CN213986768U - Laser test box and laser instrument test system - Google Patents

Abstract

The utility model relates to a laser instrument technical field discloses a laser test box and laser instrument test system. The laser test box comprises a first control circuit, a first data interface circuit, a key circuit, a display screen circuit and a second control circuit, wherein the first control circuit mutually transmits test data with the laser through the first data interface circuit, the key circuit is used for responding to key operation of a user and triggering the first control circuit to adjust the test data, the display screen circuit is used for displaying the test state of the laser test box, and the second control circuit sends specified test parameters to the laser through the first data interface circuit. Therefore, on the one hand, the laser test box provides the keys easy to operate, and the tester can test the laser device only by operating the keys, so that the test efficiency is improved, the laser test box provides a display interface to display the test state, and the tester can conveniently and efficiently perform test work. On the other hand, the laser test box adopts a hardware structure with double controllers, so that the test efficiency is improved.

Description

Laser test box and laser instrument test system

[ technical field ] A method for producing a semiconductor device

The utility model relates to a laser instrument technical field especially relates to a laser test box and laser instrument test system.

[ background of the invention ]

With the development of laser technology, various lasers are widely applied to various production links, such as marking, cutting and the like.

Typically, the laser needs to be burn-in tested before it leaves the factory. During the aging test, the prior art needs to be equipped with a special computer, the laser is controlled by the special computer to carry out the aging test, and the laser passing the aging test can be provided for customers. However, the existing burn-in test equipment has low test efficiency and high test equipment cost.

[ Utility model ] content

In order to solve the technical problem, the embodiment of the utility model provides a laser test box and laser instrument test system, its efficiency of software testing that can improve the laser instrument.

The embodiment of the utility model provides a solve its technical problem and adopt following technical scheme:

a laser test cartridge for testing a laser, the laser test cartridge comprising:

a first control circuit;

the first data interface circuit is electrically connected with the first control circuit and the laser respectively, and the first control circuit mutually transmits test data with the laser through the first data interface circuit;

the key circuit is electrically connected with the first control circuit and used for responding to key operation of a user and triggering the first control circuit to adjust test data;

the display screen circuit is electrically connected with the first control circuit and is used for displaying the test state of the laser test box;

and the second control circuit is respectively and electrically connected with the first control circuit and the first data interface circuit, and the second control circuit sends specified test parameters to the laser through the first data interface circuit so as to test the laser.

Optionally, the first control circuit includes a first controller and a first download interface circuit, and the first controller is electrically connected to the first download interface circuit;

the second control circuit comprises a second controller and a second download interface circuit, the second controller is electrically connected with the second download interface circuit, and the second controller is also electrically connected with the first controller.

Optionally, the first controller is a single chip microcomputer and/or the second controller is a programmable logic device.

Optionally, the key circuit includes:

a plurality of keys;

and the key scanning circuit is electrically connected with each key and the first controller respectively.

Optionally, the display screen circuit includes:

the display screen is used for displaying the test state of the laser test box;

and the display screen driving circuit is electrically connected with the display screen and the first controller respectively.

Optionally, the first data interface circuit comprises:

the D-type data interface is used for being electrically connected with the laser;

and the interface circuit is electrically connected with the first controller and the D-type data interface respectively.

Optionally, the laser test box further includes a communication module, and the communication module is electrically connected to the first control circuit and is configured to receive and transmit test information.

Optionally, the laser test box further includes a power supply circuit, which is electrically connected to the first control circuit, the first data interface circuit, the key circuit, the display screen circuit, and the second control circuit, respectively;

the power failure detection circuit is respectively electrically connected with the power supply circuit and the first control circuit and is used for sending a power failure detection signal to the first control circuit so that the first control circuit stores test data according to the power failure detection signal;

and the charging circuit is electrically connected between the power supply circuit and the first control circuit and provides power for the first control circuit when the laser test box is in a power-down state.

Optionally, the power supply circuit comprises:

a rectification filter circuit;

the voltage reduction circuit is electrically connected with the rectification filter circuit;

and the power management chip is respectively electrically connected with the voltage reduction circuit, the first control circuit, the first data interface circuit, the key circuit, the display screen circuit and the second control circuit and is used for monitoring and processing the target voltage output by the voltage reduction circuit.

