CN112730915A - Board connection aging test system - Google Patents
Board connection aging test system Download PDFInfo
- Publication number
- CN112730915A CN112730915A CN202110033755.1A CN202110033755A CN112730915A CN 112730915 A CN112730915 A CN 112730915A CN 202110033755 A CN202110033755 A CN 202110033755A CN 112730915 A CN112730915 A CN 112730915A
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- carrier
- connecting rod
- test
- sliding
- case
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to the technical field of aging tests, in particular to a connecting plate aging test system, which solves the defects in the prior art and comprises a case, wherein four test cavities distributed in an array are formed in the case, a carrier is assembled in the test cavities in a sliding manner, a test board is arranged in the test cavities, a heating plate is fixedly arranged on the carrier, one side of the case is movably connected with a door plate corresponding to the test cavities through a pin shaft, one side of the door plate is movably hinged with a rotating seat, a telescopic connecting rod is arranged in the rotating seat in a sliding manner, and the other end of the telescopic connecting rod is movably hinged with the carrier; through the door plant, rotate the setting of seat, telescopic link and carrier isotructure, when placing and take the product, the linkage between door plant and the carrier shifts out simultaneously when opening the door plant, but the door plant self-closing when the carrier slides makes things convenient for personnel's operation, and work efficiency is high.
Description
Technical Field
The invention relates to the technical field of aging tests, in particular to a connecting plate aging test system.
Background
The aging test board is a commonly used test component for testing chips and integrated circuit boards to wait for testing electronic devices, is generally arranged on an aging test frame, and is loaded in an aging test device to perform aging test on the devices to be tested.
The aging test equipment in the prior art has the following defects: firstly, the placement and the taking out of the product are complicated, and the operation of personnel is inconvenient; secondly, after a certain product is subjected to aging test, the heat left inside the product is naturally dispersed, and resources are wasted; thirdly, the function of the device is single, and only the aging test can be carried out.
Disclosure of Invention
The invention aims to solve the defects in the prior art and provides a connecting plate aging test system.
In order to achieve the purpose, the invention adopts the following technical scheme:
the connecting plate aging test system comprises a case, wherein four test cavities distributed in an array are formed in the case, a carrier is assembled in the test cavities in a sliding mode, a test plate is arranged in each test cavity, a heating plate is fixedly mounted on each carrier, a door plate corresponding to each test cavity is movably connected to one side of the case through a pin shaft, a rotating seat is movably hinged to one side of each door plate, a telescopic connecting rod is arranged in each rotating seat in a sliding mode, and the other end of each telescopic connecting rod is movably hinged to the carrier;
a guide block is fixed on one side of the case through screws, a pressure rod is arranged inside the guide block in a sliding mode, a roller is arranged at one end of the pressure rod and is closely attached to one side of the door plate, a connecting rod is welded to the other end of the pressure rod, a connecting plate is fixed to the other end of the connecting rod through screws, and a sliding block is fixedly arranged on one side of the connecting plate;
the testing device comprises a chassis, a testing cavity and a testing device, wherein the chassis is provided with through grooves communicated with the testing cavity, the bottom walls of the three through grooves are provided with first energy-saving holes, the top walls of the three through grooves are provided with second energy-saving holes, and the first energy-saving holes and the second energy-saving holes extend into the adjacent testing cavity.
Preferably, the rotating seat is internally provided with a sliding groove, and the telescopic connecting rod is in sliding connection with the sliding groove.
Preferably, the end part of the telescopic connecting rod is fixedly connected with a first spring through a clamping block, and the other end of the first spring is fixedly connected with the side wall of the sliding groove.
Preferably, a guide hole is formed in the guide block, and the compression bar is connected with the guide hole in a sliding manner.
Preferably, the outside cover of depression bar is equipped with the second spring, the both ends of second spring respectively with guide block and connecting rod fixed connection.
Preferably, the sliding block is in sealed sliding connection with the through groove.
Preferably, the power supply voltage sampling and B power supply follow-up power supply A control circuit, the first communication circuit, the second control circuit, the IIC communication voltage acquisition circuit, the power supply A and B reference generation conversion power and the MCU main control circuit are sequentially connected.
