CN214252388U

CN214252388U - Pin-missing test jig for power module

Info

Publication number: CN214252388U
Application number: CN202023135293.4U
Authority: CN
Inventors: 沈巧强
Original assignee: STARPOWER SEMICONDUCTOR Ltd
Current assignee: Star Semiconductor Co ltd
Priority date: 2020-12-23
Filing date: 2020-12-23
Publication date: 2021-09-21
Anticipated expiration: 2030-12-23

Abstract

The utility model discloses a power module's scarce needle test fixture, including mechanical supporting part and the test fixture body of setting in mechanical supporting part, the test fixture body mainly includes probe contact site and the probe detection portion that set up from top to bottom, the probe contact site includes first fixed plate and sets up a plurality of contact probes on first fixed plate perpendicularly, is provided with first probe circuit board on the probe contact site; the probe detection part comprises a second fixing plate and a plurality of detection probes vertically arranged on the second fixing plate, a second probe circuit board is arranged on the probe detection part, and a power supply and an indicator light are arranged on the second probe circuit board; the quantity and the position of contact probe and detection probe correspond with the stitch of power module, and when power module's whole stitch pushed down the contact probe made contact probe and detection probe contact, the circuit intercommunication on first probe circuit board and the second probe circuit board and formed complete return circuit and made the pilot lamp on the probe detection portion light.

Description

Pin-missing test jig for power module

Technical Field

The utility model relates to a semiconductor power module's test field, concretely relates to power module's scarce needle test fixture.

Background

The power semiconductor module is a combination of a certain function and a certain mode, and different functions can be realized according to different packaged components. Power semiconductor devices are mainly power metal oxide semiconductor field effect transistors (power mosfets, often abbreviated as power mos), insulated gate bipolar transistors (igbt), and power integrated circuits (power ics, often abbreviated as pic). The devices or integrated circuits can work under very high frequency, and the circuits can save more energy and materials when working under high frequency, thereby greatly reducing the volume and the weight of equipment. Especially, a monolithic on-chip power system (power system on a chip, abbreviated as psoc) with high integration level can integrate a sensing device, a circuit, a signal processing circuit, an interface circuit, a power device, a circuit and the like on a silicon chip, so that the system has the intelligent functions of precisely adjusting output according to load requirements and self-protecting according to conditions of overheating, overvoltage, overcurrent and the like.

With the development of semiconductor devices, power semiconductor modules are now increasingly used in various applications, such as: industrial frequency converter, welding machine power supply, locomotive traction, wind power generation and other occasions. Because the high-power module has many pins, especially when many pins (three or more) are on the same pole, can not detect all pins through the four-wire method when the electrical property tests, so can look over whether the module has the condition of lacking the needle through the mode of outward appearance visual inspection, but this kind of manual method still can miss the condition emergence of seeing when consuming time and laboursome and efficiency is lower for the product yield after leaving the factory reduces, has brought the adverse effect to the product quality of power semiconductor module.

Disclosure of Invention

The to-be-solved technical problem of the utility model lies in, to the above-mentioned defect of prior art, a power module's that simple structure, test are convenient and the test effect is accurate scarce needle test fixture is provided.

The utility model aims at completing the missing needle test fixture of a power module through the following technical scheme, which is used for detecting whether the power module with a plurality of pins has the missing needle condition or not, and comprises a mechanical supporting part and a test fixture body arranged in the mechanical supporting part, wherein the test fixture body mainly comprises a probe contact part and a probe detection part which are arranged up and down, the probe contact part comprises a first fixed plate and a plurality of contact probes which are vertically arranged on the first fixed plate and can move up and down relative to the first fixed plate, and a first probe circuit board is arranged on the probe contact part; the probe detection part comprises a second fixing plate and a plurality of detection probes which are vertically arranged on the second fixing plate and can move up and down relative to the fixing plate, a second probe circuit board is arranged on the probe detection part, and a power supply and an indicator light are arranged on the second probe circuit board; the quantity and the position of contact probe and detection probe correspond with the stitch of power module, and when power module's whole stitch pushes down the contact probe and makes contact probe and detection probe contact, the circuit intercommunication on first probe circuit board and the second probe circuit board and form a complete return circuit and make the pilot lamp on the probe detection portion light.

Further, the contact probe is a probe with an insulated head, and the detection probe is a spring probe.

Further, the mechanical support is made of a high-strength insulating material.

Further, the mechanical support is made of FR4 material with a thickness of 10 mm.

The utility model has the advantages of: the utility model discloses simple structure comes to detect power module's stitch through probe contact site and probe detection portion, can prevent effectively that the artifical hourglass in the visual inspection from examining, avoids lacking battle array device and flows in market, has still improved quality testing efficiency when having reduced manufacturing cost.

Drawings

Fig. 1 is a schematic structural diagram of a multi-pin power device module;

fig. 2 is a schematic structural view of the testing jig body of the present invention;

fig. 3 is a schematic circuit structure diagram of the first probe circuit board according to the present invention;

fig. 4 is a schematic diagram of a circuit structure of the second probe circuit board of the present invention.

