CN214122353U - Electronic components pin testing arrangement - Google Patents

Electronic components pin testing arrangement Download PDF

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Publication number
CN214122353U
CN214122353U CN202022261686.3U CN202022261686U CN214122353U CN 214122353 U CN214122353 U CN 214122353U CN 202022261686 U CN202022261686 U CN 202022261686U CN 214122353 U CN214122353 U CN 214122353U
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CN
China
Prior art keywords
test
subassembly
block
component
push down
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Active
Application number
CN202022261686.3U
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Chinese (zh)
Inventor
陈伟
徐勇
叶建国
韩宙
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Jiangyin Hengdela Technology Co ltd
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Jiangyin Hengdela Technology Co ltd
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Priority to CN202022261686.3U priority Critical patent/CN214122353U/en
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Publication of CN214122353U publication Critical patent/CN214122353U/en
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Abstract

The utility model discloses an electronic components pin testing arrangement, comprising a base plate, be provided with test platform on the bottom plate, both sides are provided with carousel and fixed bolster respectively around test platform, be provided with a plurality of rotatory stations on the carousel, be provided with the anchor clamps subassembly on the rotatory station, the product of awaiting measuring has been placed in the anchor clamps subassembly, be provided with the test subassembly and the push down subassembly of arranging from top to bottom on the fixed bolster, push down the subassembly and cooperate with the anchor clamps subassembly and be used for fixing a position the product of awaiting measuring on test platform, the test subassembly is used for carrying out the pin test to the product of awaiting measuring after the location. The utility model relates to an electronic components pin testing arrangement has the advantage that reduces pin test error, improves work efficiency, reduces the cost of labor.

Description

Electronic components pin testing arrangement
Technical Field
The utility model belongs to the technical field of electronic components tests, concretely relates to electronic components pin testing arrangement.
Background
In the production and manufacturing process of the electronic component, pin testing needs to be performed on the packaged electronic component. According to the traditional test method, the pins of the packaged electronic component product are tested by manually adopting corresponding measuring tools, so that the test error is large, the working efficiency is low, the labor cost is high, and the economic benefit of an enterprise cannot be improved.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide an electronic components pin testing arrangement to the test error who proposes in solving above-mentioned background art is big, work efficiency is low, the cost of labor is high, leads to the economic benefits of enterprise can't obtain the problem that improves.
In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides an electronic components pin testing arrangement, includes the bottom plate, be provided with test platform on the bottom plate, both sides are provided with carousel and fixed bolster respectively around test platform, be provided with a plurality of rotatory stations on the carousel, be provided with the anchor clamps subassembly on the rotatory station, the product of awaiting measuring has been placed in the anchor clamps subassembly, be provided with the test subassembly and the push down subassembly of arranging from top to bottom on the fixed bolster, push down the subassembly and cooperate with the anchor clamps subassembly and be used for fixing a position the product of awaiting measuring on test platform, the test subassembly is used for carrying out the pin test to the product of awaiting measuring after the location.
Further, the test assembly includes the ascending test assembly cylinder of output, the test assembly cylinder sets up in the trailing flank of fixed bolster, the output of test assembly cylinder is provided with the test assembly elevator, the leading flank sliding connection of test assembly elevator and fixed bolster, two bumping posts about being provided with downwards on the test assembly elevator, be provided with the test assembly second connecting block between the bottom of controlling two bumping posts, be provided with the test seat on the test assembly second connecting block, be provided with about two downwardly extending's test piece on the test seat.
Furthermore, a buffer spring is sleeved on the buffer column.
Furthermore, the push-down assembly comprises a push-down assembly cylinder with an upward output end, a push-down assembly lifting block is arranged at the output end of the push-down assembly cylinder, the push-down assembly lifting block is connected with the front side face of the fixed support in a sliding mode, and a push-down block extending to the test platform is arranged at the top of the push-down assembly lifting block.
Furthermore, two fixed blocks about the top of push down subassembly lifter are provided with, about two fixed blocks respectively with the left and right sides fixed connection of fixed bolster, about two fixed blocks respectively with push down the subassembly lifter about be provided with the push down subassembly guide post between the left and right sides, the bottom of push down the subassembly guide post is worn to adorn in the push down subassembly lifter, the cover is equipped with the push down subassembly spring on the push down subassembly guide post.
Furthermore, the fixture component comprises a flat fixed plate, the outer section of the fixed plate is connected with the rotary table, a fixture component fixing seat is arranged on the outer section of the fixed plate, a moving block which is connected with the fixed plate in a sliding mode is arranged on the inner section of the fixed plate, a left fixture component guide column and a right fixture component guide column are arranged between the outer end of the moving block and the fixture component fixing seat, the outer ends of the fixture component guide columns are arranged in the fixture component fixing seat in a penetrating mode, fixture component springs are sleeved on the fixture component guide columns, a fixture component fixing block is arranged at the inner end of the moving block, a clamping block extending towards the test platform is arranged on the fixture component fixing block, and a placing groove is formed in the top surface of the clamping block.
Furthermore, guide blocks are arranged downwards on the left side and the right side of the moving block.
Furthermore, the fixed support comprises a base, and a vertical supporting plate is arranged on the front side of the base.
Furthermore, a reinforcing plate is arranged between the rear side of the base and the rear side face of the supporting plate.
Compared with the prior art, the utility model provides an electronic components pin testing arrangement possesses following beneficial effect:
the utility model relates to an electronic components pin testing arrangement, its degree of automation is high, need not artifical manual test, can effectively reduce pin test error, improve work efficiency, reduce the cost of labor to improve the economic benefits of enterprise.
Drawings
The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention, and together with the description, do not constitute a limitation of the invention, in which:
fig. 1 is a schematic structural diagram of a pin testing device for electronic components according to the present invention;
FIG. 2 is an enlarged view of the structure of FIG. 1 with the bottom plate removed;
FIG. 3 is a front view of FIG. 2;
FIG. 4 is a side view of FIG. 2;
fig. 5 is a schematic structural diagram of an electronic component product.
In the figure:
a base plate 1;
a support base 2;
a test platform 3;
a fixed bracket 4; a base 401; a support plate 402; a reinforcing plate 403;
a test component 5; a test assembly cylinder 501; a test assembly rail 502; a test assembly slider 503; a test assembly elevator block 504; a test component first connection block 505; a buffer column 506; a test component second connection block 507; a test component holder 508; a test socket 509; a test strip 510; a buffer spring 511;
the pressing component 6; a hold-down assembly cylinder 601; a hold down assembly elevator 602; a fixed block 603; a hold-down assembly guide post 604; a hold down assembly spring 605; a briquetting 606;
a clamp assembly 7; a fixing plate 701; a clamp assembly mount 702; a clamp assembly rail 703; a gripper assembly slide 704; a movement block 705; clamp assembly guide posts 706; clamp assembly springs 707; a clamp assembly securing block 708; a clamp assembly first connection block 709; a clamping block 710; a guide block 711; a clamp assembly second connection block 712;
a product to be tested 8; a product body 801; a leg 802; and a pin 803.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-5, the present invention provides a technical solution: a pin testing device for electronic components comprises a bottom plate 1, wherein a supporting seat 2 is arranged on the bottom plate 1, a testing platform 3 is arranged at the top of the supporting seat 2, a coil is arranged in the testing platform 3, a turntable (not shown in the figure) and a fixing support 4 are respectively arranged on the front side and the rear side of the supporting seat 2, a plurality of rotating stations are arranged on the turntable, a clamp assembly 7 is arranged on each rotating station, a product 8 to be tested is placed in each clamp assembly 7, a testing assembly 5 and a pressing assembly 6 which are vertically arranged are arranged on each fixing support 4, the pressing assembly 6 is matched with each clamp assembly 7 to position the product 8 to be tested on the testing platform 3, and the testing assembly 5 is used for testing pins of the positioned product 8 to be tested;
the product 8 to be tested comprises a product body 801, wherein the left end and the right end of the product body 801 are provided with support legs 802 bent downwards, and the bottom ends of the support legs 802 are outwards provided with pins 803;
preferably, four rotating stations are uniformly arranged on the turntable;
the fixed support 4 comprises a base 401, the front side of the base 401 is provided with a vertical support plate 402, and the front side of the support plate 402 is provided with a test component 5 and a pressing component 6 which are arranged up and down;
a reinforcing plate 403 is arranged between the rear side of the base 401 and the rear side of the supporting plate 402;
the top surface of the supporting plate 402 is higher than the upper surface of the testing platform 3;
the test component 5 comprises a test component cylinder 501 with an upward output end, the test component cylinder 501 is arranged at the upper section of the rear side surface of the support plate 402, a vertically arranged test component guide rail 502 is arranged on the front side surface of the support plate 402, an upper test component slide block 503 and a lower test component slide block 503 are arranged on the test component guide rail 502, a test component lifting block 504 is arranged on the test component slide block 503 positioned above, a first test component connecting block 505 is arranged between the output end of the test component cylinder 501 and the top of the test component lifting block 504, a left buffer column and a right buffer column 506 are downwards arranged at the bottom of the test component lifting block 504, a second test component connecting block 507 is arranged between the bottom ends of the left buffer column and the right buffer column 506, the second test component connecting block 507 is connected with the test component slide block 503 positioned below, and a test component fixing seat 508 is arranged on the second test component connecting block 507, a test seat 509 is arranged on the front side surface of the test component fixing seat 508, and a left test piece 510 and a right test piece 510 which extend downwards are arranged on the test seat 509;
the buffer column 506 is sleeved with a buffer spring 511;
the pressing component 6 comprises a pressing component cylinder 601 with an upward output end, the pressing component cylinder 601 is arranged at the lower section of the front side surface of the support plate 402, the pressing component cylinder 601 is positioned below the test component guide rail 502, the output end of the pressing component cylinder 601 is provided with a pressing component lifting block 602, the pressing component lifting block 602 is connected with the lower section of the test component guide rail 502 in a sliding manner, the top of the front side surface of the pressing component lifting block 602 is provided with a pressing block 606 extending towards the test platform 3, a left fixing block 603 and a right fixing block 603 are arranged above the pressing component lifting block 602, the left fixing block 603 and the right fixing block 603 are respectively fixedly connected with the left side and the right side of the support plate 402, a pressing component guide column 604 is arranged between the left fixing block 603 and the right side of the pressing component lifting block 602, and the bottom end of the pressing component guide column 604 is penetrated in the pressing component lifting block 602, a pressing component spring 605 is sleeved on the pressing component guide column 604;
the clamp assembly 7 comprises a flat fixed plate 701, the outer section (inner section close to the test platform and outer section far from the test platform) of the fixed plate 701 is connected with the top surface of the turntable, the outer section of the top surface of the fixed plate 701 is provided with a clamp assembly fixing seat 702, the inner section of the top surface of the fixed plate 701 is provided with a clamp assembly guide rail 703, the clamp assembly guide rail 703 is arranged along the length direction of the fixed plate 701, the clamp assembly guide rail 703 is provided with a clamp assembly sliding block 704, the clamp assembly sliding block 704 is provided with a moving block 705, a left clamp assembly guide column 706 and a right clamp assembly guide column 706 are arranged between the outer end of the moving block 705 and the clamp assembly fixing seat 702, the outer end of the clamp assembly guide column 706 is penetrated in the clamp assembly fixing seat 702, the clamp assembly guide column 706 is sleeved with a clamp assembly spring 707, and the inner end of the moving block 705 is provided with a clamp assembly fixing block 708, a first clamp assembly connecting block 709 is arranged at the bottom of the clamp assembly fixing block 708, a clamping block 710 extending towards the test platform 3 is arranged at the bottom of the first clamp assembly connecting block 709, and a placing groove is arranged on the top surface of the clamping block 710;
guide blocks 711 are downwardly arranged at the left side and the right side of the moving block 705, a second connecting block 712 of the clamp assembly is arranged between the two guide blocks 711, and the opposite surfaces of the two guide blocks 711 are respectively contacted with the left side and the right side of the fixing plate 701.
The working principle is as follows:
the product A to be tested, the product B to be tested, the product C to be tested and the product D to be tested are respectively placed in four clamp assemblies, namely, a product body is placed in a placing groove of a clamping block, a left supporting leg and a right supporting leg of the product body are exposed on the left side and the right side of the placing groove, firstly, a turntable rotates to enable the clamping block for placing the product A to be tested to rotate to a testing platform, namely, the product A to be tested is arranged right below a lower pressing block, a left pin and a right pin of the product A to be tested are arranged on a testing station of the testing platform, at the moment, a lower pressing assembly cylinder retracts to drive the lower pressing block to move downwards, downward pressing force is generated on the top of the product body of the product A to be tested, the lower pressing block is matched with the clamping block to enable the product A to be tested to be clamped and fixed, then, the testing assembly cylinder retracts to drive a testing seat to move downwards, so that the left testing sheet and the right testing sheet are respectively contacted with the left pin and the right pin of the product A to be tested, the pin testing of the product A to be tested is realized to form the tested product A, after the pin testing is finished, the testing assembly cylinder extends out to drive the testing seat to move upwards so as to separate the testing sheet from the pins of the tested product A, then the pressing assembly cylinder extends out to drive the pressing block to move upwards, namely, the pressing force on the tested product A is cancelled, the moving block slides outwards along the guide rail of the clamp assembly manually, the clamping block moves outwards and transversely, so that the tested product A is manually transferred to the next procedure after being far away from the testing station;
rotating the turntable by 90 degrees to enable the clamping block for placing the product B to be tested to rotate to the test platform, namely the product B to be tested is positioned right below the lower pressing block, the left pin and the right pin of the product B to be tested are positioned on the test station of the test platform, and repeating the operation steps to test the pins of the product B to be tested;
and then the turntable rotates for 90 degrees again, so that the clamping block for placing the product C to be tested rotates to the test platform, and the automatic pin test of a plurality of products to be tested such as the product C to be tested can be realized by repeating the operation steps.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (9)

1. The utility model provides an electronic components pin testing arrangement which characterized in that: including bottom plate (1), be provided with test platform (3) on bottom plate (1), both sides are provided with carousel and fixed bolster (4) respectively around test platform (3), be provided with a plurality of rotatory stations on the carousel, be provided with anchor clamps subassembly (7) on the rotatory station, product (8) to be measured have been placed in anchor clamps subassembly (7), be provided with test assembly (5) and the push down subassembly (6) of arranging from top to bottom on fixed bolster (4), push down subassembly (6) and anchor clamps subassembly (7) cooperate and be used for fixing a position product (8) to be measured on test platform (3), test assembly (5) are used for carrying out the pin test to product (8) to be measured after the location.
2. The pin testing device for the electronic component as claimed in claim 1, wherein: test assembly (5) are including the ascending test assembly cylinder (501) of output, test assembly cylinder (501) set up in the trailing flank of fixed bolster (4), the output of test assembly cylinder (501) is provided with test assembly elevator (504), the leading flank sliding connection of test assembly elevator (504) and fixed bolster (4), two bumping post (506) about being provided with on test assembly elevator (504) downwards, be provided with between the bottom of two bumping post (506) about, test assembly second connecting block (507), be provided with test socket (509) on test assembly second connecting block (507), test socket (509) are last to be provided with about two downwardly extending's test piece (510).
3. The pin testing device for the electronic component as claimed in claim 2, wherein: the buffer column (506) is sleeved with a buffer spring (511).
4. The pin testing device for the electronic component as claimed in claim 1, wherein: push down subassembly (6) including the ascending subassembly cylinder (601) that pushes down of output, the output that pushes down subassembly cylinder (601) is provided with pushes down subassembly elevator (602), push down subassembly elevator (602) and the leading flank sliding connection of fixed bolster (4), the top of pushing down subassembly elevator (602) is provided with briquetting (606) down to test platform (3) extension.
5. The pin testing device for the electronic component as claimed in claim 4, wherein: two fixed blocks (603) about being provided with of push down subassembly lifter (602), two fixed blocks (603) of controlling respectively with the left and right sides fixed connection of fixed bolster (4), it pushes down subassembly guide post (604) to be provided with between two fixed blocks (603) of controlling respectively and the left and right sides of push down subassembly lifter (602), the bottom of pushing down subassembly guide post (604) is worn to adorn in push down subassembly lifter (602), it is equipped with push down subassembly spring (605) to go up the cover on push down subassembly guide post (604).
6. The pin testing device for the electronic component as claimed in claim 1, wherein: the clamp assembly (7) comprises a flat fixing plate (701), the outer section of the fixing plate (701) is connected with the rotary table, the outer section of the fixed plate (701) is provided with a fixture component fixing seat (702), the inner section of the fixed plate (701) is provided with a moving block (705) which is connected with the fixed plate (701) in a sliding way, a left clamp component guide post and a right clamp component guide post (706) are arranged between the outer end of the moving block (705) and the clamp component fixing seat (702), the outer end of the guide post (706) of the clamp component is arranged in the fixed seat (702) of the clamp component in a penetrating way, a clamp component spring (707) is sleeved on the clamp component guide post (706), the inner end of the moving block (705) is provided with a clamp component fixing block (708), the clamp component fixing block (708) is provided with a clamping block (710) extending towards the test platform (3), and the top surface of the clamping block (710) is provided with a placing groove.
7. The pin testing device for the electronic component as claimed in claim 6, wherein: guide blocks (711) are arranged downwards on the left side and the right side of the moving block (705).
8. The pin testing device for the electronic component as claimed in claim 1, wherein: the fixing support (4) comprises a base (401), and a vertical supporting plate (402) is arranged on the front side of the base (401).
9. The pin testing device for the electronic component as claimed in claim 8, wherein: a reinforcing plate (403) is arranged between the rear side of the base (401) and the rear side of the supporting plate (402).
CN202022261686.3U 2020-10-12 2020-10-12 Electronic components pin testing arrangement Active CN214122353U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202022261686.3U CN214122353U (en) 2020-10-12 2020-10-12 Electronic components pin testing arrangement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202022261686.3U CN214122353U (en) 2020-10-12 2020-10-12 Electronic components pin testing arrangement

Publications (1)

Publication Number Publication Date
CN214122353U true CN214122353U (en) 2021-09-03

Family

ID=77498191

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202022261686.3U Active CN214122353U (en) 2020-10-12 2020-10-12 Electronic components pin testing arrangement

Country Status (1)

Country Link
CN (1) CN214122353U (en)

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