CN214226478U - Lighting fixture and lighting test system - Google Patents
Lighting fixture and lighting test system Download PDFInfo
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- CN214226478U CN214226478U CN202120268674.5U CN202120268674U CN214226478U CN 214226478 U CN214226478 U CN 214226478U CN 202120268674 U CN202120268674 U CN 202120268674U CN 214226478 U CN214226478 U CN 214226478U
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Abstract
The utility model discloses a tool and test system of lighting a lamp, this tool of lighting a lamp includes: a microprocessor including a first output terminal outputting a test signal; and the abnormal state monitoring unit comprises a sampling resistor, is connected with the microprocessor, receives the test signal, is used for outputting the test signal to the equipment to be tested after passing through the sampling resistor, and outputs at least one voltage signal representing the state of the transient voltage suppressor in the equipment to be tested to the microprocessor. The lighting fixture and the lighting test system can timely check the damage condition of the TVS tube at the interface end of the liquid crystal display, and prevent bad products from flowing into customers.
Description
Technical Field
The utility model relates to a show technical field, concretely relates to tool and test system lights a lamp of lighting a lamp.
Background
In recent years, with the development of Liquid Crystal panel production technology, Thin Film Transistor Liquid Crystal displays (TFT-LCDs) have been dominant in the current flat panel Display market due to their advantages of small size, light weight, low power consumption, no radiation, and the like. In order to improve the yield of the liquid crystal display and prevent bad products from flowing into a client, a TFT-LCD display needs a plurality of detection processes before shipment, wherein the last process is the detection of the picture quality of the liquid crystal display, which is an important process before the shipment of the products in the mass production process of the liquid crystal display, and the universal inspection methods in the prior art are divided into two types of appearance inspection and spot light inspection. The lighting inspection is to inspect whether the liquid crystal display has a display function defect by inputting various mode signals.
An interface end of the lcd is usually provided with a Transient Voltage Suppressor (TVS), which can effectively avoid damage to the lcd caused by Transient sudden change of the power supply Voltage. In practical application, during the one-step lighting test from the front end to the back end of the liquid crystal display, the TVS tube at the interface end of the liquid crystal display may be damaged due to some reasons.
Referring to fig. 1, fig. 1 is a schematic diagram illustrating a lighting test system according to an embodiment. As shown in fig. 1, in the conventional lighting test system, the microprocessor 110 in the lighting fixture 100 is connected to the timing controller 300 through an output pin LED _ PWM and a TVS (Transient Voltage Suppressor) D1 of the connector 200, and a test signal, such as a PWM (Pulse Width Modulation) signal, is input to the timing controller 300 to perform a lighting test on the liquid crystal display. When the TVS transistor D1 is not damaged, the timing controller 300 can receive a normal PWM signal to control the operation of the liquid crystal display. When the TVS tube D1 is damaged, the equivalent resistor Req thereof has a resistance of about 40 ohms, and the receiving end of the timing controller 300 can receive the normal PWM signal, so that the conventional lighting fixture cannot detect the damage in time, and the defective product flows into the client side, thereby causing a great loss.
Therefore, there is a need to provide an improved technical solution to overcome the above technical problems in the prior art.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical problem, the utility model provides a tool and test system lights a lamp, the damaged condition of TVS pipe of inspection LCD interface end that can be timely avoids bad product to flow into the customer.
According to a first aspect of the present disclosure, there is provided a lighting fixture, including: a microprocessor including a first output terminal outputting a test signal;
and the abnormal state monitoring unit comprises a sampling resistor, is connected with the microprocessor and receives the test signal, and is used for outputting the test signal to the equipment to be tested after passing through the sampling resistor and outputting at least one voltage signal representing the state of the transient voltage suppressor in the equipment to be tested to the microprocessor.
Optionally, the abnormal state monitoring unit further includes:
the non-inverting input end of the first buffer is connected with the first output end of the microprocessor, the inverting input end of the first buffer is connected with the output end of the first buffer, and the output end of the first buffer is connected with the first end of the sampling resistor;
the first voltage measuring subunit comprises a first input end connected with the first end of the sampling resistor, a second input end connected with the second end of the sampling resistor, and an output end for outputting and representing the voltage difference between the two ends of the sampling resistor.