Detailed Description

To make the objects, technical solutions and advantages of the present invention more clearly understood by those skilled in the art, the present invention will be further described with reference to the accompanying drawings and examples.

In the description of the present invention, it should be understood that the directions or positional relationships indicated by the terms "upper", "lower", "left", "right", "inner", "outer", "lateral", "vertical", and the like are the directions or positional relationships shown in the drawings, and are only for convenience of description of the present invention, and do not indicate or imply that the device or element referred to must have a specific direction, and therefore, should not be construed as limiting the present invention.

As shown in fig. 1-4, the needle-missing test fixture of a power module, which is provided in the present invention, is used for detecting whether the power module 1 with multiple pins has a needle-missing condition, and comprises a mechanical support portion and a test fixture body disposed in the mechanical support portion, wherein the test fixture body mainly comprises a probe contact portion 2 and a probe detection portion 3 disposed up and down, the probe contact portion 2 comprises a first fixing plate 21 and a plurality of contact probes 22 vertically disposed on the first fixing plate 21 and capable of moving up and down relative to the fixing plate, and a first probe circuit board 23 is disposed on the probe contact portion 2; the probe detection part 3 comprises a second fixing plate 31 and a plurality of detection probes 32 which are vertically arranged on the second fixing plate 31 and can move up and down relative to the fixing plate, a second probe circuit board 33 is arranged on the probe detection part 3, and a power supply and an indicator light are arranged on the second probe circuit board 33; the number and positions of the contact probes 22 and the detection probes 32 correspond to the pins of the power module 1, and when all the pins of the power module 1 press down the contact probes 22 to make the contact probes 22 contact with the detection probes 32, the circuits on the first probe circuit board 23 and the second probe circuit board 33 are communicated to form a complete loop so that the indicator lamps on the probe detection part are turned on.

Referring to fig. 2, the first fixing plate 21 and the second fixing plate 31 are both PCB plates, the contact probe 22 is a probe with an insulated head, and the detection probe 32 is a spring probe; the mechanical support is made of a high-strength insulating material, such as: the mechanical supporting part is made of FR4 material with the thickness of 10mm or other materials with high insulating strength and high mechanical strength.

Referring to fig. 1 to 4, a plurality of pins are provided on a power portion terminal pole of the power module, for example, there are 8 pins on a U pole in total, and one or more pins are not inserted or fall off in a production process, so that an inspector is required to visually inspect each defective module in each process to pick out the defective module, but the visual inspection has a certain omission factor, which easily causes the module to flow into a next process or be sent to a client, so that the module with the defective pin is detected by using a test fixture. As shown in fig. 2, the head of the contact probe between the fixture and the module to be tested is an integral probe made of insulating material, the contact probe is extended downward to form a certain stroke by pressing the module against the probe, the tail of the probe is contacted with the detection probe on the second layer, and the detection circuit formed by the detection probe on the second layer can judge whether the contact probe on the first layer is contacted with the detection probe on the second layer. If one probe in the module is in a missing state, the contact probe of the first layer cannot have a stroke and cannot contact with the detection probe of the second layer to form a judgment condition, so that whether the module is in a missing state or not is judged.

The utility model discloses simple structure comes to detect power module's stitch through probe contact site and probe detection portion, can prevent effectively that the artifical hourglass in the visual inspection from examining, avoids lacking battle array device and flows in market, has still improved quality testing efficiency when having reduced manufacturing cost.

The specific embodiments described herein are merely illustrative of the principles of the present invention and its efficacy, and are not intended to limit the invention. Modifications and variations can be made to the above-described embodiments by those skilled in the art without departing from the spirit and scope of the present invention. Therefore, it is intended that all equivalent modifications or changes which can be made by those skilled in the art without departing from the spirit and technical idea of the present invention shall be covered by the claims of the present invention.

Claims

1. The utility model provides a power module's scarce needle test fixture for whether the power module that detects many stitches has the scarce needle condition, its characterized in that: the test fixture mainly comprises a probe contact part and a probe detection part which are arranged up and down, wherein the probe contact part comprises a first fixing plate and a plurality of contact probes which are vertically arranged on the first fixing plate and can move up and down relative to the fixing plate, and a first probe circuit board is arranged on the probe contact part; the probe detection part comprises a second fixing plate and a plurality of detection probes which are vertically arranged on the second fixing plate and can move up and down relative to the fixing plate, a second probe circuit board is arranged on the probe detection part, and a power supply and an indicator light are arranged on the second probe circuit board; the quantity and the position of contact probe and detection probe correspond with the stitch of power module, and when power module's whole stitch pushes down the contact probe and makes contact probe and detection probe contact, the circuit intercommunication on first probe circuit board and the second probe circuit board and form a complete return circuit and make the pilot lamp on the probe detection portion light.

2. The needle-missing test fixture of claim 1, wherein: the contact probe is a probe with an insulated head, and the detection probe is a spring probe.

3. The needle-missing test fixture of power module of claim 1 or 2, characterized in that: the mechanical support is made of a high-strength insulating material.

4. The needle-missing test fixture of claim 3, wherein: the mechanical support is made of FR4 material with a thickness of 10 mm.