CN214122403U - Testing device for electronic element on circuit board - Google Patents
Testing device for electronic element on circuit board Download PDFInfo
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- CN214122403U CN214122403U CN202023347492.1U CN202023347492U CN214122403U CN 214122403 U CN214122403 U CN 214122403U CN 202023347492 U CN202023347492 U CN 202023347492U CN 214122403 U CN214122403 U CN 214122403U
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- circuit board
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Abstract
The utility model discloses a testing device for electronic component on circuit board, comprising a base plate, a guide post arranged on the base plate, a top plate sleeved on the guide post and capable of being lifted, a carrier plate which is sleeved on the guide post and positioned between the top plate and the base plate and used for bearing the circuit board and an elastic part abutted between the carrier plate and the base plate, a lower test needle and a lower connecting needle which are arranged in the base plate, a first through hole which is arranged in the carrier plate and used for being passed through by the lower test needle and the lower connecting needle in a one-to-one correspondence manner, an upper test needle and an upper connecting needle which are arranged in the top plate and connected by a one-to-one correspondence circuit, a abutting part which is arranged on the top plate and used for abutting the circuit board downwards and a driving component used for driving the top plate to ascend and descend; the upper transfer pins are correspondingly positioned right above the lower transfer pins. The utility model relates to a testing arrangement can avoid pushing down the in-process and cause the damage to circuit board and lower test needle, and can test the electronic component on circuit board two sides simultaneously, and efficiency of software testing is higher.
Description
Technical Field
The utility model relates to a testing arrangement for electronic component on circuit board.
Background
When detecting parameters (such as resistance, capacitance, inductance and the like) of electronic elements on a circuit board, the circuit board needs to be driven to move downwards, so that the electronic elements on the lower surface of the circuit board are abutted to the needle point of a testing needle below the circuit board, the lower end of the testing needle is connected with a testing instrument, and the detection of the parameters of the electronic elements is completed through the testing needle.
Because the needle point of the test needle is fragile, the direct rigid pressing of the circuit board not only easily damages the test needle, but also easily damages the electronic element abutted to the test needle.
Because the test instrument structure of connecting the test needle is complicated and the cost is higher, can't install in the roof top. Therefore, after the detection is completed, the circuit board needs to be turned over, and then the parameters of the electronic element on the other surface of the circuit board need to be detected.
Disclosure of Invention
The utility model aims at providing a testing arrangement for electronic component on circuit board can avoid pushing down the in-process and cause the damage to circuit board and lower test needle, and can test the electronic component on two sides about the circuit board simultaneously, and efficiency of software testing is higher.
In order to achieve the above purpose, the utility model adopts the technical scheme that:
a testing device for electronic elements on a circuit board comprises a bottom plate, a guide post arranged on the bottom plate, a top plate sleeved on the guide post in a lifting manner, a carrier plate sleeved on the guide post in a lifting manner and positioned between the top plate and the bottom plate and used for bearing the circuit board, an elastic piece abutted between the carrier plate and the bottom plate, a lower testing pin and a lower connecting pin which are arranged in the bottom plate in a penetrating manner, first through holes which are arranged in the carrier plate and used for the lower testing pin and the lower connecting pin to penetrate through in a one-to-one corresponding manner, an upper testing pin and an upper connecting pin which are arranged in the top plate and connected with a circuit in a one-to-one corresponding manner, a pressing piece arranged on the top plate and used for pressing the circuit board downwards, and a driving assembly used for driving the top plate to lift;
the upper transfer needles are correspondingly positioned right above the lower transfer needles.
Preferably, the lower test pin and the lower connecting pin are equal in height, and when the elastic member is in a free state, the upper surface of the carrier plate is higher than the top ends of the lower test pin and the lower connecting pin.
More preferably, when the elastic member is in a free state, the top ends of the lower test pin and the lower connecting pin are located in the first through hole.
Preferably, the pressing element comprises a cylindrical body with an upper end connected to the top plate, and a conical bottom connected to a lower end of the cylindrical body and tapering downward.
More preferably, the bottom of the conical bottom is a plane.
Preferably, the drive assembly comprises a servo motor.
