CN106772011B - Full-automatic micro-gap switch function test machine - Google Patents
Full-automatic micro-gap switch function test machine Download PDFInfo
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- CN106772011B CN106772011B CN201611232273.4A CN201611232273A CN106772011B CN 106772011 B CN106772011 B CN 106772011B CN 201611232273 A CN201611232273 A CN 201611232273A CN 106772011 B CN106772011 B CN 106772011B
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- 238000012360 testing method Methods 0.000 title claims abstract description 47
- 239000004973 liquid crystal related substance Substances 0.000 claims abstract description 10
- 239000000523 sample Substances 0.000 claims description 32
- 210000001503 joint Anatomy 0.000 claims description 10
- 239000002184 metal Substances 0.000 claims description 3
- 238000003825 pressing Methods 0.000 claims description 3
- 230000002093 peripheral effect Effects 0.000 abstract description 3
- 238000003032 molecular docking Methods 0.000 description 10
- 238000000034 method Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
The invention discloses a full-automatic microswitch function testing machine which comprises a cabinet for placing peripherals, a testing machine table, a precise linear motion mechanism, an operation adjusting mechanism, a quick-change mechanism for quick manual switching when testing products of different types, a motion control system and a liquid crystal display screen, wherein the precise linear motion mechanism, the quick-change mechanism, the operation adjusting mechanism and the motion control system are respectively arranged in the testing machine table, the testing machine table is arranged on the upper end face of the cabinet, and the liquid crystal display screen is arranged on the top end face of the cabinet. The invention can greatly improve the efficiency and the precision of the micro switch test, reduce the labor intensity and improve the product quality. Meanwhile, the invention integrates the tests of operation position, operation force, position difference, release force, resistance and the like, has comprehensive functions, is convenient and flexible to use, can be compatible with multiple products, and is very suitable for testing microswitches of multiple varieties and small batches.
Description
Technical Field
The invention relates to the field of micro-switch testing, in particular to a full-automatic micro-switch function testing machine.
Background
After the production and assembly of the micro switch are completed, the micro switch is required to be tested in terms of operation position, operation force, position difference, release force, resistance and the like, and currently, a simple manual jig is generally adopted in the industry for testing.
The manual operation mode in the prior art is time-consuming and labor-consuming, only one product can be tested at a time, and the efficiency is low; the repeated precision of manual operation is not high, and the false detection is easy to generate due to operation reasons, so that the manual operation method cannot be compatible with multiple products.
Disclosure of Invention
The invention aims to solve the technical problem of providing the test platform which can improve the production efficiency and the test precision, reduce the labor intensity of staff, and simultaneously can be compatible with a plurality of products to realize the unification of the test platform.
The invention is realized by the following technical scheme: the utility model provides a full-automatic micro-gap switch function test machine, is including being used for putting rack, test board, accurate rectilinear motion mechanism, the operation guiding mechanism of peripheral hardware usefulness, quick change mechanism and motion control system, the liquid crystal display that is used for the quick manual switching when testing different model products, accurate rectilinear motion mechanism, quick change mechanism, operation guiding mechanism and motion control system are installed respectively to test board inside, and the test board is installed on the up end of rack, and liquid crystal display installs on the rack top terminal surface, and it is located the rear end face of test board, and liquid crystal display installs in a support pivot.
As the preferable technical scheme, accurate rectilinear motion mechanism includes motor module actuating mechanism, thrust meter and grating chi, the thrust meter is installed in motor module actuating mechanism's upper end, and the grating chi is installed in motor module actuating mechanism's one side, and motor module actuating mechanism drives the thrust meter and carries out rectilinear motion to read the position with the grating chi.
An operation adjusting mechanism of a full-automatic micro-switch function testing machine is composed of an XY manual platform, a quick change mechanism is arranged on the operation adjusting mechanism, and the XY manual platform comprises an X-axis adjusting mechanism and a Y-axis butting mechanism.
As an optimal technical scheme, the X-axis adjusting mechanism is arranged on a test machine and consists of a linear guide rail, a screw rod and a hand wheel.
As the preferable technical scheme, the Y-axis butt joint mechanism is arranged on the X-axis adjusting mechanism, is provided with an automatic buckle and a pressing and ejecting mechanism, and can freely adjust the clamping position through a bolt to finish the manual butt joint operation of the probe and the PIN of the product.
