CN214622715U

CN214622715U - Fine adjustment structure, probe fine adjustment device and fine adjustment assembly

Info

Publication number: CN214622715U
Application number: CN202022932563.8U
Authority: CN
Inventors: 陈秋龙
Original assignee: Shenzhen Sunson Intelligent Equipment Co ltd
Current assignee: Shenzhen Shengshi Intelligent Equipment Co ltd
Priority date: 2020-12-09
Filing date: 2020-12-09
Publication date: 2021-11-05
Anticipated expiration: 2030-12-09

Abstract

The utility model discloses a fine setting structure, probe micromatic setting and fine setting subassembly. The fine setting structure includes base, first moving member, first push rod and rotation piece, and the base is connected with first track, and first moving member can move along first track, and first moving member can be used for connecting the probe, and first push rod can move base relatively, rotates the piece and can rotate base relatively, rotates the piece and is equipped with mutually perpendicular's first face and second face, and first face is used for contacting with first push rod, and the second face is used for contacting with first moving member. Because the push rod of first push rod can drive and rotate the piece and rotate, then promote the moving member through the second face for first moving member can move along first pushing away, thereby reaches the purpose that first push rod can drive the moving member along the motion of perpendicular first push rod moving direction. The utility model also discloses a probe micromatic setting, this embodiment still provides a fine setting subassembly.

Description

Fine adjustment structure, probe fine adjustment device and fine adjustment assembly

Technical Field

The utility model relates to a probe position adjustment field especially relates to a fine setting structure, probe micromatic setting and fine setting subassembly.

Background

In the related art, if the probe needs to be transversely finely adjusted, a transverse push rod needs to be arranged on the related structure, but in part of mechanisms, the transverse position is too narrow, the push rod cannot be arranged, and inconvenience is brought to part of workers.

SUMMERY OF THE UTILITY MODEL

The utility model discloses aim at solving one of the technical problem that exists among the prior art at least. Therefore, the utility model provides a fine setting structure, probe micromatic setting and fine setting subassembly can make the direction motion that the moving member removed along perpendicular first push rod through the promotion of first push rod.

An embodiment of the utility model provides a fine setting structure, include:

the base is connected with a first rail;

a first moving member movable along the first track, the first moving member being operable to connect to a probe;

first push rod and rotation piece, first push rod can be relative the base removes, it can be relative to rotate the piece the base rotates, it is equipped with mutually perpendicular's first face and second face to rotate the piece, first face be used for with the push rod contact, the second face be used for with the contact of first moving member.

According to the utility model discloses fine setting structure has following beneficial effect at least: because first push rod can drive and rotate a rotation, then promote the moving member through the second face for first moving member can move along first track, thereby reaches the purpose that first push rod can drive the moving member along the motion of perpendicular first push rod moving direction.

According to some embodiments of the invention, the second face is provided with protrusions.

According to some embodiments of the utility model, be equipped with first support and first elastic component on the base, first elastic component with first leg joint, first track is located on the first support, the other end of first elastic component is used for supporting rotate the piece, first elastic component is in compression state.

According to the utility model discloses a some embodiments still include the connecting piece, the one end of connecting piece with first support is connected, the other end of connecting piece is used for supporting the piece rotates, the connecting piece is followed first track extending direction's width is less than first support is followed first track extending direction's width.

According to some embodiments of the utility model, finely tune the structure and still include first support and second push rod, be equipped with the second track on the base, the first track of second track perpendicular to, first support can along the second orbital movement, first track is located first support is relative the opposite side of base.

According to some embodiments of the utility model, the fine setting structure still includes the second moving member, still include the third track on the first moving member, the third track both perpendicular to the first track, also perpendicular with the second track, the second remove just can along the third track removes, the third moving member can be used for connecting the probe.

The embodiment of the utility model provides a probe micromatic setting is still provided, including probe micromatic setting structure, the probe can with first moving member is connected.

The embodiment of the utility model provides a fine setting subassembly is still provided, including base and a plurality of fine setting structure, all fine setting structures connect gradually and set up in on the base.

According to some embodiments of the utility model, be equipped with the opening on the base, all the fine setting structure centers on the opening sets up.

According to the utility model discloses a some embodiments still include a plurality of probe, every the fine setting structure is all divide equally on the first moving member and do not be connected with a probe, the probe can pass the opening.

Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.

Drawings

The invention will be further described with reference to the following drawings and examples, in which:

fig. 1 is a schematic perspective view of a fine adjustment structure in an embodiment of the present invention;

FIG. 2 is a top view of FIG. 1;

FIG. 3 is a schematic view of another angle of FIG. 1;

FIG. 4 is a schematic structural diagram of adjusting group price in the embodiment of the present invention;

fig. 5 is an enlarged view at a in fig. 4.

Reference numerals: the fine adjustment structure 100, a base 101, a first rail 102, a first moving part 103, a first push rod 104, a rotating part 105, a first support 106, a connecting part 107, a second push rod 108, a second elastic part 109, a third elastic part 110, a third push rod 111, a second rail 112, a second moving part 113, a first elastic part 201, a protrusion 202, a third rail 301, a base 401, a probe 402, and an opening 403.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary only for the purpose of explaining the present invention, and should not be construed as limiting the present invention.

In the description of the present invention, it should be understood that the orientation or positional relationship indicated with respect to the orientation description, such as up, down, front, rear, left, right, etc., is based on the orientation or positional relationship shown in the drawings, and is only for convenience of description and simplification of description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.

In the description of the present invention, a plurality of means is one or more, a plurality of means is two or more, and the terms greater than, less than, exceeding, etc. are understood as not including the number, and the terms greater than, less than, within, etc. are understood as including the number. If the first and second are described for the purpose of distinguishing technical features, they are not to be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.

In the description of the present invention, unless there is an explicit limitation, the words such as setting, installation, connection, etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above words in combination with the specific contents of the technical solution.

In the description of the present invention, reference to the description of the terms "one embodiment," "some embodiments," "an illustrative embodiment," "an example," "a specific example," or "some examples" or the like means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

In the structure for finely adjusting the probe, the probe generally needs to be moved along the pushing direction of the push rod by pushing the push rod, but in a partial structure, when the position in a certain direction is small, the movement of the push rod is affected, which makes the adjustment of the probe troublesome.

To the above problem, the utility model provides an embodiment, fine setting structure 100 includes base 101, first moving member 103, first push rod 104 and rotation piece 105, as shown in fig. 1 to 3, be connected with first track 102 on the base 101, first moving member 103 can be along first track 102 do the motion of left right direction as shown in fig. 1, first push rod 104 passes through threaded structure and connects on base 101, it rotates to rotate 105 relative base 101, be equipped with mutually perpendicular's first face and second face on the rotation piece 105, the work end of first push rod 104 can support and hold on first face, and form the extrusion to first face, the second face can exert the effect to first moving member 103, first moving member 103 can be connected with the probe.

The usage method of the above structure is that the first push rod 104 is firstly screwed to move the first push rod 104 to the front as shown in fig. 1 and to press the first surface, so that the rotating member 105 rotates counterclockwise, and then the second surface applies force to the first moving member 103 to move the first moving member 103 along the first track 102 and to move the first moving member 103 to the left as shown in fig. 1. The above structure makes the first moving part 103 complete the movement perpendicular to the moving direction of the first push rod 104 by the movement of the first push rod 104, and the displacement in the left and right direction as shown in fig. 1 is saved.

The fine adjustment structure 100 further includes a first elastic element 201, one end of the first elastic element 201 abuts against the rotating element 105, the other end of the first elastic element 201 is connected to the base 101, and the first elastic element 201 is in a compressed state.

The use method of the structure comprises the following steps: when the first push rod 104 is screwed to make the first push rod 104 move back and forth as shown in fig. 1, the rotating member 105 starts to rotate and pushes the first moving member 103 to move along the left and right directions as shown in fig. 1, at this time, the first elastic member 201 is in a compressed state, has a right acting force on the first moving member 103, and is balanced with the acting force of the rotating member 105 on the first moving member 103 (the first push rod 104 can give the acting force to the rotating member 105), so that the position of the first moving member 103 relative to the first rail 102 is relatively fixed, and after the position adjustment is ensured, the position of the first moving member 103 can be fixed, thereby the position of the probe connected to the first moving member 103 can be fixed.

