CN212568253U - Garnet crystal high temperature resistance test device - Google Patents
Garnet crystal high temperature resistance test device Download PDFInfo
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- CN212568253U CN212568253U CN202021197699.2U CN202021197699U CN212568253U CN 212568253 U CN212568253 U CN 212568253U CN 202021197699 U CN202021197699 U CN 202021197699U CN 212568253 U CN212568253 U CN 212568253U
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- garnet
- high temperature
- push rod
- resistance test
- test device
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- 230000001681 protective effect Effects 0.000 claims description 17
- 238000007789 sealing Methods 0.000 claims description 17
- 229910000831 Steel Inorganic materials 0.000 claims description 11
- 239000010959 steel Substances 0.000 claims description 11
- 230000002093 peripheral effect Effects 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 4
- 239000011521 glass Substances 0.000 claims description 3
- 238000007493 shaping process Methods 0.000 claims description 3
- 239000012774 insulation material Substances 0.000 claims description 2
- 238000003466 welding Methods 0.000 claims description 2
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- 238000002474 experimental method Methods 0.000 abstract description 2
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- 229910052500 inorganic mineral Inorganic materials 0.000 description 1
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Abstract
The utility model discloses a garnet crystal high temperature test device, including supporting base, resistance to compression push rod and the pressure head, it has through the screw connection to support base top one side resistance to high temperature test case, there is the top cap at resistance to high temperature test roof portion through the screw connection, there is the resistance to compression push rod at top cap top middle part through the screw connection, the resistance to compression push rod runs through the top cap sets up, resistance to compression push rod below is provided with thermal-insulated protection casing. Has the advantages that: the utility model discloses a set up resistance to compression push rod and pressure head, can test garnet compressive property under different temperatures, can effectually enlarge the experimental test scope of this device, through set up the camera at garnet periphery, can realize surveing the operation to garnet high temperature resistant experiment through remote communication, avoid closely surveing the garnet body under the high temperature condition, improve experimental operation process's comfort level.
Description
Technical Field
The utility model relates to a high temperature resistant experimental apparatus technical field, concretely relates to garnet crystal high temperature test device.
Background
Garnet, a geological term of art, is one of the main diagenetic minerals of the upper mantle. Garnet crystals are similar to pomegranate seeds in shape and color, so they are called "garnet". The garnet with good color and high purity can be used as a gem. The english name of Garnet is Garnet, evolved from latin text "grantum", and means "like a seed", and the common Garnet is red, but the color of the Garnet is very wide, almost covers the color of the whole spectrum, and the Garnet needs to be tested for its high temperature resistance when in use.
But current garnet crystal high temperature resistant experimental apparatus is when carrying out high temperature resistant test, mostly can not test the compressive property under the different temperatures, and the test range is less, simultaneously, when testing, needs closely survey the surface of garnet along with the change condition of temperature, and it is higher to survey ambient temperature, and the comfort level is lower.
SUMMERY OF THE UTILITY MODEL
Technical problem to be solved
In order to overcome prior art not enough, present a garnet crystal high temperature resistance test device, solved current garnet crystal high temperature resistance test device when carrying out high temperature resistance test, mostly can not test the compressive property under the different temperatures, the test range is less to and when testing, the surface that needs closely survey garnet is along with the change condition of temperature, it is higher to survey ambient temperature, the lower problem of comfort level.
(II) technical scheme
The utility model discloses a following technical scheme realizes: the utility model provides a garnet crystal high temperature test device, including supporting base, resistance to compression push rod and the pressure head, it has through the screw connection to support base top one side resistance to high temperature test case, there is the top cap at resistance to high temperature test roof portion through the screw connection, there is the resistance to compression push rod at top cap top middle part through the screw connection, the resistance to compression push rod runs through the top cap sets up, resistance to compression push rod below is provided with thermal-insulated protection casing, the top is provided with in the thermal-insulated protection casing the pressure head, the pressure head with thermal-insulated protection casing passes through the draw-in groove and connects, thermal-insulated protection casing is the clear glass material, thermal-insulated protection casing with resistance to compression push rod overlap joint, thermal.
By adopting the technical scheme, the heat-insulating protective cover and the pressure head move downwards by the action of the pressure-resistant push rod, the pressure-resistant performance of the garnet at different temperatures can be tested by the pressure head, and the test range of the device can be effectively enlarged.
Furthermore, the bottom in the high-temperature resistance test box is connected with a sealing seat through screws, a garnet placing table is arranged in the middle above the sealing seat and connected with the sealing seat through screws, and the garnet placing table is made of a heat-conducting and pressure-resistant material.
