CN214585855U

CN214585855U - MPO-FA chip quality detector

Info

Publication number: CN214585855U
Application number: CN202120307573.4U
Authority: CN
Inventors: 杨明; 何伟炜; 高红强; 肖潇
Original assignee: Ningbo Xinsulian Photoelectric Technology Co ltd
Current assignee: Ningbo Xinsulian Photoelectric Technology Co ltd
Priority date: 2021-02-03
Filing date: 2021-02-03
Publication date: 2021-11-02
Anticipated expiration: 2031-02-03

Abstract

The utility model belongs to the technical field of chip quality detectors, in particular to an MPO-FA chip quality detector, which comprises a machine base and a telescopic cylinder, the bottom end of the machine base is connected with an anti-skid rubber pad, the top end of the machine base is connected with an object placing disc, and the interior of the object placing plate is provided with an object placing groove, the interior of the machine base is provided with a first sliding groove, and a first slide block is arranged in the first sliding chute, the telescopic cylinder is fixed at the top end of the machine base, the top end of the telescopic cylinder is connected with a connecting frame, a second sliding block is arranged inside the second sliding chute, the bottom end of the second sliding block is connected with a connecting block, a third sliding block is arranged inside the third sliding chute, and the bottom of third slider is connected with the instrument shell, the surface of instrument shell is provided with the instrument button, and the bottom of machine instrument is provided with detects the head. The MPO-FA chip quality detector can move up and down and back and forth as required, and the fixed rod can fix articles.

Description

MPO-FA chip quality detector

Technical Field

The utility model relates to a chip quality detector specifically is a MPO-FA chip quality detector.

Background

The chip quality detector is the auxiliary assembly that is used for the product to detect, and the chip of most electronic product is the batch production of mill in daily life, but has the unqualified chip of quality to be good in order, therefore the chip detects and need utilize the chip quality detector, and now along with the continuous development of science and technology, the function of chip quality detector is more and more comprehensive, and current chip quality detector has following problem however:

1. when the chip quality detector is used, the detection device cannot move to detect, so that the up-down and front-back positions of the detector cannot be adjusted according to different models and styles of products, and the limitation of the device is increased;

2. when the chip quality detector is used, the chip quality detector is too heavy and is not easy to carry, and the chip quality detector is not easy to disassemble and maintain when being damaged, so that the operation difficulty is increased.

In order to solve the above problems, innovative design based on the original chip quality detector is urgently needed.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a MPO-FA chip quality detector to propose current chip quality detector when using in solving above-mentioned background art, because detection device can not remove and detect, make it can not adjust the position around the upper and lower of detector according to the model style of product difference, increased the limitation of device, because too heavy difficult carrying, difficult dismantlement maintenance when the detector damages has increased the condition of the operation degree of difficulty.

In order to achieve the above object, the utility model provides a following technical scheme: an MPO-FA chip quality detector comprises a machine base and a telescopic cylinder, wherein the bottom end of the machine base is connected with an anti-skid rubber pad, the top end of the machine base is connected with a storage disc, a storage groove is formed in the storage disc, a first sliding groove is formed in the machine base, a first sliding block is arranged in the first sliding groove, the telescopic cylinder is fixed at the top end of the machine base, the top end of the telescopic cylinder is connected with a connecting frame, a second sliding groove is formed in the connecting frame, a second sliding block is arranged in the second sliding groove, a connecting block is connected to the bottom end of the second sliding block, a third sliding groove is formed in the connecting block, a third sliding block is arranged in the third sliding groove, the bottom end of the third sliding block is connected with an instrument shell, a display screen is arranged on the surface of the instrument shell, and an instrument button is arranged on the surface of the instrument shell, and the bottom of the instrument shell is provided with a detection head.

Preferably, the antiskid rubber pad is coaxially connected with the machine base, the antiskid rubber pad and the bottom surface of the machine base are arranged on the same horizontal plane, and the object placing disc and the top surface of the machine base are arranged on the same horizontal plane.

Preferably, put for coaxial coupling between thing dish and the machine base, and put the thing groove and put for coaxial coupling between the thing dish to put the thing groove and put the same straight line setting of department between the thing dish.

Preferably, be sliding connection between first slider and the machine base, and constitute the slidable mounting structure through first draw-in groove between first slider and the machine base to adopt mutually perpendicular to set up between telescopic cylinder and the machine base.

Preferably, the connecting frame and the telescopic cylinder are arranged in a mutually perpendicular mode, the second sliding block is in sliding connection with the connecting frame, and the second sliding block and the connecting frame form a sliding installation structure through the second sliding groove.

Preferably, the outer diameter of the third sliding block is the same as the inner diameter of the third sliding groove, the third sliding block is in sliding connection with the connecting block, and the sliding installation structure is formed between the third sliding block and the connecting block through the third sliding groove.

