CN214750463U - Small-gap high-precision test probe - Google Patents

Small-gap high-precision test probe Download PDF

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Publication number
CN214750463U
CN214750463U CN202120317928.8U CN202120317928U CN214750463U CN 214750463 U CN214750463 U CN 214750463U CN 202120317928 U CN202120317928 U CN 202120317928U CN 214750463 U CN214750463 U CN 214750463U
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CN
China
Prior art keywords
needle
cavity
needle shaft
needle tube
shaft
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Active
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CN202120317928.8U
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Chinese (zh)
Inventor
丁崇亮
邹斌
申啸
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Weinan Muwang Intelligent Technology Co ltd
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Weinan Hi Tech Zone Wood King Technology Co Ltd
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Priority to CN202120317928.8U priority Critical patent/CN214750463U/en
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Abstract

The utility model discloses a booth clearance high accuracy test probe, include: a needle tube, wherein a needle tube cavity with an opening at one end is arranged in the needle tube; one end of the needle shaft is movably arranged in the inner cavity of the needle tube, the other end of the needle shaft extends out of the inner cavity of the needle tube, one end of the needle shaft, which is positioned in the inner cavity of the needle tube, is provided with a needle shaft cavity, and the needle shaft cavity is an inclined cavity or a deflection cavity; the elastic piece is arranged in the needle tube cavity, one end of the elastic piece is fixedly connected in the needle tube cavity, the other end of the elastic piece is fixedly connected in the needle shaft cavity, and the needle shaft moves in the needle tube cavity in a telescopic mode. The utility model discloses be oblique chamber or inclined to one side chamber with the needle shaft cavity, not on an axis with the needle tubing inner chamber, when the needle shaft pushes down, the yawing force of elastic component when increasing the equipment makes the elastic component inseparabler that can contact with the needle shaft inner wall, shunts the electric current of test, reduces resistance, improves the stability of electric property and the accuracy of test data.

