CN215067126U - Analog integrated circuit test machine with heat radiation structure of being convenient for - Google Patents
Analog integrated circuit test machine with heat radiation structure of being convenient for Download PDFInfo
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- CN215067126U CN215067126U CN202121452162.0U CN202121452162U CN215067126U CN 215067126 U CN215067126 U CN 215067126U CN 202121452162 U CN202121452162 U CN 202121452162U CN 215067126 U CN215067126 U CN 215067126U
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Abstract
The utility model discloses an analog integrated circuit testing machine with a structure convenient for heat dissipation, which comprises a base, a track rod and a track rod, wherein the track rod is arranged above the base; the sliding seat is connected to the outer wall of the track rod; the cylinder is fixed on the outer wall of the sliding seat; the lifting platform is connected to the lower end of the cylinder; and the motor is connected to the outer wall of the lifting platform. This simulation integrated circuit test machine with heat radiation structure of being convenient for, the last flitch that sets up can carry out and detect the integrated chip that finishes to the integrated chip that needs detected, and go up the flitch and can carry out longitudinal sliding through sharp module, cooperation lateral sliding's sliding seat can make the magnetic force of tooth's socket strip lower extreme adsorb the piece accurate adsorb unloading to integrated chip, and the right-hand test circuit board that sets up can carry out the test handling to the integrated chip of unloading, its process can cooperate two tooth's socket strips of liftable to carry out the test handling of two integrated chip in proper order, and the efficiency of software testing is greatly improved.
Description
Technical Field
The utility model relates to an integrated circuit test technical field specifically is an analog integrated circuit test machine with heat radiation structure of being convenient for.
Background
The integrated circuit tester is a special instrument for testing integrated circuits, the integrated circuit test is one of key means for ensuring the performance and quality of the integrated circuits, and the integrated circuits need to be arranged on corresponding test circuit boards for detection processing in the process of testing the integrated chips so as to screen out unqualified chips and avoid the unqualified chips from flowing into the market.
At present, an analog integrated circuit tester on the market can only detect one integrated chip core at one time, and the detection efficiency is low.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide an analog integrated circuit test machine with heat radiation structure of being convenient for to solve the present market that proposes in the above-mentioned background art and go up analog integrated circuit test machine and can only once only detect an integrated chip core, the lower problem of its detection efficiency.
In order to achieve the above object, the utility model provides a following technical scheme: an analog integrated circuit tester having a structure for facilitating heat dissipation, comprising:
a base;
further comprising:
a track rod disposed above the base;
the sliding seat is connected to the outer wall of the track rod;
the cylinder is fixed on the outer wall of the sliding seat;
the lifting platform is connected to the lower end of the cylinder;
the motor is connected to the outer wall of the lifting platform;
a gear connected to a terminal end of the motor;
the first tooth groove strip is connected to the outer wall of one side of the gear;
the second rack bar is connected to the outer wall of the other side of the gear;
the linear module is arranged on the upper surface of the base;
the upper material plate is connected to the upper surface of the linear module;
the test circuit board is arranged on the right side of the feeding plate;
and the fixing component is arranged on the outer wall of the test circuit board.
Preferably, the lifting platform forms a lifting structure through a space between the cylinder and the sliding seat, and the lifting platform forms a sliding structure through a space between the sliding seat and the rail rod.
Preferably, the gear passes through to constitute rotating-structure between motor and the elevating platform, and is connected for the meshing between gear and the first rack and the second rack.
Preferably, the feeding plate and the base form a sliding structure through the linear module, and the feeding plate and the test circuit board are distributed in parallel.
Preferably, the lower surface of the test circuit board is provided with a mounting bottom net;
and the heat radiation fans are arranged on the lower surface of the mounting bottom net and are symmetrically distributed about the vertical center line of the mounting bottom net.
