CN214252504U - Circuit board over-and-under type accredited testing organization - Google Patents

Circuit board over-and-under type accredited testing organization Download PDF

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Publication number
CN214252504U
CN214252504U CN202120210912.7U CN202120210912U CN214252504U CN 214252504 U CN214252504 U CN 214252504U CN 202120210912 U CN202120210912 U CN 202120210912U CN 214252504 U CN214252504 U CN 214252504U
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circuit board
test
probe
seat
board
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CN202120210912.7U
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王军
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Dongguan Pinhesheng Automation Technology Co ltd
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Dongguan Pinhesheng Automation Technology Co ltd
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Abstract

The utility model belongs to the technical field of the PCBA board test, concretely relates to circuit board over-and-under type accredited testing organization: the test bed is used for placing a circuit board to be tested and can carry out alignment calibration on the placing position of the circuit board to be tested; the lifting platform is supported below the test board and can drive the test board to lift in the vertical direction; the probe seat plate is arranged right above the test board, a plurality of through hole-shaped hole sites are arranged on the probe seat plate, vertical probes can be inserted into the hole sites, and the vertical probes are respectively positioned right above the point sites to be tested of the circuit board to be tested. The problems of complex test structure and high use cost of the PCBA board in the prior art are solved; the semi-automatic test that this scheme can realize the PCBA board not only can improve efficiency of software testing, also can reduce accredited testing organization's cost of manufacture simultaneously, is favorable to the circular telegram test to the PCBA board of small-scale production.

