CN215033172U

CN215033172U - Test probe bending device

Info

Publication number: CN215033172U
Application number: CN202121439014.5U
Authority: CN
Inventors: 刘志广; 颜烈刚; 孙锐锋
Original assignee: Shenzhen Doctor Technology Co ltd
Current assignee: Shenzhen Doctor Technology Co ltd
Priority date: 2021-06-25
Filing date: 2021-06-25
Publication date: 2021-12-07
Anticipated expiration: 2031-06-25

Abstract

The utility model discloses a test probe looper device, including the bottom plate, be equipped with the centre gripping subassembly on the bottom plate and buckle the subassembly, wherein: the clamping assembly comprises a clamping hand, a first bearing plate and a first sliding plate which are sequentially arranged from top to bottom, the bending assembly comprises a pressing plate, a second bearing plate and a second sliding plate which are sequentially arranged from top to bottom, the pressing plate is provided with an inclination angle towards one side of the clamping assembly, and the second bearing plate is fixed on the bottom plate through a bearing. The utility model discloses a through setting up the centre gripping subassembly and buckling the subassembly, can carry out the looper after fixed to the probe centre gripping, and the interval between two centre gripping hands of centre gripping subassembly can be adjusted through first telescopic link, can carry out the centre gripping to the probe of the different models of different thicknesses, the second loading board of buckling the subassembly can slide on second slide and second slider through the second telescopic link, can adjust the distance between clamp plate and the centre gripping hand, make can be applicable to the probe of more different models, and is very convenient.

Description

Test probe bending device

Technical Field

The utility model relates to a probe processing technology field especially relates to a test probe looper device.

Background

The probe is widely used to inspect the performance of semiconductor elements formed on a flat Panel Display device including a Liquid Crystal Display (LCD) and a Plasma Display Panel (PDP) or a wafer, and is generally mounted on a probe card. The probes used to make the probe card need to be bent at a certain angle. The existing needle bending device usually directly inserts a probe into a notch, and bends at random for an angle, so that the bending result is not accurate enough.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a test probe looper device.

In order to realize the purpose, the following technical scheme is adopted:

the utility model provides a test probe looper device, includes the bottom plate, be equipped with clamping component and the subassembly of buckling on the bottom plate, wherein: the clamping assembly comprises two clamping hands, a first bearing plate and a first sliding plate which are sequentially arranged from top to bottom, one end of each clamping hand faces the bending assembly, and the other end of each clamping hand is provided with a first telescopic rod for adjusting the distance between the two clamping hands; the two bearing plates are respectively fixed at the bottoms of the two clamping hands, the bottom of each bearing plate is provided with a sliding groove, and a first sliding block matched with the sliding groove of each bearing plate is arranged on each first sliding plate; the bending assembly comprises a pressing plate, a second bearing plate and a second sliding plate, wherein the pressing plate, the second bearing plate and the second sliding plate are sequentially arranged from top to bottom, the pressing plate faces towards one side of the clamping assembly, an inclination angle is formed in the second bearing plate, the second bearing plate is fixed to the bottom of the pressing plate, a sliding groove is formed in the bottom of the second bearing plate, a second sliding block matched with the sliding groove of the second bearing plate is fixed to the second sliding plate, a second telescopic rod used for driving the second bearing plate to move on the second sliding block is arranged at one end of the second bearing plate, the second sliding plate faces towards one end of the clamping assembly, and a bearing is connected to the one end of the bearing and fixed to the bottom plate.

Furthermore, two fixed blocks are respectively fixed on the clamping hands, the two fixed blocks are respectively fixed with the first telescopic rod, the telescopic end of the first telescopic rod is fixed on one of the fixed blocks, and the first telescopic rod is also fixed with the other fixed block. When the first telescopic rod is controlled to stretch, the first telescopic rod can drive the two clamping hands to be close to or separated from each other, and the first telescopic rod is used for controlling the two clamping hands to clamp the probe tightly.

Further, the first telescopic rod is a micrometer. The micrometer has flexible function, can drive two centre gripping hands and be close to or separate, simultaneously, because the micrometer has measurement function, to the probe of unidimensional not, can adopt the flexible volume of predetermined standard for the process standardization, the efficiencyzing of probe looper.

