CN212722973U - Pressing mechanism of electronic device test fixture - Google Patents
Pressing mechanism of electronic device test fixture Download PDFInfo
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- CN212722973U CN212722973U CN202021131039.4U CN202021131039U CN212722973U CN 212722973 U CN212722973 U CN 212722973U CN 202021131039 U CN202021131039 U CN 202021131039U CN 212722973 U CN212722973 U CN 212722973U
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- movable pressure
- pressure head
- cover plate
- upper cover
- hole
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Abstract
The utility model discloses a hold-down mechanism of an electronic device test fixture, which comprises a lower substrate, an upper cover plate and a movable pressure head, wherein the upper cover plate covers on the lower substrate and is locked with the lower substrate through a bolt; the lower base plate is provided with a through hole, the through hole is provided with an annular protruding part, the movable pressure head is provided with a flange part, the movable pressure head is movably embedded into the through hole, the upper flange part of the movable pressure head is contacted with the annular protruding part in the through hole, and the lower end of the movable pressure head extends out of the lower surface of the lower base plate; the movable pressure head is sleeved with an elastic piece, each through hole is provided with a mounting hole, the upper cover plate is provided with a second mounting hole, and a screw penetrates through the second mounting hole and the mounting hole in sequence to lock the upper cover plate and the lower substrate. The utility model relates to an it is ingenious, guaranteed the precision and the repeatability to the device process test, avoid because the effort of upper cover plate warpage and elastic component, lead to unable fixed condition to compressing tightly local device.
Description
Technical Field
The utility model relates to an electron device test fixture's hold-down mechanism belongs to optical communication test technical field.
Background
The current universal high-temperature test fixture product is compressed only by one plastic plate, so that the product can be stably arranged on the fixture in the repeated aging test material transferring process of the fixture, and the test repeatability is ensured. The existing pressing cover plate cannot meet the pressing requirements of products with different height tolerances, the thickness tolerance of a product tube seat is +/-0.075mm, the pressing cover plate can only press products with larger thickness in principle, and the products with smaller thickness of a product base cannot be effectively pressed.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing an electron device test fixture's hold-down mechanism, its design benefit has guaranteed to carry out the precision and the repeatability of testing to the device, avoids because the effort of upper cover plate warpage and elastic component, leads to unable local device to compress tightly the fixed condition.
In order to achieve the above purpose, the utility model adopts the technical scheme that: a hold-down mechanism of an electronic device test fixture comprises a lower substrate, an upper cover plate and a plurality of movable pressure heads which are arranged at intervals, wherein the upper cover plate covers the upper surface of the lower substrate and is locked with the lower substrate through at least two bolts;
the lower base plate is provided with a plurality of through holes corresponding to the movable pressure heads at intervals, the inner wall of the lower end of each through hole is provided with an annular protruding part extending inwards in the radial direction, the middle lower part of each movable pressure head is provided with a flange part extending outwards in the radial direction, the movable pressure heads are movably embedded into the through holes in the lower base plate, the lower surfaces of the upper flange parts of the movable pressure heads are in contact with the upper surfaces of the annular protruding parts in the through holes, and the lower ends of the movable pressure heads extend out of the lower surface of the lower base plate and are used for being in extrusion contact with;
the outer side of the movable pressure head is sleeved with an elastic element which is positioned between the upper cover plate and the flange part on the movable pressure head; and a screw penetrates the second mounting hole and the mounting hole on the upper cover plate in sequence to lock the upper cover plate and the lower substrate.
The further improved scheme in the technical scheme is as follows:
1. in the scheme, the number of the through holes on the movable pressure head and the lower substrate is 64, and the through holes are uniformly distributed in 8 rows and 8 columns.
2. In the above scheme, the elastic member is a spring.
Because of above-mentioned technical scheme's application, compared with the prior art, the utility model have the following advantage:
the utility model discloses hold-down mechanism of electron device test fixture, it is through setting up movable pressure head, in testing and the transportation process to the device, realize the elasticity of each device and compress tightly, avoid because the device has the high difference between the device that the tolerance leads to, or take place the shake and appear and can't realize compressing tightly the circumstances such as to some devices in the transportation process, through very ingenious design, guaranteed to test precision and repeatability to the device; in addition, the mounting holes are formed in the two sides of each mounting hole, so that clamping of each device is further guaranteed, the situation that partial devices cannot be compressed and fixed due to the action force of the warping of the upper cover plate and the elastic piece is avoided, and the precision and the repeatability of testing the devices are further improved.