Optionally, the abnormal state monitoring unit further includes:
the non-inverting input end of the second buffer is connected with the first output end of the microprocessor, the inverting input end of the second buffer is connected with the output end of the second buffer, and the output end of the second buffer is connected with the first end of the sampling resistor;
and the second voltage measurement subunit comprises a first input end connected with the first end of the sampling resistor, a second input end connected with the second end of the sampling resistor, and a first output end and a second output end, wherein the first output end and the second output end are used for outputting and representing the first end voltage of the sampling resistor.
Optionally, the resistance value of the sampling resistor is at least one order of magnitude greater than the equivalent resistance value of the transient voltage suppressor in the damaged state.
Optionally, the microprocessor further comprises: and a second output terminal for outputting the display signal.
Optionally, the lighting fixture further includes: and the display subunit is connected with the second output end of the microprocessor.
Optionally, the microprocessor further comprises: and a third output end for outputting alarm signal.
Optionally, the lighting fixture further includes: and the alarm subunit is connected with the third output end of the microprocessor.
According to a second aspect of the present disclosure, there is provided a lighting test system, including: the lighting fixture comprises an output end for outputting the test signal; and
and the equipment to be tested is connected with the output end of the lighting fixture and receives the test signal.
Optionally, the device under test includes:
the input end of the connector is connected with the output end of the lighting fixture;
the input end of the time schedule controller is connected with the output end of the connector and receives the test signal;
and the transient voltage suppressor is connected between the input end of the time sequence controller and the reference ground.
The utility model has the advantages that: the utility model discloses a tool and test system of lighting a lamp, be provided with abnormal state detecting element in the tool of lighting a lamp, this abnormal state detecting element can export the test signal of microprocessor output to the equipment under test again after sampling resistor, and then can judge whether transient voltage suppressor (for example for TVS pipe) damages in the equipment under test through the voltage condition on this sampling resistor of real-time supervision, so that the transient voltage suppressor be unusual if the damage condition of timely TVS pipe of inspection liquid crystal display interface end when damaging, avoid the huge loss because of bad product flows in the customer and causes.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention as claimed.
Drawings
The above and other objects, features and advantages of the present invention will become more apparent from the following description of the embodiments of the present invention with reference to the accompanying drawings.
Fig. 1 is a schematic diagram showing a structure of a lighting test system;
fig. 2 is a schematic structural diagram illustrating a lighting test system according to an embodiment of the disclosure;
fig. 3 shows a flowchart of the operation of the lighting test system according to the embodiment of the present disclosure.
Detailed Description
In order to facilitate understanding of the present invention, the present invention will be described more fully hereinafter with reference to the accompanying drawings. The preferred embodiments of the present invention are shown in the drawings. The invention may, however, be embodied in different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.
The present invention will be described in detail below with reference to the accompanying drawings.
Referring to fig. 2, fig. 2 shows a schematic structural diagram of a lighting test system provided according to an embodiment of the present disclosure.
As shown in fig. 2, in the present disclosure, a lighting test system includes: a lighting fixture 100 and a device under test 200. The lighting fixture 100 includes an output terminal that outputs the test signal PWM. The device under test 200 has an input terminal for receiving the test signal PWM, and the input terminal of the device under test 200 is connected to the output terminal of the lighting fixture 100.
The device under test 200 further comprises: connector 210, timing controller 220 and transient voltage suppressor D1.
The input end of the connector 210 is connected to the output end of the lighting fixture 100, the output end of the connector 210 is connected to the input end of the timing controller 220, and the connector 210 is used for transmitting the test signal PWM output by the lighting fixture 100 to the timing controller 220. The connector 210 includes a plurality of input pins and a plurality of output pins, and in this embodiment, one of the input pins and one of the output pins (for example, an LED _ PWM output pin) of the connector are used to transmit the test signal PWM output by the lighting fixture 100 to the timing controller 220.
