CN215263587U - Sample in-situ bending clamp for atomic force microscope - Google Patents
Sample in-situ bending clamp for atomic force microscope Download PDFInfo
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- CN215263587U CN215263587U CN202121110898.XU CN202121110898U CN215263587U CN 215263587 U CN215263587 U CN 215263587U CN 202121110898 U CN202121110898 U CN 202121110898U CN 215263587 U CN215263587 U CN 215263587U
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Abstract
The utility model relates to a sample in-situ bending clamp for an atomic force microscope, which comprises a base and a pressing plate, wherein the base comprises a bottom plate and a support fixed on the bottom plate, and a vertical top plate is arranged on the bottom plate; the pressing plate is vertically connected to the support in a sliding mode and fixed on the support in an adjustable mode through the locking device, an opening is formed in the position, corresponding to the top plate, of the pressing plate, two opposite upper pressing heads are arranged in the opening, and the two upper pressing heads are located on two sides of the top plate respectively. The sample in-situ bending clamp in the utility model can be adjusted and arranged by sliding the pressing plate up and down, and the pressing plate is utilized to drive the two upper pressing heads to carry out in-situ bending on the sample to be measured, thereby ensuring the accuracy and repeatability of the bending, and reducing the overall size of the clamp and the height of a sample detection area as much as possible to adapt to the narrow space of the sample area of the atomic force microscope; in addition, the in-situ continuous bending change of the sample to be measured from a plane to a preset bending angle can be realized.
Description
Technical Field
The utility model belongs to the technical field of test fixture, especially, relate to a crooked anchor clamps of sample normal position for atomic force microscope.
Background
In a sample clamping device in an existing atomic force microscope, a device for bending a sample in situ generally adopts two clamping heads to clamp two ends of the sample respectively, and the sample is bent by driving the two clamping heads to approach each other, which has the following disadvantages: firstly, the precision of sample bending is low, and the bending consistency is poor when different samples are bent at the same curvature radius; secondly, the sample in-situ moves upwards and changes in the bending process, so that the sample collides with a detection probe of the atomic force microscope to damage the probe, and the sample in-situ can not be continuously bent from a planar state to a preset bending angle.
SUMMERY OF THE UTILITY MODEL
The utility model aims to at least solve not enough among the prior art to a certain extent, provide a crooked anchor clamps of sample normal position for atomic force microscope.
In order to achieve the above object, the present invention provides a specimen in-situ bending fixture for an atomic force microscope, including:
the base comprises a bottom plate and a support fixed on the bottom plate, and a vertical top plate is arranged on the bottom plate;
the pressing plate is connected to the support in a vertically sliding mode and is fixed on the support in an adjustable mode through the locking device, an opening is formed in the position, corresponding to the top plate, of the pressing plate, two opposite upper pressing heads are arranged in the opening, and the two upper pressing heads are located on two sides of the top plate respectively.
Preferably, a light through hole is formed on the central axis of the top plate, and the light through hole penetrates through the bottom plate.
Preferably, the top surface of the top plate is a curved surface, and the curved surface extends to positions adjacent to the two ends along the longitudinal direction and is provided with a stopping portion respectively.
Preferably, the two upper pressing heads are fixed on the pressing plate with adjustable relative distance.
Preferably, one side of the support is provided with a slide rail extending along the vertical direction, the slide rail is provided with a slide block, and the press plate and the slide block are relatively fixed, so that the press plate can slide up and down relative to the support.
Preferably, the locking device comprises an adjusting bolt and a linkage assembly, the adjusting bolt is transversely in threaded connection with the support, the adjusting bolt is in transmission connection with the sliding block through the linkage assembly, and the linkage assembly can convert the transverse movement of the adjusting bolt into the vertical sliding of the sliding block.
Preferably, a mounting frame is fixed to the top of the sliding block, the pressing plate is fixedly connected with the mounting frame, the linkage assembly comprises a transmission rod and a shifting wheel, the shifting wheel is rotatably arranged on the other side wall of the support, opposite to the sliding rail, of the supporting seat, the upper end of the transmission rod is fixedly connected with the sliding block, and the lower end of the transmission rod abuts against the shifting wheel; the tail end of the screw rod part of the adjusting bolt abuts against the shifting wheel, when the adjusting bolt is rotated to enable the adjusting bolt to move transversely, the shifting wheel can be driven to rotate in the forward direction or in the reverse direction, and the transmission rod is driven to drive the sliding block to slide up and down along the sliding rail through the mounting frame.
Preferably, a vertical guide hole is formed in the support, and the locking device further comprises a locking bolt, wherein the locking bolt penetrates through the guide hole and is in threaded connection with the sliding block, so that the sliding block is adjustably fixed on the support.
