CN214844980U - Adjustable eddy current probe clamping device - Google Patents
Adjustable eddy current probe clamping device Download PDFInfo
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- CN214844980U CN214844980U CN202121311754.0U CN202121311754U CN214844980U CN 214844980 U CN214844980 U CN 214844980U CN 202121311754 U CN202121311754 U CN 202121311754U CN 214844980 U CN214844980 U CN 214844980U
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Abstract
The invention discloses an adjustable eddy current probe clamping device which comprises a probe clamping seat, wherein a probe mounting structure for mounting an eddy current probe is arranged on the probe clamping seat; the probe clamping seat is provided with a height adjusting mechanism for adjusting the lifting height of the probe clamping seat; the height adjusting mechanism comprises an adjusting seat arranged in the probe clamping seat, and at least three supporting leg mechanisms which are annularly and uniformly distributed around a set axis are arranged between the adjusting seat and the probe clamping seat; the supporting leg mechanism comprises a supporting leg, one end of the supporting leg is hinged to the adjusting seat, the middle of the supporting leg is hinged to the probe clamping seat, the probe clamping seat is provided with a driving mechanism, the adjusting seat moves along the direction parallel to the set axis to drive the probe clamping seat, and the supporting leg synchronously rotates to adjust the lifting height of the probe mounting structure. The adjustable eddy current probe clamping device can adjust the lifting height of the eddy current probe so as to be suitable for different detection working condition requirements.
Description
Technical Field
The invention belongs to the technical field of nondestructive testing, and particularly relates to an adjustable eddy current probe clamping device.
Background
Eddy currents are a physical phenomenon based on electromagnetic induction. In the eddy current probe, alternating current flows through a coil to generate an oscillating magnetic field, and when the probe is close to a conductive material, the amplitude and mode of eddy current and the generated magnetic field are interrupted or changed due to material change or defects, so that the electric impedance of the coil is reversely changed to influence the movement of electrons in the coil, and the aims of flaw detection and the like can be fulfilled by detecting and analyzing the changes.
Eddy current inspection is widely used in the aerospace industry, pressure vessels, etc., where inspection of thin metals is required to discover potential safety or quality problems. The eddy current inspection process can very quickly inspect a large area without using a coupling liquid.
The existing eddy current inspection generally adopts a probe clamping device with an anti-wear shoe, the structure of the probe clamping device is relatively fixed, and the probe clamping device is only suitable for one working condition to carry out inspection, namely, the probe clamping device needs to be designed in a pertinence manner when the inspection of workpieces with different curvatures/curved surfaces, such as flat plates, pipe rods, spherical tanks and the like, is carried out. In addition, the existing probe clamping device is mostly in direct contact with a detection contact surface, large friction exists, manual detection is inconvenient, and the problems of inaccurate detection data, difficult data analysis and the like caused by lifting away from height change and the like are easily solved.
Disclosure of Invention
In view of this, the present invention provides an adjustable eddy current probe clamping device, which can adjust the lift-off height of the eddy current probe to meet different requirements of detection conditions.
In order to achieve the purpose, the invention provides the following technical scheme:
an adjustable eddy current probe clamping device comprises a probe clamping seat, wherein a probe mounting structure for mounting an eddy current probe is arranged on the probe clamping seat; the probe clamping seat is provided with a height adjusting mechanism for adjusting the lifting height of the probe clamping seat;
the height adjusting mechanism comprises an adjusting seat arranged in the probe clamping seat, and at least three supporting leg mechanisms which are annularly and uniformly distributed around a set axis are arranged between the adjusting seat and the probe clamping seat;
the supporting leg mechanism comprises supporting legs, one end of each supporting leg is connected with the adjusting seats in an articulated mode, the middle of each supporting leg is connected with the probe clamping seats in an articulated mode, the probe clamping seats are provided with adjusting seats which are used for driving, the adjusting seats move along the direction parallel to the set axis and then drive all the supporting legs to rotate synchronously so as to adjust the lifting height adjusting mechanism of the probe mounting structure.