Description

Circuit board over-and-under type accredited testing organization
Technical Field
The utility model belongs to the technical field of the PCBA board test, concretely relates to circuit board over-and-under type accredited testing organization.
Background
After the production of the PCBA is finished, the circuit function of the PCBA is generally required to be tested so as to judge whether the PCBA has a normal function or not; most of the traditional PCBA tests adopt manual tests, and tests are performed manually by means of test tools; the existing PCBA testing device has a single structure, and the PCBA is inconvenient to replace and test in the testing process; this kind of mode needs manual line connection, and some interface pinholes are more, need aim at just can insert, need fix PCBA board earlier usually, and the line is connected to the board hand of holding in one hand to the normal way, and the circuit is complicated easily to be confused, and working strength is big, and inefficiency.
Particularly, the flat cable connector on the PCBA board needs to be opened firstly, then a flat cable probe to be tested is put in, then the flat cable cover is closed, and after the test is finished, the flat cable probe needs to be taken out, so that a large amount of burden on labor energy is brought in the process; however, the device which can carry out the power-on test on the PCBA board in the market at present has a complex structure and high cost, and is not suitable for testing the PCBA board produced in a small scale.
SUMMERY OF THE UTILITY MODEL
In order to solve the problems of complex test structure and high use cost of the PCBA board in the prior art, the scheme provides the circuit board lifting type test mechanism, which can realize semi-automatic test of the PCBA board, not only can improve the test efficiency, but also can reduce the manufacturing cost of the test mechanism, and is favorable for the power-on test of the PCBA board produced on a small scale.
The utility model discloses the technical scheme who adopts does:
a circuit board lifting type testing mechanism: the method comprises the following steps:
the test board is used for placing the circuit board to be tested and can carry out alignment calibration on the placing position of the circuit board to be tested;
the lifting platform is supported below the test board and can drive the test board to lift in the vertical direction;
the probe seat board is arranged right above the test board, a plurality of through hole-shaped hole sites are arranged on the probe seat board, vertical probes can be inserted into the hole sites, and the position of each vertical probe is respectively positioned right above each point to be detected of the circuit board to be detected.
Optionally: the lifting platform is provided with a second probe station, the second probe station is provided with a wiring control mechanism, the wiring control mechanism is connected with a wiring probe, and the wiring control mechanism can control the wiring probe to be inserted into the circuit board to be tested.
Optionally: the wire arranging control mechanism comprises an upper wire arranging seat, a lower wire arranging seat, a sliding table and a sliding rail; the upper wire arranging seat is connected above the lower wire arranging seat and fixes the wire arranging probe between the upper wire arranging seat and the lower wire arranging seat, the slide rail is arranged at a second probe station of the lifting platform, and the lower wire arranging seat is connected with the slide rail through the sliding table and can slide along the slide rail.
Optionally: the lower part of the lifting platform is connected with a telescopic device, and a telescopic shaft of the telescopic device is connected with the lifting platform and controls the lifting action of the lifting platform.
Optionally: a guide sleeve is arranged on the lifting platform, and a vertical guide rod is arranged in the guide sleeve; when the lifting platform is vertically lifted, the guide sleeve is matched with the guide rod for vertical guide.
Optionally: the expansion bend is pneumatic expansion bend, and this pneumatic expansion bend is connected with the gas circuit structure, and this gas circuit structure is including gas circuit main valve and gas circuit control valve, and the gas circuit control valve links to each other with the expansion bend, and gas circuit main valve and gas circuit control valve intercommunication, gas circuit main valve external active pressure source.
Optionally: the circuit board lifting type testing mechanism also comprises a rack, wherein the rack comprises an upper seat plate and a lower seat plate, and the upper seat plate is arranged right above the lower seat plate; be provided with first probe station on the bedplate, the probe bedplate sets up in this first probe station department.
Optionally: and a test switching port is arranged on the upper base plate and used for switching a circuit between an external test circuit and the vertical probe.
Optionally: and a test board seat is arranged on the upper seat board and used for fixing a test circuit board for outputting test signals.
Optionally: be provided with a plurality of first probe stations in the frame, every first probe station department all is provided with the probe bedplate, all corresponds under every probe bedplate and is provided with testboard and elevating platform.
The utility model has the advantages that:
1. in the scheme, the test board seat is used for bearing a circuit board to be tested and is driven to lift by the lifting platform, meanwhile, the circuit board can be quickly electrified and tested by presetting the position of the circuit board to be tested and the detection position of the vertical probe and contacting through vertical lifting through the test board seat right above the test board seat and the vertical probe arranged on the test board seat, and meanwhile, the test board seat and the test board are detachably connected on the rack, so that the test of different circuit boards can be matched and compatible in time only by replacing the corresponding test board seat and the test board;
2. meanwhile, the wire arranging control mechanism is arranged at the second probe station of the lifting platform, and can slide in the horizontal direction, so that the insertion and extraction actions of the wire arranging probe can be realized, and the test of a wire arranging interface of a circuit board to be tested is facilitated;
3. the rack in the scheme adopts a high-integration structural design, is convenient to use in batches, adopts a semi-automatic testing mode, adopts a simple structure, effectively controls the use cost of the testing mechanism, and is provided with more than two test tables in the rack, so that not only can the sequential testing of different functions of the same circuit board to be tested be realized, but also the synchronous testing of the same functions of different circuit boards to be tested can be realized.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a perspective view of a lifting type testing mechanism of a circuit board in the scheme;
FIG. 2 is a side view of the elevating type testing mechanism of the circuit board in the present solution;
FIG. 3 is a front side view of the elevating type testing mechanism of the circuit board in the present solution;
FIG. 4 is a schematic structural view of the elevating mechanism;
FIG. 5 is an exploded view of the lift mechanism and the cable management mechanism;
fig. 6 is a fixed structure view of the pneumatic control valve.
In the figure: 1-a frame; 101-a lower seat plate; 102-an upper seat plate; 103-a first probe station; 104-a console; 105-a vertical shelf plate; 2-testing the switching port; 3-test plate seat; 4-a vertical probe; 5-probe seat board; 6-a lifting mechanism; 601-a retractor; 602-a guide bar; 603-a guide sleeve; 604-a lifting platform; 605-a stopper; 606-positioning columns; 607-test bench; 608-a second probe station; 7-gas path structure; 701-a gas path main valve; 702-a gas path control valve; 703-gas circuit control board; 8-a circuit board to be tested; 9-a bus bar control mechanism; 901-flat cable probes; 902-upper wire arranging seat; 903-lower wire arranging seat; 904-slipway; 905-slide rail.
Detailed Description
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the present invention will be briefly described below with reference to the accompanying drawings and the description of the embodiments or the prior art, and it is obvious that the following description of the structure of the accompanying drawings is only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without any inventive work.
The technical solution provided by the present invention will be described in detail by way of embodiments with reference to the accompanying drawings. It should be noted that the description of the embodiments is provided to help understanding of the present invention, but the present invention is not limited thereto.
In some instances, some embodiments are not described or not in detail, as they are conventional or customary in the art.
Furthermore, the technical features described herein, or the steps of all methods or processes disclosed, may be combined in any suitable manner in one or more embodiments, in addition to the mutually exclusive features and/or steps. It will be readily appreciated by those of skill in the art that the order of the steps or operations of the methods associated with the embodiments provided herein may be varied. Any order in the drawings and examples is for illustrative purposes only and does not imply that a certain order is required unless explicitly stated to be required.
The numbering of the components as such, e.g., "first", "second", etc., is used herein only to distinguish the objects as described, and does not have any sequential or technical meaning. The terms "connected" and "coupled" when used in this application, encompass both direct and indirect connections, and also include both direct and indirect connections, where appropriate and without making any inconsistency.
Example 1
As shown in fig. 1 to 6, the present embodiment designs a circuit board lifting type testing mechanism, which includes a rack 1, a lifting mechanism 6, a testing table 607, a gas path structure 7, a probe seat plate 5, and other structures.
The machine frame 1 comprises a lower seat plate 101, an upper seat plate 102, a first probe station 103, a control console 104 and a vertical frame plate 105; the upper seat plate 102 is parallel to the right upper part of the lower seat plate 101, side plates are respectively arranged on the left side, the right side and the rear side of the rack 1, the control console 104 is arranged on the front side of the rack 1, and a switch or an operation key can be arranged on the control console 104; the vertical frame plate 105 is connected between the upper seat plate 102 and the lower seat plate 101.
