CN215116389U - Troubleshooting device of semiconductor equipment - Google Patents
Troubleshooting device of semiconductor equipment Download PDFInfo
- Publication number
- CN215116389U CN215116389U CN202120989500.8U CN202120989500U CN215116389U CN 215116389 U CN215116389 U CN 215116389U CN 202120989500 U CN202120989500 U CN 202120989500U CN 215116389 U CN215116389 U CN 215116389U
- Authority
- CN
- China
- Prior art keywords
- electric telescopic
- telescopic rod
- fixedly installed
- working plate
- fixing seat
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a troubleshooting device of semiconductor equipment, which comprises a device main body, wherein a working plate is fixedly arranged at the bottom end of the device main body, a first chute is arranged at one side of the top end of the working plate, and a first electric telescopic rod is arranged in the first chute; in the utility model, the first limiting seat can move towards the second limiting seat through the telescopic action of the first electric telescopic rod, so that the first limiting seat and the second limiting seat can fix the semiconductor equipment, and the stability of the semiconductor equipment during detection is kept; the position of the test pen can be adjusted left and right through the telescopic action of the second electric telescopic rod, the position of the test pen can be adjusted front and back through the telescopic action of the third electric telescopic rod, and the position of the test pen can be adjusted up and down through the telescopic action of the fourth electric telescopic rod, so that the test pen can comprehensively detect the semiconductor equipment.
Description
Technical Field
The utility model belongs to the technical field of the semiconductor inspection, particularly, relate to a semiconductor device's troubleshooting device.
Background
The semiconductor is a material with electric conductivity between a conductor and an insulator at normal temperature, and is applied to the fields of integrated circuits, consumer electronics, communication systems, photovoltaic power generation, illumination application, high-power conversion and the like.
In the prior art, semiconductor troubleshooting is performed on semiconductor equipment through a manual handheld test pen, so that more time and labor of workers are consumed, and the efficiency is low.
An effective solution to the problems in the related art has not been proposed yet.
Therefore, in order to solve the above problems, the utility model provides a troubleshooting device of semiconductor equipment.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a semiconductor device's troubleshooting device to solve the problem that proposes among the above-mentioned background art.
In order to achieve the above object, the utility model provides a following technical scheme: a troubleshooting device of semiconductor equipment comprises a device main body, a working plate is fixedly arranged at the bottom end of the device main body, a first chute is arranged at one side of the top end of the working plate, a first electric telescopic rod is arranged in the first chute, one end of the first electric telescopic rod is fixedly provided with a first sliding block, the top end of the first sliding block is fixedly provided with a first limiting seat, a second limiting seat is arranged at one end of the first sliding chute, a second sliding chute is arranged at the other side of the top end of the working plate, a second electric telescopic rod is arranged in the second sliding chute, a second sliding block is fixedly arranged at one end of the second electric telescopic rod, the top end of the second sliding block is fixedly provided with a support column, the top end of the support column is provided with a third electric telescopic rod, and a fourth electric telescopic rod is installed at one end of the third electric telescopic rod, and a test pen is installed at the bottom end of the fourth electric telescopic rod.
Further, the equal fixed mounting in bottom four corners department of working plate has the supporting leg, the wheel mounting panel is installed to the bottom of supporting leg, the wheel is installed to the bottom of wheel mounting panel, wheel through connection installs the connection pivot.
Further, the inside one end fixed mounting of first spout has first fixing base, one side fixed mounting of first fixing base has first electric telescopic handle, first slider with first spout sliding connection, the bottom of first spacing seat with the top sliding connection of working plate, the bottom fixed mounting of the spacing seat of second is in the top of working plate.
Furthermore, a second fixing seat is fixedly mounted at one end of the inside of the second sliding groove, a second electric telescopic rod is fixedly mounted at one side of the second fixing seat, and the second sliding block is connected with the second sliding groove in a sliding mode.
Furthermore, the top end fixed mounting of pillar has the third fixing base, one side fixed mounting of third fixing base has third electric telescopic handle.
Further, the one end fixed mounting of third electric telescopic handle has the fourth fixing base, the bottom fixed mounting of fourth fixing base has fourth electric telescopic handle, fourth electric telescopic handle's bottom fixed mounting has the fifth fixing base, the bottom fixed mounting of fifth fixing base has the test pen.
Compared with the prior art, the utility model discloses following beneficial effect has:
1. the utility model discloses in, can make first spacing seat remove towards the direction of the spacing seat of second through electric telescopic handle's flexible effect, and then make first spacing seat and the spacing seat of second fix semiconductor equipment, keep the stability that semiconductor equipment waited when detecting.
2. The utility model discloses in, can come to control the position of test pen through the flexible effect of second electric telescopic handle and adjust, can come to adjust around the position of test pen through the flexible effect of third electric telescopic handle, can come to adjust about the position of test pen through the flexible effect of fourth electric telescopic handle to make the test pen can be comprehensive come to detect semiconductor equipment.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic perspective view of the present invention;
fig. 2 is a schematic plan view of the present invention;
fig. 3 is a schematic structural view of a first sliding chute of the present invention;
fig. 4 is a schematic view of a second sliding chute structure of the present invention.