Furthermore, the probe mounting structure comprises a probe mounting hole, and a probe fixing screw for fixing the eddy current probe is arranged on the side wall of the probe mounting hole.
Furthermore, a height measuring ruler for measuring the lifting height of the probe clamping seat is arranged on the probe clamping seat, and the height measuring ruler can move along the direction parallel to the set axis.
Further, the probe clamping seat comprises a clamping frame and a probe mounting seat fixedly mounted on the clamping frame; the probe mounting structure is arranged on the probe mounting seat.
Furthermore, first hinge seats are arranged on the adjusting seats in one-to-one correspondence with the supporting legs; a waist-shaped round hole I is formed in the first hinge seat, and a first rotating shaft I matched with the waist-shaped round hole I is arranged at the end part of the supporting leg; or the end part of the supporting leg is provided with a waist-shaped round hole II, and the first hinge seat is provided with a first rotating shaft II matched with the waist-shaped round hole II.
Further, the long axis direction of the waist-shaped round hole I is perpendicular to the set axis.
Furthermore, second hinging seats are arranged on the probe clamping seat and correspond to the supporting legs one by one; a round hole I is formed in the second hinge seat, and the middle of the supporting leg is matched with a second rotating shaft I of the round hole I; or, the middle part of supporting leg is equipped with round hole II, be equipped with on the articulated seat of second with II complex second pivots II of round hole.
Furthermore, the middle part of the supporting leg is bent and a bent part is formed, and the second rotating shaft I or the round hole II is arranged at the bent part.
Further, the adjusting mechanism comprises an adjusting screw arranged between the probe clamping seat and the adjusting seat.
Furthermore, the other end of the supporting leg is provided with a spherical surface which is used for being in contact fit with a workpiece to be detected; or the other end of the supporting leg is provided with a ball which is matched with the workpiece to be measured in a rolling way.
The invention has the beneficial effects that:
according to the adjustable eddy current probe clamping device, the adjusting seat is arranged in the probe supporting seat, the supporting leg mechanisms are annularly and uniformly distributed on the adjusting seat, and the adjusting seat is driven by the adjusting mechanism to move along the direction parallel to the set axis, so that all supporting legs can be driven to rotate around the hinge shafts between the supporting legs and the probe clamping seat, the supporting height of the probe clamping seat can be adjusted, and the technical purpose of adjusting the lifting height of the eddy current probe is achieved; the adjustable eddy current probe clamping device can adjust the lifting height of the eddy current probe, so that the adjustable eddy current probe clamping device can be suitable for different detection working condition requirements.
Drawings
In order to make the object, technical scheme and beneficial effect of the invention more clear, the invention provides the following drawings for explanation:
FIG. 1 is a schematic structural diagram of an adjustable eddy current probe clamping device according to an embodiment of the present invention;
FIG. 2 is an exploded view of the adjustable eddy current probe clamping device according to the present embodiment;
FIG. 3 is a diagram illustrating a planar workpiece being inspected by the adjustable eddy current probe clamping device of the present embodiment;
FIG. 4 is a diagram illustrating a cylindrical workpiece being inspected by the adjustable eddy current probe clamping device of the present embodiment;
fig. 5 is a state diagram of the adjustable eddy current probe clamping device for detecting spherical workpieces according to the embodiment.
Description of reference numerals:
1-an adjusting seat; 2-supporting legs; 3-a probe mounting hole; 4-fixing the screw by the probe; 5-height measuring ruler; 6, a clamping frame; 7-probe mounting seat; 8-a first articulated seat; 9-kidney-shaped round hole I; 10-a first rotating shaft I; 11-a second articulated seat; 12-round hole I; 13-a second rotating shaft I; 14-an adjusting screw; 15-sphere.
Detailed Description
The present invention is further described with reference to the following drawings and specific examples so that those skilled in the art can better understand the present invention and can practice the present invention, but the examples are not intended to limit the present invention.
