CN212933330U - High-temperature testing device of attenuation redundant controller - Google Patents

Abstract

The utility model discloses a high temperature testing arrangement of subsidence redundant controller, can be including test signal source analog circuit, standard subsidence redundant controller and industrial computer, test signal source analog circuit's test signal output end respectively with the signal acquisition end electricity connection of the redundant controller of the subsidence redundant controller of examination subsidence and standard subsidence redundant controller of examination subsidence, the signal output part of the redundant controller of the subsidence redundant controller of examination subsidence and standard subsidence all with the signal input part communication connection of industrial computer. The utility model discloses can effectively improve the efficiency of software testing's test that carries out high temperature test to the redundant controller of awaiting measuring attenuation to can effectively select the stealthy fault equipment who appears transient trouble and later resume by oneself again in carrying out the high temperature test in-process through the mode of reporting to the police in real time and record when comparing out trouble signal, improve the test rate of accuracy.

Description

High-temperature testing device of attenuation redundant controller

Technical Field

The utility model relates to a track circuit system technical field especially relates to a high temperature test device of subsidence redundant controller.

Background

The attenuation redundant controller is an electronic device in the track circuit system, and the working performance and the device reliability of the attenuation redundant controller play an important role in the normal operation of the track circuit system. If the faded redundant controller fails, it may cause a red band failure in the track circuit, thereby compromising the operational safety of the train on the track.

In order to ensure the working performance and the equipment reliability of the attenuation redundant controller, before the attenuation redundant controller leaves a factory, technicians need to perform high-temperature test on the attenuation redundant controller, namely, whether the working performance and the equipment reliability of the attenuation redundant controller in a high-temperature environment meet requirements or not is tested. Failing test-compliant controllers of the failing redundant controller may be considered faulty devices that the technician must screen out.

However, the conventional high-temperature test device cannot effectively complete the high-temperature test of the attenuation redundancy controller.

SUMMERY OF THE UTILITY MODEL

In view of the above, the present invention provides a high temperature testing apparatus for attenuation redundancy controller, which overcomes or at least partially solves the above problems, and the technical solution is as follows:

a high temperature test apparatus for a subsidence redundancy controller, the high temperature test apparatus comprising: test signal source analog circuit, standard subsidence redundant controller and industrial computer, wherein:

the test signal output end of the test signal source analog circuit is electrically connected with the signal acquisition end of the attenuation redundant controller to be tested, and the attenuation redundant controller to be tested is placed in a high-temperature environment;

the test signal output end of the test signal source analog circuit is electrically connected with the signal acquisition end of the standard attenuation redundancy controller;

and the signal output end of the attenuation redundant controller to be tested and the signal output end of the standard attenuation redundant controller are both in communication connection with the signal input end of the industrial personal computer.

Optionally, the high temperature testing apparatus further includes: the system comprises a first cabinet, wherein at least one attenuation redundant controller to be tested is arranged in the first cabinet, and the first cabinet is arranged in a high-temperature environment.

Optionally, the high temperature testing apparatus further includes: and the second cabinet is placed in a non-high-temperature environment.

Optionally, the test signal source analog circuit includes: a direct current voltage signal source analog circuit;

the test signal output end of the direct-current voltage signal source analog circuit is electrically connected with the first signal acquisition end of the attenuation redundancy controller to be tested;

the test signal output end of the direct-current voltage signal source analog circuit is electrically connected with the first signal acquisition end of the standard attenuation redundancy controller;

and the first signal output end of the attenuation redundant controller to be tested and the first signal output end of the standard attenuation redundant controller are both in communication connection with the first signal input end of the industrial personal computer.

Optionally, the test signal source analog circuit includes: a work output voltage signal source analog circuit;

the test signal output end of the output voltage signal source analog circuit is electrically connected with the second signal acquisition end of the attenuation redundancy controller to be tested;

the test signal output end of the output voltage signal source analog circuit is electrically connected with the second signal acquisition end of the standard attenuation redundancy controller;

and the second signal output end of the attenuation redundant controller to be tested and the second signal output end of the standard attenuation redundant controller are both in communication connection with the second signal input end of the industrial personal computer.

Optionally, the test signal source analog circuit includes: a main rail output voltage signal source analog circuit;

the test signal output end of the main rail voltage signal source analog circuit is electrically connected with the third signal acquisition end of the attenuation redundancy controller to be tested;

the test signal output end of the main rail output voltage signal source analog circuit is electrically connected with the third signal acquisition end of the standard attenuation redundancy controller;

and the third signal output end of the attenuation redundant controller to be tested and the third signal output end of the standard attenuation redundant controller are both in communication connection with the third signal input end of the industrial personal computer.

Optionally, the test signal source analog circuit includes: a small rail voltage signal source analog circuit;

the test signal output end of the small-rail voltage signal source analog circuit is electrically connected with the fourth signal acquisition end of the attenuation redundancy controller to be tested;

the test signal output end of the small-rail voltage signal source analog circuit is electrically connected with the fourth signal acquisition end of the standard attenuation redundancy controller;

and the fourth signal output end of the attenuation redundant controller to be tested and the fourth signal output end of the standard attenuation redundant controller are both in communication connection with the fourth signal input end of the industrial personal computer.

Optionally, the analog circuit of the output voltage signal source includes: a first frequency-shifted signal transmitter.

Optionally, the analog circuit of the main rail-out voltage signal source includes: a second frequency-shifted signal transmitter and a first voltage divider;

the test signal output end of the second frequency shift signal transmitter is electrically connected with the input end of the first voltage divider;

the output end of the first voltage divider is electrically connected with the second signal acquisition end of the attenuation redundancy controller to be tested;

the output end of the first voltage divider is electrically connected with the second signal acquisition end of the standard attenuation redundancy controller.

Optionally, the small-rail-out voltage signal source analog circuit includes: a third frequency-shifted signal transmitter and a second voltage divider;

the test signal output end of the third frequency shift signal transmitter is electrically connected with the input end of the second voltage divider;

the output end of the second voltage divider is electrically connected with a fourth signal acquisition end of the attenuation redundancy controller to be tested;

the output end of the first voltage divider is electrically connected with the fourth signal acquisition end of the standard attenuation redundancy controller.

Optionally, the high temperature testing apparatus further includes: a keyboard, a display and a mouse;

the keyboard, the display and the mouse are respectively in communication connection with the industrial personal computer.

