CN214310703U - Matrix type multiport scattering parameter test system - Google Patents
Matrix type multiport scattering parameter test system Download PDFInfo
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- CN214310703U CN214310703U CN202023170348.5U CN202023170348U CN214310703U CN 214310703 U CN214310703 U CN 214310703U CN 202023170348 U CN202023170348 U CN 202023170348U CN 214310703 U CN214310703 U CN 214310703U
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Abstract
The utility model discloses a matrix multiport scattering parameter test system, including network analyzer, radio frequency switch matrix, control system, station tool system, display system, terminal data analysis system and server, control system respectively with the radio frequency switch matrix station tool system display system reaches terminal data analysis system connects, terminal data analysis system with the server is connected, network analyzer's output port with the input port connection of radio frequency switch matrix, the output channel of radio frequency switch matrix with station tool headtotail. The utility model discloses on a network analyzer's basis, just can realize the extension of arbitrary quantity test port, greatly improved network analyzer's availability factor.
Description
Technical Field
The utility model relates to a wireless measurement technical field, specific theory relates to a matrix multiport scattering parameter test system.
Background
In the current internet era, 5G mobile communication is rapidly developing, resulting in a rapid growth of wireless communication products. The network analyzer plays a key role in microwave measurement as an important instrument for scattering parameter testing. Common network analyzers have only two ports or four ports. For a production line for large-scale mass test, a network analyzer with few ports cannot meet the requirement of test tension. Meanwhile, the number of production line test samples is very large, and the conditions of uneven product performance are difficult to avoid due to the factors of non-standardization, environmental change, instrument errors and the like in the test process. In the face of such a phenomenon of inconsistent performance, it is difficult to find the cause by a manual method such as visual inspection, and the workload required for the inspection is very large. Further, from the perspective of a production line manager or a technical developer, measurement data of a product must be recorded in real time, truly reliable and unchangeable, so that a problem occurring in a test process of the product can be caused to be found from a source.
The above disadvantages are worth improving.
Disclosure of Invention
In order to overcome the not enough of current technique, the utility model provides a matrix multiport scattering parameter test system.
The utility model discloses technical scheme as follows:
the utility model provides a matrix multiport scattering parameter test system, its characterized in that, includes network analysis appearance, radio frequency switch matrix, control system, station tool system, display system, terminal data analysis system and server, control system respectively with the radio frequency switch matrix station tool system display system reaches terminal data analysis system connects, terminal data analysis system with the server is connected, network analysis appearance's output port with the input port of radio frequency switch matrix is connected, the output channel of radio frequency switch matrix with station tool headtotail.
According to above-mentioned scheme the utility model discloses, its characterized in that, network analyzer's output port has a plurality of, the number of radio frequency switch matrix's input port with network analyzer's the number of output port is corresponding.
Furthermore, an integrated switch module is arranged in the radio frequency switch matrix, the number of the integrated switch modules corresponds to the number of the input ports of the radio frequency switch matrix, the control end of the integrated switch module is connected with the control system, the input end of the integrated switch module is connected with the input ports of the radio frequency switch matrix, and the output end of the integrated switch module is provided with a plurality of output channels of the radio frequency switch matrix.
Furthermore, the station jig system comprises a plurality of test jigs for placing the object to be tested and a plurality of stations, wherein each station is provided with one test jig, and the test jigs are connected with the output channels of the radio frequency switch matrix.
Furthermore, the output channel of the radio frequency switch matrix extends to the station through the output of the radio frequency cable and is connected with the test fixture to form a test station.
Furthermore, the number of the test fixture and the stations is less than or equal to the number of the output channels of the radio frequency switch matrix.
Furthermore, the display system comprises a plurality of display screens, one display screen is arranged on each station, and the display screens are connected with the control system.
Furthermore, the control system comprises a CPU mainboard, a split screen module, an STM32 module and a USB data acquisition module, wherein the CPU mainboard is respectively connected with the split screen module, the STM32 module and the USB data acquisition module, the split screen module is connected with the display screen, the STM32 module is connected with the test fixture, and the USB data acquisition module is connected with the integrated switch module.
Furthermore, the network analyzer is placed in the center of a production line site, the network analyzer serves as the center, the output channels of the radio frequency switch matrixes independently extend to the periphery, different included angles are formed on the production line site by the output channels of the radio frequency switch matrixes, and the tail ends of the output channels of the radio frequency switch matrixes are connected with the test fixture.
