CN214539879U - Electric element test smelting tool - Google Patents

Electric element test smelting tool Download PDF

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Publication number
CN214539879U
CN214539879U CN202120668246.1U CN202120668246U CN214539879U CN 214539879 U CN214539879 U CN 214539879U CN 202120668246 U CN202120668246 U CN 202120668246U CN 214539879 U CN214539879 U CN 214539879U
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CN
China
Prior art keywords
triode
sliding plate
block
fixedly connected
top surface
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Expired - Fee Related
Application number
CN202120668246.1U
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Chinese (zh)
Inventor
任晓梦
王淑彦
杨乐
张雅博
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Zhengzhou Business University
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Zhengzhou Business University
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Priority to CN202120668246.1U priority Critical patent/CN214539879U/en
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Publication of CN214539879U publication Critical patent/CN214539879U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model relates to an electric elements test fixture technical field, concretely relates to electric elements test fixture, include awry 21274, the shape bottom plate, the rectangle breach has been seted up to the one end of awry bottom plate top surface, the inside wall fixedly connected with clamping mechanism of rectangle breach, three spacing spout has been seted up to the equidistant middle part of awry bottom plate top surface, the inside wall sliding connection of spacing spout has buffer gear, the inside wall fixedly connected with connecting block of awry bottom plate one end is convenient for spacing fixed the triode that detects through clamping mechanism. The utility model discloses in, through tip and the triode contact that rotates the turning block messenger threaded rod, the threaded rod rotates and makes the V-arrangement fixed block remove to the direction of turning block, and the top of V-arrangement fixed block is along connecting axle anticlockwise rotation, presses the fixed triode down according to the briquetting on the V-arrangement fixed block, and the tip of threaded rod is fixed with the triode with according to the briquetting cooperation, prevents triode shift position, improves the accuracy of testing result.

