CN213846699U

CN213846699U - Chip module test system based on intelligent router

Info

Publication number: CN213846699U
Application number: CN202023194704.7U
Authority: CN
Inventors: 陶鑫; 何本亮
Original assignee: Shenzhen Pemt Electric Measurement Technology Co ltd
Current assignee: Shenzhen Pemt Electric Measurement Technology Co ltd
Priority date: 2020-12-25
Filing date: 2020-12-25
Publication date: 2021-07-30
Anticipated expiration: 2030-12-25

Abstract

The utility model provides a chip module test system based on intelligence router belongs to HPLC test technical field. The utility model discloses a be as main control MCU's intelligent router, the more than one test module that links to each other with main control MCU respectively, test module includes test station MCU and AD conversion module, main control MCU links to each other with central coordinator, test station MCU respectively, and wherein, the chip module that awaits measuring is with test station MCU communication connection; the central coordinator is used for networking with each chip module to be tested to complete communication test; and the AD conversion module is connected with the test station MCU and used for AD data conversion. The utility model has the advantages that: the testing efficiency of the HPLC module is greatly improved.

Description

Chip module test system based on intelligent router

Technical Field

The utility model relates to a HPLC module that is used for carrying out data transmission among the electric power system test system that dispatches from the factory especially relates to a chip module test system based on intelligent router.

Background

With the popularization of the internet of things technology, the application of power carrier communication in a power system is more and more extensive, and high-speed broadband carrier (HPLC) is gradually applied to a large scale in domestic power grid companies. The power grid company needs reliable quality and stable performance of an HPLC communication unit to ensure that the power system runs stably and has very strict requirements on the quality of manufacturers; the problem that the HPLC communication unit has tight supply time and large supply quantity in a single time exists, a supplier faces a large number of delivery test tasks, and the improvement of the efficiency and quality of the HPLC communication unit test is urgently needed to reduce the production cost and the after-sale service cost and improve the high-quality image of company products. The existing testing method is difficult to customize a testing scheme or realize parallel testing of a testing flow according to different module products due to single platform interface and poor expandability, and serial waiting time is increased. Therefore, an efficient testing method is needed to complete the single board testing and ex-factory warehousing management of the module.

SUMMERY OF THE UTILITY MODEL

For solving the problem among the prior art, the utility model provides a chip module test system based on intelligent router.

The utility model discloses a be as main control MCU's intelligent router, the more than one test module that links to each other with main control MCU respectively, test module includes test station MCU and AD conversion module, main control MCU links to each other with central coordinator, test station MCU respectively, and wherein, the chip module that awaits measuring is with test station MCU communication connection; the central coordinator is used for networking with each chip module to be tested to complete communication test; and the AD conversion module is connected with the test station MCU and used for AD data conversion.

The utility model discloses do further improvement, still including the test station that is used for placing the chip module that awaits measuring, be equipped with the interface that links to each other with the chip module on the test station, still be equipped with the communication link who establishes communication with test station MCU, central coordinator respectively, the chip module passes through the communication link links to each other with test station MCU, central coordinator.

The utility model discloses do further improvement, still include the benchmark module, provide the benchmark of PLC communication test for the chip module that does not test on the test module.

The utility model discloses make further improvement, the benchmark module is the chip module that has passed the test.

The utility model discloses make further improvement, still include the man-machine interface module who links to each other with master control MCU.

The utility model discloses make further improvement, still including the data server who is used for saving test data, data server passes through human-computer interface module and links to each other with main control MCU.

The utility model discloses make further improvement, human-computer interface module links to each other through wireless communication module respectively with master control MCU, human-computer interface module and data server.

The utility model discloses do further improvement, test module is still including sweeping a yard module for acquire the unique sign of dispatching from the factory of the chip module that awaits measuring to send for test station MCU.

The utility model discloses do further improvement, still include the development on the spot maintenance customer end that links to each other with master control MCU and test station MCU respectively.

The utility model discloses make further improvement, test station MCU is intelligent router module equally.

