CN215218879U - Board connection aging test system - Google Patents
Board connection aging test system Download PDFInfo
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- CN215218879U CN215218879U CN202120065697.6U CN202120065697U CN215218879U CN 215218879 U CN215218879 U CN 215218879U CN 202120065697 U CN202120065697 U CN 202120065697U CN 215218879 U CN215218879 U CN 215218879U
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- carrier
- connecting rod
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- sliding
- door plant
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Abstract
The utility model relates to an aging testing technical field especially relates to even board aging testing system, solves the shortcoming that exists among the prior art, including the quick-witted case, the inside of quick-witted case is seted up four test chambers that are the array distribution, the inside of test chamber is slided and is equipped with the carrier, and the inside of test chamber is provided with the test board, and fixed mounting has the hot plate on the carrier, and one side of quick-witted case through round pin axle swing joint with the door plant that the test chamber corresponds, one side swing joint of door plant has a rotation seat, the inside of rotation seat slides and is provided with telescopic connecting rod, telescopic connecting rod's the other end with carrier swing joint; through the door plant, rotate the setting of seat, telescopic link and carrier isotructure, when placing and take the product, the linkage between door plant and the carrier shifts out simultaneously when opening the door plant, but the door plant self-closing when the carrier slides makes things convenient for personnel's operation, and work efficiency is high.
Description
Technical Field
The utility model relates to an aging testing technical field especially relates to even board aging testing system.
Background
The aging test board is a commonly used test component for testing chips and integrated circuit boards to wait for testing electronic devices, is generally arranged on an aging test frame, and is loaded in an aging test device to perform aging test on the devices to be tested.
The aging test equipment in the prior art has the following defects: firstly, the placement and the taking out of the product are complicated, and the operation of personnel is inconvenient; secondly, after a certain product is subjected to aging test, the heat left inside the product is naturally dispersed, and resources are wasted; thirdly, the function of the device is single, and only the aging test can be carried out.
SUMMERY OF THE UTILITY MODEL
The utility model aims at solving the shortcomings existing in the prior art, and providing a connecting plate aging test system.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
the connecting plate aging test system comprises a case, wherein four test cavities distributed in an array are formed in the case, a carrier is assembled in the test cavities in a sliding mode, a test plate is arranged in each test cavity, a heating plate is fixedly mounted on each carrier, a door plate corresponding to each test cavity is movably connected to one side of the case through a pin shaft, a rotating seat is movably hinged to one side of each door plate, a telescopic connecting rod is arranged in each rotating seat in a sliding mode, and the other end of each telescopic connecting rod is movably hinged to the carrier;
a guide block is fixed on one side of the case through screws, a pressure rod is arranged inside the guide block in a sliding mode, a roller is arranged at one end of the pressure rod and is closely attached to one side of the door plate, a connecting rod is welded to the other end of the pressure rod, a connecting plate is fixed to the other end of the connecting rod through screws, and a sliding block is fixedly arranged on one side of the connecting plate;
the testing device comprises a chassis, a testing cavity and a testing device, wherein the chassis is provided with through grooves communicated with the testing cavity, the bottom walls of the three through grooves are provided with first energy-saving holes, the top walls of the three through grooves are provided with second energy-saving holes, and the first energy-saving holes and the second energy-saving holes extend into the adjacent testing cavity.
Preferably, the rotating seat is internally provided with a sliding groove, and the telescopic connecting rod is in sliding connection with the sliding groove.
Preferably, the end part of the telescopic connecting rod is fixedly connected with a first spring through a clamping block, and the other end of the first spring is fixedly connected with the side wall of the sliding groove.
Preferably, a guide hole is formed in the guide block, and the compression bar is connected with the guide hole in a sliding manner.
Preferably, the outside cover of depression bar is equipped with the second spring, the both ends of second spring respectively with guide block and connecting rod fixed connection.
Preferably, the sliding block is in sealed sliding connection with the through groove.