Preferably, the fixing assembly includes:
a clamping block;
the clamping head is arranged on the upper surface of the clamping block;
and the spring is connected to the lower end of the clamping joint.
Preferably, the clamping head forms an elastic structure with the base through the spring, and the clamping head is connected with the clamping block in a clamping manner.
The utility model provides an analog integrated circuit test machine with heat radiation structure of being convenient for possesses following beneficial effect: the testing machine has better testing efficiency, better heat dissipation effect and more convenient subsequent maintenance.
1. The utility model discloses, the last flitch that sets up can be stored the integrated chip that needs detected and detect and finish to go up the flitch and can carry out longitudinal sliding through sharp module, cooperation lateral sliding's sliding seat can make the magnetic force of tooth's socket strip lower extreme adsorb the piece accurate adsorb unloading to integrated chip, and the test circuit board of right-hand setting can carry out the test handling to the integrated chip of unloading, two tooth's socket strips that its process can cooperate the liftable carry out two integrated chip's in proper order test handling, and the efficiency of software testing is greatly improved.
2. The utility model discloses, the motor that the elevating platform outer wall set up can drive the gear and rotate, and pivoted gear can drive the first rack bar and the second rack bar of its outer wall simultaneously and rise and descend, and the rack bar end all is provided with material piece in the magnetism, can carry out magnetism to two integrated chip simultaneously and inhale and adsorb.
3. The utility model discloses, it has the installation end net that is the net gape form to settle test circuit board below to two radiator fan of cooperation can effectively give off test circuit board's heat, are favorable to improving its testing arrangement's heat dispersion, and test circuit board outer wall is provided with the fixture block and can carries out the block with the joint head and be connected, and the joint head can carry out elasticity through the spring of lower extreme and go up and down, thereby and carry out the block between the joint head or break away from, make test circuit board's dismouting operation more convenient.
Drawings
Fig. 1 is a schematic diagram of an overall structure of an analog integrated circuit testing machine with a structure facilitating heat dissipation according to the present invention;
fig. 2 is a schematic view of a top-view structure of a feeding plate of an analog ic testing machine with a structure facilitating heat dissipation according to the present invention;
fig. 3 is a schematic view of a gear structure of an analog integrated circuit testing machine with a structure facilitating heat dissipation according to the present invention;
fig. 4 is a schematic diagram of a fixture block structure of an analog integrated circuit testing machine with a structure facilitating heat dissipation according to the present invention;
fig. 5 is an enlarged schematic diagram of a position a in fig. 1 of the analog integrated circuit testing machine with a structure convenient for heat dissipation according to the present invention.
In the figure: 1. a base; 2. a track rod; 3. a sliding seat; 4. a cylinder; 5. a lifting platform; 6. a motor; 7. a gear; 8. a first rack and pinion; 9. a second rack bar; 10. a linear module; 11. feeding plates; 12. testing the circuit board; 13. installing a bottom net; 14. a heat radiation fan; 15. a fixing assembly; 1501. a clamping block; 1502. a clamping head; 1503. a spring.