Furthermore, the second sliding block is L-shaped, one end of the second sliding block is located in the sliding groove of the second bearing plate, the other end of the second sliding block is fixed with the second telescopic rod, and the telescopic end of the second telescopic rod is connected with the second bearing. When the second telescopic link is controlled to stretch, the second sliding block is fixed on the second sliding plate, so that the second telescopic link can push the second bearing plate to move, and further the distance between the pressing plate and the clamping assembly can be controlled, and the bending length of the probe can be controlled.

Further, the second telescopic rod is a micrometer. The micrometer has flexible function, can drive the second loading board and remove, simultaneously, because the micrometer has measurement function, to the probe of unidimensional not, can adopt the flexible volume of predetermined standard for the process standardization, the efficiency of probe looper.

Furthermore, one end, far away from the clamping assembly, of the second sliding plate is provided with a handle. When the probe is bent, the second sliding plate needs to be pushed to move around the bearing, and a handle is arranged to play a role in saving labor.

Further, first limiting plate that the both sides of first slide were equipped with, first limiting plate is fixed on the bottom plate, be equipped with first logical groove on the first limiting plate, the both sides of first slide are connected with first bolt through the screw, first bolt passes first logical groove. When the knob loosens the first bolt, the first sliding plate can be moved to the position on the bottom plate, and when the knob tightens the first bolt, the first sliding plate can be fixed on the bottom plate.

Furthermore, the two sides of the second bearing plate are provided with second limiting plates, the second limiting plates are fixed to the second sliding plate, the second limiting plates are provided with second through grooves, the two sides of the second bearing plate are connected with second bolts through screw holes, and the second bolts penetrate through the second through grooves. When the knob loosens the second bolt, the position of the second bearing plate on the second bottom plate can be moved, and when the knob tightens the second bolt, the second bearing plate can be fixed on the second sliding plate.

Furthermore, the bottom plate is further provided with two blocking assemblies, the two blocking assemblies are respectively positioned on one sides of the clamping assembly and the bending assembly, and each blocking assembly comprises a stop block and a third bolt penetrating through the stop block. Avoid the excessive bending of the bending component.

Adopt above-mentioned scheme, the beneficial effects of the utility model are that: through setting up centre gripping subassembly and bending assembly, can carry out the looper after fixed to the probe centre gripping, and the interval between two centre gripping hands of centre gripping subassembly can be adjusted through first telescopic link, can carry out the centre gripping to the probe of the different models of different thicknesses, the second loading board of bending assembly can slide on second slide and second slider through the second telescopic link, can adjust the distance between clamp plate and the centre gripping hand for can be applicable to the probe of more different models, the practicality has.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

Fig. 1 is a schematic structural diagram of an embodiment of the present invention;

FIG. 2 is a schematic structural view of a clamping assembly according to an embodiment of the present invention

FIG. 3 is a schematic view of a bending assembly according to an embodiment of the present invention

Fig. 4 is a schematic structural diagram of a blocking assembly according to an embodiment of the present invention.

Wherein the figures identify the description:

1. a base plate; 2. a clamping assembly; 21. clamping a hand; 22. a first bearing plate; 23. a first slide plate; 231. a first slider; 24. a first telescopic rod; 25. a fixed block; 26. a first limit plate; 261. a first through groove; 27. a first bolt; 3. a bending assembly; 31. pressing a plate; 32. a second carrier plate; 33. a second slide plate; 34. a second slider; 35. a second telescopic rod; 36. a bearing; 37. a handle; 38. a second limiting plate; 381. a second through groove; 39. a second bolt; 4. a blocking assembly.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.

It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or intervening elements may also be present.

It should be noted that the terms of orientation such as outside, inside, middle and the like in the embodiments of the present invention are only relative concepts or reference to the normal use state of the product, and should not be considered as limiting.

Referring to fig. 1 to 4, a probe bending apparatus for testing a probe includes a base plate 1, a clamping assembly 2 and a bending assembly 3 are disposed on the base plate 1, wherein: the clamping assembly 2 comprises two clamping hands 21, a first bearing plate 22 and a first sliding plate 23 which are arranged in sequence from top to bottom, one end of each clamping hand 21 faces the bending assembly 3, and the other end of each clamping hand is provided with a first telescopic rod 24 for adjusting the distance between the two clamping hands 21; the two bearing plates are respectively fixed at the bottoms of the two clamping hands 21, the bottoms of the bearing plates are provided with sliding grooves, and the first sliding block 231 matched with the sliding grooves of the bearing plates is arranged on the first sliding plate 23; bending assembly 3 includes, the clamp plate 31 that sets gradually from the top down, second loading board 32, second slide 33, clamp plate 31 is equipped with the inclination towards one side of centre gripping subassembly 2, second loading board 32 is fixed in the bottom of clamp plate 31, the bottom of second loading board 32 is equipped with the spout, be fixed with on the second slide 33 with second loading board 32's spout matched with second slider 34, the one end of second loading board 32 is equipped with the second telescopic link 35 that is used for driving second loading board 32 and moves on second slider 34, second slide 33 is connected with bearing 36 towards the one end of centre gripping subassembly 2, bearing 36 fixes on bottom plate 1.

The two clamping hands 21 are respectively fixed with a fixing block 25, the two fixing blocks 25 are respectively fixed with a first telescopic rod 24, the telescopic end of the first telescopic rod 24 is fixed on one fixing block 25, and the first telescopic rod 24 is further fixed with the other fixing block 25. When the first telescopic rod 24 is controlled to stretch, the first telescopic rod can drive the two clamping hands 21 to approach or separate, and the first telescopic rod is used for controlling the two clamping hands 21 to clamp the probe tightly.

The first telescoping rod 24 is a micrometer. The micrometer has flexible function, can drive two centre gripping hands 21 and be close to or separate, simultaneously, because the micrometer has measurement function, to the probe of unidimensional not, can adopt the flexible volume of predetermined standard for the process of probe looper is standardized, efficient.

The second slider 34 is L-shaped, one end of the second slider is located in the sliding slot of the second bearing plate 32, the other end of the second slider is fixed with the second telescopic rod 35, and the telescopic end of the second telescopic rod 35 is connected with the second bearing. When the second telescopic rod 35 is controlled to stretch, the second sliding block 34 is fixed on the second sliding plate 33, so that the second telescopic rod 35 can push the second bearing plate 32 to move, and further the distance between the pressing plate 31 and the clamping assembly 2 can be controlled, so that the bending length of the probe can be controlled.

The second telescopic rod 35 is a micrometer. The micrometer has flexible function, can drive second loading board 32 and remove, simultaneously, because the micrometer has measurement function, to the probe of unidimensional not, can adopt the flexible volume of predetermined standard for the process of probe looper is standardized, efficient.

The end of the second slide 33 remote from the clamping assembly 2 is provided with a handle 37. When bending the probe, it is necessary to push the second slide plate 33 to move around the bearing 36, and a handle 37 is provided to save effort.

First limiting plate 26 that the both sides of first slide 23 were equipped with, first limiting plate 26 is fixed on bottom plate 1, is equipped with first logical groove 261 on the first limiting plate 26, and the both sides of first slide 23 are connected with first bolt 27 through the screw, and first bolt 27 passes first logical groove 261. When the knob loosens the first bolt 27, the first sliding plate 23 can be moved to the position on the base plate 1, and when the knob tightens the first bolt 27, the first sliding plate 23 can be fixed on the base plate 1.

The two sides of the second bearing plate 32 are provided with second limiting plates 38, the second limiting plates 38 are fixed to the second sliding plate 33, the second limiting plates 38 are provided with second through grooves 381, the two sides of the second bearing plate 32 are connected with second bolts 39 through screw holes, and the second bolts 39 penetrate through the second through grooves 381. When the knob releases the second bolt 39, the position of the second loading plate 32 on the second base plate 1 can be moved, and when the knob releases the second bolt 39, the second loading plate 32 can be fixed on the second sliding plate 33.

Still be equipped with on the bottom plate 1 and block subassembly 4, block subassembly 4 and have two, be located clamping component 2 and the one side of the subassembly 3 of buckling respectively, block subassembly 4 and include the dog and run through the third bolt of dog. Avoid excessive bending of the bending component 3.