Compared with the prior art, the beneficial effects of the utility model are that: the central coordinator and each chip module are subjected to networking test, so that a plurality of parallel tests are realized, the serial waiting time is shortened, and the testing efficiency of the HPLC module is greatly improved; according to a test interface provided by the platform, seamless connection between single board test and finished product information input is realized, and manual intervention in the middle process is reduced; the WIFI automatic networking and communication replace the original serial communication, so that the communication efficiency and the flexibility of communication protocol extension are improved.

Drawings

Fig. 1 is a schematic diagram of a chip module testing structure of the present invention;

FIG. 2 is a schematic structural diagram of a parallel test system for a plurality of chip modules;

fig. 3 is a schematic structural view of a third embodiment of the present invention.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and examples.

As shown in fig. 1 and fig. 2, fig. 1 is a network diagram of the testing system of this example for testing a single chip module, fig. 2 is a network diagram of a plurality of chip modules of the present invention, wherein the testing system of this example includes a main control MCU, a central coordinator CCO, more than one testing modules connected with the main control MCU respectively, the testing modules include a testing station MCU, an AD conversion module and a code scanning module, the main control MCU is connected with the central coordinator and the testing station MCU respectively, wherein the chip modules to be tested are in communication connection with the testing station MCU and the intelligent router respectively; the central coordinator is used for networking with each chip module to be tested to complete communication test; and the AD conversion module is connected with the test station MCU.

Preferably, the test station is provided with a test station for placing a chip module to be tested, the test station is provided with an interface connected with the chip module, the test station is also provided with a communication link for establishing communication with the test station MCU and the central coordinator respectively, and the chip module is connected with the test station MCU and the central coordinator through the communication link. When testing, only the chip module is required to be placed on the testing station and connected with the reserved interface on the testing station, and then testing can be carried out. And additional networking is not needed, so that the testing efficiency is greatly improved. The test station testing system can physically expand different numbers of test stations according to needs, so that parallel test of a plurality of chip modules is realized. The test station MCU of the embodiment is connected with the chip module to be tested by USART, a user-defined extended communication protocol is used, and the chip module to be tested is further connected with the test station MCU by IO (input output) and used for directly reading the state of the chip module to be tested. The test station of this example may also be provided with indicator lights to indicate the status of the test.

The testing station of the embodiment can be connected with the chip module to be tested by adopting a contact or a contact pin interface, and can conduct communication when being placed in place, so that the connection of the chip module is simpler. The present example is only to improve hardware networking system, and the testing tool in master control MCU and the test station MCU all adopts current testing tool, and the test flow is the same with prior art, therefore, test method is not the utility model discloses an improve the point, no longer expand the explanation here.

The testing station MCU of the embodiment is an intelligent router module, and each module to be tested corresponds to one testing station MCU and is used for realizing the testing flow control of the module and obtaining the testing result.

The AD (analog-to-digital) conversion module of the embodiment is mainly used for collecting analog quantity required in the testing process of the module to be tested, and is communicated with the testing station MCU by using I2C, and of course, the AD conversion module of the embodiment can also be arranged in the testing station MCU and integrated with the testing station MCU.

The main control MCU of this example is an intelligent router module too, passes through WIFI with each test station MCU and connects, and a frock corresponds a main control MCU, mainly is used for receiving the test task information that the user assigned, collects the test process data of the module that awaits measuring and reports. Through the intelligent reason ware module, original serial port communication is replaced in WIFI automatic networking and communication, has improved the flexibility of communication efficiency and communication protocol extension. Communication is more convenient, and the arrangement of the test module is more convenient.

The present embodiment may further include a reference module, where the reference module is an STA module (product to be tested) that has passed the test, and is used to provide a reference for the PLC communication test for the STA module that has not been tested. And comparing the communication data of the two data to judge the test result. The present embodiment may also set the test standard data in the test tool, and compare the test result with the test standard data, thereby determining the test result.

The chip module testing device can be provided with an alarm module, and when the chip module on the testing station is unqualified in testing, an alarm is given. The alarm module can be an indicator light or a buzzer and the like.

The CCO module of the central coordinator provides a PLC communication test networking master node for the test STA module, and communication function test is realized through communication between the central coordinator and the chip module to be tested. And the networking of the central coordinator and the like are configured through the master control MCU.

The system is also provided with a human-computer interface module to realize human-computer interaction, and a user can customize and issue a test task of the module through the human-computer interface module, start a tool test and check tool test process data. The man-machine interface module of the embodiment can be intelligent equipment such as a mobile phone, a tablet and the like.

In order to facilitate factory storage management, the code scanning module is arranged, the code scanning module is an infrared code scanning head, factory characteristic information of a chip module to be tested is acquired in an infrared reading mode, the factory characteristic information comprises a bar code of a unique factory-leaving identifier of the chip module, the bar code is output to a test station MCU through a USB interface, a test result is associated with the currently tested chip module, and when the test result is qualified, the chip module can be directly factory-leaving and stored.

As shown in fig. 3, as the third embodiment of the present invention, the present example further includes a client for on-site development and maintenance, the client for on-site development and maintenance is connected with the main control MCU and the test station MCU through USATR (full-duplex universal synchronous/asynchronous serial transceiver module) or WIFI module, respectively, and the program upgrade and the debug log check of the test station MCU and the main control MCU are realized.

The system further comprises a data server for storing the test data, the data server is connected with the main control MCU through a human-computer interface, preferably, the human-computer interface is in wireless connection with the main control MCU through Bluetooth, and the human-computer interface is in wireless connection with the data server through WIFI. The system does not need wiring, is simpler in networking, and can realize management functions of query, screening, export and the like of test data and remote sharing.

According to the embodiment, the utility model discloses a central coordinator and each chip module network deployment test realize a plurality of parallel tests, shorten serial latency, improved the test efficiency of HPLC module greatly; according to a test interface provided by the platform, seamless connection between single board test and finished product information input is realized, and manual intervention in the middle process is reduced; the WIFI automatic networking and communication replace the original serial communication, so that the communication efficiency and the flexibility of communication protocol extension are improved.

The above-mentioned embodiments are the preferred embodiments of the present invention, and the scope of the present invention is not limited to the above-mentioned embodiments, and the scope of the present invention includes and is not limited to the above-mentioned embodiments, and all equivalent changes made according to the present invention are within the protection scope of the present invention.

Claims

1. The utility model provides a chip module test system based on intelligent router which characterized in that: comprises an intelligent router as a main control MCU, more than one test module respectively connected with the main control MCU, the test module comprises a test station MCU and an AD conversion module, the main control MCU is respectively connected with a central coordinator and the test station MCU, wherein,

the chip module to be tested is in communication connection with the test station MCU; the central coordinator is used for networking with each chip module to be tested to complete communication test; and the AD conversion module is connected with the test station MCU and used for AD data conversion.

2. The intelligent router-based chip module testing system of claim 1, wherein: the test station is provided with an interface connected with the chip module, and is also provided with a communication link which is respectively communicated with the test station MCU and the central coordinator, and the chip module is connected with the test station MCU and the central coordinator through the communication link.

3. The intelligent router-based chip module testing system of claim 2, wherein: the test module is used for testing the chip modules, and the reference module is used for providing a reference for PLC communication testing for the untested chip modules on the test module.

4. The intelligent router-based chip module testing system of claim 3, wherein: the reference module is a chip module which passes the test.

5. The intelligent router-based chip module testing system of claim 1, wherein: the system also comprises a man-machine interface module connected with the main control MCU.

6. The intelligent router-based chip module testing system of claim 5, wherein: the test system also comprises a data server for storing test data, and the data server is connected with the main control MCU through the human-computer interface module.

7. The intelligent router-based chip module testing system of claim 6, wherein: the human-computer interface module is connected with the main control MCU, and the human-computer interface module is connected with the data server through the wireless communication module.

8. The intelligent router-based chip module testing system of any one of claims 1-7, wherein: the testing module further comprises a code scanning module for acquiring the factory unique identifier of the chip module to be tested and sending the factory unique identifier to the testing station MCU.

9. The intelligent router-based chip module testing system of any one of claims 1-7, wherein: the system also comprises a local development and maintenance client connected with the master control MCU and the test station MCU respectively.

10. The intelligent router-based chip module testing system of any one of claims 1-7, wherein: and the test station MCU is also an intelligent router module.