As the preferred technical scheme, quick change mechanism installs on Y axle docking mechanism, and quick change mechanism includes probe seat, plunger, docking base and probe, the probe is provided with more than one, and it is all installed on the probe seat, and the plunger sets up in one side of probe seat, and the probe seat is installed in docking base's up end, and docking base installs on operation adjustment mechanism, and the product seat is installed in the lateral surface of probe seat, and the metal horn of micro-gap switch on the product seat is switched on with the probe contact respectively.
As the preferable technical scheme, the test product is clamped on the product seat, and the locating pin and the plunger are used for completing quick replacement of the probe seats of different types of products.
The beneficial effects of the invention are as follows: the invention can greatly improve the efficiency and the precision of the micro switch test, reduce the labor intensity and improve the product quality. Meanwhile, the invention integrates the tests of operation position, operation force, position difference, release force, resistance and the like, has comprehensive functions, is convenient and flexible to use, can be compatible with multiple products, and is very suitable for testing microswitches of multiple varieties and small batches.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of the overall structure of the present invention;
FIG. 2 is a schematic diagram of a precise linear motion mechanism according to the present invention;
FIG. 3 is a perspective view of the operating adjustment mechanism of the present invention;
FIG. 4 is a front view of FIG. 3;
fig. 5 is a schematic structural view of the quick-change mechanism.
Detailed Description
All of the features disclosed in this specification, or all of the steps in a method or process disclosed, may be combined in any combination, except for mutually exclusive features and/or steps.
Any feature disclosed in this specification (including any accompanying claims, abstract and drawings), may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise. That is, each feature is one example only of a generic series of equivalent or similar features, unless expressly stated otherwise.
As shown in FIG. 1, the device comprises a cabinet 1 for placing peripheral equipment, a test machine table 2, a precise linear motion mechanism 3, an operation adjusting mechanism 4, a quick change mechanism 5 for quick manual switching during testing products of different types, a motion control system and a liquid crystal display 6, wherein the precise linear motion mechanism 3, the quick change mechanism 5, the operation adjusting mechanism 4 and the motion control system are respectively arranged in the test machine table 2, the test machine table 2 is arranged on the upper end face of the cabinet, the liquid crystal display 6 is arranged on the top end face of the cabinet 1, the liquid crystal display 6 is positioned on the rear end face of the test machine table 2, and the liquid crystal display 6 is arranged on a supporting rotating shaft.
As shown in fig. 2, the precise linear motion mechanism 3 includes a motor module driving mechanism 7, a thrust meter 8 and a grating ruler 9, the thrust meter 8 is mounted at the upper end of the motor module driving mechanism 7, the grating ruler 9 is mounted at one side of the motor module driving mechanism 7, the motor module driving mechanism 7 drives the thrust meter 8 to perform linear motion, and the grating ruler 9 is used for reading the position.
As shown in fig. 3 and 4, the operation adjustment mechanism 4 is composed of an XY manual platform, the X axis realizes manual adjustment of measurement positions of different types of products, the Y axis realizes manual docking operation of the probe and the PIN of the product, the quick change mechanism 5 is mounted on the operation adjustment mechanism 4, and the XY manual platform comprises an X axis adjustment mechanism 10 and a Y axis docking mechanism 11; the X-axis adjusting mechanism 10 is arranged on a test machine and consists of a linear guide rail 12, a screw rod 13 and a hand wheel 14.
The Y-axis butt joint mechanism is arranged on the X-axis adjusting mechanism and is provided with an automatic buckle and pressing and ejecting mechanism, and the clamping position can be freely adjusted through a bolt, so that the manual butt joint operation of the probe and the PIN of the product is completed.
As shown in fig. 5, the quick-change mechanism 5 is mounted on the Y-axis docking mechanism, and the quick-change mechanism comprises a probe seat 15, a plunger 16, a docking base 17 and a probe 18, wherein the probe is provided with more than one probe seat, all of which are mounted on the probe seat, the plunger is arranged on one side of the probe seat, the probe seat is mounted on the upper end surface of the docking base, and the docking base is mounted on the operation adjusting mechanism;
the product seat 19 is installed in the lateral surface of probe seat, and the metal feeler of micro-gap switch 20 on the product seat 19 is switched on with the contact of probe 18 respectively, and test product clamping is on the product seat, and the locating pin accomplishes the quick change of different model product probe seats with the plunger, and quick change mechanism can be used to the quick manual switching use when testing different model products.
The beneficial effects of the invention are as follows: the invention can greatly improve the efficiency and the precision of the micro switch test, reduce the labor intensity and improve the product quality. Meanwhile, the invention integrates the tests of operation position, operation force, position difference, release force, resistance and the like, has comprehensive functions, is convenient and flexible to use, can be compatible with multiple products, and is very suitable for testing microswitches of multiple varieties and small batches.
The foregoing is merely illustrative of specific embodiments of the present invention, and the scope of the invention is not limited thereto, but any changes or substitutions that do not undergo the inventive effort should be construed as falling within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope defined by the claims.
Claims (3)
1. A full-automatic micro-gap switch function test machine, its characterized in that: the device comprises a cabinet for placing the external equipment, a test machine table, a precise linear motion mechanism, an operation adjusting mechanism, a quick change mechanism for quick manual switching when testing products of different types, a motion control system and a liquid crystal display screen, wherein the precise linear motion mechanism, the quick change mechanism, the operation adjusting mechanism and the motion control system are respectively arranged in the test machine table;
the operation adjusting mechanism consists of an XY manual platform, the quick change mechanism is arranged on the operation adjusting mechanism, and the XY manual platform comprises an X-axis adjusting mechanism and a Y-axis butting mechanism; the X-axis adjusting mechanism is arranged on the test machine and consists of a linear guide rail, a screw rod and a hand wheel; the Y-axis butt joint mechanism is arranged on the X-axis adjusting mechanism and is provided with an automatic buckle and a pressing and ejecting mechanism, the clamping position can be freely adjusted through a bolt, manual butt joint operation of the probe and a product PIN is completed, the quick-change mechanism is arranged on the Y-axis butt joint mechanism and comprises a probe seat, a plunger, a butt joint base and the probe, the probe is provided with more than one piece and is arranged on the probe seat, the plunger is arranged on one side of the probe seat, the probe seat is arranged on the upper end face of the butt joint base, the butt joint base is arranged on the operation adjusting mechanism, the product seat is arranged on the outer side face of the probe seat, and metal feelers of the micro-switch on the product seat are respectively contacted and conducted with the probe.
2. The fully automatic microswitch function test machine as in claim 1 wherein: the precise linear motion mechanism comprises a motor module driving mechanism, a thrust meter and a grating ruler, wherein the thrust meter is arranged at the upper end of the motor module driving mechanism, the grating ruler is arranged on one side of the motor module driving mechanism, and the motor module driving mechanism drives the thrust meter to conduct linear motion and reads the position by the grating ruler.
3. The fully automatic microswitch function test machine as in claim 1 wherein: the test product is clamped on the product seat, and the locating pin and the plunger are used for completing quick replacement of the probe seats of different types of products.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611232273.4A CN106772011B (en) | 2016-12-27 | 2016-12-27 | Full-automatic micro-gap switch function test machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611232273.4A CN106772011B (en) | 2016-12-27 | 2016-12-27 | Full-automatic micro-gap switch function test machine |
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| Publication Number | Publication Date |
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| CN106772011A CN106772011A (en) | 2017-05-31 |
| CN106772011B true CN106772011B (en) | 2023-10-20 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201611232273.4A Active CN106772011B (en) | 2016-12-27 | 2016-12-27 | Full-automatic micro-gap switch function test machine |
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Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107253050B (en) * | 2017-08-10 | 2019-05-10 | 苏州市全力自动化科技有限公司 | Big rocker type switch automatically assembles detection operating force test machine |
| CN108918116B (en) * | 2018-06-22 | 2020-12-18 | 格力电器（武汉）有限公司 | Micro-gap switch detects anchor clamps and micro-gap switch detection device |
| CN110045274A (en) * | 2019-04-04 | 2019-07-23 | 宁波拓普电器有限公司 | A kind of microswitch test monitoring system and method |
| TWI685165B (en) * | 2019-04-08 | 2020-02-11 | 大陸商東莞寶德電子有限公司 | Signal detecting circuit for micro switch and method thereof |
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| JP2009128326A (en) * | 2007-11-28 | 2009-06-11 | Nec Corp | Position regulator and regulating method |
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| JP2009128326A (en) * | 2007-11-28 | 2009-06-11 | Nec Corp | Position regulator and regulating method |
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| CN106772011A (en) | 2017-05-31 |
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