CN213240417U - Mainboard inspection circuit and mainboard inspection system - Google Patents
Mainboard inspection circuit and mainboard inspection system Download PDFInfo
- Publication number
- CN213240417U CN213240417U CN202021995900.1U CN202021995900U CN213240417U CN 213240417 U CN213240417 U CN 213240417U CN 202021995900 U CN202021995900 U CN 202021995900U CN 213240417 U CN213240417 U CN 213240417U
- Authority
- CN
- China
- Prior art keywords
- mainboard
- circuit
- test point
- test
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 37
- 238000012360 testing method Methods 0.000 claims abstract description 107
- 239000000523 sample Substances 0.000 claims abstract description 38
- 238000006243 chemical reaction Methods 0.000 claims abstract description 13
- 230000000087 stabilizing effect Effects 0.000 claims abstract description 10
- 239000003990 capacitor Substances 0.000 claims description 6
- 238000012795 verification Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 6
- 238000001514 detection method Methods 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Images
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The utility model provides a mainboard inspection circuit and mainboard inspection system, this circuit include test mainboard, probe group, display screen, drive actuating cylinder, the probe group includes that a plurality of sets up the test point probe on the probe panel, will every test point probe on the probe panel with the test point that corresponds on the mainboard of being surveyed establishes the connection correspond under the probe panel the position of probe group is equipped with and is used for placing the trench is placed to the mainboard of being surveyed the mainboard, the test mainboard includes power input end, voltage stabilizing circuit, test point input circuit, analog switch circuit, control module, analog-to-digital conversion module. The utility model discloses a detect mainboard test point voltage, can realize reading the function of a plurality of test point voltages for the mainboard inspection in batches, convenient to use is nimble, improves the efficiency of inspection, the save time cost.
Description
Technical Field
The utility model relates to a detection device technical field especially relates to a mainboard inspection circuit and be applied to mainboard inspection system of this circuit.
Background
The existing common voltage detection device mostly uses a universal meter to detect the voltage of a test point, can not rapidly measure a plurality of test points simultaneously, and has the characteristic of singleness.
Therefore, the disadvantages of the prior art: the existing voltage detection device can only manually measure one point by one point, and for the detection of a plurality of test points, the operation is more complicated, inconvenient and lower in efficiency.
SUMMERY OF THE UTILITY MODEL
The utility model discloses a main aim at provides a convenient to use is nimble, improves the efficiency of inspection, the mainboard inspection circuit of save time cost.
Another object of the utility model is to provide a convenient to use is nimble, improves the efficiency of inspection, mainboard inspection system of save time cost.
In order to achieve the above main object, the present invention provides a motherboard testing circuit, which comprises a testing motherboard connected to a tested motherboard, the test mainboard comprises a power input end, a voltage stabilizing circuit, a test point input circuit, an analog switch circuit, a control module and an analog-to-digital conversion module, wherein the voltage stabilizing circuit is connected with the power input end, the analog-to-digital conversion module is integrated in the control module, the test point input circuit is used for inputting a plurality of test point voltage signals of the tested mainboard, the output end of the test point input circuit is connected with the input end of the analog switch circuit, the analog switch circuit sequentially outputs test point voltage signals to the control module, the control module controls the output logic of the analog switch circuit, and sends display information to a display screen to display corresponding test point information through a serial port after analog-to-digital conversion.
In a further scheme, the test point input circuit comprises an operational amplifier, a test point input end and a test point output end, wherein the input end of the operational amplifier is connected with the test point input end, and a resistor R1 and a resistor R2 are connected between the output end of the operational amplifier and the test point output end.
In a further aspect, the voltage regulator circuit includes an LDO regulator chip, a capacitor C5 is connected between an input terminal of the LDO regulator chip and the power input terminal, and a capacitor C6 and a resistor R12 are connected between an output terminal of the LDO regulator chip and the power output terminal.
In a further aspect, the analog switch circuit includes an ADG732 analog switch chip.
