CN214426674U - Device for measuring the thickness of a ceramic element bar stack - Google Patents
Device for measuring the thickness of a ceramic element bar stack Download PDFInfo
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- CN214426674U CN214426674U CN202120509150.0U CN202120509150U CN214426674U CN 214426674 U CN214426674 U CN 214426674U CN 202120509150 U CN202120509150 U CN 202120509150U CN 214426674 U CN214426674 U CN 214426674U
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- 239000000919 ceramic Substances 0.000 title claims abstract description 21
- 230000005484 gravity Effects 0.000 claims description 11
- 230000000903 blocking effect Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 5
- 238000000034 method Methods 0.000 abstract description 2
- 238000003475 lamination Methods 0.000 description 5
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
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Abstract
本申请涉及陶瓷元件厚度测量领域，公开了一种用于测量陶瓷元件巴块叠层厚度的装置，该装置包括：测量台、高度计、测量杆和固定杆，其特征在于，所述装置还包括可带动测量杆上下运动的杠杆组件，所述杠杆组件包括：套筒，套于所述固定杆下段；杠杆，所述杠杆的支点设于套筒处，通过螺丝与所述套筒外侧活动连接；所述杠杆的阻力臂末端设有开口，通过所述开口与所述测量杆下段活动卡接；挡片，固定设于所述测量杆下段紧邻所述开口的上方之处。通过上述方式，解决现有测量装置受人为因素影响，测值稳定性差，结果精确度差的问题。
The present application relates to the field of thickness measurement of ceramic components, and discloses a device for measuring the thickness of a ceramic component bar stack, the device comprising: a measuring table, an altimeter, a measuring rod and a fixing rod, characterized in that the device further comprises: A lever assembly that can drive the measuring rod to move up and down, the lever assembly includes: a sleeve sleeved on the lower section of the fixed rod; a lever, the fulcrum of the lever is set at the sleeve, and is movably connected to the outside of the sleeve through screws The end of the resistance arm of the lever is provided with an opening, which is movably clamped with the lower section of the measuring rod through the opening; Through the above method, the problems that the existing measuring device is affected by human factors, the stability of the measured value is poor, and the accuracy of the result are poor are solved.
Description
Technical Field
The application relates to the field of ceramic element thickness measurement, in particular to a device for measuring the thickness of a ceramic element bar block lamination.
Background
The thickness of Ceramic elements such as MLCCs (Multi-layer Ceramic Chip Capacitors) is measured after lamination to ensure that the thickness of all the layers is relatively uniform. The lamination thickness measurement needs to be measured by a digital display altimeter, the altimeter is reset firstly when the existing digital display altimeter is used for measurement, then the altimeter is lifted by holding a measuring rod with hands, then the laminated bar block is placed on a measuring table, and finally the measuring rod is released to enable a measuring head to contact the surface of the bar block and then a measured value is read. However, the disadvantage of this measurement method is that the measuring rod is affected by human factors, the stability of the measured value is poor, and the accuracy of the result is poor.
Therefore, there is room for further optimization of the measurement technique.
SUMMERY OF THE UTILITY MODEL
In view of the above problems, the present application provides an apparatus for measuring the thickness of a ceramic element bar stack, which aims to solve the problems of the prior art that the measuring apparatus is affected by human factors, the measured value stability is poor, and the result accuracy is poor.
In order to solve the technical problem, the application adopts a device for measuring the thickness of a ceramic element bar block lamination. The device comprises a measuring table, a height meter, a measuring rod and a fixing rod, and is characterized by further comprising a lever assembly capable of driving the measuring rod to move up and down.
Wherein the lever assembly comprises:
the sleeve is sleeved on the lower section of the fixed rod;
the fulcrum of the lever is arranged at the sleeve and is movably connected with the outer side of the sleeve through a screw;
the tail end of the resistance arm of the lever is provided with an opening, and the opening is movably clamped with the lower section of the measuring rod;
and the blocking piece is fixedly arranged at the position, close to the upper part of the opening, of the lower section of the measuring rod.
And the lower section of the measuring rod above the separation blade is also provided with a gravity ring.
The lever is a straight rod or a curved rod matched with the measuring rod.
The beneficial effect of this application is: in distinction to the prior art, the present application is directed to an apparatus for measuring the thickness of a ceramic element bar stack, the apparatus comprising: the height measuring device comprises a measuring table, a height meter, a measuring rod and a fixed rod, and is characterized in that a lever assembly capable of driving the measuring rod to move up and down is arranged on the fixed rod. By the mode, the problems that the existing measuring device is influenced by human factors, the measured value stability is poor, and the result accuracy is poor are solved
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
FIG. 1 is a block diagram of one embodiment of an apparatus for measuring the thickness of a ceramic element bar stack according to the present disclosure;
fig. 2 is a partially enlarged view of an apparatus for measuring the thickness of a ceramic element bar stack according to the present application.