The embodiment of the utility model provides a solve its technical problem and still adopt following technical scheme:

a laser testing system, comprising:

the laser test box;

and the laser comprises a second data interface circuit which is electrically connected with the first data interface circuit.

Compared with the prior art, in the utility model discloses in the laser test box, first data interface circuit is connected with first control circuit and laser instrument electricity respectively, and first control circuit passes test data each other through first data interface circuit and laser instrument, and keying circuit is connected with first control circuit electricity for adjust the test parameter. The display screen circuit is electrically connected with the first control circuit and used for displaying the test state of the laser test box. The second control circuit is respectively electrically connected with the first control circuit and the data interface circuit, and the second control circuit sends frequency parameters to the laser through the first data interface circuit so as to test the laser. On the one hand, the laser test box provides simple and easy-to-operate keys, and a tester can test the laser only by operating the keys, so that the test efficiency is improved. On the other hand, the laser test box provides a humanized display interface to display the test state, so that the tester can know the test condition in real time, and the high-efficiency test work is ensured. On the other hand, the laser test box adopts a hardware structure with double controllers, and the second control circuit assists the first control circuit to efficiently and quickly send the frequency parameters to the laser, so that the parameter adjusting efficiency of the laser is accelerated, the test efficiency of the laser test box is improved, and the test cost is reduced.

[ description of the drawings ]

One or more embodiments are illustrated by way of example in the accompanying drawings, which correspond to the figures in which like reference numerals refer to similar elements and which are not to scale unless otherwise specified.

Fig. 1 is a schematic structural diagram of a laser testing system according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of the laser shown in FIG. 1;

fig. 3 is a schematic structural diagram of a laser test box according to an embodiment of the present invention;

fig. 4 is a schematic structural diagram of another laser test box according to an embodiment of the present invention;

fig. 5 is a schematic structural diagram of another laser test box according to an embodiment of the present invention.

[ detailed description ] embodiments

In order to facilitate understanding of the present invention, the present invention will be described in more detail with reference to the accompanying drawings and specific embodiments. It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "electrically connected" to another element, it can be directly connected to the other element or intervening elements may be present. The terms "upper", "lower", "inner", "outer", "bottom", and the like as used herein are used in the description to indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are used only for convenience in describing the present invention and for simplicity in description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.

Furthermore, the technical features mentioned in the different embodiments of the invention described below can be combined with each other as long as they do not conflict with each other.

The embodiment of the utility model provides a laser instrument test system. Referring to fig. 1, a laser test system 100 includes a laser 200 and a laser test box 300.

In the present embodiment, the laser 200 may be any suitable type of laser, such as a continuous laser, a pulsed laser, an ultrashort pulsed laser, a frequency stabilized laser, a tunable laser, a single mode laser, a multimode laser, a mode-locked laser, a Q-switched laser, a TQ laser, or a MOPA laser.

Referring to fig. 2, the laser 200 includes a pump driving circuit 21, a microcontroller 22, a pump 23, a beam combiner 24, and a second data interface circuit 25.

The pump source driving circuit 21 is respectively electrically connected with the microcontroller 22 and the pump source 23, the microcontroller 22 transmits a control signal to the pump source driving circuit 21, the pump source driving circuit 21 is controlled to generate a pump source driving signal, the pump source driving signal drives the pump source 23 to generate output sub laser beams, and the plurality of sub laser beams are synthesized into a laser beam through the beam combiner 24 and output.

The second data interface circuit 25 is electrically connected to the microcontroller 22, the microcontroller 22 mutually transmits test parameters or test data with the laser test box 300 through the second data interface circuit 25, for example, the laser test box 300 sends the test parameters to the second data interface circuit 25, the second data interface circuit 25 transmits the test parameters to the microcontroller 22, and the microcontroller 22 controls the pump source driving circuit to output driving signals such as pulse signals with corresponding power or duty ratio according to the test parameters, so as to drive the pump source 23 to operate.

In some embodiments, microcontroller 22 may employ any suitable logic processing device, such as a single chip, a DSP processor, an FPGA or an ARM processor, or the like.