In a further scheme, the control module comprises an STM32 single chip microcomputer, the STM32 single chip microcomputer outputs the test point voltage to an ADC port of the STM32 single chip microcomputer through an ADG732 analog switch chip, and display information is sent to the display screen through a serial port to display corresponding test point information after analog-to-digital conversion.
In a further scheme, the inspection circuit further comprises an upper computer which transmits data and instructions with the test mainboard.
In a further scheme, the test main board further comprises an overcurrent and overvoltage protection circuit, and the overcurrent and overvoltage protection circuit is connected with the control module and used for performing overcurrent and overvoltage protection on the test main board.
In order to realize foretell another purpose, the utility model provides a pair of mainboard inspection system, it includes by survey mainboard, as above mainboard inspection circuit, probe group, display screen and drive actuating cylinder, mainboard inspection circuit include with the test mainboard of being surveyed mainboard connection, the test mainboard adopts probe group lug connection with being surveyed the mainboard, probe group includes that a plurality of sets up the test point probe on the probe panel, will every test point probe on the probe panel with the test point that corresponds on the survey mainboard establishes the connection, the probe panel by drive actuating cylinder drive and do reciprocating motion from top to bottom the position of probe group is equipped with and is used for placing the trench is placed to the mainboard of being surveyed the mainboard.
In a further scheme, after the tested mainboard is placed in the mainboard placing slot, the testing mainboard detects whether the tested mainboard is placed in place through the photoelectric sensor.
Therefore, the utility model contacts the test point of the tested mainboard through the structure probe, and the test point is input to the ADG732 analog switch chip after the voltage of the operational amplifier is followed; the switch output logic of the ADG732 analog switch chip is controlled by the control module, the voltages of the test points are sequentially output to the control module by the ADG732 analog switch chip, and the control module is communicated with a display screen through serial ports TX and RX to display the voltage information of the corresponding test points, so that the function of reading the voltages of the plurality of test points is realized.
Therefore, the utility model is simple in operation convenient, user experience is good, and inspection efficiency is high, the save time cost.
Drawings
Fig. 1 is a schematic diagram of an embodiment of a motherboard inspection system of the present invention.
Fig. 2 is a schematic diagram of an embodiment of a motherboard inspection circuit.
Fig. 3 is a schematic circuit diagram of a test point input circuit in an embodiment of a motherboard test circuit of the present invention.
Fig. 4 is a schematic circuit diagram of a voltage stabilizing circuit in an embodiment of the motherboard testing circuit of the present invention.
Fig. 5 is a schematic circuit diagram of an analog switch circuit in an embodiment of the main board inspection circuit of the present invention.
Fig. 6 is a schematic circuit diagram of a control module in an embodiment of the motherboard inspection circuit of the present invention.
Detailed Description
In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the drawings of the embodiments of the present invention are combined below to clearly and completely describe the technical solution of the embodiments of the present invention. It is to be understood that the embodiments described are only some of the embodiments of the present invention, and not all of them. All other embodiments, which can be obtained by a person skilled in the art without any inventive work based on the described embodiments of the present invention, belong to the protection scope of the present invention.
As shown in fig. 2, the motherboard testing circuit of the present invention comprises a testing motherboard 9 connected to a tested motherboard, the testing motherboard 9 comprises a power input terminal 11, a voltage regulator circuit 12, a testing point input circuit 13, an analog switch circuit 14, a control module 15, an array key module 19, and an analog-to-digital conversion module 16, the voltage regulator circuit 12 is connected to the power input terminal 11, the analog-to-digital conversion module 16 is integrated in the control module 15, the test point input circuit 13 is used for inputting a plurality of test point voltage signals of the tested mainboard 8, the output end of the test point input circuit 13 is connected with the input end of the analog switch circuit 14, the analog switch circuit 14 sequentially outputs the test point voltage signals to the control module 15, the control module 15 controls the output logic of the analog switch circuit 14, and display information is sent to the display screen 17 through a serial port after analog-to-digital conversion to display corresponding test point information.
It is thus clear that the utility model is used for detect mainboard test point voltage to contrast standard threshold value, make corresponding judgement, and show each item information through display screen 17.
