CN212749205U

CN212749205U - Conductive testing machine for FFC wire

Info

Publication number: CN212749205U
Application number: CN202021858895.XU
Authority: CN
Inventors: 黄雅莉
Original assignee: Hanmen Electronics Jiangsu Co ltd
Current assignee: Hanmen Electronics Jiangsu Co ltd
Priority date: 2020-08-31
Filing date: 2020-08-31
Publication date: 2021-03-19
Anticipated expiration: 2030-08-31

Abstract

The utility model discloses a conductivity testing machine for FFC wires, which comprises a machine box, a cover plate, a testing host machine, a lifting mechanism, a detecting head and a material placing plate; the test host is arranged in the case, the cover plate is arranged at the upper opening of the case, and the cover plate is provided with a vertical plate; the lifting mechanism is arranged on the vertical plate, the detection head is arranged on the lifting mechanism and is electrically connected with the test host, the material placing plate is arranged on the cover plate below the detection head, and the lifting mechanism drives the detection head to be close to or far away from the material placing plate; the limiting mechanism is arranged between the detection head and the cover plate and limits the detection head from excessively approaching the material placing plate; the vertical plate is L-shaped, and the bottom of the vertical plate is fixedly connected to the cover plate; the lifting mechanism comprises a clamp, a slide way, a slide block and a lifting block. The utility model discloses stop gear has been add to can prevent that the probe from excessively pushing down, both guarantee that the probe is difficult for bending the deformation, also can guarantee that golden finger's cladding material is not damaged.

Description

Conductive testing machine for FFC wire

Technical Field

The utility model relates to a testing arrangement technical field especially relates to a conductive test machine of FFC wire rod.

Background

An FFC Flexible Flat Cable (FFC) is a PET insulating material and an extremely thin tin-plated Flat copper wire, and is widely applied to connection between a printing head and a main board of various printers, signal transmission and board connection of products such as plotters, scanners, copiers, audios, liquid crystal electrical appliances, fax machines, various video disc players and the like, and is almost ubiquitous in modern electrical equipment.

In order to ensure the quality of the FFC wire, before the FFC wire is put on the market, a gold finger on the FFC wire needs to be tested to check the conductivity. At present, a conductive testing machine in the market is contacted with a golden finger through a probe, the conductive condition is judged through the lighting condition of a testing host machine, and then whether the quality of an FFC wire rod is qualified is determined. However, during the testing process, the gold plating layer of the gold finger is damaged by pressing the probe excessively, thereby affecting the corrosion resistance of the gold finger.

Therefore, it is necessary to provide a conductivity testing machine for FFC wires to solve the above problems.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a conductive test machine of FFC wire rod has add stop gear to can prevent that the probe from excessively pushing down, both guaranteed that the probe is difficult for bending the deformation, also can guarantee that the cladding material of golden finger is not damaged, with the problem of proposing in solving above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme:

a conductivity testing machine for FFC wires comprises a machine box, a cover plate, a testing host machine, a lifting mechanism, a detecting head and a material placing plate; the test host is arranged in the case, the cover plate is arranged at the upper opening of the case, and the cover plate is provided with a vertical plate; the lifting mechanism is arranged on the vertical plate, the detection head is arranged on the lifting mechanism and is electrically connected with the test host, the material placing plate is arranged on the cover plate below the detection head, and the lifting mechanism drives the detection head to be close to or far away from the material placing plate; the material placing plate is arranged between the detection head and the cover plate, and the limit mechanism limits the detection head to be excessively close to the material placing plate.

The utility model has the further improvement that the vertical plate is L-shaped, and the bottom of the vertical plate is fixedly connected with the cover plate; the lifting mechanism comprises a clamp, a slide way, a slide block and a lifting block; the clamp and the slideway are vertically and fixedly connected to the vertical plate, and the sliding block is connected to the slideway in a sliding manner; the lifting block is fixedly connected to the sliding block, and the pivot of the clamp is fixedly connected to the lifting block.

