CN213986572U

CN213986572U - Thermistor test fixture

Info

Publication number: CN213986572U
Application number: CN202023080324.0U
Authority: CN
Inventors: 冯刘洪; 史书刚; 孙鹏远; 刘艽凌
Original assignee: China Zhenhua Group Yunke Electronics Co Ltd
Current assignee: China Zhenhua Group Yunke Electronics Co Ltd
Priority date: 2020-12-18
Filing date: 2020-12-18
Publication date: 2021-08-17
Anticipated expiration: 2030-12-18

Abstract

The disclosed thermistor test fixture comprises a workbench, wherein an upper probe and a lower probe are arranged on the workbench, the upper probe and the lower probe are respectively contacted with a first parameter measurement point of an electronic element to be tested, a left contact block and a right contact block are further arranged on the workbench, the left contact block and the right contact block are respectively contacted with a second parameter measurement point of the electronic element to be tested, the left contact block is arranged on the workbench in a sliding manner, and a left locker for locking the left contact block is arranged on the workbench. In this scheme, go up probe and lower probe and be used for cooperating the instrument to measure first parameter, left side contact piece, right contact piece are used for cooperating another instrument to measure the second parameter. The fixture can be used for measuring different parameters of the electronic element, and the electronic element does not need to be welded in the measuring process, so that the testing efficiency of the electronic element is improved. In addition, the left contact block is arranged on the workbench in a sliding mode, and the distance between the left contact block and the right contact block can be adjusted, so that the test fixture can adapt to products of different models.

Description

Thermistor test fixture

Technical Field

The disclosure relates to the technical field of electronic element testing, in particular to a thermistor testing clamp.

Background

The test items of the insulation resistance and the dielectric withstand voltage of the polymer PTC thermistor are test items in a polymer PTC thermistor identification test and a B group test. The polymer PTC thermistor adopts a special test fixture when testing the insulation resistance and the medium withstand voltage, and the fixture can only meet the products of specific models, and the products of other models cannot be used. Because the position size of the product placed on the clamp is certain, the product with the approximate overall dimension can only be met, the product is required to be welded on the clamp by using an electric iron during each test, the product is required to be taken off from the clamp by using the electric iron after the test is finished, the test is very inconvenient, the product is possibly damaged, the subsequent test is influenced, and the working efficiency is low.

SUMMERY OF THE UTILITY MODEL

The utility model provides a thermistor test fixture has solved among the prior art technical problem that the anchor clamps operation is inconvenient for the electronic component test, the commonality is poor.

Some embodiments adopted to solve the above technical problems include:

the utility model provides a thermistor test fixture, includes the workstation, be provided with probe and lower probe on the workstation, go up the probe contacts the first parameter measurement point of the electronic component that awaits measuring respectively down, still be provided with left contact piece and right contact piece on the workstation, left side contact piece the right side contact piece contacts the second parameter measurement point of the electronic component that awaits measuring respectively, left side contact piece slide set up in on the workstation, be provided with the locking on the workstation left side contact piece's left locker.

Preferably, the right contact block is slidably disposed on the workbench, and a right locker for locking the right contact block is disposed on the workbench.

In this scheme, the right side contact piece slides and sets up on the workstation, and the distance between left side contact piece and the right side contact piece has bigger control range, can adapt to the electronic component of more models.

Preferably, the left locker and the right locker are both locking bolts, each locking bolt comprises a locking nut, and each locking nut is provided with a butterfly handle.

In the scheme, the locking nut is convenient to operate, tools are not needed, and the operating performance of the locking nut is optimized.

Preferably, the left contact block and the right contact block are respectively provided with a strip-shaped groove, and the locking bolt penetrates through the strip-shaped grooves.

In this scheme, the adjustment range of left contact piece, right contact piece is injectd in the setting in bar groove to, bar groove cooperation locking bolt has the guide ability, has optimized the displacement precision of left contact piece, right contact piece.

Preferably, the workbench is further provided with a support for supporting the upper probe, and the upper probe is slidably arranged on the support.

In this scheme, the setting of support makes probe convenient operation, has optimized the operating performance of last probe.

Preferably, the support is provided with a through hole, the upper probe penetrates through the through hole to be in contact with the electronic element to be tested, and one end, far away from the workbench, of the upper probe is provided with an annular handle.

In the scheme, the annular handle is arranged, so that the operating performance of the upper probe is further optimized.

Preferably, the upper probe and the lower probe are electrically connected with the first wire clamp through a lead.

In the scheme, the arrangement of the lead enables the test fixture to be flexible in arrangement position, and the operation performance of the test fixture is optimized.

Preferably, the bracket is provided with a threading hole for the lead to pass through, and the threading hole is in a long strip shape.

In this scheme, the through wires hole is rectangular shape, and the wire is not fragile, has prolonged the life of wire.

Preferably, the left contact block and the right contact block are electrically connected with the second wire clamp through cables.

In this scheme, the setting of cable makes test fixture set up the position nimble, has optimized test fixture's operating performance.

Preferably, the cables are respectively welded to the left contact block and the right contact block.

In this scheme, the cable welds on left contact piece, right contact piece, and the cable has good contact ability with left contact piece, right contact piece, has improved test fixture's measuring accuracy.

Compared with the prior art, the thermistor test fixture provided by the disclosure has the following advantages:

the disclosed thermistor test fixture comprises a workbench, wherein an upper probe and a lower probe are arranged on the workbench, the upper probe and the lower probe are respectively contacted with a first parameter measurement point of an electronic element to be tested, a left contact block and a right contact block are further arranged on the workbench, the left contact block and the right contact block are respectively contacted with a second parameter measurement point of the electronic element to be tested, the left contact block is arranged on the workbench in a sliding manner, and a left locker for locking the left contact block is arranged on the workbench. In this scheme, go up probe and lower probe and be used for cooperating the instrument to measure first parameter, left side contact piece, right contact piece are used for cooperating another instrument to measure the second parameter. The fixture can be used for measuring different parameters of the electronic element, and the electronic element does not need to be welded in the measuring process, so that the testing efficiency of the electronic element is improved. In addition, the left contact block is arranged on the workbench in a sliding mode, and the distance between the left contact block and the right contact block can be adjusted, so that the test fixture can adapt to products of different models, and the test fixture is good in universality.

All be provided with the bar groove on left side contact block, the right side contact block, the bar groove has the ability to left side contact block, the direction of right side contact block with the locking bolt cooperation, and left side contact block, right side contact block displacement precision are high, have optimized test fixture's operating performance.

Drawings

For purposes of explanation, several embodiments of the disclosed technology are set forth in the following figures. The following drawings are incorporated herein and constitute a part of the detailed description. In some instances, well-known structures and components are shown in block diagram form in order to avoid obscuring the concepts of the disclosed subject technology.

Fig. 1 is a schematic view of the present disclosure in a first direction.

Fig. 2 is a schematic view of the present disclosure in a second orientation.

Fig. 3 is a schematic view of a third aspect of the present disclosure.

In the figure: 1. the device comprises a workbench, 2, an upper probe, 3, a lower probe, 4, a left contact block, 5, a right contact block, 6, a locking bolt, 7, a locking nut, 8, a butterfly-shaped handle, 9, a strip-shaped groove, 10, a support, 11, an annular handle, 12, a first wire clamp, 13, a wire, 14, a threading hole, 15, a cable, 16 and a second wire clamp.

Detailed Description

The specific embodiments illustrated below are intended as descriptions of various configurations of the presently disclosed subject technology and are not intended to represent the only configurations in which the presently disclosed subject technology may be practiced. Specific embodiments include specific details for the purpose of providing a thorough understanding of the presently disclosed subject matter technology. It will be apparent, however, to one skilled in the art that the disclosed subject matter technology is not limited to the specific details shown herein and may be practiced without these specific details.

Referring to fig. 1, fig. 2, fig. 3, a thermistor test fixture, includes workstation 1, be provided with probe 2 and lower probe 3 on the workstation 1, go up probe 2 probe 3 contacts the first parameter measurement point of the electronic component that awaits measuring respectively down, still be provided with left contact piece 4 and right contact piece 5 on the workstation 1, left side contact piece 4 right contact piece 5 contacts the second parameter measurement point of the electronic component that awaits measuring respectively, left side contact piece 4 slide set up in on the workstation 1, be provided with the locking on the workstation 1 left locker of left side contact piece 4.