Optionally, the high temperature testing apparatus further includes: a DC power supply;

the electric energy output end of the direct current power supply is electrically connected with the electric energy input end of the attenuation redundancy controller to be tested;

and the electric energy output end of the direct-current power supply is electrically connected with the electric energy input end of the standard attenuation redundant controller.

The utility model provides a high temperature test device of subsides redundant controller that consumes can be including test signal source analog circuit, standard subsides redundant controller and industrial computer, test signal source analog circuit's test signal output end respectively with the signal acquisition end of the redundant controller that awaits measuring subsides and the signal acquisition end electricity connection of standard subsides redundant controller that consumes, the signal output end of the redundant controller that awaits measuring subsides and the signal output end of standard subsides redundant controller all with the signal input part communication connection of industrial computer. In the embodiment, a test signal source simulation circuit can be used for simulating a voltage signal received by the attenuation redundant controller in an actual working condition, the simulated voltage signal is used as a test signal and is input to the attenuation redundant controller to be tested and the standard attenuation redundant controller, the existing industrial personal computer can be used for receiving signals output by the attenuation redundant controller to be tested and the standard attenuation redundant controller after receiving the test signal, the signals output by the attenuation redundant controller to be tested and the signals output by the standard attenuation redundant controller are compared in real time, and the fault equipment is determined according to the comparison result. The utility model discloses can effectively improve the efficiency of software testing's test that carries out high temperature test to the redundant controller of awaiting measuring attenuation to can effectively select the stealthy fault equipment who appears transient trouble and later resume by oneself again in carrying out the high temperature test in-process through the mode of reporting to the police in real time and record when comparing out trouble signal, improve the test rate of accuracy.

The above description is only an overview of the technical solutions of the present invention, and in order to make the technical means of the present invention more clearly understood, the present invention may be implemented according to the content of the description, and in order to make the above and other objects, features, and advantages of the present invention more obvious and understandable, the following detailed description of the present invention is given.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.

Fig. 1 is a schematic structural diagram of a high temperature testing apparatus for attenuation redundancy controller according to an embodiment of the present invention;

fig. 2 is a schematic structural diagram of another high-temperature testing apparatus for an attenuation redundant controller according to an embodiment of the present invention;

fig. 3 is a schematic structural diagram of another high-temperature testing apparatus for an attenuation redundant controller according to an embodiment of the present invention;

fig. 4 is a schematic structural diagram of another high-temperature testing apparatus for attenuation redundancy controller according to an embodiment of the present invention;

fig. 5 is a schematic structural diagram of another high-temperature testing apparatus for an attenuation redundant controller according to an embodiment of the present invention;

fig. 6 is a schematic structural diagram of another high-temperature testing apparatus for an attenuation redundant controller according to an embodiment of the present invention;

fig. 7 is a schematic structural diagram of another high-temperature testing apparatus for an attenuation redundancy controller according to an embodiment of the present invention;

fig. 8 shows an output voltage signal source analog circuit and a main rail output voltage signal source analog circuit according to an embodiment of the present invention;

fig. 9 is a schematic structural diagram of another high-temperature testing apparatus for attenuation redundancy controller according to an embodiment of the present invention;

fig. 10 is a diagram of an analog circuit of a small rail voltage signal source according to an embodiment of the present invention.

Detailed Description

Exemplary embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the invention are shown in the drawings, it should be understood that the invention can be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.

As shown in fig. 1, the present embodiment provides a high temperature testing apparatus for a decaying redundant controller, which may include: test signal source analog circuit 101, standard decay redundant controller 102 and industrial computer 104, wherein:

the test signal output end of the test signal source analog circuit 101 is electrically connected with the signal acquisition end of the attenuation redundancy controller 103 to be tested, and the attenuation redundancy controller 103 to be tested is placed in a high-temperature environment;

the test signal output end of the test signal source analog circuit 101 is electrically connected with the signal acquisition end of the standard attenuation redundancy controller 102;

the signal output end of the attenuation redundant controller to be tested 103 and the signal output end of the standard attenuation redundant controller 102 are both in communication connection with the signal input end of the industrial personal computer 104.

The test signal source analog circuit 101 can simulate a voltage signal received by the attenuation redundancy controller 103 to be tested in an actual working condition, and output the simulated voltage signal as a test signal to the attenuation redundancy controller 103 to be tested so as to perform a high-temperature test on the attenuation redundancy controller 103 to be tested.

The standard attenuation redundant controller 102 is an attenuation redundant controller with the same model as the attenuation redundant controller 103 to be tested, stable performance and strong reliability, and the standard attenuation redundant controller 102 and the attenuation redundant controller 103 to be tested can receive the test signal output by the test signal source analog circuit 101 together. The test signal source analog circuit 101 can output test signals to the signal acquisition end of the attenuation redundant controller to be tested 103 and the signal acquisition end of the standard attenuation redundant controller 102 through the test signal output end, and provides test signals for the attenuation redundant controller to be tested 103 and the standard attenuation redundant controller 102.

It should be noted that, in an actual track circuit transmission channel, the attenuation redundancy controller may collect various types of voltage signals such as a direct current voltage signal, a power-out voltage signal, a main rail-out voltage signal, a small rail-out voltage signal, and the like, and may also convert the collected voltage signals into corresponding digital signals and upload the digital signals to a corresponding signal analysis system, so that the signal analysis system may analyze whether the voltage signals are abnormal according to the received digital signals, thereby implementing fault monitoring on the voltage signals and related devices. The utility model discloses can be under high temperature environment, use the voltage signal of test signal source analog circuit 101 simulation above-mentioned type and with each type's that simulates voltage signal input to the examination of awaiting measuring subsides redundant controller 103 and standard subsides redundant controller 102, later through comparing the signal of examining the output of examination of awaiting measuring subsides redundant controller 103 and standard subsides redundant controller 102 after receiving test signal, confirm the equipment performance and the reliability of examination subsides redundant controller 103 under high temperature environment, thereby confirm whether the examination of awaiting measuring subsides redundant controller 103 is the faulty equipment.

The signal output by the attenuation redundancy controller to be tested 103 after receiving the test signal is a digital signal obtained by converting the received test signal by the attenuation redundancy controller to be tested 103. Accordingly, the signal output by the standard attenuation redundancy controller 102 after receiving the test signal is also a digital signal obtained by converting the received test signal by the standard attenuation redundancy controller 102.

Wherein, the utility model discloses can establish above-mentioned high temperature environment in prior art's high-temperature chamber. Wherein, the utility model discloses can confirm that the indoor temperature and the temperature of high temperature room are long when lasting according to the relevant test standard or the requirement of the high temperature test of subsidence redundant controller. Wherein, the utility model discloses numerical value to indoor temperature and temperature duration do not all do the restriction, for example indoor temperature can be 40 ℃, and temperature duration can be 48 hours. It can be appreciated that the utility model discloses when carrying out the high temperature test, standard decay redundant controller 102 can place in high temperature environment, also can place in non-high temperature environment, the utility model discloses do not limit to this.

Specifically, the utility model discloses can use test signal source analog circuit 101 simulation and direct current voltage signal, work play voltage signal, main rail goes out one or several kinds of the same type's in voltage signal and the little rail voltage signal to the voltage signal of each type that will simulate inputs one by one to the examination of awaiting measuring subsides redundant controller 103 and standard subsides redundant controller 102 as test signal, carries out the high temperature test of corresponding type's voltage signal collection and monitor function to examination subsides redundant controller 103 under high temperature environment. For example, the utility model discloses can use test signal source analog circuit 101 simulation direct current voltage signal and work out voltage signal, later can be earlier with simulating out direct current voltage signal input to the redundant controller of decay 103 and the redundant controller of standard decay 102 of awaiting measuring, carry out the high temperature test of direct current voltage signal acquisition and monitoring function to the redundant controller of decay 103 of awaiting measuring at high temperature environment; and inputting the simulated output voltage signal to the attenuation redundant controller to be tested 103 and the standard attenuation redundant controller 102, and performing high-temperature test of output voltage signal acquisition and monitoring functions on the attenuation redundant controller to be tested 103 in a high-temperature environment.

It should be noted that the utility model discloses a test signal source simulates out and carries out the high temperature test with the voltage signal that subsides redundant controller received when the actual working condition, can effectively improve the test accuracy.

Wherein, the utility model discloses can use existing industrial computer 104 among the prior art, receive and compare in real time the signal of the output of waiting to await measuring subsides loss redundant controller 103 and standard subsides loss redundant controller 102 after receiving test signal, confirm to await measuring that the signal acquisition and the monitoring function of subsides loss redundant controller 103 under high temperature environment are normal according to the comparison result to confirm whether the waiting to await measuring subsides loss redundant controller 103 is the fault equipment.

The industrial personal computer 104 CAN be respectively in communication connection with the attenuation redundant controller to be tested 103 and the standard attenuation redundant controller 102 through the CAN bus, so as to receive signals sent by the attenuation redundant controller to be tested 103 and the standard attenuation redundant controller 102 through the CAN bus.

Specifically, the industrial personal computer 104 may identify a voltage signal corresponding to the signal after receiving the signals output by the attenuation redundant controller 103 to be tested and the standard attenuation redundant controller 102, and then compare the identified voltage signal in real time.

After receiving the test signal output by the test signal source analog circuit 101, both the standard attenuation redundant controller 102 and the attenuation redundant controller to be tested 103 output corresponding signals to the industrial personal computer 104 at the signal output end. Specifically, the utility model discloses can use the current industrial computer that the model is IPC-400 to come as industrial computer 104 in this embodiment.

It should be noted that, after receiving the signals output by the to-be-tested attenuation redundant controller 103 and the standard attenuation redundant controller 102, the industrial personal computer 104 may compare the signal output by the to-be-tested attenuation redundant controller 103 with the signal output by the standard attenuation redundant controller 102. The industrial personal computer 104 may determine that the signal acquisition and monitoring function of the attenuation redundant controller 103 to be tested in the high-temperature environment does not meet the test requirement and determine that the attenuation redundant controller 103 to be tested is a faulty device when the signal output by the attenuation redundant controller 103 to be tested is inconsistent with the signal output by the standard attenuation redundant controller 102 or the difference exceeds a preset allowable error range.

In practical application, the utility model discloses can carry out the high temperature test to a plurality of examination subsides redundant controller 103 that await measuring simultaneously to improve the efficiency of software testing's test. At this time, each attenuation redundancy controller 103 to be tested needs to be placed in a high-temperature environment, the test signal output end of the test signal source analog circuit 101 can be electrically connected with the signal acquisition end of each attenuation redundancy controller 103 to be tested and the signal output end of the standard attenuation redundancy controller 102, and the test signal output end of the test signal source analog circuit 101 can output test signals to each attenuation redundancy controller 103 to be tested and the standard attenuation redundancy controller 102 through the test signal output end; the signal output end of each attenuation redundant controller to be tested 103 and the signal output end of the standard attenuation redundant controller 102 can be in communication connection with the signal input end of the industrial personal computer 104, each attenuation redundant controller to be tested 103 and the standard attenuation redundant controller 102 can output corresponding signals to the industrial personal computer 104 after receiving the test signals, and the industrial personal computer 104 compares the signals to determine the fault equipment.

Wherein, industrial computer 104 can be provided with a plurality of terminals, and every terminal all can regard as industrial computer 104's signal input part and the signal output part communication connection of a subsidence redundant controller. For example, the industrial personal computer 104 may be provided with a first terminal, a second terminal, and a third terminal, when the first to-be-tested attenuation redundant controller 103 and the second to-be-tested attenuation redundant controller 103 perform high-temperature tests, the first terminal may be used as a signal input end of the industrial personal computer 104 and communicatively connected to a signal output end of the standard attenuation redundant controller 102, the second terminal may also be used as a signal input end of the industrial personal computer 104 and communicatively connected to a signal output end of the first to-be-tested attenuation redundant controller 103, and the third terminal may also be used as a signal input end of the industrial personal computer 104 and communicatively connected to a signal output end of the second to-be-tested attenuation redundant controller 103.

Specifically, after receiving the signal output by each attenuation redundant controller to be tested 103 and the signal output by the standard attenuation redundant controller 102, the industrial personal computer 104 may compare the signal output by each attenuation redundant controller to be tested 103 with the signal output by the standard attenuation redundant controller 102, respectively. For example, when the first to-be-tested attenuation redundant controller 103 and the second to-be-tested attenuation redundant controller 103 perform a high-temperature test, the industrial personal computer 104 may compare a signal output by the first to-be-tested attenuation redundant controller 103 with a signal output by the standard attenuation redundant controller 102, and compare a signal output by the second to-be-tested attenuation redundant controller 103 with a signal output by the standard attenuation redundant controller 102.

When the industrial personal computer 104 compares the signals output by the attenuation redundant controllers 103 to be tested with the signals output by the standard attenuation redundant controller 102, the attenuation redundant controllers 103 to be tested, which have output signals inconsistent with the signals output by the standard attenuation redundant controller 102 or have differences exceeding a preset allowable error range, can be determined as faulty devices. Specifically, the utility model discloses can be before carrying out the high temperature test, all carry out corresponding sign by technical staff to the terminal of industrial computer 104 and subside redundant controller (including standard subside redundant controller 102 and the subside redundant controller 103 that awaits measuring) in advance to correspond in industrial computer 104 and preserve the terminal and the sign relation of the subside redundant controller that is connected that subsides. Then, the industrial personal computer 104 may determine, as a fault signal, a signal that is inconsistent with the signal output by the standard attenuation redundant controller 102 or differs beyond a preset allowable error range in the process of comparing the signals after the high-temperature test, determine a corresponding terminal according to the fault signal, and then determine the corresponding attenuation redundant controller to be tested 103 as a fault device according to the above identification relationship.

In practical application, the industrial personal computer 104 in this embodiment may perform real-time alarm and recording when comparing the fault signals, so as to effectively screen out the invisible fault devices that are temporarily failed during the high-temperature test and then automatically recovered.

Optionally, in the high temperature testing apparatus for other attenuation redundancy controllers provided in this embodiment, the apparatus may further include: a Keyboard-Video Mouse (KVM) switch provides a man-machine interface between the industrial personal computer 104 and a technician, so that the technician can operate the industrial personal computer 104 conveniently, and the test efficiency is effectively improved.

The high-temperature testing device for the attenuation redundancy controller provided by the embodiment can comprise: the system comprises a test signal source simulation circuit 101, a standard attenuation redundant controller 102 and an industrial personal computer 104, wherein a test signal output end of the test signal source simulation circuit 101 is electrically connected with a signal acquisition end of the attenuation redundant controller 103 to be tested and a signal acquisition end of the standard attenuation redundant controller 102, and a signal output end of the attenuation redundant controller 103 to be tested and a signal output end of the standard attenuation redundant controller 102 are both in communication connection with a signal input end of the industrial personal computer 104. In this embodiment, the test signal source simulation circuit 101 may be used to simulate a voltage signal received by the attenuation redundant controller in an actual working condition, the simulated voltage signal is input to the attenuation redundant controller 103 to be tested and the standard attenuation redundant controller 102 as a test signal, the industrial personal computer 104 is used to receive signals output by the attenuation redundant controller 103 to be tested and the standard attenuation redundant controller 102 after receiving the test signal, and the signals output by the attenuation redundant controller 103 to be tested and the signals output by the standard attenuation redundant controller 102 are compared in real time, and a faulty device is determined according to the comparison result. The utility model discloses can effectively improve the efficiency of software testing's test that carries out high temperature test to await measuring subsides redundant controller 103 to can effectively select the stealthy fault equipment who appears transient trouble and later self-resuming in carrying out the high temperature test in-process through the mode of reporting to the police in real time and record when comparing out trouble signal, improve the test rate of accuracy.

Based on the schematic structural diagram shown in fig. 1, the present embodiment provides another high temperature testing apparatus for an attenuation redundancy controller, where the high temperature testing apparatus may further include: the system comprises a first cabinet, wherein at least one attenuation redundant controller 103 to be tested can be placed in the first cabinet, and the first cabinet is placed in a high-temperature environment.

It should be noted that, when needing to carry out high temperature test to a plurality of examination subsidence redundant controller 103 that await measuring, the utility model discloses can go ahead and all place each examination subsides redundant controller 103 that awaits measuring inside first cabinet, later place first cabinet in high temperature environment, begin again to each examination subsides redundant controller 103 that awaits measuring and carry out high temperature test to realize the centralized management and the centralized test to each examination subsides redundant controller 103 that awaits measuring, improve efficiency of software testing.

Wherein, first rack can be the rack among the prior art, the utility model discloses do not restrict to the concrete structure and the type of first rack.

The high-temperature testing device for the attenuation redundant controllers provided by the embodiment can be provided with the first cabinet, so that the centralized management and the centralized test of the attenuation redundant controllers 103 to be tested are realized, and the testing efficiency is improved.

Based on the schematic structure diagram shown in fig. 1, the utility model discloses still provide another kind of high temperature test device who declines redundant controller, this high temperature test device can also include: the second cabinet is internally provided with a standard attenuation redundant controller 102, an industrial personal computer 104 and a test signal source analog circuit 101, and is arranged in a non-high-temperature environment.

What need to explain, the utility model discloses can be before carrying out the high temperature test to the awaiting measuring subsides power consumption redundant controller 103, the standard subsides power consumption redundant controller 102 that will participate in the high temperature test, test signal source analog circuit 101 and industrial computer 104 are all placed inside the second rack, place the second rack under non-high temperature environment, later restart the awaiting measuring subsides power consumption redundant controller 103's high temperature test to the realization is to standard subsides power consumption redundant controller 102, the centralized management of test signal source analog circuit 101 and industrial computer 104, improve efficiency of software testing.

According to the high-temperature test device for the attenuation redundant controller, the standard attenuation redundant controller 102, the test signal source simulation circuit 101 and the industrial personal computer 104 can be placed inside the second cabinet, so that the standard attenuation redundant controller 102, the test signal source simulation circuit 101 and the industrial personal computer 104 are managed in a centralized mode, and the test efficiency is improved.

Based on the schematic structure shown in fig. 1, the present embodiment provides another high temperature testing apparatus for attenuation redundancy controller, as shown in fig. 2, in the high temperature testing apparatus, the test signal source analog circuit 101 may include: the dc voltage signal source is an analog circuit 105.

The test signal output end of the direct-current voltage signal source analog circuit 105 is electrically connected with the first signal acquisition end of the attenuation redundancy controller to be tested 103;

the test signal output end of the direct-current voltage signal source analog circuit 105 is electrically connected with the first signal acquisition end of the standard attenuation redundant controller 102;

the first signal output end of the attenuation redundant controller to be tested 103 and the first signal output end of the standard attenuation redundant controller 102 are both in communication connection with the first signal input end of the industrial personal computer 104.

