CN214953621U - Automatic chip testing device - Google Patents
Automatic chip testing device Download PDFInfo
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- CN214953621U CN214953621U CN202121202869.6U CN202121202869U CN214953621U CN 214953621 U CN214953621 U CN 214953621U CN 202121202869 U CN202121202869 U CN 202121202869U CN 214953621 U CN214953621 U CN 214953621U
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- groove
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Abstract
The utility model discloses an automatic change chip testing arrangement, its structure includes test groove, frame, organism, limiting plate, cushion, displacement formula operation panel, electric cabinet, the utility model discloses a limiting plate inside groove is led and is connect displacement formula operation panel, and the frame seat links to each other integratively with the combination of surperficial platen, and antetheca catching groove piece is the fulcrum piece that can drive the frame seat and remove, is equipped with a plurality of embedded smooth pearls on first wall strip and the second wall strip, corresponds caulking groove position interval arrangement, and the surface can roll and connect inboard recess of limiting plate and a frame inner wall, and the straight line moves behind the stage body outward, can make things convenient for the staff to clean the frame inside groove, and dead angle position dust also can clear away, has reduced because of the static influence that the dust received, can effectively improve the security that the device used.
Description
Technical Field
The utility model relates to an automatic change chip testing arrangement belongs to chip testing technical field.
Background
The development of new electronic information technology depends on the continuous push of the semiconductor industry, so that the use of the chip as a core technology becomes more and more frequent and important, the development of the electronic information industry is accelerated, and the intelligent electronic technology is integrated in the aspects of control, communication, man-machine interaction, network interconnection and the like.
The chip is in the encapsulation completion back, need test through automatic chip testing arrangement, and current testing arrangement mesa is fixed unmovable mostly, and the frame corresponds has restricted inspection operation range, because can receive the dust influence and reduce the measuring accuracy among the electronic detection process, consequently need clean the inside recess of frame, but the dead angle position is not clear up well, reduces the safety in utilization of device easily.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing an automatic change chip testing arrangement to solve the most fixed unmovable of current testing arrangement mesa, the restriction that the frame corresponds inspects operation range, because can receive the dust influence and reduce the measuring accuracy in the electronic detection process, consequently need clean the inside recess of frame, but the dead angle position is not clear up well, reduces the problem of the safety in utilization of device easily.
In order to achieve the above purpose, the present invention is realized by the following technical solution: the utility model provides an automatic change chip testing arrangement, its structure includes test groove, frame, organism, limiting plate, cushion, displacement formula operation panel, electric cabinet, be equipped with the electric cabinet that the combination was used on the organism, be equipped with the enclosure that the opening link up on the organism and connect the formula frame, test groove diapire position has set the limiting plate, the limiting plate wall is established on the bottom layer position in the frame, the frame installation face hangs down mutually and connects electric cabinet inner wall, limiting plate inboard recess leads mutually and connects displacement formula operation panel.
Further, the displacement type operation platform comprises a frame seat, a table plate, a groove buckling block, a first wall strip, a second wall strip, an embedded groove and a sliding ball, wherein the table plate is stacked on the surface of the frame seat, the groove buckling block is installed on the front wall of the frame seat at a fixed point, the first wall strip and the second wall strip are arranged on two sides of the frame seat at intervals, a plurality of embedded grooves are formed in the first wall strip and the second wall strip, embedded sliding balls are arranged on the embedded grooves, and the surface of the sliding ball can be connected with a groove in the inner side of the limiting plate and the inner wall of the frame in a rolling mode.
Furthermore, the cushion blocks are fixedly arranged at intervals on two sides of the bottom of the machine body.
Further, the frame inner cavity integrally forms a test slot.
Further, spacing plate is arranged at intervals of the electric cabinet.
Further, the frame mounting surface is higher than the position of the cushion block.
Further, the first wall strip linearly slides and contacts the groove on the inner side of the limiting plate.
Further, the surface of the table plate is higher than the transverse surface of the limiting plate.