Wherein, the utility model discloses a theory of operation does: put the probe between two centre gripping hands 21, then knob first telescopic link 24, the knob micrometer for the interval between two centre gripping hands 21 diminishes, thereby grasps the probe, wherein, when the knob, the first loading board 22 that every centre gripping hand 21 corresponds slides on first slider 231, and makes the interval between the centre gripping hand 21 can diminish. When bending the needle, the handle 37 is turned so that the second slider 33 rotates about the bearing 36, and the pressing plate 31 presses against the probe, thereby bending the probe.

When the distance between the pressing plate 31 and the clamping is required to be adjusted, the second telescopic rod 35 pushes the second bearing plate 32 to move, so that the distance between the pressing plate 31 and the clamping assembly 2 can be changed, and the bending length of the probe can be controlled.

Has the advantages that: through setting up centre gripping subassembly 2 and bending component 3, can carry out the looper after fixed to the probe centre gripping, and the interval between two centre gripping hands 21 of centre gripping subassembly 2 can be adjusted through first telescopic link 24, can carry out the centre gripping to the probe of the different models of different thicknesses, bending component 3's second loading board 32 can slide on second slide 33 and second slider 34 through second telescopic link 35, can adjust the distance between clamp plate 31 and the centre gripping hand 21, make can be applicable to the probe of more different models, and the practicality has.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention in its corresponding aspects.

Claims

1. The utility model provides a test probe looper device, includes the bottom plate, its characterized in that, be equipped with the centre gripping subassembly on the bottom plate and buckle the subassembly, wherein:

the clamping assembly comprises two clamping hands, a first bearing plate and a first sliding plate which are sequentially arranged from top to bottom, one end of each clamping hand faces the bending assembly, and the other end of each clamping hand is provided with a first telescopic rod for adjusting the distance between the two clamping hands; the two bearing plates are respectively fixed at the bottoms of the two clamping hands, the bottom of each bearing plate is provided with a sliding groove, and a first sliding block matched with the sliding groove of each bearing plate is arranged on each first sliding plate;

the bending assembly comprises a pressing plate, a second bearing plate and a second sliding plate, wherein the pressing plate, the second bearing plate and the second sliding plate are sequentially arranged from top to bottom, the pressing plate faces towards one side of the clamping assembly, an inclination angle is formed in the second bearing plate, the second bearing plate is fixed to the bottom of the pressing plate, a sliding groove is formed in the bottom of the second bearing plate, a second sliding block matched with the sliding groove of the second bearing plate is fixed to the second sliding plate, a second telescopic rod used for driving the second bearing plate to move on the second sliding block is arranged at one end of the second bearing plate, the second sliding plate faces towards one end of the clamping assembly, and a bearing is connected to the one end of the bearing and fixed to the bottom plate.

2. The test probe looper device of claim 1, wherein two fixing blocks are respectively fixed to the two holding arms, the two fixing blocks are respectively fixed to the first telescopic rod, the telescopic end of the first telescopic rod is fixed to one of the fixing blocks, and the first telescopic rod is further fixed to the other fixing block.

3. The test probe looper device of claim 2 wherein the first telescoping rod is a micrometer.

4. The test probe looper device of claim 1, wherein the second slider is L-shaped, one end of the second slider is located in the sliding slot of the second carrier plate, the other end of the second slider is fixed to the second telescoping rod, and the telescoping end of the second telescoping rod is connected to the second carrier.

5. The test probe looper device of claim 4 wherein the second telescoping rod is a micrometer.

6. The test probe looper apparatus of claim 1 wherein an end of the second sled remote from the clamping assembly is provided with a handle.

7. The test probe needle bending device according to claim 1, wherein first limiting plates are arranged on two sides of the first sliding plate, the first limiting plates are fixed on the bottom plate, a first through groove is arranged on the first limiting plates, first bolts are connected to two sides of the first sliding plate through screw holes, and the first bolts penetrate through the first through groove.

8. The test probe needle bending device according to claim 1, wherein second limiting plates are disposed on two sides of the second bearing plate, the second limiting plates are fixed to the second sliding plate, a second through groove is disposed on the second limiting plates, second bolts are connected to two sides of the second bearing plate through screw holes, and the second bolts pass through the second through groove.

9. The test probe looper device of claim 1, wherein the base plate further comprises two blocking members disposed on one side of the clamping member and the bending member, respectively, the blocking members including a stopper and a third bolt extending through the stopper.