CN215180683U - ICT testing arrangement with stop gear - Google Patents
ICT testing arrangement with stop gear Download PDFInfo
- Publication number
- CN215180683U CN215180683U CN202121485538.8U CN202121485538U CN215180683U CN 215180683 U CN215180683 U CN 215180683U CN 202121485538 U CN202121485538 U CN 202121485538U CN 215180683 U CN215180683 U CN 215180683U
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- Prior art keywords
- movable frame
- electromagnet
- movable
- groups
- ict testing
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- 238000012360 testing method Methods 0.000 title claims abstract description 55
- 239000000523 sample Substances 0.000 claims abstract description 39
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims abstract description 32
- 238000003825 pressing Methods 0.000 claims abstract description 26
- 229910052742 iron Inorganic materials 0.000 claims abstract description 16
- 230000000670 limiting effect Effects 0.000 claims abstract description 12
- 230000003014 reinforcing effect Effects 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 6
- 230000009977 dual effect Effects 0.000 description 2
- 230000005389 magnetism Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- RVCKCEDKBVEEHL-UHFFFAOYSA-N 2,3,4,5,6-pentachlorobenzyl alcohol Chemical compound OCC1=C(Cl)C(Cl)=C(Cl)C(Cl)=C1Cl RVCKCEDKBVEEHL-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The utility model relates to an ICT testing device with a limiting mechanism, which comprises a test board, an ICT testing head and a Z-axis moving component for driving the ICT testing head to move along the Z axis; the ICT testing head comprises an electromagnet, an iron sheet corresponding to the electromagnet and a movable frame; one of the electromagnet and the iron sheet is fixed with the driving end of the Z-axis moving assembly, and the other of the electromagnet and the iron sheet is fixed with the upper end of the movable frame; the ICT testing head also comprises a probe set; a plurality of groups of movable through grooves which are all in a strip shape are arranged on the lower surface of the movable frame; the width of the movable through groove is matched with the probes of the probe group; the centers of the plurality of groups of movable through grooves are superposed, and the centers of the movable through grooves are superposed with the center of the lower surface of the movable frame; the upper end part of the probe group is fixedly provided with a hanging piece corresponding to the movable frame; the ICT test head also comprises a pressing component which is arranged on the movable frame and used for pressing each hanging piece. After the improvement, the position of the probe can be adjusted according to actual detection requirements, the utilization rate of the probe is high, and different tests can share the same movable frame.
Description
Technical Field
The utility model relates to a ICT test technical field, more specifically say, relate to an ICT testing arrangement with stop gear.
Background
The ICT testing device detects open circuit and short circuit of PCBA circuit and welding condition of parts by testing the test point of the probe contact circuit board. In actual production, the test point of the circuit board of different models is different, and at present, the probe fixed plate is many customized, just need prepare the probe fixed plate of polylith difference during the test, and the probe fixed plate can only do and scrap the processing after using, unable cyclic utilization.
SUMMERY OF THE UTILITY MODEL
The to-be-solved technical problem of the utility model lies in, to the above-mentioned defect of prior art, provide an ICT testing arrangement with stop gear.
The utility model provides a technical scheme that its technical problem adopted is:
an ICT testing device with a limiting mechanism is constructed, and comprises a testing table, an ICT testing head and a Z-axis moving component for driving the ICT testing head to move along a Z axis; wherein: the ICT testing head comprises an electromagnet, an iron sheet corresponding to the electromagnet and a movable frame; one of the electromagnet and the iron sheet is fixed with the driving end of the Z-axis moving assembly, and the other of the electromagnet and the iron sheet is fixed with the upper end of the movable frame;
the ICT testing head also comprises a probe set; a plurality of groups of movable through grooves which are all in a strip shape are arranged on the lower surface of the movable frame; the width of the movable through groove is matched with the probes of the probe group; the centers of the plurality of groups of movable through grooves are superposed, and the centers of the movable through grooves are superposed with the center of the lower surface of the movable frame; the upper end part of the probe group is fixedly provided with a hanging piece corresponding to the movable frame; the ICT test head also comprises a pressing component which is arranged on the movable frame and used for pressing each hanging piece.
Preferably, the pressing component comprises a pressing plate for pressing and holding the hanging piece, a plurality of groups of bolts which penetrate through the movable frame and the pressing plate, and a plurality of groups of nuts which correspond to the plurality of groups of bolts one to one; the nut is fixed with the movable frame; the plurality of groups of bolts are circumferentially and uniformly distributed on the pressing plate.