The reference numbers illustrate:
measuring table 10, measuring rod 20, height gauge 30, fixing rod 40, sleeve 50, lever 60, opening 602, screw 70, baffle 80 and gravity ring 90.
Detailed Description
The technical solutions in the embodiments of the present application will be described clearly and completely with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that all the directional indications such as up, down, left, right, front and rear … … in the embodiment of the present application are only used to explain the relative positional relationship, movement, etc. between the components in a specific posture as shown in the drawings, and if the specific posture is changed, the directional indication is changed accordingly.
In addition, the descriptions referred to as "first", "second", etc. in this application are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicit ly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present application.
The technical scheme provided by the application is to provide a device for measuring the thickness of a ceramic element bar block lamination.
Referring to fig. 1, fig. 1 is a structural diagram of an embodiment of an apparatus for measuring a thickness of a ceramic element bar stack according to the present disclosure.
The device includes measuring table 10, altimeter 30, measuring stick 20 and dead lever 40, the device still includes the lever subassembly that can drive the measuring stick up-and-down motion, through the application of lever subassembly, avoids the human factor to cause the great scheduling problem of measurement deviation.
Referring to fig. 2, fig. 2 is a partially enlarged view of an apparatus for measuring a thickness of a ceramic element bar stack according to the present application.
With reference to fig. 1 and 2, the lever assembly includes:
a sleeve 50, which is sleeved on the lower section of the fixing rod 40;
the fulcrum of the lever 60 is arranged at the sleeve 50 and is movably connected with the outer side of the sleeve 50 through a screw 70;
an opening 602 is arranged at the tail end of the resistance arm of the lever 60, and the opening 602 is movably clamped with the lower section of the measuring rod 20;
further, the lever assembly further includes a stopper 80 fixedly disposed on the lower section of the measuring rod 20 immediately above the opening. The stop 80 allows the lever 60 to be forced to raise the gauge head at the gauge head position of the measuring stick 20.
In some embodiments, a gravity ring 90 is further provided on the lower section of the measuring rod above the baffle, and the gravity ring 90 is fixedly connected to the measuring rod 20. The gravity can be increased to lower the measuring stick 20.
In some embodiments, the gravity ring 90 is movable, has an inner diameter larger than the outer diameter of the measuring rod 20 and smaller than the length of the baffle 80, and is sleeved on the measuring rod 20.
Further, in some embodiments, the lever 60 is a straight rod.
In some embodiments, the lever 60 is a curved rod that mates with the measuring rod 20.
It can be understood that the power arm end of the lever 60 is pressed to drive the measuring rod 20 to move up and down, the measured object is placed on the measuring table 10 when the measuring head of the measuring rod 20 is lifted, the measuring rod 20 falls freely under the action of gravity after the lever 60 is released, and the measured value can be read by the height gauge 30 when the measuring head contacts the surface of the measured object.
The beneficial effect of this application is: be different from prior art, the device for measuring ceramic element ba piece stromatolite thickness of this application through increasing lever assembly for whole device does not receive the human factor influence, has the precision height, efficient advantage. The problems of poor stability and poor result accuracy of a measured value in the prior art can be effectively solved.
In the embodiments provided in this application, it should be understood that the disclosed methods and structures may be implemented in other ways. For example, the above-described structural embodiments are merely illustrative, and actual implementations may have additional divisions, for example, multiple units or structures may be combined or integrated into another system, or some features may be omitted, or not implemented.
The above embodiments are merely examples, and not intended to limit the scope of the present application, and all modifications, equivalents, and other technical fields which are obvious from the present disclosure and which are applicable to the present application are intended to be included in the scope of the present application.
Claims (4)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120509150.0U CN214426674U (en) | 2021-03-10 | 2021-03-10 | Device for measuring the thickness of a ceramic element bar stack |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120509150.0U CN214426674U (en) | 2021-03-10 | 2021-03-10 | Device for measuring the thickness of a ceramic element bar stack |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214426674U true CN214426674U (en) | 2021-10-19 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202120509150.0U Active CN214426674U (en) | 2021-03-10 | 2021-03-10 | Device for measuring the thickness of a ceramic element bar stack |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214426674U (en) |
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2021
- 2021-03-10 CN CN202120509150.0U patent/CN214426674U/en active Active
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Address after: No.1, Chuangye 2nd Road, Shuangdong street, Luoding City, Yunfu City, Guangdong Province 527200 Patentee after: Guangdong Weirong Electronic Technology Co.,Ltd. Country or region after: China Address before: Micro Rong Technology Park, No.1 Chuangye 2nd Road, Shuangdong Street, Luoding City, Yunfu City, Guangdong Province Patentee before: GUANGDONG WEIRONG ELECTRONIC TECHNOLOGY Co.,Ltd. Country or region before: China |