CN214174503U - Probe resistance value zero clearing device - Google Patents
Probe resistance value zero clearing device Download PDFInfo
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- CN214174503U CN214174503U CN202023019783.8U CN202023019783U CN214174503U CN 214174503 U CN214174503 U CN 214174503U CN 202023019783 U CN202023019783 U CN 202023019783U CN 214174503 U CN214174503 U CN 214174503U
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- probe
- conductive layer
- shaped hole
- layer
- strip
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Abstract
The utility model discloses a probe resistance zero clearing device, including electrically conductive, first conducting layer and second conducting layer, first conducting layer is used for contacting the electrical connection with first probe, and the position of the relative first conducting layer of first probe is adjustable, and the second conducting layer is used for being connected with second probe contact electricity, and the position of the relative second conducting layer of second probe is adjustable, and first conducting layer is connected with second conducting layer electricity through electrically conductive, and first conducting layer and second conducting layer are in the state of opening a way. The position of the probe resistance value zero clearing device is not required to be adjusted by adjusting the position of the first probe relative to the first conducting layer and the position of the second probe relative to the second conducting layer so as to correspond to the positions of different battery poles, and therefore the production efficiency is improved.
Description
Technical Field
The utility model relates to an electricity core test technical field, in particular to probe resistance zero clearing device.
Background
With the development of new energy automobiles, batteries become an important part of the new energy automobiles, and sorting testing is an indispensable link of a battery production process. And after the probe is connected with the tester, carrying out internal resistance detection on the battery. Before detection, the resistance value of the probe needs to be reset, the smaller the value of the resistance value zero clearing instrument is, the smaller the detection error of the battery is, the larger the value of the resistance value zero clearing instrument is, and the larger the detection error of the battery is. Therefore, the probe resistance value zero clearing device is a core component of the sorting test. In actual production, the types of batteries to be tested are different, and the positions of poles of the batteries are different, so that the positions of the probes for testing are different, and the probes need to be moved to adjust the positions of the probes. The existing probe resistance value zero clearing device needs to move along with the movement of the probe so as to correspond to the position of the probe, so that the device is very inconvenient and reduces the production efficiency.
SUMMERY OF THE UTILITY MODEL
Therefore, a probe resistance value zero clearing device is needed to be provided, and the technical problems that the probe resistance value zero clearing device needs to be moved to correspond to the position of a probe, so that inconvenience is caused, and production efficiency is reduced in the prior art are solved.
The utility model discloses a probe resistance zero clearing device, include:
a conductive member;
the first conducting layer is used for being in contact electrical connection with the first probe, and the position of the first probe relative to the first conducting layer is adjustable; and
the second conducting layer is used for being in contact electrical connection with the second probe, the position of the second probe relative to the second conducting layer is adjustable, the first conducting layer is electrically connected with the second conducting layer through the conducting piece, and the first conducting layer and the second conducting layer are in an open circuit state.
Furthermore, the probe resistance value zero clearing device further comprises an insulating layer, and the insulating layer is attached to and arranged between the first conducting layer and the second conducting layer.
Further, the insulating layers are detachably connected with the first conductive layer and the second conductive layer respectively.
Furthermore, the first conducting layer is provided with a first threaded hole, the insulating layer is provided with a second threaded hole, the second conducting layer is provided with a third threaded hole, the outer wall of the conducting piece is provided with threads, the conducting piece penetrates through the first threaded hole, the second threaded hole and the third threaded hole in sequence, and the conducting piece is in threaded connection with the first conducting layer, the insulating layer and the second conducting layer in sequence.
Further, first bar hole has been seted up to first conducting layer, second bar hole has been seted up to the insulating layer, the second probe can be through running through first bar hole with second bar hole with the second conducting layer contacts the electricity and is connected, just the second probe with the pore wall in first bar hole has the clearance, the second probe can be in first bar hole with the second bar is downthehole relative the second conducting layer removes, in order to adjust the second probe is relative the position of second conducting layer.
Further, a third strip-shaped hole is formed in the first conducting layer, a fourth strip-shaped hole is formed in the insulating layer, the second probe can penetrate through the third strip-shaped hole and the fourth strip-shaped hole and is electrically connected with the second conducting layer in a contacting mode, a gap is formed between the second probe and the hole wall of the third strip-shaped hole, the second probe can be arranged in the third strip-shaped hole and the fourth strip-shaped hole, the third strip-shaped hole is opposite to the first strip-shaped hole, and the fourth strip-shaped hole is opposite to the second strip-shaped hole.