Furthermore, the network analyzer is placed at the center of a production line site, the network analyzer serves as a center, the output channels of the radio frequency switch matrixes are gathered together, the output channels of the radio frequency switch matrixes extend in the same direction, the output channels of the radio frequency switch matrixes respectively extend to different distances and then are separately branched, and the tail end of each branched output channel of the radio frequency switch matrix is connected with the test fixture.
The beneficial effects of the utility model reside in that:
the utility model can realize the expansion of any number of test ports on the basis of one network analyzer, greatly improve the use efficiency of the network analyzer, and simultaneously realize the traceability test data, thereby being convenient for analyzing the test data and finding out the problem source of abnormal products; the utility model relates to a rationally, the practicality is high, has good marketing and using value.
Drawings
Fig. 1 is a structural frame diagram of an embodiment of the present invention;
fig. 2 is a schematic connection diagram of a network analyzer, a radio frequency switch matrix and a station jig system according to an embodiment of the present invention;
fig. 3 is a schematic diagram of the connection between the control system and the display system, the station fixture system and the rf switch matrix according to an embodiment of the present invention.
Detailed Description
In order to make the technical problem, technical solution and advantageous effects to be solved by the present invention more clearly understood, the following description is given in conjunction with the accompanying drawings and embodiments to illustrate the present invention in further detail.
As shown in fig. 1, a matrix type multi-port scattering parameter testing system includes a network analyzer 11, a radio frequency switch matrix 12, a control system 13, a station fixture system 14, a display system 15, a terminal data analysis system 16 and a server 17, where the control system 13 is connected to the radio frequency switch matrix 12, the station fixture system 14, the display system 15 and the terminal data analysis system 16, the terminal data analysis system 16 is connected to the server 17, an output port of the network analyzer 11 is connected to an input port of the radio frequency switch matrix 12, and an output channel of the radio frequency switch matrix 12 is connected to the station fixture system 14.
The terminal data analysis system 16 is used for storing, analyzing and collecting data generated in the measurement process. The server 17 is used to store and process the data generated during the measurement.
In this embodiment, there are a plurality of output ports of the network analyzer 11, the number of input ports of the rf switch matrix 12 corresponds to the number of output ports of the network analyzer 11, and the rf switch matrix 12 can be expanded for any port of the network analyzer 11.
In this embodiment, an integrated switch module 121 is disposed in the radio frequency switch matrix 12, the number of the integrated switch modules 121 corresponds to the number of input ports of the radio frequency switch matrix 12, a control end of the integrated switch module 121 is connected to the control system 13, an input end of the integrated switch module 121 is connected to the input ports of the radio frequency switch matrix 12, an output end of the integrated switch module 121 is provided with a plurality of output channels of the radio frequency switch matrix 12, and the number of the output channels can be set according to the required number of the channels, such as 1 to 8, 2 to 4, and the like.
Each output channel is switched by the integrated switch module 121, the integrated switch module 121 is controlled by the control system 13, and the output channels can be conducted only when activated. Therefore, the measurement signal of the network analyzer 11 is transmitted only on the activated output channel, and the channels that are not activated are in the off state and cannot transmit the signal.
Specifically, a scattering parameter test system in which the two-port network analyzer 11 is expanded into eight ports is taken as an example, as shown in fig. 2. Two output ports of the network analyzer 11 are respectively connected with two input ports of the radio frequency switch matrix 12, two integrated switch modules 121 are disposed in the radio frequency switch matrix 12, and four switchable output channels, which are P1, P2, P3, P4, P5, P6, P7, and P8, are disposed at an output end of each integrated switch module 121. At the same time, at most two channels of P1-P8 can be activated and conducted simultaneously, wherein one channel is from P1-P4, and the other channel is from P5-P8. Therefore, the reflection coefficient or the transmission coefficient of the object to be tested can be tested by using a single port according to actual needs.
In this embodiment, the station fixture system 14 includes a plurality of test fixtures 141 for placing the object to be tested and a plurality of stations, each station places one test fixture 141, and the output channel extends to the station through the rf cable and is connected to the test fixture 141 to form a test station. Because each test fixture 141 extends a channel of the rf switch matrix 12 by means of the rf cable, the number of test fixtures 141 and stations is less than or equal to the number of output channels of the rf switch matrix 12.
