CN213092827U - NVMeM.2SSD test jig changes board - Google Patents

Abstract

The utility model discloses a NVMe M.2SSD test jig changes board, the technique that exists now, the test link is many, causes wearing and tearing easily to product golden finger, when doing the RDT test, need to change 3.3V with the dress and change the board and test, lift off again after the test is accomplished and burn the record again, dismouting influence efficiency, SATA2.5 "changes the board and need use the rubber band to bind the mode fixed on the product, and efficiency is extremely low. The utility model discloses a this changes the fixed product test of board, the product plug number of times that has significantly reduced prevents the product and indicates the scratch at the golden finger that the testing process plug leads to, and wearing and tearing carry out the buckle to the product that awaits measuring through the nylon screw, the simple operation promotes production efficiency. The rubber band that the market generally used at present presses the mode of tying up, and the operation is complicated, and easy deformation is inefficacy or fracture after the high temperature, saves the switching of RDT in-process power supply interface, promotes production efficiency.

Description

NVMe M.2SSD test jig changes board

Technical Field

The utility model relates to a solid state disk processing technology field specifically is a NVMe M.2SSD test jig changes board.

Background

Solid state drives are commonly referred to as Solid state drives, which are hard disks made of Solid state electronic memory chip arrays and are named after Solid capacitors are called Solid in english in taiwan. The SSD is composed of a control unit and a storage unit (FLASH chip, DRAM chip). The specification, definition, function and use method of the interface of the solid state disk are completely the same as those of a common hard disk, and the appearance and size of the product are also completely consistent with those of the common hard disk. The method is widely applied to the fields of military affairs, vehicle-mounted, industrial control, video monitoring, network terminals, electric power, medical treatment, aviation, navigation equipment and the like.

The in-process test jig commentaries on classics board that carries out solid state hard drives processing is indispensable equipment, and the test jig commentaries on classics board on the present market has test link many, causes wearing and tearing easily to the product golden finger, when doing the RDT test, need to install 5V and change 3.3V commentaries on classics board and test, unloads once more after the test is accomplished and carries out the procedure burning record, and the dismouting influences efficiency and SATA2.5 "commentaries on classics board on the product and need use the rubber band to bind the mode fixed, the extremely low problem of efficiency.

To solve the problem, a NVMe M.2SSD test frame rotating plate is provided.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a rubber mold with design positioning mechanism changes the fixed product test of board through this, and the product plug number of times that has significantly reduced prevents the product and indicates the scratch at the golden finger that the test procedure plug leads to, and wearing and tearing carry out the buckle to the product that awaits measuring through the nylon screw, and the simple operation promotes production efficiency. The rubber band that the market generally used at present presses the mode of tying up, and the operation is complicated, and easy deformation is inefficacy or fracture after the high temperature, saves the switching of RDT in-process power supply interface, promotes production efficiency, has solved the problem in the background art.

In order to achieve the above object, the utility model provides a following technical scheme: an NVMe M.2SSD test frame rotating plate comprises a test frame rotating plate body and a product to be tested, wherein the test frame rotating plate comprises a test rotating plate body, a power input end, a first power supply, a first buckling hole, a processing mechanism, a second power supply, a second buckling hole, a third buckling hole, a movable nut, a first main plate interface, an M.2BKey female seat interface and an installation sheet, the power input end is arranged above the right end of the test rotating plate body, two first power supplies are installed on one side of the power input end, the second power supply is installed on the other side of the first power supply, the first buckling hole, the second buckling hole and the third buckling hole are arranged in the middle of the test rotating plate body, the processing mechanism is installed between the first buckling hole and the second buckling hole, the first main plate interface is arranged on the left end of the test rotating plate body, the M.2BKey female seat interface is installed on the left side of the upper end of the test rotating plate body, the product to be tested comprises a plate body, a notch and a second main board interface.

Further, a movable nut is mounted in an inner cavity of the first fastening hole 14 in a penetrating manner.

Further, the movable nut comprises a locking screw, a first M2 nylon nut and a second M2 nylon nut, the locking screw is mounted in an inner cavity of the first buckling hole, and the outer ring of the locking screw is sleeved with the first M2 nylon nut and the second M2 nylon nut.

Further, the bottom of test commentaries on classics board body is installed the installation piece, the installation piece is the iron sheet that a thin zinc-plated material made.

Further, the first motherboard interface may be mated with the second motherboard interface.

Further, the opening diameter of the notch is larger than the diameter of the locking screw.

Further, the first power supply and the second power supply are both 100UF 1206.

Compared with the prior art, the beneficial effects of the utility model are as follows:

1. the utility model provides a NVMe M M.2SSD test jig changes board uses the public seat of 15PIN SATA head as 5V power input, reduces to change the board volume, is connected with RDT high temperature box 7+15PINSATA seat, provides the RDT test power supply. The power is inputted to two first power input filter capacitors at positions to filter the input voltage ripple, the first power is filtered to a 5V down 3.3V module to reduce the voltage to 3.3V, and the module uses a SilikeY 8035DBC 5A large current power IC.

2. The utility model provides a NVMe M M.2SSD test jig changes board, for the examination product that awaits measuring provides sufficient electric current to can support the highest 2TB of bigger capacity hard disk, 3.3V output filter uses two second power encapsulation 3.3V power output filter capacitance, filtering output voltage ripple, 3.3V power to M.2BKey female seat 1B, and the test product second mainboard interface that awaits measuring is given in its power supply, and the switching on carries out the RDT test. The movable nut is a high-temperature-resistant M2 nylon screw and is used for buckling a product to be tested, and the product to be tested can be fixed without disassembling the screw by using the elastic characteristic of the nylon screw. When the interface of the second main board of the product to be tested is connected to the M.2BKey female seat, the position of the notch 22 of the product to be tested is locked with the movable nut by pressing. The plate retains the first buckling hole, the second buckling hole and the third buckling hole at the buckling positions of NVMe M.2SSD in different specifications so as to be compatible with the production of products in different dimensions. When the specification of the product to be tested is fixed and positioned, a high-temperature resistant M2 nylon screw is installed in the inner cavity of the second buckling hole to fix the product, and the high-temperature resistant M2 nylon screw is the same as the first buckling hole. When the fixed position of product NVMe M.2SSD 2242 specification that awaits measuring, carry out the product fixedly at third buckle hole position installation high temperature resistant M2 nylon screw, the same with first buckle hole same position, adjust the notch that first M2 nylon nut blocked the product of awaiting measuring with the interval of second M2 nylon nut, adjustable product fixed height that awaits measuring, through this fixed product test of commentaries on classics board, the product plug number of times has significantly reduced, prevent the golden finger scratch that the product leads to at the test procedure plug, wearing and tearing.

3. The utility model provides a NVMe M.2SSD test jig changes board, first mainboard interface are NVMe M.2 GEN3 x4 interface, are connected with external equipment, link to the female seat interface of M.2 BKey. And the product to be tested is inserted into the M.2BKey female socket interface through the second mainboard interface, and data transmission is carried out with external equipment through the first mainboard interface. non-RDT tests such as firmware burning, product burnInTest, speed test and the like are all connected with the outside by using a first mainboard interface. When the product is installed to the test rotating plate body, firmware burning and burnInTest are carried out with an external device burning jig or a burnInTest jig, the installation piece is used for attracting with a burning jig or a burnInTest jig magnet, the rotating plate and the burning rotating plate jig are fixed, the product to be tested is buckled through the nylon screw, operation is convenient, and production efficiency is improved. The rubber band that the market generally used at present presses the mode of tying up, and the operation is complicated, and easy deformation is inefficacy or fracture after the high temperature, saves the switching of RDT in-process power supply interface, promotes production efficiency.

Drawings

FIG. 1 is a schematic structural view of a test rotating plate according to the present invention;

FIG. 2 is a side view of the test rotor of the present invention;

FIG. 3 is a bottom view of the test rotating plate of the present invention;

fig. 4 is a schematic structural view of a product to be tested according to the present invention.

In the figure: 1. testing the rotating plate; 11. testing the rotating plate body; 12. a power supply input terminal; 13. a first power supply; 14. A first snap hole; 15. a processing mechanism; 16. a second power supply; 17. a second snap-fit hole; 18. a third snap hole; 19. a movable nut; 191. a locking screw; 192. a first M2 nylon nut; 193. a second M2 nylon nut; 1A, a first mainboard interface; 1B, M.2BKey female socket interface; 1C, mounting pieces; 2. a product to be tested; 21. A plate body; 22. a recess; 23. and a second motherboard interface.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-4, an NVMe m.2SSD test board comprises a test board rotating board 1 and a product 2 to be tested, the test board rotating board 1 includes a test board rotating body 11, a power input end 12, a first power supply 13, a first fastening hole 14, a processing mechanism 15, a second power supply 16, a second fastening hole 17, a third fastening hole 18, a movable nut 19, a first motherboard interface 1A, an m.2BKey socket interface 1B and a mounting plate 1C, the power input end 12 is disposed above the right end of the test board rotating body 11, two first power supplies 13 are disposed on one side of the power input end 12, the second power supply 16 is disposed on the other side of the first power supply 13, the first fastening hole 14, the second fastening hole 17 and the third fastening hole 18 are disposed in the middle of the test board rotating body 11, the movable nut 19 is disposed in an inner cavity of the first fastening hole 14, and the movable nut 19 includes a locking screw 191, and a movable nut 19, A first M2 nylon nut 192 and a second M2 nylon nut 193, a locking screw 191 is installed in the inner cavity of the first fastening hole 14, the outer ring of the locking screw 191 is sleeved with the first M2 nylon nut 192 and the second M2 nylon nut 193, a processing mechanism 15 is installed between the first fastening hole 14 and the second fastening hole 17, a first mainboard interface 1A is arranged at the left end of the testing rotating plate body 11, an M.2BKey female seat interface 1B is installed at the left side of the upper end of the testing rotating plate body 11, a product 2 to be tested comprises a plate body 21, a notch 22 and a second mainboard interface 23, an installation piece 1C is installed at the bottom end of the testing rotating plate body 11, the installation piece 1C is an iron sheet made of a thin galvanized material, the first mainboard interface 1A can be matched with the second mainboard interface 23, the opening diameter of the notch 22 is larger than that of the locking screw 191, the types of the first power supply 13 and the second power supply 16 are both 100UF 1206, a15 PIN SATA head male seat is used as a 5V power supply input, the size of a rotating plate is reduced, and the rotating plate is connected with an RDT high-temperature box 7+15PINSATA seat to provide power for RDT test. The power supply is input to two first power supply 13 input filter capacitors at positions to filter input voltage ripples, the first power supply 13 filters the input voltage ripples and then goes to a 5V and 3.3V reduction module to reduce the voltage to 3.3V, and the module uses a silicon Lijie SY8035DBC 5A large-current power supply IC to provide sufficient current for a product 2 to be tested so as to support the highest 2TB of a hard disk with larger capacity. The 3.3V output filter uses two second power supplies 16 to package a 3.3V power supply output filter capacitor, filters out output voltage ripples, and the 3.3V power supply supplies power to the m.2BKey female socket 1B, supplies power to the second main board interface 23 of the product to be tested, and is powered on to perform RDT test. The movable nut 19 is a high-temperature resistant M2 nylon screw and is used for buckling a product to be tested, and the product to be tested can be fixed without disassembling the screw by using the elastic characteristic of the nylon screw. When the second main board interface 23 of the product to be tested is connected to the m.2BKey female socket 1B, the position of the notch 22 of the product to be tested is locked with the movable nut 19 by pressing. The plate retains the first snap hole 14, the second snap hole 17 and the third snap hole 18 at the snap positions of NVMe m.2SSD of different specifications to be compatible with the production of products of different dimensions. When the specification of the product to be tested is fixed and positioned, a high-temperature resistant M2 nylon screw is installed in the inner cavity of the second buckling hole 17 to fix the product, and the high-temperature resistant M2 nylon screw is the same as the first buckling hole 14. When a product to be tested is fixed in position according to the specification of NVMe M.2SSD 2242, a high-temperature-resistant M2 nylon screw is installed at the position of the third buckling hole 18 to fix the product, the position of the third buckling hole is the same as that of the first buckling hole 14, the distance between the first M2 nylon nut 192 and the second M2 nylon nut 193 is adjusted to clamp the notch 22 of the product to be tested 2, the fixing height of the product to be tested can be adjusted, the first main board interface 1A is an NVMe M.2 GEN3 x4 interface and is connected with external equipment and connected to an M.2BKey female seat interface 1B. The product 2 to be tested is inserted into the M.2BKey female socket interface 1B through the second mainboard interface 23, and data transmission is carried out with external equipment through the first mainboard interface 1A. non-RDT tests such as firmware burning, product BurnTest, speed test and the like are all connected with the outside by using the first mainboard interface 1A. When the product is installed on the testing rotating plate body 11, firmware burning and BurnInTest are carried out on the product and an external device burning jig or a BurnInTest jig, the installation piece 1C is used for being attracted with a magnet of the burning jig or the BurnInTest jig, and the rotating plate and the burning rotating plate jig are fixed.