Referring to fig. 3, the test point input circuit 13 includes an operational amplifier U5, a test point input terminal, and a test point output terminal, wherein an input terminal of the operational amplifier U5 is connected to the test point input terminal, and a resistor R1, a resistor R2, a resistor R3, and a resistor R4 are connected between an output terminal of the operational amplifier U5 and the test point output terminal. It can be seen that this circuit is a test point input circuit 13, and the voltage is followed by the LM358 operational amplifier, and then divided by the resistor, and input to the ADG732 analog switch chip U1. The circuit can realize circuit following of two test voltages, each test voltage needs half of functions of an LM358 operational amplifier, for example, the circuit following of one test voltage can be realized by arranging the voltage dividing resistors R1 and R2 at the output end, and the circuit following of a second test voltage can be realized by arranging the voltage dividing resistors R3 and R4 at the output end.
Referring to fig. 4, the voltage regulator 12 includes an LDO regulator chip U3, a capacitor C5 is connected between the input terminal of the LDO regulator chip U3 and the power input terminal 11, and a capacitor C6 and a resistor R12 are connected between the output terminal of the LDO regulator chip U3 and the power output terminal. Therefore, the circuit adopts the LDO chip to reduce the voltage by 3.3V to supply power to the STM32 single chip microcomputer and the ADG732 analog switch chip U1.
Referring to fig. 5, the analog switch circuit 14 includes an ADG732 analog switch chip U1. Therefore, the circuit is an ADG732 chip module, the switch output logic of the ADG732 chip is controlled according to the IO port of the STM32 singlechip, and the voltage of a test point is output to the ADC port of the STM32 singlechip.
Referring to fig. 6, the control module 15 includes an STM32 single chip microcomputer (U2), the STM32 single chip microcomputer outputs test point voltages to an ADC port of the STM32 single chip microcomputer through an ADG732 analog switch chip U1, and sends display information to the display screen 17 through a serial port to display corresponding test point information after analog-to-digital conversion. Therefore, the circuit is an STM32 single chip microcomputer, is input to an ADC port through an ADG732 chip, and sends information to a serial port display screen through a serial port TX to display corresponding test point information after analog-to-digital conversion.
In this embodiment, the inspection circuit further includes an upper computer 100 for data and instruction transmission with the test motherboard 9. Specifically, the upper computer 100 controls the test motherboard 9 to detect whether the voltage and the current of the test point set on the tested motherboard 8 are normal.
Preferably, the test motherboard 9 further includes an overcurrent and overvoltage protection circuit, and the overcurrent and overvoltage protection circuit is connected to the control module and is configured to perform overcurrent and overvoltage protection on the test motherboard 9.
In this embodiment, a motherboard inspection system is further provided, as shown in fig. 1, the system includes a tested motherboard 8, the motherboard inspection circuit described above, a probe group 61, a display screen 17, a pull rod 62, a receiving board 2, a guide post 4, and a driving cylinder 60, a test motherboard 9 of the motherboard inspection circuit is directly connected to the tested motherboard 8 through the probe group 61, the probe group 61 includes a plurality of test point probes arranged on a probe panel, each test point probe on the probe panel is connected to a corresponding test point on the tested motherboard 8, the probe panel is driven by the driving cylinder 60 to move up and down in a reciprocating manner, and a motherboard placing slot for placing the tested motherboard 8 is provided at a position corresponding to the probe group 61 under the probe panel.
Wherein, a horizontally and transversely arranged bearing plate 2 is arranged below the top surface of the shell, a vertically arranged pull rod 62 is arranged above the bearing plate 2, the top end of the pull rod 62 is connected with a driving cylinder 60, and the pull rod 62 is connected with a piston rod of the cylinder 60.
Preferably, after the tested motherboard 8 is placed in the motherboard placement slot, the test motherboard 9 detects whether the tested motherboard 8 is placed in place through the photoelectric sensor.
Therefore, the utility model contacts the test point of the tested mainboard 8 through the structure probe, and the voltage is input to the ADG732 analog switch chip U1 after being followed by the voltage of the operational amplifier U5; the switch output logic of the ADG732 analog switch chip U1 is controlled by the control module 15, the voltages of the test points are sequentially output to the control module 15 by the ADG732 analog switch chip U1, and the control module 15 communicates with the display screen 17 through serial ports TX and RX to display the voltage information of the corresponding test points, so that the function of reading the voltages of the plurality of test points is realized.
Therefore, the utility model discloses verifying attachment user experience is good, and easy operation is convenient, and inspection efficiency is high, the save time cost.
It is to be noted that technical or scientific terms used in the present disclosure should have the ordinary meanings as understood by those having ordinary skill in the art to which the present invention belongs, unless otherwise defined. The use of "first," "second," and similar terms in this disclosure is not intended to indicate any order, quantity, or importance, but rather is used to distinguish one element from another. Also, the use of the terms "a," "an," or "the" and similar referents do not denote a limitation of quantity, but rather denote the presence of at least one. The word "comprising" or "comprises", and the like, means that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items. The terms "connected" or "coupled" and the like are not restricted to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", and the like are used merely to indicate relative positional relationships, and when the absolute position of the object being described is changed, the relative positional relationships may also be changed accordingly.
The above is only the preferred embodiment of the present invention, but the design concept of the present invention is not limited thereto, and all the insubstantial modifications made by the present invention by using the design concept also fall within the protection scope of the present invention.
Claims (9)
1. A motherboard verification circuit, comprising:
the test mainboard is connected with the tested mainboard and comprises a power input end, a voltage stabilizing circuit, a test point input circuit, an analog switch circuit, a control module and an analog-to-digital conversion module, wherein the voltage stabilizing circuit is connected with the power input end and used for outputting a working power supply, the analog-to-digital conversion module is integrated in the control module, the test point input circuit is used for inputting a plurality of test point voltage signals of the tested mainboard, the output end of the test point input circuit is connected with the input end of the analog switch circuit, the analog switch circuit sequentially outputs the test point voltage signals to the control module, the control module controls the output logic of the analog switch circuit, and display information is sent to a display screen through a serial port after analog-to-digital conversion to display corresponding test point information.
2. The motherboard inspection circuit as recited in claim 1, wherein:
the test point input circuit comprises an operational amplifier, a test point input end and a test point output end, wherein the input end of the operational amplifier is connected with the test point input end, and a resistor R1 and a resistor R2 are connected between the output end of the operational amplifier and the test point output end.
3. The motherboard inspection circuit as recited in claim 1, wherein:
the voltage stabilizing circuit comprises an LDO voltage stabilizing chip, a capacitor C5 is connected between the input end of the LDO voltage stabilizing chip and the power input end, and a capacitor C6 and a resistor R12 are connected between the output end of the LDO voltage stabilizing chip and the power output end.
4. The motherboard inspection circuit as recited in claim 1, wherein:
the analog switch circuit includes an ADG732 analog switch chip.
5. The motherboard inspection circuit of claim 4, wherein:
the control module comprises an STM32 single chip microcomputer, the STM32 single chip microcomputer outputs the test point voltage to an ADC port of the STM32 single chip microcomputer through an ADG732 analog switch chip, and the test point voltage is converted into analog and digital signals and then sends display information to the display screen through a serial port to display corresponding test point information.
6. The board inspection circuit according to any one of claims 1 to 5, wherein:
the inspection circuit further comprises an upper computer which transmits data and instructions with the test mainboard.
7. The board inspection circuit according to any one of claims 1 to 5, wherein:
the test mainboard further comprises an overcurrent and overvoltage protection circuit, and the overcurrent and overvoltage protection circuit is connected with the control module and used for carrying out overcurrent and overvoltage protection on the test mainboard.
8. A motherboard inspection system, comprising:
the mainboard test circuit comprises a test mainboard connected with the mainboard to be tested, the test mainboard is directly connected with the mainboard to be tested by adopting the probe set, the probe set comprises a plurality of test point probes arranged on a probe panel, each test point probe on the probe panel is connected with a corresponding test point on the mainboard to be tested, the probe panel is driven by the driving cylinder to move up and down in a reciprocating manner, and a mainboard placing slot used for placing the mainboard to be tested is arranged at a position corresponding to the probe set under the probe panel.