Fig. 1 is a schematic structural diagram of an embodiment of an adjustable eddy current probe clamping device according to the present invention. The adjustable eddy current probe clamping device comprises a probe clamping seat, wherein a probe mounting structure for mounting an eddy current probe is arranged on the probe clamping seat; the probe clamping seat is provided with a height adjusting mechanism for adjusting the lifting height of the probe clamping seat. The height adjusting mechanism of this embodiment is equipped with around setting axis line annular equipartition's at least three supporting leg mechanism including installing regulation seat 1 in the probe grip slipper between regulation seat 1 and the probe grip slipper. The supporting leg mechanism of this embodiment includes supporting leg 2, and the one end of supporting leg 2 is connected with adjusting between 1 to articulate, and articulated between the middle part of supporting leg 2 and the probe grip slipper is connected, and is equipped with on the probe grip slipper to be used for the drive to adjust 1 and remove and then drive all supporting legs 2 synchronous rotation in order to adjust the lift-off height adjustment mechanism of probe mounting structure along the direction parallel with the settlement axis. The supporting leg mechanism annular equipartition of this embodiment establishes to 3, and the contained angle between two adjacent supporting leg mechanisms is 120. The set axis of the embodiment is the axis of the annular array of the 3 support leg mechanisms.
The probe mounting structure of this embodiment includes the probe mounting hole 3, is equipped with the probe set screw 4 that is used for fixed eddy current probe on the lateral wall of probe mounting hole 3 to can fix eddy current probe in the probe mounting structure.
Furthermore, a height measuring ruler 5 for measuring the lifting height of the probe clamping seat is arranged on the probe clamping seat, and the height measuring ruler 5 can move along the direction parallel to the set axis. The height measuring ruler 5 is provided with measuring scales, and after the height of the probe mounting structure is adjusted through the height adjusting mechanism, the slidable height measuring ruler 5 is in contact fit with the surface of a workpiece to be measured, so that the height of the probe mounting structure is measured.
Further, the probe clamping seat of the present embodiment includes a clamping frame 6 and a probe mounting seat 7 fixedly mounted on the clamping frame 6; the probe mounting structure is arranged on the probe mounting seat 7. The height gauge 5 of the present embodiment is mounted on the probe mount 7. Through setting up probe holder components of a whole that can function independently into supporting rack 6 and probe mount pad 7, can be convenient for install and adjust seat 1 and set up high adjustment mechanism.
Specifically, the adjusting seat 1 and the supporting legs 2 are provided with first hinge seats 8 in a one-to-one correspondence manner; a waist-shaped round hole I9 is formed in the first hinge seat 8, and a first rotating shaft I10 matched with the waist-shaped round hole I9 is arranged at the end part of the supporting leg 2; or the end part of the supporting leg 2 is provided with a waist-shaped round hole II, and the first hinge seat 8 is provided with a first rotating shaft II matched with the waist-shaped round hole II. The waist shape round hole I9 that is equipped with on first articulated seat 8 of this embodiment, the tip of supporting leg 2 be equipped with waist shape round hole I9 complex first pivot I10, be used for playing the effect of stepping down when adjusting seat 1 and moving along setting for the axis through setting up waist shape round hole I9. The long axis direction of the waist-shaped round hole I9 of the embodiment is vertical to the set axis.
Further, second hinge seats 11 are arranged on the probe clamping seat and correspond to the supporting legs 2 one by one; a round hole I12 is formed in the second hinge seat 11, and a second rotating shaft I13 is arranged in the middle of the supporting leg 2 and matched with the round hole I12; or, the middle part of supporting leg 2 is equipped with round hole II, is equipped with on the articulated seat 11 of second with II complex second pivots II of round hole. This embodiment is equipped with round hole I12 on the articulated seat 11 of second, the middle part of supporting leg 2 and round hole I12 complex second pivot I13 to can make supporting leg 2 rotate around second pivot I13, in order to reach the technical purpose of adjusting to carry from the height. Specifically, the middle part of supporting leg 2 is bent and the shaping portion of bending, and second pivot I13 or round hole II set up in the portion of bending. The L type of bending into in the middle part of supporting leg 2 of this embodiment, the portion of bending of supporting leg 2 is equipped with second pivot I13, so, adjusts 1 less distances of removal of seat and can make supporting leg 2 rotate great angle, improves regulation efficiency.
