CN214041638U

CN214041638U - Semiconductor test jig with stable clamping

Info

Publication number: CN214041638U
Application number: CN202022147330.7U
Authority: CN
Inventors: 王睿
Original assignee: Xi'an Heguangchen Technology Co ltd
Current assignee: Anhui Shunpai Metal Technology Co ltd
Priority date: 2020-09-27
Filing date: 2020-09-27
Publication date: 2021-08-24
Anticipated expiration: 2030-09-27

Abstract

The utility model discloses a stable semiconductor test of centre gripping is with tool, the on-line screen storage device comprises a base, the symmetric swing joint of base upper surface has the fixture block, the draw-in groove has been seted up on the fixture block surface, the inboard welding of casing has the guide bar, first slider is installed to guide bar outer wall symmetry, stereoplasm spring has been cup jointed to first slider one side, the symmetric welding of casing upper surface edge has the curb plate, the curb plate surface rotates and is connected with the lead screw, lock nut is installed with curb plate surface linking department to the lead screw, sharp slip table is all installed to the casing both sides, the ion fan is installed to sharp slip table top. The utility model discloses a card is held to fixture block cooperation stereoplasm spring and is held the location to make its end contact with the semiconductor outer wall through rotating the lead screw, not only simple structure, stability when convenient operation has promoted the semiconductor centre gripping moreover.

Description

Semiconductor test jig with stable clamping

Technical Field

The utility model relates to a semiconductor test technical field specifically is a stable jig is used in semiconductor test of centre gripping.

Background

The semiconductor refers to a material having a conductivity between a conductor and an insulator at normal temperature. Semiconductors are used in the fields of integrated circuits, consumer electronics, communication systems, photovoltaic power generation, lighting, high-power conversion, etc., for example, diodes are devices fabricated using semiconductors. The importance of semiconductors is enormous, both from a technological and economic point of view. Most electronic products, such as computers, mobile phones or digital audio recorders, have a core unit closely related to a semiconductor.

The jig is a tool for carpenters, ironmen, pincers, machines, electrical controls and other handicrafts, and is mainly used as a tool for assisting in controlling position or action (or both). The jig can be divided into a process assembly type jig, a project test type jig and a circuit board test type jig.

The existing jig for testing the semiconductor with stable clamping mainly has the following defects:

when the existing jig for semiconductor test with stable clamping is used for clamping and fixing the semiconductor, the structure is complex, so that the semiconductor is inconvenient to clamp and is unstable during clamping.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a stable semiconductor test of centre gripping is with tool, it is convenient fixed to the semiconductor centre gripping, improves the stability of centre gripping simultaneously to solve the problem that proposes in the above-mentioned background art.

In order to solve the technical problem, the utility model provides a following technical scheme: the utility model provides a stable semiconductor test of centre gripping is with tool, includes the base, still includes the casing, surface symmetry swing joint has the fixture block on the base, the draw-in groove has been seted up on the fixture block surface, the inboard welding of casing has the guide bar, first slider is installed to guide bar outer wall symmetry, stereoplasm spring has been cup jointed to first slider one side, the symmetrical welding of casing upper surface edge has the curb plate, the curb plate surface rotates and is connected with the lead screw, lock nut is installed with curb plate surface linking department to the lead screw, sharp slip table is all installed to the casing both sides, the ion fan is installed to sharp slip table top.

Further, the symmetry fixedly connected with branch of base lower surface edge, the cushion is installed to the branch bottom, plays the effect that supports through branch and cushion to the base, prevents the wearing and tearing of base lower surface.

Furthermore, a straight hole is formed below the clamping block, a connecting rod is fixedly connected to the upper surface of the first sliding block and is connected with the straight hole, the top end of the connecting rod is connected with the lower surface of the clamping block in a welding mode, and the clamping block is connected with the first sliding block through the connecting rod, so that the first sliding block and the clamping block can move synchronously, and the semiconductor card can be conveniently clamped and positioned.

Furthermore, the tail end of the screw rod corresponds to the clamping groove, so that the clamping and fixing of the semiconductor are facilitated.

Furthermore, a hand wheel is installed at the end of the screw rod, and the hand wheel is manually held, so that the screw rod can be conveniently driven to rotate forwards or backwards.

Furthermore, the inner side of the linear sliding table is movably connected with a second sliding block, and the second sliding block is connected with the bottom of the ion fan, so that the position of the ion fan can be conveniently adjusted.

Compared with the prior art, the utility model discloses the beneficial effect who reaches is:

1. the utility model discloses a when carrying out the centre gripping to the semiconductor, make artifical handheld semiconductor put the top of department between two fixture blocks, then through dragging relative movement between two fixture blocks, thereby drive two first sliders relative movement on the guide bar, and first slider is with stereoplasm spring compression deformation when removing, through placing the semiconductor in the draw-in groove of seting up on one of them fixture block, reset through the stereoplasm spring, thereby make two fixture blocks move in opposite directions, and it is fixed to hold the semiconductor card, and the terminal semiconductor with the card of holding of lead screw is corresponding, make its end contact with the semiconductor outer wall through rotating the lead screw, then fix the lead screw lock through lock nut, simple structure not only, and stability when having promoted the semiconductor centre gripping.