The laser test cartridge 300 is used to test the laser 200. Referring to fig. 3, the laser testing box 300 includes a first control circuit 31, a first data interface circuit 32, a key circuit 33, a display circuit 34, and a second control circuit 35.

The first control circuit 31 serves as a control core of the laser test box 300, which records various test service logics, for example, when a test is started, the first control circuit 31 performs an initialization operation, where the initialization operation includes powering on to output a default power, setting a default frequency, setting both laser and red light of a laser to be in an off state, initializing a display screen or displaying default parameters, and the like.

The first data interface circuit 32 is electrically connected to the first control circuit 31 and the laser 200, respectively, the first control circuit 31 mutually transmits test data with the laser 200 through the first data interface circuit 32, for example, the first control circuit 31 transmits power data to the laser 200 through the first data interface circuit 32 to control the laser 200 to operate according to the power data, for example, the first control circuit 31 transmits a turn-off signal or a turn-on signal to the laser 200 through the first data interface circuit 32 to control the laser 200 to operate in an active state or a standby state, for example, the first control circuit 31 transmits pulse width data to the laser 200 through the first data interface circuit 32 to control the laser 200 to generate corresponding laser according to the pulse width data.

The key circuit 33 is electrically connected to the first control circuit 31 and configured to trigger the first control circuit 31 to adjust the test data in response to a key operation of a user, for example, the key circuit 33 includes a plurality of function keys, when a certain function key is pressed, the first control circuit 31 may detect that a level of the function key changes, for example, from a high level to a low level, or from a low level to a high level, and then the first control circuit 31 performs a corresponding logic operation, for example, power down or power up, according to the level change of the function key.

The display circuit 34 is electrically connected to the first control circuit 31 for displaying the test status of the laser test box 300, for example, the first control circuit 31 controls the display circuit 34 to display the test status such as the current test power, the current test frequency, or the current test pulse width.

The second control circuit 35 is electrically connected to the first control circuit 31 and the first data interface circuit 32, respectively, and the second control circuit 35 sends a designated test parameter to the laser 200 through the first data interface circuit 32 to test the laser 200, wherein the designated test parameter includes a test frequency and other parameters, generally, the test frequency belongs to a frequently operated parameter in the test process of the laser 200, and the designated test parameter such as the test frequency is configured for the laser 200 by specially setting the second control circuit 35, which can rapidly configure the designated test parameter for the laser 200, thereby improving the test efficiency of the laser 200. Generally, the second control circuit 35 can burn various types of test service logic, for example, when starting the test, the second control circuit 35 sends a default test frequency to the laser 200 through the first data interface circuit 32.

In general, in one aspect, the laser test box 300 provides simple and easy-to-operate keys, and a tester can test the laser 200 by operating the keys, thereby improving the test efficiency. On the other hand, the laser test box 300 provides a humanized display interface to display the test state, so that the testers can conveniently know the test condition in real time, and the high-efficiency test work is ensured. On the other hand, the laser test box 300 adopts a hardware architecture with dual controllers, and the second control circuit 35 assists the first control circuit 31 to efficiently and quickly send the frequency parameters to the laser 200, so as to accelerate the parameter adjustment efficiency of the laser 200, further improve the test efficiency of the laser test box 300, and reduce the test cost.

Generally, when the prior art needs to burn programs into each controller on a hardware architecture of a dual controller, the prior art needs to use a dedicated downloader to connect each controller for burning programs, which is troublesome.

Referring to fig. 4, in some embodiments, the first control circuit 31 includes a first controller 311 and a first download interface circuit 312, and the first controller 311 is electrically connected to the first download interface circuit 312.

The second control circuit 35 includes a second controller 351 and a second download interface circuit 352, the second controller 351 is electrically connected to the second download interface circuit 352, and the second controller 351 is also electrically connected to the first controller 311.

When the first controller 311 needs to be updated and upgraded, a user can connect the first download interface circuit 312 to the upper computer, and the upper computer burns an update program or an upgrade program to the first controller 311 through the first download interface circuit 312, so that the purpose of updating and upgrading the first controller 311 is achieved. Similarly, when the second controller 352 needs to be updated and upgraded, the user can connect the second download interface circuit 352 to the upper computer, and the upper computer burns the update program or upgrade program to the second controller 352 through the second download interface circuit 352, so that in this embodiment, the update and upgrade of the programs of the first controller 311 and the second controller 352 can be completed without using an additional special downloader, thereby improving the adaptability and reliability of the laser test box.