The dc voltage signal source analog circuit 105 may simulate and output a dc voltage signal that is the same as the dc voltage signal collected by the attenuation redundancy controller under the actual working condition. During high-temperature testing, the dc voltage signal source analog circuit 105 may serve as the test signal source analog circuit 101, a test signal output end of the dc voltage signal source analog circuit 105 may serve as a test signal output end of the test signal source analog circuit 101, and the dc voltage signal source analog circuit 105 may output a simulated dc voltage signal to the first signal collecting end of the attenuation redundancy controller 103 to be tested and the first signal collecting end of the standard attenuation redundancy controller 102 at the test signal output end.

Then, the industrial personal computer 104 can determine whether the to-be-tested attenuation redundant controller 103 receives the direct-current voltage signal by comparing signals output by the to-be-tested attenuation redundant controller 103 and the standard attenuation redundant controller 102, and if so, the to-be-tested attenuation redundant controller 103 is determined to have normal acquisition and monitoring functions on the direct-current voltage signal; otherwise, determining that the acquisition and monitoring function of the to-be-tested attenuation redundant controller 103 on the direct-current voltage signal is failed, and determining that the to-be-tested attenuation redundant controller 103 is a failed device.

In practical applications, the dc voltage signal source analog circuit 105 may specifically include: a first dc power supply 106, as shown in fig. 3. The first dc power supply 106 may simulate a dc voltage signal received by the attenuation redundant controller under actual working conditions, and may output the simulated dc voltage signal to the attenuation redundant controller 103 to be tested and the standard attenuation redundant controller 102 during high-temperature testing. The utility model discloses do not limit to the output voltage of first DC power supply 106, can confirm by the technical staff according to actual working conditions, for example 24 volts.

The high-temperature test device for the attenuation redundant controller provided by the embodiment can simulate and output the direct-current voltage signal which is the same as the direct-current voltage signal collected by the attenuation redundant controller under the actual working condition by using the direct-current voltage signal source simulation circuit 105 when performing high-temperature test, and can effectively improve the test accuracy while testing the direct-current voltage signal collection and monitoring functions of the attenuation redundant controller 103 to be tested under the high-temperature environment.

Based on the schematic structure shown in fig. 1, the present embodiment provides another high temperature testing apparatus for attenuation redundancy controller, as shown in fig. 4, in the high temperature testing apparatus, the test signal source analog circuit 101 may include: a work-out voltage signal source analog circuit 107;

the test signal output end of the output voltage signal source analog circuit 107 is electrically connected with the second signal acquisition end of the attenuation redundancy controller to be tested 103;

the test signal output end of the output voltage signal source analog circuit 107 is electrically connected with the second signal acquisition end of the standard attenuation redundancy controller 102;

and a second signal output end of the attenuation redundant controller to be tested 103 and a second signal output end of the standard attenuation redundant controller 102 are both in communication connection with a second signal input end of the industrial personal computer 104.

The output voltage signal source analog circuit 107 may simulate and output an output voltage signal that is the same as the output voltage signal collected by the attenuation redundancy controller under the actual working condition. When high-temperature testing is performed, the output voltage signal source analog circuit 107 can serve as the test signal source analog circuit 101, the test signal output end of the output voltage signal source analog circuit 107 can serve as the test signal output end of the test signal source analog circuit 101, and the output voltage signal source analog circuit 107 can output simulated output voltage signals to the second signal acquisition end of the attenuation redundancy controller 103 to be tested and the second signal acquisition end of the standard attenuation redundancy controller 102 at the test signal output end.

Then, the industrial personal computer 104 may determine whether the signal output by the attenuation redundant controller 103 to be tested is normal by comparing the signals output by the attenuation redundant controller 103 to be tested and the standard attenuation redundant controller 102, so as to determine whether the function of acquiring and monitoring the output voltage signal of the attenuation redundant controller 103 to be tested in the high-temperature environment is normal.

It should be noted that the utility model discloses when carrying out the high temperature test, use output voltage signal source analog circuit 107 and output and the output of the redundant controller that declines and consume the output voltage signal that the same of output voltage signal that gathers under the actual working condition, can effectively improve the accuracy of test when can testing the output voltage signal collection of the redundant controller 103 that declines of awaiting measuring under the high temperature environment and monitoring function.

In the high temperature testing apparatus of other attenuation redundancy controllers proposed in this embodiment, as shown in fig. 5, the output voltage signal source analog circuit 107 may specifically include: a first frequency-shifted signal transmitter 108.

It should be noted that the present invention can use the first frequency-shift signal transmitter 108 as the output voltage signal source analog circuit 107 to transmit the output voltage signal to the to-be-tested attenuation redundant controller 103 and the standard attenuation redundant controller 102.

The first frequency-shift signal transmitter 108 may be a ZPW · F type uninsulated transmitter, among others. At this time, the first frequency shift signal transmitter 108 may transmit a frequency shift signal with a carrier frequency of 1701.4Hz and a low frequency of 10.3Hz to the attenuation redundancy controller 103 and the standard attenuation redundancy controller 102 to be tested, where the frequency shift signal may be a power output voltage signal received by the attenuation redundancy controller 103 and the standard attenuation redundancy controller 102 to be tested when performing a high temperature test. It should be noted that the output voltage signal sent by the first frequency shift signal transmitter 108 may be consistent with the high-voltage high-power frequency shift signal collected by the attenuation redundancy controller under the actual working condition, and the accuracy of the test may be effectively improved while the output voltage signal collection and monitoring functions of the attenuation redundancy controller 103 to be tested are tested under the high-temperature environment.

The high-temperature test device for the attenuation redundant controller provided by the embodiment can use the output voltage signal source analog circuit 107 and output the output voltage signal which is the same as the output voltage signal collected by the attenuation redundant controller under the actual working condition when performing high-temperature test, and can effectively improve the test accuracy while testing the output voltage signal collection and monitoring functions of the attenuation redundant controller 103 to be tested under the high-temperature environment.

Based on the schematic structure diagram shown in fig. 1, the utility model provides a high temperature test device of another kind of decay redundant controller, as shown in fig. 6, test signal source analog circuit 101 can include: a main rail output voltage signal source analog circuit 109;

the test signal output end of the main rail output voltage signal source analog circuit 109 is electrically connected with the third signal acquisition end of the attenuation redundancy controller 103 to be tested;

the test signal output end of the main rail output voltage signal source analog circuit 109 is electrically connected with the third signal acquisition end of the standard attenuation redundancy controller 102;

and a third signal output end of the attenuation redundant controller to be tested 103 and a third signal output end of the standard attenuation redundant controller 102 are both in communication connection with a third signal input end of the industrial personal computer 104.