Preferably, the mounting bracket includes a fixing plate and a connecting plate perpendicular to each other, the fixing plate is fixed to the upper end of the slider, the upper end of the connecting plate is fixed to the fixing plate, and the lower end of the connecting plate is fixed to the pressing plate.
The sample in-situ bending clamp in the utility model can be adjusted and arranged by sliding the pressing plate up and down, and the pressing plate is utilized to drive the two upper pressing heads to carry out in-situ bending on the sample to be measured, thereby ensuring the accuracy and repeatability of the bending, and reducing the overall size of the clamp and the height of a sample detection area as much as possible to adapt to the narrow space of the sample area of the atomic force microscope; in addition, the in-situ continuous bending change of the sample to be measured from a plane to a preset bending angle can be realized.
Drawings
In order to illustrate the embodiments of the present invention or the technical solutions in the prior art more clearly, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.
Fig. 1 is a first schematic structural diagram of a sample in-situ bending fixture according to an embodiment of the present invention;
FIG. 2 is an exploded view of FIG. 1;
fig. 3 is a schematic structural view of the middle top plate of the present invention;
fig. 4 is an assembly schematic diagram of the middle press plate and the upper press head of the present invention;
fig. 5 is a schematic structural diagram of a sample in-situ bending fixture according to an embodiment of the present invention.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present invention, and should not be construed as limiting the present invention, and all other embodiments obtained by those skilled in the art without creative efforts based on the embodiments of the present invention belong to the protection scope of the present invention.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "circumferential", "radial", and the like, indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically limited otherwise.
Referring to fig. 1 and 2, an embodiment of the present invention provides a sample in-situ bending fixture for an atomic force microscope, including a base 10 and a pressing plate 20, where the base 10 includes a bottom plate 11 and a support 12 fixed on the bottom plate 11, and a vertical top plate 13 is disposed on the bottom plate 11; the pressing plate 20 is connected to the support 12 in a vertically sliding manner and is adjustably fixed on the support 12 through the locking device 30, an opening 21 is formed in the position, corresponding to the top plate 13, of the pressing plate 20, two opposite upper pressing heads 22 are arranged in the opening 21, and the two upper pressing heads 22 are respectively located on two sides of the top plate 13.
That is, the pressing plate 20 can be moved up and down in the vertical direction and fixed at any position relative to the bottom plate 11 while being kept horizontal as a whole, in this embodiment, the top plate 13 is disposed along the longitudinal direction, and the two upper pressing heads 22 are respectively disposed on both lateral sides of the top plate 13; when the device is specifically applied, the pressure plate 20 is lifted upwards until the two upper pressure heads 22 are approximately flush with the top surface of the top plate 13, the central axis of a sample to be tested is abutted against the top of the top plate 13, two ends of the sample to be tested are respectively abutted against the bottoms of the two upper pressure heads 22, then the height of the pressure plate 20 is adjusted downwards, and then the sample to be tested is subjected to in-situ bending, and the bending range can be bent to 3mm curvature radius from a flat state; compared with the existing mode of realizing the bending of the sample to be tested by the mutual approach of the two clamping heads, the sample in-situ bending clamp of the embodiment can ensure the accuracy and the repeatability of the bending by controlling the height of the pressing plate 20; in addition, because the bending of the sample to be tested is realized by the action of the two upper pressing heads 22 which are pressed downwards and matched with the top plate 13, the original position (analysis site) of the sample to be tested is fixed and unchanged, and the analysis site can be continuously bent from a plane to a preset bending angle.
Further, as shown in fig. 3, a light hole 131 is formed on the central axis of the top plate 13, and the light hole 131 penetrates through the bottom plate 11. When the sample in-situ bending clamp is arranged on the atomic force microscope, a light source at the bottom of the sample in-situ bending clamp can irradiate on a sample to be measured from the light through hole 131; in order to facilitate the installation of the in-situ bending fixture of the sample, a magnet can be installed at the bottom of the bottom plate 11 to facilitate the positioning during the installation.
Preferably, in order to make the sample to be tested more stable during bending, in this embodiment, the top surface of the top plate 13 is set as a curved surface 132, the curved surface 132 extends longitudinally to positions adjacent to the two ends and is provided with the stopping portions 133, that is, the length of the curved surface 132 between the two stopping portions 133 is adapted to the width of the sample to be tested, after the sample to be tested is bent in situ, the two stopping portions 133 can be used for stopping and positioning, so as to prevent the sample to be tested from coming out of the fixture, and ensure the installation stability of the sample to be tested. It should be noted that the top plate 13 is detachably connected to the bottom plate 11, and the top plate 13 can be replaced when samples to be measured with different width sizes are to be replaced.
