CN212696216U - Microphone testing tool and system - Google Patents

Abstract

The application discloses test fixture of microphone includes: a test board having a first sound hole and a first pad; the microphone to be tested is provided with a second sound hole and a second bonding pad, the second sound hole corresponds to the first sound hole, and the second bonding pad corresponds to the first bonding pad; a probe having a first end and a retractable second end, the first end penetrating the first pad, the second end abutting the second pad; and the pressing plate is abutted against the microphone to be tested, so that the first bonding pad is in physical contact and electrical contact with the second bonding pad through the probe. The test tool and the test system provided by the application enable the electric connection between the microphone to be tested and the test board to be more stable through the probe, so that more reliable test data can be obtained after the microphone to be tested is replaced for multiple times.

Description

Microphone testing tool and system

Technical Field

The application relates to the technical field of microphone testing, in particular to a microphone testing tool and system.

Background

Microphones are used in more and more widespread applications in consumer electronics. The performance requirements for microphones are also becoming more stringent. It is generally necessary to test the sensitivity of the microphone during the development phase. The existing microphone testing tool easily causes unstable electric connection between a microphone to be tested and a testing board, and causes inaccurate testing data.

In order to solve the problem of unstable electrical connection between the microphone to be tested and the test board in the related art, no effective solution has been proposed at present.

SUMMERY OF THE UTILITY MODEL

In view of the above problems in the related art, the present application provides a testing tool and system for a microphone, which can effectively test the microphone and obtain reliable testing data.

The technical scheme of the application is realized as follows:

according to an aspect of the present application, there is provided a test fixture for a microphone, including:

a test board having a first sound hole and a first pad;

the microphone to be tested is provided with a second sound hole and a second bonding pad, the second sound hole corresponds to the first sound hole, and the second bonding pad corresponds to the first bonding pad;

a probe having a first end and a retractable second end, the first end penetrating the first pad, the second end abutting the second pad;

and the pressing plate is abutted against the microphone to be tested, so that the first bonding pad is in physical contact and electrical contact with the second bonding pad through the probe.

According to another aspect of the present application, there is provided a test system of a microphone, including:

a sound source that emits a test sound wave;

the microphone to be tested receives the sound waves, converts sound energy into electric energy and outputs an electric signal through a second bonding pad of the microphone to be tested;

and the test board is provided with a first bonding pad electrically connected with the second bonding pad and used for receiving and processing the electric signal.

The test tool and the test system provided by the application enable the electric connection between the microphone to be tested and the test board to be more stable through the probe, so that more reliable test data can be obtained after the microphone to be tested is replaced for multiple times.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.

FIG. 1 illustrates a schematic diagram of a test fixture for a microphone according to some embodiments.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments that can be derived from the embodiments given herein by a person of ordinary skill in the art are intended to be within the scope of the present disclosure.

According to the embodiment of the application, the microphone testing tool is used for testing the sensitivity of a microphone. The microphone includes a capacitive MEMS microphone and a piezoelectric MEMS microphone.

Referring to fig. 1, the test fixture includes a test board 10, a microphone 20 to be tested, a probe 30, a limiting plate 40, and a pressing plate 50. The various components of the test fixture will be described in detail below.

The test board 10 has a first sound hole 11, a first pad 12, and a third pad 13. The third pads 13 and the first pads 12 are respectively located on both sides of the test board 10, and through holes (not numbered) are provided through the first pads 12 and the third pads 13. The third pad 13 is electrically connected to the first pad 12 through a conductive member on the inner wall of the through-hole. Test plate 10 is secured to a test station (not shown) via at least three studs 14, wherein first ends of studs 14 are secured to the test station. In some embodiments, the test Board 10 includes a PCB (Printed Circuit Board) and the test Board 10 is used for conducting the electrical signals generated by the microphone 20 to be tested to other external test circuits. Or the test board 10 includes a test circuit to test the sensitivity of the microphone 20 under test.

The microphone 20 to be tested has a second sound hole 22 and a second bonding pad 21, the second sound hole 22 corresponds to the first sound hole 11, and the size of the first sound hole 11 is larger than that of the second sound hole 22, so that sound waves can reach the diaphragm (not shown in the figure) of the microphone 20 to be tested through the first sound hole 11 of the test board 10 and the second sound hole 22 of the microphone 20 to be tested. The second bonding pad 21 corresponds to the first bonding pad 12, thereby facilitating conduction of an electrical signal generated by the microphone 20 to be tested to an external test circuit via the first bonding pad 12 and the second bonding pad 21. In some embodiments, the microphone 20 under test comprises a package of the drop-in type, the second sound hole 22 being located on the same side as the second pad 21.

The probe 30 has a first end penetrating the first pad 12 and a second end that is extendable and retractable and abuts against the second pad 21. Specifically, the probe 30 includes a ferrule (not shown), a spring (not shown) housed in the ferrule, and a retractable tip 31. The ferrule and the third land 13 are secured and electrically connected via an adhesive, which may comprise solder paste or other conductive adhesive. The tip 31 penetrates the through hole and abuts against the second pad 21 of the microphone 20 to be tested. It is worth noting that, on the one hand, the second pads 21 of the microphone 20 to be tested are in physical and electrical contact with the first pads 12 of the test board 10 due to being pressed. On the other hand, the second pad 21 of the microphone 20 under test is in electrical contact with the third pad 13 via the tip 31, and since the third pad 13 is also in electrical contact with the first pad 12, the second pad 21 is in electrical contact with the first pad 12 via the tip 31 and the third pad 13. By such a connection, a stable electrical contact of the first pad 12 with the second pad 21 can be ensured. Tip 31 may be compressed to be flush with the surface of test plate 10.