Detailed Description
1-3, an analog integrated circuit tester having a structure for facilitating heat dissipation, comprising: a base 1; further comprising: a track rod 2 disposed above the base 1; a sliding seat 3 connected to the outer wall of the track rod 2; the cylinder 4 is fixed on the outer wall of the sliding seat 3; a lifting platform 5 connected to the lower end of the cylinder 4; the lifting platform 5 forms a lifting structure through the space between the cylinder 4 and the sliding seat 3, and the lifting platform 5 forms a sliding structure through the space between the sliding seat 3 and the track rod 2; the arranged lifting platform 5 can transversely slide between the sliding seat 3 and the track rod 2 so as to transfer the integrated chip below, and the lifting platform 5 can be lifted through the air cylinder 4 simultaneously so as to carry out feeding and discharging detection operation on the integrated chip; a motor 6 connected to the outer wall of the lifting platform 5; a gear 7 connected to the end of the motor 6; a first rack bar 8 connected to the outer wall of one side of the gear 7; a second rack 9 connected to the outer wall of the other side of the gear 7; a rotating structure is formed between the gear 7 and the lifting platform 5 through the motor 6, the gear 7 is in meshed connection with the first tooth groove strip 8 and the second tooth groove strip 9, the motor 6 arranged on the outer wall of the lifting platform 5 can drive the gear 7 to rotate, the rotating gear 7 can simultaneously drive the first tooth groove strip 8 and the second tooth groove strip 9 on the outer wall of the lifting platform to ascend and descend, and magnetic feeding blocks are arranged at the tail ends of the tooth groove strips and can simultaneously perform magnetic absorption and adsorption on two integrated chips; a linear module 10 disposed on the upper surface of the base 1; an upper material plate 11 connected to the upper surface of the linear module 10; a test circuit board 12 disposed on the right of the upper board 11; the feeding plate 11 and the base 1 form a sliding structure through the linear module 10, and the feeding plate 11 and the test circuit board 12 are distributed in parallel; the upper material plate 11 can store the integrated chips to be detected and the detected integrated chips, the upper material plate 11 can longitudinally slide through the linear module 10, the magnetic adsorption blocks at the lower ends of the tooth socket strips can accurately adsorb and feed the integrated chips by matching with the sliding seat 3 which transversely slides, the test circuit board 12 arranged on the right can detect the fed integrated chips, and the test circuit board can be matched with the two liftable tooth socket strips to test and process two integrated chips in sequence, so that the test efficiency is greatly improved; the lower surface of the test circuit board 12 is provided with a mounting bottom net 13; the heat radiation fans 14 are arranged on the lower surface of the installation bottom net 13, and the heat radiation fans 14 are symmetrically distributed around the vertical center line of the installation bottom net 13; a mounting bottom net 13 in a net mouth shape is arranged below the test circuit board 12, and the two cooling fans 14 are matched to effectively dissipate heat of the test circuit board 12, so that the cooling performance of the test device is improved;
as shown in fig. 4 to 5, a fixing member 15 is disposed on an outer wall of the test circuit board 12, and the fixing member 15 includes: a fixture block 1501; the clamping head 1502 is arranged on the upper surface of the clamping block 1501; a spring 1503 connected to the lower end of the bayonet 1502; the clamping head 1502 and the base 1 form an elastic structure through a spring 1503, and the clamping head 1502 and the clamping block 1501 are in clamping connection; the outer wall of the test circuit board 12 is provided with a clamping block 1501 which can be clamped with the clamping head 1502, and the clamping head 1502 can elastically lift through the spring 1503 at the lower end, so that the clamping head 1502 can be clamped or separated, and the dismounting and mounting operation of the test circuit board 12 is more convenient.
In conclusion, when the tester for simulating integrated circuits with a structure convenient for heat dissipation is used, the upper plate 11 arranged firstly can store the integrated chips to be tested and the tested integrated chips, and the upper plate 11 can slide longitudinally through the linear module 10, the lifting platform 5 arranged can slide transversely through the sliding seat 3 and the track rod 2, then the motor 6 arranged on the outer wall of the lifting platform 5 can drive the gear 7 to rotate, the rotating gear 7 can simultaneously drive the first rack bar 8 and the second rack bar 9 on the outer wall to ascend and descend, the tail end of each rack bar is provided with the magnetic upper block which can simultaneously carry out magnetic absorption on the two integrated chips and transfer the two integrated chips to the right test circuit board 12 for test processing, and the process can be matched with the two liftable rack bars to carry out test processing on the two integrated chips in sequence, the efficiency of testing is greatly improved, and test circuit board 12 outer wall is provided with fixture block 1501 at last and can carry out the block with joint 1502 and be connected, and joint 1502 can carry out elasticity through spring 1503 of lower extreme and go up and down to with joint 1502 between carry out the block or break away from, make test circuit board 12's dismouting operation more convenient.