Preferably, the bolt sleeve is provided with a rubber ring.
Preferably, the electromagnet is fixed with the driving end of the Z-axis moving component; the ICT testing device also comprises a plurality of groups of reinforcing ribs which are uniformly distributed around the circumference of the driving end of the Z-axis moving assembly; the driving end of the Z-axis moving assembly and the upper surface of the electromagnet are fixed with the reinforcing rib.
Preferably, guide blocks are fixedly arranged on two sides of the electromagnet; and the test bench is fixedly provided with two groups of guide rods which correspond to the two groups of guide blocks one to one.
Preferably, the movable frame comprises a lower flat plate and a plurality of groups of upright posts which are uniformly distributed on the lower flat plate in a circumferential manner; the two ends of the upright post are respectively fixed with the iron sheet and the lower flat plate.
Preferably, the upper surface of the lower flat plate is provided with a plurality of groups of scale marks which correspond to the plurality of groups of movable through grooves one to one.
The beneficial effects of the utility model reside in that: the position of probe can be adjusted according to the detection demand of reality, and the high-usage of probe, and different tests can share same adjustable shelf. Specifically, the method comprises the following steps: on one hand, when the electromagnet is powered off, the position of the movable frame is adjustable, after the electromagnet is adjusted to a specified position, the electromagnet is powered on, the electromagnet has magnetism, and can attract the iron sheet, namely the position of the movable frame is fixed; on the other hand, the position of the probe on the movable frame is adjustable, the probe is pushed along the movable through groove, and after the probe reaches a designated position, the detection position of the probe can be fixed by pressing the hanging piece on the probe by the pressing component. Therefore, through dual regulation, the flexibility of use is greatly improved, and various detection requirements can be met.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the present invention will be further described below with reference to the accompanying drawings and embodiments, wherein the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained without inventive work according to the drawings:
fig. 1 is a front view of an ICT testing device with a limiting mechanism according to a preferred embodiment of the present invention;
FIG. 2 is an enlarged view at A in FIG. 1;
fig. 3 is a top view of a lower plate of an ICT testing device with a position-limiting mechanism according to a preferred embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, a clear and complete description will be given below with reference to the technical solutions of the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art without creative efforts belong to the protection scope of the present invention.
An ICT testing device with a limiting mechanism according to a preferred embodiment of the present invention is shown in fig. 1 to 3, and includes a testing table 10, an ICT testing head 11, and a Z-axis moving assembly 12 for driving the ICT testing head 11 to move along a Z-axis; the ICT test head 11 comprises an electromagnet 13, an iron sheet 14 corresponding to the electromagnet 13 and a movable frame 15; an electromagnet 13 and an iron sheet 14, one of which is fixed with the driving end of the Z-axis moving component 12, and the other of which is fixed with the upper end of the movable frame 15;
After the improvement, the position of the probe can be adjusted according to actual detection requirements, the utilization rate of the probe is high, and different tests can share the same movable frame 15. Specifically, the method comprises the following steps: on one hand, when the electromagnet 13 is powered off, the position of the movable frame 15 is adjustable, after the electromagnet 13 is adjusted to a specified position, the electromagnet 13 is powered on, the electromagnet 13 has magnetism, and the iron sheet 14 can be attracted, namely the position of the movable frame 15 is fixed; on the other hand, the position of the probe on the movable frame 15 is adjustable, the probe is pushed along the movable through groove 180, and after reaching the designated position, the detecting position of the probe can be fixed by pressing the hanging piece 17 on the probe through the pressing component 18. Therefore, through dual regulation, the flexibility of use is greatly improved, and various detection requirements can be met.
As shown in fig. 1-2, the pressing assembly 18 includes a pressing plate 19 for pressing the hanging piece 17, a plurality of sets of bolts 110 penetrating through the movable frame 15 and the pressing plate 19, and a plurality of sets of nuts 111 corresponding to the plurality of sets of bolts 110; the nut 111 is fixed with the movable frame 15; the plurality of groups of bolts 110 are circumferentially and uniformly distributed on the pressing plate 19, and after the probe reaches a designated position, the bolts 110 are screwed, so that the probe extends into the nuts 111, the pressing plate 19 can be clamped, and the assembly and disassembly are convenient.
As shown in FIG. 2, the bolt 110 is sleeved with a rubber ring 112, so that friction is increased, and the limiting effect is better.