Because of above-mentioned technical scheme's application, compared with the prior art, the utility model have the following advantage: the utility model relates to a testing arrangement for electronic component on circuit board, through setting up the elastic component between support plate and bottom plate, when the roof pushes down, support the circuit board elasticity, through the effective protection circuit board of elastic buffer; meanwhile, the circuit board is in elastic butt joint with the needle points of the upper test needle and the lower test needle, so that the upper test needle and the lower test needle can be prevented from being damaged in the pressing process; the electronic elements on the upper surface and the lower surface of the circuit board can be tested simultaneously through the upper test needle and the lower test needle, and the test efficiency is high.
Drawings
Fig. 1 is a schematic structural diagram of the device of the present invention.
Wherein: 1. a base plate; 2. a guide post; 3. a top plate; 4. a carrier plate; 5. a circuit board; 6. an elastic member; 7. a test needle is arranged; 8. downwards transferring a needle; 9. mounting a test pin; 10. transferring the needle upwards; 11. the pressing piece.
Detailed Description
The technical solution of the present invention will be further explained with reference to the accompanying drawings.
Referring to fig. 1, the testing apparatus for electronic components on a circuit board includes a bottom plate 1, a guiding post 2 disposed on the bottom plate 1, a top plate 3 capable of being lifted and sleeved on the guiding post 2, and a carrier plate 4 capable of being lifted and sleeved on the guiding post 2 and located between the top plate 3 and the bottom plate 1, where the carrier plate 4 is used to carry a circuit board 5.
In the present embodiment, the guide posts 2 are provided in a plurality of parallel and vertically extending positions. The top plate 3, the carrier plate 4 and the bottom plate 1 are sequentially arranged at intervals from top to bottom.
The testing device for the electronic element on the circuit board further comprises an elastic piece 6, a lower testing pin 7 and a lower connecting pin 8, wherein the elastic piece 6 is arranged between the support plate 4 and the bottom plate 1 in a butting mode, the lower testing pin 7 and the lower connecting pin 8 are fixed and penetrate through the bottom plate 1, first through holes are formed in the support plate 4 and used for being penetrated through by the lower testing pin 7 and the lower connecting pin 8 in a one-to-one correspondence mode, upper testing pins 9 and upper connecting pins 10 are fixed and penetrate through the top plate 3 and are connected with a circuit in a one-to-one correspondence mode, and the upper connecting pins 10 are located right above the lower connecting pins 8 in a.
The top end of the lower test needle 7 upwards penetrates through the bottom plate 1 and the first through hole and then abuts against the electronic element on the lower surface of the circuit board 5, and the bottom end of the lower test needle 7 downwards penetrates out of the bottom plate 1 and is connected with a test instrument.
The top of the lower transfer needle 8 upwards penetrates through the bottom plate 1 and the first through hole and then abuts against the bottom end of the upper transfer needle 10, and the bottom end of the lower transfer needle 8 downwards penetrates out of the bottom plate 1 to be connected with a test instrument. The parameters of the surface electronic elements on the circuit board 5 are detected through the lower connecting pins 8, the upper connecting pins 10 and the upper testing pins 9.
In the present embodiment, referring to fig. 1, the upper test pin 9 and the lower test pin 7 are respectively located at upper and lower sides of the circuit board 5. The upper transfer pins 10 and the lower transfer pins 8 are located on the left side of the circuit board 5.
In this embodiment, the lower test needles 7 and the lower connecting needles 8 are equal in height, and when the elastic member 6 is in the free state, the upper surface of the carrier plate 4 is higher than the top ends of the lower test needles 7 and the lower connecting needles 8.
The elastic piece 6 is arranged between the carrier plate 4 and the bottom plate 1, so that the circuit board 5 is elastically pressed when the top plate 3 is pressed downwards, and the circuit board 5 is effectively protected by elastic buffering; simultaneously, circuit board 5 can avoid pushing down the in-process and cause the damage to last test needle 9 and test needle 7 down to the needle point elasticity butt of last test needle 9 and test needle 7 down. After the test is accomplished, roof 3 upwards resets, and under the drive of the elastic component 6 elasticity power, support plate 4 rises to reset and rise to test needle 7 under and under 8 tops of spigots under, has played the guard action to testing needle 7 under and spigots under 8, can prevent to test under 7 and spigots under 8 by the mistake touch damage. At this time, the upper connecting pin 10 and the lower connecting pin 8 are separated from each other, and the upper testing pin 9 and the lower testing pin 7 are separated from the circuit board 5.
In this embodiment, when the elastic member 6 is in the free state, the top ends of the lower test pin 7 and the lower connecting pin 8 are located in the first through hole. That is, the top ends of the lower test pin 7 and the lower connecting pin 8 are lower than the upper surface of the carrier plate 4 and higher than the lower surface of the carrier plate 4, and by this arrangement, the lower test pin 7 and the lower connecting pin 8 can be further protected.
The testing device for the electronic components on the circuit board further comprises a pressing member 11 arranged on the top plate 3 and used for pressing the circuit board 5 downwards, and a driving assembly (not shown in the figure) used for driving the top plate 3 to lift. In this embodiment, the drive assembly includes a servo motor.
In the present embodiment, the pressing member 11 includes a cylindrical body having an upper end connected to the top plate 3, and a conical bottom connected to a lower end of the cylindrical body and tapering downward. Through this setting, because the cylindricality body is thicker, can be used for realizing the installation between 3 with the roof, the awl end is then used for realizing the accurate pressure to circuit board 5 upper surface. The cylindrical body and the conical bottom are integrally formed.
The bottom of the conical bottom is a plane so as to realize surface-to-surface contact with the upper surface of the circuit board 5. Avoiding point-to-surface contact damaging the circuit board 5.
The above embodiments are only for illustrating the technical concept and features of the present invention, and the purpose of the embodiments is to enable people skilled in the art to understand the contents of the present invention and to implement the present invention, which cannot limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered by the protection scope of the present invention.
Claims (6)
1. A test apparatus for electronic components on a circuit board, comprising: the device comprises a bottom plate, a guide post arranged on the bottom plate, a top plate sleeved on the guide post in a lifting manner, a support plate sleeved on the guide post in a lifting manner and positioned between the top plate and the bottom plate and used for bearing a circuit board, an elastic piece abutted between the support plate and the bottom plate, a lower test needle and a lower connecting needle which are arranged in the bottom plate in a penetrating manner, first through holes which are arranged in the support plate and used for being penetrated by the lower test needles and the lower connecting needles in a one-to-one corresponding manner, an upper test needle and an upper connecting needle which are arranged in the top plate in a penetrating manner and connected with a circuit in a one-to-one corresponding manner, a pressing piece arranged on the top plate and used for pressing the circuit board downwards, and a driving assembly used for driving the top plate to lift;
the upper transfer needles are correspondingly positioned right above the lower transfer needles.
2. A test apparatus for electronic components on a circuit board according to claim 1, wherein: the lower test needle and the lower connecting needle are equal in height, and when the elastic piece is in a free state, the upper surface of the carrier plate is higher than the top ends of the lower test needle and the lower connecting needle.
3. A test apparatus for electronic components on a circuit board according to claim 2, wherein: when the elastic piece is in a free state, the top ends of the lower test needle and the lower connecting needle are positioned in the first through hole.
4. A test apparatus for electronic components on a circuit board according to claim 1, wherein: the pressing piece comprises a cylindrical body with the upper end connected to the top plate and a conical bottom which is connected to the lower end of the cylindrical body and gradually shrinks in a conical mode downwards.
5. A test apparatus for electronic components on a circuit board according to claim 4, wherein: the bottom of the cone bottom is a plane.
6. A test apparatus for electronic components on a circuit board according to claim 1, wherein: the drive assembly includes a servo motor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023347492.1U CN214122403U (en) | 2020-12-31 | 2020-12-31 | Testing device for electronic element on circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023347492.1U CN214122403U (en) | 2020-12-31 | 2020-12-31 | Testing device for electronic element on circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214122403U true CN214122403U (en) | 2021-09-03 |
Family
ID=77493202
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202023347492.1U Active CN214122403U (en) | 2020-12-31 | 2020-12-31 | Testing device for electronic element on circuit board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214122403U (en) |
-
2020
- 2020-12-31 CN CN202023347492.1U patent/CN214122403U/en active Active
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