CN215180799U

CN215180799U - Universal high-speed backplane connector conduction testing device

Info

Publication number: CN215180799U
Application number: CN202120335981.0U
Authority: CN
Inventors: 蔡树人; 曾维钦; 邓曙光; 李牛军
Original assignee: FCI Connectors Dongguan Co Ltd
Current assignee: FCI Connectors Dongguan Co Ltd
Priority date: 2021-02-05
Filing date: 2021-02-05
Publication date: 2021-12-14
Anticipated expiration: 2031-02-05

Abstract

The utility model provides a general high-speed backplane connector conduction testing device, which comprises an upper testing seat and a lower testing seat which are matched with each other, wherein the upper testing seat is lifted by a driving mechanism driver so as to realize the contact between the upper testing seat and the lower testing seat; the upper test seat is provided with a protection plate, and the protection plate is provided with a plurality of guide holes for the probe cup heads to penetrate through. The utility model has simple structure, realizes the connection between the wire and the fish eye probe of the connector by utilizing the mutual matching of the upper test seat and the lower test seat, thereby realizing the test of the connector; the utility model discloses utilize the backplate and utilize the probe cover that has the probe cup head and the contact of flake terminal, switch on the conduction test board through the wire rod that the probe cover is connected and carry out the conduction test to because the probe head size is longer, when backplate and probe reciprocated, the probe cup head all can effectively protect the probe in the guiding hole the inside of backplate, prevents that the probe from warping, and the flake strides the emergence of other problems such as PIN.

Description

Universal high-speed backplane connector conduction testing device

Technical Field

The utility model belongs to the technical field of connector test equipment technique and specifically relates to a general high-speed backplane connector conduction testing arrangement.

Background

A conventional connector generally includes a connector housing and a plurality of connection terminals provided on the housing. The connecting terminal is connected with a lead. There is a risk of damage during mounting of the connection terminal in the connector housing. The more miniaturized connectors, the higher the risk of damage to the connection terminals during installation. The damage may be the case when the connection terminal is disconnected from the wire or when the connection terminal is not mounted in place. Either type of damage can affect the proper use of the connector.

The high-speed backplane connector is a common connector for large-scale communication equipment, ultrahigh-performance servers, supercomputers, industrial computers and high-end storage equipment, and plays a role in connecting a single board and a backplane, transmitting high-speed differential signals or single-ended signals and transmitting large current by crimping the connector fisheyes and the PCB. In order to ensure the electrical performance of the product, the product must be subjected to a conduction test.

In the prior art, a special connector testing device is not provided, whether a connecting terminal of a connector is correctly installed or not and whether the connector can conduct electricity normally or not can not be quickly tested, and the purpose of testing the connector is generally achieved by utilizing a testing seat.

However, the conventional test socket has the following disadvantages:

1. the probe can be inclined and deformed in the test process, so that the product is misjudged, fish eyes of the product are scratched, and the inclined needle crosses the needle.

2. The service life of the probe is short, and the frequency of replacing the probe is high.

3. The traditional probe cup is small and short, and is not easy to align and debug.

Disclosure of Invention

To prior art not enough, the utility model provides a general high-speed backplane connector conduction testing arrangement, the device through increasing guider, can prevent that the probe from warping, the product test that can improve simultaneously is through rate.

The technical scheme of the utility model is that: a universal high-speed backplane connector conduction testing device comprises an upper testing seat and a lower testing seat which are matched with each other, wherein the upper testing seat is lifted through a driver of a driving mechanism so as to realize the contact of the upper testing seat and the lower testing seat; the upper test seat is provided with a protection plate, and the protection plate is provided with a plurality of guide holes for the probe cup heads to penetrate through.

Preferably, the upper test seat further comprises an upper female seat support, a fixing frame and a probe sleeve fixing seat, the fixing frame is arranged at the upper end of the upper female seat support and used for fixing wires, the upper female seat support is connected with the probe sleeve fixing seat through a guide assembly, and the protection plate is arranged below the probe sleeve fixing seat through the guide assembly.

Preferably, the guide assembly is a plurality of guide posts, and the guide posts sequentially penetrate through the upper female seat support, the probe sleeve fixing seat and the protection plate from top to bottom.

Preferably, the probe sleeve fixing seat is provided with a plurality of fixing holes for penetrating the probe sleeve with the wire, and the lower end of each probe sleeve is provided with a probe cup head.

Preferably, the probe sleeve fixing seat is connected with the guide pillar through a linear bearing.

Preferably, the guard plate is connected with the lower end of the guide pillar, the lower end of the upper female seat support is further provided with a plurality of spring plungers, and the spring plungers downwards penetrate through the probe sleeve fixing seat to be connected with the guard plate.

Preferably, the lower test socket comprises a lower test socket body and a plurality of fixing seats arranged on the lower test socket body, the test socket body is provided with a connector, and a fisheye probe of the connector is opposite to a probe sleeve with a wire.

The utility model has the advantages that:

1. the utility model has simple structure, realizes the connection between the wire and the fish eye probe of the connector by utilizing the mutual matching of the upper test seat and the lower test seat, thereby realizing the test of the connector;

2. the utility model discloses utilize the backplate and utilize the probe cover that has the probe cup head and the contact of flake terminal, switch on the conduction test board through the wire rod that the probe cover is connected and carry out the conduction test to because the probe head size is longer, when backplate and probe reciprocated, the probe cup head all can effectively protect the probe in the guiding hole the inside of backplate, prevents that the probe from warping, and the flake strides the emergence of other problems such as PIN.

