CN211206668U - Composite low-voltage ride through test device - Google Patents
Composite low-voltage ride through test device Download PDFInfo
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- CN211206668U CN211206668U CN201921823917.6U CN201921823917U CN211206668U CN 211206668 U CN211206668 U CN 211206668U CN 201921823917 U CN201921823917 U CN 201921823917U CN 211206668 U CN211206668 U CN 211206668U
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- 238000012360 testing method Methods 0.000 title claims abstract description 82
- 239000002131 composite material Substances 0.000 title claims abstract description 17
- 238000004891 communication Methods 0.000 claims abstract description 6
- 238000005259 measurement Methods 0.000 abstract description 3
- 238000004088 simulation Methods 0.000 abstract description 3
- 238000009792 diffusion process Methods 0.000 abstract description 2
- 238000005070 sampling Methods 0.000 abstract description 2
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- 150000001875 compounds Chemical class 0.000 description 5
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Abstract
The utility model relates to a composite low voltage ride through test device, which comprises a low voltage distribution unit, a low voltage ride through test device, a low voltage grade distribution unit, a high and low temperature test box, a DC power supply simulator, a signal acquisition unit and a centralized control system; the system comprises a 10kV bus lead, a low-voltage distribution unit, a low-voltage ride-through testing device, a low-voltage grade distribution unit, a high-low temperature test box and a direct-current power supply simulator, wherein a loop is formed by the low-voltage distribution unit, the low-voltage ride-through testing device, the low-voltage grade distribution unit, the high-low temperature test box and the direct-current power supply simulator in sequence; the centralized control system is in data communication connection with the low-voltage power distribution unit, the low-voltage ride through testing device, the high-low temperature test box and the direct-current power supply simulator. The device carries out sampling measurement and 24-hour monitoring on the electrical performance of the equipment to be tested under the simulation limit working condition, can quickly detect the problems in the system and quickly cut off under any condition, and prevents further diffusion of faults.
Description
Technical Field
The utility model relates to a compound field of low voltage ride through test and environmental test of MW level capacity, in particular to compound low voltage ride through test device.
Background
In the field of low voltage ride through tests, the existing low voltage ride through test devices are used for singly carrying out low voltage ride through tests which operate in normal temperature and humidity ranges aiming at the tested normal use environment, and in practical application, particularly in a limit environment area with higher temperature and humidity, the temperature and humidity of the environment exceed the normal use working condition of equipment, so that a composite test for researching the electrical performance of the equipment under the limit condition is particularly important.
SUMMERY OF THE UTILITY MODEL
The to-be-solved technical problem of the utility model aims at providing a can simulation equipment operational environment, the compound low voltage ride through test device of electrical properties of test equipment when extreme environment moves.
In order to solve the technical problem, the composite low-voltage ride-through test device comprises a low-voltage distribution unit, a low-voltage ride-through test device, a low-voltage grade distribution unit, a high-low temperature test box, a direct-current power supply simulator, a signal acquisition unit and a centralized control system; the output end of the tested device is connected with the input end of the tested device in the high-low temperature test box through the low-voltage grade distribution unit, the output end of the tested device is connected with the input end of the direct-current power supply simulator, and the output end of the direct-current power supply simulator is connected back to the 10kV bus through the low-voltage distribution unit to form a loop; the signal acquisition unit is arranged between the low-voltage grade distribution unit and the tested equipment and between the tested equipment and the direct-current power supply simulator; the centralized control system is in data communication connection with the low-voltage power distribution unit, the low-voltage ride through testing device, the high-low temperature test box and the direct-current power supply simulator; the high-low temperature test box is powered by 10kV bus distribution.
Furthermore, a station for providing an interface for connecting the test system and the tested equipment is arranged between the high-low temperature test box and the direct-current power supply simulator.