Description

Small-gap high-precision test probe
Technical Field
The utility model belongs to the electronic components field, specifically speaking relates to a booth clearance high accuracy test probe.
Background
The spring needle consists of a needle shaft, a needle tube and a spring, wherein the needle shaft and the spring are both arranged in a cavity of the needle tube, and the needle tube, the needle shaft and the spring form a whole after being fixed by a precise riveting technology.
When the spring needle is small, due to the limitation of test stroke, a reverse hole drilling design needs to be performed on the needle head, the spring penetrates through the inner hole of the needle shaft and the inner hole of the needle tube, the inner hole of the needle shaft is smaller than the inner hole of the needle tube, and the inner part of the needle shaft is controlled to be a straight hole and is in the same circle center with the needle shaft. When the spring needle works, the needle moves axially towards the needle tube, the larger the pressing stroke is, the larger the force can be, the certain stroke is pressed downwards, all the forces are concentrated on the contact part (spring end) between the spring and the needle tube, and the gap between the needle shaft and the spring is larger, so that the elastic force and the resistance rise linearly, and the test data is inaccurate.
Disclosure of Invention
The utility model aims at providing a booth clearance high accuracy test probe to it is great to solve the clearance between current spring needle axle and the spring, and elasticity and resistance straight-line rise cause the unsafe problem of test data.
In order to solve the technical problem, the utility model discloses a booth clearance high accuracy test probe, include:
a needle tube, wherein a needle tube cavity with an opening at one end is arranged in the needle tube;
one end of the needle shaft is movably arranged in the inner cavity of the needle tube, the other end of the needle shaft extends out of the inner cavity of the needle tube, one end of the needle shaft, which is positioned in the inner cavity of the needle tube, is provided with a needle shaft cavity, and the needle shaft cavity is an inclined cavity or a deflection cavity;
the elastic piece is arranged in the needle tube cavity, one end of the elastic piece is fixedly connected in the needle tube cavity, the other end of the elastic piece is fixedly connected in the needle shaft cavity, and the needle shaft moves in the needle tube cavity in a telescopic mode.
The utility model discloses technical scheme's characteristics still lie in:
furthermore, the needle shaft is in interference fit with the inner wall of the inner cavity of the needle tube.
Further, the needle shaft cavity is not on the same axis as the needle tube cavity.
Further, the surfaces of the needle tube, the needle shaft and the elastic member are all plated with gold.
Further, the elastic member is a compression spring.
Compared with the prior art, the utility model discloses can obtain including following technological effect:
the utility model discloses little clearance high accuracy test probe is oblique chamber or inclined to one side chamber with the needle shaft cavity, and is not on an axis with the needle tubing inner chamber, when the needle shaft pushes down, the yawing force of elastic component when increasing the equipment makes inseparabler that elastic component and needle shaft inner wall can contact, shunts the electric current of test, reduces resistance, improves the stability of electric property and the accuracy of test data.
Drawings
The accompanying drawings, which are described herein, serve to provide a further understanding of the invention and constitute a part of this specification, and the exemplary embodiments and descriptions thereof are provided for explaining the invention without unduly limiting it. In the drawings:
fig. 1 is a schematic structural view of a small-gap high-precision test probe in embodiment 1 of the present invention;
FIG. 2 is a schematic structural view of a needle shaft in a small-gap high-precision test probe in embodiment 1 of the present invention;
fig. 3 is a schematic structural diagram of a small-gap high-precision test probe in embodiment 2 of the present invention;
fig. 4 is a schematic structural view of a needle shaft in a small-gap high-precision test probe in embodiment 2 of the present invention.
In the figure, 1, a needle tube, 2, a needle tube cavity, 3, a needle shaft, 4, a needle shaft cavity, 5 and an elastic part.
Detailed Description
The following embodiments will be described in detail with reference to the accompanying drawings, so that how to implement the technical means of the present invention to solve the technical problems and achieve the technical effects can be fully understood and implemented.
In the description of the present invention, it is to be understood that the terms "center", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, are not to be construed as limiting the present invention. Furthermore, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first," "second," etc. may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless otherwise specified.
In the description of the present invention, it should be noted that unless otherwise explicitly stated or limited, the terms "mounted," "connected," and "disposed" are to be construed broadly and can include, for example, a fixed connection, a removable connection, or an integral connection or a removable arrangement. The specific meaning of the above terms in this patent may be understood by those of ordinary skill in the art as appropriate.
Example 1
This embodiment 1 discloses a small-gap high-precision test probe, as shown in fig. 1 and 2, including:
a needle tube 1, wherein a needle tube cavity 2 with one end opened is arranged in the needle tube 1;
one end of the needle shaft 3 is movably arranged in the needle tube cavity 2, the other end of the needle shaft 3 extends out of the needle tube cavity 2, one end of the needle shaft 3, which is positioned in the needle tube cavity 2, is provided with a needle shaft cavity 4, and the needle shaft cavity 4 is a deflection cavity;
an elastic piece 5 is arranged in the needle tube cavity 2, one end of the elastic piece 5 is fixedly connected in the needle tube cavity 2, the other end of the elastic piece 5 is fixedly connected in the needle shaft cavity 4, and the needle shaft 3 moves in the needle tube cavity 2 in a stretching mode.
During the test, at the in-process that needle shaft 3 pushed down, needle shaft 3 moves to 1 direction of needle tubing, and the stroke of pushing down is big more, and the dynamics will be big more, and needle shaft cavity 4 designs for inclined to one side the chamber, and when needle shaft 3 pushed down, the lateral force of elastic component 5 when increasing the equipment makes elastic component 5 inseparabler that can contact with 3 inner walls of needle shaft, shunts the electric current of test, reduces resistance, improves the stability of electric property and the accuracy of test data.
Furthermore, the needle shaft 3 is in interference fit with the inner wall of the needle tube inner cavity 2, the detachable connection is realized through the interference fit, the structure is simple, the cost is low, and the practicability is high.
As shown in FIG. 2, the needle shaft cavity 4 is an offset cavity, which is not located at the center of the needle shaft 3, and the needle shaft cavity 4 and the needle tube cavity 2 are not located on the same axis, and functions as: when needle shaft 3 pushed down, the lateral force of elastic component 5 when increasing the equipment made elastic component 5 inseparabler with that 3 inner walls of needle shaft can contact, shunted the electric current of test, reduced resistance, improved the stability of electric property and the accuracy of test data.
Furthermore, the surfaces of the needle tube 1, the needle shaft 3 and the elastic part 5 are all plated with gold to improve the corrosion resistance, the mechanical property, the electrical property and the like of the test probe.
Further, the elastic member 5 may be any elastic member capable of providing a one-dimensional displacement, such as a compression spring.
Example 2
This embodiment 2 discloses a small-gap high-precision test probe, as shown in fig. 3 and 4, including:
a needle tube 1, wherein a needle tube cavity 2 with one end opened is arranged in the needle tube 1;
one end of the needle shaft 3 is movably arranged in the needle tube cavity 2, the other end of the needle shaft 3 extends out of the needle tube cavity 2, one end of the needle shaft 3, which is positioned in the needle tube cavity 2, is provided with a needle shaft cavity 4, and the needle shaft cavity 4 is an inclined cavity;
an elastic piece 5 is arranged in the needle tube cavity 2, one end of the elastic piece 5 is fixedly connected in the needle tube cavity 2, the other end of the elastic piece 5 is fixedly connected in the needle shaft cavity 4, and the needle shaft 3 moves in the needle tube cavity 2 in a stretching mode.
During the test, at the in-process that needle shaft 3 pushed down, needle shaft 3 moves to 1 direction of needle tubing, and the stroke of pushing down is big more, and the dynamics will be big more, and needle shaft cavity 4 designs for oblique chamber, and when needle shaft 3 pushed down, the lateral force of elastic component 5 when increasing the equipment makes elastic component 5 inseparabler that can contact with 3 inner walls of needle shaft, shunts the electric current of test, reduces resistance, improves the stability of electric property and the accuracy of test data.
Furthermore, the needle shaft 3 is in interference fit with the inner wall of the needle tube inner cavity 2, the detachable connection is realized through the interference fit, the structure is simple, the cost is low, and the practicability is high.
As shown in fig. 4, the needle shaft cavity 4 is a slant cavity which is gradually inclined downwards from the end of the needle shaft 3, is not at the central position of the needle shaft 3, and the needle shaft cavity 4 and the needle tube cavity 2 are not on the same axis, and has the functions of: when needle shaft 3 pushed down, the lateral force of elastic component 5 when increasing the equipment made elastic component 5 and needle shaft inner wall 4 can contact inseparabler, shunted the electric current of test, reduced resistance, improved electric property's stability and test data's accuracy.
Furthermore, the surfaces of the needle tube 1, the needle shaft 3 and the elastic part 5 are all plated with gold to improve the corrosion resistance, the mechanical property, the electrical property and the like of the test probe.
Further, the elastic member 5 may be any elastic member capable of providing a one-dimensional displacement, such as a compression spring.
While the foregoing description shows and describes several preferred embodiments of the invention, it is to be understood, as noted above, that the invention is not limited to the forms disclosed herein, but is not to be construed as excluding other embodiments and is capable of use in various other combinations, modifications, and environments and is capable of changes within the scope of the inventive concept as expressed herein, commensurate with the above teachings, or the skill or knowledge of the relevant art. And that modifications and variations may be effected by those skilled in the art without departing from the spirit and scope of the invention as defined by the appended claims.

