CN213121644U

CN213121644U - Microscope detection platform

Info

Publication number: CN213121644U
Application number: CN202021351316.2U
Authority: CN
Inventors: 闪雷章
Original assignee: Jiangsu Bo'ao Optical Instrument Co ltd
Current assignee: Jiangsu Bo'ao Optical Instrument Co ltd
Priority date: 2020-07-10
Filing date: 2020-07-10
Publication date: 2021-05-04
Anticipated expiration: 2030-07-10

Abstract

The utility model discloses a microscope detection platform, which comprises a base, wherein a supporting shaft is arranged at the middle position of the top of the base, a rotating plate is arranged at the top of the supporting shaft, a second bevel gear is arranged at the middle position of the outer side of the supporting shaft, a mounting plate is arranged at one side of the bottom of the rotating plate, and clamping grooves are symmetrically arranged at the top and the bottom of one side of the mounting plate; the utility model discloses the device is through carrying out the all-round removal to testing platform, can observe each position of sample, guarantee carefully and comprehensive to the sample observation, improve the quality and the accuracy of detection, rotate to suitable position department to testing platform simultaneously, can fix the platform, make can keep the stability of detection when detecting, prevent because the touching leads to the rotation of platform, reduce unnecessary trouble, thereby improve the efficiency of detection, can carry out quick fixed to the sample simultaneously, improve the stability of sample.

Description

Microscope detection platform

Technical Field

The utility model relates to a testing platform technical field specifically is a microscope testing platform.

Background

After the material preparation and cutting process in the lithium battery industry, the plane burr of a first piece needs to be tested, and mass production can be carried out only after the burr test of the first piece is passed;

but in practice there are certain disadvantages in use:

1. firstly, when a detected sample is observed, the moving range of a platform is limited, so that the detected sample is not observed comprehensively, and a certain deviation is generated on a detected structure;

2. meanwhile, when the addition platform rotates, due to the fact that the addition platform is generally not fixed, the platform is easy to touch during detection, the platform rotates, a detection sample deviates from an observation range, the microscope needs to be focused and adjusted again, time is wasted, and detection efficiency is reduced;

3. meanwhile, the sample lacks an effective fixing device, so that the sample is easy to move and shift when the platform is moved or rotated.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a microscope testing platform to solve the problem that proposes among the above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme: a microscope detection platform comprises a base, wherein a supporting shaft is arranged at the middle position of the top of the base, a rotating plate is arranged at the top of the supporting shaft, a second bevel gear is arranged at the middle position of the outer side of the supporting shaft, a mounting plate is arranged at one side of the bottom of the rotating plate, clamping grooves are symmetrically arranged at the top and the bottom of one side of the mounting plate, a sleeve is sleeved at the middle position of one side of the mounting plate close to the clamping grooves, clamping blocks are arranged at one sides of the top and the bottom of the sleeve, the clamping blocks are matched with the clamping grooves, limiting sliding grooves are symmetrically arranged at the top and the bottom of the inner part of the sleeve, a rotating shaft is sleeved inside the sleeve, limiting sliding blocks are symmetrically arranged at one sides of the top and the bottom of the rotating shaft, the limiting sliding blocks are matched with the limiting sliding grooves in a, intermeshing between first bevel gear and the second bevel gear, the bilateral symmetry at commentaries on classics board top is provided with first guide rail, and is two sets of the inside of first guide rail all is provided with first spout, and is two sets of the inside of first spout all slides and is provided with first slider, and is two sets of the top of first slider is provided with the second guide rail, the intermediate position department at second guide rail top is provided with the second spout, the inside of second spout slides and is provided with the second slider, the top of second slider is provided with places the platform, the both ends symmetry of placing a top portion is provided with the fixed block, and is two sets of the one end that the fixed block is close to each other all is provided with the second spring, and is two sets of the one end that the second spring is close to each other all is.

Preferably, the grip block is L-shaped and the grip block is internally provided with rubber.

Preferably, the first bevel gear and the second bevel gear are at ninety degrees to each other.

Preferably, the bottom of base is provided with the blotter, and the blotter bottom is provided with the raised grain.

Preferably, a grab handle is arranged on one side, away from the first bevel gear, of the sleeve.

Preferably, the first sliding groove and the first sliding block are in a T shape in cross section, and the first sliding block and the first sliding groove are matched with each other in a sliding mode.

Compared with the prior art, the beneficial effects of the utility model are that: the microscope detection platform can carry out all-dimensional movement on the detection platform, can observe each position of a sample, ensures careful and comprehensive observation of the sample, improves the detection quality and accuracy, and can fix the platform when the detection platform rotates to a proper position, so that the detection stability can be kept during detection, the rotation of the platform caused by touch is prevented, unnecessary troubles are reduced, the detection efficiency is improved, and meanwhile, the sample can be quickly fixed, and the stability of the sample is improved;

1. through the mutual matching of the first guide rail, the second guide rail, the placing table, the second sliding block, the clamping plate, the second sliding groove, the first sliding block and the first sliding groove, the detection platform can move in all directions, so that each position of a sample can be observed, the careful and comprehensive observation of the sample is ensured, and the detection quality and accuracy are improved;

2. through the mutual matching among the sleeve, the first spring, the limiting sliding groove, the limiting sliding block, the clamping groove, the rotating shaft, the clamping block and the mounting plate, when the detection platform rotates to a proper position, the platform can be fixed, so that the detection stability can be kept during detection, the rotation of the platform caused by touch is prevented, unnecessary troubles are reduced, and the detection efficiency is improved;

3. through mutually supporting between grip block, fixed block and the second spring, can carry out quick fixed to the sample simultaneously, improve the stability of sample.

Drawings

Fig. 1 is a front sectional view of the present invention;

FIG. 2 is a front view of the present invention;

fig. 3 is a top view of the present invention;

fig. 4 is an enlarged schematic view of a structure in fig. 1 according to the present invention.

In the figure: 1. a base; 2. a first bevel gear; 3. a sleeve; 4. a first spring; 5. a first guide rail; 6. A second guide rail; 7. a placing table; 8. a second slider; 9. a clamping plate; 10. a second chute; 11. a first slider; 12. a first chute; 13. rotating the plate; 14. a second bevel gear; 15. a support shaft; 16. a limiting chute; 17. a limiting slide block; 18. a card slot; 19. a rotating shaft; 20. a clamping block; 21. mounting a plate; 22. a fixed block; 23. a second spring.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-4, the present invention provides an embodiment: a microscope detection platform comprises a base 1, a supporting shaft 15 is arranged at the middle position of the top of the base 1, a rotating plate 13 is arranged at the top of the supporting shaft 15, a second bevel gear 14 is arranged at the middle position of the outer side of the supporting shaft 15, a mounting plate 21 is arranged at one side of the bottom of the rotating plate 13, clamping grooves 18 are symmetrically arranged at the top and the bottom of one side of the mounting plate 21, a sleeve 3 is sleeved at the middle position of one side of the mounting plate 21 close to the clamping grooves 18, clamping blocks 20 are arranged at one sides of the top and the bottom of the sleeve 3 to prevent the rotating plate 13 from rotating randomly, the clamping blocks 20 are matched with the clamping grooves 18, limiting sliding grooves 16 are symmetrically arranged at the top and the bottom inside of the sleeve 3, a rotating shaft 19 is sleeved inside the sleeve 3, limiting sliding blocks 17 are symmetrically arranged at one sides of the top and the bottom of, one side that first spring 4 was kept away from to pivot 19 is provided with first bevel gear 2, intermeshing between first bevel gear 2 and the second bevel gear 14, the bilateral symmetry at commentaries on classics board 13 top is provided with first guide rail 5, the inside of two sets of first guide rail 5 all is provided with first spout 12, the inside of two sets of first spout 12 all slides and is provided with first slider 11, the top of two sets of first sliders 11 is provided with second guide rail 6, the intermediate position department at second guide rail 6 top is provided with second spout 10, the inside of second spout 10 slides and is provided with second slider 8, the top of second slider 8 is provided with places platform 7, the both ends symmetry of placing platform 7 top is provided with fixed block 22, the one end that two sets of fixed block 22 are close to each other all is provided with second spring 23, the one end that two sets of second spring 23 are close to each other all is provided with grip block 9, stabilize the centre.

In this implementation, grip block 9 is the L type and grip block 9 is inside all to be provided with the rubber pad, prevent the damage to the sample, be ninety degrees between first bevel gear 2 and the second bevel gear 14, be convenient for first bevel gear 2 rotates second bevel gear 14, base 1's bottom is provided with the blotter, and the blotter bottom is provided with the raised grain, make the test platform place more stably, one side that first bevel gear 2 was kept away from to sleeve pipe 3 is provided with the grab handle, be convenient for rotate sleeve pipe 3, first spout 12 and first slider 11's cross section department T type, mutual slip adaptation between first slider 11 and the first spout 12, prevent that first slider 11 from droing from the inside of first spout 12.