The stopper plate 40 is fixed to the test board 10 by bolts 41. Also the bolt 41 has an external thread and the second end of the stud 14 has an internal thread. The internal thread of the second end of the stud 14 is fixedly connected with the external thread of the bolt 41, in other words, the bolt 41 can be screwed into the stud 14. The limiting plate 40 has a limiting hole, and the microphone 20 to be tested is accommodated in the limiting hole, and the second pad 21 of the microphone 20 to be tested is initially aligned with the first pad 12 of the testing board 10.

The platen 50 abuts the microphone 20 to be tested such that the first pads 12 are in physical and electrical contact with the second pads 21 via the probes 30. The platen 50 includes a magnet block 51, a main body, and a projection 52 projecting from the main body, and the projection 52 abuts against the microphone 20. The magnet block 51 is in contact with the bolt 41. The pressing plate 50 is firmly connected to the microphone 20 to be tested by the protrusion 52 and the magnet block 51.

A system for testing the microphone 20 to be tested using the test tool will be described below. The system comprises a sound source, a microphone 20 to be tested and a test board 10.

The sound source emits a test sound wave. The microphone under test 20 receives the acoustic wave and converts the acoustic energy into electric energy, and outputs an electric signal through the second pad 21 of the microphone under test 20. The test board 10 has first pads 12 electrically connected to second pads 21, and the test board 10 receives and processes the electrical signals. Finally, the test board 10 conducts the electrical signal to an external test circuit so that the sensitivity of the microphone 20 under test can be measured.

By adopting the testing tool and system provided by the application, a tester can simply place the microphone 20 to be tested at the position of the limiting hole, push the pressing plate 50 to enable the protruding part 52 to be in contact with the microphone 20 to be tested, and the probe 30 contracts to enable the electric signal generated by the microphone 20 to be tested to be conducted out through the testing board 10. After the test is completed, the tester can easily remove the pressing plate 50 and replace the microphone 20 to be tested for the next round of test.

In addition, through setting up probe 30 in the test fixture that this application provided for the second sound hole 22 of microphone 20 that awaits measuring and the first sound hole 11 in close contact with of survey test panel 10, thereby reduced the distance between first sound hole 11 and the second sound hole 22, be favorable to reducing the sound wave decay. Moreover, the probe 30 is arranged, so that the electric connection between the microphone 20 to be tested and the test board 10 is more stable, and more reliable test data can be obtained after the microphone 20 to be tested is replaced for multiple times.

The present invention is not intended to be limited to the particular embodiments shown and described, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims (8)

1. The utility model provides a test fixture of microphone which characterized in that includes:

a test board having a first sound hole and a first pad;

the microphone to be tested is provided with a second sound hole and a second bonding pad, the second sound hole corresponds to the first sound hole, and the second bonding pad corresponds to the first bonding pad;

a probe having a first end and a retractable second end, the first end penetrating the first pad, the second end abutting the second pad;

and the pressing plate is abutted against the microphone to be tested, so that the first bonding pad is in physical contact and electrical contact with the second bonding pad through the probe.

2. The microphone testing tool according to claim 1, wherein the testing board further has a third pad, the third pad and the first pad are respectively located on two sides of the testing board, and the third pad is electrically connected with the first pad through a conductive member on an inner wall of the through hole; the probe is provided with a ferrule, a spring and a telescopic needle point, wherein the spring and the telescopic needle point are contained in the ferrule, the ferrule is fixed with the third bonding pad and is electrically connected with the third bonding pad, and the needle point penetrates through the through hole and is abutted against the second bonding pad of the microphone to be tested.

3. The microphone testing tool of claim 2, wherein the testing board is fixed to a testing table via at least three studs, wherein first ends of the studs are fixed to the testing table.

4. The microphone testing tool according to claim 3, further comprising a limiting plate, wherein the limiting plate is fixed to the testing plate through a bolt, and the internal thread of the second end of the stud is fixedly connected with the external thread of the bolt.

5. The microphone testing tool according to claim 4, wherein the limiting plate is fixed to the testing board and has a limiting hole, and the microphone to be tested is accommodated in the limiting hole.

6. The microphone testing tool according to claim 5, wherein the pressing plate comprises a body, a magnet block and a protrusion portion protruding from the body, the protrusion portion abuts against the microphone, and the magnet block is in contact with the bolt.

7. The microphone testing tool of claim 1, wherein the microphone comprises a piezoelectric MEMS microphone.

8. A system for testing a microphone, comprising:

a sound source that emits a test sound wave;

the microphone to be tested receives the sound waves, converts sound energy into electric energy and outputs an electric signal through a second bonding pad of the microphone to be tested;

and the test board is provided with a first bonding pad electrically connected with the second bonding pad and used for receiving and processing the electric signal.

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