Further, the third strip-shaped hole extends along the straight line where the first strip-shaped hole is located.
Furthermore, the first strip-shaped hole and the third strip-shaped hole are symmetrically arranged relative to the first threaded hole.
Further, the probe resistance value zero clearing device further comprises a base, wherein the base is arranged on the first conducting layer and/or the second conducting layer and is used for supporting the first conducting layer and/or the second conducting layer.
Further, the base is detachably connected with the first conducting layer and/or the second conducting layer.
The utility model discloses a probe resistance zero clearing device, first conducting layer is used for being connected with first probe contact electricity, the second conducting layer is used for being connected with second probe contact electricity, first conducting layer is connected with second conducting layer electricity through electrically conductive, and first conducting layer and second conducting layer are in the state of opening a way, the voltage of testing out is zero, the resistance of calculating also is zero, thereby realize the resistance of first probe and the resistance zero clearing of second probe, through the position of the relative first conducting layer of adjustment first probe, and the position of the relative second conducting layer of adjustment second probe, with the position of the battery utmost point post that corresponds the difference, need not to adjust the position of probe resistance zero clearing device, thereby improve production efficiency.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
Fig. 1 is an exploded view of a probe resistance value resetting device according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a probe resistance value resetting device according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of a first conductive layer in an embodiment of the present invention;
fig. 4 is a schematic structural diagram of a second conductive layer in an embodiment of the present invention;
fig. 5 is a schematic structural diagram of an insulating layer in an embodiment of the present invention.
The main components are as follows:
10. a probe resistance value zero clearing device; 100. a first conductive layer; 110. a first threaded hole; 120. a first bar-shaped hole; 130. a third strip-shaped hole; 200. a second conductive layer; 210. a third threaded hole; 300. a conductive member; 400. an insulating layer; 410. a second threaded hole; 420. a second bar-shaped hole; 430. a fourth aperture; 500. a base; 510. and a fourth threaded hole.
The objects, features and advantages of the present invention will be further described with reference to the accompanying drawings.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
It should be noted that all the directional indicators (such as upper, lower, left, right, front and rear … …) in the embodiment of the present invention are only used to explain the relative position relationship between the components, the motion situation, etc. in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indicator is changed accordingly.
In addition, the descriptions related to "first", "second", etc. in the present invention are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicit ly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, "and/or" in the whole text includes three schemes, taking a and/or B as an example, including a technical scheme, and a technical scheme that a and B meet simultaneously; in addition, the technical solutions in the embodiments may be combined with each other, but it must be based on the realization of those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should not be considered to exist, and is not within the protection scope of the present invention.
As shown in fig. 1 and fig. 2, in some embodiments, a probe resistance value clearing device 10 includes a conductive member 300, a first conductive layer 100, and a second conductive layer 200, where the first conductive layer 100 is configured to be in contact with and electrically connected to a first probe, and a position of the first probe relative to the first conductive layer 100 is adjustable, the second conductive layer 200 is configured to be in contact with and electrically connected to a second probe, and a position of the second probe relative to the second conductive layer 200 is adjustable, the first conductive layer 100 is electrically connected to the second conductive layer 200 through the conductive member 300, and the first conductive layer 100 and the second conductive layer 200 are in an open circuit state.
When the device works, the first conducting layer 100 is in contact electrical connection with the first probe, the second conducting layer 200 is in contact electrical connection with the second probe, the first conducting layer 100 is electrically connected with the second conducting layer 200 through the conducting piece 300, the first conducting layer 100 and the second conducting layer 200 are in an open circuit state, the tested voltage is zero, the calculated resistance is also zero, the resistance value of the first probe and the resistance value of the second probe are reset, the positions of the first probe relative to the first conducting layer 100 and the second probe relative to the second conducting layer 200 are adjusted to correspond to the positions of different battery poles, the position of the probe resistance value resetting device 10 does not need to be adjusted, and therefore production efficiency is improved.
Specifically, the first probe can move relative to the first conductive layer 100 to adjust the position of the first probe relative to the first conductive layer 100. More specifically, the first probe is used to output a current and the second probe is used to detect a voltage.
As shown in fig. 5, in some embodiments, the probe resistance value clearing device 10 further includes an insulating layer 400, and the insulating layer 400 is disposed between the first conductive layer 100 and the second conductive layer 200 in an attaching manner. Specifically, the insulating layer 400 may be made of, but not limited to, bakelite.
