CN213689716U - Coaxial test probe module and test device thereof - Google Patents

Abstract

A coaxial test probe module and a test device thereof are provided. The probes penetrate through the metal hollow base, each probe is provided with a connecting end and a testing end, and the testing end of each probe penetrates through the metal piece, so that the tail end of the testing end of each probe protrudes out of the metal piece. The connecting ends of the probes are respectively connected to a connecting part. The testing part is provided with a first surface and a second surface which are oppositely arranged, the testing end of the probe penetrates into the testing part from the second surface until the metal piece of the probe is positioned in the testing part, and the tail end of the testing end of the probe is exposed out of the first surface. The utility model discloses a coaxial structure makes the probe reach impedance match effectively to replace the test mode of board to the public female head of board connector make-up, needn't undertake the risk that the connector weigh wounded and part trouble.

Description

Coaxial test probe module and test device thereof

Technical Field

The present invention relates to a coaxial test probe module and a test device thereof, and more particularly to a coaxial test probe module and a test device thereof which can be used in high frequency transmission line measurement and can effectively achieve impedance matching.

Background

The conventional test module mainly comprises Pogo pins (Pogo pins) and a Printed Circuit Board (PCB), and because of the complicated structure and many impedance discontinuous points, when the test module is used for testing a transmission line, the reflection quantity between the test equipment and an object to be tested is too large because the test Pin cannot effectively perform impedance matching, and the S-parameter (S-parameter) of the transmission line cannot be accurately measured.

If the male and female connectors of a Board-to-Board Connector (BTB Connector) are to be buckled together for testing, the method is not suitable for testing in mass production, and is also prone to causing damage to the connectors during testing, thereby risking component failure.

SUMMERY OF THE UTILITY MODEL

In view of the above, an embodiment of the present invention provides a coaxial testing probe module, which includes a metal hollow base, a plurality of probes, a plurality of connecting portions and a testing portion. The metal hollow base has a first end portion and a second end portion located on opposite sides. The probes penetrate through the metal hollow base, each probe is provided with a connecting end and a testing end, the connecting end of each probe protrudes out of the first end portion of the metal hollow base, the testing end of each probe protrudes out of the second end portion of the metal hollow base, the testing end of each probe penetrates through the metal piece, the tail end of the testing end of each probe protrudes out of the metal piece, and the metal piece is filled with insulating materials to coat the probes located in the metal piece. The connecting ends of the probes are respectively connected to a connecting part. The test part is provided with a first surface and a second surface which are oppositely arranged, the test end of the probe penetrates into the test part from the second surface of the test part until the metal piece of the probe is positioned in the test part, and the tail end of the test end of the probe is exposed out of the first surface of the test part.

In some embodiments, the insulating material is teflon.

In some embodiments, the metal hollow base further includes a fixing member disposed at the first end portion of the metal hollow base, and the connecting portion is disposed on the fixing member.

In some embodiments, the testing device further comprises an assembly member disposed at the second end of the metal hollow base and having a through hole, and the testing portion is disposed through the through hole and fixed to the assembly member.

In some embodiments, the second surface side of the testing portion has a propping portion, and the area of the propping portion is larger than the sectional area of the through hole, so that the propping portion props against one side of the assembly adjacent to the metal hollow base.

The present invention provides a testing apparatus in another embodiment, which includes a carrier, a driving member and the coaxial testing probe module. The carrier plate is provided with a containing groove, and the containing groove is used for containing the transmission line to be tested. The driving part drives the at least one coaxial test probe module to be close to the support plate until the tail end of the test end of the probe of the at least one coaxial test probe module contacts the transmission line to be tested.

In some embodiments, a plurality of positioning elements are protruded from the second surface of the testing portion of at least one coaxial testing probe module.

In some embodiments, the height of the positioning element protruding from the second surface is less than the height of the end of the testing end of the probe protruding from the second surface.