As an embodiment, as shown in fig. 1 to fig. 3, the second surface is provided with a protrusion 202, and the protrusion 202 can support the first moving member 103 to apply a force to the first moving member 103, so that the first moving member 103 can move along the first rail 102. Since the second surface is provided with the protrusion 202, the distance between the contact point of the rotating member 105 for pushing the connecting member 107 and the rotating shaft of the rotating member 105 is extended, which helps to increase the moment, thereby reducing the force that the rotating member 105 more easily gives to the first moving member 103 for moving.

Specifically, as shown in fig. 1 to 3, the fine adjustment structure 100 further includes a connecting member 107, one end of the connecting member 107 is connected to the first moving member 103, and the other end of the connecting member 107 is used for abutting against the protrusion 202, when the rotating member 105 is driven to rotate by the first pushing member, the protrusion 202 can abut against the connecting member 107, and the connecting member 107 drives the first moving member 103 to move relative to the first rail 102.

Specifically, as shown in fig. 1, the length of the connecting element 107 in the left-right direction in fig. 1 is smaller than the length of the first moving element 103 in the left-right direction in fig. 1, compared with the structure in which the rotating element 105 directly acts on the first moving element 103, the structure makes the length of the connecting element 107 and the protrusion 202 in the left-right direction in fig. 1 shorter when the connecting element 107 abuts against the protrusion 202, and thus the distance in the left-right direction in fig. 1 is saved.

Specifically, as shown in fig. 1 and fig. 2, the first elastic element 201 is located between the connecting element 107 and the first supporting frame 106, and when the rotating element 105 drives the connecting element 107 to move to the left as shown in fig. 1, the first elastic element 201 is in a compressed state, and the force applied to the connecting element 107 by the rotating element 105 is balanced with the force applied to the connecting element 107, so that the position of the connecting element 107 is relatively fixed, and thus the position of the first moving element 103 is relatively fixed.

Specifically, as shown in fig. 1 to 3, the fine adjustment structure 100 further includes a first bracket 106 and a second push rod 108, a second rail 112 is disposed on the base 101, the first bracket 106 can move along the second rail 112, a working end of the second push rod 108 abuts against the first bracket 106, the first push rod 104 is connected with the base 101 through a threaded structure, and an operator can drive the second push rod 108 to push the first bracket 106 to move along the front-back direction shown in fig. 1.

Specifically, as shown in fig. 1 to 3, the first rail 102 is located on the other side of the first support 106 opposite to the base 101, and the first rail 102 is perpendicular to the second rail 112, so that the probe connected to the first moving member 103 can be driven to move in the front-back direction and the left-right direction as shown in fig. 1 by the first push rod 104 and the second push rod 108.

Specifically, the fine adjustment structure 100 further includes a second elastic member 109, the second elastic member 109 is located between the base 101 and the first support 106, the second elastic member 109 is in a stretching state, when the second push rod 108 pushes the first support 106 to move forward as shown in fig. 1, the pulling force given to the second support by the second spring and the force given to the first support 106 by the second push rod 108 (the second push rod 108 and the base 101 are connected through threads, and the supporting force given to the second push rod 108 by the base 101) are balanced, so that the first support 106 can be fixed in position relative to the base 101.

Specifically, the fine adjustment structure 100 further includes a second moving member 113 and a third push rod 111, the first moving member 103 is provided with a third rail 301, the third rail 301 is perpendicular to the first rail 102, the third rail 301 is also perpendicular to the second rail 112, so that the third rail 301 is arranged along the up-down direction shown in fig. 1, the third push rod 111 is connected with the first moving member 103 through a threaded structure, and the working end of the third push member can abut against the second moving member 113, the structure enables the second moving member 113 to be pushed to move along the third rail 301 by screwing the third push rod 111, so that the probe on the second moving member 113 can be driven to move in a three-axis manner through the first support 106, the first moving member 103 and the second moving member 113.

Specifically, as shown in fig. 1 to 3, the fine adjustment structure 100 further includes a third elastic element 110, one end of the third elastic element 110 is connected to the second moving element 113, the other end of the third elastic element 110 is connected to the second moving element 113, and the third elastic element 110 is in a compressed state, so that a pulling force applied by the third elastic element 110 to the second moving element 113 is balanced with a force applied by the third push rod 111 to the second moving element 113 (the first moving element 103 can apply a supporting force to the third push rod 111), so that the position of the second moving element 113 on the third track 301 can be fixed.