Preferably, the power supply voltage sampling and B power supply follow-up power supply A control circuit, the first communication circuit, the second control circuit, the IIC communication voltage acquisition circuit, the reference power supplies A and B to generate converted power and the MCU main control circuit are sequentially connected.
The utility model has the advantages that:
1. the utility model discloses in through the door plant, rotate the setting of seat, telescopic link and carrier isotructure, when placing and the product of taking, the linkage between door plant and the carrier, the carrier shifts out simultaneously when opening the door plant, but door plant self-closing when the carrier slides makes things convenient for personnel's operation, and work efficiency is high.
2. The utility model discloses in through the setting of gyro wheel, depression bar, connecting plate, connecting rod, sliding block and energy-conserving hole isotructure, after the one deck test intracavity portion accomplished the ageing tests, the door plant is opened and to be made the sliding block slide to make this layer one side lead to the energy-conserving hole in the groove and open, utilize negative pressure device to send the thermal current into other test intracavity and use, but energy saving consumption.
3. The utility model discloses in adopted mains voltage sample and B power to follow A power control circuit, first communication circuit, second control circuit, IIC communication voltage acquisition circuit, reference power A and B and produced conversion electric power and MCU main control circuit, it is integrative with electrical test to collect ageing, and the multilayer is ageing simultaneously, unified control, efficient, and output current scope computer is programme-controlled, all passageway synchronization adjustment.
Drawings
Fig. 1 is a front view of a link plate aging test system provided by the present invention;
fig. 2 is a cross-sectional view of a plane of depression of the link plate aging test system provided by the present invention;
fig. 3 is a schematic view of a door panel rotation of the connecting plate aging test system provided by the present invention;
fig. 4 is a test chart of the link plate aging test system provided by the present invention;
FIG. 5 is an enlarged view of the connection board aging test system provided by the present invention at the position marked A;
FIG. 6 is an enlarged view of the connection board aging test system provided by the present invention at the position marked B;
FIG. 7 is a schematic diagram of a power supply control circuit A for power supply voltage sampling and power supply B following provided by the present invention;
fig. 8 is a schematic diagram of a first communication circuit according to the present invention;
fig. 9 is a schematic diagram of a second communication circuit according to the present invention;
fig. 10 is a schematic diagram of an IIC communication voltage acquisition circuit according to the present invention;
fig. 11 is a schematic diagram of a reference power supply a and a reference power supply B generating conversion circuit according to the present invention;
fig. 12 is a schematic diagram of the MCU main control circuit according to the present invention.
In the figure: the device comprises a case 1, a test chamber 2, a carrier 3, a door plate 4, a connecting rod 5, a connecting plate 6, a sliding block 7, a heating plate 8, a telescopic connecting rod 9, a rotating seat 10, a sliding chute 11, a first spring 12, a through groove 13, a first energy-saving hole 14, a guide block 15, a second spring 16, a pressure rod 17, a roller 18 and a second energy-saving hole 19.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.
Referring to fig. 1-12, the connecting plate aging test system comprises a case 1, four test chambers 2 distributed in an array are arranged inside the case 1, a carrier 3 is slidably assembled inside the test chambers 2, a test board is arranged inside the test chambers 2, a heating plate 8 is fixedly installed on the carrier 3, a door plate 4 corresponding to the test chambers 2 is movably connected to one side of the case 1 through a pin shaft, a rotating seat 10 is movably hinged to one side of the door plate 4, a telescopic connecting rod 9 is slidably arranged inside the rotating seat 10, and the other end of the telescopic connecting rod 9 is movably hinged to the carrier 3; a guide block 15 is fixed on one side of the case 1 through screws, a pressure lever 17 is slidably arranged inside the guide block 15, a roller 18 is arranged at one end of the pressure lever 17, the roller 18 is tightly attached to one side of the door plate 4, a connecting rod 5 is welded at the other end of the pressure lever 17, a connecting plate 6 is fixed at the other end of the connecting rod 5 through screws, and a sliding block 7 is fixedly arranged on one side of the connecting plate 6; the chassis 1 is provided with through grooves 13 communicated with the test cavities 2, the bottom walls of the three through grooves 13 are provided with first energy-saving holes 14, the top walls of the three through grooves 13 are provided with second energy-saving holes 19, and the first energy-saving holes 14 and the second energy-saving holes 19 extend into the adjacent test cavities 2.