Drawings

Fig. 1 is a schematic structural view of the present invention;

FIG. 2 is a schematic structural view of the upper test socket of the present invention;

FIG. 3 is a schematic structural view of the lower test socket of the present invention;

FIG. 4 is a schematic cross-sectional view of the upper test socket of the present invention;

fig. 5 is a schematic structural view of the guide assembly of the present invention;

in the figure, 1-upper test seat, 2-lower test seat, 3-upper female seat bracket, 4-fixing seat, 5-probe sleeve fixing seat, 6-protection plate, 7-guide pillar, 8-spring plunger, 9-lower test seat body, 10-fixing seat, 11-wire, 12-probe sleeve, 13-probe cup head and 14-connector.

Detailed Description

The following description of the embodiments of the present invention will be made with reference to the accompanying drawings:

as shown in fig. 1, the embodiment provides a general conduction testing device for a high-speed backplane connector, which includes an upper testing socket 1 and a lower testing socket 2 that are matched with each other, where the upper testing socket 1 is driven by a driving mechanism to lift and lower so as to contact the upper testing socket 1 and the lower testing socket 2; in this embodiment, the upper test socket 1 can be connected with the driving cylinder, and the upper test socket 1 is driven to ascend and descend by the driving cylinder.

As shown in fig. 2, the upper test socket 1 of this embodiment includes an upper female socket support 3, a fixing frame 4, a probe sleeve fixing seat 5, and a protection plate 6, the upper end of the upper female socket support 3 is provided with the fixing frame 4, the fixing frame 4 is used for fixing a wire 11, the upper female socket support 3 is connected with the probe sleeve fixing seat 5 through a guiding component, and the protection plate 6 is disposed below the probe sleeve fixing seat 6 through the guiding component. In this embodiment, the guard plate 6 is provided with a plurality of guide holes for the probe sleeve 12 with the probe cup head 13 to pass through.

The probe sleeve fixing seat 6 is provided with a plurality of fixing holes for penetrating the probe sleeve 12 with the wire 11, and the lower end of each probe sleeve 12 is provided with a probe cup head 13.

Preferably, the guide assembly is a plurality of guide posts 7, and the plurality of guide posts 7 sequentially penetrate through the upper female base bracket 3, the probe sleeve fixing base 4 and the guard plate 5 from top to bottom. The probe sleeve fixing seat 4 is connected with the guide post 7 through a linear bearing. The guard plate 5 is connected with the lower end of the guide post 7, the lower end of the upper female seat support 3 is also provided with a plurality of spring plungers 8, and the spring plungers 8 downwards penetrate through the probe sleeve fixing seat 6 to be connected with the guard plate 6, as shown in fig. 5.

Preferably, as shown in fig. 3, the lower test socket 3 includes a lower test socket body 9 and a plurality of fixing seats 10 disposed on the lower test socket body 9, the test socket body 9 is placed with a connector, and a fisheye probe of the connector faces upward to a probe sleeve with a wire.

As shown in figure 4, in the test process, because the probe head size is longer, when backplate 6 and probe reciprocated, probe cup head 13 all is in the guiding hole inside of backplate 6, can effectively protect the probe, prevents that the probe from warping, and other problems such as PIN are striden to the fisheye's emergence.

The foregoing embodiments and description have been provided to illustrate the principles and preferred embodiments of the present invention, and various changes and modifications may be made without departing from the spirit and scope of the invention, which fall within the scope of the invention as claimed.

Claims

1. The utility model provides a general high-speed backplane connector conduction testing arrangement, includes the last test socket and the lower test socket of mutually supporting, its characterized in that, last test socket have the backplate, the backplate on seted up a plurality of guiding holes that are used for supplying the probe cover that has the probe cup head to wear to establish.

2. The apparatus of claim 1, wherein the test apparatus comprises: the upper test seat further comprises an upper female seat support, a fixing frame and a probe sleeve fixing seat, the fixing frame is arranged at the upper end of the upper female seat support and used for fixing wires, the upper female seat support is connected with the probe sleeve fixing seat through a guide assembly, and the protection plate is arranged below the probe sleeve fixing seat through the guide assembly.

3. The apparatus of claim 2, wherein the test apparatus comprises: the guide assembly is a plurality of guide posts which sequentially penetrate through the upper female seat support, the probe sleeve fixing seat and the protection plate from top to bottom.

4. The apparatus of claim 3, wherein the test apparatus comprises: the probe sleeve fixing seat is provided with a plurality of fixing holes for penetrating through the probe sleeve with wires, and the lower end of each probe sleeve is provided with a probe cup head.

5. The apparatus of claim 4, wherein the test apparatus comprises: the probe sleeve fixing seat is connected with the guide pillar through a linear bearing.

6. The apparatus of claim 3, wherein the test apparatus comprises: the protective plate is connected with the lower end of the guide pillar, the lower end of the upper female seat support is further provided with a plurality of spring plungers, and the spring plungers downwards penetrate through the probe sleeve fixing seat and are connected with the protective plate.

7. The apparatus of claim 1, wherein the test apparatus comprises: the lower test seat comprises a lower test seat body and a plurality of fixed seats arranged on the lower test seat body.