CN212988268U

CN212988268U - Measuring instrument table and measuring assembly

Info

Publication number: CN212988268U
Application number: CN202022325618.9U
Authority: CN
Inventors: 刘建立; 刘小波; 仲光楠
Original assignee: Lianhengguangke Suzhou Intelligent Technology Co ltd
Current assignee: Lianhengguangke Suzhou Intelligent Technology Co ltd
Priority date: 2020-10-19
Filing date: 2020-10-19
Publication date: 2021-04-16
Anticipated expiration: 2030-10-19

Abstract

The utility model provides a measuring instrument platform includes first drive arrangement, second drive arrangement, third drive arrangement and the first plywood that sets up from bottom to top, the second plywood, the third plywood, the fourth plywood, the fifth plywood, the calibration board is shaded, the top of first plywood is stretched to the epirelief and is equipped with first slide rail, the bottom of second plywood is sunken upwards be equipped with first slide rail complex first spout, the top of second plywood is stretched to the epirelief and is equipped with the second slide rail, the bottom of third plywood is sunken upwards be equipped with second slide rail complex second spout, the extending direction perpendicular to second slide rail of first slide rail, the fourth plywood is fixed on the third plywood, the top of fourth plywood is equipped with the third slide rail that upwards extends, be equipped with on the fifth plywood with third slide rail complex third spout. The utility model discloses a measuring instrument platform and measuring component, around can adjusting the calibration plate in a poor light, control, position from top to bottom, and adjust the precision height.

Description

Measuring instrument table and measuring assembly

Technical Field

The utility model relates to a measuring instrument platform and measuring component belongs to the optical measurement field.

Background

In the existing measurement field, displacement and deformation of some tiny objects need to be measured, a camera, a microscope and a backlight calibration plate for placing the objects are generally needed, and sometimes the backlight calibration plate needs to be moved to change the position and the angle of measurement shooting. The existing backlight calibration plate is not convenient and fast to move, and the moving distance is not accurate enough, so that measuring errors are generated.

In view of the above, there is a need for an improved apparatus to solve the above problems.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a measuring instrument platform to the calibration plate in a poor light that solves current measuring instrument platform removes not convenient problem.

In order to achieve the above purpose, the utility model provides a following technical scheme: a measuring instrument platform comprises a first driving device, a second driving device and a third driving device, as well as a first layer plate, a second layer plate, a third layer plate, a fourth layer plate, a fifth layer plate and a backlight calibration plate which are arranged from bottom to top, wherein the top of the first layer plate is provided with a first slide rail in an upward protruding mode, the bottom of the second layer plate is provided with a first slide groove matched with the first slide rail in an upward recessed mode, the first driving device is used for driving the second layer plate to move relative to the first layer plate, the top of the second layer plate is provided with a second slide rail in an upward protruding mode, the bottom of the third layer plate is provided with a second slide groove matched with the second slide rail in an upward recessed mode, the second driving device is used for driving the third layer plate to move relative to the second layer plate, the extending direction of the first slide rail is perpendicular to the second slide rail, and the fourth layer plate is fixed on the third layer plate, the top of the fourth layer plate is provided with a third sliding rail which extends upwards, the fifth layer plate is provided with a third sliding groove matched with the third sliding rail, the third driving device is used for driving the fifth layer plate to move relative to the fourth layer plate, and the backlight calibration plate is arranged above the fifth layer plate.

Further, the first driving device comprises a first micrometer screw knob and a first connecting piece, and the first connecting piece is connected with the first micrometer screw knob, the first layer plate and the second layer plate.

Further, the second driving device comprises a second micrometer screw knob and a second connecting piece, and the second connecting piece is connected with the second micrometer screw knob, the second layer plate and the third layer plate.

Further, the third driving device comprises a third micrometer knob and a third connecting piece, and the third connecting piece is connected with the third micrometer knob, the fourth layer plate and the fifth layer plate.

Furthermore, the top of the fourth layer plate extends upwards to be provided with a bump, the number of the third slide rails is two, and the two third slide rails are arranged on two opposite sides of the bump.

Furthermore, the bottom of the fifth layer plate extends downwards to form two baffles, and the third sliding groove is formed in the inner side of each baffle.

The measuring instrument platform further comprises a sixth layer plate fixed above the fifth layer plate, a seventh layer plate arranged above the sixth layer plate, and a fourth driving device, wherein the backlight calibration plate is fixed at the top of the seventh layer plate, the top of the sixth layer plate is an arc-shaped plane with a low middle and two high sides, a fourth sliding rail is arranged in an upward protruding manner, the middle of the fourth sliding rail is low and the two high sides, a fourth sliding groove matched with the fourth sliding rail is arranged at the bottom of the seventh layer plate in an upward recessed manner, and the fourth driving device is used for driving the seventh layer plate to move relative to the sixth layer plate.

Furthermore, the fourth slide rail is provided with a first buckling edge which is inclined inwards from top to bottom along two sides of the sliding direction, and the fourth sliding chute is provided with a second buckling edge which is inclined inwards from top to bottom along two sides of the sliding direction.

The utility model also provides a measuring component, measuring component includes microscope, camera and is used for placing the measuring instrument platform of object.

The beneficial effects of the utility model reside in that: the utility model discloses a measuring instrument platform and measuring component can adjust around the calibration plate is shaded, control, position from top to bottom, and adjust the precision height.

The above description is only an overview of the technical solution of the present invention, and in order to make the technical means of the present invention clearer and can be implemented according to the content of the description, the following detailed description is made with reference to the preferred embodiments of the present invention and accompanying drawings.

Drawings

Fig. 1 is a schematic structural diagram of the measuring instrument table of the present invention.

Fig. 2 is an exploded schematic view of the measuring instrument table of the present invention.

Detailed Description

The technical solution of the present invention will be described clearly and completely with reference to the accompanying drawings, and obviously, the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art. Furthermore, the technical features mentioned in the different embodiments of the invention described below can be combined with each other as long as they do not conflict with each other.

As shown in fig. 1 to 2, the measuring assembly of the present invention includes a microscope, a camera, and a measuring instrument table 100 for placing an object.

The measuring instrument table 100 comprises a first driving device 11, a second driving device 12, a third driving device 13, a fourth driving device 14, a first layer plate 21, a second layer plate 22, a third layer plate 23, a fourth layer plate 24, a fifth layer plate 25, a sixth layer plate 26, a seventh layer plate 27 and a backlight calibration plate 28 which are arranged from bottom to top.

The top of the first layer board 21 protrudes upwards to form a first slide rail 211, the bottom of the second layer board 22 is recessed upwards to form a first slide groove 221 matched with the first slide rail 211, and the first driving device 11 is used for driving the second layer board 22 to move relative to the first layer board 21.

The first driving means 11 includes a first micrometer screw 111 and a first connecting member 112, and the first connecting member 112 connects the first micrometer screw 111, the first layer plate 21 and the second layer plate 22.

In this embodiment, the extending direction of the first slide rail 211 is defined as the left-right direction, that is, the first micrometer knob 111 is rotated to move the second layer plate 22 in the left-right direction relative to the first layer plate 21, so as to drive the uppermost backlight calibration plate 28 to move left and right. By providing the first micrometer screw 111, the distance of movement of the second layer 22 relative to the first layer 21 can be precisely controlled.

The top of the second layer board 22 protrudes upwards to form a second slide rail 222, the bottom of the third layer board 23 is recessed upwards to form a second slide slot 231 matched with the second slide rail 222, the second driving device 12 is configured to drive the third layer board 23 to move relative to the second layer board 22, and the extending direction of the first slide rail 211 is perpendicular to the second slide rail 222.

In this embodiment, the second driving device 12 includes a second micrometer knob 121 and a second connecting member 122, and the second connecting member 122 connects the second micrometer knob 121, the second layer plate 22 and the third layer plate 23.

In this embodiment, the extending direction of the second slide rail 222 is defined as the front-back direction, that is, the third layer plate 23 can move in the front-back direction relative to the second layer plate 22 by rotating the second micrometer knob 121, so as to drive the uppermost backlight calibration plate 28 to move back and forth. By providing the second micrometer screw 121, the distance of movement of the third layer 23 relative to the second layer 22 can be precisely controlled.

The fourth layer plate 24 is fixed on the third layer plate 23, a convex block 241 extends upwards from the top of the fourth layer plate 24, third slide rails 242 are respectively arranged on two opposite sides of the convex block 241, and the third slide rails 242 extend upwards and downwards along the vertical direction.

The bottom of the fifth layer plate 25 extends downwards to form two baffles 251 and a third sliding groove matched with the third sliding rail 242, and the third sliding groove is arranged on the inner side of the baffles 251.

The third driving device 13 is used for driving the fifth layer plate 25 to move relative to the fourth layer plate 24, and the backlight calibration plate 28 is disposed above the fifth layer plate 25. The third driving device 13 comprises a third micrometer knob and a third connecting member, wherein the third connecting member is connected with the third micrometer knob, the fourth layer plate 24 and the fifth layer plate 25. The rotation of the third micrometer knob can make the fifth layer plate 25 move up and down relative to the fourth layer plate 24, and further drive the uppermost backlight calibration plate 28 to move up and down. By providing a third micrometer knob, the distance of movement of the fifth layer 25 relative to the fourth layer 24 can be precisely controlled.