Wherein, through the door plant 4, rotate the setting of seat 10, flexible connecting rod 9 and carrier 3 isotructure, when placing and taking the product, link between door plant 4 and the carrier 3, carrier 3 shifts out simultaneously when opening door plant 4, door plant 4 can self-closing when carrier 3 slides, make things convenient for personnel's operation, high working efficiency, through the setting of gyro wheel 18, depression bar 17, connecting plate 6, connecting rod 5, sliding block 7 and structure such as energy-conserving hole, after one deck test chamber 2 is inside to accomplish the aging test, door plant 4 opens and can make sliding block 7 slide, thereby make the energy-conserving hole in this layer one side logical groove 13 open, utilize the negative pressure device to send the thermal current into other test chambers 2 and use, can save energy consumption, adopted mains voltage sample and B mains following A mains operated control circuit, first communication circuit, second control circuit, IIC communication voltage acquisition circuit, The reference power supplies A and B generate converted power and an MCU (micro control unit) main control circuit, aging and electrical property testing are integrated, multiple layers of aging are performed simultaneously, unified control is performed, efficiency is high, the output current range is controlled by a computer program, and all channels are adjusted synchronously.
The inside of the rotating seat 10 is provided with a sliding chute 11, and the telescopic connecting rod 9 is connected with the sliding chute 11 in a sliding way.
The end of the telescopic connecting rod 9 is fixedly connected with a first spring 12 through a clamping block, and the other end of the first spring 12 is fixedly connected with the side wall of the sliding groove 11.
The inside of guide block 15 is seted up the guiding hole, and depression bar 17 and guiding hole sliding connection.
The outside cover of depression bar 17 is equipped with second spring 16, and the both ends of second spring 16 are respectively with guide block 15 and connecting rod 5 fixed connection.
The sliding block 7 is connected with the through groove 13 in a sealing and sliding mode.
The power supply voltage sampling and B power supply follow-up power supply A control circuit, the first communication circuit, the second control circuit, the IIC communication voltage acquisition circuit, the reference power supplies A and B which are connected in sequence generate conversion power and the MCU main control circuit.
In the embodiment, during testing, the corresponding door panel 4 is opened, when the door panel 4 is opened, the rotating seat 10 and the telescopic connecting rod 9 are driven to rotate together, the other end of the telescopic connecting rod 9 can pull the carrier 3 to move, when the door panel 4 is completely opened, the carrier 3 slides for a certain stroke, and the carrier 3 is further pulled by the elasticity of the first spring 12 to slide outwards, so that the carrier 3 is completely moved out of the case 1, as shown in fig. 3, then a product is placed on the carrier 3, after the carrier 3 is pushed to enter the testing cavity 2, the moved door panel 4 rotates under the pulling of the telescopic connecting rod 9 and the rotating seat 10, and after the carrier 3 moves for a certain stroke, a person pushes the door panel 4 to completely push the carrier 3 into the testing cavity 2;
further, after the product is placed in the test chamber 2, a person selects to perform an aging test or a test, and when the aging test is performed, the heating plate 8 on the carrier 3 is heated to perform a thermal aging test;
in addition, after the ageing test, the personnel open door plant 4 of corresponding one side, door plant 4 removes along gyro wheel 18 opening the in-process, can extrude depression bar 17, make depression bar 17 slide along guide block 15, depression bar 17 takes connecting rod 5 and connecting plate 6 to remove simultaneously, connecting plate 6 then drives sliding block 7 and removes, make first energy-conserving hole 14 or the energy-conserving hole 19 of second on the lateral wall open, negative pressure device through in the energy-conserving hole continues to use with the heat flow suction in this test cavity 2 adjacent test cavity 2, avoid this part heat to run off, energy saving consumption.
