CN212693952U

CN212693952U - Double-particle test board

Info

Publication number: CN212693952U
Application number: CN202021100021.8U
Authority: CN
Inventors: 刘旺
Original assignee: Jiangxi Huaersheng Technology Co ltd
Current assignee: Jiangxi Huaersheng Technology Co ltd
Priority date: 2020-06-15
Filing date: 2020-06-15
Publication date: 2021-03-12
Anticipated expiration: 2030-06-15

Abstract

The utility model discloses a double-grain testing plate, which comprises a testing box, a testing box slide rail, a first testing product box, a second testing product box, a pressing arm, a switching board, a product box slide rail and a pressing arm support frame, wherein the upper end of the testing box is fixedly provided with the testing box slide rail through a pulley, the lower part of the testing box is provided with the pressing arm, the four corners of the pressing arm are welded with the pressing arm support frame, the lower part of the pressing arm is provided with the first testing product box and the second testing product box, the upper ends of the first testing product box and the second testing product box are fixedly provided with the switching board by screws, the bottoms of the first testing product box and the second testing product box are provided with the product box slide rail, the switching board is additionally arranged on the original basis, can be simultaneously connected with a mainboard to the function detection of the testing box for testing, the double-grain function can be simultaneously tested by matching with the existing starting testing box, the labor cost can be reduced by comparison.

Description

Double-particle test board

Technical Field

The utility model relates to a material detection area, concretely relates to is a two test version.

Background

The TFT belongs to an active matrix liquid crystal display, and the display of the TFT adopts a back-transmission type illumination mode, namely an imaginary light source path is not from top to bottom like TN liquid crystal but from bottom to top. The method is that the special light pipe is arranged on the back of the liquid crystal, the light source is upwards transmitted out through the lower polarizing plate when irradiating, and the conventional testing TFT wearable screen can only test a single TFT through a single testing machine, so that the working efficiency is extremely low, and therefore, the conventional testing machine is urgently required to be changed, the testing quantity can be increased, and the testing efficiency is improved.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a two grain test version has the efficiency of software testing that improves, improves the test quality, can contrast, reduces the advantage of cost of labor.

In order to achieve the above object, the utility model provides a following technical scheme, a two grain test version, its characterized in that: including test box, test box slide rail, first test product box, second test product box, push down arm, keysets, product box slide rail, push down the arm support frame, the test box upper end is equipped with the test box slide rail through the pulley is fixed, the test box below is equipped with and pushes down the arm, push down arm four corners welding and be equipped with and push down the arm support frame, it is equipped with first test product box and second test product box to push down the arm below, first test product box and second test product box upper end screw fixation are equipped with the keysets, first test product box and second test product box bottom are equipped with the product box slide rail.

Preferably, the first test product box and the second test product box are stainless steel shells.

Preferably, the support frame of the lower pressing arm adopts a telescopic structure.

Preferably, the test box adopts a TFT detection device.

Preferably, the adapter plate adopts a detachable structure.

Compared with the prior art, the beneficial effects of the utility model are as follows:

1. the utility model provides a two grain test version, newly increases a keysets on original basis, can be connected to the test box function with the mainboard and detect and test, cooperates current start-up test box to reach two grain functions of concurrent test, has the improvement efficiency of software testing, improves the test quality, can contrast, reduces the advantage of cost of labor.

Drawings

Fig. 1 is a schematic view of the overall structure of a double-particle test plate according to the present invention;

fig. 2 is a schematic view of the front view structure of a double-particle test plate of the present invention.

The figures are labeled as follows: 1. a test box; 2. a test box slide rail; 3. a first test product cartridge; 4. a second test product cartridge; 5. a pressing arm; 6. an adapter plate; 7. a product box slide rail; 8. and pressing the arm support frame downwards.

Detailed Description

The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, rather than all embodiments, and all other embodiments obtained by a person of ordinary skill in the art without creative work belong to the protection scope of the present invention based on the embodiments of the present invention.

In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Example 1:

referring to fig. 1, a double-particle test board comprises a test box 1, a first test product box 3, a second test product box 4, a pressing arm 5, a switching board 6 and a pressing arm support frame 8, wherein in the use process, the pressing arm 5 descends through the pressing arm support frame 8 to fix the product box 3 and the second test product box 4, the test box 1 detects products inside the first test product box 3 through the PCB test board, and meanwhile, the PCB test board reaches the second test product box 4 through the switching board 6 to detect the products.

The working principle is as follows: a double-particle test board is characterized in that in the using process, an external controller is opened to control a test box 1 to move on a test box slide rail 2, after the test box reaches a proper position, a first test product box 3 and a second test product box 4 are controlled to reach the corresponding positions through a product box slide rail 7, then a pressing arm 5 is controlled to descend through a pressing arm support frame 8, the product box 3 and the second test product box 4 are fixed, the test box 1 detects products in the first test product box 3 through a PCB test board, meanwhile, the PCB test board reaches the second test product box 4 through a transfer board 6 to detect the products, a transfer board is additionally arranged on the original basis, the transfer board can be connected with a main board to the test box function detection for testing simultaneously, the double-particle function test is achieved by matching with the existing start-up test box, the test efficiency is improved, and the test quality is improved, the labor cost can be reduced by comparison.

Having shown and described the basic principles and principal features of the invention and advantages thereof, it will be apparent to those skilled in the art that the invention is not limited to the details of the foregoing exemplary embodiments, but is capable of other specific forms without departing from the spirit or essential characteristics thereof; the present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein, and any reference signs in the claims are not intended to be construed as limiting the claim concerned.

Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.

Claims

1. The utility model provides a two grain test boards which characterized in that: comprises a test box (1), a test box slide rail (2), a first test product box (3), a second test product box (4), a lower press arm (5), an adapter plate (6), a product box slide rail (7) and a lower press arm support frame (8), the upper end of the test box (1) is fixedly provided with a test box slide rail (2) through a pulley, a lower pressing arm (5) is arranged below the test box (1), four corners of the lower pressing arm (5) are welded with lower pressing arm supporting frames (8), a first test product box (3) and a second test product box (4) are arranged below the lower pressing arm (5), the upper ends of the first test product box (3) and the second test product box (4) are fixedly provided with adapter plates (6) by screws, and product box slide rails (7) are arranged at the bottoms of the first test product box (3) and the second test product box (4).

2. The dual-particle test plate according to claim 1, wherein: the first test product box (3) and the second test product box (4) are made of stainless steel shells.

3. The dual-particle test plate according to claim 1, wherein: the lower pressing arm support frame (8) adopts a telescopic structure.

4. The dual-particle test plate according to claim 1, wherein: the test box (1) adopts a TFT detection device.

5. The dual-particle test plate according to claim 1, wherein: the adapter plate (6) adopts a detachable structure.