The test fixture 141 is a platform for measuring scattering parameters, and the object to be measured is placed on the test fixture 141 and measured according to the test standard flow. Before formal measurement, an object to be tested is arranged on the test fixture 141, information of the object to be tested is simultaneously input, then application starting test is applied to the server 17, and after the server 17 passes the test application, the application information is fed back to the control system 13; the test can be started after the permission is obtained; in the testing process, the port connection condition, impedance matching characteristic, signal transmission power, noise level, and temperature, humidity, electromagnetic interference, etc. of the testing environment of the object to be tested and the testing fixture 141 are recorded by the testing fixture 141. The monitored data and the test data of the object to be tested can be viewed through the display system 15 and simultaneously stored in the server 17 in real time.
In the test process, whether irregular operation exists or not and whether the measurement environment meets the measurement standard or not are recorded and stored. The irregular operation includes human influence, equipment abnormality and the like.
After the test is finished, the terminal data analysis system 16 analyzes and compares the test data, the test conditions monitored in the test process are in accordance with the standard, and the test data are in accordance with the product standard, and the information that the test passes is displayed through the display screen; and for the condition that the test result does not meet the product standard or the test condition does not meet the specification, displaying the information of the test failure through the display screen, and searching and analyzing the stored data for the reason of the test failure.
In this embodiment, the display system 15 includes a plurality of display screens 141, one display screen 141 is disposed on each workstation, the display screen 141 is connected to the control system 13, and the display screen 141 can view the measurement data in real time.
As shown in fig. 3, in this embodiment, the control system 13 includes a CPU board 131, a split screen module 132, an STM32 module 133, and a USB data acquisition module 134, where the CPU board 131 is connected to the split screen module 132, the STM32 module 133, and the USB data acquisition module 134 through a bottom layer protocol, respectively, the split screen module 132 is connected to the display screen 141, the STM32 module 133 is connected to the test fixture 141, and the USB data acquisition module 134 is connected to the integrated switch module 121.
The screen splitting module 132 splits the video output signal of the CPU board 131 into multiple paths, and each path of video signal is connected to one display screen 141.
The STM32 module 133 is used to control the operation of the test fixture 141, and also process the access information, the ambient environment information, etc. collected by the test fixture 141 about the object to be tested, and control the operation of the camera, the temperature and humidity sensor, etc.
The USB data acquisition module 134 is configured to switch the output channel of the integrated switch module 121, and after the USB data acquisition module 134 obtains the protocol command of the CPU board 131, the output channel of the integrated switch module 121 is switched in a manner of outputting a high level and a low level, and then the output channel is extended to each test fixture 141 by the radio frequency cable.
In this embodiment, according to the requirement of the production line test site, the station jig system 14 may be arranged according to the following technique, the network analyzer 11 is placed at the center of the production line site, the output channels of the radio frequency switch matrixes 12 independently extend around, the output channels of each radio frequency switch matrix 12 form different included angles on the production line site, and the end of the output channel of each radio frequency switch matrix 12 is connected to the test jig 141. Or, the network analyzer 11 is placed at the center of the production line site, and with the network analyzer 11 as the center, the output channels of the radio frequency switch matrixes 12 are collected together, and the output channels of the radio frequency switch matrixes 12 extend in the same direction, the output channels of each radio frequency switch matrix 12 extend to different distances and then branch off independently, and the tail end of the output channel of each branched radio frequency switch matrix 12 is connected with the test fixture 141. In addition, the arrangement of the station jig system 14 can be a mixture of the above two ways.
In this embodiment, the terminal data analysis system 16 records, stores and analyzes the test condition of the test fixture 141 at each station; the data collected by the terminal data analysis system 16 come from the measurement information, the information of the object to be measured, the information of the surrounding environment, etc. provided by the station jig system 14. The measurement information includes actual measurement parameters of the object to be measured, input signal power, port impedance matching conditions, cable loss, time delay and the like. The information of the object to be detected comprises the model, the attribute, the weight and the like of the object to be detected; the ambient information includes electromagnetic noise interference, human influence, temperature, humidity, and the like. The terminal data analysis system 16 classifies and stores different types of products; recording and storing the data of the same product; the performance of the same product was compared.
The beneficial effects of the utility model reside in that:
the utility model can realize the expansion of any number of test ports on the basis of one network analyzer, greatly improve the use efficiency of the network analyzer, and simultaneously realize the traceability test data, thereby being convenient for analyzing the test data and finding out the problem source of abnormal products; the utility model relates to a rationally, the practicality is high, has good marketing and using value.
