CN215066821U

CN215066821U - Semiconductor power device test fixture

Info

Publication number: CN215066821U
Application number: CN202121044243.7U
Authority: CN
Inventors: 马磊; 周军
Original assignee: Individual
Current assignee: Individual
Priority date: 2021-05-17
Filing date: 2021-05-17
Publication date: 2021-12-07
Anticipated expiration: 2031-05-17

Abstract

The utility model discloses a semiconductor power device test fixture, which comprises a base, an L support frame is arranged at one side of the base, a placing seat is fixedly arranged on the base, a clamping mechanism is arranged on the placing seat, a connecting frame is arranged above the placing seat, a support rod is arranged between one side of the connecting frame and the L support frame, a plurality of movable connectors are arranged on the connecting frame, the connectors comprise sliding grooves, sliding grooves are arranged on the connecting frame, sliding blocks are arranged in the sliding grooves in a sliding way, a moving handle is arranged at one side of the sliding blocks, sliding grooves matched with the moving handle are arranged at the side edges of the sliding grooves, lifting columns are arranged on the sliding blocks in a penetrating way, insulation plates are arranged at the bottoms of the lifting columns, clamping heads are arranged at the bottoms of the insulation plates, wires are arranged at one side of the clamping heads, the utility model can adjust the spacing of the clamping heads through the moving handle, thereby conveniently adjusting the positions of the clamping heads, the semiconductor power devices with different sizes can be conveniently tested and used.

Description

Semiconductor power device test fixture

Technical Field

The utility model relates to a semiconductor power device tests technical field, especially relates to a semiconductor power device test fixture.

Background

With the development of technology, the development of semiconductor devices is more and more rapid, and during the research and analysis of the existing semiconductor devices, in order to ensure that the semiconductor device functions sufficiently during the application process, the semiconductor device needs to be tested, in the testing process, in order to ensure the testing accuracy, after the semiconductor device is clamped by the clamp, the static detection is carried out, the existing semiconductor devices have a great variety and different sizes, in addition, for the convenience of connection of semiconductor devices, pins are generally arranged, and the pitches of the pins generally change along with the change of the sizes of the semiconductor devices, and the existing clamp can only detect one kind of semiconductor device, which is inconvenient for detecting semiconductor devices of different sizes.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the shortcoming that exists among the prior art, and the semiconductor power device test fixture that proposes.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

the utility model provides a semiconductor power device test fixture, includes the base, places seat and L support frame, the L support frame sets up one side at the base, place the fixed setting on the base of seat, it is equipped with fixture on the seat to place, the top of placing the seat is equipped with the link, be equipped with the bracing piece between one side of link and the L support frame, be equipped with the connector of a plurality of activities on the link, the connector includes the sliding tray, be equipped with the sliding tray that runs through on the link, it is equipped with the sliding block to slide in the sliding tray, one side of sliding block is equipped with removes the handle, and the side of sliding tray be equipped with remove handle complex sliding groove, run through on the sliding block and be equipped with the lift post, and the bottom of lift post is equipped with the insulation board, the bottom of insulation board is equipped with the holding head, one side of holding head is equipped with the wire.

Preferably, be equipped with the spacing spout of a set of symmetry in the lift post, be equipped with in the sliding block with spacing spout complex spacing slider, the surface of spacing slider is equipped with the rubber pad, and the inside wall of spacing slider and spacing spout closely laminates.

Preferably, the clamping head comprises a fixing block A, the bottom of the insulating plate is provided with the fixing block A, the bottom of the fixing block A is provided with an arc-shaped clamping plate A, one side of the fixing block A is provided with a fixing block B, the fixing block A and the fixing block B are connected through a contraction mechanism, and the bottom of the fixing block B is provided with an arc-shaped clamping plate B.

Preferably, shrink mechanism includes fixed sleeving, one side of fixed block A is equipped with fixed sleeving, one side of fixed block B is equipped with flexible post, the tip of flexible post is equipped with spacing dish, and just the setting of spacing dish slip is in fixed sleeving, the cover is equipped with the spring on the flexible post, and the spring setting is between spacing dish and fixed sleeving.