Description

Electric element test smelting tool
Technical Field
The utility model relates to an electric elements tests smelting tool technical field, concretely relates to electric elements tests smelting tool.
Background
The tool is a large-scale tool of carpenter, ironman, and some other handicraft, mainly as a tool to assist the control position or action (or both), the common electric element has triode, diode, electric capacity and resistance, etc., the triode is a semiconductor device to control the electric current, have the function of amplifying the weak signal into the electric signal with larger amplitude value, generally need to use the digital multimeter when judging the quality of the triode and confirming the pin arrangement of the triode, in the course of detecting the triode with the digital multimeter, the detector puts the triode on the operation desk, paste the pin on the pointer probe and triode on the digital multimeter and read the numerical value to judge the quality of the triode and confirm the emitter (e), base (b) and collector (c) of the triode;
the in-process of digital multimeter's two pointer probes contact triode pin that awaits measuring, pointer probe's contact is subject to operator's use level, some surveyors exert oneself great can pointer probe damage the pin of triode, lead to the test result to have undulantly, need use the e of pen record triode in the test process, b, c, but the difficult record of pointer probe is held in the staff's hand, and triode itself is lighter, directly place and detect on the operation panel, the triode is changeed the position easily on the operation panel, influence the accuracy of testing result.
SUMMERY OF THE UTILITY MODEL
In order to overcome the technical problems, the utility model aims to provide an electrical component testing jig, through fixedly connecting with ring one in the circular vestibule inside of stopper, the top surface fixedly connected with buffer spring of ring one, buffer spring's top fixedly connected with ring two, slow down direct contact with the pin of triode from ring two through ring one of digital multimeter's pointer probe, prevent that the inspector from using the pointer probe to exert a great force and damaging the triode pin, the triode is protected, through inserting the pointer probe of digital multimeter into the circular toggle slot on sliding plate one, sliding plate two and sliding plate three, be convenient for shift out sliding plate one, sliding plate two and sliding plate three from different positions on the connecting block, and the top surface of sliding plate one, sliding plate two and sliding plate three all is provided with the pin sign, be convenient for fast record the name of the different pins of triode in the process of detection, the efficiency of the work of record test result work is favorable to improving, make the one end of threaded rod gradually contact with the triode through rotating the turning block, because the lateral wall of threaded rod closes with the inside of V-arrangement fixed block soon and is connected, the threaded rod rotates and makes the V-arrangement fixed block move to the direction of turning block, the top of V-arrangement fixed block rotates along the connecting axle anticlockwise at this moment, make the fixed triode of pressing down of pressing the briquetting on the V-arrangement fixed block, the tip of threaded rod with press the briquetting cooperation to fix the triode, place triode shift position, improve the accuracy of testing result.
The purpose of the utility model can be realized by the following technical scheme:
the utility model provides an electrical element test fixture, includes the shape bottom plate of \21274, the rectangle breach has been seted up to the one end of shape bottom plate top surface of \\21274, the inside wall fixedly connected with clamping mechanism of rectangle breach, three spacing spout has been seted up to the equidistant middle part of shape bottom plate top surface of \ 21274, the inside wall sliding connection of spacing spout has buffer gear, the inside wall fixedly connected with connecting block of shape bottom plate one end is convenient for spacing fixed triode that waits to detect through clamping mechanism, is convenient for slow down the pin direct contact of pointer probe and triode through buffer gear, has protected the triode.
Further, the method comprises the following steps: clamping mechanism includes the V-arrangement fixed block, the corner embedding of V-arrangement fixed block is fixed with the connecting axle, the both ends of connecting axle are rotated with the inside wall of rectangle breach and are connected, the bottom of V-arrangement fixed block closes soon and is connected with the threaded rod, the threaded rod deviates from the one end fixedly connected with turning block of V-arrangement fixed block, makes the one end of threaded rod contact with the triode gradually through rotating the turning block, because the lateral wall of threaded rod closes soon with the inside of V-arrangement fixed block and is connected, the threaded rod rotates and makes the V-arrangement fixed block remove to the direction of turning block, and the top of V-arrangement fixed block is along connecting axle anticlockwise rotation this moment, makes the fixed triode of pressing down of pressing the briquetting on the V-arrangement fixed block, and the tip of threaded rod is fixed with the triode with pressing the cooperation of briquetting, prevents triode shift position, improves the accuracy of testing result.
Further, the method comprises the following steps: the bottom of one end, away from the threaded rod, of the V-shaped fixing block is fixedly connected with a pressing block, the outer side wall of the pressing block is fixedly sleeved with a rubber sleeve, the pressing block is semi-cylindrical in shape, the triode can be further conveniently fixed by the pressing block, and the rubber sleeve plays a role in protecting the triode;
further, the method comprises the following steps: the buffer mechanism comprises a limiting block, the middle part of the limiting block is provided with a limiting round hole, the top surface of the limiting block is provided with a round hole cavity, the bottom end of the circular hole cavity is communicated with the middle part of the limiting round hole, the inner side wall of the bottom end of the circular hole cavity is fixedly connected with a first circular ring, the top surface of the first circular ring is fixedly connected with a buffer spring, the top end of the buffer spring is fixedly connected with a second circular ring, the outer side wall of the second circular ring is in sliding connection with the inner side wall of the circular hole cavity, through the circular vestibule the inside fixedly connected with ring one at the stopper, the top surface fixedly connected with buffer spring of ring one, buffer spring's top fixedly connected with ring two slows down digital multimeter's pointer probe and directly passes through the pin contact of ring one with the triode from ring two, prevents that measurement personnel from using the pointer probe to exert oneself great damage triode pin, has protected the triode.
Further, the method comprises the following steps: the bottom surface fixedly connected with lug of stopper, the lateral wall of lug and the inside wall sliding connection who corresponds the spacing spout in position, the clamping mechanism of being convenient for is at the in-process of fixed triode position, and the stopper moves together with the pin of triode.
Further, the method comprises the following steps: the two ends and the middle part of the connecting block are respectively provided with three symmetrically distributed rectangular sliding grooves, the inner side walls of the adjacent three rectangular sliding grooves are respectively connected with a first sliding plate, a second sliding plate and a third sliding plate in a sliding and clamping mode, the first sliding plate, the second sliding plate and the third sliding plate can be conveniently moved out from different positions on the connecting block through inserting pointer probes of a digital multimeter into circular toggle grooves in the first sliding plate, the second sliding plate and the third sliding plate, pin marks are arranged on the top surfaces of the first sliding plate, the second sliding plate and the third sliding plate, the names of different pins of the triode can be conveniently and rapidly recorded in the detection process, and the work efficiency of recording the test result is improved.
Further, the method comprises the following steps: the first sliding plate, the second sliding plate and the third sliding plate are provided with circular poking grooves at the ends departing from the connecting block, and the first sliding plate, the second sliding plate or the third sliding plate can be conveniently moved out of the connecting block through the circular poking grooves.
Further, the method comprises the following steps: the length of the second sliding plate is greater than that of the first sliding plate, and the length of the third sliding plate is greater than that of the second sliding plate, so that the first sliding plate, the second sliding plate and the third sliding plate in the adjacent limiting sliding grooves can be smoothly moved out of the connecting block.
Further, the method comprises the following steps: the top surface of the first sliding plate is provided with a triode emitter mark, the top surface of the second sliding plate is provided with a triode base mark, and the top surface of the third sliding plate is provided with a triode collector mark, so that pins of a triode in the test process can be conveniently recorded through the marks.
The utility model has the advantages that:
1. the first ring is fixedly connected in the circular hole cavity of the limiting block, the buffer spring is fixedly connected to the top surface of the first ring, and the second ring is fixedly connected to the top end of the buffer spring, so that the direct contact of a pointer probe of the digital multimeter with a pin of the triode through the first ring from the second ring is slowed down, a tester is prevented from damaging the pin of the triode with great force by using the pointer probe, and the triode is protected;
2. the pointer probe of the digital multimeter is inserted into the circular poking grooves on the first sliding plate, the second sliding plate and the third sliding plate, so that the first sliding plate, the second sliding plate and the third sliding plate can be conveniently moved out from different positions on the connecting block, and pin marks are arranged on the top surfaces of the first sliding plate, the second sliding plate and the third sliding plate, so that the names of different pins of the triode can be conveniently and rapidly recorded in the detection process, and the working efficiency of recording the test result is improved;