In summary, the following steps: the utility model provides a NVMe M M.2SSD test jig changes board uses the public seat of 15PIN SATA head as 5V power input, reduces to change the board volume, is connected with RDT high temperature box 7+15PINSATA seat, provides the RDT test power supply. The power supply is input to two first power supply 13 input filter capacitors at positions to filter input voltage ripples, the first power supply 13 filters the input voltage ripples and then goes to a 5V and 3.3V reduction module to reduce the voltage to 3.3V, and the module uses a silicon Lijie SY8035DBC 5A large-current power supply IC to provide sufficient current for a product 2 to be tested so as to support the highest 2TB of a hard disk with larger capacity. The 3.3V output filter uses two second power supplies 16 to package a 3.3V power supply output filter capacitor, filters out output voltage ripples, and the 3.3V power supply supplies power to the m.2BKey female socket 1B, supplies power to the second main board interface 23 of the product to be tested, and is powered on to perform RDT test. The movable nut 19 is a high-temperature resistant M2 nylon screw and is used for buckling a product to be tested, and the product to be tested can be fixed without disassembling the screw by using the elastic characteristic of the nylon screw. When the second main board interface 23 of the product to be tested is connected to the m.2BKey female socket 1B, the position of the notch 22 of the product to be tested is locked with the movable nut 19 by pressing. The plate retains the first snap hole 14, the second snap hole 17 and the third snap hole 18 at the snap positions of NVMe m.2SSD of different specifications to be compatible with the production of products of different dimensions. When the specification of the product to be tested is fixed and positioned, a high-temperature resistant M2 nylon screw is installed in the inner cavity of the second buckling hole 17 to fix the product, and the fixing is the same as the first buckling hole 14. When a product to be tested is fixed in position according to the specification of NVMe M.2SSD 2242, a high-temperature-resistant M2 nylon screw is installed at the position of the third buckling hole 18 to fix the product, the position of the third buckling hole is the same as that of the first buckling hole 14, the distance between the first M2 nylon nut 192 and the second M2 nylon nut 193 is adjusted to clamp the notch 22 of the product to be tested 2, the fixing height of the product to be tested can be adjusted, the first main board interface 1A is an NVMe M.2 GEN3 x4 interface and is connected with external equipment and connected to an M.2BKey female seat interface 1B. The product 2 to be tested is inserted into the M.2BKey female socket interface 1B through the second mainboard interface 23, and data transmission is carried out with external equipment through the first mainboard interface 1A. non-RDT tests such as firmware burning, product BurnTest, speed test and the like are all connected with the outside by using the first mainboard interface 1A. When the product is installed on the testing rotating plate body 11, firmware burning and BurnInTest are carried out on the product and an external device burning jig or a BurnInTest jig, the installation piece 1C is used for being attracted with a magnet of the burning jig or the BurnInTest jig, and the rotating plate and the burning rotating plate jig are fixed.

It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (7)

1. The utility model provides a NVMe M.2SSD test jig commentaries on classics board, includes test jig commentaries on classics board (1) and the product (2) of awaiting measuring, its characterized in that: the test rack rotating plate (1) comprises a test rotating plate body (11), a power supply input end (12), a first power supply (13), a first buckling hole (14), a processing mechanism (15), a second power supply (16), a second buckling hole (17), a third buckling hole (18), a movable nut (19), a first mainboard interface (1A), an M.2BKey female seat interface (1B) and a mounting piece (1C), wherein the power supply input end (12) is arranged above the right end of the test rotating plate body (11), two first power supplies (13) are arranged on one side of the power supply input end (12), the second power supply (16) is arranged on the other side of the first power supply (13), the first buckling hole (14), the second buckling hole (17) and the third buckling hole (18) are arranged in the middle of the test rotating plate body (11), the processing mechanism (15) is arranged between the first buckling hole (14) and the second buckling hole (17), the left end of the test rotating plate body (11) is arranged and provided with a first mainboard interface (1A), the left side of the upper end of the test rotating plate body (11) is provided with an M.2BKey female seat interface (1B), and the product to be tested (2) comprises a plate body (21), a notch (22) and a second mainboard interface (23).

2. An NVMe m.2ssd test rack carousel as in claim 1, wherein: the inner cavity of the first buckling hole (14) is provided with a movable nut (19) in a penetrating way.

3. An NVMe m.2ssd test rack carousel as in claim 1, wherein: the movable nut (19) comprises a locking screw (191), a first M2 nylon nut (192) and a second M2 nylon nut (193), the locking screw (191) is installed in an inner cavity of the first buckling hole (14), and the outer ring of the locking screw (191) is sleeved with the first M2 nylon nut (192) and the second M2 nylon nut (193).

4. An NVMe m.2ssd test rack carousel as in claim 1, wherein: the bottom of test commentaries on classics board body (11) is installed installation piece (1C), installation piece (1C) is the iron sheet that a thin zinc-plated material made.

5. An NVMe m.2ssd test rack carousel as in claim 1, wherein: the first motherboard interface (1A) can be matched with the second motherboard interface (23).

6. An NVMe m.2ssd test rack carousel as in claim 1, wherein: the opening diameter of the notch (22) is larger than that of the locking screw (191).

7. An NVMe m.2ssd test rack carousel as in claim 1, wherein: the types of the first power supply (13) and the second power supply (16) are both 100UF 1206.

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