When the door panel 4 is closed again, the second spring 16 pulls the connecting rod 5, the connecting plate 6, and the sliding block 7 to return, thereby blocking the first economizer hole 14 or the second economizer hole 19 again.
Above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the design of the present invention, equivalent replacement or change should be covered within the protection scope of the present invention.
Claims (7)
1. The connecting plate aging test system comprises a case (1) and is characterized in that four test chambers (2) distributed in an array manner are formed in the case (1), a carrier (3) is assembled in the test chambers (2) in a sliding manner, a test board is arranged in the test chambers (2), a heating plate (8) is fixedly mounted on the carrier (3), one side of the case (1) is movably connected with a door plate (4) corresponding to the test chambers (2) through a pin shaft, one side of the door plate (4) is movably hinged with a rotating seat (10), a telescopic connecting rod (9) is arranged in the rotating seat (10) in a sliding manner, and the other end of the telescopic connecting rod (9) is movably hinged with the carrier (3);
a guide block (15) is fixed on one side of the case (1) through screws, a pressure lever (17) is arranged inside the guide block (15) in a sliding mode, a roller (18) is arranged at one end of the pressure lever (17), the roller (18) is tightly attached to one side of the door panel (4) in contact with the other end of the pressure lever (17), a connecting rod (5) is welded to the other end of the pressure lever (17), a connecting plate (6) is fixed to the other end of the connecting rod (5) through screws, and a sliding block (7) is fixedly arranged on one side of the connecting plate (6);
the testing device is characterized in that a through groove (13) communicated with the testing cavity (2) is formed in the case (1), a first energy-saving hole (14) is formed in the bottom wall of each of the three through grooves (13), a second energy-saving hole (19) is formed in the top wall of each of the three through grooves (13), and the first energy-saving hole (14) and the second energy-saving hole (19) extend into the adjacent testing cavity (2).
2. The connecting plate aging testing system according to claim 1, wherein a sliding groove (11) is formed in the rotating seat (10), and the telescopic connecting rod (9) is in sliding connection with the sliding groove (11).
3. The connecting plate aging testing system according to claim 2, wherein the end of the telescopic connecting rod (9) is fixedly connected with a first spring (12) through a clamping block, and the other end of the first spring (12) is fixedly connected with the side wall of the chute (11).
4. The connecting plate aging testing system of claim 1, wherein a guide hole is formed in the guide block (15), and the pressure lever (17) is connected with the guide hole in a sliding manner.
5. The connecting plate aging testing system of claim 4, wherein a second spring (16) is sleeved outside the compression bar (17), and two ends of the second spring (16) are respectively fixedly connected with the guide block (15) and the connecting rod (5).
6. The link plate aging test system according to claim 1, wherein the sliding block (7) is in sealed sliding connection with the through groove (13).
7. The connecting board aging test system according to claim 1, further comprising a power supply voltage sampling and B power supply following A power supply control circuit, a first communication circuit, a second control circuit, an IIC communication voltage acquisition circuit, a reference power supply A and B generating conversion power, and an MCU main control circuit, which are connected in sequence.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120065697.6U CN215218879U (en) | 2021-01-12 | 2021-01-12 | Board connection aging test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120065697.6U CN215218879U (en) | 2021-01-12 | 2021-01-12 | Board connection aging test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215218879U true CN215218879U (en) | 2021-12-17 |
Family
ID=79437331
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202120065697.6U Active CN215218879U (en) | 2021-01-12 | 2021-01-12 | Board connection aging test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215218879U (en) |
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2021
- 2021-01-12 CN CN202120065697.6U patent/CN215218879U/en active Active
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