Compared with the prior art, the beneficial effects of the utility model are that: when the MPO-FA chip quality detector is used, the detection device can move for detection, so that the upper, lower, front and rear positions of the detector can be adjusted according to different models and styles of products, the limitation of the device is reduced, the portable detector is convenient to disassemble and carry, is easy to disassemble and maintain when damaged, and is convenient and quick to take out and carry when going out, and the practicability of the device is improved;

1. when the chip quality detector is used, the telescopic cylinder is started to adjust the height of the connecting frame, the height of the detection head is adjusted through the connecting frame, and then the front and back positions of the detection head in the instrument shell are adjusted by controlling the second sliding block in the second sliding groove 9 to detect a chip, so that the upper, lower, front and back positions of the detector can be adjusted according to different models and styles of products, and the limitation of the device is reduced;

2. when this chip quality detector uses, through the first slider among the first spout of slip with machine base and telescopic cylinder split, later need can take out the detector through the third slider among the third spout of slip when going out and carry convenient to use swift of going out, because easy dismounting carries quick detachable maintenance when the detector damages, need go out to take out to carry convenient to use swift of going out, increased the practicality of device.

Drawings

FIG. 1 is a schematic view of the overall front cross-sectional structure of the present invention;

FIG. 2 is a schematic view of the overall side view cross-section structure of the present invention;

fig. 3 is an enlarged schematic view of a portion a in fig. 1 according to the present invention.

In the figure: 1. a machine base; 2. an anti-skid rubber pad; 3. placing a tray; 4. a storage groove; 5. a first chute; 6. a first slider; 7. a telescopic cylinder; 8. a connecting frame; 9. a second chute; 10. a second slider; 11. connecting blocks; 12. a third chute; 13. a third slider; 14. an instrument housing; 15. a display screen; 16. an instrument button; 17. and a detection head.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-3, the present invention provides a technical solution: an MPO-FA chip quality detector comprises a machine base 1, an anti-skid rubber pad 2, a storage tray 3, a storage groove 4, a first sliding groove 5, a first sliding block 6, a telescopic cylinder 7, a connecting frame 8, a second sliding groove 9, a second sliding block 10, a connecting block 11, a third sliding groove 12, a third sliding block 13, an instrument shell 14, a display screen 15, an instrument button 16 and a detection head 17, wherein the anti-skid rubber pad 2 is connected to the bottom end of the machine base 1, the storage tray 3 is connected to the top end of the machine base 1, the storage groove 4 is arranged inside the storage tray 3, the first sliding groove 5 is arranged inside the machine base 1, the first sliding block 6 is arranged inside the first sliding groove 5, the telescopic cylinder 7 is fixed to the top end of the machine base 1, the connecting frame 8 is connected to the top end of the telescopic cylinder 7, the second sliding groove 9 is arranged inside the connecting frame 8, the second sliding block 10 is arranged inside the second sliding groove 9, the bottom end of the second slider 10 is connected with a connecting block 11, a third sliding groove 12 is arranged inside the connecting block 11, a third slider 13 is arranged inside the third sliding groove 12, the bottom end of the third slider 13 is connected with an instrument shell 14, a display screen 15 is arranged on the surface of the instrument shell 14, an instrument button 16 is arranged on the surface of the instrument shell 14, and a detection head 17 is arranged at the bottom end of the instrument shell 14;

furthermore, the antiskid rubber pad 2 is coaxially connected with the machine base 1, the antiskid rubber pad 2 and the bottom surface of the machine base 1 are arranged on the same horizontal plane, the object placing disc 3 and the top surface of the machine base 1 are arranged on the same horizontal plane, the whole machine is stably placed on a plane through the antiskid rubber pad 2, and the machine base 1 is not easy to slip and damage;

further, the object placing tray 3 is coaxially connected with the machine base 1, the object placing groove 4 is coaxially connected with the object placing tray 3, the object placing groove 4 and the object placing tray 3 are arranged in the same straight line, and then the chip is placed in the object placing groove 4 in the object placing tray 3 to prevent the chip from sliding down and being damaged;

furthermore, the first sliding block 6 is in sliding connection with the machine base 1, the first sliding block 6 and the machine base 1 form a sliding installation structure through the first sliding groove 5, the telescopic cylinder 7 and the machine base 1 are arranged vertically, and when the MPO-FA chip quality detector needs to be maintained, the machine base 1 and the telescopic cylinder 7 can be detached by sliding the first sliding block 6 in the first sliding groove 5;

furthermore, the connecting frame 8 and the telescopic cylinder 7 are arranged vertically, the second slider 10 is connected with the connecting frame 8 in a sliding manner, the second slider 10 and the connecting frame 8 form a sliding installation structure through a second sliding chute 9, the telescopic cylinder 7 is started to adjust the height of the connecting frame 8, the connecting frame 8 is used for adjusting the height of the detection head 17, and then the front and back positions of the detection head 17 in the instrument shell 14 are adjusted by controlling the second slider 10 in the second sliding chute 9 to detect the chip;

further, the outer diameter of the third slider 13 is the same as the inner diameter of the third sliding groove 12, the third slider 13 is connected with the connecting block 11 in a sliding manner, the third slider 13 and the connecting block 11 form a sliding installation structure through the third sliding groove 12, and the detector is taken out and carried out through the third slider 13 in the third sliding groove 12 in the sliding connecting block 11, so that the use is convenient and fast.