The main rail voltage signal source analog circuit 109 may simulate and output a main rail voltage signal that is the same as a main rail voltage signal collected by the attenuation redundancy controller under actual operation. During high-temperature testing, the main rail-out voltage signal source analog circuit 109 may serve as the test signal source analog circuit 101, a test signal output end of the main rail-out voltage signal source analog circuit 109 may serve as a test signal output end of the test signal source analog circuit 101, and the main rail-out voltage signal source analog circuit 109 may output a simulated main rail-out voltage signal to the third signal acquisition end of the to-be-tested attenuation redundant controller 103 and the third signal acquisition end of the standard attenuation redundant controller 102 at the test signal output end.

Then, the industrial personal computer 104 may determine whether the signal output by the attenuation redundant controller 103 to be tested is normal by comparing the signals output by the attenuation redundant controller 103 to be tested and the standard attenuation redundant controller 102, so as to determine whether the main rail voltage signal acquisition and monitoring functions of the attenuation redundant controller 103 to be tested in a high-temperature environment are normal.

It should be noted that the utility model discloses when carrying out the high temperature test, use main rail to go out voltage signal source analog circuit 109 and output and the main rail that the redundant controller of subsides gathered under the actual working condition goes out voltage signal the same, can effectively improve the rate of accuracy of test when the main rail that awaits measuring subsides redundant controller 103 of losing voltage signal collection and monitoring function test under the high temperature environment.

In the high temperature testing apparatus for other attenuation redundancy controllers proposed in this embodiment, as shown in fig. 7, the main rail voltage signal source analog circuit 109 may specifically include: a second frequency-shifted signal transmitter 110 and a first voltage divider 111;

the test signal output end of the second frequency shift signal transmitter 110 is electrically connected with the input end of the first voltage divider 111;

the output end of the first voltage divider 111 is electrically connected with the second signal acquisition end of the attenuation redundancy controller 103 to be tested;

the output end of the first voltage divider 111 is electrically connected to the second signal acquisition end of the modular attenuation redundancy controller 102.

The product type and the transmitted frequency shift signal of the second frequency shift signal transmitter 110 may be identical to those of the first frequency shift signal transmitter 108, that is, the second frequency shift signal transmitter 110 may be a ZPW · F type uninsulated transmitter, and the second frequency shift signal transmitter 110 may output a frequency shift signal with a carrier frequency of 1701.4Hz and a low frequency of 10.3 Hz.

In the actual operation of the attenuation redundant controller, the signal frequency of the main rail voltage signal collected by the attenuation redundant controller is the same as the signal frequency of the output voltage signal, and the voltage amplitude of the main rail voltage signal is different from the voltage amplitude of the output voltage signal. Therefore, when the product model of the second frequency shift signal transmitter 110 is consistent with the product model of the first frequency shift signal transmitter 108 and the transmitted frequency shift signal, the utility model discloses can set up the first voltage divider 111 to adjust the voltage amplitude of the main rail voltage signal of group.

The first voltage divider 111 may divide the frequency-shifted signal transmitted by the second frequency-shifted signal transmitter 110, so that the attenuation redundancy controller 103 to be tested and the standard attenuation redundancy controller 102 may receive the main rail voltage signal consistent with the actual working condition. It should be noted that the specific electrical parameters of the first voltage divider 111 can be determined by a skilled person according to practical situations, and the present invention is not limited thereto.

It should be noted that, in the utility model provides an among other high temperature testing arrangement, when second frequency shift signal transmitter 110 can direct output and the unanimous main rail voltage signal of actual working condition, the utility model discloses need not to set up first voltage divider 111 and carry out the partial pressure to the frequency shift signal of second frequency shift signal transmitter 110.

The high-temperature test device for the attenuation redundant controller provided by the embodiment can use the main rail voltage signal source analog circuit 109 to output the main rail voltage signal which is the same as the main rail voltage signal collected by the attenuation redundant controller under the actual working condition when performing high-temperature test, and can effectively improve the accuracy of the test while testing the main rail voltage signal collection and monitoring functions of the attenuation redundant controller 103 to be tested under the high-temperature environment.

Based on the schematic structural diagrams shown in fig. 5 and fig. 7, the present embodiment proposes another high-temperature test apparatus for a loss-reduction redundant controller. In the high temperature test apparatus, as shown in fig. 8, the first frequency-shift signal transmitter 108 and the second frequency-shift signal transmitter 110 may be the same fourth frequency-shift signal transmitter, the first voltage divider 111 may be a first slide resistor, and the output voltage signal source analog circuit 107 and the main rail-out voltage signal source analog circuit 109 may be composed of the fourth frequency-shift signal transmitter and the first slide resistor.

It should be noted that, because in the actual working condition of the attenuation redundant controller, the signal frequency of the main rail voltage signal collected by the attenuation redundant controller is the same as the signal frequency of the power output voltage signal, and the voltage amplitude of the main rail voltage signal is different from the voltage amplitude of the power output voltage signal, therefore, the utility model discloses can use fourth frequency shift signal transmitter and first slide-wire rheostat to constitute power output voltage signal source analog circuit 107 and main rail voltage signal source analog circuit 109, use fourth frequency shift signal transmitter and first slide-wire rheostat to simulate power output voltage signal and main rail voltage signal simultaneously. It should be noted that the specific electrical parameters of the first slide rheostat can be determined by the skilled person according to the actual situation, for example, the first slide rheostat can be a 100 ohm, 200 watt slide rheostat.

As shown in fig. 8, the fourth frequency-shift signal transmitter may be provided with two terminals a1 and a2, and the first slide rheostat may be provided with five terminals a1, a2, a3, a4, and a 5. The a1 terminal of the fourth frequency shift signal transmitter may be electrically connected with the a3 terminal of the first slide rheostat, and the a2 terminal of the fourth frequency shift signal transmitter may be electrically connected with the a5 terminal of the first slide rheostat. At this time, when the attenuation redundant controller 103 to be tested or the standard attenuation redundant controller 102 is connected to the a3 terminal and the a5 terminal, the fourth frequency shift signal transmitter and the first slide rheostat may output a power-out voltage signal for the attenuation redundant controller 103 to be tested and the standard attenuation redundant controller 102 at the a3 terminal and the a5 terminal, where the a3 terminal is the test signal output terminal of the power-out voltage signal source analog circuit 107; when the attenuation redundant controller 103 or the standard attenuation redundant controller 102 to be tested is connected to the a3 terminal and the a4 terminal, main rail voltage signals can be output to the attenuation redundant controller 103 and the standard attenuation redundant controller 102 to be tested at the a3 terminal and the a4 terminal, wherein the a3 terminal is a test signal output end of the main rail voltage signal source analog circuit 109.