The utility model has the further improvement that the detection head comprises a mounting plate and a probe; the mounting panel rigid coupling is in the bottom of elevator, the vertical rigid coupling of probe in the front end of mounting panel, and the upper and lower both ends of probe all protrude in the mounting panel, and the cable junction test host computer is passed through on the top of probe.

The utility model discloses a further improvement is, the upper surface of putting the flitch is equipped with puts the silo, and when the mounting panel moved down to extreme position, the probe stretched into to putting in the silo.

The utility model discloses a further improvement is, stop gear includes stopper A and stopper B, stopper A rigid coupling in the bottom of mounting panel, stopper B rigid coupling on the apron, when the mounting panel moves down to extreme position, stopper A and stopper B contact.

The utility model discloses a further improvement is, stopper A and stopper B are the hemisphere form, and stopper A and stopper B atress elastic deformation.

The utility model discloses a further improvement scheme is, be equipped with the louvre of the long waist type of a plurality of on the machine box.

The utility model discloses a further improvement scheme is, the mounting panel is colorless transparent material.

The utility model discloses a further improvement scheme is, the top of riser is equipped with guiding mechanism, and the cable passes from guiding mechanism.

The utility model discloses a further improvement is, guiding mechanism includes U type support, and U type support internal rotation two sections have two fixed pulleys, and the cable passes between two fixed pulleys.

The utility model has the advantages that:

first, the utility model discloses a conducting test machine of FFC wire rod has add stop gear to can prevent that the probe from excessively pushing down, both guarantee that the probe is difficult for bending the deformation, also can guarantee that golden finger's cladding material is not damaged.

Second, the utility model discloses a conductive test machine of FFC wire rod, stopper A and stopper B are the hemisphere form, and stopper A and stopper B accept but elastic deformation, if can press the clamp with strength under the non-conductive condition to it does not remove the condition that targets in place and leads to the non-conductive condition to take place to get rid of the probe.

Third, the utility model discloses a conductive test machine of FFC wire rod is equipped with the louvre of the long waist type of a plurality of on the machine box, guarantees the stability of test host computer work in the machine box.

Fourth, the utility model discloses a conductive test machine of FFC wire rod, mounting panel are colorless transparent material, make things convenient for the operator to observe whether probe and golden finger contact.

Fifth, the utility model discloses a conductive test machine of FFC wire rod, the top of riser is equipped with guiding mechanism, and the cable passes from guiding mechanism, prevents the cable wearing and tearing, and when guaranteeing that the operator presses down the clamp, the cable is difficult to produce with other parts and interferes.

Drawings

Fig. 1 is a schematic view of the overall structure of the present invention.

Fig. 2 is a top view of the material placing plate of the present invention.

Fig. 3 is a side view of the guiding mechanism of the present invention.

Fig. 4 is a schematic structural view of the present invention in a use state.

In the figure: 1-machine box, 2-cover plate, 3-lifting mechanism, 301-clamp, 302-slideway, 303-sliding block, 304-lifting block, 4-detection head, 401-mounting plate, 402-probe, 403-cable, 5-material placing plate, 501-material placing groove, 6-limiting mechanism, 601-limiting block A, 602-limiting block B, 7-vertical plate, 8-guiding mechanism, 801-U-shaped bracket, 802-fixed pulley, 9-button and 10-FFC wire rod.

Detailed Description

The invention will be further elucidated with reference to the drawings and the specific embodiments.

Example 1: as shown in fig. 1 to 4, a conductivity testing machine for FFC wires comprises a machine box 1, a cover plate 2, a testing host, a lifting mechanism 3, a detecting head 4 and a material placing plate 5; the testing host (not shown in the attached drawing) is installed in the machine box 1, the cover plate 2 is fixedly connected to the upper opening of the machine box 1 through an inner hexagonal countersunk head screw, and the cover plate 2 is fixedly connected with a vertical plate 7 through an inner hexagonal socket head cap throwing screw; the lifting mechanism 3 is arranged on the vertical plate 7, the detection head 4 is arranged on the lifting mechanism 3 and is electrically connected with the test host, the material placing plate 5 is arranged on the cover plate 2 below the detection head 4, and the lifting mechanism 3 drives the detection head 4 to approach or be far away from the material placing plate 5; the device also comprises a limiting mechanism 6, wherein the limiting mechanism 6 is arranged between the detection head 4 and the cover plate 2, and the limiting mechanism 6 limits the excessive approach of the detection head 4 to the material placing plate 5; the vertical plate 7 is L-shaped, and the bottom of the vertical plate 7 is fixedly connected to the cover plate 2; the lifting mechanism 3 comprises a clamp 301, a slide way 302, a slide block 303 and a lifting block 304; the clamp 301 and the slide way 302 are vertically and fixedly connected to the vertical plate 7 through an inner hexagonal countersunk head screw, and the slide block 303 is connected to the slide way 302 in a sliding manner; the lifting block 304 is fixedly connected to the sliding block 303, and the pivot of the clamp 301 is fixedly connected to the lifting block 304; the detection head 4 comprises a mounting plate 401 and a probe 402; the mounting plate 401 is fixedly connected to the bottom of the lifting block 304, the probe 402 is vertically in interference fit with the front end of the mounting plate 401, the upper end and the lower end of the probe 402 protrude out of the mounting plate 401, and the top end of the probe 402 is connected with the test host through a cable 403; a material placing groove 501 is formed in the upper surface of the material placing plate 5, and when the mounting plate 401 moves downwards to the limit position, the probe 402 extends into the material placing groove 501; the limiting mechanism 6 comprises a limiting block A601 and a limiting block B602, the limiting block A601 is adhered to the bottom of the mounting plate 401 or fixedly connected to the bottom of the mounting plate 401 through a screw, the limiting block B602 is adhered to the cover plate 2 or fixedly connected to the cover plate through a screw, and when the mounting plate 401 moves downwards to a limiting position, the limiting block A601 is in contact with the limiting block B602; the limiting block A601 and the limiting block B602 are hemispheroid, and the limiting block A601 and the limiting block B602 can elastically deform under the stress; a plurality of long waist-shaped heat dissipation holes are formed in the case 1; the mounting plate 401 is made of colorless transparent material.

Example 2: the present embodiment is a further improvement of embodiment 1, and the main improvement is that in embodiment 1, the cable 403 is easily worn when in use; in the present embodiment, the above-mentioned defects can be avoided, specifically:

a guide mechanism 8 is arranged at the top end of the vertical plate 7, and a cable 403 passes through the guide mechanism 8; the guide mechanism 8 comprises a U-shaped bracket 801, two fixed pulleys 802 rotate in the U-shaped bracket 801, and the cable 403 passes through the two fixed pulleys 802; in the present embodiment, the cable 403 passes through the guide mechanism 8 during use, so as to prevent the cable 403 from being worn, and ensure that the cable 403 is not easily interfered with other components when the operator presses the clamp 301.

Otherwise, this embodiment is identical to embodiment 1, and will not be described herein.

The utility model discloses a concrete theory of operation as follows:

when in use, the test host is firstly powered on; then the FFC wire 10 is placed in the material placing groove 501, and the golden finger is just positioned under the probe 402 at the moment; an operator pulls a wrench of the clamp 301, the probe 402 moves downwards to be in contact with the golden finger, and at the moment, the limiting block A601 just contacts with the limiting block B602; an operator presses the button 9, and if a green light on the cover plate 2 is on, the quality of the golden finger is qualified; if the red light on the cover plate 2 is on, the operator pulls the wrench slightly to increase the downward pressure of the probe 402, if the green light on the cover plate 2 is on, the golden finger is qualified, and if the red light on the cover plate 2 is still on, the golden finger is unqualified.