Drawings
FIG. 1 is an exploded view of the pressing mechanism of the electronic device testing fixture of the present invention;
FIG. 2 is a schematic view of a partial structure of the present invention;
fig. 3 is a schematic structural diagram of the movable pressing head and the elastic member of the present invention.
In the above drawings: 1. a lower substrate; 2. an upper cover plate; 3. a movable pressure head; 31. a flange portion; 4. a through hole; 41. an annular projection; 5. an elastic member; 6. mounting holes; 7. and a second mounting hole.
Detailed Description
In the description of this patent, it is noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the present invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; furthermore, unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, as they may be fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The meaning of the above terms in this patent may be specifically understood by those of ordinary skill in the art.
Example 1: a hold-down mechanism of an electronic device test fixture comprises a lower substrate 1, an upper cover plate 2 and a plurality of movable pressure heads 3 which are arranged at intervals, wherein the upper cover plate 2 covers the upper surface of the lower substrate 1 and is locked with the lower substrate 1 through at least two bolts;
a plurality of through holes 4 corresponding to the movable pressure head 3 are arranged on the lower substrate 1 at intervals, an annular protruding part 41 which extends radially inwards is arranged on the inner wall of the lower end of each through hole 4, a flange part 31 which extends radially outwards is arranged at the middle lower part of each movable pressure head 3, each movable pressure head 3 is movably embedded into the through hole 4 on the lower substrate 1, the lower surface of the flange part 31 on each movable pressure head 3 is contacted with the upper surface of the annular protruding part 41 in each through hole 4, and the lower end of each movable pressure head 3 extends out of the lower surface of the lower substrate 1 and is used for being in pressing contact with a device to be tested;
the outer side of the movable pressure head 3 is sleeved with an elastic element 5, and the elastic element 5 is positioned between the upper cover plate 2 and a flange part 31 on the movable pressure head 3; every the both sides of through-hole 4 all are provided with a mounting hole 6, it has the second mounting hole 7 that corresponds with mounting hole 6 to open on upper cover plate 2, and a screw penetrates second mounting hole 7 and mounting hole 6 on upper cover plate 2 in proper order, locks upper cover plate 2 and infrabasal plate 1.
The number of the through holes 4 on the movable pressure head 3 and the lower substrate 1 is 64, and the through holes are evenly distributed in 8 rows and 8 columns.
Example 2: a hold-down mechanism of an electronic device test fixture comprises a lower substrate 1, an upper cover plate 2 and a plurality of movable pressure heads 3 which are arranged at intervals, wherein the upper cover plate 2 covers the upper surface of the lower substrate 1 and is locked with the lower substrate 1 through at least two bolts;
a plurality of through holes 4 corresponding to the movable pressure head 3 are arranged on the lower substrate 1 at intervals, an annular protruding part 41 which extends radially inwards is arranged on the inner wall of the lower end of each through hole 4, a flange part 31 which extends radially outwards is arranged at the middle lower part of each movable pressure head 3, each movable pressure head 3 is movably embedded into the through hole 4 on the lower substrate 1, the lower surface of the flange part 31 on each movable pressure head 3 is contacted with the upper surface of the annular protruding part 41 in each through hole 4, and the lower end of each movable pressure head 3 extends out of the lower surface of the lower substrate 1 and is used for being in pressing contact with a device to be tested;
the outer side of the movable pressure head 3 is sleeved with an elastic element 5, and the elastic element 5 is positioned between the upper cover plate 2 and the flange part 31 on the movable pressure head 3.
The elastic member 5 is a spring.
When the pressing mechanism of the electronic device test fixture is adopted, elastic pressing of each device is realized in the process of testing and transferring the devices by arranging the movable pressing head, the situations that the devices are highly different due to tolerance of the devices, or the pressing of partial devices cannot be realized due to shaking in the transferring process are avoided, and the precision and the repeatability of process testing of the devices are ensured by the ingenious design; in addition, the mounting holes are formed in the two sides of each mounting hole, so that clamping of each device is further guaranteed, the situation that partial devices cannot be compressed and fixed due to the action force of the warping of the upper cover plate and the elastic piece is avoided, and the precision and the repeatability of testing the devices are further improved.