The invention has the beneficial effects that:
1. according to the invention, through the arrangement of the door plate, the rotating seat, the telescopic connecting rod, the carrier and other structures, when a product is placed and taken, the door plate and the carrier are linked, the carrier is moved out simultaneously when the door plate is opened, the door plate can be automatically closed when the carrier slides, the operation of personnel is facilitated, and the working efficiency is high.
2. According to the invention, through the arrangement of the structures such as the roller, the pressure rod, the connecting plate, the connecting rod, the sliding block, the energy-saving hole and the like, after the aging test is completed in the test cavity of one layer, the sliding block can slide when the door plate is opened, so that the energy-saving hole in the through groove on one side of the layer is opened, and heat flow is sent to other test cavities by using the negative pressure device for use, so that the energy consumption can be saved.
3. The invention adopts a power supply voltage sampling and B power supply following A power supply control circuit, a first communication circuit, a second control circuit, an IIC communication voltage acquisition circuit, a power supply A and B reference generation conversion power and an MCU main control circuit, integrates aging and electrical property testing into a whole, realizes multi-layer simultaneous aging, unified control, high efficiency, computer program control of output current range and synchronous adjustment of all channels.
Drawings
FIG. 1 is a front view of a link plate burn-in test system according to the present invention;
FIG. 2 is a top cross-sectional view of a link plate burn-in system in accordance with the present invention;
FIG. 3 is a schematic view of a door panel of the connecting plate aging test system according to the present invention;
FIG. 4 is a test chart of the link board aging test system according to the present invention;
FIG. 5 is an enlarged view of the link plate aging test system according to the present invention at the reference A;
FIG. 6 is an enlarged view of the link plate aging test system of the present invention at B;
FIG. 7 is a schematic diagram of a power supply voltage sampling and B power supply following A power supply control circuit according to the present invention;
FIG. 8 is a schematic diagram of a first communication circuit according to the present invention;
FIG. 9 is a schematic diagram of a second communication circuit according to the present invention;
FIG. 10 is a schematic diagram of an IIC communication voltage acquisition circuit according to the present invention;
FIG. 11 is a schematic diagram of a reference generation and conversion circuit for power supplies A and B according to the present invention;
fig. 12 is a schematic diagram of the MCU main control circuit according to the present invention.
In the figure: the device comprises a case 1, a test chamber 2, a carrier 3, a door plate 4, a connecting rod 5, a connecting plate 6, a sliding block 7, a heating plate 8, a telescopic connecting rod 9, a rotating seat 10, a sliding chute 11, a first spring 12, a through groove 13, a first energy-saving hole 14, a guide block 15, a second spring 16, a pressure rod 17, a roller 18 and a second energy-saving hole 19.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.
Referring to fig. 1-12, the connecting plate aging test system comprises a case 1, four test chambers 2 distributed in an array are arranged inside the case 1, a carrier 3 is slidably assembled inside the test chambers 2, a test board is arranged inside the test chambers 2, a heating plate 8 is fixedly installed on the carrier 3, a door plate 4 corresponding to the test chambers 2 is movably connected to one side of the case 1 through a pin shaft, a rotating seat 10 is movably hinged to one side of the door plate 4, a telescopic connecting rod 9 is slidably arranged inside the rotating seat 10, and the other end of the telescopic connecting rod 9 is movably hinged to the carrier 3; a guide block 15 is fixed on one side of the case 1 through screws, a pressure lever 17 is slidably arranged inside the guide block 15, a roller 18 is arranged at one end of the pressure lever 17, the roller 18 is tightly attached to one side of the door plate 4, a connecting rod 5 is welded at the other end of the pressure lever 17, a connecting plate 6 is fixed at the other end of the connecting rod 5 through screws, and a sliding block 7 is fixedly arranged on one side of the connecting plate 6; the chassis 1 is provided with through grooves 13 communicated with the test cavities 2, the bottom walls of the three through grooves 13 are provided with first energy-saving holes 14, the top walls of the three through grooves 13 are provided with second energy-saving holes 19, and the first energy-saving holes 14 and the second energy-saving holes 19 extend into the adjacent test cavities 2.
