CN212540196U - Scanning electron microscope plant sample sampler - Google Patents

Scanning electron microscope plant sample sampler Download PDF

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Publication number
CN212540196U
CN212540196U CN202021311533.9U CN202021311533U CN212540196U CN 212540196 U CN212540196 U CN 212540196U CN 202021311533 U CN202021311533 U CN 202021311533U CN 212540196 U CN212540196 U CN 212540196U
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China
Prior art keywords
sample
fixed
sleeve
cover
plate
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CN202021311533.9U
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Chinese (zh)
Inventor
姜碧薇
周玉香
陈西风
孔阳阳
安磊
李斐
王甜
贾帅
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Ningxia Polytechnic (ningxia Radio And Television University)
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Ningxia Polytechnic (ningxia Radio And Television University)
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Abstract

The utility model discloses a scanning electron microscope plant sample sampler, including the sample cover, the inside rectangular channel of having seted up of sample cover, the sample cover of rectangular channel inboard is internal to be fixed with the bracing piece, the sample is put in the side and is provided with and pushes away the cover, it is fixed with the fixed plate to push away the cover upside, sliding connection has the push rod on the fixed plate, the push rod extends to in the push away cover. The utility model discloses a sample cover and bracing piece, the convenience is placed the sample, through clamp plate and locating plate, the convenience is fixed a position the sample, elasticity through the spring, the convenience is stretched clamp plate and locating plate, the waste material after the sample is conveniently taken off, through pushing away cover and cutter, the convenience is to inserting the rectangular channel in, and then the convenience is cut the sample, and through the bracing piece, avoid cutting the back sample and fall in the rectangular channel, and through gliding push rod, it is ejecting that the sample in the convenient cover that will get into pushes away, make things convenient for personnel to operate, and make things convenient for the sample.