Through adopting above-mentioned technical scheme, the seal receptacle can during thermal-insulated protection casing up-and-down motion, ensure the garnet body is in sealed environment, avoids the heat to distribute away.
Further, a garnet body is lapped on the middle portion of the garnet placing table, temperature sensors are arranged on two sides of the periphery of the garnet body, and the temperature sensors are connected with the garnet placing table through screws.
Through adopting above-mentioned technical scheme, temperature sensor can real-time measurement the inside temperature variation condition of thermal-insulated protection casing, and then be convenient for observe the surface variation that garnet body takes place along with the change of temperature.
Further, a heating wire is arranged on the periphery of the garnet placing table and connected with the garnet placing table through screws, the heating wire is of an annular structure, the sealing seat is of a cylindrical structure, a sealing ring is connected to the outer wall of the sealing seat through a clamping groove, and the sealing seat is made of heat insulating materials.
Through adopting above-mentioned technical scheme, the heater strip is used for right garnet body inner space heats, the sealing washer plays sealed the purpose of thermal-insulated protection casing.
Furthermore, cameras are arranged on four side walls inside the high-temperature resistance test box and connected with the high-temperature resistance test box through screws.
Through adopting above-mentioned technical scheme, can pass through the real-time detection of camera the garnet body can follow the outside direct observation along with the change condition of temperature the change of garnet body, and then carry out the test to its high temperature resistance ability, avoid under the high temperature condition right the garnet body carries out closely observation, improves the comfort level of experimental operation process.
Furthermore, the other side above the supporting base is connected with a rotary supporting seat through a screw, the inside of the rotary supporting seat is rotatably connected with a rotary table, a supporting hole is formed in the outer wall of the rotary table, a steel ball is arranged inside the supporting hole, and the steel ball and the inside of the supporting hole are connected with a pressure spring in a clamping and pressing mode.
By adopting the technical scheme, the pressure spring provides elastic acting force for the clamping action of the steel balls.
Furthermore, the inside of the rotary supporting seat is close to a plurality of clamping holes are formed in the periphery of the rotary table, a supporting vertical rod is welded above the rotary table, a PLC (programmable logic controller) is connected above the supporting vertical rod through screws, and a display screen and an operation key are arranged on the PLC.
By adopting the technical scheme, the PLC controller can be rotated by force to drive the turntable to rotate inside the rotary supporting seat, the steel balls are clamped inside the clamping holes under the action of the pressure spring, so that the PLC controller has a self-fixing function under the action of no external force, and the angle of the PLC controller is convenient to adjust.
(III) advantageous effects
Compared with the prior art, the utility model, following beneficial effect has:
1. in order to solve the problems that the compressive property of the garnet at different temperatures can not be tested and the test range is small when the high temperature resistance test is carried out by the existing garnet crystal high temperature resistance test device, the compressive property of the garnet at different temperatures can be tested by arranging the compressive push rod and the pressure head, and the test range of the device can be effectively expanded;
2. when solving current garnet crystal high temperature resistant experimental apparatus, need closely survey the surface of garnet along with the situation of change of temperature, it is higher to survey ambient temperature, the lower problem of comfort level, the utility model discloses a set up the camera in garnet periphery, can realize closely observing the operation to the garnet high temperature resistant experiment through remote communication, avoid closely observing the garnet body under the high temperature condition, improve experimental operation process's comfort level.
Drawings
FIG. 1 is a front view of a garnet crystal high temperature resistance test apparatus according to the present invention;
FIG. 2 is a main sectional view of a high temperature resistance test box of the high temperature resistance test device for garnet crystals according to the present invention;
FIG. 3 is a main sectional view of a rotary supporting seat of the high temperature resistance testing apparatus for garnet crystals according to the present invention;
FIG. 4 is a structural diagram of a heating wire in a garnet crystal high temperature resistance test device.
The reference numerals are explained below:
1. a support base; 2. a high temperature resistance test chamber; 3. a top cover; 4. a compression resistant push rod; 5. rotating the supporting seat; 6. supporting the upright stanchion; 7. a PLC controller; 8. a turntable; 9. a support hole; 10. a pressure spring; 11. steel balls; 12. a clamping hole; 13. a camera; 14. a heat-insulating protective cover; 15. a pressure head; 16. a sealing seat; 17. a seal ring; 18. a garnet placement table; 19. a garnet body; 20. a temperature sensor; 21. a heating wire.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
As shown in fig. 1-4, the high temperature test device for garnet crystal in this embodiment includes a supporting base 1, a pressure-resistant push rod 4 and a pressure head 15, one side of the upper side of the supporting base 1 is connected with a high temperature test chamber 2 through a screw, the top of the high temperature test chamber 2 is connected with a top cover 3 through a screw, the middle part of the upper side of the top cover 3 is connected with the pressure-resistant push rod 4 through a screw, the pressure-resistant push rod 4 penetrates through the top cover 3, a heat-insulating protective cover 14 is arranged below the pressure-resistant push rod 4, the pressure head 15 is arranged at the inner top of the heat-insulating protective cover 14, the pressure head 15 is connected with the heat-insulating protective cover 14 through a clamping groove, the heat-insulating protective cover 14 is made of transparent glass, the heat-insulating protective cover 14 is lapped with the pressure-resistant push rod 4, the heat, the test range of the device can be effectively expanded.