9. The motherboard inspection system as recited in claim 8, wherein:
when the tested mainboard is arranged in the mainboard placing groove, the testing mainboard detects whether the tested mainboard is placed in place through the photoelectric sensor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021995900.1U CN213240417U (en) | 2020-09-11 | 2020-09-11 | Mainboard inspection circuit and mainboard inspection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021995900.1U CN213240417U (en) | 2020-09-11 | 2020-09-11 | Mainboard inspection circuit and mainboard inspection system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN213240417U true CN213240417U (en) | 2021-05-18 |
Family
ID=75874714
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202021995900.1U Active CN213240417U (en) | 2020-09-11 | 2020-09-11 | Mainboard inspection circuit and mainboard inspection system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN213240417U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113533944A (en) * | 2021-09-17 | 2021-10-22 | 莱克电气绿能科技(苏州)有限公司 | Intelligent equipment main control board testing method |
| CN117214692A (en) * | 2023-04-28 | 2023-12-12 | 东莞市小强电子科技有限公司 | Multifunctional electric performance testing system and testing process for brushless motor |
-
2020
- 2020-09-11 CN CN202021995900.1U patent/CN213240417U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113533944A (en) * | 2021-09-17 | 2021-10-22 | 莱克电气绿能科技(苏州)有限公司 | Intelligent equipment main control board testing method |
| CN117214692A (en) * | 2023-04-28 | 2023-12-12 | 东莞市小强电子科技有限公司 | Multifunctional electric performance testing system and testing process for brushless motor |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101661418B (en) | Keyboard testing system | |
| CN213240417U (en) | Mainboard inspection circuit and mainboard inspection system | |
| CN101930025A (en) | Power dissipation testing device | |
| CN108896900A (en) | A kind of wireless charging system device for testing functions and test method | |
| CN106526455A (en) | Circuit board detection and diagnosis system and method for missile launch control device | |
| CN207396620U (en) | Have both the tester of fast charge test and voltage conversion | |
| CN101042813B (en) | Intelligent digital experiment system | |
| CN208013366U (en) | A kind of RF IC automatic testing equipment | |
| CN211453815U (en) | Electronic product batch aging test system | |
| CN202256605U (en) | Load capacity testing device of main board interface | |
| CN207832960U (en) | A kind of circuit board testing system | |
| CN207908608U (en) | Metering device wire searcher | |
| CN206832849U (en) | PLC mainboard measurement jigs | |
| CN107491004A (en) | Intelligent weighing tester and its application method | |
| CN206193181U (en) | Accuse device circuit board detection diagnosis equipment is sent out to guided missile | |
| CN200986437Y (en) | Digitalized experiment system | |
| CN212459857U (en) | Hand-held inductive load direct current resistance automatic measuring device | |
| CN210513202U (en) | Portable multipath temperature and humidity acquisition device | |
| CN211653008U (en) | Integrated multi-instrument detector | |
| CN208076073U (en) | A kind of digital contact holding tension gauge | |
| CN102393504A (en) | Plotting device of schematic diagram of circuit board | |
| CN202049186U (en) | Detection module for digital oscilloscope | |
| CN207585835U (en) | Hand-held torque calibrator | |
| CN208026858U (en) | A kind of electric energy meter power consumption test module | |
| CN206400068U (en) | A kind of subway relay test-device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address | ||
| CP03 | Change of name, title or address |
Address after: Floors 4-8, Building 1, No. 199 Shui'an 1st Road, Xiangzhou District, Zhuhai City, Guangdong Province Patentee after: Zhuhai Shixin Medical Technology Co.,Ltd. Country or region after: China Address before: 4th Floor, Building B, No. 6 Pingxi 10th Road, Nanping Science and Technology Industrial Park, Xiangzhou District, Zhuhai City, Guangdong Province Patentee before: ZHUHAI SEESHEEN MEDICAL TECHNOLOGY CO.,LTD. Country or region before: China |