Claims (5)

1. A small-gap high-precision test probe, comprising:
the needle tube (1), a needle tube cavity (2) with one open end is arranged in the needle tube (1);
the needle shaft (3), one end of the needle shaft (3) is movably arranged in the needle tube inner cavity (2), the other end of the needle shaft (3) extends out of the needle tube inner cavity (2), one end of the needle shaft (3) positioned in the needle tube inner cavity (2) is provided with a needle shaft cavity (4), and the needle shaft cavity (4) is an inclined cavity or a deviated cavity;
an elastic component (5), set up in needle tubing inner chamber (2), the one end fixed connection of elastic component (5) is in needle tubing inner chamber (2), the other end fixed connection of elastic component (5) is in needle axle cavity (4), needle axle (3) is in telescopic motion in needle tubing inner chamber (2).
2. The small-gap high-precision test probe according to claim 1, wherein the needle shaft (3) is in interference fit with the inner wall of the needle tube cavity (2).
3. The small gap high accuracy test probe of claim 1, wherein the needle shaft cavity (4) is not on an axis with the needle cannula lumen (2).
4. The small-gap high-precision test probe according to claim 1, wherein the surfaces of the needle tube (1), the needle shaft (3) and the elastic member (5) are all plated with gold.
5. The small-gap high-precision test probe according to claim 4, characterized in that the elastic member (5) is a compression spring.
CN202120317928.8U 2021-02-04 2021-02-04 Small-gap high-precision test probe Active CN214750463U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202120317928.8U CN214750463U (en) 2021-02-04 2021-02-04 Small-gap high-precision test probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202120317928.8U CN214750463U (en) 2021-02-04 2021-02-04 Small-gap high-precision test probe

Publications (1)

Publication Number Publication Date
CN214750463U true CN214750463U (en) 2021-11-16

Family

ID=78643385

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202120317928.8U Active CN214750463U (en) 2021-02-04 2021-02-04 Small-gap high-precision test probe

Country Status (1)

Country Link
CN (1) CN214750463U (en)

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GR01 Patent grant
GR01 Patent grant
CP03 Change of name, title or address

Address after: 714000 No. 18, chongye Second Road, high tech Industrial Development Zone, Weinan City, Shaanxi Province

Patentee after: Weinan Muwang Intelligent Technology Co.,Ltd.

Address before: 710000 northwest corner of cross between Dongfeng Street and Shiquan Road, high tech Industrial Development Zone, Weinan City, Shaanxi Province

Patentee before: WEINAN HI-TECH ZONE WOOD KING TECHNOLOGY Co.,Ltd.

CP03 Change of name, title or address