3. make the one end of threaded rod gradually contact with the triode through rotating the turning block, because the lateral wall of threaded rod closes with the inside of V-arrangement fixed block soon and is connected, the threaded rod rotates and makes the V-arrangement fixed block remove to the direction of turning block, and the top of V-arrangement fixed block is along connecting axle anticlockwise rotation this moment, makes the fixed triode of pressing down of pressing the briquetting on the V-arrangement fixed block, and the tip of threaded rod is fixed with the triode with pressing the briquetting cooperation, places triode shift position, improves the accuracy of testing result.
Drawings
The present invention will be further described with reference to the accompanying drawings.
Fig. 1-2 are schematic views of the overall structure of the present invention;
FIG. 3 is a schematic view of a middle (21274) and a middle (middle) shaped bottom plate of the present invention;
FIG. 4 is a schematic structural view of a clamping mechanism of the present invention;
FIG. 5 is a schematic structural view of the middle buffer mechanism of the present invention;
fig. 6 is an exploded view of the middle connecting block of the present invention.
In the figure: 100. \ 21274;' shape bottom board; 110. a rectangular notch; 120. a limiting chute; 200. a clamping mechanism; 210. a V-shaped fixed block; 220. a connecting shaft; 230. a threaded rod; 240. rotating the block; 300. a buffer mechanism; 310. a limiting block; 311. limiting round holes; 320. a first circular ring; 330. a buffer spring; 340. a second circular ring; 400. connecting blocks; 410. a rectangular chute; 420. a first sliding plate; 430. a second sliding plate; 440. a third sliding plate; 500. and a triode.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely below with reference to the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art without creative efforts belong to the protection scope of the present invention.
Referring to fig. 1-6, an electrical component testing jig includes a v-21274, a rectangular notch 110 is formed at one end of the top surface of the v-21274100, a clamping mechanism 200 is fixedly connected to the inner side wall of the rectangular notch 110, three limiting sliding grooves 120 are formed in the middle of the top surface of the v-21274, the middle of the top surface of the v-21274100 is equidistantly spaced, a buffer mechanism 300 is slidably connected to the inner side wall of the limiting sliding grooves 120, a connecting block 400 is fixedly connected to the inner side wall of one end of the v-21274100, a transistor 500 to be tested is conveniently limited and fixed by the clamping mechanism 200, a pointer probe is conveniently slowed down by the buffer mechanism 300 to be directly contacted with a pin of the transistor 500, and the transistor 500 is protected.
The clamping mechanism 200 comprises a V-shaped fixed block 210, a connecting shaft 220 is embedded and fixed at the corner of the V-shaped fixed block 210, two ends of the connecting shaft 220 are rotatably connected with the inner side wall of the rectangular notch 110, the bottom of the V-shaped fixed block 210 is rotatably connected with a threaded rod 230, one end of the threaded rod 230, which is far away from the V-shaped fixed block 210, is fixedly connected with a rotating block 240, one end of the threaded rod 230 is gradually contacted with the triode 500 by rotating the rotating block 240, because the outer side wall of the threaded rod 230 is rotatably connected with the inside of the V-shaped fixed block 210, the threaded rod 230 rotates to enable the V-shaped fixed block 210 to move towards the rotating block 240, at the moment, the top of the V-shaped fixed block 210 rotates anticlockwise along the connecting shaft 220, a pressing block on the V-shaped fixed block 210 presses down to fix the triode 500, the end part of the threaded rod 230 is matched with the pressing block to fix the triode 500, and prevent the triode 500 from moving, the accuracy of the detection result is improved.
The bottom of one end, away from the threaded rod 230, of the V-shaped fixing block 210 is fixedly connected with a pressing block, the outer side wall of the pressing block is fixedly sleeved with a rubber sleeve, the pressing block is semi-cylindrical in shape, the triode 500 is conveniently further fixed by the pressing block, and the rubber sleeve plays a role in protecting the triode 500; the buffer mechanism 300 comprises a limit block 310, a limit round hole 311 is formed in the middle of the limit block 310, a circular hole cavity is formed in the top surface of the limit block 310, the bottom end of the circular hole cavity is communicated with the middle of the limit round hole 311, a first ring 320 is fixedly connected to the inner side wall of the bottom end of the circular hole cavity, a buffer spring 330 is fixedly connected to the top surface of the first ring 320, a second ring 340 is fixedly connected to the top end of the buffer spring 330, the outer side wall of the second ring 340 is slidably connected with the inner side wall of the circular hole cavity, the first ring 320 is fixedly connected to the inside of the circular hole of the limit block 310, the buffer spring 330 is fixedly connected to the top surface of the first ring 320, the second ring 340 is fixedly connected to the top end of the buffer spring 330, the pointer probe of the digital multimeter is slowed down to directly contact with the pin of the triode 500 from the second ring 340 through the first ring 320, and the pointer probe is prevented from greatly damaging the pin of the triode 500 by the force, the transistor 500 is protected.