Wherein, through the door plant 4, rotate the setting of seat 10, flexible connecting rod 9 and carrier 3 isotructure, when placing and taking the product, link between door plant 4 and the carrier 3, carrier 3 shifts out simultaneously when opening door plant 4, door plant 4 can self-closing when carrier 3 slides, make things convenient for personnel's operation, high working efficiency, through the setting of gyro wheel 18, depression bar 17, connecting plate 6, connecting rod 5, sliding block 7 and structure such as energy-conserving hole, after one deck test chamber 2 is inside to accomplish the aging test, door plant 4 opens and can make sliding block 7 slide, thereby make the energy-conserving hole in this layer one side logical groove 13 open, utilize the negative pressure device to send the thermal current into other test chambers 2 and use, can save energy consumption, adopted mains voltage sample and B mains following A mains operated control circuit, first communication circuit, second control circuit, IIC communication voltage acquisition circuit, The power supply A and the power supply B generate converted power and the MCU master control circuit integrates aging and electrical property testing, realizes simultaneous aging of multiple layers and unified control, has high efficiency, and has computer program control of output current range and synchronous adjustment of all channels.
The inside of the rotating seat 10 is provided with a sliding chute 11, and the telescopic connecting rod 9 is connected with the sliding chute 11 in a sliding way.
The end of the telescopic connecting rod 9 is fixedly connected with a first spring 12 through a clamping block, and the other end of the first spring 12 is fixedly connected with the side wall of the sliding groove 11.
The inside of guide block 15 is seted up the guiding hole, and depression bar 17 and guiding hole sliding connection.
The outside cover of depression bar 17 is equipped with second spring 16, and the both ends of second spring 16 are respectively with guide block 15 and connecting rod 5 fixed connection.
The sliding block 7 is connected with the through groove 13 in a sealing and sliding mode.
The power supply voltage sampling and B power supply follow-up power supply A control circuit, the first communication circuit, the second control circuit, the IIC communication voltage acquisition circuit, the power supply A and B reference generation conversion power and the MCU main control circuit are sequentially connected.
In the embodiment, during testing, the corresponding door panel 4 is opened, the door panel 4 drives the rotating seat 10 and the telescopic connecting rod 9 to rotate together when opened, the other end of the telescopic connecting rod 9 can pull the carrier 3 to move, when the door panel 4 is completely opened, the carrier 3 slides for a certain stroke, and the carrier 3 slides outwards under the pulling of the elasticity of the first spring 12, so that the carrier 3 is completely moved out of the case 1, as shown in fig. 3, then a product is placed on the carrier 3, after the carrier 3 is pushed into the testing chamber 2, the moved door panel 4 rotates under the pulling of the telescopic connecting rod 9 and the rotating seat 10, and after the carrier 3 moves for a certain stroke, a person pushes the door panel 4 to completely push the carrier 3 into the testing chamber 2;
further, after the product is placed in the test chamber 2, a person selects to perform an aging test or a test, and when the aging test is performed, the heating plate 8 on the carrier 3 is heated to perform a thermal aging test;
in addition, after the ageing test, the personnel open door plant 4 of corresponding one side, door plant 4 removes along gyro wheel 18 opening the in-process, can extrude depression bar 17, make depression bar 17 slide along guide block 15, depression bar 17 takes connecting rod 5 and connecting plate 6 to remove simultaneously, connecting plate 6 then drives sliding block 7 and removes, make first energy-conserving hole 14 or the energy-conserving hole 19 of second on the lateral wall open, negative pressure device through in the energy-conserving hole continues to use with the heat flow suction in this test cavity 2 adjacent test cavity 2, avoid this part heat to run off, energy saving consumption.
When the door panel 4 is closed again, the second spring 16 pulls the connecting rod 5, the connecting plate 6, and the sliding block 7 to return, thereby blocking the first economizer hole 14 or the second economizer hole 19 again.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be able to cover the technical scope of the present invention and the equivalent alternatives or modifications according to the technical solution and the inventive concept of the present invention within the technical scope of the present invention.