It will be understood that modifications and variations can be made by persons skilled in the art in light of the above teachings and all such modifications and variations are considered to be within the scope of the invention as defined by the following claims.
The above exemplary description of the present invention is made in conjunction with the accompanying drawings, and it is obvious that the present invention is not limited by the above manner, and various improvements made by the method concept and technical solution of the present invention or by directly applying the concept and technical solution of the present invention to other occasions without improvement are all within the protection scope of the present invention.
Claims (10)
1. The utility model provides a matrix multiport scattering parameter test system, its characterized in that, includes network analysis appearance, radio frequency switch matrix, control system, station tool system, display system, terminal data analysis system and server, control system respectively with the radio frequency switch matrix station tool system display system reaches terminal data analysis system connects, terminal data analysis system with the server is connected, network analysis appearance's output port with the input port of radio frequency switch matrix is connected, the output channel of radio frequency switch matrix with station tool headtotail.
2. The matrix-type multi-port scattering parameter testing system of claim 1, wherein there are a plurality of output ports of said network analyzer, and the number of input ports of said rf switch matrix corresponds to the number of output ports of said network analyzer.
3. The matrix-type multi-port scattering parameter testing system according to claim 2, wherein integrated switch modules are disposed in said rf switch matrix, the number of said integrated switch modules corresponds to the number of input ports of said rf switch matrix, the control end of said integrated switch module is connected to said control system, the input end of said integrated switch module is connected to the input ports of said rf switch matrix, and the output end of said integrated switch module is provided with a plurality of output channels of said rf switch matrix.
4. The matrix-type multi-port scattering parameter testing system of claim 3, wherein said station fixture system comprises a plurality of test fixtures for placing objects to be tested and a plurality of stations, one of said test fixtures being placed at each of said stations, said test fixtures being connected to output channels of said RF switch matrix.
5. The matrix-type multi-port scatterometry parameter testing system of claim 4, wherein output channels of said rf switch matrix extend through rf cable outputs to said stations and are connected to said test fixture to form test stations.
6. The matrix-type multi-port scattering parameter testing system of claim 4, wherein the number of said testing jigs and said stations is less than or equal to the number of output channels of said RF switch matrix.
7. The matrix-type multi-port scattering parameter testing system according to claim 4, wherein said display system comprises a plurality of display screens, one of said display screens being disposed at each of said workstations, said display screens being connected to said control system.
8. The matrix type multi-port scattering parameter testing system according to claim 7, wherein said control system comprises a CPU motherboard, a split screen module, an STM32 module and a USB data acquisition module, said CPU motherboard is respectively connected with said split screen module, said STM32 module and said USB data acquisition module, said split screen module is connected with said display screen, said STM32 module is connected with said testing fixture, and said USB data acquisition module is connected with said integrated switch module.
9. The matrix type multi-port scattering parameter testing system of claim 4, wherein said network analyzer is placed at a central location of a production line site, and with said network analyzer as a center, said output channels of said RF switch matrix are independently extended to the periphery, each output channel of said RF switch matrix forms a different angle on said production line site, and the end of each output channel of said RF switch matrix is connected to said testing fixture.
10. The matrix type multi-port scattering parameter testing system of claim 4, wherein said network analyzer is placed at a central location of a production line site, and centered on said network analyzer, output channels of said RF switch matrices are collected together, and said output channels of said RF switch matrices extend in the same direction, each output channel of said RF switch matrix extends to different distances and then branches off separately, and the end of each branched output channel of said RF switch matrix is connected to said testing fixture.
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| CN202023170348.5U CN214310703U (en) | 2020-12-24 | 2020-12-24 | Matrix type multiport scattering parameter test system |
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| CN202023170348.5U CN214310703U (en) | 2020-12-24 | 2020-12-24 | Matrix type multiport scattering parameter test system |
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Effective date of registration: 20230901 Address after: 518000 Room 201, building 4, South Taiyun chuanggu, Tangwei community, Fenghuang street, Guangming District, Shenzhen, Guangdong Patentee after: Shenzhen Xinghang Wulian science and Technology Co.,Ltd. Address before: 518000 5103, floor 5, building a, huanggangling Industrial Park, Hangcheng Industrial Zone, Taoyuan community, Xixiang street, Bao'an District, Shenzhen, Guangdong Patentee before: TERMWAY TECHNOLOGY (SHENZHEN) CO.,LTD. |
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