The bottom surface of the limiting block 310 is fixedly connected with a convex block, the outer side wall of the convex block is in sliding connection with the inner side wall of the limiting chute 120 at the corresponding position, so that the limiting block 310 and the pins of the triode 500 move together in the process of fixing the position of the triode 500 by the clamping mechanism 200; the two ends and the middle part of the connecting block 400 are respectively provided with three symmetrically distributed rectangular sliding grooves 410, the inner side walls of the adjacent three rectangular sliding grooves 410 are respectively connected with a first sliding plate 420, a second sliding plate 430 and a third sliding plate 440 in a sliding and clamping manner, the first sliding plate 420, the second sliding plate 430 and the third sliding plate 440 can be conveniently moved out from different positions on the connecting block 400 by inserting pointer probes of a digital multimeter into circular toggle grooves on the first sliding plate 420, the second sliding plate 430 and the third sliding plate 440, pin marks are arranged on the top surfaces of the first sliding plate 420, the second sliding plate 430 and the third sliding plate 440, the names of different pins of the triode 500 can be conveniently and rapidly recorded in the detection process, and the work efficiency of recording test results can be improved.
One ends of the first sliding plate 420, the second sliding plate 430 and the third sliding plate 440, which are far away from the connecting block 400, are provided with circular poking grooves, so that the first sliding plate 420, the second sliding plate 430 or the third sliding plate 440 can be conveniently moved out of the connecting block 400 through the circular poking grooves; the length of the sliding plate II 430 is greater than that of the sliding plate I420, and the length of the sliding plate III 440 is greater than that of the sliding plate II 430, so that the sliding plate I420, the sliding plate II 430 and the sliding plate III 440 in the adjacent rectangular sliding grooves 410 can be smoothly removed from the connecting block 400; the top surface of the first sliding plate 420 is provided with a triode emitter mark, the top surface of the second sliding plate 430 is provided with a triode base mark, and the top surface of the third sliding plate 440 is provided with a triode collector mark, so that pins of the triode 500 in the test process can be conveniently recorded through the marks.
The working principle is as follows: when the triode 500 is used, three pins of the triode 500 are respectively inserted into the limiting round holes 311 on the limiting blocks 310 at corresponding positions, then the rotating block 240 is rotated, the threaded rod 230 is gradually moved to one side of the triode 500 and is attached to the triode 500, the V-shaped fixing block 210 which is screwed and connected with the threaded rod 230 in the process that the threaded rod 230 rotates to be close to the triode 500 moves to the direction of the rotating block 240, the corner of the V-shaped fixing block 210 rotates anticlockwise along the connecting shaft 220, the pressing block on the V-shaped fixing block 210 is gradually contacted with one side of the top surface of the triode 500, and the triode 500 is fixed on the V-shaped bottom plate 100 through the cooperation of the pressing block and the end part of the threaded rod 230, the triode 500 is fixed on the V-shaped bottom plate 100, and then the pin arrangement of the triode 500 and the quality of the triode 500 are tested by using an external digital multimeter;
during testing, the pointer probe is inserted into the middle of the second ring 340, the pointer probe sequentially penetrates through the buffer spring 330 and the first ring 320 to be in contact with the pins of the triode 500 for testing, at the moment, the buffer spring 330 is in a compressed state, the size of the circular hole in the middle of the second ring 340 only allows the front end of the pointer probe to pass through, the tail end of the pointer probe cannot pass through the second ring 340, the pointer probe is moved out of the limit block 310 and inserted into the circular poking groove in the sliding plate I420, the sliding plate II 430 or the sliding plate III 440 at the corresponding position after testing, the sliding plate I420, the sliding plate II 430 or the sliding plate III 440 with the marked names corresponding to the testing results are moved out of the connecting block 400, and the names of different pins of the triode 500 can be rapidly recorded in the testing process.
In the description herein, references to the description of "one embodiment," "an example," "a specific example," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
The foregoing is illustrative and explanatory only, and various modifications, additions and substitutions as described for the specific embodiments described herein may be made by those skilled in the art without departing from the scope of the invention or exceeding the scope of the invention as defined in the claims.

Claims (9)

1. The utility model provides an electrical element test fixture, includes the shape bottom plate (100), its characterized in that, rectangle breach (110) have been seted up to the one end of shape bottom plate (100) top surface \21274, the inside wall fixedly connected with clamping mechanism (200) of rectangle breach (110), three spacing spout (120) have been seted up to the equidistant middle part of shape bottom plate (100) top surface \21274, the inside wall sliding connection of spacing spout (120) has buffer gear (300), the inside wall fixedly connected with connecting block (400) of shape bottom plate (100) one end \\21274.
2. The electrical component testing jig according to claim 1, wherein the clamping mechanism (200) comprises a V-shaped fixing block (210), a connecting shaft (220) is embedded and fixed at the corner of the V-shaped fixing block (210), two ends of the connecting shaft (220) are rotatably connected with the inner side wall of the rectangular notch (110), a threaded rod (230) is rotatably connected to the bottom of the V-shaped fixing block (210), and a rotating block (240) is fixedly connected to one end of the threaded rod (230) which deviates from the V-shaped fixing block (210).
3. The electrical component testing jig according to claim 2, wherein a pressing block is fixedly connected to a bottom of the V-shaped fixing block (210) at an end away from the threaded rod (230), a rubber sleeve is fixedly sleeved on an outer side wall of the pressing block, and the pressing block is semi-cylindrical in shape.
4. The electrical component testing jig of claim 1, characterized in that buffer gear (300) includes stopper (310), spacing round hole (311) has been seted up at the middle part of stopper (310), circular vestibule has been seted up to the top surface of stopper (310), the bottom of circular vestibule communicates with each other with the middle part of spacing round hole (311), the inside wall fixedly connected with ring one (320) of circular vestibule bottom, the top surface fixedly connected with buffer spring (330) of ring one (320), the top fixedly connected with ring two (340) of buffer spring (330), the lateral wall of ring two (340) and the inside wall sliding connection of circular vestibule.
5. The electrical component testing tool according to claim 4, wherein a protrusion is fixedly connected to a bottom surface of the limiting block (310), and an outer side wall of the protrusion is slidably connected to an inner side wall of the corresponding position limiting sliding groove (120).
6. The electrical component testing jig according to claim 1, wherein two ends and a middle portion of the connecting block (400) are respectively provided with three symmetrically distributed rectangular sliding grooves (410), and inner side walls of adjacent three rectangular sliding grooves (410) are respectively slidably clamped with a first sliding plate (420), a second sliding plate (430) and a third sliding plate (440).
7. The electrical component testing tool of claim 6, wherein the ends of the first sliding plate (420), the second sliding plate (430) and the third sliding plate (440) facing away from the connecting block (400) are provided with circular toggle slots.
8. The electrical component testing tool of claim 7, wherein the length of the second slide plate (430) is greater than the length of the first slide plate (420), and the length of the third slide plate (440) is greater than the length of the second slide plate (430).
9. The electrical component testing tool of claim 7, wherein the top surface of the first sliding plate (420) is provided with a triode emitter mark, the top surface of the second sliding plate (430) is provided with a triode base mark, and the top surface of the third sliding plate (440) is provided with a triode collector mark.
CN202120668246.1U 2021-04-01 2021-04-01 Electric element test smelting tool Expired - Fee Related CN214539879U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202120668246.1U CN214539879U (en) 2021-04-01 2021-04-01 Electric element test smelting tool

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202120668246.1U CN214539879U (en) 2021-04-01 2021-04-01 Electric element test smelting tool

Publications (1)

Publication Number Publication Date
CN214539879U true CN214539879U (en) 2021-10-29

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Application Number Title Priority Date Filing Date
CN202120668246.1U Expired - Fee Related CN214539879U (en) 2021-04-01 2021-04-01 Electric element test smelting tool

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117471268A (en) * 2023-12-28 2024-01-30 深圳市伟鼎自动化科技有限公司 Semiconductor device testing apparatus and method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117471268A (en) * 2023-12-28 2024-01-30 深圳市伟鼎自动化科技有限公司 Semiconductor device testing apparatus and method
CN117471268B (en) * 2023-12-28 2024-04-05 深圳市伟鼎自动化科技有限公司 Semiconductor device testing apparatus and method

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Granted publication date: 20211029