Claims (7)
1. The connecting plate aging test system comprises a case (1) and is characterized in that four test chambers (2) distributed in an array manner are formed in the case (1), a carrier (3) is assembled in the test chambers (2) in a sliding manner, a test board is arranged in the test chambers (2), a heating plate (8) is fixedly mounted on the carrier (3), one side of the case (1) is movably connected with a door plate (4) corresponding to the test chambers (2) through a pin shaft, one side of the door plate (4) is movably hinged with a rotating seat (10), a telescopic connecting rod (9) is arranged in the rotating seat (10) in a sliding manner, and the other end of the telescopic connecting rod (9) is movably hinged with the carrier (3);
a guide block (15) is fixed on one side of the case (1) through screws, a pressure lever (17) is arranged inside the guide block (15) in a sliding mode, a roller (18) is arranged at one end of the pressure lever (17), the roller (18) is tightly attached to one side of the door panel (4) in contact with the other end of the pressure lever (17), a connecting rod (5) is welded to the other end of the pressure lever (17), a connecting plate (6) is fixed to the other end of the connecting rod (5) through screws, and a sliding block (7) is fixedly arranged on one side of the connecting;
the testing device is characterized in that a through groove (13) communicated with the testing cavity (2) is formed in the case (1), a first energy-saving hole (14) is formed in the bottom wall of each of the three through grooves (13), a second energy-saving hole (19) is formed in the top wall of each of the three through grooves (13), and the first energy-saving hole (14) and the second energy-saving hole (19) extend into the adjacent testing cavity (2).
2. The connecting plate aging testing system according to claim 1, wherein a sliding groove (11) is formed in the rotating seat (10), and the telescopic connecting rod (9) is in sliding connection with the sliding groove (11).
3. The connecting plate aging testing system according to claim 2, wherein the end of the telescopic connecting rod (9) is fixedly connected with a first spring (12) through a clamping block, and the other end of the first spring (12) is fixedly connected with the side wall of the chute (11).
4. The connecting plate aging testing system of claim 1, wherein a guide hole is formed in the guide block (15), and the pressure lever (17) is connected with the guide hole in a sliding manner.
5. The connecting plate aging testing system of claim 4, wherein a second spring (16) is sleeved outside the compression bar (17), and two ends of the second spring (16) are respectively fixedly connected with the guide block (15) and the connecting rod (5).
6. The link plate aging test system according to claim 1, wherein the sliding block (7) is in sealed sliding connection with the through groove (13).
7. The connecting board aging test system according to claim 1, further comprising a power supply voltage sampling and B power supply following A power supply control circuit, a first communication circuit, a second control circuit, an IIC communication voltage acquisition circuit, a power supply A and B reference generation conversion power and an MCU main control circuit connected in sequence.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110033755.1A CN112730915A (en) | 2021-01-12 | 2021-01-12 | Board connection aging test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110033755.1A CN112730915A (en) | 2021-01-12 | 2021-01-12 | Board connection aging test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN112730915A true CN112730915A (en) | 2021-04-30 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110033755.1A Pending CN112730915A (en) | 2021-01-12 | 2021-01-12 | Board connection aging test system |
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| Country | Link |
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| CN (1) | CN112730915A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113777475A (en) * | 2021-11-15 | 2021-12-10 | 枣庄智博智能科技有限公司 | Automatic test platform and test method for aging of electronic product |
| CN114236371A (en) * | 2021-11-15 | 2022-03-25 | 广东电网有限责任公司东莞供电局 | Relay multistation testing arrangement |
| CN117092495A (en) * | 2023-10-19 | 2023-11-21 | 江苏永鼎股份有限公司 | Chip aging test equipment |
-
2021
- 2021-01-12 CN CN202110033755.1A patent/CN112730915A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113777475A (en) * | 2021-11-15 | 2021-12-10 | 枣庄智博智能科技有限公司 | Automatic test platform and test method for aging of electronic product |
| CN113777475B (en) * | 2021-11-15 | 2022-01-25 | 枣庄智博智能科技有限公司 | Automatic test platform and test method for aging of electronic product |
| CN114236371A (en) * | 2021-11-15 | 2022-03-25 | 广东电网有限责任公司东莞供电局 | Relay multistation testing arrangement |
| CN117092495A (en) * | 2023-10-19 | 2023-11-21 | 江苏永鼎股份有限公司 | Chip aging test equipment |
| CN117092495B (en) * | 2023-10-19 | 2024-01-02 | 江苏永鼎股份有限公司 | Chip aging test equipment |
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