The upper base plate 102 is provided with a test adapter port 2, a test plate base 3 and two first probe stations 103; the test adapter 2 is detachably arranged on the upper seat plate 102 and is used for circuit adapter between an external test circuit and the vertical probe 4; the test board seat 3 is detachably arranged on the upper seat plate 102 and is used for fixing a test circuit board for outputting a test signal, and the test circuit board output by the test circuit board carries out an electrifying test on the circuit board 8 to be tested through the vertical probe 4; the first probe station 103 is a hole formed in the upper seat plate 102, and the probe seat plate 5 is correspondingly disposed right below the hole.
The test board seat 3 is detachably connected to the lower side of the upper seat board 102; and this test plate seat 3 is located under first probe station 103, is provided with the hole site of a plurality of through-hole forms on test plate seat 3, can insert vertical probe 4 in these through-holes, and the position of each vertical probe 4 is located the circuit board 8 that awaits measuring directly over each point location that awaits measuring respectively, and vertical probe 4 is through the point location that awaits measuring on the contact pair circuit board 8 that awaits measuring to circuit board 8 that awaits measuring carries out the circuit test.
The lifting mechanism 6 is arranged on the lower seat plate 101, and the lifting mechanism 6 comprises a pneumatic expansion piece, a guide rod 602, a guide sleeve 603, a lifting table 604 and a positioning column 606; the telescopic device 601 is vertically arranged on the lower seat plate 101, the lifting platform 604 is arranged above the telescopic device 601 and connected with a telescopic shaft of the telescopic device 601, and the telescopic device 601 can control the lifting action of the lifting platform 604 in the vertical direction; the guide sleeve 603 is internally connected on the lifting table 604, and a vertical guide rod 602 is arranged in the guide sleeve 603; when the lifting platform 604 is lifted vertically, the guide sleeve 603 is matched with the guide rod 602 to guide vertically.
The test bench 607 is detachably fixed above the lifting bench 604 through screws, the test bench 607 is used for placing the circuit board 8 to be tested, the test bench 607 is provided with a limiter 605 and a positioning column 606, and the positioning column 606 is connected to the test bench 607 and is used for aligning and calibrating the edge and the hole site of the circuit board 8 to be tested; the limiter 605 is detachably connected to the test table 607, and a kidney-shaped hole is provided in the limiter 605, and the limiter 605 can adjust the position so that the limiter 605 can align and calibrate the placement position of the circuit board 8 to be tested.
The expansion piece 601 used by the lifting mechanism 6 is a pneumatic expansion piece, and the pneumatic expansion piece is connected with the gas path structure 7; the gas circuit structure 7 comprises a gas circuit main valve 701, a gas circuit control valve 702, a gas circuit control board 703 and other structures; the gas circuit control valve 702 is connected with the expansion piece 601, the gas circuit main valve 701 is communicated with the gas circuit control valve 702, the gas circuit control valve 702 adopts an electromagnetic valve and is electrically connected with the gas circuit control board 703, and the control knob is arranged on the console 104 and is electrically connected with the gas circuit control board 703 so as to control the action of the gas circuit control valve 702; the gas circuit main valve 701 is connected to an external gas pressure source; the air path control valve 702 is fixed to the riser frame.
During the use, insert vertical probe 4 in the corresponding hole site on the probe bedplate 5, make vertical probe 4 correspond to be arranged in the circuit board 8 that awaits measuring directly over the point location, when the vertical ascending of expansion bend 601 control elevating platform 604, elevating platform 604 bears the weight of the testboard 607 and rises, thereby the point location that awaits measuring that circuit board 8 on the testboard 607 can contact and correspond vertical probe 4 and carry out the circular telegram test, accomplish the test after, with circuit board 8 that awaits measuring, it tests or changes and tests on other accredited testing organization to change to other test station.
Example 2
As shown in fig. 4 and 5, on the basis of the structure of embodiment 1, a second probe station 608 is disposed on the lifting table 604, a flat cable control mechanism 9 is disposed at the second probe station 608, and the flat cable control mechanism 9 can fix the flat cable probe 901 and can plug the flat cable probe 901 into a flat cable interface on the circuit board 8 to be tested.
The flat cable control mechanism 9 includes an upper flat cable seat 902, a lower flat cable seat 903, a sliding table 904 and a sliding rail 905; the upper wire arranging seat 902 is connected above the lower wire arranging seat 903 and fixes the wire arranging probe 901 between the upper wire arranging seat and the lower wire arranging seat, the sliding rail 905 is arranged at the second probe station 608 of the lifting table 604, and the lower wire arranging seat 903 is connected with the sliding rail 905 through the sliding table 904 and can slide along the sliding rail 905; when the upper wire arranging seat 902 or the lower wire arranging seat 903 is pushed manually to slide, the wire arranging probe 901 can be inserted into or pulled out of the wire arranging interface of the circuit board 8 to be tested.
The above examples are merely for clearly illustrating the examples and are not intended to limit the embodiments; other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications can be made without departing from the scope of the invention.

