CN213750130U - Low-frequency noise immunity comprehensive test device integrating multiple noise immunity test standards - Google Patents
Low-frequency noise immunity comprehensive test device integrating multiple noise immunity test standards Download PDFInfo
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- CN213750130U CN213750130U CN202022613497.8U CN202022613497U CN213750130U CN 213750130 U CN213750130 U CN 213750130U CN 202022613497 U CN202022613497 U CN 202022613497U CN 213750130 U CN213750130 U CN 213750130U
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Abstract
The utility model provides a low-frequency noise immunity comprehensive testing device integrating multiple noise immunity testing standards, which comprises a device body, wherein the device body is provided with an instrument output device with a plurality of instrument output interfaces, and the device body is provided with an MCU main control module, a display screen, a signal generation module and a signal measurement module; the signal measuring module is used for measuring and monitoring the output signal of the signal generating module, and the MCU main control module controls one of the instrument output interfaces on the instrument output device to be communicated with the output end of the signal generating module through the switch switching control circuit. The utility model discloses MCU host system can control the multiple noise immunity test signal of signal generation module output, after selecting test signal parameter and standard, MCU host system passes through signal measurement module to signal measurement and control, and MCU host system can set up the instrument output interface that automatic switch corresponds according to the user simultaneously and switch on and carry out corresponding signal test output, the utility model discloses install very big improvement the efficiency of test.
Description
Technical Field
The utility model relates to an electronic measurement technical field especially relates to a low frequency noise immunity comprehensive testing device of multiple noise immunity test standard of set, is applicable to various electronic equipment's low frequency conduction noise immunity test, low frequency magnetic field noise immunity test, power frequency magnetic field noise immunity test.
Background
The low-frequency immunity test can measure the capability of electronic equipment for bearing different types of electromagnetic phenomena, and has important significance for evaluating the EMC performance of electronic products in various use environments. Because the use environments of electronic equipment in various fields such as daily consumption, military, medical treatment, aerospace and the like are different, and the requirements on the low-frequency immunity performance of the electronic equipment are different, various low-frequency immunity test standards are generated, and each standard is different for signals required to be generated, so that a measuring device or a test bed may be replaced when one test standard is replaced. Therefore, the test cost is high, and the test efficiency is low.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a set multiple immunity test standard's low frequency immunity integrated test device.
In order to solve the above problems, the utility model adopts the following technical proposal:
the utility model provides a set multiple immunity test standard's low frequency immunity comprehensive testing arrangement, includes the device body, its characterized in that: the device body is provided with an MCU main control module, a display screen, a signal generation module and a signal measurement module;
the MCU main control module is connected with the display screen and is used for providing human-computer interaction;
the signal generating module at least comprises a direct current and power frequency signal generating module, a low-frequency signal generating module, a power amplifying module and a signal source switching circuit;
the signal generated by the low-frequency signal generating module is amplified by the power amplification module and then output to the signal source switching circuit, and the signal generated by the direct-current and power-frequency signal generating module is output to the signal source switching circuit; the MCU main control module controls the signal source switching circuit to switch on the low-frequency signal generating module and the direct current and power frequency signal generating module to output signals; and the MCU master control module controls the low-frequency signal generation module and the direct current and power frequency signal generation module to switch on and output signals through the signal source switching circuit.
The signal measuring module is used for measuring and monitoring the output signal of the signal generating module, transmitting the measuring result to the MCU main control module and displaying the measuring result through the display screen;
the device body is provided with an instrument output device with a plurality of instrument output interfaces, the instrument output device is connected with the output end of the signal generation module through a switch switching control circuit, the switch switching control circuit is connected with the MCU main control module, and after the MCU main control module receives a signal instruction through man-machine interaction, one of the instrument output interfaces on the instrument output device is controlled to be communicated with the output end of the signal generation module through the switch switching control circuit.
The low-frequency noise immunity comprehensive testing device integrating multiple noise immunity testing standards is characterized in that: the signal measurement module comprises a voltage/current sampling module, and the output end of the voltage/current sampling module is connected with the MCU main control module through a signal measurement circuit and used for outputting a sampling signal; an optical coupling isolation circuit is arranged between the input end of the voltage/current sampling module and the output end of the signal generation module and used for isolating the signal measurement module and the signal generation module, so that the problem of high-voltage common mode is avoided.
The low-frequency noise immunity comprehensive testing device integrating multiple noise immunity testing standards is characterized in that: the switch switching control circuit is a relay and IGBT switch circuit.
The utility model discloses beneficial effect: the utility model discloses in MCU main control module can control signal generation module output multiple noise immunity test signal, through man-machine interaction, realize noise immunity test signal parameter and standard selection; after selecting test signal parameter and standard, MCU host system passes through signal measurement module and measures and control noise immunity test signal, and MCU host system can switch on according to the instrument output interface that user set up parameter and measurement standard automatic switch-over correspond simultaneously and carry out corresponding signal test output, the utility model discloses the very big improvement efficiency of test of device.
Drawings
Fig. 1 is a schematic block diagram of an integrated immunity test device.
Fig. 2 is a wiring diagram of the integrated immunity testing device.
Detailed Description
In order to make the aforementioned objects, features and advantages more comprehensible, embodiments of the present invention are described in detail below with reference to the accompanying drawings.
As shown in fig. 1 and 2, a low-frequency noise immunity comprehensive testing device integrating multiple noise immunity testing standards comprises a device body, wherein an MCU main control module 1, a display screen 2, a signal generation module 3 and a signal measurement module 4 are arranged on the device body;
the MCU main control module 1 is connected with the display screen 2 and is used for providing human-computer interaction;
the signal generating module 3 at least comprises a direct current and power frequency signal generating module 31, a low frequency signal generating module 32, a power amplifier module 33 and a signal source switching circuit 34;
the signal generated by the low-frequency signal generating module 32 is amplified by the power amplifier module 33 and then output to the signal source switching circuit 34, and the signal generated by the direct current and power frequency signal generating module 31 is output to the signal source switching circuit 34; the MCU main control module 1 controls the low-frequency signal generation module 32 and the direct current and power frequency signal generation module 31 to switch on and output signals through the signal source switching circuit 34;
the signal measuring module 4 is used for measuring and monitoring the output signal of the signal generating module 3, transmitting the measuring result to the MCU main control module 1 and displaying the measuring result through a display screen;
the device body is provided with an instrument output device 5 with a plurality of instrument output interfaces, the instrument output device 5 is connected with the output end of the signal generation module 3 through a switch switching control circuit 6, the switch switching control circuit 6 is connected with the MCU main control module 1, and after the MCU main control module 1 receives a signal instruction through man-machine interaction, one of the instrument output interfaces on the instrument output device 5 is controlled to be communicated with the output end of the signal generation module 3 through the switch switching control circuit 6.
In the application, the signal measurement module 4 comprises a voltage/current sampling module, and the output end of the voltage/current sampling module is connected with the MCU main control module 1 through a signal measurement circuit and is used for outputting a sampling signal; and an optical coupling isolation circuit 7 is arranged between the input end of the voltage/current sampling module and the output end of the signal generation module and is used for isolating the signal measurement module 4 and the signal generation module 3, so that the problem of high-voltage common mode is avoided.
In the present application, the switch switching control circuit 6 is a relay and an IGBT switching circuit.
During operation, according to parameters and test standards set by a user, the MCU main control module 1 controls the signal generation module 3 to generate required signals, the MCU main control module 1 controls a plurality of instrument output interfaces on the instrument output device 5 to be switched to corresponding test channels, and meanwhile, the MCU main control module
And receiving and processing data fed back by the signal measurement module through the signal measurement circuit, and finally giving a corresponding measurement result.
The utility model discloses work flow as follows:
the first step is as follows: firstly, connecting a test cable or a magnetic field generating coil according to the type to be tested;
the second step is that: setting corresponding test standards and test parameters by touching a display screen or a button according to the test standards;
the third step: after the setting is finished, the MCU main control module 1 controls the signal generation module 3 to generate a required test signal, wherein the signal frequency range is DC-400 KHz, and the amplitude is 0 to +/-300V;
the fourth step: the MCU main control module 1 receives a measurement result of the signal measurement module 4; meanwhile, the MCU main control module 1 controls a peripheral relay or an IGBT switch circuit to be switched to a corresponding instrument output interface through an MCU in the MCU main control module according to the set test standard and parameters.
The utility model discloses the theory of operation of well main module introduces as follows:
the utility model discloses what mainly go on is that low frequency noise immunity tests, and all test standard in the comprehensive consideration table one, the frequency range that the signal required is DC ~ 400KHz, and voltage range is 0 ~ 300V, and the electric current scope is 1mA ~ 20A.
Table one test criteria:
in order to be able to produce the required test signal of the test standard that satisfies table one, the utility model discloses well signal generation module 3 has integrated low frequency signal generation unit 32, power amplifier unit 33 and direct current and power frequency signal generation unit 31. The signal generating unit 32 and the power amplifying unit 33 are matched with each other to form an adjustable low-frequency signal source, which can generate various sinusoidal signals, non-sinusoidal signals and customized signals required by a low-and-medium frequency conducted immunity test.
The signal that signal generation module 3 produced sends to MCU host system 1 after passing through signal measurement module 4 measurement, and MCU host system 1 compares the measured signal with the test standard signal that table one shows, and when the current signal of signal measurement module 4 measured signal was too high or low, MCU host system 1 then control signal generation module 3 and adjust signal amplitude for the signal that signal generation module 3 produced suits with the test standard signal that table one shows. Meanwhile, a low-frequency magnetic field can be generated by matching with an externally connected radiation ring or a Helmholtz coil, and the low-frequency magnetic field is used for testing the immunity of the low-frequency magnetic field.
When the power frequency magnetic field radiation immunity test is carried out, the direct current and power frequency signal generating unit 33 is used for generating a high-quality power frequency signal source, and a power frequency magnetic field is generated by matching with an externally connected power frequency magnetic field coil to carry out the power frequency magnetic field immunity test.
Therefore, the utility model discloses the required signal source of low frequency noise immunity test in the shown standard of table has been solved on the test signal source head.
In order to ensure mutual isolation between signal generation and measurement, the optical coupler is adopted to isolate the signal measurement module 4 from the signal generation module 3, so that the problem of high-voltage common mode is avoided.
The utility model discloses accomplished that low frequency conduction takes place, low frequency magnetic field takes place, power frequency magnetic field takes place. In order to meet various testing methods required by the standard shown in the table I, an MCU master control module is integrated inside the test circuit for controlling the test signal output channel. For example, when a low-frequency conduction immunity test is performed, the MCU main control module 1 switches the signal output interface to the low-frequency conduction immunity test interface through the relay. When the test standard requires that the signal switching time is in the microsecond level, the IGBT switching circuit is adopted to carry out rapid signal switching.
The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.
Claims (3)
1. The utility model provides a set multiple immunity test standard's low frequency immunity comprehensive testing arrangement, includes the device body, its characterized in that: the device body is provided with an MCU main control module (1), a display screen (2), a signal generation module (3) and a signal measurement module (4);
the MCU main control module (1) is connected with the display screen (2) and is used for providing human-computer interaction;
the signal generating module (3) at least comprises a direct current and power frequency signal generating module (31), a low-frequency signal generating module (32), a power amplifier module (33) and a signal source switching circuit (34);
the signal generated by the low-frequency signal generating module (32) is amplified by the power amplification module (33) and then output to the signal source switching circuit (34), and the signal generated by the direct current and power frequency signal generating module (31) is output to the signal source switching circuit (34); the MCU main control module (1) controls the low-frequency signal generation module (32) and the direct current and power frequency signal generation module (31) to switch on and output signals through the signal source switching circuit (34);
the signal measuring module (4) is used for measuring and monitoring the output signal of the signal generating module (3), and transmitting the measuring result to the MCU main control module (1) and displaying the measuring result through a display screen;
the device is characterized in that an instrument output device (5) with a plurality of instrument output interfaces is arranged on the device body, the instrument output device (5) is connected with the output end of the signal generation module (3) through a switch switching control circuit (6), the switch switching control circuit (6) is connected with the MCU main control module (1), and after the MCU main control module (1) receives a signal instruction through man-machine interaction, one of the instrument output interfaces on the instrument output device (5) is controlled to be communicated with the output end of the signal generation module (3) through the switch switching control circuit (6).
2. The integrated low-frequency immunity test device for integrating multiple immunity test standards according to claim 1, characterized in that: the signal measurement module (4) comprises a voltage/current sampling module, and the output end of the voltage/current sampling module is connected with the MCU main control module (1) through a signal measurement circuit and used for outputting a sampling signal; an optical coupling isolation circuit (7) is arranged between the input end of the voltage/current sampling module and the output end of the signal generating module and is used for isolating the signal measuring module (4) and the signal generating module (3).
3. The integrated low-frequency immunity test device for integrating multiple immunity test standards according to claim 1, characterized in that: the switch switching control circuit (6) is a relay and IGBT switch circuit.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117538640A (en) * | 2023-11-07 | 2024-02-09 | 苏州逐晨科技有限公司 | Test device and method for voltage mutation immunity test |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117538640A (en) * | 2023-11-07 | 2024-02-09 | 苏州逐晨科技有限公司 | Test device and method for voltage mutation immunity test |
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