Reference numerals:
1. a device main body; 2. a working plate; 3. supporting legs; 301. a wheel mounting plate; 302. a wheel; 303. connecting the rotating shaft; 4. a first chute; 401. a first fixed seat; 402. a first electric telescopic rod; 403. a first slider; 404. a first limiting seat; 405. a second limiting seat; 5. a second chute; 501. a second fixed seat; 502. a second electric telescopic rod; 503. a second slider; 504. a pillar; 505. a third fixed seat; 6. a third electric telescopic rod; 601. a fourth fixed seat; 7. a fourth electric telescopic rod; 701. a fifth fixed seat; 8. a test pen.
Detailed Description
The following, with reference to the drawings and the detailed description, further description of the present invention is made:
referring to fig. 1 to 4, a troubleshooting device for semiconductor devices according to an embodiment of the present invention includes a device main body 1, a working plate 2 is fixedly installed at a bottom end of the device main body 1, a first sliding groove 4 is disposed at one side of a top end of the working plate 2, a first electric telescopic rod 402 is installed inside the first sliding groove 4, a first slider 403 is fixedly installed at one end of the first electric telescopic rod 402, a first limit seat 404 is fixedly installed at a top end of the first slider 403, a second limit seat 405 is installed at one end of the first sliding groove 4, a second sliding groove 5 is disposed at the other side of the top end of the working plate 2, a second electric telescopic rod 502 is installed inside the second sliding groove 5, a second slider 503 is fixedly installed at one end of the second electric telescopic rod 502, a pillar 504 is fixedly installed at a top end of the second slider 503, a third electric telescopic rod 6 is installed at a top end of the pillar 504, a fourth electric telescopic rod 7 is installed at one end of the third electric telescopic rod 6, and a test pen 8 is installed at the bottom end of the fourth electric telescopic rod 7.
Through the scheme of the utility model, the supporting legs 3 are fixedly installed at the four corners of the bottom end of the working plate 2, the wheel mounting plate 301 is installed at the bottom end of the supporting legs 3, the wheels 302 are installed at the bottom end of the wheel mounting plate 301, and the wheels 302 are installed with the connecting rotating shafts 303 in a penetrating connection manner; a first fixed seat 401 is fixedly mounted at one end inside the first sliding chute 4, the first electric telescopic rod 402 is fixedly mounted at one side of the first fixed seat 401, the first sliding block 403 is in sliding connection with the first sliding chute 4, the bottom end of the first limiting seat 404 is in sliding connection with the top end of the working plate 2, and the bottom end of the second limiting seat 405 is fixedly mounted at the top end of the working plate 2; a second fixed seat 501 is fixedly installed at one end inside the second sliding chute 5, a second electric telescopic rod 502 is fixedly installed at one side of the second fixed seat 501, and the second sliding block 503 is connected with the second sliding chute 5 in a sliding manner; a third fixing seat 505 is fixedly installed at the top end of the supporting column 504, and the third electric telescopic rod 6 is fixedly installed at one side of the third fixing seat 505; one end fixed mounting of third electric telescopic handle 6 has fourth fixing base 601, the bottom fixed mounting of fourth fixing base 601 has fourth electric telescopic handle 7, the bottom fixed mounting of fourth electric telescopic handle 7 has fifth fixing base 701, the bottom fixed mounting of fifth fixing base 701 has test pen 8.
In specific application, the semiconductor device is firstly placed at the top end of the working plate 2 and positioned between the first limiting seat 404 and the second limiting seat 405, then the first electric telescopic rod 402 is started, the second limiting seat 405 can move towards the direction of the first limiting seat 404 under the action of the first electric telescopic rod 402, further the first limiting seat 404 and the second limiting seat 405 can clamp and fix the semiconductor device, the stability of the semiconductor device in the testing process is kept, then the semiconductor device is detected through the testing pen 8, the position of the testing pen 8 can be adjusted left and right under the telescopic action of the second electric telescopic rod 502, the position of the testing pen 8 can be adjusted front and back under the telescopic action of the third electric telescopic rod 6, the position of the testing pen 8 can be adjusted up and down under the telescopic action of the fourth electric telescopic rod 7, so that the test pen 8 can be used to test the semiconductor device in its entirety.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments described in the foregoing embodiments, or equivalents may be substituted for elements thereof. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (6)
1. The troubleshooting device of the semiconductor equipment is characterized by comprising a device main body (1), wherein a working plate (2) is fixedly mounted at the bottom end of the device main body (1), a first sliding groove (4) is formed in one side of the top end of the working plate (2), a first electric telescopic rod (402) is mounted inside the first sliding groove (4), a first sliding block (403) is fixedly mounted at one end of the first electric telescopic rod (402), a first limiting seat (404) is fixedly mounted at the top end of the first sliding block (403), a second limiting seat (405) is mounted at one end of the first sliding groove (4), a second sliding groove (5) is formed in the other side of the top end of the working plate (2), a second electric telescopic rod (502) is mounted inside the second sliding groove (5), and a second sliding block (503) is fixedly mounted at one end of the second electric telescopic rod (502), the top fixed mounting of second slider (503) has pillar (504), third electric telescopic handle (6) are installed on the top of pillar (504), fourth electric telescopic handle (7) are installed to the one end of third electric telescopic handle (6), test pen (8) are installed to the bottom of fourth electric telescopic handle (7).