In some embodiments, the first controller 311 is a single chip and/or the second controller 351 is a programmable logic device, such as a CPLD device or an FPGA device.

In some embodiments, the first download Interface circuit 312 and/or the second download Interface circuit 352 may employ a Serial Peripheral Interface (SPI Interface).

Referring to fig. 4, in some embodiments, the first data interface circuit 32 and the second data interface circuit 25 both include a D-type data interface 321 and an interface circuit 322, the D-type data interface 321 is used for electrically connecting to the laser, and the interface circuit 322 is electrically connected to the first controller 311 and the D-type data interface 321, respectively.

In this embodiment, the first controller 311 controls the interface circuit 322 to transmit the test data to the D-type data interface 321, the D-type data interface 321 then transmits the test data to the D-type data interface of the second data interface circuit 25, and the D-type data interface of the second data interface circuit 25 then transmits the test data to the microcontroller 22 through the interface circuit of the second data interface circuit 25.

In some embodiments, the D-type data interface 321 may be any suitable D-type data interface, such as a DB25 interface or the like.

In some embodiments, interface circuit 322 may select any model and fit the chip of the D-type data interface.

Referring to fig. 4, in some embodiments, the key circuit 33 includes a plurality of keys 331 and a key scan circuit 332, and the key scan circuit 332 is electrically connected to each of the keys 331 and the first controller 311.

In the present embodiment, each key 311 corresponds to a designated function, for example, the designated function of each key may include a function key such as a mode selection key, a frequency increase key, a frequency decrease key, a power increase key, a power decrease key, a pulse width switching key, a power latch key, an 18-pin key of DB25, a 19-pin key of DB25, or a red light setting key.

In this embodiment, the first controller 311 controls the key scanning circuit 332 to sequentially poll the level status of each key 311 in a polling manner, and when the first controller 311 detects that the level of the corresponding key changes, that is, the corresponding key is pressed, the first controller 311 adjusts the test data according to the function of the key and the previous test parameter, and also outputs the adjusted test data according to the laser control timing sequence.

In some embodiments, the first controller 311 enters the debug mode when the first controller 311 detects that the level of the mode selection key becomes a high level, and the first controller 311 enters the burn-in test mode when the first controller 311 detects that the level of the mode selection key becomes a low level. After entering the debug mode, the first controller 311 selects the set aging initial value as test data to transmit to the laser 200, subsequently adjusts the test data according to the key operation of the user, and outputs the adjusted test data according to the laser control timing sequence to control the laser 200 to implement a corresponding test function. After entering the burn-in test mode, the first controller 311 first selects and transmits test data during power-on initialization to the laser 200, and then the first controller 311 or the second controller 352 controls test data or parameters such as frequency, power, pulse width, and the like to cyclically increase light emission according to a set step length, that is, the laser 200 first sets laser parameters according to a burn-in initial value and outputs laser with a fixed burn-in duration. Subsequently, as the frequency, power or pulse width is increased by one step, the laser outputs a fixed aging duration in accordance with new test data or parameters, and when the frequency, power or pulse width accumulates to a maximum value, the frequency, power or pulse width returns to a minimum value and restarts, and so on.

In some embodiments, after entering the burn-in test mode, the laser test box 300 sends an abnormal timing disturbance signal to the laser 200 to perform a pressure test, for example, to control the off state and/or the on state of the laser 200 to be in an abnormal state, for example, to control the combined laser and red light output of the laser 200 to be in an abnormal state, for example, to control the laser fast switch or the red light fast switch of the laser 200. When the aging time reaches the designated value, the laser test box 300 ends the whole aging process, and the display circuit 34 displays the aging result, in this embodiment, the display circuit 34 dynamically refreshes to a new value every time the test data or parameters change.

Therefore, the laser test box 300 provided in this embodiment simplifies the control and test of the laser 200, and the user can control the parameters of the laser 200, such as power, frequency, pulse width, etc., by operating the corresponding keys without knowing the complicated communication timing sequence and protocol of the laser 200. In addition, the laser test box 300 has a one-key aging function, so that the purposes of automatic frequency conversion, power conversion and the like can be realized without operating the laser 200 in an aging process by production line personnel, and the state of the laser 200 can be detected in real time.

Referring to fig. 4, in some embodiments, the display circuit 34 includes a display screen 341 and a display screen driving circuit 342, the display screen 341 is used for displaying the testing status of the laser testing box 300, and the display screen driving circuit 342 is electrically connected to the display screen 341 and the first controller 311, respectively. The first controller 311 controls the display driving circuit 342 to drive the display to display the test status of the laser test box 300.

Therefore, the laser test box 300 is configured with a display function, and can dynamically display the current test state in real time, so that the actual output state can be conveniently compared.

In some embodiments, the display screen 341 includes a touch screen or a non-touch screen, and may be a TFT screen (TFT Thin Film Transistor), a TFD screen (TFD Thin Film Diode), a UFB screen (Ultra Thin Film Bright, UFB), an STN screen (Super Twisted Nematic, STN), an OLED screen (Organic Light-Emitting Diode), an AMOLED screen (Active Matrix/Organic Light-Emitting Diode, AMOLED Active Matrix Organic Light-Emitting Diode panel), or the like.

In some embodiments, the display driver circuit 342 may select any suitable type of display driver chip.

In order to facilitate a tester to remotely test the laser 200 or analyze a test result of the laser 200, in some embodiments, referring to fig. 5, the laser test box 300 further includes a communication module 36, the communication module 36 is electrically connected to the first control circuit 31 and is configured to receive and transmit test information, for example, the test information includes a test instruction, a user sends the test instruction to the laser test box 300 through an external device, the communication module 36 receives the test instruction and transmits the test instruction to the first control circuit 31, and the first control circuit 31 enters a test state according to the test instruction.

Considering that the power supply of the laser test box is occasionally powered down, and the laser test box cannot timely store the test data, thereby causing the result of retesting and reducing the test efficiency, in some embodiments, please continue to refer to fig. 5, the laser test box 300 further includes a power circuit 37, a power failure detection circuit 38 and a charging circuit 39.

The power circuit 37 is electrically connected to the first control circuit 31, the first data interface circuit 32, the key circuit 33, the display circuit 34, and the second control circuit 35, respectively, and supplies power to these circuits.

The power down detection circuit 38 is electrically connected to the power supply circuit 37 and the first control circuit 31, respectively, and is configured to send a power down detection signal to the first control circuit 31, so that the first control circuit 31 stores test data according to the power down detection signal.

The charging circuit 39 is electrically connected between the power supply circuit 37 and the first control circuit 31, and when the power-off detection signal is a pulse signal, the first control circuit 31 determines that the external power supply can continuously supply power to the laser test box 300 according to the pulse signal. When the power-off detection signal is a low-level signal and the duration of the low-level signal is greater than or equal to the preset duration, the first control circuit 31 determines that the laser test box 300 is in a power-off state according to the low-level signal, so that the charging circuit 39 provides power for the first control circuit 31, and the first control circuit 31 stores test data.

With reference to fig. 5, in some embodiments, the power circuit 37 includes a rectifying and filtering circuit 371, a voltage-reducing circuit 372 and a power management chip 373.

The rectifying and filtering circuit 371 is used to rectify the external alternating current into direct current and filter harmonics contained in the direct current.

In some embodiments, the rectifying and filtering circuit may select any suitable combination of a rectifying circuit and a filtering circuit, for example, the rectifying circuit is a full bridge rectifying circuit, and the filtering circuit is an EMI filtering circuit.

The voltage dropping circuit 372 is electrically connected to the rectifying and filtering circuit 371, and is configured to drop the filtered power to a target voltage, for example, 220 v to 12 v.

In some embodiments, the voltage reduction circuit 372 may be any suitable voltage reduction circuit formed by discrete components, and may also be any suitable voltage reduction circuit topology, such as a Buck circuit.