There is the seal receptacle 16 bottom in the high temperature resistance test box 2 through the screw connection, and 16 top middle parts of seal receptacle are provided with the garnet and place platform 18, and the garnet is placed platform 18 and is passed through the screw connection with seal receptacle 16, and the garnet is placed platform 18 and is made for heat conduction, withstand voltage material, and seal receptacle 16 can ensure that garnet body 19 is in sealed environment when thermal-insulated protection casing 14 moves from top to bottom, avoids the heat to distribute away.
The garnet is placed platform 18 top middle part overlap joint and is had garnet body 19, and garnet body 19 periphery both sides all are provided with temperature sensor 20, and temperature sensor 20 places platform 18 with the garnet and passes through screw connection, and temperature sensor 20 can be real-time the inside temperature variation condition of measurement thermal-insulated protection casing 14, and then is convenient for observe the surface variation that garnet body 19 takes place along with the change of temperature.
The peripheral heater strip 21 that is provided with of platform 18 is placed to the garnet, and heater strip 21 places platform 18 with the garnet and passes through the screw connection, and heater strip 21 is the loop configuration, and seal receptacle 16 is cylindrical structure, is connected with sealing washer 17 through the draw-in groove on the outer wall of seal receptacle 16, and seal receptacle 16 is made for thermal insulation material, and heater strip 21 is used for heating 19 inner spaces of garnet body, and sealing washer 17 plays the purpose of sealed thermal-insulated protection casing 14.
All be provided with camera 13 on the inside four lateral walls of high temperature resistance test case 2, camera 13 passes through the screw connection with high temperature resistance test case 2, can be through the real-time change condition of detection garnet body 19 along with the temperature of camera 13, can follow the change of outside direct observation garnet body 19, and then test the high temperature resistance performance test thereof, avoid carrying out closely observation to garnet body 19 under the high temperature condition, improve experimental operation process's comfort level.
Support 1 top opposite side of base and have rotary supporting seat 5 through screw connection, rotary supporting seat 5 internal rotation is connected with carousel 8, and the shaping has supported hole 9 on the 8 outer walls of carousel, and the inside steel ball 11 that is provided with of supported hole 9, and steel ball 11 is connected with pressure spring 10 with the inside card pressure mode that presses of supported hole 9, and pressure spring 10 provides the elastic force for the chucking of steel ball 11.
Inside being close to the peripheral shaping of carousel 8 of 5 of rotating support seat has a plurality of card holes 12, 8 top welding of carousel has support pole setting 6, there is PLC controller 7 support pole setting 6 top through screw connection, be equipped with display screen and operation button on the PLC controller 7, can be through rotating PLC controller 7 hard, drive carousel 8 at 5 inside rotations of rotating support seat, under the effect of pressure spring 10, with 11 chucking of steel ball inside card hole 12, can ensure that PLC controller 7 is under the effect of not receiving the external force, self-fixing's function has, be convenient for adjust the angle of PLC controller 7.
The specific implementation process of this embodiment is as follows: when the high-temperature-resistant experimental device is used, the top cover 3 is opened firstly, the heat-insulating protective cover 14 is taken out, the garnet body 19 is placed above the garnet placing table 18, the heat-insulating protective cover 14 and the top cover 3 are covered, then the power supply is switched on, the heating wire 21 is controlled to be started through the PLC 7 to heat the garnet body 19, in the heating process, the temperature sensor 20 can detect the peripheral temperature change condition of the garnet body 19 in real time, the pressure-resistant push rod 4 can be controlled to act within a certain temperature interval range to push the heat-insulating protective cover 14 and the pressure head 15 to move downwards, the sealing ring 17 can ensure the internal sealing of the heat-insulating protective cover 14, the pressure-resistant performance of the garnet at different temperatures can be tested through the pressure head 15, the test range of the device can be effectively expanded, and meanwhile, the camera 13 can monitor the change, simultaneously with the display screen display of temperature information and garnet's monitoring information through PLC controller 7 come out, convenient visual observation, simultaneously, avoid carrying out closely observing garnet body 19 under the high temperature condition, improve experimental operation process's comfort level.
The above-described embodiments are merely illustrative of the preferred embodiments of the present invention and are not intended to limit the spirit and scope of the present invention. Without departing from the design concept of the present invention, various modifications and improvements made by the technical solution of the present invention by those skilled in the art should fall into the protection scope of the present invention, and the technical contents claimed by the present invention have been fully recorded in the claims.
Claims (7)
1. The utility model provides a garnet crystal high temperature resistance test device which characterized in that: comprises a supporting base (1), a pressure-resistant push rod (4) and a pressure head (15), wherein one side above the supporting base (1) is connected with a high-temperature resistant test box (2) through a screw, the top of the high-temperature resistant test box (2) is connected with a top cover (3) through a screw, the middle part above the top cover (3) is connected with the compression-resistant push rod (4) through a screw, the compression-resistant push rod (4) penetrates through the top cover (3), a heat-insulating protective cover (14) is arranged below the compression-resistant push rod (4), the pressure head (15) is arranged at the inner top of the heat insulation protective cover (14), the pressure head (15) is connected with the heat insulation protective cover (14) through a clamping groove, the heat insulation protective cover (14) is made of transparent glass, the heat insulation protective cover (14) is in lap joint with the compression-resistant push rod (4), and the heat insulation protective cover (14) is of a cylindrical structure.
2. The garnet crystal high temperature resistance test device of claim 1, wherein: the inner bottom of the high-temperature resistant test box (2) is connected with a sealing seat (16) through screws, a garnet placing table (18) is arranged in the middle of the upper portion of the sealing seat (16), the garnet placing table (18) is connected with the sealing seat (16) through screws, and the garnet placing table (18) is made of heat-conducting and pressure-resistant materials.
3. The garnet crystal high temperature resistance test device of claim 2, wherein: a garnet body (19) is lapped on the middle part above the garnet placing table (18), temperature sensors (20) are arranged on two peripheral sides of the garnet body (19), and the temperature sensors (20) are connected with the garnet placing table (18) through screws.
4. The garnet crystal high temperature resistance test device of claim 3, wherein: platform (18) periphery is placed to garnet is provided with heater strip (21), heater strip (21) with platform (18) is placed to garnet passes through the screw connection, heater strip (21) are the loop configuration, seal receptacle (16) are cylindrical structure, be connected with sealing washer (17) through the draw-in groove on seal receptacle (16) outer wall, seal receptacle (16) are made for thermal insulation material.
5. The garnet crystal high temperature resistance test device of claim 4, wherein: the camera (13) is arranged on the four side walls inside the high-temperature resistant test box (2), and the camera (13) is connected with the high-temperature resistant test box (2) through screws.
6. The garnet crystal high temperature resistance test device of claim 1, wherein: the supporting base is characterized in that the other side above the supporting base (1) is connected with a rotary supporting seat (5) through a screw, the rotary supporting seat (5) is internally rotatably connected with a rotary table (8), a supporting hole (9) is formed in the outer wall of the rotary table (8), a steel ball (11) is arranged in the supporting hole (9), and the steel ball (11) and the inside of the supporting hole (9) are connected with a pressure spring (10) through a clamping and pressing mode.
7. The garnet crystal high temperature resistance test device of claim 6, wherein: rotatory supporting seat (5) inside is close to carousel (8) peripheral shaping has a plurality of card holes (12), the welding of carousel (8) top has support pole setting (6), there are PLC controller (7) support pole setting (6) top through the screw connection, be equipped with display screen and operation button on PLC controller (7).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021197699.2U CN212568253U (en) | 2020-06-24 | 2020-06-24 | Garnet crystal high temperature resistance test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021197699.2U CN212568253U (en) | 2020-06-24 | 2020-06-24 | Garnet crystal high temperature resistance test device |
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| Publication Number | Publication Date |
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| CN212568253U true CN212568253U (en) | 2021-02-19 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202021197699.2U Expired - Fee Related CN212568253U (en) | 2020-06-24 | 2020-06-24 | Garnet crystal high temperature resistance test device |
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| CN (1) | CN212568253U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114577625A (en) * | 2022-03-16 | 2022-06-03 | 江苏奔腾橡胶制品有限公司 | Plastic product defect detection device and detection method |
-
2020
- 2020-06-24 CN CN202021197699.2U patent/CN212568253U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114577625A (en) * | 2022-03-16 | 2022-06-03 | 江苏奔腾橡胶制品有限公司 | Plastic product defect detection device and detection method |
| CN114577625B (en) * | 2022-03-16 | 2023-10-20 | 江苏奔腾橡胶制品有限公司 | Plastic product defect detection device and detection method |
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Granted publication date: 20210219 |