The embodiment of the utility model also discloses a probe micromatic setting, including probe 402 and the fine setting structure 100 in any one of the above-mentioned embodiments, probe 402 is connected on second moving member 113.

Since the fine adjustment structure 100 can save the position in the left-right direction as shown in fig. 1, even if the probe 402 fine adjustment structure 100 encounters a situation with a small directional position as shown in fig. 1 during use, the probe 402 can move perpendicular to the moving direction of the first push rod 104 through the first push rod 104 (i.e. the probe 402 can move in the left-right direction as shown in fig. 1).

The embodiment of the utility model also discloses a fine setting subassembly, as shown in fig. 4 and 5, the fine setting subassembly includes base 401 and the fine setting structure 100 in a plurality of above-mentioned arbitrary embodiments, fine setting structure 100 connects gradually on base 401, in this embodiment, when fine setting structure 100 connects gradually along the left and right sides direction as shown in fig. 1, because first push rod 104 sets up along the fore-and-aft direction as shown in fig. 1, this makes when base 401 is fixed as the length of the left and right sides direction as shown in fig. 1, because first push rod 104 transversely sets up (sets up along the fore-and-aft direction as shown in fig. 1), can set up more fine setting structure 100 on base 401.

Specifically, as shown in fig. 4 and 5, an opening 403 is formed on the base 401, and all the fine adjustment structures 100 can be disposed around the opening 403, and as shown in fig. 4, since the first push rod 104 is disposed transversely, the arrangement of the fine adjustment structures 100 can save the displacement of the opening 403 in the circumferential direction, so that when the circumference of the opening 403 is fixed, more fine adjustment structures 100 can be disposed thereon.

Specifically, the fine tuning assembly further includes a plurality of probes 402, each of the second moving members 113 of the fine tuning structure 100 is connected to one of the probes 402, the fine tuning structure 100 is located on one side of the opening 403 of the base 401, and the probes 402 can extend into the opening 403 and extend toward the other side of the base 401 to detect the chip located on the other side of the base 401 relative to the fine tuning structure 100.

The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present invention within the knowledge of those skilled in the art. Furthermore, the embodiments of the present invention and features of the embodiments may be combined with each other without conflict.

Claims

1. Fine setting structure, its characterized in that includes:

the base is connected with a first rail;

the first push rod can move relative to the base, the rotating piece can rotate relative to the base, the rotating piece is provided with a first surface and a second surface which are perpendicular to each other, the first surface is used for abutting against the first push rod, and the second surface is used for abutting against the first moving piece.

2. The fine tuning structure of claim 1, wherein the second face is provided with a protrusion.

3. The fine adjustment structure of claim 1, further comprising a first elastic member, one end of the first elastic member is used for abutting against the rotating member, the other end of the elastic member is used for abutting against the base, and the first elastic member is in a compressed state.

4. The fine adjustment structure of claim 3, further comprising a connecting member, one end of the connecting member is connected to the first moving member, the other end of the connecting member is used for supporting the rotating member, and a width of the connecting member along the extending direction of the first track is smaller than a width of the first moving member along the extending direction of the first track.

5. The fine adjustment structure of claim 1, further comprising a first support and a second push rod, wherein the base is provided with a second track perpendicular to the first track, the first track is located on the other side of the first support opposite to the base, and the second push rod can push the first support to move along the second track.

6. The fine adjustment structure of claim 5, further comprising a second moving member, the first moving member further comprising a third track thereon, the third track being perpendicular to both the first track and the second track, the second moving member being movable along the third track, the second moving member being adapted to connect to a probe.

7. A probe fine adjustment device, characterized by comprising a probe and the fine adjustment structure of any one of claims 1 to 6, the probe being connectable with the first moving member.

8. A fine adjustment assembly, comprising a base and a plurality of fine adjustment structures as claimed in any one of claims 1 to 6, all of which are connected in series and disposed on the base.

9. The trim assembly of claim 8, wherein the base defines an opening, and wherein all of the trim structure is disposed about the opening.

10. The trim assembly of claim 9, further comprising a plurality of probes, one probe being attached to each of said first moving members of each of said trim structures, said probes being capable of passing through said openings.