The timing controller 220 is further connected to the display to be tested in the device 200 to be tested, and is configured to receive the test signal PWM output by the lighting fixture 100, and implement lighting test on the display according to the test signal PWM control.
The transient voltage suppressor D1 is connected between the input terminal of the timing controller 220 and ground, and is used for providing transient voltage suppression for signals transmitted to the timing controller 220. It is understood that the transient voltage suppressor D1 can be equivalent to an equivalent resistor Req connected between the input terminal of the timing controller 220 and the reference ground, and the resistance value is close to infinity when it is normally not damaged, so as to provide transient voltage suppression for the signal transmitted to the timing controller 220; when the transient voltage suppressor D1 is damaged, its resistance to ground is reduced, for example, to about 40 ohms. It should be understood that the values are merely exemplary, and the equivalent resistance value of the transient voltage suppressors D1 with different specifications may be reduced to different degrees when the transient voltage suppressors D1 with different specifications are damaged, and the equivalent resistance value of the transient voltage suppressors D1 with the same specification may be reduced to different degrees when the transient voltage suppressors D1 with different specifications are damaged to different degrees.
The lighting fixture 100 provided by the present disclosure can effectively check whether the transient voltage suppressor D1 in the device under test 200 is in an abnormal state, if so, whether the transient voltage suppressor D1 is damaged, thereby preventing bad products from flowing into the client. In the embodiment of the present disclosure, the lighting fixture 100 includes: a microprocessor 110 and an abnormal state monitoring unit 120.
The microprocessor 110 is configured to generate a test signal PWM required for the lighting test, and determine whether the transient voltage suppressor D1 in the device under test 200 is in an abnormal state, such as whether a damage occurs, based on a feedback signal returned by the abnormal state monitoring unit 120.
The microprocessor 110 includes a first output terminal outputting the test signal PWM, and an input terminal receiving the feedback signal. In one embodiment of the present disclosure, the number of inputs used by the microprocessor 110 to receive the feedback signal is one; in another embodiment of the present disclosure, the number of inputs used by the microprocessor 110 to receive the feedback signal is two.
The abnormal state monitoring unit 120 includes a sampling resistor R1, and the abnormal state monitoring unit 120 is connected to the microprocessor 110, receives the test signal PWM, outputs the test signal PWM output by the microprocessor 110 to the device under test 200 through the sampling resistor R1, and outputs at least one voltage signal (i.e., a feedback signal) representing a state of a transient voltage suppressor in the device under test to the microprocessor 110.
The abnormal state monitoring unit 120 further includes: a buffer 121 and a voltage measuring unit 122.
In one embodiment of the present disclosure, when the number of the inputs used by the microprocessor 110 for receiving the feedback signal is one, the buffer 121 is a first buffer, a non-inverting input of the first buffer is connected to a first output of the microprocessor 110, an inverting input of the first buffer is connected to an output of the first buffer, and an output of the first buffer is connected to a first end of the sampling resistor R1, i.e., the node a. Meanwhile, the voltage measuring unit 122 is a first voltage measuring subunit and includes a first input terminal connected to a first terminal of the sampling resistor R1, i.e., the node a, a second input terminal connected to a second terminal of the sampling resistor R1, i.e., the node B, and an output terminal outputting a voltage difference representing a voltage difference between both terminals of the sampling resistor R1. It will be appreciated that the first voltage measuring subunit also has one number of outputs and is connected to an input for receiving a feedback signal by the microprocessor 110.
In this embodiment, the first voltage measuring subunit directly measures the voltage difference between the two ends of the sampling resistor R1, and the microprocessor 110 directly compares the voltage difference with a preset threshold, such as a first threshold, and determines that the transient voltage suppressor D1 is in a normal state and is not damaged when the voltage difference is smaller than the first threshold; when the voltage difference is greater than or equal to the first threshold, it is determined that the transient voltage suppressor D1 is in an abnormal state and is damaged.