The power management chip 373 is electrically connected to the voltage dropping circuit 372, the first control circuit 31, the first data interface circuit 32, the key circuit 33, the display screen circuit 34, and the second control circuit 35, respectively, and is configured to monitor and process the target voltage output by the voltage dropping circuit 372, for example, when the target voltage is monitored to be excessive, the power management chip 373 disconnects the power supply loop, and an external power cannot be input to the first control circuit 31, the first data interface circuit 32, the key circuit 33, the display screen circuit 34, and the second control circuit 35 through the power management chip 373. The power management chip 373 may also reduce the 12 volt voltage to 5 volts or 3.3 volts.

In some embodiments, the power management chip 373 may select any type of power management chip.

In some embodiments, the power down detection circuit 38 may select a sampling circuit composed of any suitable discrete components, for example, the power down detection circuit 38 is composed of a resistor network composed of a plurality of resistors, or composed of a plurality of resistors, a switch tube, and a capacitor, etc.

In some embodiments, the charging circuit 39 may be any suitable charging circuit composed of discrete components, for example, the charging circuit 39 may be an electrolytic capacitor, or a circuit composed of an electrolytic capacitor and a resistor.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit it; within the idea of the invention, also technical features in the above embodiments or in different embodiments can be combined, steps can be implemented in any order, and there are many other variations of the different aspects of the invention as described above, which are not provided in detail for the sake of brevity; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention.

Claims (10)

1. A laser test cartridge for testing a laser, the laser test cartridge comprising:

a first control circuit;

the first data interface circuit is electrically connected with the first control circuit and the laser respectively, and the first control circuit mutually transmits test data with the laser through the first data interface circuit;

the key circuit is electrically connected with the first control circuit and used for responding to key operation of a user and triggering the first control circuit to adjust test data;

the display screen circuit is electrically connected with the first control circuit and is used for displaying the test state of the laser test box;

and the second control circuit is respectively and electrically connected with the first control circuit and the first data interface circuit, and the second control circuit sends specified test parameters to the laser through the first data interface circuit so as to test the laser.

2. The laser test kit of claim 1,

the first control circuit comprises a first controller and a first download interface circuit, and the first controller is electrically connected with the first download interface circuit;

the second control circuit comprises a second controller and a second download interface circuit, the second controller is electrically connected with the second download interface circuit, and the second controller is also electrically connected with the first controller.

3. The laser test box of claim 2, wherein the first controller is a single chip and/or the second controller is a programmable logic device.

4. The laser test cassette of claim 2, wherein the key circuit comprises:

a plurality of keys;

and the key scanning circuit is electrically connected with each key and the first controller respectively.

5. The laser test cassette of claim 2, wherein the display screen circuitry comprises:

the display screen is used for displaying the test state of the laser test box;

and the display screen driving circuit is electrically connected with the display screen and the first controller respectively.

6. The laser test cassette of claim 2, wherein the first data interface circuit comprises:

the D-type data interface is used for being electrically connected with the laser;

and the interface circuit is electrically connected with the first controller and the D-type data interface respectively.

7. The laser test box according to any one of claims 1 to 6, further comprising a communication module electrically connected to the first control circuit for transceiving test information.

8. The laser test cartridge of any one of claims 1 to 6, further comprising:

the power supply circuit is respectively and electrically connected with the first control circuit, the first data interface circuit, the key circuit, the display screen circuit and the second control circuit;

the power failure detection circuit is respectively electrically connected with the power supply circuit and the first control circuit and is used for sending a power failure detection signal to the first control circuit so that the first control circuit stores test data according to the power failure detection signal;

and the charging circuit is electrically connected between the power supply circuit and the first control circuit and provides power for the first control circuit when the laser test box is in a power-down state.

9. The laser test cassette of claim 8, wherein the power circuit comprises:

a rectification filter circuit;

the voltage reduction circuit is electrically connected with the rectification filter circuit;

and the power management chip is respectively electrically connected with the voltage reduction circuit, the first control circuit, the first data interface circuit, the key circuit, the display screen circuit and the second control circuit and is used for monitoring and processing the target voltage output by the voltage reduction circuit.

10. A laser testing system, comprising:

the laser test kit of any one of claims 1 to 9;

and the laser comprises a second data interface circuit which is electrically connected with the first data interface circuit.

Images