The working principle is as follows: when the MPO-FA chip quality detector is used, as shown in figures 1-3, firstly, the whole machine is stably placed on a plane through the anti-skid rubber pad 2, so that the machine base 1 is not easy to slip and damage, then the chip is placed in the storage groove 4 in the storage disc 3 to prevent the chip from slipping and damaging, then the telescopic air cylinder 7 is started to adjust the height of the connecting frame 8, the height of the detection head 17 is adjusted through the connecting frame 8, then the front and back positions of the detection head 17 in the instrument shell 14 are adjusted through controlling the second sliding block 10 in the second sliding groove 9 to detect the chip, then the instrument button 16 in the instrument shell 14 controls the switch and data when the chip is detected, then the data detected through the detection head 17 in the instrument shell 14 is reflected to the display screen 15 in the instrument shell 14, and when the MPO-FA chip quality detector needs to be maintained, the machine base 1 and the telescopic sliding block 6 in the first sliding groove 5 can be slid to control the switch and the data when the MPO-FA chip quality detector is maintained The cylinder 7 is disassembled, and then the detector can be taken out through the third sliding block 13 in the third sliding groove 12 in the sliding connecting block 11 when the detector needs to go out, so that the detector is convenient and quick to carry and use.

It should be finally noted that the above only serves to illustrate the technical solution of the present invention, and not to limit the scope of the present invention, and that simple modifications or equivalent replacements performed by those skilled in the art to the technical solution of the present invention do not depart from the spirit and scope of the technical solution of the present invention.

Claims

1. The utility model provides a MPO-FA chip quality detector, includes machine base (1) and telescopic cylinder (7), its characterized in that: the bottom end of the machine base (1) is connected with an anti-skidding rubber pad (2), the top end of the machine base (1) is connected with a storage disc (3), a storage groove (4) is formed in the storage disc (3), a first sliding groove (5) is formed in the machine base (1), a first sliding block (6) is arranged in the first sliding groove (5), a telescopic cylinder (7) is fixed at the top end of the machine base (1), the top end of the telescopic cylinder (7) is connected with a connecting frame (8), a second sliding groove (9) is formed in the connecting frame (8), a second sliding block (10) is arranged in the second sliding groove (9), the bottom end of the second sliding block (10) is connected with a connecting block (11), a third sliding groove (12) is formed in the connecting block (11), a third sliding block (13) is arranged in the third sliding groove (12), and the bottom of third slider (13) is connected with instrument shell (14) to the surface of instrument shell (14) is provided with display screen (15), the surface of instrument shell (14) is provided with instrument button (16), and the bottom of instrument shell (14) is provided with detects head (17).

2. The MPO-FA chip quality detector of claim 1, wherein: the antiskid rubber pad (2) is coaxially connected with the machine base (1), the antiskid rubber pad (2) and the bottom surface of the machine base (1) are arranged on the same horizontal plane, and the object placing disc (3) and the top surface of the machine base (1) are arranged on the same horizontal plane.

3. The MPO-FA chip quality detector of claim 1, wherein: put for coaxial coupling between thing dish (3) and machine base (1), and put thing groove (4) and put for coaxial coupling between thing dish (3) to put thing groove (4) and put and locate the same straight line setting between thing dish (3).

4. The MPO-FA chip quality detector of claim 1, wherein: be sliding connection between first slider (6) and machine base (1), and constitute the slidable mounting structure through first spout (5) between first slider (6) and machine base (1) to adopt mutually perpendicular to set up between telescopic cylinder (7) and machine base (1).

5. The MPO-FA chip quality detector of claim 1, wherein: adopt mutually perpendicular to set up between link (8) and telescopic cylinder (7), and be sliding connection between second slider (10) and link (8) to constitute the slidable mounting structure through second spout (9) between second slider (10) and link (8).

6. The MPO-FA chip quality detector of claim 1, wherein: the outer diameter of the third sliding block (13) is the same as the inner diameter of the third sliding groove (12), the third sliding block (13) is in sliding connection with the connecting block (11), and the third sliding block (13) and the connecting block (11) form a sliding installation structure through the third sliding groove (12).