Claims (7)
1. An analog integrated circuit tester having a structure for facilitating heat dissipation, comprising:
a base (1);
it is characterized by also comprising:
a track rod (2) disposed above the base (1);
the sliding seat (3) is connected to the outer wall of the track rod (2);
the cylinder (4) is fixed on the outer wall of the sliding seat (3);
a lifting platform (5) connected to the lower end of the cylinder (4);
the motor (6) is connected to the outer wall of the lifting platform (5);
a gear (7) connected to the end of the motor (6);
a first rack bar (8) connected to the outer wall of one side of the gear (7);
a second rack (9) connected to the other side outer wall of the gear (7);
a linear module (10) arranged on the upper surface of the base (1);
the upper material plate (11) is connected to the upper surface of the linear module (10);
the test circuit board (12) is arranged on the right side of the upper material plate (11);
and the fixing component (15) is arranged on the outer wall of the test circuit board (12).
2. The device for testing the analog integrated circuit with the structure for facilitating heat dissipation as recited in claim 1, wherein the lifting table (5) passes through a space between the cylinder (4) and the sliding base (3) to form a lifting structure, and the lifting table (5) passes through a space between the sliding base (3) and the track rod (2) to form a sliding structure.
3. The tester for testing the analog integrated circuit with the structure facilitating heat dissipation as recited in claim 1, wherein the gear (7) is in a rotating structure with the lifting table (5) through the motor (6), and the gear (7) is in meshed connection with the first rack (8) and the second rack (9).
4. The tester for testing the ICs with the structure facilitating heat dissipation as recited in claim 1, wherein the material feeding plate (11) passes through the linear module (10) and forms a sliding structure with the base (1), and the material feeding plate (11) and the test circuit board (12) are arranged in parallel.
5. The analog integrated circuit tester with a structure for facilitating heat dissipation as set forth in claim 1, wherein a mounting base net (13) is provided on a lower surface of the test circuit board (12);
and the heat radiation fans (14) are arranged on the lower surface of the mounting bottom net (13), and the heat radiation fans (14) are symmetrically distributed around the vertical center line of the mounting bottom net (13).
6. An analog integrated circuit tester having a structure for facilitating heat dissipation as set forth in claim 1, wherein said holding member (15) comprises:
a latch (1501);
the clamping head (1502) is arranged on the upper surface of the clamping block (1501);
a spring (1503) connected to a lower end of the bayonet (1502).
7. The device for testing the analog integrated circuit with the structure facilitating heat dissipation as recited in claim 6, wherein the latch head (1502) forms an elastic structure with the base (1) through the spring (1503), and the latch head (1502) is in snap-fit connection with the latch (1501).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121452162.0U CN215067126U (en) | 2021-06-28 | 2021-06-28 | Analog integrated circuit test machine with heat radiation structure of being convenient for |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121452162.0U CN215067126U (en) | 2021-06-28 | 2021-06-28 | Analog integrated circuit test machine with heat radiation structure of being convenient for |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215067126U true CN215067126U (en) | 2021-12-07 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202121452162.0U Active CN215067126U (en) | 2021-06-28 | 2021-06-28 | Analog integrated circuit test machine with heat radiation structure of being convenient for |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117310451A (en) * | 2023-11-27 | 2023-12-29 | 深圳市晶导电子有限公司 | Detection device applied to short-sized direct-insert plastic package chip |
-
2021
- 2021-06-28 CN CN202121452162.0U patent/CN215067126U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117310451A (en) * | 2023-11-27 | 2023-12-29 | 深圳市晶导电子有限公司 | Detection device applied to short-sized direct-insert plastic package chip |
| CN117310451B (en) * | 2023-11-27 | 2024-02-23 | 深圳市晶导电子有限公司 | Detection device applied to short-sized direct-insert plastic package chip |
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