The high-temperature testing device of the attenuation redundancy controller provided by this embodiment may use the fourth frequency shift signal transmitter and the first slide-wire rheostat to form the output voltage signal source analog circuit 107 and the main rail output voltage signal source analog circuit 109, and does not need to use two frequency shift signal transmitters to form the output voltage signal source analog circuit 107 and the main rail output voltage signal source analog circuit 109, so that the utilization rate of the device may be effectively improved.

Based on the schematic structure diagram shown in fig. 1, the present embodiment provides another high temperature testing apparatus for attenuation redundancy controller, as shown in fig. 9, the test signal source analog circuit 101 may include: a small rail-out voltage signal source analog circuit 112;

the test signal output end of the small-rail voltage signal source analog circuit 112 is electrically connected with the fourth signal acquisition end of the attenuation redundancy controller 103 to be tested;

the test signal output end of the small-rail voltage signal source analog circuit 112 is electrically connected with the fourth signal acquisition end of the standard attenuation redundancy controller 102;

and a fourth signal output end of the attenuation redundant controller to be tested 103 and a fourth signal output end of the standard attenuation redundant controller 102 are both in communication connection with a fourth signal input end of the industrial personal computer 104.

The small-rail voltage signal source analog circuit 112 may simulate and output a small-rail voltage signal that is the same as the small-rail voltage signal collected by the attenuation redundancy controller under the actual working condition. When a high-temperature test is performed, the small-rail-out voltage signal source analog circuit 112 may serve as the test signal source analog circuit 101, a test signal output end of the small-rail-out voltage signal source analog circuit 112 may serve as a test signal output end of the test signal source analog circuit 101, and the small-rail-out voltage signal source analog circuit 112 may output a simulated small-rail-out voltage signal to the fourth signal acquisition end of the to-be-tested attenuation redundant controller 103 and the fourth signal acquisition end of the standard attenuation redundant controller 102 at the test signal output end.

Then, the industrial personal computer 104 may determine whether the signal output by the attenuation redundant controller 103 to be tested is normal by comparing the signals output by the attenuation redundant controller 103 to be tested and the standard attenuation redundant controller 102, so as to determine whether the small-rail-out voltage signal acquisition and monitoring functions of the attenuation redundant controller 103 to be tested in a high-temperature environment are normal.

It should be noted that the utility model discloses when carrying out the high temperature test, use little rail-out voltage signal source analog circuit 112 and output and the same little rail-out voltage signal of the little rail-out voltage signal that subsides redundant controller gathered under the actual working condition, can effectively improve the rate of accuracy of test when can testing the little rail-out voltage signal collection and the monitoring function of the subsides redundant controller 103 that awaits measuring under the high temperature environment.

In the high temperature testing apparatus of other attenuation redundancy controllers proposed in this embodiment, as shown in fig. 10, the small-rail voltage signal source analog circuit 112 may include: a third frequency-shifted signal transmitter and a second voltage divider;

the test signal output end of the third frequency shift signal transmitter is electrically connected with the input end of the second voltage divider;

the output end of the second voltage divider is electrically connected with a fourth signal acquisition end of the attenuation redundancy controller to be tested 103;

the output end of the first voltage divider 111 is electrically connected to the fourth signal acquisition end of the modular attenuation redundancy controller 102.

The type of the third frequency-shift signal transmitter may be the same as the types of the first frequency-shift signal transmitter 108 and the second frequency-shift signal transmitter 110, that is, the type of the third frequency-shift signal transmitter may be a ZPW · F type uninsulated transmitter. It should be noted that, in the actual working condition of the attenuation redundant controller, the signal frequency and the signal amplitude of the small-rail voltage signal collected by the attenuation redundant controller are different from the power-off voltage signal and the main-rail voltage signal, and therefore, the frequency of the frequency-shifted signal sent by the third frequency-shifted signal sender is not consistent with the first frequency-shifted signal sender 108 and the second frequency-shifted signal sender 110, and the frequency of the frequency-shifted signal sent by the third frequency-shifted signal sender can be determined by a technician according to the actual working condition, which is not limited by the present invention, for example, the third frequency-shifted signal sender can output the frequency-shifted signal with the carrier frequency of 1701.4Hz and the low frequency of 10.3 Hz.

The second voltage divider may divide the frequency-shifted signal sent by the third frequency-shifted signal transmitter, so that the attenuation redundancy controller 103 to be tested and the standard attenuation redundancy controller 102 may receive the small-rail voltage signal consistent with the actual working condition. It should be noted that, the specific electrical parameters of the second voltage divider can be determined by the skilled person according to the actual situation, and the present invention is not limited thereto. The second voltage divider may be consistent with the electrical parameters of the first voltage divider 111. In particular, the second voltage divider may be a second varistor in accordance with the electrical parameters of the first varistor.

As shown in fig. 10, when the second voltage divider is the second slide resistor, the third frequency-shifted signal transmitter may be provided with two terminals of b1 and b2, and the second slide resistor may be provided with two terminals of b3 and b 4. The b1 terminal of the third frequency shift signal transmitter may be electrically connected with the b3 terminal of the second slide wire varistor, and the b2 terminal of the third frequency shift signal transmitter may be electrically connected with the b4 terminal of the second slide wire varistor. When the attenuation redundant controller 103 or the standard attenuation redundant controller 102 to be tested is connected to the b3 terminal and the b4 terminal, the fourth frequency-shift signal transmitter and the first slide rheostat may output a small-rail-out voltage signal to the attenuation redundant controller 103 to be tested and the standard attenuation redundant controller 102 at the b3 terminal and the b4 terminal, wherein the b3 terminal may be a test signal output terminal of the small-rail-out voltage signal source analog circuit 112.

It should be noted that, in the utility model provides an among other high temperature testing arrangement, when third frequency shift signal transmitter can direct output and the unanimous little rail voltage signal of actual working condition, the utility model discloses need not to set up the second divider and carry out the partial pressure to the frequency shift signal of third frequency shift signal transmitter.

The high-temperature test device for the attenuation redundant controller provided by this embodiment can use the small rail voltage signal source analog circuit 112 and output the small rail voltage signal that is the same as the small rail voltage signal collected by the attenuation redundant controller under the actual working condition when performing a high-temperature test, and can effectively improve the accuracy of the test while testing the small rail voltage signal collection and monitoring functions of the attenuation redundant controller 103 to be tested under a high-temperature environment.

It can be understood that, in the high temperature testing apparatus of other attenuation redundancy controllers provided in this embodiment, the test signal source analog circuit 101 may simultaneously include one or more analog circuits of the dc voltage signal source analog circuit 105, the power-out voltage signal source analog circuit 107, the main rail-out voltage signal source analog circuit 109, and the small rail-out voltage signal source analog circuit 112, so that during the high temperature test, multiple types of test signals may be provided for the attenuation redundancy controller 103 to be tested and the standard attenuation redundancy controller 102, thereby implementing the high temperature test of multiple signal acquisition and monitoring functions of the attenuation redundancy controller 103 to be tested, and effectively improving the testing efficiency.

Based on the schematic structural diagram shown in fig. 1, the present embodiment provides another high temperature testing apparatus for an attenuation redundancy controller, where the high temperature testing apparatus may further include: a second direct current power supply;

the electric energy output end of the second direct current power supply is electrically connected with the electric energy input end of the attenuation redundancy controller 103 to be tested;

the power output end of the second dc power supply is electrically connected to the power input end of the standard droop redundancy controller 102.

The second direct-current power supply can supply power to the attenuation redundant controller to be tested 103 and the standard attenuation redundant controller 102, so that the attenuation redundant controller to be tested 103 and the standard attenuation redundant controller 102 can smoothly perform high-temperature test. When a plurality of attenuation redundant controllers 103 to be tested are simultaneously tested at a high temperature, the second direct current power supply can respectively supply power to the attenuation redundant controllers 103 to be tested and the standard attenuation redundant controller 102, and when the second direct current power supply is disconnected from any power supply circuit of the attenuation redundant controller 103 to be tested or the standard attenuation redundant controller 102, the power supply of the direct current power supply to other attenuation redundant controllers cannot be influenced.

The high-temperature testing device for the attenuation redundant controller provided by this embodiment may be provided with a second dc power supply, and the second dc power supply is used to supply power to the attenuation redundant controller to be tested 103 and the standard attenuation redundant controller 102, so that the attenuation redundant controller to be tested 103 and the standard attenuation redundant controller 102 can perform high-temperature testing smoothly.

It is also noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, article, or apparatus that comprises the element.

The above are merely examples of the present application and are not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.

Claims (9)

1. A high temperature test apparatus for fading redundant controllers, said high temperature test apparatus comprising: test signal source analog circuit, standard subsidence redundant controller and industrial computer, wherein:

the test signal output end of the test signal source analog circuit is electrically connected with the signal acquisition end of the attenuation redundancy controller to be tested, and the attenuation redundancy controller to be tested is placed in a high-temperature environment;

the test signal output end of the test signal source analog circuit is electrically connected with the signal acquisition end of the standard attenuation redundancy controller;

and the signal output end of the attenuation redundant controller to be tested and the signal output end of the standard attenuation redundant controller are both in communication connection with the signal input end of the industrial personal computer.

2. The high temperature test apparatus of claim 1, further comprising: the system comprises a first cabinet, wherein at least one attenuation redundant controller to be tested is placed in the first cabinet, and the first cabinet is placed in a high-temperature environment.

3. The high temperature test apparatus of claim 1, further comprising: the second cabinet is internally provided with the standard attenuation redundant controller, the test signal source simulation circuit and the industrial personal computer, and the second cabinet is arranged in a non-high-temperature environment.

4. The high temperature testing apparatus of claim 1, wherein the test signal source analog circuit comprises: a direct current voltage signal source analog circuit;

the test signal output end of the direct-current voltage signal source analog circuit is electrically connected with the first signal acquisition end of the attenuation redundancy controller to be tested;

the test signal output end of the direct-current voltage signal source analog circuit is electrically connected with the first signal acquisition end of the standard attenuation redundant controller;

and the first signal output end of the attenuation redundant controller to be tested and the first signal output end of the standard attenuation redundant controller are both in communication connection with the first signal input end of the industrial personal computer.

5. The high temperature testing apparatus of claim 1, wherein the test signal source analog circuit comprises: a work output voltage signal source analog circuit;

the test signal output end of the work output voltage signal source analog circuit is electrically connected with the second signal acquisition end of the attenuation redundancy controller to be tested;

the test signal output end of the work output voltage signal source analog circuit is electrically connected with the second signal acquisition end of the standard attenuation redundancy controller;

and the second signal output end of the attenuation redundant controller to be tested and the second signal output end of the standard attenuation redundant controller are both in communication connection with the second signal input end of the industrial personal computer.

6. The high temperature testing apparatus of claim 1, wherein the test signal source analog circuit comprises: a main rail output voltage signal source analog circuit;

the test signal output end of the main rail output voltage signal source analog circuit is electrically connected with the third signal acquisition end of the attenuation redundancy controller to be tested;

the test signal output end of the main rail output voltage signal source analog circuit is electrically connected with the third signal acquisition end of the standard attenuation redundancy controller;

and the third signal output end of the attenuation redundant controller to be tested and the third signal output end of the standard attenuation redundant controller are both in communication connection with the third signal input end of the industrial personal computer.

7. The high temperature testing apparatus of claim 1, wherein the test signal source analog circuit comprises: a small rail voltage signal source analog circuit;

the test signal output end of the small-rail voltage signal source analog circuit is electrically connected with the fourth signal acquisition end of the attenuation redundancy controller to be tested;

the test signal output end of the small-rail voltage signal source analog circuit is electrically connected with the fourth signal acquisition end of the standard attenuation redundant controller;

and the fourth signal output end of the attenuation redundant controller to be tested and the fourth signal output end of the standard attenuation redundant controller are both in communication connection with the fourth signal input end of the industrial personal computer.

8. The high temperature testing apparatus of claim 5, wherein the output voltage signal source analog circuit comprises: a first frequency-shifted signal transmitter.

9. The high temperature test apparatus of claim 6, wherein the main rail voltage signal source analog circuit comprises: a second frequency-shifted signal transmitter and a first voltage divider;

the test signal output end of the second frequency shift signal transmitter is electrically connected with the input end of the first voltage divider;

the output end of the first voltage divider is electrically connected with the second signal acquisition end of the attenuation redundancy controller to be tested;

and the output end of the first voltage divider is electrically connected with the second signal acquisition end of the standard attenuation redundant controller.

Images