Advantageous effects
The utility model relates to an automatic change chip testing arrangement, limiting plate inboard recess is led mutually and is connect displacement formula operation panel, the frame seat links to each other integratively with the combination of surperficial platen, antetheca catching groove piece is the fulcrum piece that can drive the frame seat and remove, be equipped with a plurality of embedded sliding balls on first wall strip and the second wall strip, correspond caulking groove position interval arrangement, the surface can roll and connect inboard recess of limiting plate and a frame inner wall, the straight line moves the stage body back outward, can make things convenient for the staff to clean the frame inside groove, dead angle position dust also can be cleared away, the static influence that has reduced because of the dust receives, can effectively improve the security that the device used.
Drawings
Other features, objects and advantages of the invention will become more apparent upon reading of the detailed description of non-limiting embodiments with reference to the following drawings:
fig. 1 is a schematic structural diagram of an automated chip testing apparatus according to the present invention;
fig. 2 is a schematic view of the assembly structure of the displacement operating platform of the present invention.
In the figure: the device comprises a test slot-1, a frame-2, a machine body-3, a limiting plate-4, a cushion block-5, a displacement type operating platform-6, a frame seat-30, a bedplate-31, a buckling groove block-32, a first wall strip-33, a second wall strip-34, an embedding groove-35, a sliding bead-36 and an electric cabinet-7.
Detailed Description
In order to make the technical means, creation features, achievement purposes and functions of the present invention easy to understand, the present invention is further described below with reference to the following embodiments.
Referring to fig. 1-2, the present invention provides a technical solution: an automatic chip testing device structurally comprises a testing groove 1, a frame 2, a machine body 3, a limiting plate 4, a cushion block 5, a displacement type operating platform 6 and an electric cabinet 7, wherein the electric cabinet 7 which is used in combination is arranged on the machine body 3, a surrounding type frame 2 with a through opening is arranged on the machine body 3, the bottom wall of the testing groove 1 is provided with the limiting plate 4 in a matching mode, the wall of the limiting plate 4 is arranged at the bottom layer position in the frame 2, the mounting surface of the frame 2 is perpendicular to the inner wall of the electric cabinet 7, the groove at the inner side of the limiting plate 4 is connected with the displacement type operating platform 6 in a guiding mode, the displacement type operating platform 6 comprises a frame seat 30, a bedplate 31, a buckling groove block 32, a first wall strip 33, a second wall strip 34, a caulking groove 35 and a sliding ball 36, the bedplate 31 is overlapped on the surface of the frame seat 30, the buckling groove block 32 is arranged at the fixed point position on the front wall of the frame seat 30, the first wall strip 33 and the second wall strip 34 which are arranged at intervals on two sides of the frame seat 30, the novel test device is characterized in that a plurality of caulking grooves 35 are formed in the first wall strips 33 and the second wall strips 34, embedded sliding beads 36 are arranged on the caulking grooves 35, the surfaces of the sliding beads 36 can be in rolling connection with grooves in the inner sides of the limiting plates 4 and the inner walls of the frames 2, the cushion blocks 5 are fixedly arranged at intervals on two sides of the bottom of the machine body 3, the inner cavities of the frames 2 integrally form test grooves 1, the electric cabinet 7 is provided with spacing plates 4 at intervals, the mounting surface of each frame 2 is higher than the positions of the cushion blocks 5, the first wall strips 33 linearly and slidably contact the grooves in the inner sides of the limiting plates 4, and the surface of the bedplate 31 is higher than the transverse surface of each limiting plate 4.
The sliding ball 36 is provided with a plurality of grooves which are arranged at intervals corresponding to the positions of the caulking grooves 35, and the surface of the sliding ball can be connected with the inner side groove of the limiting plate 4 and the inner wall of the frame 2 in a rolling way.
For example: when the device is used, the inner side groove of the limiting plate 4 is connected with the displacement type operating platform 6 in a guide mode, the frame base 30 and the surface bedplate 31 are combined and connected into a whole, the front wall groove buckling block 32 is a fulcrum block capable of driving the frame base 30 to move, a plurality of embedded sliding balls 36 are arranged on the first wall strip 33 and the second wall strip 34 and correspond to the embedded grooves 35 in position and interval arrangement, the inner side groove of the limiting plate 4 and the inner wall of the frame 2 can be rolled on the surface, after the platform body is linearly moved outwards, workers can clean the inner groove of the frame 2 conveniently, dust at dead angle positions can be removed, the electrostatic influence caused by the dust is reduced, and the use safety of the device can be effectively improved.
The utility model provides a problem be the most fixed unmovable of current testing arrangement mesa, the restriction that the frame corresponds has inspected operation range, because can receive the dust influence in the electronic detection process and reduce the measuring accuracy, consequently need clean the inside recess of frame, but the dead angle position is not clear up well, reduces the safety in utilization of device easily, the utility model discloses a combination of each other of above-mentioned parts, straight line move the stage body back outward, can make things convenient for the staff to clean the frame inside groove, and dead angle position dust also can be cleared away, has reduced the static influence that receives because of the dust, can effectively improve the security that the device used.
The basic principles and the main features of the invention and the advantages of the invention have been shown and described above, it will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, but that the invention may be embodied in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.
Claims (6)
1. The utility model provides an automatic change chip testing arrangement, its structure includes test groove (1), frame (2), organism (3), limiting plate (4), cushion (5), displacement formula operation panel (6), electric cabinet (7), its characterized in that:
be equipped with electric cabinet (7) that the combination was used on organism (3), it connects formula frame (2) to be equipped with the enclosure that the opening link up on organism (3), limiting plate (4) have been set to test groove (1) diapire position, limiting plate (4) wall is established on the bottom layer position in frame (2), frame (2) installation face hangs down mutually and connects electric cabinet (7) inner wall, limiting plate (4) inboard recess is led mutually and is connect displacement formula operation panel (6).
2. The automated chip testing apparatus of claim 1, wherein: displacement formula operation panel (6) are including frame seat (30), platen (31), catching groove piece (32), first wall strip (33), second wall strip (34), caulking groove (35), smooth pearl (36), frame seat (30) surface is folded and is equipped with platen (31), catching groove piece (32) are installed on frame seat (30) antetheca fixed point position, frame seat (30) both sides are divided and are equipped with position spaced first wall strip (33) and second wall strip (34), be equipped with a plurality of caulking grooves (35) on first wall strip (33) and second wall strip (34), be equipped with embedded smooth pearl (36) on caulking groove (35), smooth pearl (36) surface can roll and connect inboard recess of limiting plate (4) and a frame (2) inner wall.
3. The automated chip testing apparatus of claim 1, wherein: the cushion blocks (5) are fixedly arranged at intervals on two sides of the bottom of the machine body (3).
4. The automated chip testing apparatus of claim 1, wherein: the inner cavity of the frame (2) is integrated to form a test slot (1).
5. The automated chip testing apparatus of claim 1, wherein: the electric cabinet (7) is provided with spacing limit plates (4) at intervals.
6. The automated chip testing apparatus of claim 1, wherein: the mounting surface of the frame (2) is higher than the position of the cushion block (5).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121202869.6U CN214953621U (en) | 2021-06-01 | 2021-06-01 | Automatic chip testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121202869.6U CN214953621U (en) | 2021-06-01 | 2021-06-01 | Automatic chip testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214953621U true CN214953621U (en) | 2021-11-30 |
Family
ID=79057397
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121202869.6U Active CN214953621U (en) | 2021-06-01 | 2021-06-01 | Automatic chip testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214953621U (en) |
-
2021
- 2021-06-01 CN CN202121202869.6U patent/CN214953621U/en active Active
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: No. 101.102, Building 12, No. 88 Keyuan South Road, High tech Zone, Chengdu, Sichuan, 610041 Patentee after: Chengdu Hantong Integrated Technology Co.,Ltd. Address before: 610000 No. 101 and 102, building 12, No. 88, Keyuan South Road, high tech Zone, Chengdu, Sichuan Patentee before: CHENGDU CHINAR INTEGRATED TECHNOLOGY CO.,LTD. |
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| CP03 | Change of name, title or address |