The above embodiments are only for illustrating the technical concept and features of the present invention, and the purpose of the embodiments is to enable people skilled in the art to understand the contents of the present invention and to implement the present invention, which cannot limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered by the protection scope of the present invention.
Claims (3)
1. The utility model provides an electron device test fixture's hold-down mechanism which characterized in that: the device comprises a lower substrate (1), an upper cover plate (2) and a plurality of movable pressure heads (3) which are arranged at intervals, wherein the upper cover plate (2) covers the upper surface of the lower substrate (1) and is locked with the lower substrate (1) through at least two bolts;
a plurality of through holes (4) corresponding to the movable pressure head (3) are formed in the lower base plate (1) at intervals, a radially inward extending annular protruding portion (41) is arranged on the inner wall of the lower end of each through hole (4), a radially outward extending flange portion (31) is arranged on the middle lower portion of each movable pressure head (3), each movable pressure head (3) is movably embedded into the corresponding through hole (4) in the lower base plate (1), the lower surface of the upper flange portion (31) of each movable pressure head (3) is in contact with the upper surface of the corresponding annular protruding portion (41) in the corresponding through hole (4), and the lower end of each movable pressure head (3) extends out of the lower surface of the corresponding lower base plate (1) and is used for being in compression contact with a device to;
an elastic piece (5) is sleeved on the outer side of the movable pressure head (3), and the elastic piece (5) is positioned between the upper cover plate (2) and a flange part (31) on the movable pressure head (3); every the both sides of through-hole (4) all are provided with a mounting hole (6), it has second mounting hole (7) that correspond with mounting hole (6) to open on upper cover plate (2), and a screw penetrates second mounting hole (7) and mounting hole (6) on upper cover plate (2) in proper order, locks upper cover plate (2) and infrabasal plate (1).
2. The hold-down mechanism of an electronic device testing fixture of claim 1, wherein: the number of the through holes (4) on the movable pressure head (3) and the lower substrate (1) is 64, and the through holes are evenly distributed in 8 rows and 8 columns.
3. The hold-down mechanism of an electronic device testing fixture of claim 1, wherein: the elastic piece (5) is a spring.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021131039.4U CN212722973U (en) | 2020-06-17 | 2020-06-17 | Pressing mechanism of electronic device test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021131039.4U CN212722973U (en) | 2020-06-17 | 2020-06-17 | Pressing mechanism of electronic device test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN212722973U true CN212722973U (en) | 2021-03-16 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202021131039.4U Active CN212722973U (en) | 2020-06-17 | 2020-06-17 | Pressing mechanism of electronic device test fixture |
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| Country | Link |
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| CN (1) | CN212722973U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116551418A (en) * | 2023-07-07 | 2023-08-08 | 杭州鄂达精密机电科技有限公司 | Clamp for punching batch valve seats |
| CN116551419A (en) * | 2023-07-07 | 2023-08-08 | 杭州鄂达精密机电科技有限公司 | Full-automatic clamping assembly for punching batch valve seats |
-
2020
- 2020-06-17 CN CN202021131039.4U patent/CN212722973U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116551418A (en) * | 2023-07-07 | 2023-08-08 | 杭州鄂达精密机电科技有限公司 | Clamp for punching batch valve seats |
| CN116551419A (en) * | 2023-07-07 | 2023-08-08 | 杭州鄂达精密机电科技有限公司 | Full-automatic clamping assembly for punching batch valve seats |
| CN116551418B (en) * | 2023-07-07 | 2023-09-19 | 杭州鄂达精密机电科技有限公司 | Clamp for punching batch valve seats |
| CN116551419B (en) * | 2023-07-07 | 2023-09-19 | 杭州鄂达精密机电科技有限公司 | Full-automatic clamping assembly for punching batch valve seats |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: Building 5, No. 1508, Xiangjiang Road, Suzhou High-tech Zone, Suzhou City, Jiangsu Province 215129 Patentee after: Suzhou Lianxun Instrument Co.,Ltd. Address before: 215011 Building 5, no.1508 Xiangjiang Road, high tech Zone, Suzhou City, Jiangsu Province Patentee before: STELIGHT INSTRUMENT Inc. |
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| CP03 | Change of name, title or address |