In one embodiment of the present disclosure, when the number of the inputs used by the microprocessor 110 for receiving the feedback signal is two, the buffer 121 is a second buffer, a non-inverting input of the second buffer is connected to the first output terminal of the microprocessor 110, an inverting input of the second buffer is connected to the output terminal of the second buffer, and the output terminal of the second buffer is connected to the first terminal of the sampling resistor R1, i.e., the node a. Meanwhile, the voltage measuring unit 122 is a second voltage measuring sub-unit, and includes a first input terminal connected to a first terminal of the sampling resistor R1, i.e., the node a, a second input terminal connected to a second terminal of the sampling resistor R1, i.e., the node B, and a first output terminal outputting a voltage representing the first terminal of the sampling resistor R1 (i.e., the voltage of the node a) and a second output terminal outputting a voltage representing the second terminal of the sampling resistor R1 (i.e., the voltage of the node B). It will be appreciated that the second voltage measuring subunit also has two outputs, each connected to two inputs of the microprocessor 110 for receiving the feedback signal.
In this embodiment, the second voltage measuring sub-unit is configured to measure only the respective potentials (including the potential of the node a and the potential of the node B) across the sampling resistor R1, and the state of the transient voltage suppressor D1 is determined by the microprocessor 110 based on the potential of the node a and the potential of the node B. For example, the microprocessor 110 calculates a voltage difference between the first potential and the second potential, compares the voltage difference with a preset first threshold, and determines the state of the transient voltage suppressor D1 according to the comparison result. Or the microprocessor 110 determines whether the potential of the node B is decreased and changed and the change value exceeds a preset second threshold, and determines the state of the transient voltage suppressor D1 according to the determination result.
In the present disclosure, the resistance of the sampling resistor R1 is set to be at least one order of magnitude greater than the equivalent resistance of the transient voltage suppressor D1 in the damaged state. Therefore, the voltage difference between the two ends of the sampling resistor R1 can have obvious variation before and after the transient voltage suppressor D1 is abnormal, so that the microprocessor 110 can accurately identify the voltage difference, and the accuracy of state judgment of the transient voltage suppressor D1 is further improved.
Further, the lighting fixture 100 further includes a display subunit 130, and the microprocessor 110 further includes a second output terminal for outputting a display signal. The display subunit 130 is connected to the second output terminal of the microprocessor 110, and can be used for displaying the inspection result of the lighting fixture 100 on the state of the transient voltage suppressor D1 in real time, so that the tester can read the inspection result intuitively.
Further, the lighting fixture 100 further includes an alarm subunit 140, and the microprocessor 110 further includes a third output end for outputting an alarm signal. The alarm subunit 140 is connected to the third output terminal of the microprocessor 110, and is configured to alarm when the abnormality of the transient voltage suppressor D1 is detected.
In the present disclosure, the operation principle of the lighting test system can be understood with reference to fig. 3. Fig. 3 shows a work flow chart of the lighting test system according to the embodiment of the present disclosure. The method specifically comprises the following steps:
step S1 is first executed to power on the system. After the system is powered on, step S2 is executed, the microprocessor 110 outputs the test signal PWM, and the test signal PWM is transmitted to the device under test 200 via the buffer 121 and the sampling resistor R1. Meanwhile, the voltage measurement sub-unit 122 measures the potential values of the node a and the node B across the sampling resistor R1 in real time, and feeds back the measurement results to the microprocessor 110. Next, step S3 is executed to determine whether the voltage difference between node a and node B exceeds a predetermined value, such as a first threshold, by the microprocessor 110. When the potential values of the node a and the node B at the two ends of the sampling resistor R1 are approximately equal, that is, the voltage difference between the node a and the node B does not exceed the first threshold, it indicates that the transient voltage suppressor D1 is in a normal state, at this time, step S4 is executed, and the microprocessor 110 normally outputs the test signal PWM to control the normal lighting test on the device under test 200. When the voltage difference between the node a and the node B at the two ends of the sampling resistor R1 exceeds the first threshold, it indicates that the transient voltage suppressor D1 is in an abnormal state (for example, the transient voltage suppressor D1 is damaged, its equivalent resistance to ground becomes small, and at this time, there is a series-connection relationship between the sampling resistor R1 and the transient voltage suppressor D1 to the ground, so that the potential of the node B is greatly reduced), step S5 is executed, and the microprocessor 110 interrupts the output test signal PWM, outputs a display signal indicating an error to the display subunit 130, and outputs an alarm signal to the alarm subunit 140.
In summary, the present disclosure outputs the test signal output by the microprocessor to the device under test after passing through the sampling resistor, and then can determine whether the transient voltage suppressor (for example, TVS tube) in the device under test is damaged by monitoring the voltage condition on the sampling resistor in real time, so as to check the damage condition of the TVS tube at the interface end of the liquid crystal display in time when the transient voltage suppressor is abnormal, such as damaged, and avoid huge loss caused by the flow of defective products into customers.
It should be noted that, in this document, the contained terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Finally, it should be noted that: it should be understood that the above examples are only for clearly illustrating the present invention and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious changes and modifications may be made without departing from the scope of the present invention.
Claims (10)
1. A lighting fixture is characterized by comprising:
a microprocessor including a first output terminal outputting a test signal;
and the abnormal state monitoring unit comprises a sampling resistor, is connected with the microprocessor and receives the test signal, and is used for outputting the test signal to the equipment to be tested after passing through the sampling resistor and outputting at least one voltage signal representing the state of the transient voltage suppressor in the equipment to be tested to the microprocessor.
2. The lighting fixture according to claim 1, wherein the abnormal state monitoring unit further includes:
the non-inverting input end of the first buffer is connected with the first output end of the microprocessor, the inverting input end of the first buffer is connected with the output end of the first buffer, and the output end of the first buffer is connected with the first end of the sampling resistor;
the first voltage measuring subunit comprises a first input end connected with the first end of the sampling resistor, a second input end connected with the second end of the sampling resistor, and an output end for outputting and representing the voltage difference between the two ends of the sampling resistor.
3. The lighting fixture according to claim 1, wherein the abnormal state monitoring unit further includes:
the non-inverting input end of the second buffer is connected with the first output end of the microprocessor, the inverting input end of the second buffer is connected with the output end of the second buffer, and the output end of the second buffer is connected with the first end of the sampling resistor;
and the second voltage measurement subunit comprises a first input end connected with the first end of the sampling resistor, a second input end connected with the second end of the sampling resistor, and a first output end and a second output end, wherein the first output end and the second output end are used for outputting and representing the first end voltage of the sampling resistor.
4. The lighting fixture according to claim 1, wherein the sampling resistor has a resistance value at least one order of magnitude greater than an equivalent resistance value of the transient voltage suppressor in a damaged state.
5. The lighting fixture of claim 1, wherein the microprocessor further comprises: and a second output terminal for outputting the display signal.
6. The lighting fixture of claim 5, wherein the lighting fixture further comprises: and the display subunit is connected with the second output end of the microprocessor.
7. The lighting fixture of claim 1, wherein the microprocessor further comprises: and a third output end for outputting alarm signal.
8. The lighting fixture of claim 7, wherein the lighting fixture further comprises: and the alarm subunit is connected with the third output end of the microprocessor.
9. A lighting test system, comprising:
the lighting fixture of any one of claims 1-8, including an output terminal that outputs the test signal; and
and the equipment to be tested is connected with the output end of the lighting fixture and receives the test signal.
10. The lighting test system of claim 9, wherein the device under test includes:
the input end of the connector is connected with the output end of the lighting fixture;
the input end of the time schedule controller is connected with the output end of the connector and receives the test signal;
and the transient voltage suppressor is connected between the input end of the time sequence controller and the reference ground.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120268674.5U CN214226478U (en) | 2021-01-29 | 2021-01-29 | Lighting fixture and lighting test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120268674.5U CN214226478U (en) | 2021-01-29 | 2021-01-29 | Lighting fixture and lighting test system |
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| Publication Number | Publication Date |
|---|---|
| CN214226478U true CN214226478U (en) | 2021-09-17 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202120268674.5U Active CN214226478U (en) | 2021-01-29 | 2021-01-29 | Lighting fixture and lighting test system |
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|---|---|
| CN (1) | CN214226478U (en) |
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2021
- 2021-01-29 CN CN202120268674.5U patent/CN214226478U/en active Active
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