CN213517423U - Semiconductor diode inspection testing device - Google Patents
Semiconductor diode inspection testing device Download PDFInfo
- Publication number
- CN213517423U CN213517423U CN202022467578.1U CN202022467578U CN213517423U CN 213517423 U CN213517423 U CN 213517423U CN 202022467578 U CN202022467578 U CN 202022467578U CN 213517423 U CN213517423 U CN 213517423U
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- picture peg
- semiconductor diode
- fixed frame
- fixed
- butterfly nut
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Abstract
The utility model discloses a semiconductor diode test device, including unable adjustment base, unable adjustment base's inside is equipped with the picture peg, the outside of picture peg is equipped with fixed frame, fixed frame arranges in the top of picture peg with the picture peg is fixed through the rivet, fixed frame's inside is equipped with the diode body, the diode body inserts the inside electric connection that passes through of jack of picture peg, fixed frame's outside is equipped with butterfly nut, butterfly nut's inside is equipped with the screw pole, the one end of screw pole with butterfly nut passes through welded fastening. The fixing frame is arranged outside the inserting plate, the clamping block is arranged inside the fixing frame and is controlled by the butterfly nut, and the semiconductor diode in the fixing frame can be fixed, so that the stability of the semiconductor diode in the quality inspection and test process is improved, and the reliability of quality inspection and test data is improved.
Description
Technical Field
The utility model relates to a semiconductor diode technical field specifically is a semiconductor diode test device.
Background
When the existing semiconductor diode inspection and test device is used, the semiconductor diode cannot be fixed after being inserted into the plug board, so that the stability of the semiconductor diode is reduced in the processes of pulling out and pulling out the semiconductor diode, the stability of the semiconductor diode in the quality inspection and test process cannot be improved, and the reliability of quality inspection and test data is reduced.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a semiconductor diode test device has solved the problem that proposes among the background art.
In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a semiconductor diode test device, includes unable adjustment base, unable adjustment base's inside is equipped with the picture peg, the bottom embedding of picture peg is in unable adjustment base's inside is fixed through bolt and nut, the outside of picture peg is equipped with fixed frame, fixed frame arranges in the top of picture peg with the picture peg is fixed through the rivet, fixed frame's inside is equipped with the diode body, the diode body inserts the inside electric connection that passes through of jack of picture peg, fixed frame's outside is equipped with butterfly nut, butterfly nut's inside is equipped with the screw pole, the one end of screw pole with butterfly nut passes through welded fastening.
As a preferred embodiment of the present invention, the outer surface of the fixing frame is provided with a threaded hole, and the other end of the lead screw is inserted into the threaded hole and is connected to the inside of the threaded hole through a screw.
As a preferred embodiment of the present invention, the inside of the fixing frame is provided with a clamping block, and the clamping block is distributed corresponding to the diode body.
As a preferred embodiment of the present invention, the outer surface of the clamping block is provided with a mounting hole, and the lead screw is inserted into the mounting hole through a threaded connection.
As a preferred embodiment of the present invention, the bottom of the fixing base is provided with a mounting plate, the mounting plate and the fixing base are fixed by bolts and nuts.
Compared with the prior art, the beneficial effects of the utility model are as follows:
the fixing frame is arranged outside the inserting plate, the clamping block is arranged inside the fixing frame and is controlled by the butterfly nut, and the semiconductor diode in the fixing frame can be fixed, so that the stability of the semiconductor diode in the quality inspection and test process is improved, and the reliability of quality inspection and test data is improved.
Drawings
FIG. 1 is a front view of a semiconductor diode testing apparatus according to the present invention,
FIG. 2 is a cross-sectional view of the semiconductor diode testing apparatus of the present invention,
fig. 3 is the utility model relates to a semiconductor diode test testing arrangement's screw hole position schematic diagram.
In the figure, a fixed base 1, an inserting plate 2, a fixed frame 3, a diode body 4, a butterfly nut 5, a screw rod 6, a threaded hole 7, a clamping block 8, a mounting hole 9 and a mounting plate 10 are arranged.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-3, the present invention provides a technical solution: the utility model provides a semiconductor diode test device, includes unable adjustment base 1, unable adjustment base 1's inside is equipped with picture peg 2, the bottom embedding of picture peg 2 is in unable adjustment base 1's inside is fixed through screw bolt and nut, the outside of picture peg 2 is equipped with fixed frame 3, fixed frame 3 is arranged in picture peg 2's top with picture peg 2 is fixed through the rivet, fixed frame 3's inside is equipped with diode body 4, diode body 4 inserts the inside electric connection that passes through of picture peg 2's jack, fixed frame 3's outside is equipped with butterfly nut 5, butterfly nut 5's inside is equipped with screw rod 6, the one end of screw rod 6 with butterfly nut 5 passes through welded fastening.
Referring to fig. 1-2, the outer surface of the fixing frame 3 is provided with a threaded hole 7, the other end of the lead screw 6 is inserted into the threaded hole 7 and is connected with the threaded hole through a thread, and the lead screw 6 can be conveniently connected and fixed through the additionally arranged threaded hole 7.
Referring to fig. 1-2, the fixing frame 3 is provided therein with clamping blocks 8, the clamping blocks 8 are distributed corresponding to the diode body 4, and the semiconductor diode can be fixed by the additionally arranged clamping blocks 8.
Referring to fig. 1 to 3, the outer surface of the clamping block 8 is provided with a mounting hole 9, the lead screw 6 is inserted into the mounting hole 9 and is connected with the mounting hole by a screw thread, and the lead screw 6 can be conveniently connected with the mounting hole 9.
Referring to fig. 1-2, the bottom of the fixing base 1 is provided with an installation plate 10, the installation plate 10 and the fixing base 1 are fixed by bolts and nuts, and the installation of the device is facilitated by the additionally arranged installation plate 0, so that the installation convenience is improved.
A semiconductor diode test device be equipped with fixed frame 3 through the outside at picture peg 2 to be equipped with grip block 8 in fixed frame 3's inside, the grip block 8 of establishing controls it through the butterfly nut 5 that is equipped with, screws up butterfly nut 5, thereby indirect control grip block 8 under butterfly nut 5 to the control of screw rod 6, make grip block 8 press from both sides tightly can to the inside semiconductor diode of fixed frame 3.
The utility model discloses a unable adjustment base 1, picture peg 2, fixed frame 3, diode body 4, butterfly nut 5, lead screw 6, screw hole 7, grip block 8, mounting hole 9, mounting panel 10 part are the parts that universal standard spare or technical personnel in the field know, and its structure and principle all can learn through the technical manual or learn through conventional experimental method for this technical personnel, the utility model provides a current semiconductor diode test device inserts it after the inside of picture peg when using, can not fix semiconductor diode's itself, easily leads to extracting and extracting the in-process to its stability reduction to semiconductor diode to can not improve semiconductor diode's stability in the quality inspection test procedure, thereby reduce the problem of quality inspection test data's reliability. The utility model discloses an outside at the picture peg is equipped with fixed frame to be equipped with the grip block in fixed frame's inside, the grip block of establishing controls it through the butterfly nut who is equipped with, can realize fixing the semiconductor diode in the fixed frame, thereby improves the stability of semiconductor diode in quality inspection test process, thereby improves the reliability of quality inspection test data.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments described in the foregoing embodiments, or equivalents may be substituted for elements thereof. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (5)
1. A semiconductor diode inspection and test device is characterized in that: including unable adjustment base (1), the inside of unable adjustment base (1) is equipped with picture peg (2), the bottom embedding of picture peg (2) is in the inside of unable adjustment base (1) is fixed through screw bolt and nut, the outside of picture peg (2) is equipped with fixed frame (3), fixed frame (3) are arranged in the top of picture peg (2) with picture peg (2) are fixed through the rivet, the inside of fixed frame (3) is equipped with diode body (4), diode body (4) insert the inside electric connection that passes through of jack of picture peg (2), the outside of fixed frame (3) is equipped with butterfly nut (5), the inside of butterfly nut (5) is equipped with screw rod (6), the one end of screw rod (6) with butterfly nut (5) are through welded fastening.
2. The semiconductor diode inspection and test device of claim 1, wherein: the outer surface of the fixed frame (3) is provided with a threaded hole (7), and the other end of the screw rod (6) is inserted into the threaded hole (7) and is connected with the inside through threads.
3. The semiconductor diode inspection and test device of claim 1, wherein: the diode fixing frame is characterized in that clamping blocks (8) are arranged inside the fixing frame (3), and the clamping blocks (8) and the diode body (4) are distributed correspondingly.
4. A semiconductor diode inspection and test device according to claim 3, wherein: the outer surface of the clamping block (8) is provided with a mounting hole (9), and the lead screw (6) is inserted into the mounting hole (9) and is connected with the inside through threads.
5. The semiconductor diode inspection and test device of claim 1, wherein: the bottom of unable adjustment base (1) is equipped with mounting panel (10), mounting panel (10) with unable adjustment base (1) is fixed through bolt and nut.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022467578.1U CN213517423U (en) | 2020-10-30 | 2020-10-30 | Semiconductor diode inspection testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022467578.1U CN213517423U (en) | 2020-10-30 | 2020-10-30 | Semiconductor diode inspection testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN213517423U true CN213517423U (en) | 2021-06-22 |
Family
ID=76413724
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202022467578.1U Active CN213517423U (en) | 2020-10-30 | 2020-10-30 | Semiconductor diode inspection testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN213517423U (en) |
-
2020
- 2020-10-30 CN CN202022467578.1U patent/CN213517423U/en active Active
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