Further, adjustment mechanism is including setting up adjusting screw 14 between probe grip slipper and regulation seat 1, and adjusting screw 14 can rotate and install on regulation seat 1 simultaneously with probe grip slipper screw-thread fit, also can with probe grip slipper normal running fit simultaneously with regulation seat 1 screw-thread fit. And the axis of the adjustment screw 14 is parallel or collinear with the set axis. Thus, the technical purpose of adjusting the lift-off height of the probe mounting structure is achieved by rotating the adjusting screw 14 to change the position of the adjusting seat 1 on the axis parallel to the set axis.
Furthermore, the other end of the supporting leg 2 is provided with a spherical surface 15 which is used for being in contact fit with a workpiece to be detected; or, the other end of the supporting leg 2 is provided with a ball which is matched with the workpiece to be measured in a rolling way. The other end of the supporting leg 2 of the embodiment is provided with a spherical surface 15 for contacting and matching with the workpiece to be measured.
According to the adjustable eddy current probe clamping device, the adjusting seat is arranged in the probe supporting seat, the supporting leg mechanisms are annularly and uniformly arranged on the adjusting seat, and the adjusting seat is driven by the adjusting mechanism to move along the direction parallel to the set axis, so that all the supporting legs can be driven to rotate around the hinge shafts between the supporting legs and the probe clamping seat, the supporting height of the probe clamping seat can be adjusted, and the technical purpose of adjusting the lifting height of the eddy current probe is achieved; because the adjustable eddy current probe clamping device of this embodiment can adjust the lift-off height of eddy current probe, consequently, can be applicable to different inspection operating mode requirements.
In actual operation, an eddy current probe interface is connected with an eddy current flaw detector, the eddy current probe is placed in a probe mounting hole 3, the eddy current probe is fixed in the probe mounting hole 3 through a probe fixing screw 4, the adjustable eddy current probe clamping device of the embodiment is placed on a workpiece to be detected through a supporting leg 2, the relative height between a detection surface of the eddy current probe and the workpiece to be detected is adjusted by rotating a knob of an adjusting screw 14, the height is measured by a height measuring ruler 5, and the lifting height is set to be 0.5-5 mm. The lifting-off height accurate control of the detection process can be realized, and the stability and reliability of the test process are ensured. The parameters of the eddy current instrument are set, the adjustable eddy current probe clamping device of the embodiment is pushed to move along the detection process setting route through the handheld clamping frame 6, the probe sends a magnetic field, the workpiece to be detected is magnetized, when the detection part of the workpiece has a defect, the workpiece can generate an electromagnetic eddy current signal, the electromagnetic eddy current signal is received by the probe, and finally, whether the detection part of the workpiece to be detected has the defect or not is judged according to the instrument.
The above-mentioned embodiments are merely preferred embodiments for fully illustrating the present invention, and the scope of the present invention is not limited thereto. The equivalent substitution or change made by the technical personnel in the technical field on the basis of the invention is all within the protection scope of the invention. The protection scope of the invention is subject to the claims.
Claims (10)
1. The utility model provides an eddy current probe clamping device with adjustable which characterized in that: the eddy current probe clamping device comprises a probe clamping seat, wherein a probe mounting structure for mounting an eddy current probe is arranged on the probe clamping seat; the probe clamping seat is provided with a height adjusting mechanism for adjusting the lifting height of the probe clamping seat;
the height adjusting mechanism comprises an adjusting seat (1) arranged in the probe clamping seat, and at least three supporting leg mechanisms which are annularly and uniformly distributed around a set axis are arranged between the adjusting seat (1) and the probe clamping seat;
the supporting leg mechanism comprises supporting legs (2), one ends of the supporting legs (2) are hinged to the adjusting seats (1), the middle portions of the supporting legs (2) are hinged to the probe clamping seats, the probe clamping seats are provided with driving devices, the adjusting seats (1) move along the direction parallel to the axis and drive all the supporting legs (2) synchronously rotate to adjust the lifting height adjusting mechanism of the probe mounting structure.