The workbench 1 is an accessory for supporting a corresponding structure, the workbench 1 at least comprises a table top, and support legs can be arranged on the table top to support the table top at a reasonable position, so that the fixation of related characteristics is facilitated. The working platform 1 can be made of insulating materials, for example, the working platform 1 can be formed by splicing insulating plates, and the insulating plates can be bonded or fixed together through screws.

In practice, the test fixture typically needs to be used with a corresponding test tool, such as a voltmeter, multimeter, or other specialized tool. Testing different parameters requires use with different instruments. The specific tool is determined according to actual needs.

The first measuring point and the second measuring point are provided with two or more measuring points, and the first measuring point and the second measuring point are only used for distinguishing different parameters to be measured and are not limited in number. The number of the specific measuring points is determined according to actual requirements.

The terms left and right in the left and right contact blocks 4 and 5 are used for distinguishing and are not limitations on spatial positions. In practice, one of the left contact block 4 and the right contact block 5 has a position adjusting capability to meet the requirement of universality. Therefore, the sliding arrangement of the left contact block 4 in the present embodiment is only one embodiment, and is not a limitation on the spatial position or specific structure.

In some embodiments, the right contact block 5 is slidably disposed on the workbench 1, and a right locker for locking the right contact block 5 is disposed on the workbench 1.

The left locking device and the right locking device are both locking bolts 6, each locking bolt 6 comprises a locking nut 7, and a butterfly-shaped handle 8 is arranged on each locking nut 7.

A strip-shaped groove 9 is formed in each of the left contact block 4 and the right contact block 5, and the locking bolt 6 penetrates through the strip-shaped groove 9.

In practice, the supporting legs and the table top are matched to form a certain space, and at the moment, the bolt heads of the locking bolts 6 can be positioned in the space formed by the supporting legs and the table top, so that the test fixture is compact in structure. Specifically, the locking bolt 6 is inserted through the table top, and a hole portion for inserting the locking bolt 6 is provided in the table top, and the hole portion is inserted through the table top, so that the locking bolt 6 is assembled.

In some embodiments, a support 10 supporting the upper probe 2 is further disposed on the working platform 1, and the upper probe 2 is slidably disposed on the support 10.

The support 10 is provided with a through hole, the upper probe 2 penetrates through the through hole to be contacted with an electronic element to be tested, and one end, far away from the workbench 1, of the upper probe 2 is provided with an annular handle 11.

The annular handle 11 can be of an integral structure with the upper probe 2, and the annular handle 11 can also be of a structure made of other materials. The ring-shaped handle 11 may be bonded to the upper probe 2 to facilitate the operation of the upper probe 2. The annular handle 11 mainly functions to facilitate the operation of the upper probe 2, and therefore, the shape of the annular handle 11 may be other shapes.

The bracket 10 can be fixed on the workbench 1 through screws, and the bracket 10 can also be fixed on the workbench 1 through other modes. The support 10 may be made of an insulating material.

In some embodiments, the upper probe 2 and the lower probe 3 are electrically connected to the first wire holder 12 through a conducting wire 13.

The lower probe 3 can be fixed on the workbench 1 by any means, for example, a pinhole is arranged on the workbench 1, the lower probe 3 is fixed in the pinhole, the upper end of the lower probe 3 is in contact with an electronic component to be tested, and the lower end of the lower probe 3 can be located in a space formed by the support legs and the table top, so as to facilitate the connection of the lower probe 3 with other structures, for example, the electrical connection with a tester, and the like.

The bracket 10 is provided with a threading hole 14 for the lead 13 to pass through, and the threading hole 14 is in a long strip shape.

Preferably, the lower probe 3 may be located at the midpoint of the mesa.

In some embodiments, the left contact block 4 and the right contact block 5 are electrically connected to the second wire gripper 16 through a cable 15.

The cable 15 is welded to the left contact block 4 and the right contact block 5, respectively.

Both the first gripper 12 and the second gripper 16 may be alligator clips, which are not commonly used in the art.

In practice, the positions of the left contact block 4 and the right contact block 5 are well adjusted according to the external dimension of the electronic element to be measured, the locking nut 7 is loosened when the positions are adjusted, then the positions of the left contact block 4 and the right contact block 5 are adjusted, and the locking nut 7 is screwed after the positions of the left contact block 4 and the right contact block 5 are adjusted in place.

When the electronic component to be tested is put, the upper probe 2 is loosened, and the upper probe 2 is pressed on the electronic component to be tested. Then the right contact block 5 is pressed against the electronic component to be tested. Finally, the first wire clamping device 12 and the second wire clamping device 16 are respectively clamped on the corresponding testers, and then the corresponding tests can be completed.

The scheme can be used for testing insulation resistance and dielectric withstand voltage tests of products of PTC thermistors 3216, 4532 and 7555 types and chip film fixed resistors 2012, 3216, 3225, 5025, 6332, 3263, 6363, 12008, 5084 and 5086 types.

While the subject matter of the present disclosure and its corresponding details have been described above, it is to be understood that the above description is only illustrative of some embodiments of the subject matter of the present disclosure and that some of the details may be omitted from the detailed description.

In addition, in some of the embodiments disclosed above, there is a possibility that a plurality of embodiments may be combined and implemented, and various combinations are not listed at length. The implementation embodiments can be freely combined according to the requirements when the technical personnel in the field carry out the implementation so as to obtain better application experience.

Other configurations of details or figures may be derived by those skilled in the art in practicing the presently disclosed subject matter, as well as figures, and it will be apparent that such details are within the scope of the presently disclosed subject matter and are covered by the presently disclosed subject matter without departing from the presently disclosed subject matter.

Claims

1. A thermistor test fixture, comprising a table (1), characterized in that: be provided with on workstation (1) probe (2) and lower probe (3), go up probe (2) probe (3) contact the first parameter measurement point of the electronic component that awaits measuring respectively down, still be provided with on workstation (1) left contact piece (4) and right contact piece (5), left side contact piece (4) right side contact piece (5) contact the second parameter measurement point of the electronic component that awaits measuring respectively, left side contact piece (4) slide set up in on workstation (1), be provided with the locking on workstation (1) the left locker of left side contact piece (4).

2. The thermistor test fixture of claim 1, characterized in that: the right contact block (5) is arranged on the workbench (1) in a sliding mode, and a right locker for locking the right contact block (5) is arranged on the workbench (1).

3. The thermistor test fixture of claim 2, characterized in that: the left locking device and the right locking device are both locking bolts (6), each locking bolt (6) comprises a locking nut (7), and a butterfly-shaped handle (8) is arranged on each locking nut (7).

4. The thermistor test fixture of claim 3, characterized in that: a strip-shaped groove (9) is formed in each of the left contact block (4) and the right contact block (5), and the locking bolt (6) penetrates through the strip-shaped groove (9).

5. The thermistor test fixture of claim 1, characterized in that: the workbench (1) is further provided with a support (10) for supporting the upper probe (2), and the upper probe (2) is arranged on the support (10) in a sliding mode.

6. The thermistor test fixture of claim 5, characterized in that: the support (10) is provided with a through hole, the upper probe (2) penetrates through the through hole to be contacted with an electronic element to be tested, and one end, away from the workbench (1), of the upper probe (2) is provided with an annular handle (11).

7. The thermistor test fixture of claim 6, characterized in that: the upper probe (2) and the lower probe (3) are electrically connected with the first wire clamping device (12) through a lead (13).

8. The thermistor test fixture of claim 7, characterized in that: the bracket (10) is provided with a threading hole (14) for the lead (13) to pass through, and the threading hole (14) is in a long strip shape.

9. The thermistor test fixture of claim 1, characterized in that: the left contact block (4) and the right contact block (5) are electrically connected with a second wire clamp (16) through cables (15).

10. The thermistor test fixture of claim 9, characterized in that: the cable (15) is welded on the left contact block (4) and the right contact block (5) respectively.