Claims (10)

1. The utility model provides a circuit board over-and-under type accredited testing organization which characterized in that: the method comprises the following steps:
the test bench (607) is used for placing the circuit board (8) to be tested, and can carry out alignment calibration on the placing position of the circuit board (8) to be tested;
the lifting platform (604) is supported below the test platform (607) and can drive the test platform (607) to lift in the vertical direction;
the probe seat board (5), probe seat board (5) set up directly over testboard (607), are provided with the hole site of a plurality of through-hole forms on probe seat board (5), can insert vertical probe (4) in each hole site, and the position of each vertical probe (4) is located directly over each point location that awaits measuring of circuit board (8) that awaits measuring respectively.
2. The circuit board lifting testing mechanism of claim 1, wherein: a second probe station (608) is arranged on the lifting platform (604), a flat cable control mechanism (9) is arranged at the second probe station (608), a flat cable probe (901) is connected to the flat cable control mechanism (9), and the flat cable control mechanism (9) can control the flat cable probe (901) to be plugged onto the circuit board (8) to be tested.
3. The circuit board lifting testing mechanism of claim 2, wherein: the arrangement line control mechanism (9) comprises an upper arrangement line seat (902), a lower arrangement line seat (903), a sliding table (904) and a sliding rail (905); the upper wire arranging seat (902) is connected above the lower wire arranging seat (903) and fixes the wire arranging probe (901) between the upper wire arranging seat and the lower wire arranging seat, the sliding rail (905) is arranged at a second probe station (608) of the lifting table (604), and the lower wire arranging seat (903) is connected with the sliding rail (905) through the sliding table (904) and can slide along the sliding rail (905).
4. The circuit board elevation testing mechanism of any one of claims 1-3, wherein: a telescopic device (601) is connected below the lifting platform (604), and a telescopic shaft of the telescopic device (601) is connected with the lifting platform (604) and controls the lifting action of the lifting platform (604).
5. The circuit board lifting testing mechanism of claim 4, wherein: a guide sleeve (603) is arranged on the lifting platform (604), and a vertical guide rod (602) is arranged in the guide sleeve (603); when the lifting platform (604) is lifted vertically, the guide sleeve (603) is matched with the guide rod (602) to guide vertically.
6. The circuit board lifting testing mechanism of claim 4, wherein: the expansion piece (601) is a pneumatic expansion piece, the pneumatic expansion piece is connected with a gas path structure (7), the gas path structure (7) comprises a gas path main valve (701) and a gas path control valve (702), the gas path control valve (702) is connected with the expansion piece (601), the gas path main valve (701) is communicated with the gas path control valve (702), and the gas path main valve (701) is externally connected with a gas pressure source.
7. The circuit board lifting testing mechanism of claim 1, wherein: the circuit board lifting type testing mechanism further comprises a rack (1), the rack (1) comprises an upper seat plate (102) and a lower seat plate (101), and the upper seat plate (102) is arranged right above the lower seat plate (101); a first probe station (103) is arranged on the upper seat plate (102), and the probe seat plate (5) is arranged at the first probe station (103).
8. The circuit board lift-type testing mechanism of claim 7, wherein: a test adapter interface (2) is arranged on the upper seat plate (102), and the test adapter interface (2) is used for circuit switching between an external test circuit and the vertical probe (4).
9. The circuit board lift-type testing mechanism of claim 7, wherein: the upper seat plate (102) is provided with a test plate seat (3), and the test plate seat (3) is used for fixing a test circuit board for outputting test signals.
10. The circuit board lift-type testing mechanism of claim 7, wherein: be provided with a plurality of first probe station (103) on frame (1), every first probe station (103) department all is provided with probe bedplate (5), all corresponds under every probe bedplate (5) and is provided with testboard (607) and elevating platform (604).
CN202120210912.7U 2021-01-25 2021-01-25 Circuit board over-and-under type accredited testing organization Active CN214252504U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202120210912.7U CN214252504U (en) 2021-01-25 2021-01-25 Circuit board over-and-under type accredited testing organization

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202120210912.7U CN214252504U (en) 2021-01-25 2021-01-25 Circuit board over-and-under type accredited testing organization

Publications (1)

Publication Number Publication Date
CN214252504U true CN214252504U (en) 2021-09-21

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114355138A (en) * 2021-12-31 2022-04-15 苏州欣华锐电子有限公司 Machine table for aging test of semiconductor device
CN118011058A (en) * 2024-02-19 2024-05-10 四川川浦融科技有限公司 Power module testing device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114355138A (en) * 2021-12-31 2022-04-15 苏州欣华锐电子有限公司 Machine table for aging test of semiconductor device
CN118011058A (en) * 2024-02-19 2024-05-10 四川川浦融科技有限公司 Power module testing device

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