It should be noted that the testing host is a device commonly used in the detection of electronic products such as FFC cables, LCD screens, etc., and the structure and principle thereof are not specifically described herein.

The above embodiments are only for illustrating the technical concept and features of the present invention, and the purpose of the embodiments is to enable those skilled in the art to understand the contents of the present invention and to implement the present invention, which cannot limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered by the protection scope of the present invention.

Claims

1. The utility model provides a conductive test machine of FFC wire rod which characterized in that: comprises a case (1), a cover plate (2), a test host, a lifting mechanism (3), a detection head (4) and a material placing plate (5); the test host is arranged in the case (1), the cover plate (2) is arranged at the upper opening of the case (1), and the cover plate (2) is provided with a vertical plate (7); the lifting mechanism (3) is arranged on the vertical plate (7), the detection head (4) is arranged on the lifting mechanism (3) and is electrically connected with the test host, the material placing plate (5) is arranged on the cover plate (2) below the detection head (4), and the lifting mechanism (3) drives the detection head (4) to approach or be far away from the material placing plate (5); the material placing plate is characterized by further comprising a limiting mechanism (6), wherein the limiting mechanism (6) is arranged between the detection head (4) and the cover plate (2), and the limiting mechanism (6) limits the detection head (4) to excessively approach the material placing plate (5).

2. The conduction testing machine of an FFC wire of claim 1, wherein: the vertical plate (7) is L-shaped, and the bottom of the vertical plate (7) is fixedly connected to the cover plate (2); the lifting mechanism (3) comprises a clamp (301), a slide way (302), a slide block (303) and a lifting block (304); the clamp (301) and the slide way (302) are vertically and fixedly connected to the vertical plate (7), and the sliding block (303) is connected to the slide way (302) in a sliding manner; the lifting block (304) is fixedly connected to the sliding block (303), and the pivot of the clamp (301) is fixedly connected to the lifting block (304).

3. The conduction testing machine for the FFC wire according to claim 2, wherein: the detection head (4) comprises a mounting plate (401) and a probe (402); mounting panel (401) rigid coupling in the bottom of elevator (304), the vertical rigid coupling of probe (402) in the front end of mounting panel (401), and the upper and lower both ends of probe (402) all protrude in mounting panel (401), and the top of probe (402) is passed through cable (403) and is connected the test host computer.

4. The conduction testing machine of an FFC wire of claim 3, wherein: the upper surface of the material placing plate (5) is provided with a material placing groove (501), and when the mounting plate (401) moves downwards to the limit position, the probe (402) extends into the material placing groove (501).

5. The conduction testing machine of an FFC wire of claim 3, wherein: stop gear (6) include stopper A (601) and stopper B (602), stopper A (601) rigid coupling in the bottom of mounting panel (401), stopper B (602) rigid coupling on apron (2), when mounting panel (401) downwardly movement to extreme position, stopper A (601) and stopper B (602) contact.

6. The conduction testing machine for FFC wires according to claim 5, wherein: the limiting block A (601) and the limiting block B (602) are hemispheroid, and the limiting block A (601) and the limiting block B (602) can elastically deform under stress.

7. The conduction testing machine of an FFC wire of claim 1, wherein: the machine box (1) is provided with a plurality of long waist-shaped heat dissipation holes.

8. The conduction testing machine of an FFC wire of claim 3, wherein: the mounting plate (401) is made of colorless transparent materials.

9. The conduction testing machine of an FFC wire of claim 3, wherein: the top of riser (7) is equipped with guiding mechanism (8), and cable (403) passes through in guiding mechanism (8).

10. The conduction testing machine of an FFC wire of claim 9, wherein: the guide mechanism (8) comprises a U-shaped support (801), two fixed pulleys (802) rotate in the U-shaped support (801), and the cable (403) penetrates through the two fixed pulleys (802).