Further, as shown in fig. 4, two upper indenters 22 are fixed to the pressing plate 20 with an adjustable relative distance therebetween. That is, the pressing plate 20 is located the position of the relative both sides of opening 21 and has been seted up horizontal bar hole 23 respectively, but go up that pressure head 22 lateral shifting's pass through bar hole 23 cooperation latch segment 24 and be fixed in on the pressing plate 20 to adjust two relative distances between the pressure head 22, so adapt to the crooked needs of the sample that awaits measuring of different length.
In one embodiment, as shown in fig. 2, a sliding way of this embodiment is to provide a sliding rail 121 extending in a vertical direction on one side of the support 12, a sliding block 122 is provided on the sliding rail 121, and the pressing plate 20 and the sliding block 122 are relatively fixed, so that the pressing plate 20 can slide up and down relative to the support 12. Of course, in other embodiments, other ways of slidably coupling the pressure plate 20 to the support 12 may be used.
As shown in fig. 5, the locking device 30 includes an adjusting bolt 31 and a linkage assembly 32, the adjusting bolt 31 is transversely screwed on the support 12, the adjusting bolt 31 is drivingly connected with the slider 122 through the linkage assembly 32, and the linkage assembly 32 enables the transverse movement of the adjusting bolt 31 to be converted into the vertical sliding movement of the slider 122. Specifically, a mounting block 124 is fixed on the other side wall of the support 12 opposite to the slide rail 121, a connecting head 125 is convexly arranged on one side of the mounting block 124 away from the top plate 13, an external thread is arranged on the outer peripheral wall of the connecting head 125, a transverse through hole penetrating through the mounting hole is formed inside the connecting head 125, the adjusting bolt 31 is in threaded connection with the connecting head 125, a screw portion of the adjusting bolt penetrates through the mounting block 124 through the through hole and is in transmission connection with the linkage assembly 32, the adjusting bolt 31 can move transversely when the adjusting bolt 31 is rotated, the sliding block 122 is driven to vertically slide through the linkage assembly 32, and the pressing plate 20 is driven to slide up and down, so that in-situ bending of a sample to be measured and adjustment of the bending radius are realized.
Specifically, a mounting frame 25 is fixed on the top of the slider 122, the mounting frame 25 includes a fixing plate 251 and a connecting plate 252 perpendicular to each other, the fixing plate 251 fixes the upper end of the slider 122, the upper end of the connecting plate 252 is fixed on the fixing plate 251, and the lower end of the connecting plate 252 is fixed on the pressure plate 20, preferably, the pressure plate 20 and the fixing plate 251 are perpendicular to the connecting plate 252 and located on two opposite sides of the connecting plate 252, respectively, so as to reduce the distance between the pressure plate 20 and the bottom plate 11, thereby reducing the overall size of the fixture and the height of the sample detection region as much as possible to adapt to the narrow space of the sample region of the afm.
Preferably, the linkage assembly 32 includes a transmission rod 322 and a thumb wheel 321, the thumb wheel 321 is rotatably disposed on the other side wall of the support 12 opposite to the slide rail 121, the upper end of the transmission rod 322 is fixedly connected with the slider 122, and the lower end abuts against the thumb wheel 321; the end of the screw portion 311 of the adjusting bolt 31 abuts against the thumb wheel 321, and when the adjusting bolt 31 is rotated to move transversely, the thumb wheel 321 is driven to rotate in the forward direction or in the reverse direction, so as to drive the transmission rod 322 to drive the slider 122 to slide up and down along the slide rail 121 through the mounting bracket 25.
It should be noted that the dial wheel 321 is rotatably mounted on the support 12 through a rotating shaft, and a first dial portion 323 and a second dial portion 324 which are perpendicular to each other are convexly disposed on the dial wheel, the first dial portion 323 abuts against the end of the screw portion 311 of the adjusting bolt 31, and the second dial portion 324 abuts against the lower end of the transmission rod 322; when the adjusting bolt 31 rotates and moves in a direction close to the dial wheel 321, the dial wheel 321 is driven to rotate in a positive direction (clockwise direction in fig. 5) by the first toggle part 323, and meanwhile, the second toggle part 324 pushes the transmission rod 322 upwards, so as to drive the slider 122, the mounting rack 25 and the pressing plate 20 to move upwards integrally; when the adjusting bolt 31 rotates and moves away from the thumb wheel 321, the slider 122, the mounting bracket 25 and the pressing plate 20 slide downward under the action of gravity; preferably, a tension spring is further disposed between the support 12 and the slider 122, so that the slider 122 always receives a vertical downward tension, so that the transmission rod 322 always abuts against the second toggle portion 324, and the adjustment precision of the adjustment bolt 31 is ensured. Furthermore, a vertical guide hole 123 is formed on the support 12, and the locking device 30 further includes a locking bolt 33, wherein the locking bolt 33 is threaded to the sliding block 122 through the guide hole 123, so as to adjustably fix the sliding block 122 on the support 12; after the height of the pressing plate 20 is adjusted to a desired position by the adjusting bolt 31, the locking bolt 33 can be screwed to fix the sliding block 122 and the support 12 together, so that the pressing plate 20 is fixed relative to the bottom plate 11; in addition, in order to ensure the accuracy of bending and realize the bending with the same curvature radius for different samples to be measured, the adjusting bolt 31 is provided with a plurality of scales corresponding to the height of the pressing plate 20.