2. The troubleshooting device of a semiconductor device as claimed in claim 1, wherein the bottom four corners of the working plate (2) are all fixedly provided with supporting legs (3), the bottom ends of the supporting legs (3) are provided with wheel mounting plates (301), the bottom ends of the wheel mounting plates (301) are provided with wheels (302), and the wheels (302) are provided with connecting rotating shafts (303) through connection.
3. The troubleshooting device of a semiconductor device as claimed in claim 1, wherein a first fixing seat (401) is fixedly installed at one end of the interior of the first sliding chute (4), the first electric telescopic rod (402) is fixedly installed at one side of the first fixing seat (401), the first slider (403) is slidably connected with the first sliding chute (4), the bottom end of the first limiting seat (404) is slidably connected with the top end of the working plate (2), and the bottom end of the second limiting seat (405) is fixedly installed at the top end of the working plate (2).
4. The troubleshooting device for semiconductor equipment as claimed in claim 1, wherein a second fixing seat (501) is fixedly installed at one end of the inside of the second sliding chute (5), the second electric telescopic rod (502) is fixedly installed at one side of the second fixing seat (501), and the second sliding block (503) is slidably connected with the second sliding chute (5).
5. The troubleshooting apparatus for semiconductor device as claimed in claim 1, wherein a third fixing seat (505) is fixedly installed on a top end of said pillar (504), and said third electric telescopic rod (6) is fixedly installed on one side of said third fixing seat (505).
6. The troubleshooting device for semiconductor equipment as claimed in claim 1, wherein a fourth fixing seat (601) is fixedly installed at one end of the third electric telescopic rod (6), the fourth electric telescopic rod (7) is fixedly installed at a bottom end of the fourth fixing seat (601), a fifth fixing seat (701) is fixedly installed at a bottom end of the fourth electric telescopic rod (7), and the test pen (8) is fixedly installed at a bottom end of the fifth fixing seat (701).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120989500.8U CN215116389U (en) | 2021-05-11 | 2021-05-11 | Troubleshooting device of semiconductor equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120989500.8U CN215116389U (en) | 2021-05-11 | 2021-05-11 | Troubleshooting device of semiconductor equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215116389U true CN215116389U (en) | 2021-12-10 |
Family
ID=79295435
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202120989500.8U Active CN215116389U (en) | 2021-05-11 | 2021-05-11 | Troubleshooting device of semiconductor equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215116389U (en) |
-
2021
- 2021-05-11 CN CN202120989500.8U patent/CN215116389U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104980094A (en) | Solar energy support guide rail, clamp block, intermediate-voltage block, and side-voltage block in cooperative usage | |
| CN215116389U (en) | Troubleshooting device of semiconductor equipment | |
| CN205622581U (en) | Solar rack for electrical equipment | |
| CN211930946U (en) | Equipment for eliminating glass static electricity | |
| CN204947973U (en) | solar bracket guide rail | |
| CN210360028U (en) | Clamping tool for production and processing of switching power supply | |
| CN203649760U (en) | Single tube welding fixture of three-phase photovoltaic grid-connected inverter | |
| CN210123448U (en) | Intelligent power distribution network electrical equipment testing device | |
| CN112649668A (en) | Electric energy quality high frequency harmonic monitoring devices | |
| CN204496375U (en) | Computer cables support | |
| CN215064402U (en) | Concrete crack detection device | |
| CN213933779U (en) | Nondestructive testing device for ring forging | |
| CN210878267U (en) | Fixing clamp for welding for production of distribution box | |
| CN214473473U (en) | A test positioning jig for shielded cell | |
| CN213069049U (en) | Self-power-consumption test jig for battery protection board | |
| CN203920804U (en) | Dielectric Loss Test tool cart | |
| CN217305215U (en) | Tray anti-reverse device for semiconductor test | |
| CN212302378U (en) | Computer display card is with heat dissipation protective bracket | |
| CN212675049U (en) | Power equipment checks and uses device | |
| CN215835022U (en) | Insulating protector that power supply and distribution engineering construction was used | |
| CN215580530U (en) | Special environment loss reduction device for power distribution area | |
| CN211478390U (en) | High-power IGBT module test fixture | |
| CN213661140U (en) | Fixed firm portable insulating bus crane span structure | |
| CN211348443U (en) | 5G antenna high frequency test socket | |
| CN208085753U (en) | A kind of holder of electrical cabinet easy to remove |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |