CN214122274U

CN214122274U - Anti-seismic device of atomic force microscope

Info

Publication number: CN214122274U
Application number: CN202022614452.2U
Authority: CN
Inventors: 张丽; 李天军
Original assignee: Shaoxing Interfer Photoelectric Technology Co ltd
Current assignee: Shaoxing Interfer Photoelectric Technology Co ltd
Priority date: 2020-11-12
Filing date: 2020-11-12
Publication date: 2021-09-03
Anticipated expiration: 2030-11-12

Abstract

The utility model provides an atomic force microscope's antidetonation device belongs to atomic force microscope accessory technical field. The shock absorption device comprises a cylindrical base, wherein a shock absorption groove is formed in the base, a mounting seat is arranged in the shock absorption groove, an upward convex upper positioning column is arranged in the middle of the mounting seat, a plurality of clamping assemblies are further arranged on the mounting seat, and a shock absorption assembly is arranged in the shock absorption groove. Atomic force microscope places on the mount pad, goes up the recess that the reference column can cooperate atomic force microscope bottom and can fix a position atomic force microscope, and a plurality of clamping component can fix atomic force microscope on the mount pad, and the shock attenuation subassembly of shock attenuation inslot can reduce the external vibrations of transmitting mount pad and atomic force microscope department to improve and detect the precision.

Description

Anti-seismic device of atomic force microscope

Technical Field

The utility model belongs to the technical field of atomic force microscope accessory, a atomic force microscope's antidetonation device is related to.

Background

Atomic Force microscope, AFM, an analytical instrument that can be used to study the surface structure of solid materials, including insulators. The surface structure and properties of a substance are studied by detecting the extremely weak interatomic interaction force between the surface of a sample to be measured and a miniature force sensitive element. One end of a pair of micro cantilevers which are extremely sensitive to weak force is fixed, the micro needle point at the other end is close to a sample, at the moment, the micro needle point interacts with the sample, and the acting force enables the micro cantilevers to deform or change in motion state. When a sample is scanned, the sensor is used for detecting the changes, so that the distribution information of the acting force can be obtained, and the information of the surface appearance structure and the surface roughness can be obtained with the nanometer resolution. However, the atomic force microscope in the prior art is easy to influence the detection data due to external vibration when in use.

In order to overcome the deficiencies of the prior art, various solutions have been proposed through continuous research, such as chinese patent disclosing a simple spring suspension device for atomic force microscope [ application No.: 201820327449.2], the AFM base is suspended on the upper part of the frame body through columnar tension springs uniformly and circumferentially arranged at the upper end of the AFM base, the distance between the lower end face of the AFM base and the lower end face of the frame body is 2-10cm, and the included angle range of the central axes of two adjacent columnar tension springs is 30-45 degrees; the utility model discloses can compare favourably active shock attenuation platform completely, very big reduction atomic force microscope's cost, convenient to use has improved the stability in use of instrument.

SUMMERY OF THE UTILITY MODEL

The utility model aims at the above-mentioned problem, provide an atomic force microscope's antidetonation device.

In order to achieve the above purpose, the utility model adopts the following technical proposal:

the utility model provides an atomic force microscope's antidetonation device, is including being columniform base, the base on be equipped with the shock attenuation groove, the shock attenuation inslot be equipped with the mount pad, mount pad middle part be equipped with the convex reference column of going up that makes progress, the mount pad on still be equipped with a plurality of clamping component, the shock attenuation inslot be equipped with damper.

In foretell atomic force microscope's antidetonation device, damper include a plurality of constant head tanks that set up in the mount pad bottom along circumference, the damper bottom be equipped with a plurality of lower reference columns with the constant head tank one-to-one, lower reference column insert to the constant head tank in, and still be equipped with the elastic component in the constant head tank.

In the anti-seismic device of the atomic force microscope, the elastic part is a first spring, and two ends of the first spring are fixedly connected with the lower positioning column and the positioning groove respectively.

In the anti-seismic device of the atomic force microscope, the damping assembly further comprises a plurality of second springs arranged along the circumferential direction, and two ends of each second spring are fixedly connected with the bottom of the damping groove and the bottom of the mounting seat respectively.

In the anti-seismic device of the atomic force microscope, the plurality of clamping components are circumferentially arranged on the mounting seat, the side wall of the mounting seat is further provided with a plurality of mounting grooves, and the clamping components are arranged in the mounting grooves.

In the anti-seismic device for the atomic force microscope, the clamping assembly comprises a clamping driver arranged in the mounting groove, the clamping driver is provided with an output shaft capable of lifting along the vertical direction, and the end part of the output shaft of the clamping driver is connected with the clamping plate.

In the anti-seismic device of the atomic force microscope, the section of the clamping plate is in an isosceles trapezoid shape, and the bottom of the clamping plate is further provided with the positioning rod.

In the anti-seismic device of the atomic force microscope, two limiting grooves are further arranged on two sides of the positioning groove, and two limiting blocks which are respectively inserted into the limiting grooves are further arranged on two sides of the lower positioning column.

In the anti-vibration device for the atomic force microscope, the cross sections of the damping groove and the mounting seat are circular.

In the anti-vibration device for the atomic force microscope, the cross sections of the upper positioning column and the positioning rod are circular.

Compared with the prior art, the utility model has the advantages of:

1. atomic force microscope places on the mount pad, goes up the recess that the reference column can cooperate atomic force microscope bottom and can fix a position atomic force microscope, and a plurality of clamping component can fix atomic force microscope on the mount pad, and the shock attenuation subassembly of shock attenuation inslot can reduce the external vibrations of transmitting mount pad and atomic force microscope department to improve and detect the precision.

2. The lower positioning column is matched with the positioning groove to position the mounting seat, the elastic piece can provide a shock-absorbing effect for the mounting seat, and the vibration transmitted to the mounting seat and the atomic force microscope from the outside is reduced, so that the detection precision is improved.

Additional advantages, objects, and features of the invention will be set forth in part in the description which follows and in part will become apparent to those having ordinary skill in the art upon examination of the following or may be learned from practice of the invention.

Drawings

Fig. 1 is a schematic diagram of the overall structure provided by the present invention;

fig. 2 is a plan view of the present invention.

Detailed Description

As shown in fig. 1 and 2, an anti-seismic device for an atomic force microscope includes a cylindrical base 1, a damping groove 2 is formed in the base 1, an installation seat 3 is arranged in the damping groove 2, an upper positioning column 4 protruding upwards is arranged in the middle of the installation seat 3, a plurality of clamping assemblies 5 are further arranged on the installation seat 3, and a damping assembly 6 is arranged in the damping groove 2.

In this embodiment, atomic force microscope places on mount pad 3, and last reference column 4 can coordinate the recess of atomic force microscope bottom to fix a position atomic force microscope, and a plurality of clamping component 5 can fix atomic force microscope on mount pad 3, and damper 6 in the damping tank 2 can reduce the external vibrations of transmitting mount pad 3 and atomic force microscope department to improve and detect the precision.

Specifically, as shown in fig. 1 and 2, the damping assembly 6 includes a plurality of positioning grooves 7 circumferentially disposed at the bottom of the mounting seat 3, the bottom of the damping groove 2 is provided with a plurality of lower positioning pillars 8 corresponding to the positioning grooves 7 one by one, the lower positioning pillars 8 are inserted into the positioning grooves 7, and the positioning grooves 7 are further provided with elastic members 9. Lower reference column 8 cooperation constant head tank 7 can fix a position mount pad 3, and elastic component 9 can provide the effect of moving away to avoid possible earthquakes for the mount pad, reduces the external vibrations that transmit mount pad 3 and atomic force microscope department to improve and detect the precision.

Preferably, as shown in fig. 1 and 2, the elastic member 9 is a first spring, and two ends of the first spring are fixedly connected with the lower positioning column 8 and the positioning groove 7, respectively. The first spring can provide a better shock-absorbing effect for the mounting base 3.

Preferably, as shown in fig. 1 and fig. 2, the damping assembly 6 further includes a plurality of second springs 10 circumferentially disposed, and two ends of each second spring 10 are fixedly connected to the bottom of the damping groove 2 and the bottom of the mounting seat 3, respectively. The second spring 10 can further provide a better shock absorbing effect for the mounting base 3.

Preferably, as shown in fig. 1 and 2, a plurality of clamping assemblies 5 are circumferentially disposed on the mounting seat 3, a plurality of mounting grooves 11 are further disposed on a side wall of the mounting seat 3, and the clamping assemblies 5 are disposed in the mounting grooves 11. The clamping assembly 5 comprises a clamping driver 12 arranged in the mounting groove 11, the clamping driver 12 is provided with an output shaft which can lift along the vertical direction, and the end part of the output shaft of the clamping driver 12 is connected with a clamping plate 13. The clamping driver 12 in the clamping assembly 5 can drive the clamping plate 13 to lift in the vertical direction so as to be matched with the mounting seat to clamp and fix the microscope.

It will be appreciated by those skilled in the art that the clamp actuator 12 may be a cylinder or an air cylinder.

Preferably, as shown in fig. 1 and 2, the cross section of the clamping plate 13 is isosceles trapezoid, and the bottom of the clamping plate 13 is further provided with a positioning rod 14. The positioning rod 14 can be inserted into a groove body on the microscope so as to circumferentially limit the microscope.

Preferably, as shown in fig. 1 and 2, two limiting grooves 15 are further disposed on two sides of the positioning groove 7, and two limiting blocks 16 are further disposed on two sides of the lower positioning column 8 and respectively inserted into the limiting grooves 15. The limiting block 16 is matched with the limiting groove 15 to limit the lower positioning column 8.

Preferably, as shown in fig. 1 and 2, the damping groove 2 and the mounting seat 3 are circular in cross section. The cross sections of the upper positioning column 4 and the positioning rod 14 are both circular.

The utility model discloses a theory of operation is: the atomic force microscope is placed on the mounting seat 3, the upper positioning column 4 can be matched with a groove at the bottom of the atomic force microscope to position the atomic force microscope, the clamping components 5 can fix the atomic force microscope on the mounting seat 3, the shock absorption components 6 in the shock absorption grooves 2 can reduce the shock transmitted to the mounting seat 3 and the atomic force microscope from the outside so as to improve the detection precision, the lower positioning column 8 is matched with the positioning grooves 7 to position the mounting seat 3, the elastic part 9 can provide a shock absorption effect for the mounting seat and reduce the shock transmitted to the mounting seat 3 and the atomic force microscope from the outside so as to improve the detection precision, the first spring can provide a better shock absorption effect for the mounting seat 3, the second spring 10 can further provide a better shock absorption effect for the mounting seat 3, the clamping driver 12 in the clamping components 5 can drive the clamping plate 13 to lift along the vertical direction so as to be matched with the mounting seat to clamp and fix the microscope, the locating rod 14 can be inserted into a groove body on the microscope so as to circumferentially limit the microscope, and the limiting block 16 is matched with the limiting groove 15 so as to limit the lower locating column 8.

The specific embodiments described herein are merely illustrative of the spirit of the invention. Various modifications, additions and substitutions for the specific embodiments described herein may be made by those skilled in the art without departing from the spirit of the invention or exceeding the scope of the invention as defined in the accompanying claims.

Claims

1. The utility model provides an atomic force microscope's antidetonation device, is including being columniform base (1), its characterized in that, base (1) on be equipped with damping tank (2), damping tank (2) in be equipped with mount pad (3), mount pad (3) middle part be equipped with upwards convex last reference column (4), mount pad (3) on still be equipped with a plurality of clamping components (5), damping tank (2) in be equipped with damper (6).

2. The anti-seismic device of the atomic force microscope according to claim 1, wherein the shock absorption assembly (6) comprises a plurality of positioning grooves (7) circumferentially arranged at the bottom of the mounting seat (3), a plurality of lower positioning columns (8) corresponding to the positioning grooves (7) in a one-to-one manner are arranged at the bottom of the shock absorption groove (2), the lower positioning columns (8) are inserted into the positioning grooves (7), and elastic members (9) are further arranged in the positioning grooves (7).

3. The anti-seismic device of the atomic force microscope according to claim 2, wherein the elastic member (9) is a first spring, and two ends of the first spring are fixedly connected with the lower positioning column (8) and the positioning groove (7), respectively.

4. The anti-seismic device of the atomic force microscope according to claim 3, wherein the shock absorption assembly (6) further comprises a plurality of second springs (10) arranged along the circumferential direction, and two ends of each second spring (10) are fixedly connected with the bottoms of the shock absorption grooves (2) and the bottoms of the mounting seats (3) respectively.

5. An anti-seismic device for an atomic force microscope according to any one of claims 1 to 4, characterized in that a plurality of clamping assemblies (5) are circumferentially arranged on the mounting base (3), a plurality of mounting grooves (11) are further formed on the side wall of the mounting base (3), and the clamping assemblies (5) are arranged in the mounting grooves (11).

6. The anti-seismic device for the atomic force microscope according to claim 5, wherein the clamping assembly (5) comprises a clamping driver (12) arranged in the installation groove (11), the clamping driver (12) is provided with an output shaft which can lift in the vertical direction, and a clamping plate (13) is connected to the end part of the output shaft of the clamping driver (12).

7. The anti-seismic device of the atomic force microscope according to claim 6, wherein the cross section of the clamping plate (13) is isosceles trapezoid, and the bottom of the clamping plate (13) is further provided with a positioning rod (14).

8. The anti-seismic device of the atomic force microscope according to claim 2, wherein two limiting grooves (15) are further disposed on two sides of the positioning groove (7), and two limiting blocks (16) are further disposed on two sides of the lower positioning column (8) and respectively inserted into the limiting grooves (15).

9. An anti-seismic device for an atomic force microscope according to any of claims 1 to 4, characterized in that the cross-sections of the damping groove (2) and the mounting seat (3) are circular.

10. The anti-seismic device of the atomic force microscope according to claim 7, wherein the cross section of the upper positioning column (4) and the cross section of the positioning rod (14) are both circular.