In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
Above is the description to the technical scheme that the utility model provides, to technical personnel in the field, according to the utility model discloses the thought of embodiment all has the change part on concrete implementation and range of application, to sum up, this description content should not be understood as the restriction of the utility model.
Claims (9)
1. A sample in-situ bending fixture for an atomic force microscope, comprising:
the base comprises a bottom plate and a support fixed on the bottom plate, and a vertical top plate is arranged on the bottom plate;
the pressing plate is connected to the support in a vertically sliding mode and is fixed on the support in an adjustable mode through the locking device, an opening is formed in the position, corresponding to the top plate, of the pressing plate, two opposite upper pressing heads are arranged in the opening, and the two upper pressing heads are located on two sides of the top plate respectively.
2. The in-situ bending fixture for the sample of the atomic force microscope as recited in claim 1, wherein a light hole is formed on a central axis of the top plate, and the light hole penetrates through the bottom plate.
3. The specimen in-situ bending fixture for an atomic force microscope according to claim 1, wherein the top surface of the top plate is a curved surface, and the curved surface extends longitudinally to positions adjacent to the two ends and is provided with a stopping portion.
4. The specimen in-situ bending fixture for an atomic force microscope according to claim 1, wherein the two upper indenters are fixed on the platen with adjustable relative distance.
5. The in-situ bending fixture for the sample of the atomic force microscope as recited in claim 1, wherein a slide rail extending in a vertical direction is disposed on one side of the support, a slide block is disposed on the slide rail, and the pressing plate is fixed relative to the slide block, so that the pressing plate can slide up and down relative to the support.
6. The specimen in-situ bending fixture for an atomic force microscope according to claim 5, wherein the locking device comprises an adjusting bolt and a linkage assembly, the adjusting bolt is transversely and threadedly connected to the support, the adjusting bolt is in transmission connection with the slide block through the linkage assembly, and the linkage assembly enables the transverse movement of the adjusting bolt to be converted into the vertical sliding movement of the slide block.
7. The specimen in-situ bending fixture for the atomic force microscope as claimed in claim 6, wherein a mounting rack is fixed on the top of the slide block, the pressing plate is fixedly connected with the mounting rack, the linkage assembly comprises a transmission rod and a thumb wheel, the thumb wheel is rotatably arranged on the other side wall of the support seat opposite to the slide rail, the upper end of the transmission rod is fixedly connected with the slide block, and the lower end of the transmission rod abuts against the thumb wheel; the tail end of the screw rod part of the adjusting bolt abuts against the shifting wheel, when the adjusting bolt is rotated to enable the adjusting bolt to move transversely, the shifting wheel can be driven to rotate in the forward direction or in the reverse direction, and the transmission rod is driven to drive the sliding block to slide up and down along the sliding rail through the mounting frame.
8. The in-situ bending fixture for the sample of the atomic force microscope as recited in claim 7, wherein the base is provided with a vertical guide hole, and the locking device further comprises a locking bolt, the locking bolt is threaded to the slide block through the guide hole, and the slide block is adjustably fixed on the base.
9. The specimen in-situ bending fixture for an afm according to claim 7, wherein the mounting frame comprises a fixing plate and a connecting plate perpendicular to each other, the fixing plate is fixed to the upper end of the sliding block, the upper end of the connecting plate is fixed to the fixing plate, and the lower end of the connecting plate is fixed to the pressing plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121110898.XU CN215263587U (en) | 2021-05-21 | 2021-05-21 | Sample in-situ bending clamp for atomic force microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121110898.XU CN215263587U (en) | 2021-05-21 | 2021-05-21 | Sample in-situ bending clamp for atomic force microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215263587U true CN215263587U (en) | 2021-12-21 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121110898.XU Active CN215263587U (en) | 2021-05-21 | 2021-05-21 | Sample in-situ bending clamp for atomic force microscope |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215263587U (en) |
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2021
- 2021-05-21 CN CN202121110898.XU patent/CN215263587U/en active Active
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