To sum up, the utility model provides a coaxial test probe module and testing arrangement thereof through coaxial structure, makes the probe reach impedance match effectively, and the shell of probe is the hollow base of metal, and the metalwork is worn to locate by the test end of probe, can be so that whole test assembly and the transmission line that awaits measuring are ground altogether to increase area to ground, promote the overall stability, reduce the clutter of test. Moreover, the method can replace a test mode of buckling the male head and the female head of the board-to-board connector, and the risk of crushing the connector and the failure of parts does not need to be born. Furthermore, the utility model provides a coaxial test probe is movable probe, and in testing arrangement, direct lock can use on test fixture, effectively promotes test fixture's flexibility, also shortens test fixture's development cycle and verification time simultaneously, reduces the cost.

The detailed features and advantages of the present invention will be described in detail in the following detailed description, which is for the purpose of promoting an understanding of the principles of the invention and for the purpose of illustrating the invention, and will be apparent to those skilled in the art from the following detailed description, claims and drawings.

Drawings

Fig. 1 is an external view of a coaxial test probe module according to an embodiment of the present invention;

fig. 2 is an exploded view of a coaxial test probe module according to an embodiment of the present invention;

FIG. 3 is an operation diagram of a testing device according to an embodiment of the present invention;

fig. 4 is a schematic bottom view of a coaxial test probe module according to an embodiment of the present invention;

FIG. 5A is a plot of the Voltage Stabilizing Wave Ratio (VSWR) of a conventional pin die under test;

fig. 5B is a graph of standing wave ratio (VSWR) of the coaxial test probe module according to an embodiment of the invention during testing;

FIG. 6A is a graph of S11 during testing of a conventional pin die;

fig. 6B is a graph of S11 curve of the coaxial testing probe module according to an embodiment of the present invention during testing.

[ notation ] to show

100 coaxial test probe module

10: metal hollow base

11 first end part

12 second end part

20: probe

21: connection end

22 test end

221 terminal end

23: metal member

231 insulating material

30 connecting part

31: screw

32 screw cap

40 test part

41 first surface

42 second surface

421 top abutting part

422 positioning part

50, fixing part

60: assembly part

61 through hole

62 concave part

200 testing device

70 carrier plate

71 a receiving groove

72 transmission line to be tested

80 driving member

Detailed Description

Referring to fig. 1 to 2, fig. 1 is an external view of a coaxial testing probe module according to an embodiment of the present invention, and fig. 2 is an exploded view of the coaxial testing probe module according to an embodiment of the present invention. As shown in fig. 1, the coaxial testing probe module 100 of the present embodiment includes a metal hollow base 10, a probe 20, a connecting portion 30 and a testing portion 40.

Referring to fig. 2, a portion of the metal hollow base 10 is shown in perspective to more clearly illustrate the detailed internal structure. As seen from the exploded view, the metal hollow base 10 has a first end portion 11 and a second end portion 12 at opposite sides, and a plurality of probes 20 are inserted into the metal hollow base 10. Each probe 20 has a connecting end 21 and a testing end 22, the connecting end 21 of the probe 20 protrudes from the first end 11 of the metal hollow base 10, and the testing end 22 of the probe 20 protrudes from the second end 12 of the metal hollow base 10. The testing end 22 of each probe 20 is inserted through the metal member 23, so that the end 221 of the testing end 22 of each probe 20 protrudes out of the metal member 23, and the metal member 23 is filled with an insulating material 231 to cover the probes 20 located in the metal member 23. As seen in the perspective portion of fig. 2, the connection ends 21 of the probes 20 are connected to the connection portions 30, respectively.

Referring to fig. 2, the testing portion 40 has a first surface 41 and a second surface 42 opposite to each other, the testing end 22 of the probe 20 penetrates the testing portion 40 from the second surface 42 of the testing portion 40 until the metal member 23 of the probe 20 is located in the testing portion 40, and the end 221 of the testing end 22 of the probe 20 is exposed out of the first surface 41 of the testing portion 40.

As described above, the present invention provides a coaxial test probe module 100, which is designed in a coaxial mode, so that the test probe module can effectively perform impedance matching, and the test frequency can reach 15 GHz. The probe 20, the testing part 40 and the housing (the metal hollow base 10) thereof are grounded, and the testing end 22 of the probe 20 is inserted into the metal member 23. The metal member 23 is connected to the metal hollow base 10 through the testing portion 40 made of the same metal material, so that the whole coaxial testing probe module 100 is grounded, and during testing, the testing portion 40 and the object to be tested are grounded, so that the differential loss curve during testing can be smoother without generating resonance, thereby overcoming the problems in the prior art.

In this embodiment, the insulating material 231 filled in the metal member 23 is teflon, but not limited thereto. In some embodiments, other insulating materials may be used to fill the metal piece 23. The teflon filled in the front metal piece 23 of the probe 20 does not contact with the connector during the pin die test, so as to avoid the impedance change caused by the change of the DK value (direct Constant) and the influence on the test result.

Referring to the lower portion of fig. 2, the coaxial testing probe module 100 of the present embodiment further includes a fixing member 50, and in the figure, the fixing member 50 is also shown in a perspective manner for better illustrating the detailed internal structure. The fixing member 50 is disposed at the first end 11 of the metal hollow base 10, and the connecting portion 30 is disposed on the fixing member 50. As shown in fig. 2, in the present embodiment, the connection portion 30 is composed of a screw 31 and a nut 32, the connection end 21 of the probe 20 is connected to the screw 31 of the connection portion 30, the screw 31 with the probe 20 is inserted into the fixing member 50 when the connection portion is assembled, and the other end of the connection portion is screwed into the screw 31 by using the nut 32 in the connection portion 30 to fix the probe 20 on the fixing member 50, but not limited thereto. In some embodiments, other fixing methods can be used to fix the probe 20, but in the fixing member 50, a probe 20 is mainly matched with a connecting portion 30.

Referring to the upper portion of fig. 2, the coaxial testing probe module 100 of the present embodiment further includes an assembly member 60 disposed at the second end portion 12 of the metal hollow base 10 and having a through hole 61, and the testing portion 40 penetrates through the through hole 61 and is fixedly disposed on the assembly member 60. As shown in fig. 2, the second surface 42 side of the testing portion 40 has a top portion 421, the area of the top portion 421 is larger than the sectional area of the through hole 61, and when assembling, the top portion 421 is abutted against the side of the assembling member 60 adjacent to the metal hollow base 10. More specifically, as shown in fig. 2, in the present embodiment, a square recess 62 is formed around the through hole 61 of the assembly 60, and when assembling, the abutting portion 421 of the testing portion 40 is received in the square recess 62 of the assembly 60, thereby completing the fixing of the testing portion 40.

Referring to fig. 3, fig. 3 is an operation diagram of a testing device according to an embodiment of the present invention. As shown in fig. 3, the testing apparatus 200 of the present embodiment includes a carrier 70, a driving member 80, and a coaxial testing probe module 100.

As shown in fig. 3, the carrier 70 has a receiving groove 71, the receiving groove 71 is used for receiving the transmission line 72 to be tested, in this embodiment, two coaxial testing probe modules 100 are assembled on the driving member 80, and are located above the carrier 70 and corresponding to the receiving groove 71, the driving member 80 drives the coaxial testing probe modules 100 to approach the carrier 70 until the tail end 221 of the testing end 22 of the probe 20 of the coaxial testing probe module 100 contacts the transmission line 72 to be tested.

Referring to fig. 3, when the testing device 200 of the present embodiment is used to perform a test, the driving member 80 is electrically connected to a motor (not shown), so that the testing device 200 moves down linearly until the end 221 of the testing end 22 of the probe 20 contacts the transmission line 72 to be tested, but not limited thereto. In some embodiments, the driving member 80 may also be disposed on a slide rail to drive the coaxial testing probe module 100 to approach the carrier 70 for testing.

Referring to fig. 4, fig. 4 is a schematic bottom view of a coaxial testing probe module according to an embodiment of the present invention. From the illustration of the bottom view, it will be clear how the end 221 of the testing end 22 of the probe 20 accommodated in the testing apparatus 200 contacts the transmission line 72 to be tested. As shown in fig. 3 and 4, the second surface 42 of the testing part 40 is convexly provided with a plurality of positioning elements 422, and the height of the positioning elements 422 protruding from the second surface 42 is smaller than the height of the ends 221 of the testing ends 22 of the probes 20 protruding from the second surface 42. In this embodiment, the exposed portion of the probe 20 is about 0.3 mm, which greatly reduces the influence of impedance mismatch.

Furthermore, the utility model provides a coaxial test probe module 100 and testing arrangement 200 is not only applicable to the high Frequency transmission line test of 5G board to board Connector, also is applicable to the transmission line test of all Radio Frequency connectors (Radio Frequency Connector, RF Connector). And use the utility model provides a test method, Vector Network Analyzer (VNA), coaxial cable and coaxial probe among the test system all guarantee at 50 ohm. Just the utility model provides a mode is suitable for the test of volume production in-process, and is not only efficient, also difficult production part crushing.

Next, referring to fig. 5A and 5B, fig. 5A is a standing wave ratio (VSWR) diagram of a conventional pin die during testing, and fig. 5B is a standing wave ratio (VSWR) diagram of a coaxial testing probe module according to an embodiment of the present invention during testing. As shown in fig. 5A and 5B, with the structure that the probe 20 is disposed in the metal hollow base 10, the probe 20, the testing portion 40 and the housing (the metal hollow base 10) thereof are all grounded, the testing end 22 of the probe 20 is disposed through the metal piece 23, the metal piece 23 is disposed through the testing portion 40, so that the coaxial testing probe module 100 and the transmission line 72 to be tested can be grounded more conveniently, grounding during transmission line testing can be increased, stability of the whole transmission line testing can be improved, thus, in comparison with FIG. 5B, from the measurement result of Time Domain Reflectometry (TDR), FIG. 5A shows the waveform of the conventional pin mode under test, it can be seen that the needle point under the needle model has an instantaneous impedance drop (250 on the horizontal axis) of about 42 ohms, which causes the impedance mismatch of the conventional needle model under the needle. On the contrary, the coaxial test probe module 100 of the present invention can substantially maintain the impedance matching even if the variation is generated when the probe is inserted (e.g. around-199.2 or around 1069.4), the variation range is also within 5% of 50 ohm.

The reason that can't satisfy the high frequency test at present technically is that the S parameter can produce the resonance because of impedance mismatch at the high frequency section, can know from this, the utility model discloses in effectively having improved traditional test module, because of the wave mode unstability that impedance mismatch leads to effectively promote Flexible Printed Circuit board (Flexible Printed Circuit, FPC) welded plate to the board connector after, the accuracy and the efficiency of the 5G high frequency measurement of transmission line.

More specifically, referring to fig. 6A and 6B, fig. 6A is a graph of S11 of a conventional pin mold during testing, and fig. 6B is a graph of S11 of a coaxial testing probe module according to an embodiment of the present invention during testing. Observe by S11' S matching degree, can discover the utility model provides a coaxial test probe module 100 all is at-15 db (@15GHz) with the value of traditional board to board connector make-up. As shown in FIG. 6A and FIG. 6B, the differential loss curve of the coaxial test probe module 100 and the conventional board-to-board connector make-up test is quite stable, and the loss value is close, thereby proving that the coaxial test probe module 100 testing method provided by the utility model is quite accurate (117.8mm: -2.6 db/unit loss 0.022db/10 GHz).

Traditional pin matrix must use the printed circuit board switching, will increase impedance discontinuity point, uncertainty when also increasing the test simultaneously, however, the utility model provides a testing arrangement 200 then comprises probe 20 and cable, effectively reduces the uncertainty of measurationing. Furthermore, the conventional pin mold uses a common insulating material without metal coating and thus cannot be completely grounded with the transmission line 72 to be tested, which results in impedance mismatch. However, the coaxial probe is coaxial, so that the coaxial test probe module 100 and the transmission line 72 to be tested form a common ground during testing, and the impedance matching is good, so that the difference is close to the buckling data of the conventional board-to-board connector. The utility model provides a design, except getting rid of with the difference of traditional needle mould, still got rid of the processing procedure difference of PCB keysets, so coaxial test probe module 100 more is fit for large batch volume production.

To sum up, the utility model provides a coaxial test probe module 100 through coaxial structure, makes probe 20 reach impedance match effectively, and probe 20's shell is the hollow base 10 of metal, and metalwork 23 is worn to locate by probe 20's test end 22, can be so that whole test assembly and the transmission line 72 that awaits measuring are ground altogether to increase area under ground, promote the overall stability, reduce the clutter of test. Moreover, the method can replace a test mode of buckling the male head and the female head of the board-to-board connector, and the risk of crushing the connector and the failure of parts does not need to be born. Furthermore, the utility model provides a coaxial test probe 20 is movable probe, in testing arrangement 200, directly locks can use on test fixture, effectively promotes test fixture's flexibility, also shortens test fixture's development cycle and verification time simultaneously, reduces the cost.

Although the present invention has been described with reference to the above embodiments, it should be understood that the scope of the present invention is not limited to the above embodiments, and other changes and modifications may be made by those skilled in the art without departing from the spirit and scope of the present invention.

Claims (8)

1. A coaxial test probe module, comprising:

a metal hollow base having a first end and a second end on opposite sides;

a plurality of probes, which are arranged in the metal hollow base in a penetrating manner, wherein each probe is respectively provided with a connecting end and a testing end, the connecting end of each probe protrudes out of the first end part of the metal hollow base, the testing end of each probe protrudes out of the second end part of the metal hollow base, and the testing end of each probe is arranged in a metal piece in a penetrating manner, so that one tail end of the testing end of each probe protrudes out of the metal piece, and an insulating material is filled in the metal piece to coat the probe in the metal piece;

the connecting end of each probe is respectively connected to one of the connecting parts; and

the testing part is provided with a first surface and a second surface which are arranged oppositely, the testing ends of the probes penetrate into the testing part from the second surface of the testing part until the metal piece of the probes is positioned in the testing part, and the tail ends of the testing ends of the probes are exposed out of the first surface of the testing part.

2. The coaxial test probe module of claim 1, wherein the insulating material is teflon.

3. The coaxial test probe module of claim 1, further comprising a fixing member disposed at the first end of the metal hollow base, wherein the plurality of connecting portions are disposed at the fixing member.

4. The coaxial testing probe module of claim 1, further comprising an assembly member disposed at the second end of the metal hollow base and having a through hole, wherein the testing portion is disposed through the through hole and fixed to the assembly member.

5. The coaxial testing probe module of claim 4, wherein the second surface side of the testing portion has a propping portion, the area of the propping portion is larger than the cross-sectional area of the through hole, so that the propping portion props against the side of the assembly member adjacent to the metal hollow base.

6. A test apparatus, comprising:

a carrier plate, which is provided with a containing groove for placing a transmission line to be tested;

a driving member; and

the coaxial probe module of any one of claims 1 to 5, wherein the at least one coaxial probe module is disposed above the carrier and corresponding to the accommodating slot, and the driving member drives the at least one coaxial probe module to approach the carrier until the end of the testing end of the probe of the at least one coaxial probe module contacts the transmission line to be tested.

7. The testing apparatus as claimed in claim 6, wherein a plurality of positioning elements are protruded from the second surface of the testing portion of the at least one coaxial testing probe module.

8. The testing device as claimed in claim 7, wherein the height of the positioning members protruding from the second surface is less than the height of the end of the testing end of the probe protruding from the second surface.

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