Preferably, fixture includes the limiting plate, the inboard of placing the seat is equipped with the limiting plate, the left side of placing the seat is equipped with grip block A, the right side of placing the seat is equipped with grip block B, grip block B and place and be equipped with the moving mechanism between the seat.

Preferably, the movable mechanism includes the regulating block, the fixed bottom that sets up at splint B of regulating block, place be equipped with on the seat with regulating block complex shifting chute, the shifting chute internal rotation is equipped with the threaded rod, and passes through threaded connection between threaded rod and the regulating block, the tip of threaded rod is equipped with the rotation handle.

Compared with the prior art, the beneficial effects of the utility model are that:

1. through rotatory rotation handle for rotate the handle and drive the threaded rod, the threaded rod then drives the regulating block and controls in the shifting chute, makes the regulating block drive grip block B and controls, makes grip block B cooperation grip block A carry out the centre gripping to semiconductor power device, through such setting, makes grip block B and grip block A can fix the centre gripping to the semiconductor power device of equidimension not, and application scope is wider, and the later stage of being convenient for detects.

2. Can drive the sliding block through removing the handle and remove about in the sliding tray to can adjust the interval of holding head according to semiconductor power device pin interval size, then through pressing down the lift post, make the holding head carry out the centre gripping to semiconductor power device's pin and detect, through such setting, can adjust the interval of holding head, thereby conveniently carry out the centre gripping to the pin of different intervals, be convenient for detect.

Drawings

Fig. 1 is a schematic structural diagram of a semiconductor power device testing fixture according to the present invention;

FIG. 2 is a schematic structural view of the connecting frame and the connecting head of the present invention;

fig. 3 is a partially enlarged view of a portion a in fig. 2 according to the present invention.

In the figure: the base 1, place seat 2, limiting plate 3, grip block A4, grip block B5, connector 6, sliding tray 61, sliding block 62, removal handle 63, slide clamping groove 64, lift post 65, insulation board 66, centre gripping head 67, fixed block A671, arc splint A672, fixed block B673, arc splint B674, wire 68, link 7, bracing piece 8, L support frame 9, logical groove 10, regulating block 11, shifting chute 12, threaded rod 13, rotation handle 14, protection pad 15, fixed sleeve 16, flexible post 17, spacing dish 18, spring 19, spacing spout 22.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.

Referring to fig. 1-3, a semiconductor power device testing fixture, comprising a base 1, a placing seat 2 and an L supporting frame 9, wherein the L supporting frame 9 is arranged at one side of the base 1, the placing seat 2 is fixedly arranged on the base 1, a clamping mechanism is arranged on the placing seat 2, a connecting frame 7 is arranged above the placing seat 2, a supporting rod 8 is arranged between one side of the connecting frame 7 and the L supporting frame 9, a plurality of movable connectors 6 are arranged on the connecting frame 7, each connector 6 comprises a sliding groove 61, a through sliding groove 61 is arranged on the connecting frame 7, a sliding block 62 is arranged in the sliding groove 61, a moving handle 63 is arranged at one side of the sliding block 62, a sliding slot 64 matched with the sliding block 63 is arranged at the side edge of the sliding groove 61, a lifting column 65 is arranged in the sliding groove 62 in a penetrating manner, an insulating plate 66 is arranged at the bottom of the lifting column 65, a clamping head 67 is arranged at the bottom of the insulating plate 66, a lead 68 is arranged at one side of the clamping head 67, a through groove 10 is formed in one side of the L-shaped support frame 9, the lead 68 can be limited to a certain extent through the through groove 10, the lead is prevented from being placed on the base 1 in a messy manner, the sliding block 62 can be driven to move left and right in the sliding groove 61 through the moving handle 63, so that the distance between the clamping heads 67 can be adjusted according to the pin distance of the semiconductor power device, and then the pins of the semiconductor power device can be clamped and detected by the clamping heads 67 through pressing the lifting columns 65;

