharge measuring device and measuring method using integration photometry
CN109253981A (en) * 2018-11-12 2019-01-22 武汉轻工大学 Quantitative Analysis Model method for building up and device based on infrared spectroscopy
CN110231369A (en) * 2019-07-15 2019-09-13 南通科技职业学院 A kind of detection device and detection method of chicken meat
JP2020177026A (en) * 2020-07-16 2020-10-29 パナソニックIpマネジメント株式会社 Water content observation device, water content observation method and cultivation device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201107114Y (en) * 2007-09-10 2008-08-27 江苏大学 Multi-light path output type integrating sphere
CN201277944Y (en) * 2008-05-23 2009-07-22 江苏大学 Integrating sphere detection system
WO2010073778A1 (en) * 2008-12-25 2010-07-01 浜松ホトニクス株式会社 Spectrometer, spectrometry, and spectrometry program
CN101907564A (en) * 2010-06-24 2010-12-08 江苏大学 Rapeseed quality non-destructive testing method and device based on near infrared spectrum technology

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201107114Y (en) * 2007-09-10 2008-08-27 江苏大学 Multi-light path output type integrating sphere
CN201277944Y (en) * 2008-05-23 2009-07-22 江苏大学 Integrating sphere detection system
WO2010073778A1 (en) * 2008-12-25 2010-07-01 浜松ホトニクス株式会社 Spectrometer, spectrometry, and spectrometry program
CN101907564A (en) * 2010-06-24 2010-12-08 江苏大学 Rapeseed quality non-destructive testing method and device based on near infrared spectrum technology

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
胡静芳等: "基于半导体激光器的近红外农产品品质专用检测仪的设计", 《基于半导体激光器的近红外农产品品质专用检测仪的设计》, 31 August 2011 (2011-08-31), pages 82 - 85 *

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102890070A (en) * 2012-09-14 2013-01-23 江苏惠通集团有限责任公司 Near infrared spectrum analyzer for quality of agricultural product based on micro electro-mechanical technology
CN105008896A (en) * 2012-12-11 2015-10-28 内克西斯公司 Photoreflectance device
CN105008896B (en) * 2012-12-11 2017-08-18 内克西斯公司 Light reflecting device
CN105424624A (en) * 2015-11-11 2016-03-23 广州讯动网络科技有限公司 Detector based on semiconductor laser unit and parameter adjustment method of detector
CN105424624B (en) * 2015-11-11 2018-11-20 广州讯动网络科技有限公司 A kind of detector and its parameter regulation means based on semiconductor laser
CN106918577A (en) * 2017-03-02 2017-07-04 许昌学院 The detection means and method of a kind of medicine
CN107478966A (en) * 2017-07-26 2017-12-15 国网上海市电力公司 A kind of partial-discharge measuring device and measuring method using integration photometry
CN109253981A (en) * 2018-11-12 2019-01-22 武汉轻工大学 Quantitative Analysis Model method for building up and device based on infrared spectroscopy
CN109253981B (en) * 2018-11-12 2021-04-27 武汉轻工大学 Method and device for establishing quantitative analysis model based on infrared spectrum
CN110231369A (en) * 2019-07-15 2019-09-13 南通科技职业学院 A kind of detection device and detection method of chicken meat
JP2020177026A (en) * 2020-07-16 2020-10-29 パナソニックIpマネジメント株式会社 Water content observation device, water content observation method and cultivation device

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Application publication date: 20120704