Further, the insulating layer 400 is detachably coupled to the first conductive layer 100 and the second conductive layer 200, respectively, thereby facilitating disassembly and assembly.
As shown in fig. 3 and 4, in some embodiments, the first conductive layer 100 is provided with a first threaded hole 110, the insulating layer 400 is provided with a second threaded hole 410, the second conductive layer 200 is provided with a third threaded hole 210, the outer wall of the conductive member 300 is provided with a thread, the conductive member 300 sequentially penetrates through the first threaded hole 110, the second threaded hole 410 and the third threaded hole 210, and the conductive member 300 is sequentially in threaded connection with the first conductive layer 100, the insulating layer 400 and the second conductive layer 200. Specifically, the conductive member 300 sequentially penetrates through the first, second, and third screw holes 110, 410, and 210, and the conductive member 300 is sequentially in threaded connection with the first conductive layer 100, the insulating layer 400, and the second conductive layer 200, thereby facilitating disassembly and assembly.
Further, the conductive members 300 are respectively screwed with the first conductive layer 100 and the second conductive layer 200, and the conductive members 300 are respectively in contact with the first conductive layer 100 and the second conductive layer 200, so that the first conductive layer 100 is electrically connected with the second conductive layer 200.
In some embodiments, the first conductive layer 100 has a first bar-shaped hole 120, the insulating layer 400 has a second bar-shaped hole 420, the second probe can be electrically connected to the second conductive layer 200 by penetrating through the first bar-shaped hole 120 and the second bar-shaped hole 420, and the second probe has a gap with the hole wall of the first bar-shaped hole 120, and the second probe can move relative to the second conductive layer 200 in the first bar-shaped hole 120 and the second bar-shaped hole 420 to adjust the position of the second probe relative to the second conductive layer 200. Specifically, a gap is formed between the second probe and the wall of the first bar-shaped hole 120, so that the second probe does not contact the first conductive layer 100 when penetrating through the first bar-shaped hole 120.
Further, the first conductive layer 100 is provided with a third strip-shaped hole 130, the insulating layer 400 is provided with a fourth strip-shaped hole 430, the second probe can be in contact with and electrically connected to the second conductive layer 200 by penetrating through the third strip-shaped hole 130 and the fourth strip-shaped hole 430, the second probe and the hole wall of the third strip-shaped hole 130 have a gap, the second probe can move relative to the second conductive layer 200 in the third strip-shaped hole 120 and the fourth strip-shaped hole 420, the third strip-shaped hole 130 is arranged relative to the first strip-shaped hole 120, and the fourth strip-shaped hole 430 is arranged relative to the second strip-shaped hole 420. Specifically, the third strip-shaped hole 130 is disposed opposite to the first strip-shaped hole 120, and the fourth strip-shaped hole 430 is disposed opposite to the second strip-shaped hole 420, so that the movable stroke of the second probe relative to the second conductive layer 200 is increased, the adjustment of different positions of the battery poles is satisfied, and the situation that the distance between the battery poles is too large and exceeds the moving range of the second probe relative to the second conductive layer 200 is avoided.
In some embodiments, the third stripe holes 130 extend along the straight line where the first stripe holes 120 are located. The fourth strip-shaped hole 430 extends along a straight line where the second strip-shaped hole 420 is located.
Specifically, the first bar-shaped hole 120 and the third bar-shaped hole 130 are symmetrically disposed with respect to the first threaded hole 110. The second strip-shaped hole 420 and the fourth strip-shaped hole 430 are symmetrically arranged relative to the second threaded hole 410.
In some embodiments, the probe resistance value clearing device 10 further includes a base 500, where the base 500 is disposed on the first conductive layer 100 and/or the second conductive layer 200, and the base 500 is used to support the first conductive layer 100 and/or the second conductive layer 200. Specifically, the base 500 may be, but not limited to, an insulating material, so as to prevent the first conductive layer 100 and/or the second conductive layer 200 from being magnetically interfered, thereby affecting the testing effect. More specifically, the base 500 may be made of, but not limited to, bakelite.
In some embodiments, base 500 is removably coupled to first conductive layer 100 and/or second conductive layer 200.