Description

Scanning electron microscope plant sample sampler
Technical Field
The utility model relates to a plant sampling equipment technical field specifically is a scanning electron microscope plant sample sampler.
Background
In recent years, scanning electron microscopy has been widely applied in the fields of biology, medicine, metallurgy and other disciplines, and the development of related disciplines is greatly promoted. The scanning electron microscope can directly observe the structure of the surface of a sample at present, the sample preparation process is convenient and simple, the sample is not required to be cut into slices, and the sample can be translated and rotated in a three-dimensional space in a sample chamber, so that the ideal effect of observing the sample from various angles is realized.
Generally, after a plant sample is pretreated before an endoscope such as material drawing, cleaning, fixing, rinsing, dehydrating, ethanol replacement, freeze drying, conductive gold spraying and the like, a part (about 2CM in diameter) of a desired sample is cut by scissors, and then the part is stuck on a conductive double-faced adhesive tape by a forceps clamp and then is put on a tray for observation.
However, the samples trimmed by the existing scissors have different sizes and rough edges, and the loss and the error of the samples can be caused by various reasons in the operation process. Therefore, it is necessary to design a convenient and standard sampler during the sampling process. Therefore, we propose a sampler for plant samples by scanning electron microscopy.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a scanning electron microscope plant sample sampler to it is comparatively crude with the sample size difference and edge to propose the sample of pruning with the scissors now in solving above-mentioned background art, because the problem of the loss and the error of sample probably still can cause in the middle of the operation process because various reasons.
In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a scanning electron microscope plant sample sampler, includes the sample cover, the inside rectangular channel of having seted up of sample cover, be fixed with the bracing piece in the sample cover of rectangular channel inboard, the sample is sheathe in the side and is provided with and pushes away the cover, it is fixed with the fixed plate to push away the cover upside, sliding connection has the push rod on the fixed plate, the push rod extends to in pushing away the cover, it is fixed with the cutter to push away the cover downside, sample cover upper end is provided with the clamp plate, the clamp plate lower extreme is fixed with the locating plate, be fixed with the guide pillar on the fixed plate on locating plate left side and right side, guide pillar outside cover is.
Preferably, a spring is fixed in the guide sleeve, the other end of the spring is fixedly connected with the guide pillar, four groups of the guide sleeve, the spring and the guide pillar are arranged, and the four groups of the guide sleeve, the spring and the guide pillar are respectively arranged between the pressing plate and the sampling sleeve.
Preferably, the middle part has been seted up logical groove on the fixed plate, and has been seted up limit slide in the logical inslot wall, the push rod passes logical groove, the spout has all been seted up on push rod left side and right side, limit slide sliding connection is in the spout.
Preferably, the left side and the right side of the fixing plate are both fixed with a push block, and the lower end of the sampling sleeve is fixedly bonded with an anti-slip base.
Preferably, the outer diameter of the push sleeve is slightly smaller than the diameter of the rectangular groove, the inner diameter of the push sleeve is slightly larger than the diameter of the support rod, and the diameter of the push rod is the same as that of the support rod.
Preferably, the inner diameter of the positioning plate is far larger than the diameter of the rectangular groove.
Compared with the prior art, the beneficial effects of the utility model are that:
this scanning electron microscope plant sample sampler, through sample cover and bracing piece, the convenience is placed the sample, through clamp plate and locating plate, the convenience is fixed a position the sample, elasticity through the spring, the convenience is stretched clamp plate and locating plate, the waste material after the sample is conveniently taken off, through pushing away cover and cutter, the convenience is to inserting the rectangular channel, and then the convenience is cut the sample, and pass through the bracing piece, the sample falls on the rectangular channel after avoiding cutting, and through gliding push rod, it is ejecting that the sample in the cover is pushed away to the convenience will get into, make things convenient for personnel's operation, and make things convenient for the sample, avoided the sample size to differ and the edge is comparatively crude, very big reduction cause the loss and the error of sample in the middle of the operation process.
Drawings
FIG. 1 is a view of the structure of the present invention;
FIG. 2 is a structural diagram of the sampling sleeve, the rectangular groove and the support rod of the present invention;
FIG. 3 is a structural diagram of the middle press plate and the positioning plate of the present invention;
FIG. 4 is a front sectional view of the fixing plate, the pushing sleeve and the pushing rod of the present invention;
FIG. 5 is a front sectional view of the middle guide post, the guide sleeve and the spring of the present invention;
fig. 6 is an enlarged view of a portion a in fig. 1 according to the present invention.
In the figure: 1. a push rod; 2. a fixing plate; 3. a push block; 4. pushing a sleeve; 5. a cutter; 6. pressing a plate; 7. a sampling sleeve; 8. an anti-slip base; 9. a limiting slide block; 10. a rectangular groove; 11. a support bar; 12. a guide post; 13. a guide sleeve; 14. a spring; 15. and (7) positioning the plate.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-6, the present invention provides a technical solution: the utility model provides a scanning electron microscope plant sample sampler, including sample cover 7, rectangular channel 10 has been seted up to sample cover 7 inside, 7 internal fixation of sample cover 7 of rectangular channel 10 inboard have a bracing piece 11, 7 upsides of sample cover are provided with and push away cover 4, it is fixed with fixed plate 2 to push away 4 upsides of cover, sliding connection has push rod 1 on fixed plate 2, push rod 1 extends to and pushes away in the cover 4, it is fixed with cutter 5 to push away 4 downsides of cover, 7 upper ends of sample cover are provided with clamp plate 6, 6 lower extremes of clamp plate are fixed with locating plate 15, be fixed with guide pillar 12 on 15 left sides of locating plate and the fixed plate 2 on right side, guide pillar 12 outside cover is equipped with guide pin.
The utility model discloses in: the spring 14 is fixed in the guide sleeve 13, the other end of the spring 14 is fixedly connected with the guide post 12, four groups of guide sleeves 13, springs 14 and guide posts 12 are arranged, and the four groups of guide sleeves 13, springs 14 and guide posts 12 are respectively arranged between the pressing plate 6 and the sampling sleeve 7, so that the pressing plate 6 and the sampling sleeve 7 can be conveniently and stably connected.
The utility model discloses in: the middle part has been seted up logical groove on fixed plate 2, and has been led to the inslot wall and seted up limit slide 9, and push rod 1 passes logical groove, and the spout has all been seted up on push rod 1 left side and right side, and limit slide 9 sliding connection makes things convenient for push rod 1 to install through leading to the groove in the spout, through limit slide 9 and spout, conveniently leads to and spacing, convenient slip push rod 1.
The utility model discloses in: fixed plate 2 left side and right side all are fixed with ejector pad 3, and 7 lower extremes of sample cover bond and are fixed with anti-skidding base 8, and through ejector pad 3, make things convenient for personnel to promote fixed plate 2, through anti-skidding base 8, sample cover 7 slides or topples over in avoiding operating.
The utility model discloses in: the outer diameter of the push sleeve 4 is slightly smaller than the diameter of the rectangular groove 10, the inner diameter of the push sleeve 4 is slightly larger than the diameter of the support rod 11, and the diameter of the push rod 1 is the same as that of the support rod 11.
The utility model discloses in: the inner diameter of the positioning plate 15 is much larger than the diameter of the rectangular groove 10.
The working principle is as follows: during normal use, the sampling sleeve 7 is placed at a designated position, then the sampling sleeve 7 is held to stretch the pressing plate 6 upwards, the pressing plate 6 drives the positioning plate 15 to move upwards, the spring 14 is driven to stretch, then a sample to be sampled is placed on the upper side of the sampling sleeve 7, then the pressing plate 6 is loosened, further under the action of the spring 14, the positioning plate 15 is reset, further the positioning plate 15 is contacted with the sample to realize positioning, then the cutter 5 on the lower side of the push sleeve 4 is pushed into the rectangular groove 10 until the push sleeve 4 enters the rectangular groove 10, meanwhile, the push rod 1 is jacked upwards through the support rod 11, further the sample is cut off to realize sampling, then the push sleeve 4 is taken out, the push sleeve 1 resets under the self gravity of the push rod 1, the sample clamped in the push sleeve 4 is pushed down and falls on the support rod 11, the taking of a person is facilitated, the operation of the person is facilitated, and the sampling is facilitated, the sample size is avoided being different, the edge is rough, and sample loss and errors caused in the operating process are greatly reduced.
In summary, the following steps: the utility model discloses a sample cover 7 and bracing piece 11, the convenience is placed the sample, through clamp plate 6 and locating plate 15, the convenience is fixed a position the sample, elasticity through spring 14, the convenience is stretched clamp plate 6 and locating plate 15, the waste material after conveniently taking a sample off, through pushing away cover 4 and cutter 5, the convenience is to inserting rectangular channel 10 in, and then the convenience is cut the sample, and pass through bracing piece 11, avoid cutting the back sample and fall in rectangular channel 10, and through gliding push rod 1, it is ejecting to conveniently get into the sample that pushes away in the cover 4, make things convenient for personnel to operate, and make things convenient for the sample, avoided the sample size to differ and the edge comparatively coarse, very big reduction cause the loss and the error of sample in the middle of the operation process.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (6)