The backlight calibration plate 28 is fixed on the top of the seventh plate 27, the top of the sixth plate 26 is an arc-shaped plane with a low middle and two high sides, a fourth slide rail 261 is arranged in an upward protruding manner, the middle of the fourth slide rail 261 is low and the two high sides, and a fourth slide groove 271 matched with the fourth slide rail 261 is arranged at the bottom of the seventh plate 27 in an upward recessed manner.

The fourth slide rail 261 is provided with a first buckling edge inclined inwards from top to bottom along two sides of the sliding direction, and the fourth slide groove 271 is provided with a second buckling edge inclined inwards from top to bottom along two sides of the sliding direction.

The fourth driving device 14 is used to drive the seventh layer 27 to move relative to the sixth layer 26, so as to adjust the inclination of the backlight calibration plate 28.

The measuring instrument platform 100 and the measuring component of the utility model can adjust the front and back, left and right, up and down positions of the backlight calibration plate 28, and the adjusting precision is high; by providing the sixth layer plate 26 and the seventh layer plate 27, an effect of adjusting the inclination of the backlight scaling plate 28 can be achieved.

The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above-mentioned embodiments only represent some embodiments of the present invention, and the description thereof is specific and detailed, but not to be construed as limiting the scope of the present invention. It should be noted that, for those skilled in the art, without departing from the spirit of the present invention, several variations and modifications can be made, which are within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.

Claims

1. A measurement instrument stand characterized by: the measuring instrument platform comprises a first driving device, a second driving device, a third driving device, a first laminate, a second laminate, a third laminate, a fourth laminate, a fifth laminate and a backlight calibration plate, wherein the first laminate, the second laminate, the third laminate, the fourth laminate, the fifth laminate and the backlight calibration plate are arranged from bottom to top, the top of the first laminate is provided with a first slide rail in an upward protruding mode, the bottom of the second laminate is provided with a first slide groove matched with the first slide rail in an upward recessed mode, the first driving device is used for driving the second laminate to move relative to the first laminate, the top of the second laminate is provided with a second slide rail in an upward protruding mode, the bottom of the third laminate is provided with a second slide groove matched with the second slide rail in an upward recessed mode, the second driving device is used for driving the third laminate to move relative to the second laminate, the extending direction of the first slide rail is perpendicular to the second slide rail, and the fourth laminate is fixed on the third, the top of the fourth layer plate is provided with a third sliding rail which extends upwards, the fifth layer plate is provided with a third sliding groove matched with the third sliding rail, the third driving device is used for driving the fifth layer plate to move relative to the fourth layer plate, and the backlight calibration plate is arranged above the fifth layer plate.

2. An instrument table according to claim 1 wherein the first drive means comprises a first micrometer screw knob and a first connector connecting the first micrometer screw knob, the first layer plate and the second layer plate.

3. An instrument table according to claim 1 wherein the second drive means comprises a second micrometer screw knob and a second connector, the second connector connecting the second micrometer screw knob, the second layer plate and the third layer plate.

4. An instrument table according to claim 1 wherein the third drive means comprises a third micrometer screw knob and a third connector, the third connector connecting the third micrometer screw knob, the fourth plate and the fifth plate.

5. The instrument table of claim 1 wherein the top of the fourth plate extends upwardly with a projection, the number of the third slide rails being two, two of the third slide rails being disposed on opposite sides of the projection.

6. A gauge stand according to claim 5, wherein the bottom of the fifth layer is provided with two baffles extending downwardly, the third runner being provided on the inside of the baffles.

7. The measuring instrument platform according to claim 1, further comprising a sixth plate fixed above the fifth plate, a seventh plate arranged above the sixth plate, and a fourth driving device, wherein the backlight calibration plate is fixed on the top of the seventh plate, the top of the sixth plate is an arc-shaped plane with a lower middle and two higher sides, a fourth slide rail is convexly arranged on the top of the sixth plate, the lower middle of the fourth slide rail is higher than the two lower sides, a fourth slide groove matched with the fourth slide rail is concavely arranged on the bottom of the seventh plate, and the fourth driving device is used for driving the seventh plate to move relative to the sixth plate.

8. The apparatus table according to claim 7, wherein the fourth slide rail has first retaining edges inclined inward from top to bottom along both sides of the sliding direction, and the fourth slide groove has second retaining edges inclined inward from top to bottom along both sides of the sliding direction.

9. A measurement assembly, characterized by: the measuring assembly comprises a microscope, a camera and a measuring instrument table according to any one of claims 1-8 for placing an object.