Specifically, the base 500 is provided with a fourth threaded hole 510, the conductive member 300 sequentially penetrates through the first threaded hole 110, the second threaded hole 410, the third threaded hole 210 and the fourth threaded hole 510, and the conductive member 300 is respectively in threaded connection with the first conductive layer 100, the insulating layer 400, the second conductive layer 200 and the base 500.
The above only be the preferred embodiment of the utility model discloses a not consequently restriction the utility model discloses a patent range, all are in the utility model discloses a conceive, utilize the equivalent structure transform of what the content was done in the description and the attached drawing, or direct/indirect application all is included in other relevant technical field the utility model discloses a patent protection within range.
Claims (10)
1. A probe resistance value resetting device, comprising:
a conductive member;
the first conducting layer is used for being in contact electrical connection with the first probe, and the position of the first probe relative to the first conducting layer is adjustable; and
the second conducting layer is used for being in contact electrical connection with the second probe, the position of the second probe relative to the second conducting layer is adjustable, the first conducting layer is electrically connected with the second conducting layer through the conducting piece, and the first conducting layer and the second conducting layer are in an open circuit state.
2. The probe resistance value clearing device according to claim 1, further comprising an insulating layer, wherein the insulating layer is attached and arranged between the first conductive layer and the second conductive layer.
3. The probe resistance value clearing device according to claim 2, wherein the insulating layers are detachably connected to the first conductive layer and the second conductive layer, respectively.
4. The probe resistance value clearing device according to claim 2, wherein the first conductive layer is provided with a first threaded hole, the insulating layer is provided with a second threaded hole, the second conductive layer is provided with a third threaded hole, the outer wall of the conductive member is provided with a thread, the conductive member sequentially penetrates through the first threaded hole, the second threaded hole and the third threaded hole, and the conductive member is sequentially in threaded connection with the first conductive layer, the insulating layer and the second conductive layer.
5. The probe resistance value clearing device according to claim 4, wherein the first conductive layer is provided with a first bar-shaped hole, the insulating layer is provided with a second bar-shaped hole, the second probe can be electrically connected with the second conductive layer by penetrating through the first bar-shaped hole and the second bar-shaped hole, a gap is formed between the second probe and a hole wall of the first bar-shaped hole, and the second probe can move relative to the second conductive layer in the first bar-shaped hole and the second bar-shaped hole to adjust a position of the second probe relative to the second conductive layer.
6. The probe resistance value clearing device according to claim 5, wherein the first conductive layer is provided with a third strip-shaped hole, the insulating layer is provided with a fourth strip-shaped hole, the second probe can be electrically connected with the second conductive layer by penetrating through the third strip-shaped hole and the fourth strip-shaped hole, a gap is formed between the second probe and a hole wall of the third strip-shaped hole, the second probe can move relative to the second conductive layer in the third strip-shaped hole and the fourth strip-shaped hole, the third strip-shaped hole is arranged opposite to the first strip-shaped hole, and the fourth strip-shaped hole is arranged opposite to the second strip-shaped hole.
7. The probe resistance value clearing device according to claim 6, wherein the third bar-shaped hole is provided extending along a straight line where the first bar-shaped hole is located.
8. The probe resistance value clearing device according to claim 7, wherein the first bar hole and the third bar hole are symmetrically arranged with respect to the first screw hole.
9. The probe resistance value clearing device according to claim 1, further comprising a base, wherein the base is disposed on the first conductive layer and/or the second conductive layer, and the base is configured to support the first conductive layer and/or the second conductive layer.
10. The probe resistance value clearing device according to claim 9, wherein the base is detachably connected to the first conductive layer and/or the second conductive layer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023019783.8U CN214174503U (en) | 2020-12-15 | 2020-12-15 | Probe resistance value zero clearing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023019783.8U CN214174503U (en) | 2020-12-15 | 2020-12-15 | Probe resistance value zero clearing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214174503U true CN214174503U (en) | 2021-09-10 |
Family
ID=77606269
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202023019783.8U Withdrawn - After Issue CN214174503U (en) | 2020-12-15 | 2020-12-15 | Probe resistance value zero clearing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214174503U (en) |
-
2020
- 2020-12-15 CN CN202023019783.8U patent/CN214174503U/en not_active Withdrawn - After Issue
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned | ||
| AV01 | Patent right actively abandoned | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20210910 Effective date of abandoning: 20230630 |
|
| AV01 | Patent right actively abandoned |
Granted publication date: 20210910 Effective date of abandoning: 20230630 |