2. The utility model discloses a sharp slip table work removes the ionic wind machine to the clamping area of semiconductor, through the ionic wind machine switch on after, blows out a large amount of air currents that have positive and negative electric charge, can with the electric charge neutralization that takes on the object fall, consequently can be effectual with the static that carries on semiconductor and the centre gripping subassembly, be favorable to promoting the accuracy nature that the semiconductor detected.

Drawings

The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention, and together with the description serve to explain the invention and not to limit the invention. In the drawings:

fig. 1 is a schematic view of the overall structure of the present invention;

fig. 2 is a schematic view of the sectional structure of the housing of the present invention;

FIG. 3 is a side view of the side plate of the present invention;

FIG. 4 is a schematic side view of the linear slide table of the present invention;

in the figure: 1. a base; 101. a strut; 102. cushion blocks; 2. a housing; 201. a clamping block; 202. a straight hole; 203. a card slot; 204. a guide bar; 205. a first slider; 206. a hard spring; 207. a connecting rod; 3. a side plate; 301. a screw rod; 302. A hand wheel; 303. locking the nut; 4. a linear sliding table; 401. a second slider; 402. an ion fan.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-4, the present invention provides a technical solution: the utility model provides a stable semiconductor test of centre gripping is with tool, includes base 1, still includes casing 2, the symmetrical swing joint of surface has fixture block 201 on base 1, draw-in groove 203 has been seted up on the fixture block 201 surface, 2 inboard welding of casing have guide bar 204, first slider 205 is installed to guide bar 204 outer wall symmetry, stereoplasm spring 206 has been cup jointed to first slider 205 one side, 2 upper surface edge symmetrical welding of casing have

curb plate

3, 3 surperficial rotations of curb plate are connected with lead screw 301,

lead screw

301 and 3 surperficial linking departments of curb plate install lock nut 303, sharp slip table 4 is all installed to 2 both sides of casing, ion fan 402 is installed to 4 tops of sharp slip table.

When a semiconductor is clamped, the semiconductor is manually placed above the position between the two clamping blocks 201 by hand, then the two clamping blocks 201 are dragged to move relatively, so that the two first sliding blocks 205 are driven to move relatively on the guide rod 204, the first sliding block 205 compresses and deforms the hard spring 206 when moving, the semiconductor is placed in the clamping groove 203 formed in one of the clamping blocks 201 and reset through the hard spring 206, so that the two clamping blocks 201 move oppositely, the semiconductor is clamped and fixed, the tail end of the screw rod 301 corresponds to the clamped semiconductor, the tail end of the screw rod 301 is contacted with the outer wall of the semiconductor by rotating the screw rod 301, and then the screw rod 301 is locked and fixed through the locking nut 303, so that the structure is simple, the stability during semiconductor clamping is improved, the control device is externally connected with the linear sliding table 4, and a set of proper forward and reverse rotation programs is set for the linear sliding table 4 through the control device, the ion fan 402 is moved to the clamping area of the semiconductor by the operation of the linear sliding table 4, a large amount of air flow with positive and negative charges is blown out after the ion fan 402 is powered on, the charges on the object can be neutralized, and when the charges on the surface of the object are negative charges, the positive charges in the air flow can be attracted; when the object surface has positive charges, it will attract the negative charges in the air flow, so it can effectively neutralize the static electricity carried on the semiconductor and the holding component, and is beneficial to improving the accuracy of semiconductor detection.

Further, base 1 lower surface edge symmetry fixedly connected with branch 101, cushion 102 is installed to branch 101 bottom, plays the effect of support through branch 101 and cushion 102 to base 1, prevents base 1 lower surface wearing and tearing.

Furthermore, a straight hole 202 is formed below the clamping block 201, a connecting rod 207 is fixedly connected to the upper surface of the first sliding block 205, the connecting rod 207 is connected with the straight hole 202, the top end of the connecting rod 207 is connected with the lower surface of the clamping block 201 in a welding mode, and the clamping block 201 is connected with the first sliding block 205 through the connecting rod 207, so that the first sliding block 205 and the clamping block 201 can move synchronously, and the clamping and the positioning of the semiconductor can be facilitated.

Furthermore, the tail end of the screw rod 301 corresponds to the clamping groove 203, so that the semiconductor can be clamped and fixed.

Furthermore, a hand wheel 302 is installed at the end of the screw rod 301, and the hand wheel 302 is manually held, so that the screw rod 301 can be conveniently driven to rotate forwards or reversely.