The working principle is as follows: firstly, a sample to be detected is placed between two groups of clamping plates 9 at the top of a placing table 7, the two groups of clamping plates 9 are pulled out towards two ends, at the moment, second springs 23 are compressed, and the sample is clamped and fixed under the action of the two groups of second springs 23 after the sample is placed;

focusing and aligning a sample by a microscope, when the sample needs to be comprehensively observed, sliding the movable placing platform 7 in the second sliding groove 10 through the second sliding block 8, moving the sample left and right, holding the second sliding groove 10, and moving the sample back and forth in the first guide rail 5 through the first sliding block 11, so that the sample can be comprehensively moved on a platform of the sample, and each position of the sample can be observed;

meanwhile, when the detection platform needs to be rotated, the sleeve 3 is pushed to move towards the first bevel gear 2 at the moment, the sleeve 3 drives the two groups of fixture blocks 20 to move, the fixture blocks are separated from the inside of the clamping groove 18, the sleeve 3 is removed from being fixed, then the sleeve 3 is rotated, the sleeve 3 is matched with the limiting sliding block 17 through the limiting sliding groove 16, the rotating shaft 19 is driven to rotate, the rotating shaft 19 drives the first bevel gear 2 to rotate, the first bevel gear 2 drives the supporting shaft 15 to rotate through the second bevel gear 14, the supporting shaft 15 drives the rotating plate 13 to rotate, finally, the rotating plate 13 drives the sample to rotate, the sample is detected more carefully, the sleeve 3 is pulled backwards at the moment, the sleeve 3 drives the two groups of fixture blocks 20 to be inserted into the inside of the clamping groove 18, the sleeve 3 is fixed, the platform is fixed, and the platform is.

It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

In the description of the present invention, "a plurality" means two or more unless otherwise specified; the terms "upper", "lower", "left", "right", "inner", "outer", "front", "rear", "head", "tail", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are merely for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "connected" and "connected" are to be interpreted broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; may be directly connected or indirectly connected through an intermediate. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Claims

1. A microscope testing platform comprises a base (1), and is characterized in that: the middle position of the top of the base (1) is provided with a supporting shaft (15), the top of the supporting shaft (15) is provided with a rotating plate (13), the middle position of the outer side of the supporting shaft (15) is provided with a second bevel gear (14), one side of the bottom of the rotating plate (13) is provided with a mounting plate (21), the top and the bottom of one side of the mounting plate (21) are symmetrically provided with clamping grooves (18), the middle position of one side of the mounting plate (21), which is close to the clamping grooves (18), is sleeved with a sleeve (3), one sides of the top and the bottom of the sleeve (3) are provided with clamping blocks (20), the clamping blocks (20) are mutually matched with the clamping grooves (18), the top and the bottom of the inside of the sleeve (3) are symmetrically provided with limiting sliding grooves (16), the inside of the sleeve (3) is sleeved with a rotating shaft (19), the limiting sliding blocks (17) are matched with the limiting sliding grooves (16) in a sliding mode, one side, away from the clamping groove (18), of the rotating shaft (19) is provided with a first spring (4), one side, away from the first spring (4), of the rotating shaft (19) is provided with a first bevel gear (2), the first bevel gear (2) and the second bevel gear (14) are meshed with each other, first guide rails (5) are symmetrically arranged on two sides of the top of the rotating plate (13), first sliding grooves (12) are formed in two groups of the first guide rails (5), first sliding blocks (11) are arranged in two groups of the first sliding grooves (12) in a sliding mode, second guide rails (6) are arranged on the tops of the two groups of the first sliding blocks (11), a second sliding groove (10) is arranged in the middle of the tops of the second guide rails (6), and a second sliding block (8) is arranged in the second sliding groove (10) in a sliding mode, the top of the second sliding block (8) is provided with a placing table (7), two ends of the top of the placing table (7) are symmetrically provided with fixing blocks (22), two groups of fixing blocks (22) are arranged at the ends close to each other and are provided with second springs (23), and two groups of second springs (23) are arranged at the ends close to each other and are provided with clamping plates (9).

2. A microscopy platform as claimed in claim 1, wherein: the clamping plate (9) is L-shaped, and rubber is arranged inside the clamping plate (9).

3. A microscopy platform as claimed in claim 1, wherein: the first bevel gear (2) and the second bevel gear (14) are at ninety degrees therebetween.

4. A microscopy platform as claimed in claim 1, wherein: the bottom of base (1) is provided with the blotter, and the blotter bottom is provided with the raised grain.

5. A microscopy platform as claimed in claim 1, wherein: and a grab handle is arranged on one side of the sleeve (3) far away from the first bevel gear (2).

6. A microscopy platform as claimed in claim 1, wherein: the cross sections of the first sliding groove (12) and the first sliding block (11) are T-shaped, and the first sliding block (11) and the first sliding groove (12) are matched in a sliding mode.