2. The adjustable eddy current probe clamp as claimed in claim 1, wherein: the probe mounting structure comprises a probe mounting hole (3), and a probe fixing screw (4) for fixing the eddy current probe is arranged on the side wall of the probe mounting hole (3).
3. The adjustable eddy current probe clamp as claimed in claim 1, wherein: the probe clamping seat is provided with a height measuring ruler (5) for measuring the lifting height of the probe clamping seat, and the height measuring ruler (5) can move along the direction parallel to the set axis.
4. The adjustable eddy current probe clamp as claimed in claim 1, wherein: the probe clamping seat comprises a clamping frame (6) and a probe mounting seat (7) fixedly mounted on the clamping frame (6); the probe mounting structure is arranged on the probe mounting base (7).
5. The adjustable eddy current probe clamp apparatus according to any one of claims 1 to 4, wherein: the adjusting seat (1) and the supporting legs (2) are provided with first hinge seats (8) in a one-to-one correspondence manner; a waist-shaped round hole I (9) is formed in the first hinge seat (8), and a first rotating shaft I (10) matched with the waist-shaped round hole I (9) is arranged at the end part of the supporting leg (2); or the end part of the supporting leg (2) is provided with a waist-shaped round hole II, and the first hinge seat (8) is provided with a first rotating shaft II matched with the waist-shaped round hole II.
6. The adjustable eddy current probe clamp as claimed in claim 5, wherein: the long axis direction of the waist-shaped round hole I (9) is perpendicular to the set axis.
7. The adjustable eddy current probe clamp as claimed in claim 5, wherein: second hinged seats (11) are arranged on the probe clamping seat and correspond to the supporting legs (2) one by one; a round hole I (12) is formed in the second hinge seat (11), and a second rotating shaft I (13) matched with the round hole I (12) is arranged in the middle of the supporting leg (2); or, the middle part of supporting leg (2) is equipped with round hole II, be equipped with on the articulated seat of second (11) with II complex second pivots II of round hole.
8. The adjustable eddy current probe clamp as claimed in claim 7, wherein: the middle part of supporting leg (2) is bent and the shaping portion of bending, second pivot I (13) or round hole II set up the portion of bending.
9. The adjustable eddy current probe clamp as claimed in claim 1, wherein: the adjusting mechanism comprises an adjusting screw (14) arranged between the probe clamping seat and the adjusting seat (1).
10. The adjustable eddy current probe clamp as claimed in claim 1, wherein: the other end of the supporting leg (2) is provided with a spherical surface (15) which is used for being in contact fit with a workpiece to be measured; or the other end of the supporting leg (2) is provided with a ball which is used for being matched with the workpiece to be measured in a rolling way.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121311754.0U CN214844980U (en) | 2021-06-11 | 2021-06-11 | Adjustable eddy current probe clamping device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121311754.0U CN214844980U (en) | 2021-06-11 | 2021-06-11 | Adjustable eddy current probe clamping device |
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| CN214844980U true CN214844980U (en) | 2021-11-23 |
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| CN202121311754.0U Active CN214844980U (en) | 2021-06-11 | 2021-06-11 | Adjustable eddy current probe clamping device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114166933A (en) * | 2021-12-14 | 2022-03-11 | 电子科技大学 | Probe clamping device for inhibiting vibration response |
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2021
- 2021-06-11 CN CN202121311754.0U patent/CN214844980U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114166933A (en) * | 2021-12-14 | 2022-03-11 | 电子科技大学 | Probe clamping device for inhibiting vibration response |
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