Further, the inner side of the linear sliding table 4 is movably connected with a second sliding block 401, and the second sliding block 401 is connected with the bottom of the ion fan 402, so that the position of the ion fan 402 can be conveniently adjusted.

The utility model discloses a theory of operation: when a semiconductor is clamped, the semiconductor is manually placed above the position between the two clamping blocks 201 by hand, then the two clamping blocks 201 are dragged to move relatively, so that the two first sliding blocks 205 are driven to move relatively on the guide rod 204, the first sliding block 205 compresses and deforms the hard spring 206 when moving, the semiconductor is placed in the clamping groove 203 formed in one of the clamping blocks 201 and reset through the hard spring 206, so that the two clamping blocks 201 move oppositely, the semiconductor is clamped and fixed, the tail end of the screw rod 301 corresponds to the clamped semiconductor, the tail end of the screw rod 301 is contacted with the outer wall of the semiconductor by rotating the screw rod 301, and then the screw rod 301 is locked and fixed through the locking nut 303, so that the structure is simple, the stability during semiconductor clamping is improved, the linear sliding table 4 is externally connected with a control device, and a set of proper forward and reverse rotation programs are set for the linear sliding table 4 through the control device, the ion fan 402 is moved to the clamping area of the semiconductor by the operation of the linear sliding table 4, a large amount of air flow with positive and negative charges is blown out after the ion fan 402 is powered on, the charges on the object can be neutralized, and when the charges on the surface of the object are negative charges, the positive charges in the air flow can be attracted; when the surface of the object is charged with positive charges, the object attracts negative charges in air flow, so that static electricity carried on a semiconductor and a clamping assembly can be effectively neutralized, the accuracy of semiconductor detection is improved, the support rods 101 are symmetrically and fixedly connected to the edge of the lower surface of the base 1, the cushion block 102 is installed at the bottom end of the support rod 101, the base 1 is supported by the support rods 101 and the cushion block 102, abrasion of the lower surface of the base 1 is prevented, the linear hole 202 is formed below the clamping block 201, the connecting rod 207 is fixedly connected to the upper surface of the first sliding block 205, the connecting rod 207 is connected to the linear hole 202, the top end of the connecting rod 207 is connected to the lower surface of the clamping block 201 in a welding manner, the clamping block 201 is connected to the first sliding block 205 through the connecting rod 207, so that the first sliding block 205 and the clamping block 201 synchronously move, the clamping and the positioning of the semiconductor is facilitated, the tail end of the screw rod 301 corresponds to the clamping groove 203, and the clamping and the semiconductor is favorably clamped and fixed, the hand wheel 302 is installed to lead screw 301 end department, through hand-held hand wheel 302 of manual work, conveniently drives lead screw 301 forward or reverse rotation, and the inboard swing joint of sharp slip table 4 has second slider 401, and second slider 401 links up with ion fan 402 bottom, conveniently adjusts ion fan 402's position.

It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.

Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments described in the foregoing embodiments, or equivalents may be substituted for elements thereof. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. The utility model provides a stable tool is used in semiconductor test of centre gripping, includes base (1), its characterized in that: still include casing (2), surface symmetry swing joint has fixture block (201) on base (1), draw-in groove (203) have been seted up on fixture block (201) surface, the inboard welding of casing (2) has guide bar (204), first slider (205) are installed to guide bar (204) outer wall symmetry, stereoplasm spring (206) have been cup jointed to first slider (205) one side, the symmetrical welding of casing (2) upper surface edge has curb plate (3), curb plate (3) surface rotates and is connected with lead screw (301), lock nut (303) are installed with curb plate (3) surperficial linking department in lead screw (301), sharp slip table (4) are all installed to casing (2) both sides, ionic fan (402) are installed to sharp slip table (4) top.

2. The jig for testing a semiconductor of claim 1, wherein the jig comprises: the base (1) lower surface edge symmetry fixedly connected with branch (101), cushion (102) are installed to branch (101) bottom.

3. The jig for testing a semiconductor of claim 1, wherein the jig comprises: a straight hole (202) is formed in the lower portion of the clamping block (201), a connecting rod (207) is fixedly connected to the upper surface of the first sliding block (205), the connecting rod (207) is connected with the straight hole (202), and the top end of the connecting rod (207) is connected with the lower surface of the clamping block (201) in a welding mode.

4. The jig for testing a semiconductor of claim 1, wherein the jig comprises: the tail end of the screw rod (301) corresponds to the clamping groove (203).

5. The jig for testing a semiconductor of claim 1, wherein the jig comprises: and a hand wheel (302) is arranged at the end of the screw rod (301).

6. The jig for testing a semiconductor of claim 1, wherein the jig comprises: the inner side of the linear sliding table (4) is movably connected with a second sliding block (401), and the second sliding block (401) is connected with the bottom of the ion fan (402).