Furthermore, the low-voltage distribution unit comprises a first switch cabinet, a second switch cabinet, a third switch cabinet, a first transformer and a transformer protection device, and the low-voltage grade distribution unit comprises a fourth switch cabinet, a fifth switch cabinet, a sixth switch cabinet and a second transformer.
Furthermore, a second transformer is connected in series to the fifth switch cabinet, and then the fifth switch cabinet and the sixth switch cabinet are connected in parallel to form a switch cabinet group.
Furthermore, a 10kV bus lead is connected to the input end of a first switch cabinet, the output end of the first switch cabinet is connected to the input end of a low voltage ride through test device, the output end of the low voltage ride through test device is connected to the input end of a fourth switch cabinet, the output end of the fourth switch cabinet is connected to the input end of a switch cabinet group, the output end of the switch cabinet group is connected to the input end of a tested device through a station interface by a first signal acquisition unit, the output end of the tested device is connected to the input end of a direct current power supply simulator through the station interface, the input end of the direct current power supply simulator is connected to the input end of a second switch cabinet, the output end of the second switch cabinet is connected to the input end of a first transformer, the output end of the first transformer is connected to the input end of a.
Furthermore, a seventh switch cabinet, an eighth switch cabinet and a third transformer are arranged between the high-low temperature test box and the 10kV bus.
The tested electric loop is that 10kV voltage passes through a zero (low) voltage ride-through test device to output voltage according to a voltage drop curve, and a centralized control system identifies the voltage level input at the alternating current side of the tested equipment. If the equipment is 400V, the equipment is directly connected with a station through a switch cabinet and a signal acquisition unit without a transformer, so that the equipment to be tested is connected; if the equipment is in the other low-voltage standard voltage grades, the equipment is changed into the corresponding standard voltage grade through the transformer, and then the equipment to be tested is connected through the switch cabinet connecting station. The device to be tested outputs direct current voltage, and then the direct current voltage passes through the signal acquisition unit, the direct current power supply simulator, the switch cabinet, the transformer protection device and the 10kV direct current bus in sequence to form an energy closed loop.
The bus voltage of 10kV is converted into 400kV through a seventh switch cabinet, a third transformer and an eighth switch cabinet and then is transmitted to a high-low temperature test box for power supply, equipment to be tested is placed in the high-low temperature test box, the equipment to be tested only aims at rectifier equipment and is electrified and operated under the limit environment provided by the high-low temperature test box, and the electrical performance of the equipment to be tested is tested;
the centralized control system collects the equipment parameters of the test loop through the signal collection unit, and main equipment in the device can be remotely operated in a centralized mode in the centralized control system in a communication mode.
The input and the output of the device are protected by the circuit breaker, and the self fault of a certain device cannot influence or damage other devices in the system.
The utility model relates to a compound low-voltage ride through test device has filled internal compound low-voltage ride through test's blank, through high low temperature test case simulation limit operating mode temperature, humidity environment, treats that the electrical property of equipment for measurement carries out sampling measurement and 24 hours control, can all detect the problem in the system rapidly under any circumstance and cut off fast, prevents that the trouble from further spreading.
Drawings
The composite low voltage ride through test device of the present invention is further described with reference to the accompanying drawings:
FIG. 1 is a schematic block diagram of the composite low voltage ride through test apparatus;
fig. 2 is a block diagram showing the structure of the composite low-voltage ride-through test apparatus.
In the figure:
10-10kV bus
11-first switch cabinet, 12-second switch cabinet, 13-third switch cabinet, 14-first transformer and 15-transformer protection device
21-a fourth switch cabinet, 22-a fifth switch cabinet, 23-a sixth switch cabinet and 24-a second transformer;
31-seventh switch cabinet, 32-third transformer, 33-eighth switch cabinet.
Detailed Description
As shown in fig. 1 and 2, the composite low voltage ride through test device comprises a low voltage distribution unit, a low voltage ride through test device, a low voltage grade distribution unit, a high and low temperature test box, a direct current power supply simulator, a signal acquisition unit and a centralized control system; the output end of the tested device is connected with the input end of the tested device in the high-low temperature test box through the low-voltage grade distribution unit, the output end of the tested device is connected with the input end of the direct-current power supply simulator, and the output end of the direct-current power supply simulator is connected back to the 10kV bus 10 through the low-voltage distribution unit to form a loop; the signal acquisition unit is arranged between the low-voltage grade distribution unit and the tested equipment and between the tested equipment and the direct-current power supply simulator; the centralized control system is in data communication connection with the low-voltage power distribution unit, the low-voltage ride through testing device, the high-low temperature test box and the direct-current power supply simulator; the high-low temperature test box is powered by 10kV buses.
Furthermore, a station for providing an interface for connecting the test system and the tested equipment is arranged between the high-low temperature test box and the direct-current power supply simulator.
Further, the low voltage distribution unit includes a first switch cabinet 11, a second switch cabinet 12, a third switch cabinet 13, a first transformer 14 and a transformer protection device 15, and the low voltage class distribution unit includes a fourth switch cabinet 21, a fifth switch cabinet 22, a sixth switch cabinet 23 and a second transformer 24.
Furthermore, the fifth switch cabinet 22 is connected in series with a second transformer 24, and then connected in parallel with the sixth switch cabinet 23 to form a switch cabinet group.
Further, a 10kV bus 10 lead is connected to an input end of a first switch cabinet 11, an output end of the first switch cabinet 11 is connected to an input end of a low voltage ride through test device, an output end of the low voltage ride through test device is connected to an input end of a fourth switch cabinet 14, an output end of the fourth switch cabinet 14 is connected to an input end of a switch cabinet group, an output end of the switch cabinet group is connected to an input end of a tested device through a station interface by a first signal acquisition unit, an output end of the tested device is connected to an input end of a direct current power supply simulator through the station interface, an input end of the direct current power supply simulator is connected to an input end of a second switch cabinet 12, an output end of the second switch cabinet 12 is connected to an input end of a first transformer 11, an output end of the first transformer 11 is connected to an input end of a transformer protection.
Further, a seventh switch cabinet 31, a third transformer 32 and an eighth switch cabinet 33 are arranged between the high-low temperature test box and the 10kV bus.
The tested electric loop is that 10kV voltage passes through a zero (low) voltage ride-through test device to output voltage according to a voltage drop curve, and a centralized control system identifies the voltage level input at the alternating current side of the tested equipment. If the equipment is 400V, the equipment is directly connected with a station through a switch cabinet and a signal acquisition unit without a transformer, so that the equipment to be tested is connected; if the equipment is in the other low-voltage standard voltage grades, the equipment is changed into the corresponding standard voltage grade through the transformer, and then the equipment to be tested is connected through the switch cabinet connecting station. The device to be tested outputs direct current voltage, and then the direct current voltage passes through the signal acquisition unit, the direct current power supply simulator, the switch cabinet, the transformer protection device and the 10kV direct current bus in sequence to form an energy closed loop.
The bus voltage of 10kV is converted into 400kV through a seventh switch cabinet 31, a third transformer 33 and an eighth switch cabinet 32, the 400kV voltage is sent to a high-low temperature test box for power supply, equipment to be tested is placed in the high-low temperature test box, the equipment to be tested is only directed at rectifier equipment, and the equipment to be tested is electrified and operated under the limit environment provided by the high-low temperature test box, so that the electrical performance of the equipment to be tested is tested;
the centralized control system collects the equipment parameters of the test loop through the signal collection unit, and main equipment in the device can be remotely operated in a centralized mode in the centralized control system in a communication mode.
The input and the output of the device are protected by the circuit breaker, and the self fault of a certain device cannot influence or damage other devices in the system.
The composite low-voltage ride-through test device fills the blank of the composite low-voltage ride-through test in China, simulates the temperature and humidity environment of the limit working condition through the high-low temperature test box, samples and measures the electrical performance of equipment to be tested and monitors the electrical performance for 24 hours, can quickly detect the problems in the system and quickly cut off the system under any condition, and prevents further diffusion of faults.
The above embodiments are intended to be illustrative of the manner in which the invention may be made and used by persons skilled in the art, and modifications to the above embodiments will be apparent to those skilled in the art, and it is therefore intended that the invention, including but not limited to the above embodiments, be limited to any methods, processes and products consistent with the principles and novel and inventive features disclosed herein, and which are to be interpreted as illustrative and not in a limiting sense.
Claims (6)
1. A composite low voltage ride through test device is characterized in that: the system comprises a low-voltage distribution unit, a low-voltage ride-through testing device, a low-voltage grade distribution unit, a high-low temperature test box, a direct-current power supply simulator, a signal acquisition unit and a centralized control system; wherein,
the 10kV bus is connected to the input end of the low voltage ride through testing device through the low voltage distribution unit, the output end of the low voltage ride through testing device is connected to the input end of the tested device in the high and low temperature test box through the low voltage grade distribution unit, the output end of the tested device is connected to the input end of the direct current power supply simulator, and the output end of the direct current power supply simulator is connected back to the 10kV bus through the low voltage distribution unit to form a loop;
the signal acquisition unit is arranged between the low-voltage grade distribution unit and the tested equipment and between the tested equipment and the direct-current power supply simulator;
the centralized control system is in data communication connection with the low-voltage power distribution unit, the low-voltage ride through testing device, the high-low temperature test box and the direct-current power supply simulator;
the high-low temperature test box is powered by 10kV bus distribution.
2. The composite low voltage ride through test apparatus of claim 1, wherein: and a station for providing an interface for connecting the test system and the tested equipment is arranged between the high-low temperature test box and the direct-current power supply simulator.
3. The composite low voltage ride through test apparatus of claim 2, wherein: the low-voltage distribution unit comprises a first switch cabinet, a second switch cabinet, a third switch cabinet, a first transformer and a transformer protection device, and the low-voltage grade distribution unit comprises a fourth switch cabinet, a fifth switch cabinet, a sixth switch cabinet and a second transformer.
4. A composite low voltage ride through test apparatus according to claim 3, wherein: and the fifth switch cabinet is connected with a second transformer in series and then connected with the sixth switch cabinet in parallel to form a switch cabinet group.
5. The composite low voltage ride through test device of claim 4, wherein: the 10kV bus lead is connected to the input end of a first switch cabinet, the output end of the first switch cabinet is connected with the input end of a low voltage ride through testing device, the output end of the low voltage ride through testing device is connected with the input end of a fourth switch cabinet, the output end of the fourth switch cabinet is connected with the input end of a switch cabinet group, the output end of the switch cabinet group is connected with the input end of a tested device through a station interface by a first signal acquisition unit, the output end of the tested device is connected with the input end of a direct current power supply simulator through the station interface, the input end of the direct current power supply simulator is connected with the input end of a second switch cabinet, the output end of the second switch cabinet is connected with the input end of a first transformer, the output end of the first transformer is connected with the input end.
6. The composite low voltage ride through test apparatus of any of claims 1 to 5, wherein: and a seventh switch cabinet, an eighth switch cabinet and a third transformer are arranged between the high-low temperature test box and the 10kV bus.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921823917.6U CN211206668U (en) | 2020-06-02 | 2020-06-02 | Composite low-voltage ride through test device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921823917.6U CN211206668U (en) | 2020-06-02 | 2020-06-02 | Composite low-voltage ride through test device |
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| Publication Number | Publication Date |
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| CN211206668U true CN211206668U (en) | 2020-08-07 |
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| CN201921823917.6U Active CN211206668U (en) | 2020-06-02 | 2020-06-02 | Composite low-voltage ride through test device |
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| CN (1) | CN211206668U (en) |
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2020
- 2020-06-02 CN CN201921823917.6U patent/CN211206668U/en active Active
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