CN2150555Y - Infrared reflection water analyzer - Google Patents

Infrared reflection water analyzer Download PDF

Info

Publication number
CN2150555Y
CN2150555Y CN 93207063 CN93207063U CN2150555Y CN 2150555 Y CN2150555 Y CN 2150555Y CN 93207063 CN93207063 CN 93207063 CN 93207063 U CN93207063 U CN 93207063U CN 2150555 Y CN2150555 Y CN 2150555Y
Authority
CN
China
Prior art keywords
light
input end
output terminal
detector
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 93207063
Other languages
Chinese (zh)
Inventor
李昶熹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Research Institute of Chemical Engineering and Metallurgy of CNNC
Original Assignee
Beijing Research Institute of Chemical Engineering and Metallurgy of CNNC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing Research Institute of Chemical Engineering and Metallurgy of CNNC filed Critical Beijing Research Institute of Chemical Engineering and Metallurgy of CNNC
Priority to CN 93207063 priority Critical patent/CN2150555Y/en
Application granted granted Critical
Publication of CN2150555Y publication Critical patent/CN2150555Y/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

The utility model discloses an infrared reflection water analyzer for measuring the solid material moisture, comprising a light source, a monochromator, a light path device and a measuring device. After the near infrared radiation energy is absorbed and reflected by materials, through double light path device in which the light is divided by the monochromator, the infrared interference for measuring can be efficiently reduced in the extraneous light. The structures of the single light source, a simple detector, double light paths and three wave lengths are adopted. The error caused by environment temperature variation, optical element aging or sample background variation can be compensated. In an accessory light path, optical fiber cables which are adopted can cause the design layout of a probe to be flexible and compact. Sampling and resetting signs are arranged on a light filter disk, in order to cause the utility model to be convenient for realizing computerization.

Description

Infrared reflection water analyzer
The utility model relates to a kind of instrument that utilizes the optical method measuring material component, is that a kind of water of answering is to the absorption of the near-infrared radiation energy of specific wavelength, the infrared external reflection moisture meter that material moisture is measured in reflection specifically.
In the prior art, answer the absorption of water to the near-infrared radiation energy of specific wavelength, the instrument that material moisture is measured in reflection can divide two classes, the disclosed a kind of water analysis device of one class such as U.S.P4097743, what it adopted is double light path, the technical scheme of elder generation's beam split, promptly be provided with in the device and guide light source near-infrared radiation energy into tested material and be absorbed, reflex to the main optical path parts of detector and light source near-infrared radiation energy is absorbed without tested material, the auxilliary light path part of detector is directly guided in reflection into, and is absorbed by material at the near-infrared radiation energy, use the monochromator beam split before the reflection; Another kind of as Measurex2238 type infrared external reflection moisture meter, the technical scheme of beam split after then adopting, promptly it absorbs, reflects back monochromator beam split at the near-infrared radiation energy at tested material.Above-mentioned two quasi-instruments respectively have relative merits, the former is because of there being auxilliary light path device, two interior compensating signals behind monochromator, have been increased without the material reflection, they have reflected the size of measuring wavelength and reference wavelength energy in the incident light, by the multiplier-divider computing, can eliminate because variation of ambient temperature, the aging error that causes that waits of optical element, temperature stability is good, but owing to adopted the near-infrared radiation energy to be absorbed by material, beam split before the reflection, like this, near-infrared radiation energy in the ambient light can directly reflex to detector through material without monochromator and cause interference, even before detector, add a resistance visible light again, the optical filter of saturating infrared light, but satisfy height, measurement wavelength that low two kinds of moisture measurement range selection are different and reference wavelength change needed wave band and cover, and its passband is wanted wide usually and reached 10000
Figure 932070639_IMG2
, special in the incandescent lamp that contains a large amount of near-infrared radiations with Alternating Current Power Supply, influence bigger.The latter is absorbed, reflects the technical scheme of back beam split because of adopting the near-infrared radiation energy by material, near-infrared radiation energy in the ambient light will could arrive detector through after the narrow band pass filter beam split, so it disturbs little to apparatus measures, thereby the probe of instrument can be gone up installation in any direction, its shortcoming is owing to adopted two detectors, when variation of ambient temperature, the performance change of two detectors is difficult to accomplish in full accord, in order to reduce error, the temperature variation of two detectors is strict to be controlled in 0.005 ℃.
The purpose of this utility model provide a kind of temperature stability good, near-infrared radiation in the ambient light is disturbed little infrared external reflection moisture meter.
For achieving the above object, the utility model adopts the technical scheme of double light path, back beam split.Specifically, a kind of infrared external reflection moisture meter comprises light source, monochromator, detector, guide the light beam of light source into tested material absorbs, reflexes to the main optical path device of detector, the light beam of light source is directly guided into the auxilliary light path device of detector, and the measurement mechanism that is connected with detector, said light source base is connected on the parabolic mirror of central shaft level; Said main optical path device comprises that being located at light source dead ahead and parabolic mirror central shaft angle is that plane mirror, level that 45 ° center has an aperture are installed in light window glass, level under this plane mirror and are installed in protruding spherical reflector directly over this plane mirror and level and are installed in the concave spherical mirror that center directly over the protruding spherical reflector has circular hole; Said monochromator is located between concave spherical mirror and the detector, be equipped with on the optical filter dish of monochromator three separate be 120 ° monochromatic filter, it penetrates wavelength and is respectively and measures wavelength X m, the first reference wavelength λ r 1With the second reference wavelength λ r 2, and λ r 2-λ m=λ m-λ r 1Said auxilliary light path device is to be involuted by two optical cables that are arranged on the upper and lower side of monochromator optical filter dish.
The utility model is with a detector, by the time partitioning scheme receive in proper order three beams from same light source through tested material absorption, reflection after the light after the monochromator beam split and in addition three beams directly from light source and without tested material absorb, reflection is through the light of monochromator beam split.If Vm, Vr 1And Vr 2And V ' m, V ' r 1And V ' r 2Represent above-mentioned preceding three-beam and back three-beam corresponding amplifier output voltage respectively, then can write out:
Vm=Imαβmγ(1-KmM)TmδmA。(1)
Vr 1=Ir 1αβr 1γ(1-Kr 1M)Tr 1δr 1A。(2)
Vr 2=Ir 2αβr 2γ(1-Kr 2M)Tr 2δr 2A。(3)
V′m=Imα′TmδmA。(4)
V′r 1=Ir 1α′Tr 1δr 1A。(5)
V′r 2=Ir 2α′Tr 2δr 2A。(6)
In above-mentioned all formulas, Im, Ir 1And Ir 2Be respectively and have the wavelength X of measurement m, the first reference wavelength λ r in the light that light source bulb sends 1With the second reference wavelength λ r 2Radiation flux; α is the radiation flux ratio that arrives tested material in the incident light; α ' is the radiation flux ratio that arrives auxilliary light path in the incident light; β m, β r 1With β r 2Be respectively tested material to measuring the reflection coefficient of wavelength, first and second reference wavelengths; γ is the luminous flux ratio that arrives detector in the reflected light; Km, Kr 1And Kr 2Be respectively the absorption coefficient of water to measurement wavelength, first and second reference wavelengths, Km>>Kr 1Or Kr 2M is the moisture value of material; Tm, Tr 1And Tr 2Be respectively and measure the transmitance that wavelength, the first and second reference wavelength optical filter centers see through wavelength; δ m, δ r 1With δ r 2Be respectively detector to measuring the photoelectric conversion rate of wavelength, first and second reference wavelengths; A.Enlargement factor for amplifier.Handle in this instrument
E=Vr 1·V′m÷Vm·V′r 1+Vr 2·V′m÷Vm·V′r 2(7)
As the yardstick of weighing tested material moisture,, then obtain with (1)~(6) formula substitutions (7):
E=[βr 1(1-Kr 1M)+βr 2(1-Kr 2M)]/βm(1-KmM) (8)
This shows, the instrument measured value only with tested material moisture value M and tested material to measuring reflection coefficient β m, the β r of wavelength, first reference wavelength and second reference wavelength 1With β r 2Relevant, irrelevant with the variation of technical characteristics such as bulb, detector, optical filter, amplifier, that is to say that it is to temperature-insensitive.
Common Km>>Kr 1Or Kr 2, when satisfying KmM<<1, (8) formula can be write as:
E≈(βr 1+βr 2)(1+KmM)/βm (9)
So instrument measured value and material moisture value M are linear.Because of λ r 2-λ m=λ m-λ r 1, then during the run-off the straight of tested material background, can think (β r 1+ β r 2)/β m=[ (β r+ Δ)+(β r-Δ) ]/β m approximate constant is so the instrument measured value is insensitive to the tested material change of background.
In sum, the utility model adopts the structure of single light source, simple detector, double light path and three-wavelength, can compensate that aging or sample background changes caused measuring error because of the optical element of variation of ambient temperature, device, thereby not add under any constant temperature, stability of instrument is good; Adopt the near-infrared radiation energy by material absorb, after the reflection again beam split can reduce of the interference of ambient light middle infrared (Mid-IR) effectively to measuring; Adopting optical cable to transmit light signal in the auxilliary light path can make interior each component layouts of instrument probe flexible, compact; The aluminium foil that also can stick the energy reflects infrared light on the optical filter dish is equipped with sampling and reseting sensor and can makes instrument be convenient to realize microcomputerization as sampling and reseting mark.
The utility model has following accompanying drawing:
Fig. 1 is an infrared external reflection moisture meter structural representation provided by the utility model;
Fig. 2 is a monochromator optical filter dish synoptic diagram;
Fig. 3 is the sensor signal sequential chart;
Fig. 4 is the measurement mechanism synoptic diagram.
Now in conjunction with the accompanying drawings and embodiments the utility model is described specifically:
As shown in Figure 1, monochromator, ead sulfide detector 8, main optical path device, auxilliary light path device that a kind of infrared external reflection moisture meter comprises light source bulb 1, is made up of optical filter dish 7 and optical filter 20, and the measurement mechanism that is connected with detector 8.Light source bulb 1 base is connected on the parabolic mirror 2 of central shaft level.The main optical path device comprises that the central shaft angle that is located at light source bulb 1 dead ahead and parabolic mirror 2 is that plane mirror 3, level that 45 ° center has an aperture are positioned on light window glass 21, level under this plane mirror 3 and are positioned on protruding spherical reflector 6 directly over this plane mirror 3, and level is positioned on the concave spherical mirror 5 that center directly over the protruding spherical reflector 6 has circular hole.In the present embodiment, establish the hollow cylinder 26 that a side vertical with parabolic mirror 2 central shafts has circular open in the dead ahead of light source bulb 1, in hollow cylinder 26, be positioned at the elliptic plane catoptron 3 that the center of installing, circular open place has aperture, light window glass 21 and protruding spherical reflector 6 are positioned on the bottom and the top of hollow cylinder 26 respectively.Monochromator is made up of optical filter dish 7 and the monochromatic filter 20 that is installed on this dish, optical filter dish 7 is driven by synchronous motor 12, its rotating speed is 500 rev/mins, optical filter dish 7 is located between concave spherical mirror 5 and the detector 8, the monochromatic filter 20(that is equipped with three separate 120 ° on the dish 7 sees Fig. 2), it penetrates wavelength and is respectively λ m, λ r 1With λ r 2, wherein λ m is the measurement wavelength to water sensitive, λ r 1With λ r 2Be water insensitive first reference wavelength and second reference wavelength, and λ r 2-λ m=λ m-λ r 1Said auxilliary light path device is to be involuted by the optical cable 10 and 9 that is arranged on optical filter dish 7 upper and lower both sides, the top of optical cable 9 inserts in the central small hole of plane mirror 3, position in the beginning of its end and optical cable 10, the terminal center pit that inserts device for fastening 15,16 and 17 respectively, the line of centres of device for fastening 15 and 16 center pit is auxilliary optical axis, and the installation site of device for fastening 17 can be adjusted in vertical direction.The light that sends from light source bulb 1 becomes directional light after parabolic mirror 2 reflections, after plane mirror 3 changes 90 °, pass light window glass 21 and be mapped to tested material 4, by its absorb, light after the reflection again through light window glass 21, assemble by concave spherical mirror 5 after, again through protruding spherical reflector 6 reflections, pass the center hole of concave spherical mirror 5, focus on optical filter 20, upper and lower two light cone center lines are primary optical axis.When a certain optical filter incision primary optical axis, having this optical filter center can be through its arrival detector 8, formation main optical path through the light of wavelength.From sub-fraction in the incident light of light source bulb 1 by plane mirror 3 central small hole and optical cable 9 be introduced to below the optical filter dish 7 with the symmetrical position of primary optical axis on, when optical axis is assisted in a certain optical filter incision, have the light that this optical filter center sees through wavelength and can see through it, and reflex on the detector 8 by optical cable 10 and the plane mirror 11 that is installed in detector 8 front sides, constitute auxilliary light path.On the card of optical filter dish 7, three intersection points of primary optical axis, auxilliary optical axis and optical filter dish 7 central axis and card are positioned on the same diameter of this dish.As shown in Figure 2, on the circumference of the different radii of optical filter dish 7, post respectively can reflects infrared light aluminium foil 18 and 19, as the distinguishing mark that sends sampling and reset pulse.Wherein aluminium foil 18 has six, and the angle of intersection between their center line is 60 °, 19 1 on aluminium foil.Be respectively equipped with sampling sensor 13 and reseting sensor 14 with aluminium foil 18 and 19 corresponding radial distance above optical filter dish 7, they are the optoelectronic switch for being made up of infrarede emitting diode and silicon phototriode all.When below aluminium foil 18 or 19 forwards sampling sensor 13 or reseting sensor 14 to, make sensor 13 or 14 send sampling or reset pulse, as shown in Figure 3.Detector 8 alternately receives the light signal from main and auxiliary light path, because of three optical filters 20 are housed on the optical filter dish 7, main and auxiliary two optical axises is arranged on the device, so optical filter dish 7 whenever rotates a circle, detector 8 can receive six pulses.So the utlity model has the characteristics of single light source, simple detector, double light path, three-wavelength, six light beams.
As shown in Figure 4, measurement mechanism comprises isolated form instrument amplifier 27, A/D converter 28, single chip microcomputer 29, trigger flip- flop 33 and 36, the photoelectrical coupler of forming by light emitting diode and silicon phototriode 34 and 37, differential peak clipper 38 and 39, triad counter 35, and D/A 30, operational amplifier 31 and converter 32, the output terminal of detector 8 is connected with the input end of amplifier 27, the output terminal of amplifier 27 is connected with the input end ViN of A/D converter 28, the output terminal INTR of A/D converter 28 is connected with single chip microcomputer 29 input end INTI, the RD output terminal of single chip microcomputer 29 is connected with the RD input end of A/D converter 28, sensor 13 and 14 silicon phototriode output terminal are connected with 36 input end with trigger flip-flop 33 respectively, trigger flip-flop 33 is connected with 37 light emitting diode is anodal with photoelectrical coupler 34 respectively with 36 output terminal, the silicon phototriode pipe collector of photoelectrical coupler 34 is connected with the WR of A/D converter 28 end, and be connected through the CP of differential peak clipper 38 and counter 35 end, the collector of the silicon phototriode of photoelectrical coupler 37 is connected with the R input end of counter 35 through differential peak clipper 39, the P of the output terminal of counter 35 and single chip microcomputer 29 2End connects, the P of single chip microcomputer 29 1Output terminal is connected with the input end of D/A 30, the input end of the output termination operational amplifier 31 of D/A 30, the input end of the output termination converter 32 of operational amplifier 31.The signal of detector 8 outputs is delivered to A/D converter 28 input end ViN after isolated form instrument amplifier 27 amplifies.When having aluminium foil to enter below the sampling sensor 13, its silicon phototriode output sampling pulse electric current removes to trigger trigger flip-flop 33, its output current drives the light emitting diode in the photoelectrical coupler 34, silicon phototriode pipe collector output negative pulse in this coupling mechanism 34 is to the WR input end of A/D converter 28, make it begin to carry out mould/number conversion, on the other hand, this negative pulse is transported to the CP input end of triad counter 35 by differential peak clipper 38, make its counting, the P of its output and single chip microcomputer 29 2Mouth links to each other.In case EOC, EOC signal of INTR output terminal output of A/D converter 28 is to the interrupting input end INTI of single chip microcomputer 29, make its RD output terminal send " reading " signal, pass through P to the RD of A/D converter 28 0Port outputs to the digital quantity of analog/digital converter 28 outputs in the counter 35 pairing random memories and goes in a certain address location.At this moment, if aluminium foil 18 does not also shift out sensor 13, the WR end signal remains level "0", above-mentioned conversion process can carry out in rapid succession, promptly be close to the storage address of data in random memory that conversion for the first time goes out, storing the data of analog/digital converter output for the second time; Be close to the storage address of data in random memory that conversion for the second time goes out, storing the data of mould/transformation of variables output for the third time again, by that analogy, till aluminium foil 18 leaves sensor 13.Then microcomputer 29 carries out digital filtering to the data in above-mentioned several addresses under software control, rejects the big data of stochastic error, obtains in the address location that again it is sent to other appointment behind its mean value and goes.When having aluminium foil 19 to enter below the reseting sensor 14, its silicon phototriode output reset pulse electric current removes to trigger trigger flip-flop 36, its output current drives the light emitting diode in the photoelectrical coupler 37, the collector output negative pulse of the silicon phototriode in this photoelectrical coupler 37 resets this counter 35 to R the RESET input of counter 35.Under software control, microcomputer 29 takes out all mean value from the address location of each appointment
Figure 932070639_IMG3
With
Figure 932070639_IMG4
Carry out computing, draw tested material moisture, promptly
Moisture percentage=A+B( )
Wherein two constants of A and B can be calculated by regressing calculation when instrumental calibration, are stored in the address location of random memory appointment.The data of the representative moisture percentage that microcomputer 29 is calculated are transported to D/A converter 30 from its P mouth, by operational amplifier 31 output analog quantity voltages, become 4~20mA signal of standard again through voltage/current transducer 32, as the simulation output of this instrument, with so that controller is implemented in line traffic control to production run.
The utility model can be used for measuring the moisture in powdery, granular, sheet, the various solid materials of fibrous and little bulk, can be widely used in industry such as pottery, tobacco, chemical industry, cement, medicine, papermaking, metallurgy, wood working, grain processing and mineral processing, its measurement result and material loading density, thickness of feed layer and temperature of charge are irrelevant, be specially adapted to the online contactless continuous coverage of solid material on the travelling belt, and can provide signal accurately to control system, to improve the quality of products, reduce energy consumption.

Claims (4)

1, a kind of infrared external reflection moisture meter, comprise light source bulb (1), the monochromator of forming by optical filter dish (7) and optical filter (20), ead sulfide detector (8), guiding the light beam of light source bulb (1) into tested material (4) absorbs, reflex to the main optical path device of detector (8), the light beam of light source bulb (1) is directly guided into the auxilliary light path device of detector (8), and the measurement mechanism that is connected with detector (8), the base that it is characterized in that light source bulb (1) is connected on the parabolic mirror (2) of central shaft level, the main optical path device comprises that being located at light source bulb (1) dead ahead and parabolic mirror (2) central shaft angle is the plane mirror (3) that 45 ° center has aperture, level be installed in directly over this plane mirror and under protruding spherical reflector (6) and light window glass (21), and level is installed in the concave spherical mirror (5) that center directly over the protruding spherical reflector (6) has circular hole, monochromator is located between concave spherical mirror (5) and the detector (8), be equipped with on the optical filter dish (7) of monochromator three separate be 120 ° monochromatic filter (20), it penetrates wavelength and is respectively the measurement wavelength X m, the first reference wavelength λ γ 1With the second reference wavelength λ γ 2, and λ γ 2mm-λ γ 1, auxilliary light path device is to be involuted by the optical cable (10) and (9) that are arranged on the upper and lower both sides of optical filter dish (7).
2, a kind of infrared external reflection moisture meter according to claim 1, it is characterized in that said optical filter dish (7) upward posts aluminium foil (18) and (19) respectively on the different radii circumference, totally six on aluminium foil (18), the angle of intersection between their center lines is 60 °, aluminium foil (19) is one, be respectively equipped with sampling sensor (13) and the reseting sensor of being made up of infrarede emitting diode and silicon phototriode (14) at the top of optical filter dish (7) and aluminium foil (18) and (19) corresponding radial distance, sensor (13) is connected with measurement mechanism respectively with (14).
3, a kind of infrared external reflection moisture meter according to claim 2, it is characterized in that described measurement mechanism comprises isolated form instrument amplifier (27), A/D converter (28), single chip microcomputer (29), trigger flip-flop (33) and (36), photoelectrical coupler (34) and (37) formed by light emitting diode and silicon phototriode, differential peak clipper (38) and (39), and triad counter (35), the output terminal of detector (8) is connected with the input end of amplifier (27), the output terminal of amplifier (27) is connected with the input end ViN of A/D converter (28), the output terminal INTR of A/D converter (28) is connected with single chip microcomputer (29) input end INTI, the RD output terminal of single chip microcomputer (29) is connected with the RD input end of A/D converter (28), the silicon phototriode output terminal of sensor (13) and (14) is connected with the input end of trigger flip-flop (33) and (36) respectively, the output terminal of trigger flip-flop (33) and (36) is connected with the light emitting diode of photoelectrical coupler (34) and (37) is anodal respectively, the silicon phototriode pipe collector of photoelectrical coupler (34) is connected with the WR input end of A/D converter (28), and be connected through the CP input end of differential peak clipper (38) with counter (35), the silicon phototriode pipe collector of photoelectrical coupler (37) is connected with the ground R input end of counter (35) through differential peak clipper (39), the P of the output terminal of counter (35) and single chip microcomputer (29) 2End connects.
4, a kind of infrared external reflection moisture meter according to claim 3 is characterized in that described measurement mechanism also is provided with D/A (30), operational amplifier (31) and voltage/current transducer (32), the P of single chip microcomputer (29) 1Output terminal is connected with the input end of D/A (30), the input end of the output termination operational amplifier (31) of D/A (30), and operational amplifier (31) output terminal is connected with converter (32) input end.
CN 93207063 1993-03-26 1993-03-26 Infrared reflection water analyzer Expired - Fee Related CN2150555Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 93207063 CN2150555Y (en) 1993-03-26 1993-03-26 Infrared reflection water analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 93207063 CN2150555Y (en) 1993-03-26 1993-03-26 Infrared reflection water analyzer

Publications (1)

Publication Number Publication Date
CN2150555Y true CN2150555Y (en) 1993-12-22

Family

ID=33789887

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 93207063 Expired - Fee Related CN2150555Y (en) 1993-03-26 1993-03-26 Infrared reflection water analyzer

Country Status (1)

Country Link
CN (1) CN2150555Y (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101968443A (en) * 2010-09-07 2011-02-09 中国农业大学 Nondestructive detection device and method of water content of reflective near infrared plant leaf
CN103364360A (en) * 2013-03-14 2013-10-23 深圳先进技术研究院 Moisture meter
CN104848841A (en) * 2014-04-18 2015-08-19 常州市新瑞得仪器有限公司 Tilting sensor and working method thereof
CN106769979A (en) * 2016-12-22 2017-05-31 核工业北京化工冶金研究院 A kind of high-accuracy infrared moisture meter detection device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101968443A (en) * 2010-09-07 2011-02-09 中国农业大学 Nondestructive detection device and method of water content of reflective near infrared plant leaf
CN103364360A (en) * 2013-03-14 2013-10-23 深圳先进技术研究院 Moisture meter
CN103364360B (en) * 2013-03-14 2015-09-30 深圳先进技术研究院 Moisture teller
CN104848841A (en) * 2014-04-18 2015-08-19 常州市新瑞得仪器有限公司 Tilting sensor and working method thereof
CN106769979A (en) * 2016-12-22 2017-05-31 核工业北京化工冶金研究院 A kind of high-accuracy infrared moisture meter detection device
CN106769979B (en) * 2016-12-22 2019-05-17 核工业北京化工冶金研究院 A kind of high-accuracy infrared moisture meter detection device

Similar Documents

Publication Publication Date Title
CN1928533B (en) Outdoor high optical spectrum BRDF automatic detection method
CN87107260A (en) The device for monitoring characteristics of film on substrate
CN1648682A (en) Laser feedback nano displaycement measuring device
CN1216283C (en) Laser light scattering dust concentration on line measuring method
CN2150555Y (en) Infrared reflection water analyzer
NZ203140A (en) Surface coating reflectance measurement
WO2020097847A1 (en) Liquid level detection system and liquid level detection method
CN102854149A (en) Measuring apparatus for continuous spectrum bidirectional scattering distribution function
US4689485A (en) Optoelectronic displacement measuring apparatus using color-encoded light
CN201417244Y (en) Laser concentration sensor
EP0453797A2 (en) Infrared ray moisture meter
CN106247989A (en) A kind of guide rail rolling angle field calibration and measurement apparatus and method
CN101788340A (en) Wavelength scanning device
CN1074832C (en) On-line near infrared multicomponent measuring method and apparatus
CN208270014U (en) A kind of vertical silo material position device for dynamically detecting
US3782833A (en) Method and apparatus for measuring area
CN103278475B (en) Measuring device and method of transparent medium refractive index
CN1448739A (en) Temperature compensation sensing apparatus for sputtering palladium on optical fibre grating
CN2788124Y (en) Glass tube wall thickness detector
CN1266985A (en) Dynamic laser torductor
CN1873393A (en) Optical multichannel analysis apparatus
CN2549439Y (en) Non-contact dynamic continuous metering tester
JPS6432152A (en) Moisture meter
CN214251171U (en) Novel laser charge level indicator with dustproof function and convenient maintenance
CN2034276U (en) Light quantum measuring detecting head

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C19 Lapse of patent right due to non-payment of the annual fee
CF01 Termination of patent right due to non-payment of annual fee