CN213337717U

CN213337717U - Testing mechanism

Info

Publication number: CN213337717U
Application number: CN202021866941.0U
Authority: CN
Inventors: 王振波; 陈兆林; 何颖东
Original assignee: Shenzhen Sunyilg Intelligent Equipment Co ltd
Current assignee: Shenzhen Sunyilg Intelligent Equipment Co ltd
Priority date: 2020-08-28
Filing date: 2020-08-28
Publication date: 2021-06-01
Anticipated expiration: 2030-08-28

Abstract

The application provides a test mechanism, including test disc subassembly, rotatory rotating assembly, push down test assembly and lifting unit, the test disc subassembly includes a set body, two at least test seats, the test seat includes first seat body and first circuit board, the seat body has yields standing groove and test groove, push down test assembly includes second seat body and second circuit board, the electricity is connected with the second circuit board and is used for contacting the first probe subassembly of yields and is used for contacting the second probe subassembly that awaits measuring. According to the testing mechanism provided by the application, when one testing seat is positioned at the position of the lower pressing testing component for testing, other testing seats can synchronously carry out feeding and discharging operations, so that the detection speed is increased; moreover, the to-be-tested piece, the good product, the first circuit board and the second circuit board can form a conduction loop, a cable does not need to be externally connected to the downward pressing test assembly and the test seat, and the cable cannot be wound when the test disc assembly rotates.

Description

Testing mechanism

Technical Field

The application belongs to the technical field of electronic device detection, and particularly relates to a testing mechanism.

Background

With the gradual commercial use of the next generation of internet, the new generation of mobile communication and digital television, the upgrading and updating of the electronic complete machine industry will bring huge market opportunities for the development of the electronic material and component industry. The demand for electronic components, particularly BTB products, is increasing, and the quality demands of customers are also becoming higher and higher. The performance detection of the product is an important means for ensuring the quality of the product. By detecting the performance of the product, the defective product is screened and removed, and the yield of the output product is ensured.

The detection mechanism on existing equipment is typically located at a separate station. The equipment absorbs the product through the suction nozzle and places the product on the detection mechanism, and after the detection of the detection mechanism is finished, the suction nozzle absorbs the product to the next station. When the performance that some products need to detect is more, need distribute detection mechanism on each different station one by one to detect the product with this, the detection of multistation can make the detection speed of product slow, influences the functioning speed of whole platform equipment.

In addition, when the existing testing assembly tests the electronic device, the testing seat and the testing assembly are required to be externally connected with cables to form a detection loop to detect the electronic device, and when the testing assembly or the testing seat moves, the external cables are easy to wind.

Disclosure of Invention

An object of the embodiment of the application is to provide a testing mechanism to when the performance that needs to detect that exists among the prior art is more, detect that speed is slower and external cable takes place winding technical problem easily.

In order to achieve the purpose, the technical scheme adopted by the application is as follows: the utility model provides a testing mechanism, include the test disc subassembly, be used for the drive the rotatory rotating assembly of test disc subassembly, push down the test subassembly and be used for the drive push down the lifting unit that the test subassembly removed, the test disc subassembly including connect in rotating assembly's dish body, be fixed in two at least test seats on the dish body, the test seat includes first seat body and first circuit board, the seat body has the yields standing groove that is used for placing the yields and is used for placing the test groove that awaits measuring, first circuit board is used for switching on yields and awaits measuring, it includes second seat body and second circuit board to push down the test subassembly, second circuit board electricity is connected with the first probe subassembly that is used for contacting the yields and is used for contacting the second probe subassembly that awaits measuring.

In one embodiment, the first probe assembly includes a first probe row and a second probe row for contacting pins on two sides of a good product, respectively, the second probe assembly includes a third probe row and a fourth probe row for contacting pins on two sides of a to-be-tested product, respectively, the first probe row and the fourth probe row are electrically connected, and the second probe row and the third probe row are electrically connected.

In one embodiment, the number of the test seats is two, and the two test seats are arranged in central symmetry with the rotation center of the disc body.

In one embodiment, the rotating assembly includes a first motor, and the disk body is connected to an output shaft of the first motor.

In one embodiment, the lifting assembly comprises a second motor, a transmission assembly driven by the second motor, and a guide structure for guiding the transmission assembly to output linear motion, and the press-down test assembly is connected to the guide structure.

In one embodiment, the guide structure comprises a slide rail fixedly arranged and a slide block slidably connected to the slide rail, and the push-down test assembly is fixedly connected to the slide block.

In one embodiment, the transmission assembly includes a swinging member fixed to the output shaft of the second motor and a protruding column fixed to the sliding block, the swinging member is provided with a strip-shaped groove, and the protruding column extends into the strip-shaped groove.

In one embodiment, the guide structure further comprises an elastic member for preventing the sliding block from falling off, and two ends of the elastic member are respectively connected to the sliding rail and the sliding block.

In one embodiment, the test tray assembly further comprises a correlation optical fiber for detecting whether the piece to be tested is in place.

In one embodiment, the testing mechanism further comprises a mounting frame, the mounting frame comprises a mounting base, a first side plate and a second side plate, the first side plate and the second side plate are both fixed on the mounting base, the rotating assembly is arranged on the first side plate, and the lifting assembly is arranged on the second side plate.

The application provides a accredited testing organization's beneficial effect lies in: compared with the prior art, this application accredited testing organization includes test disc subassembly, rotating assembly, pushes down test subassembly and lifting unit, lifting unit can drive push down test subassembly remove to with test disc subassembly on the piece contact test that awaits measuring, test disc subassembly includes two test seats at least, when one of them test seat is located and pushes down test subassembly department and test, other test seats can go up the unloading operation in step, improve detection speed. And, the test seat includes first seat body and first circuit board, the yields standing groove and the standing groove of the piece that awaits measuring have been seted up on the first seat body, be equipped with first probe subassembly and second probe subassembly on the second circuit board of push-down test subassembly, when testing, first probe subassembly and yields contact, second probe subassembly and the piece contact that awaits measuring, make the piece that awaits measuring, the yields, first circuit board and second circuit board form conduction loop, need not external cable on push-down test subassembly and test seat, like this, when the rotatory and push-down test subassembly of test dish subassembly goes up and down, the winding phenomenon of cable can not take place.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.

Fig. 1 is a perspective structural view of a testing mechanism provided in an embodiment of the present application;

FIG. 2 is a perspective view of a test disc assembly according to an embodiment of the present disclosure;

FIG. 3 is a perspective view of a test assembly according to an embodiment of the present disclosure;

fig. 4 is a perspective structural view of a lifting assembly provided in an embodiment of the present application.

Wherein, in the figures, the respective reference numerals:

1-a rotating assembly; 2-test disc assembly; 21-a disc body; 22-a test seat; 221-a first seat body; 2211-good product placing groove; 2212-test slot; 222-a first circuit board; 23-correlation optical fiber; 3-a lifting assembly; 31-a second motor; 32-a transmission assembly; 321-an oscillating piece; 3211-a strip groove; 322-raised posts; 33-a guide structure; 331-a slide rail; 332-a slider; 333-a second elastic member; 4-pressing down the test assembly; 41-a second seat body; 42-a second circuit board; 43-a first probe assembly; 431-first probe column; 432-a second probe column; 44-a second probe assembly; 441-third probe column; 442-fourth probe column; 5-mounting a frame; 51-a mounting base; 52-a first side panel; 53-second side plate.

Detailed Description

In order to make the technical problems, technical solutions and advantageous effects to be solved by the present application clearer, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.

It will be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like, as used herein, refer to an orientation or positional relationship indicated in the drawings that is solely for the purpose of facilitating the description and simplifying the description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be considered as limiting the present application.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.

The test mechanism provided in the embodiments of the present application will now be described.

In one embodiment of the present application, referring to fig. 1 to 3, the testing mechanism includes a rotating assembly 1, a test tray assembly 2, a lifting assembly 3, and a pressing testing assembly 4. The rotating assembly 1 is used for driving the test disc assembly 2 to rotate, and the lifting assembly 3 is used for driving the downward pressing test assembly 4 to move up and down. The test disc assembly 2 comprises a disc body 21 and at least two test seats 22, when the test mechanism works, a piece to be tested is placed on one of the test seats 22, the other test seat 22 is located below the downward pressing test assembly 4, the electronic device at the position of the downward pressing test assembly 4 is tested at the moment, after the electronic device is tested, the rotating assembly 1 rotates, the test seat 22 with the piece to be tested rotates to the position below the downward pressing test assembly 4, the lifting assembly 3 drives the downward pressing test assembly 4 to move downwards for testing, meanwhile, the discharging mechanism moves away the tested electronic device, and the feeding mechanism fills the next piece to be tested into the vacant test seat 22 to prepare for testing. So, the detection and the feeding and discharging of the piece to be detected can be carried out simultaneously, and the detection efficiency can be improved. More specifically, each test socket 22 includes a first socket body 221 and a first circuit board 222, a good product placing groove 2211 and a test slot 2212 are opened on the first socket body 221, the good product placing groove 2211 is used for placing a good product, and the test slot 2212 is used for placing a piece to be tested. The push-down test assembly 4 comprises a second seat body 41 and a second circuit board 42, the second circuit board 42 is electrically connected with a first probe assembly 43 and a second probe assembly 44, the first probe assembly 43 is used for contacting and conducting a good product, and the second probe assembly 44 is used for contacting and conducting a to-be-tested piece. Thus, when testing, a good product, the first probe assembly 43, the second circuit board 42, the second probe assembly 44, the to-be-tested element, and the first circuit board 222 form a conduction loop, and no external cable is required to be connected to the test disc assembly 2 and the lower test assembly 4, and no cable winding is generated when the test disc assembly 2 rotates.

The test mechanism in the above embodiment includes test disc assembly 2, rotating assembly 1, pushes down test assembly 4 and lifting unit 3, and lifting unit 3 can drive and push down test assembly 4 and move to with the test disc assembly 2 on the piece that awaits measuring contact test, and test disc assembly 2 includes two test sockets 22 at least, and when one of them test socket 22 was located and pushes down test assembly 4 department and tests, other test sockets 22 can go up the unloading operation in step, improve detection speed. Moreover, the test socket 22 includes the first socket body 221 and the first circuit board 222, the good product accommodating groove 2211 and the accommodating groove for the test component are opened on the first socket body 221, the first probe assembly 43 and the second probe assembly 44 are arranged on the second circuit board 42 of the push-down test component 4, when testing, the first probe assembly 43 contacts with the good product, the second probe assembly 44 contacts with the test component to be tested, so that the test component to be tested, the good product, the first circuit board 222 and the second circuit board 42 form a conduction loop, it is not necessary to connect cables on the push-down test component 4 and the test socket 22, thus, when the test component assembly 2 rotates and the push-down test component 4 rises, the cable winding phenomenon cannot occur.

In one embodiment of the present application, referring to fig. 2 and 3, the first probe assembly 43 includes a first probe row 431 and a second probe row 432, and the first probe row 431 and the second probe row 432 are respectively used for contacting two rows of pins on two sides of a good product, so that the pins on two sides of the good product can be conducted. The second probe assembly 44 includes a third probe row 441 and a fourth probe row 442, where the third probe row 441 and the fourth probe row 442 are respectively used for contacting two rows of pins on two sides of the device under test, so that the pins on two sides of the device under test can be conducted, and thus each pin of the device under test can be detected. Compared with the prior art that two probes are contacted on the same pin of the piece to be tested, the testing mechanism only needs to contact one probe on the same pin of the piece to be tested and tests the piece to be tested by conducting with a good product, so that the probability of poor contact when the probe is contacted with the piece to be tested is reduced, and particularly when the piece to be tested is small, the probability of poor contact between the probe and the pin of the electronic device can be reduced.

Optionally, referring to fig. 2, the test tray assembly 2 further includes a correlation fiber 23, the correlation fiber 23 may be used to detect whether the to-be-tested piece is placed in place, and when the to-be-tested piece is not placed in place, the correlation fiber may be fed back to the control system, so that the rotating assembly 1 and the lifting assembly 3 stop working, and the test mechanism is prevented from being damaged.

In one embodiment of the present application, referring to fig. 1 and fig. 2, the number of the test sockets 22 is two, and the two test sockets 22 are disposed in central symmetry with the rotation center of the disk body 21. Thus, the angle of each rotation of the rotating assembly 1 is the same, and the control program of the rotating assembly 1 can be simplified. When the to-be-tested object in one of the test sockets 22 is tested, the electronic device in the other test socket 22 is taken out by the blanking mechanism, and the other to-be-tested object is loaded into the test slot 2212 of the test socket 22 by the loading mechanism to be ready for testing.

In one embodiment of the present application, referring to fig. 1, the rotating assembly 1 includes a first motor, and the disc body 21 is connected to an output shaft of the first motor, so that the disc body 21 can rotate under the action of the first motor. The first motor may incorporate a speed reducer to rotate the disc body 21 at an appropriate angular velocity. In other embodiments, the rotating assembly 1 may also be other driving members capable of outputting a rotating motion, and is not limited herein.

In one embodiment of the present application, please refer to fig. 4, the lifting assembly 3 includes a second motor 31, a transmission assembly 32 and a guide structure 33, the second motor 31 can output a rotational motion, the transmission assembly 32 and the guide structure 33 cooperate to convert the rotational motion into a linear motion, and the push-down testing assembly 4 is connected to the guide structure 33, so as to realize an up-and-down motion under the driving of the guide structure 33. In other embodiments, the lifting assembly 3 may also be composed of a driving member such as a cylinder, a screw mechanism, etc. capable of outputting linear motion.

Optionally, the guiding structure 33 includes a sliding rail 331 and a sliding block 332, the sliding block 332 is slidably connected to the sliding rail 331, the push-down testing component 4 is fixedly connected to the sliding block 332, and a sliding direction of the sliding block 332 is a moving direction of the push-down testing component 4. With reference to fig. 4, the downward-pressing test assembly 4 moves up and down, the slide rail 331 is vertically disposed, and the moving direction of the slide block 332 is also vertical. The specific structure and shape of the slider 332 are not limited herein.

Alternatively, the transmission assembly 32 includes a swinging member 321 and a protrusion column 322, the swinging member 321 is fixed to the output shaft of the second motor 31, the output shaft of the second motor 31 moves synchronously with the swinging member 321, and the protrusion column 322 is fixed to the sliding block 332. The swinging member 321 is provided with a strip groove 3211, and the protruding column 322 extends into the strip groove 3211. More specifically, when the second motor 31 is operated, the oscillating member 321 oscillates along with the second motor, and the protruding column 322 moves correspondingly under the restriction of the strip groove 3211, while the protruding column 322 can only slide relative to the sliding rail 331 under the restriction of the sliding rail 331. In this way, the transmission assembly 32 and the guide structure 33 cooperate with each other to convert the rotary motion of the second motor 31 into the linear motion.

Optionally, the guiding structure 33 includes a sliding rail 331 and a sliding block 332, and further includes a second elastic member 333, two ends of the second elastic member 333 are respectively connected to the sliding rail 331 and the sliding block 332, and the second elastic member 333 is configured to prevent the sliding block 332 from suddenly falling. The slide rail 331 is fixed to the second side plate 53 described below, and one end of the second elastic member 333 may be fixed to the second side plate 53 or the slide rail 331. More specifically, when the slide rail 331 is vertically arranged, the slide block 332 moves up and down, when the second motor 31 is powered off, the slide block 332 may fall freely, and the second elastic member 333 is arranged to prevent the slide block 332 from falling freely, thereby ensuring the safety of the use of the testing mechanism.

In one embodiment of the present application, referring to fig. 1, the testing mechanism further includes a mounting frame 5, the mounting frame 5 includes a mounting base 51, a first side plate 52 and a second side plate 53, the first side plate 52 and the second side plate 53 are both fixed on the mounting base 51, and the first side plate 52 and the second side plate 53 can be vertically connected to the mounting base 51. The rotating assembly 1 is disposed on the first side plate 52, and specifically, the first motor of the rotating assembly 1 is fixed to the first side plate 52. The lifting assembly 3 is disposed on the second side plate 53, and specifically, the second motor 31 and the slide rail 331 of the lifting assembly 3 are fixed on the second side plate 53. In this way, the rotating assembly 1 and the lifting assembly 3 are supported and mounted by providing the mounting bracket 5.

The above description is only exemplary of the present application and should not be taken as limiting the present application, as any modification, equivalent replacement, or improvement made within the spirit and principle of the present application should be included in the protection scope of the present application.

Claims

1. A testing mechanism, its characterized in that: including the test disc subassembly, be used for the drive the rotatory rotating assembly of test disc subassembly, push down the test subassembly and be used for the drive push down the lifting unit that the test subassembly removed, the test disc subassembly including connect in rotating assembly's dish body, be fixed in two at least test seats on the dish body, the test seat includes first seat body and first circuit board, the seat body has the yields standing groove that is used for placing the yields and is used for placing the test groove that awaits measuring, first circuit board is used for switching on the yields and awaits measuring, it includes second seat body and second circuit board to push down the test subassembly, second circuit board electricity is connected with the first probe subassembly that is used for contacting the yields and is used for contacting the second probe subassembly that awaits measuring.

2. The test mechanism of claim 1, wherein: the first probe assembly comprises a first probe row and a second probe row which are respectively used for contacting pins on two sides of a good product, the second probe assembly comprises a third probe row and a fourth probe row which are respectively used for contacting pins on two sides of a to-be-detected product, the first probe row is electrically connected with the fourth probe row, and the second probe row is electrically connected with the third probe row.

3. The test mechanism of claim 1, wherein: the number of the test seats is two, and the two test seats are arranged in a central symmetry mode by using the rotation center of the disc body.

4. The test mechanism of claim 1, wherein: the rotating assembly includes a first motor, and the disk body is connected to an output shaft of the first motor.

5. The test mechanism of claim 1, wherein: the lifting assembly comprises a second motor, a transmission assembly driven by the second motor and a guide structure used for guiding the transmission assembly to output linear motion, and the downward pressing test assembly is connected to the guide structure.

6. The test mechanism of claim 5, wherein: the guide structure including fixed slide rail and the sliding connection that sets up in sliding block on the slide rail, push down test assembly fixed connection in the sliding block.

7. The test mechanism of claim 6, wherein: the transmission assembly comprises a swinging piece fixed on an output shaft of the second motor and a protruding column fixed on the sliding block, a strip-shaped groove is formed in the swinging piece, and the protruding column stretches into the strip-shaped groove.

8. The test mechanism of claim 6, wherein: the guide structure still includes the elastic component that is used for preventing the sliding block and drops, the both ends of elastic component connect respectively in the slide rail with the sliding block.

9. The test mechanism of any one of claims 1-8, wherein: the test disc assembly also comprises a correlation optical fiber for detecting whether the piece to be tested is in place.

10. The test mechanism of any one of claims 1-8, wherein: the testing mechanism further comprises a mounting frame, the mounting frame comprises a mounting base, a first side plate and a second side plate, the first side plate and the second side plate are fixed on the mounting base, the rotating assembly is arranged on the first side plate, and the lifting assembly is arranged on the second side plate.