1. The utility model provides a scanning electron microscope plant sample sampler, includes sample cover (7), its characterized in that: the novel sampling device is characterized in that a rectangular groove (10) is formed in the sampling sleeve (7), a support rod (11) is fixed in the sampling sleeve (7) on the inner side of the rectangular groove (10), a pushing sleeve (4) is arranged on the upper side of the sampling sleeve (7), a fixing plate (2) is fixed on the upper side of the pushing sleeve (4), a push rod (1) is connected to the fixing plate (2) in a sliding mode, the push rod (1) extends into the pushing sleeve (4), a cutter (5) is fixed on the lower side of the pushing sleeve (4), a pressing plate (6) is arranged at the upper end of the sampling sleeve (7), a positioning plate (15) is fixed at the lower end of the pressing plate (6), guide columns (12) are fixed on the fixing plate (2) on the left side and the right side of the positioning plate (15), guide sleeves (13) are sleeved on the outer.
2. A scanning electron microscope plant sample sampler according to claim 1, characterized in that: the spring (14) is fixed in the guide sleeve (13), the other end of the spring (14) is fixedly connected with the guide post (12), four groups of guide sleeves (13), four groups of springs (14) and four groups of guide posts (12) are arranged in the guide sleeve (13), and the four groups of guide sleeves (13), four groups of springs (14) and four groups of guide posts (12) are respectively arranged between the pressure plate (6) and the sampling sleeve (7).
3. A scanning electron microscope plant sample sampler according to claim 1, characterized in that: the middle part has been seted up logical groove on fixed plate (2), and has been led to the inslot wall and seted up limit slide (9), push rod (1) passes logical groove, the spout has all been seted up on push rod (1) left side and right side, limit slide (9) sliding connection is in the spout.
4. A scanning electron microscope plant sample sampler according to claim 1, characterized in that: the left side and the right side of the fixed plate (2) are both fixed with a push block (3), and the lower end of the sampling sleeve (7) is fixedly bonded with an anti-skid base (8).
5. A scanning electron microscope plant sample sampler according to claim 1, characterized in that: the outer diameter of the push sleeve (4) is slightly smaller than the diameter of the rectangular groove (10), the inner diameter of the push sleeve (4) is slightly larger than the diameter of the support rod (11), and the diameter of the push rod (1) is the same as that of the support rod (11).
6. A scanning electron microscope plant sample sampler according to claim 1, characterized in that: the inner diameter of the positioning plate (15) is far larger than the diameter of the rectangular groove (10).
CN202021311533.9U 2020-07-07 2020-07-07 Scanning electron microscope plant sample sampler Active CN212540196U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202021311533.9U CN212540196U (en) 2020-07-07 2020-07-07 Scanning electron microscope plant sample sampler

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202021311533.9U CN212540196U (en) 2020-07-07 2020-07-07 Scanning electron microscope plant sample sampler

Publications (1)

Publication Number Publication Date
CN212540196U true CN212540196U (en) 2021-02-12

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CN202021311533.9U Active CN212540196U (en) 2020-07-07 2020-07-07 Scanning electron microscope plant sample sampler

Country Status (1)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115396579A (en) * 2022-08-25 2022-11-25 昆明理工大学 Method for automatically shooting scanning electron microscope

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115396579A (en) * 2022-08-25 2022-11-25 昆明理工大学 Method for automatically shooting scanning electron microscope

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