a group of symmetrical limiting sliding grooves 20 are formed in the lifting column 65, limiting sliding blocks matched with the limiting sliding grooves 20 are arranged in the sliding blocks 62, rubber pads are arranged on the surfaces of the limiting sliding blocks, the limiting sliding blocks are tightly attached to the inner side walls of the limiting sliding grooves 20, the lifting column 65 can only vertically move up and down in the middle of the sliding blocks 62 through the arrangement of the limiting sliding grooves 20 matched with the limiting sliding blocks, the friction force between the limiting sliding grooves 20 and the limiting sliding blocks can be increased through the arrangement of the rubber pads, the lifting column 65 has a certain positioning effect, the lifting column 65 is convenient to adjust, and the clamping heads 67 are connected with pins of a semiconductor power device;

the clamping head 67 comprises a fixing block A671, the bottom of the insulating plate 66 is provided with a fixing block A671, the bottom of the fixing block A671 is provided with an arc-shaped clamping plate A672, one side of the fixing block A671 is provided with a fixing block B673, the fixing block A671 is connected with the fixing block B673 through a contraction mechanism, the bottom of the fixing block B673 is provided with an arc-shaped clamping plate B674, the contraction mechanism comprises a fixing sleeve 16, one side of the fixing block A671 is provided with a fixing sleeve 16, one side of the fixing block B673 is provided with a telescopic column 17, the end part of the telescopic column 17 is provided with a limiting disc 18, the limiting disc 18 is arranged in the fixing sleeve 16 in a sliding mode, the telescopic column 17 is sleeved with a spring 19, the spring 19 is arranged between the limiting disc 18 and the fixing sleeve 16, when pins of the semiconductor power device are required to be connected, the arc-shaped clamping plate B is pulled, the limiting disc 18 at the end part of the telescopic column 17 extrudes the spring 19 to shrink, so that the arc-shaped clamping plate 674 is unfolded, then, the pin is placed between the arc-shaped clamping plate B674 and the arc-shaped clamping plate A672, then the arc-shaped clamping plate B674 is loosened, and under the contraction of the spring 19, the arc-shaped clamping plate B674 and the arc-shaped clamping plate A672 clamp the pin;

the clamping mechanism comprises a limiting plate 3, the limiting plate 3 is arranged on the inner side of the placing seat 2, the clamping plate A4 is arranged on the left side of the placing seat 2, the clamping plate B5 is arranged on the right side of the placing seat 2, the protective pads 15 are arranged on the inner sides of the clamping plate A4 and the clamping plate B5, the clamping plate A4 and the clamping plate B5 have certain protection effect when clamping a semiconductor power device through the protective pads 15, a movable mechanism is arranged between the clamping plate B5 and the placing seat 2 and comprises an adjusting block 11, the adjusting block is fixedly arranged at the bottom of the clamping plate B5, a moving groove 12 matched with the adjusting block 11 is arranged on the placing seat 2, a threaded rod 13 is rotatably arranged in the moving groove 12, the threaded rod 13 is connected with the adjusting block 11 through threads, a rotating handle 14 is arranged at the end part of the threaded rod 13, the rotating handle 14 is used for driving the threaded rod 13, the adjusting block 11 is driven by the rotating handle 14 to move left and right in the moving groove 12, so that the adjusting block 11 drives the clamping plate B5 to move left and right, and the clamping plate B5 cooperates with the clamping plate a4 to clamp semiconductor power devices with different sizes.

The working principle of the utility model is that the rotation handle 14 is rotated to drive the rotation handle 14 to drive the threaded rod 13, the threaded rod 13 drives the adjusting block 11 to move left and right in the moving groove 12, the adjusting block 11 drives the clamping plate B5 to move left and right, the clamping plate B5 is matched with the clamping plate A4 to clamp the semiconductor power device, then the moving handle 63 is used to drive the sliding block 62 to move left and right in the sliding groove 61, so that the distance between the clamping heads 67 can be adjusted according to the pin distance of the semiconductor power device, the lifting column 65 only vertically moves up and down in the middle of the sliding block 62 by matching the limiting sliding groove 20 with the limiting slide block, and the friction force between the limiting sliding groove 20 and the limiting slide block can be increased by arranging the rubber pad, so that the lifting column 65 has a certain positioning effect on the clamping heads 67, still adjust the height of holding head 67 simultaneously, make holding head 67 and pin contact, rethread pulling arc splint B674, make the spacing dish 18 extrusion spring 19 of flexible post 17 tip shrink, thereby make arc splint B674 expand, then place the pin between arc splint B674 and arc splint A672, loosen arc splint B674 again, under spring 19's shrink, make arc splint B674 and arc splint A672 carry out the centre gripping to the pin, can be connected with detection mechanism through the wire 68 of holding head 67 one side at last, make detection mechanism detect semiconductor power device through wire 68.

Above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the design of the present invention, equivalent replacement or change should be covered within the protection scope of the present invention.

Claims

1. A semiconductor power device test fixture comprises a base (1), a placing seat (2) and an L support frame (9), wherein the L support frame (9) is arranged on one side of the base (1), the placing seat (2) is fixedly arranged on the base (1), the semiconductor power device test fixture is characterized in that a clamping mechanism is arranged on the placing seat (2), a connecting frame (7) is arranged above the placing seat (2), a supporting rod (8) is arranged between one side of the connecting frame (7) and the L support frame (9), a plurality of movable connectors (6) are arranged on the connecting frame (7), each connector (6) comprises a sliding groove (61), a through sliding groove (61) is arranged on the connecting frame (7), a sliding block (62) is arranged in the sliding groove (61) in a sliding mode, a moving handle (63) is arranged on one side of the sliding block (62), and a sliding clamping groove (64) matched with the moving handle (63) is arranged on the side of the sliding groove (61), the sliding block (62) is provided with a lifting column (65) in a penetrating mode, the bottom of the lifting column (65) is provided with an insulating plate (66), the bottom of the insulating plate (66) is provided with a clamping head (67), and one side of the clamping head (67) is provided with a wire (68).

2. The semiconductor power device testing fixture of claim 1, wherein a set of symmetrical limiting sliding grooves (22) is formed in the lifting column (65), a limiting sliding block matched with the limiting sliding grooves (22) is formed in the sliding block (62), a rubber pad is arranged on the surface of the limiting sliding block, and the limiting sliding block is tightly attached to the inner side wall of the limiting sliding grooves (22).

3. The semiconductor power device test fixture according to claim 1 or 2, wherein the clamping head (67) comprises a fixing block A (671), the bottom of the insulating plate (66) is provided with the fixing block A (671), the bottom of the fixing block A (671) is provided with an arc-shaped clamping plate A (672), one side of the fixing block A (671) is provided with a fixing block B (673), the fixing block A (671) and the fixing block B (673) are connected through a contraction mechanism, and the bottom of the fixing block B (673) is provided with an arc-shaped clamping plate B (674).

4. The semiconductor power device testing fixture of claim 3, wherein the shrinking mechanism comprises a fixing sleeve (16), the fixing sleeve (16) is arranged on one side of the fixing block A (671), a telescopic column (17) is arranged on one side of the fixing block B (673), a limiting plate (18) is arranged at the end of the telescopic column (17), the limiting plate (18) is slidably arranged in the fixing sleeve (16), a spring (19) is sleeved on the telescopic column (17), and the spring (19) is arranged between the limiting plate (18) and the fixing sleeve (16).

5. The semiconductor power device testing fixture according to claim 1, 2 or 4, wherein the clamping mechanism comprises a limiting plate (3), the limiting plate (3) is arranged on the inner side of the placing seat (2), a clamping plate A (4) is arranged on the left side of the placing seat (2), a clamping plate B (5) is arranged on the right side of the placing seat (2), and a movable mechanism is arranged between the clamping plate B (5) and the placing seat (2).

6. The semiconductor power device testing fixture as claimed in claim 5, wherein the movable mechanism comprises an adjusting block (11), the adjusting block is fixedly arranged at the bottom of the clamping plate B (5), a moving groove (12) matched with the adjusting block (11) is formed in the placing seat (2), a threaded rod (13) is rotatably arranged in the moving groove (12), the threaded rod (13) is connected with the adjusting block (11) through threads, and a rotating handle (14) is arranged at the end of the threaded rod (13).