As shown in fig. 1, the electromagnet 13 is fixed to the driving end of the Z-axis moving assembly 12; the ICT testing device also comprises a plurality of groups of reinforcing ribs 113 which are uniformly distributed around the circumference of the driving end of the Z-axis moving component 12; the driving end of the Z-axis moving unit 12 and the upper surface of the electromagnet 13 are fixed to the reinforcing rib 113.
As shown in fig. 1, guide blocks 114 are fixedly arranged on both sides of the electromagnet 13; the test bench is fixedly provided with two groups of guide rods 115 which correspond to the two groups of guide blocks 114 one by one, and the movement of the electromagnet 13 is more stable through the matching of the guide blocks 114 and the guide rods 115.
As shown in fig. 1, the movable frame 15 includes a lower plate 116, and a plurality of sets of columns 117 uniformly distributed on the lower plate 116; two ends of the upright column 117 are respectively fixed with the iron sheet 14 and the lower flat plate 116, so that more sufficient space is provided for taking and placing the probe.
As shown in fig. 3, the upper surface of the lower plate 116 is provided with a plurality of sets of scale marks 118 corresponding to the plurality of sets of movable through slots 180 one to one, so that the moving distance of the probe can be conveniently and intuitively known, and the adjustment is more convenient.
It will be understood that modifications and variations can be made by persons skilled in the art in light of the above teachings and all such modifications and variations are considered to be within the scope of the invention as defined by the following claims.
Claims (7)
1. An ICT testing device with a limiting mechanism comprises a test board, an ICT testing head and a Z-axis moving component for driving the ICT testing head to move along a Z axis; the method is characterized in that: the ICT testing head comprises an electromagnet, an iron sheet corresponding to the electromagnet and a movable frame; one of the electromagnet and the iron sheet is fixed with the driving end of the Z-axis moving assembly, and the other of the electromagnet and the iron sheet is fixed with the upper end of the movable frame;
the ICT testing head also comprises a probe set; a plurality of groups of movable through grooves which are all in a strip shape are arranged on the lower surface of the movable frame; the width of the movable through groove is matched with the probes of the probe group; the centers of the plurality of groups of movable through grooves are superposed, and the centers of the movable through grooves are superposed with the center of the lower surface of the movable frame; the upper end part of the probe group is fixedly provided with a hanging piece corresponding to the movable frame; the ICT test head also comprises a pressing component which is arranged on the movable frame and used for pressing each hanging piece.
2. The ICT testing device with the limiting mechanism according to claim 1, wherein the pressing component comprises a pressing plate for pressing and holding the hanging piece, a plurality of groups of bolts which penetrate through the movable frame and the pressing plate, and a plurality of groups of nuts which are in one-to-one correspondence with the plurality of groups of bolts; the nut is fixed with the movable frame; the plurality of groups of bolts are circumferentially and uniformly distributed on the pressing plate.
3. The ICT testing device with the limiting mechanism according to claim 2, wherein the bolt sleeve is provided with a rubber ring.
4. An ICT testing device with a limiting mechanism according to claim 1, characterized in that the electromagnet is fixed with the driving end of the Z-axis moving component; the ICT testing device also comprises a plurality of groups of reinforcing ribs which are uniformly distributed around the circumference of the driving end of the Z-axis moving assembly; the driving end of the Z-axis moving assembly and the upper surface of the electromagnet are fixed with the reinforcing rib.
5. The ICT testing device with the limiting mechanism according to claim 4, wherein guide blocks are fixedly arranged on both sides of the electromagnet; and the test bench is fixedly provided with two groups of guide rods which correspond to the two groups of guide blocks one to one.
6. The ICT testing device with the limiting mechanism according to claim 4, wherein the movable frame comprises a lower flat plate, a plurality of sets of columns uniformly distributed on the lower flat plate in a circumferential manner; the two ends of the upright post are respectively fixed with the iron sheet and the lower flat plate.
7. The ICT testing device with the limiting mechanism according to claim 6, wherein the upper surface of the lower plate is provided with a plurality of sets of scale marks corresponding to the plurality of sets of the movable through slots one by one.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121485538.8U CN215180683U (en) | 2021-07-01 | 2021-07-01 | ICT testing arrangement with stop gear |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121485538.8U CN215180683U (en) | 2021-07-01 | 2021-07-01 | ICT testing arrangement with stop gear |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215180683U true CN215180683U (en) | 2021-12-14 |
Family
ID=79382127
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121485538.8U Expired - Fee Related CN215180683U (en) | 2021-07-01 | 2021-07-01 | ICT testing arrangement with stop gear |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215180683U (en) |
-
2021
- 2021-07-01 CN CN202121485538.8U patent/CN215180683U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20211214 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |